JPH116050A - Optical member and its production - Google Patents

Optical member and its production

Info

Publication number
JPH116050A
JPH116050A JP9158212A JP15821297A JPH116050A JP H116050 A JPH116050 A JP H116050A JP 9158212 A JP9158212 A JP 9158212A JP 15821297 A JP15821297 A JP 15821297A JP H116050 A JPH116050 A JP H116050A
Authority
JP
Japan
Prior art keywords
resist
thin film
optical thin
pattern
transparent substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP9158212A
Other languages
Japanese (ja)
Inventor
Junichi Sakamoto
淳一 坂本
Nagato Osano
永人 小佐野
Hiroyuki Suzuki
博幸 鈴木
Kenitsu Iwata
研逸 岩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP9158212A priority Critical patent/JPH116050A/en
Publication of JPH116050A publication Critical patent/JPH116050A/en
Withdrawn legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To simply/easily form an optical thin film having a fine/complex pattern by removing a resist together with an optical thin film and leaving a optical thin film having a prescribed pattern shape after a resist is formed on a transparent substrate, further an optical thin film is formed on a whole substrate face. SOLUTION: A resist 2 is formed on a surface of a transparent substrate 1 of glass, plastic, etc., by an ink jet method, etc. Next, an optical thin film 3 is formed on a whole face of the transparent substrate forming the resist 2 by a vacuum deposition method, a sputtering method, a CVD method, etc. Successively, the resist 2 is peeled or dissolved to be removed and the optical thin 3 on the resist 3 is removed, the optical thin film 3, which has a pattern opposite to a pattern of the resist 2 on the transparent substrate 1, is left. By this method, an optical thin film having a fine/complex pattern is easily formed with a simple device at a good yield.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ヘッドマウントデ
ィスプレイやビデオカメラの内部光学部品として用いら
れる光学部材、特に面内に異なる分光特性エリアを有す
る光学部材とその製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical member used as an internal optical component of a head mounted display or a video camera, and more particularly to an optical member having different spectral characteristic areas in a plane and a method of manufacturing the same.

【0002】[0002]

【従来の技術】近年、ヘッドマウントディスプレイやビ
デオカメラなどの光学機器において、視線入力や位置検
出等の技術の進歩に伴って、面内にある特定の波長を反
射する部分と透過する部分とを有する光学部材の必要性
が高まってきている。
2. Description of the Related Art In recent years, in optical devices such as a head-mounted display and a video camera, a portion that reflects a specific wavelength within a plane and a portion that transmits the wavelength have been developed in accordance with the development of technologies such as line-of-sight input and position detection. The necessity of having an optical member is increasing.

【0003】また、近年、光学系の小型化に伴って、そ
のパターンも微細化、複雑化する傾向にある。
In recent years, with the miniaturization of optical systems, their patterns tend to be finer and more complicated.

【0004】このような光学部材は、基本的に透明基板
上に光学薄膜を所定のパターンに形成してなり、該光学
薄膜のパターン形状としては、中心部のみにパターン
を有する、中心部に開口部を有する、の2つのタイプ
に大別することができる。
[0004] Such an optical member is basically formed by forming an optical thin film in a predetermined pattern on a transparent substrate, and the optical thin film has a pattern shape only at a central portion and an opening at the central portion. Having a part.

【0005】ここで、上記のパターンを有する光学薄
膜を形成する場合には、中心部に開口部を設けたマスク
を用いて成膜することにより容易に製造可能である。し
かしながら、のパターンを有する光学薄膜を成膜する
場合には、中心部のみをマスク遮蔽しなければならない
が、マスクには支持部が必要であり、該支持部が影とな
って成膜を阻害するため、成膜すべき領域全面に一工程
で成膜することが不可能である。従って、成膜工程を2
回以上に分けて行なう必要がある。
Here, when an optical thin film having the above-mentioned pattern is formed, it can be easily manufactured by forming the film using a mask having an opening at the center. However, when forming an optical thin film having the above pattern, the mask must be shielded only at the central portion, but the mask requires a support portion, and the support portion becomes a shadow and hinders the film formation. Therefore, it is impossible to form a film over the entire region to be formed in one step. Therefore, the film forming process is
It needs to be done more than once.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、複数回
に分けた成膜工程は製造工程を複雑にするばかりでな
く、不良品の発生率を高め、歩留を低下させる原因とな
る。また、遮蔽マスクのようなメカニカルマスクを使用
する場合には、微細で複雑なパターンを高精度に形成す
ることが困難であった。このような微細なパターンを形
成する方法としてはフォトレジストを用いた方法が適し
ているが、フォトレジストを用いることによって、光学
薄膜成膜前工程が複雑になるとともに、露光機、現像機
等の設備が高価になり、光学部材のコストアップを招い
てしまう。また、レジストの種類に応じて、特別な有機
溶剤やアルカリ現像剤、剥離装置などが必要となる。
However, the film formation process divided into a plurality of times not only complicates the manufacturing process but also increases the incidence of defective products and lowers the yield. When a mechanical mask such as a shielding mask is used, it is difficult to form a fine and complicated pattern with high accuracy. As a method for forming such a fine pattern, a method using a photoresist is suitable. However, the use of a photoresist complicates the process of forming an optical thin film, and also requires an exposure machine, a developing machine, and the like. The equipment becomes expensive and the cost of the optical member increases. Further, depending on the type of the resist, a special organic solvent, an alkaline developer, a peeling device, and the like are required.

【0007】本発明は、このような問題に鑑みてなされ
たもので、微細で且つ複雑なパターンを有する光学薄膜
を簡素な工程で形成し、信頼性の高い光学部材を安価に
提供することにある。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and is intended to provide a highly reliable optical member at a low cost by forming an optical thin film having a fine and complicated pattern by a simple process. is there.

【0008】[0008]

【課題を解決するための手段】本発明の第一は、透明基
板上に光学薄膜パターンを有する光学部材の製造方法で
あって、透明基板上にインクジェット法によりレジスト
材を付与してレジストを形成する工程と、透明基板全面
に光学薄膜を形成する工程と、上記レジストをその上の
光学薄膜ごと除去して透明基板上に所定のパターン形状
の光学薄膜を残す工程と、を有することを特徴とする。
The first aspect of the present invention is a method for manufacturing an optical member having an optical thin film pattern on a transparent substrate, and forming a resist by applying a resist material on the transparent substrate by an ink jet method. And a step of forming an optical thin film on the entire surface of the transparent substrate, and a step of removing the resist together with the optical thin film thereon to leave an optical thin film of a predetermined pattern on the transparent substrate. I do.

【0009】また、本発明の第二は、上記製造方法で製
造されたことを特徴とする光学部材である。
A second aspect of the present invention is an optical member manufactured by the above manufacturing method.

【0010】[0010]

【発明の実施の形態】図1は本発明の製造方法の工程を
示す断面模式図である。本発明においては、先ず透明基
板1上にインクジェット法によりレジスト材を付与して
レジスト2を形成する。即ち、インクジェット法におけ
るインクとしてレジスト材を用いて透明基板上に描画
し、所望のパターンのレジスト2を形成する(図1
(a))。
DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic sectional view showing the steps of the manufacturing method of the present invention. In the present invention, first, a resist material is applied on the transparent substrate 1 by an ink-jet method to form a resist 2. That is, drawing is performed on a transparent substrate using a resist material as ink in the ink jet method, and a resist 2 having a desired pattern is formed (FIG. 1).
(A)).

【0011】本発明において、透明基板1としては、ガ
ラス、プラスチックなど一般に用いられる光学用基板材
料が用いられる。また、レジスト材としては、有機溶媒
に高分子材料を溶解させたものや、水に染料やでんぷん
を分散させたもの等、インクジェット法により微細なイ
ンク粒として透明基板上に付与し得るもので、且つ、乾
燥後に固形成分が透明基板上に残留するものであれば用
いることができる。
In the present invention, as the transparent substrate 1, a commonly used optical substrate material such as glass or plastic is used. Further, as a resist material, such as a material in which a polymer material is dissolved in an organic solvent, a material in which a dye or starch is dispersed in water, and the like can be provided on a transparent substrate as fine ink particles by an inkjet method, In addition, any solid component that remains on the transparent substrate after drying can be used.

【0012】また、インクジェット方式としては、エネ
ルギー発生素子として電気熱変換体を用いたバブルジェ
ットタイプ、或いは圧電素子を用いたピエゾジェットタ
イプ等が使用可能である。
As an ink jet system, a bubble jet type using an electrothermal converter as an energy generating element, a piezo jet type using a piezoelectric element, or the like can be used.

【0013】レジスト2を形成した透明基板1全面に光
学薄膜3を成膜する(図1(b))。成膜方法は、光学
薄膜3の素材によって選択すれば良く、例えば真空蒸着
法、スパッタリング法、CVD法等が用いられる。
An optical thin film 3 is formed on the entire surface of the transparent substrate 1 on which the resist 2 has been formed (FIG. 1B). The film formation method may be selected depending on the material of the optical thin film 3, and for example, a vacuum evaporation method, a sputtering method, a CVD method, or the like is used.

【0014】レジスト2を剥離或いは溶解して除去する
(図1(c))。同時に、レジスト2上の光学薄膜も除
去されるため、透明基板1上にはレジスト2のパターン
とは逆パターンの光学薄膜3が残される。
The resist 2 is removed by stripping or dissolving (FIG. 1C). At the same time, since the optical thin film on the resist 2 is also removed, the optical thin film 3 having a pattern opposite to the pattern of the resist 2 is left on the transparent substrate 1.

【0015】本発明によれば、1工程で微細且つ複雑な
パターンのレジストを容易に形成することができるた
め、該レジスト形成工程として高価な装置などが不要で
あり、また、歩留も良好である。
According to the present invention, since a resist having a fine and complicated pattern can be easily formed in one step, an expensive apparatus or the like is not required as the resist forming step, and the yield is good. is there.

【0016】図6に本発明の光学部材を用いた光学系の
模式図を示す。この光学系は視線入力光学系であり、当
該光学系に用いた観察光学素子61が本発明の光学部材
であり、その面Bを図7に示す。本光学系においては、
画像表示手段62に表示される画像を観察光学素子61
の面Cより取り込み、目視による画像認識を可能とする
と同時に、眼球を赤外光源63により照明し、その反射
光を観察光学素子62の面Bに設けられた透過領域Dよ
り背面に取り出し、その赤外光を背面のクサビプリズム
65及び結像光学系64を介して受光素子66に導き、
眼球の動きを検知するものである。光学薄膜3として
は、例えば金属薄膜が用いられ、領域D以外では光を反
射するように構成されている。
FIG. 6 is a schematic view of an optical system using the optical member of the present invention. This optical system is a line-of-sight input optical system, and the observation optical element 61 used in the optical system is the optical member of the present invention, and the surface B is shown in FIG. In this optical system,
The image displayed on the image display means 62 is displayed on the observation optical element 61.
At the same time, the eyeball is illuminated by the infrared light source 63, and the reflected light is taken out from the transmission area D provided on the surface B of the observation optical element 62 to the back, thereby enabling image recognition by visual observation. Infrared light is guided to the light receiving element 66 through the rear wedge prism 65 and the imaging optical system 64,
It detects the movement of the eyeball. As the optical thin film 3, for example, a metal thin film is used, and is configured to reflect light in regions other than the region D.

【0017】[0017]

【実施例】【Example】

[実施例1]70mm×50mmで10mm厚の光学ガ
ラス基板にインクジェット法によりφ3mmの円形のレ
ジストパターンを描画した。ここで用いたレジストは、
純水に5重量%のでんぷんを溶解したものを用いた。
Example 1 A circular resist pattern of φ3 mm was drawn on an optical glass substrate of 70 mm × 50 mm and 10 mm thick by an ink jet method. The resist used here is
A solution obtained by dissolving 5% by weight of starch in pure water was used.

【0018】上記基板を80℃で5分間乾燥させた後、
真空蒸着機にセットし、基板と蒸着膜の密着力を上げる
ため、200℃に基板加熱を行いながら、1時間排気を
行なった。この後、基板全面にアルミニウムを100n
m厚に抵抗加熱蒸着した後、SiOをλ/2(λ=55
0nm)抵抗加熱で蒸着し、真空蒸着機より取り出し
た。
After drying the substrate at 80 ° C. for 5 minutes,
The apparatus was set in a vacuum evaporation machine, and was evacuated for 1 hour while heating the substrate to 200 ° C. in order to increase the adhesion between the substrate and the deposited film. Thereafter, 100 n of aluminum is applied to the entire surface of the substrate.
After the resistance heating evaporation to a thickness of m, the SiO was changed to λ / 2 (λ = 55
0 nm) Vapor deposition was performed by resistance heating, and it was taken out from the vacuum vapor deposition machine.

【0019】上記基板を純水に浸し、超音波洗浄器で5
分間洗浄を施して上記レジストをその上の蒸着膜ごと除
去した後、温風乾燥し、図2に示すようなアルミニウム
のパターンミラーを得た。
The above substrate is immersed in pure water, and 5
After washing for minutes, the resist was removed together with the deposited film thereon, followed by drying with warm air to obtain an aluminum pattern mirror as shown in FIG.

【0020】本実施例で得られたパターンミラーは、透
光部4の形状が真円に近く、且つ、傷等の外観欠陥がな
く、非常に良好に形成されていた。
In the pattern mirror obtained in this embodiment, the shape of the light transmitting portion 4 was close to a perfect circle, and there was no appearance defect such as a scratch, and the pattern mirror was formed very well.

【0021】[比較例1]実施例1と同じ基板を用意
し、図4に示す2種類のマスクを用いて実施例1と同じ
蒸着工程を行なった。即ち、先ず図4(a)のマスクで
遮蔽して蒸着を行なうことにより、図5のパターン形状
に蒸着膜51を得、さらに図4(b)のマスクを用いて
蒸着を行なうことで実施例1と同じパターンのアルミニ
ウムパターンミラーを得た。
Comparative Example 1 The same substrate as in Example 1 was prepared, and the same deposition process as in Example 1 was performed using two types of masks shown in FIG. That is, first, the vapor deposition is performed by shielding with the mask of FIG. 4A to obtain the vapor deposition film 51 in the pattern shape of FIG. 5, and the vapor deposition is further performed by using the mask of FIG. An aluminum pattern mirror having the same pattern as in No. 1 was obtained.

【0022】本比較例においては、マスクエッヂと基板
のすき間に膜が回り込んで、エッヂがぼやけてしまっ
た。また、2枚のマスクのつなぎ目でズレが生じ、真円
が形成できなかった。
In this comparative example, the film wrapped around the gap between the mask edge and the substrate, and the edge was blurred. In addition, deviation occurred at the joint between the two masks, and a perfect circle could not be formed.

【0023】[比較例2]図3に示す工程によって実施
例1と同じパターンのアルミニウムパターンミラーを作
製した。即ち、実施例1と同じ基板1上にポジ型レジス
トを厚さ3μmになるようにスピンコートしてレジスト
層31を形成し(図3(a))、フォトマスク32を介
して露光機により紫外線を20秒間照射し(図3
(b))、その後アッシングを行ない、レジスト33を
形成した(図3(c))。
Comparative Example 2 An aluminum pattern mirror having the same pattern as in Example 1 was manufactured by the steps shown in FIG. That is, a positive resist is spin-coated on the same substrate 1 as in Example 1 so as to have a thickness of 3 μm to form a resist layer 31 (FIG. 3A). For 20 seconds (Fig. 3
(B)) Then, ashing was performed to form a resist 33 (FIG. 3C).

【0024】上記基板全面に実施例1と同様にアルミニ
ウムとSiOを蒸着し(図3(d))、基板裏面より露
光し、アッシングすることによりレジスト33をその上
の蒸着膜ごと除去することにより、実施例1と同じパタ
ーンのアルミニウムパターンミラーを得た。
Aluminum and SiO are vapor-deposited on the entire surface of the substrate in the same manner as in Example 1 (FIG. 3D), and the resist 33 is removed together with the vapor-deposited film thereon by exposing and ashing from the rear surface of the substrate. Then, an aluminum pattern mirror having the same pattern as in Example 1 was obtained.

【0025】本比較例においては、蒸着膜と基板の密着
力を上げるための基板加熱を行うことができないので、
でき上りの膜の基板への密着力が弱かった。
In this comparative example, the substrate cannot be heated to increase the adhesion between the deposited film and the substrate.
The adhesion of the resulting film to the substrate was weak.

【0026】上記実施例1、比較例1、2の工程のフロ
ーチャートを図8に示す。図中(a)が実施例1、
(b)が比較例1、(c)が比較例2である。フォトリ
ソ技術を用いた(c)は、工程が長いばかりでなく、フ
ォトリソ用装置が高価であるため、得られる光学部材も
高価になってしまう。また、成膜工程は真空排気時間を
要するため、工程全体に占める時間割合が大きい。従っ
て、なるべく成膜工程数は少なくする方が有利である
が、(b)では島状の開口部を形成するために複数枚の
マスクを組み合わせる必要があるため、成膜回数が増
え、時間的に不利である。
FIG. 8 shows a flow chart of the steps of Example 1 and Comparative Examples 1 and 2. (A) in the figure is Example 1,
(B) is Comparative Example 1 and (c) is Comparative Example 2. In the case of (c) using the photolithography technique, not only the process is long but also the photolithography equipment is expensive, so that the obtained optical member is also expensive. In addition, since the film formation step requires evacuation time, the time ratio in the entire process is large. Therefore, it is advantageous to reduce the number of film formation steps as much as possible. However, in FIG. 3B, since it is necessary to combine a plurality of masks to form an island-shaped opening, the number of film formations is increased, and time is reduced. Disadvantageous.

【0027】[実施例2]100mm×100mmで1
mm厚のアクリル基板に、1mmピッチで500μmの
線幅のストライプパターンをインクジェット法により描
画した。ここで用いたレジストは、純水に15重量%の
エチレングリコール、固形成分として粒径2μm以下の
カーボンブラックを8重量%、ヘキサノールを5重量
%、混合分散したものを使用した。
Example 2 1 × 100 mm × 100 mm
A stripe pattern having a line width of 500 μm was drawn at a pitch of 1 mm on an acrylic substrate having a thickness of mm by an inkjet method. The resist used here was a mixture obtained by mixing and dispersing 15% by weight of ethylene glycol in pure water, 8% by weight of carbon black having a particle size of 2 μm or less as a solid component, and 5% by weight of hexanol.

【0028】上記基板を50℃で10分間乾燥した後、
スパッタ装置のチャンバーにセットし、10分間排気し
た。この後、RFスパッタリング法によりアルミニウム
ターゲットを酸化雰囲気中でスパッタした。この時の条
件は、Arガス流量80sccm及びO2 ガス流量10
sccmで、真空度が0.8Paであった。RF放電パ
ワーは500Wで、成膜速度は3nm/秒であった。こ
の条件で51秒間スパッタを行ない、厚さ153nmの
アルミナ膜を得た。
After drying the substrate at 50 ° C. for 10 minutes,
It was set in the chamber of the sputtering device and evacuated for 10 minutes. Thereafter, an aluminum target was sputtered in an oxidizing atmosphere by an RF sputtering method. The conditions at this time are as follows: Ar gas flow rate 80 sccm and O 2 gas flow rate 10
At a sccm, the degree of vacuum was 0.8 Pa. The RF discharge power was 500 W and the deposition rate was 3 nm / sec. Sputtering was performed under these conditions for 51 seconds to obtain an alumina film having a thickness of 153 nm.

【0029】引き続き、同一チャンバー内に配置してあ
るSiO2 ターゲットをスパッタした。この時の条件
は、放電ガス圧及びパワーは上記アルミニウムターゲッ
トの時と同じ条件で、成膜速度は5nm/秒とした。こ
の条件で17秒間スパッタを行ない、85nm厚のSi
2 膜を得た。
Subsequently, the SiO 2 target placed in the same chamber was sputtered. At this time, the discharge gas pressure and power were the same as those for the aluminum target, and the film formation rate was 5 nm / sec. Sputtering is performed under these conditions for 17 seconds, and 85 nm thick Si
An O 2 film was obtained.

【0030】その後、スパッタ装置より基板を取り出
し、エタノールにより超音波洗浄を10分間施して、上
記レジストをその上の蒸着膜ごと除去し、ストライプ状
の反射防止膜付きアクリル基板を得た。
Thereafter, the substrate was taken out of the sputtering apparatus and subjected to ultrasonic cleaning with ethanol for 10 minutes to remove the resist together with the deposited film thereon, thereby obtaining a striped acrylic substrate having an antireflection film.

【0031】[0031]

【発明の効果】以上説明したように、本発明によれば、
複雑な工程或いは高価な装置を要する工程を経ることな
く、微細で複雑なパターンの光学薄膜を有する光学部材
を容易に形成することができる。
As described above, according to the present invention,
An optical member having an optical thin film with a fine and complicated pattern can be easily formed without going through complicated steps or steps requiring expensive equipment.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の製造方法の工程を示す断面模式図であ
る。
FIG. 1 is a schematic cross-sectional view showing steps of a manufacturing method according to the present invention.

【図2】本発明の実施例1で形成したアルミニウムパタ
ーンミラーを示す図である。
FIG. 2 is a view showing an aluminum pattern mirror formed in Example 1 of the present invention.

【図3】本発明の比較例2の工程を示す断面模式図であ
る。
FIG. 3 is a schematic cross-sectional view showing a process of Comparative Example 2 of the present invention.

【図4】本発明の比較例1で用いたマスクを示す図であ
る。
FIG. 4 is a view showing a mask used in Comparative Example 1 of the present invention.

【図5】本発明の比較例1において、第一の成膜工程で
得られた蒸着膜を示す図である。
FIG. 5 is a view showing a deposited film obtained in a first film forming step in Comparative Example 1 of the present invention.

【図6】本発明の光学部材を用いた視線入力光学系の模
式図である。
FIG. 6 is a schematic diagram of a line-of-sight input optical system using the optical member of the present invention.

【図7】図6に示した光学系に用いた光学部材を示す図
である。
FIG. 7 is a diagram showing an optical member used in the optical system shown in FIG.

【図8】本発明の実施例及び比較例のフローチャートで
ある。
FIG. 8 is a flowchart of an example of the present invention and a comparative example.

【符号の説明】[Explanation of symbols]

1 透明基板 2 レジスト 3 光学薄膜 4 透光領域 31 レジスト層 32 フォトマスク 33 レジスト 51 蒸着膜 61 観察光学素子 62 画像表示手段 63 赤外光源 64 結像光学系 65 クサビプリズム 66 受光素子 REFERENCE SIGNS LIST 1 transparent substrate 2 resist 3 optical thin film 4 light-transmitting region 31 resist layer 32 photomask 33 resist 51 deposited film 61 observation optical element 62 image display means 63 infrared light source 64 imaging optical system 65 wedge prism 66 light receiving element

フロントページの続き (72)発明者 岩田 研逸 東京都大田区下丸子3丁目30番2号 キヤ ノン株式会社内Continuation of the front page (72) Inventor Kenichi Iwata 3-30-2 Shimomaruko, Ota-ku, Tokyo Inside Canon Inc.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 透明基板上に光学薄膜パターンを有する
光学部材の製造方法であって、透明基板上にインクジェ
ット法によりレジスト材を付与してレジストを形成する
工程と、透明基板全面に光学薄膜を形成する工程と、上
記レジストをその上の光学薄膜ごと除去して透明基板上
に所定のパターン形状の光学薄膜を残す工程と、を有す
ることを特徴とする光学部材の製造方法。
1. A method for manufacturing an optical member having an optical thin film pattern on a transparent substrate, comprising: applying a resist material on the transparent substrate by an inkjet method to form a resist; A method for manufacturing an optical member, comprising: a step of forming; and a step of removing the resist together with the optical thin film thereon to leave an optical thin film having a predetermined pattern on a transparent substrate.
【請求項2】 透明基板上に光学薄膜パターンを有し、
請求項1記載の製造方法により製造されたことを特徴と
する光学部材。
2. An optical thin film pattern on a transparent substrate,
An optical member manufactured by the manufacturing method according to claim 1.
JP9158212A 1997-06-16 1997-06-16 Optical member and its production Withdrawn JPH116050A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9158212A JPH116050A (en) 1997-06-16 1997-06-16 Optical member and its production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9158212A JPH116050A (en) 1997-06-16 1997-06-16 Optical member and its production

Publications (1)

Publication Number Publication Date
JPH116050A true JPH116050A (en) 1999-01-12

Family

ID=15666740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9158212A Withdrawn JPH116050A (en) 1997-06-16 1997-06-16 Optical member and its production

Country Status (1)

Country Link
JP (1) JPH116050A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1496731A1 (en) * 2002-04-15 2005-01-12 National Institute of Advanced Industrial Science and Technology Fast production method for printed board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1496731A1 (en) * 2002-04-15 2005-01-12 National Institute of Advanced Industrial Science and Technology Fast production method for printed board
EP1496731A4 (en) * 2002-04-15 2008-10-22 Nat Inst Of Advanced Ind Scien Fast production method for printed board

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