JPH1148115A - Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same - Google Patents

Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same

Info

Publication number
JPH1148115A
JPH1148115A JP15326998A JP15326998A JPH1148115A JP H1148115 A JPH1148115 A JP H1148115A JP 15326998 A JP15326998 A JP 15326998A JP 15326998 A JP15326998 A JP 15326998A JP H1148115 A JPH1148115 A JP H1148115A
Authority
JP
Japan
Prior art keywords
sphere
grinding
polishing
housing
rotating shaft
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15326998A
Other languages
Japanese (ja)
Inventor
Nobuo Sakai
信雄 坂井
Ken Ishida
研 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui High Tec Inc
Original Assignee
Mitsui High Tec Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui High Tec Inc filed Critical Mitsui High Tec Inc
Priority to JP15326998A priority Critical patent/JPH1148115A/en
Publication of JPH1148115A publication Critical patent/JPH1148115A/en
Pending legal-status Critical Current

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Landscapes

  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a device for grinding and polishing a sphere with high grinding and polishing efficiency, and suitable for relatively easy production of the sphere of high sphericity. SOLUTION: This device is provided with a freely rotating and vertically movable rotary shaft 7 with a passing groove for a worked sphere formed into a spiral shape in its periphery, and a housing 11 arranged in an outer periphery of the shaft 7 and having a grinding and polishing surface in its inner surface. An outer circumferential surface of a sphere is ground and polished into a sphere of high sphericity during a period when the worked sphere is rotatingly moved through the passing groove 6 formed into the spiral shape in the outer periphery of the rotary shaft 7 while contacting with an inner surface of the housing 11 for grinding and polishing. This device is applicable not only for a semiconductor silicon sphere as the worked sphere but also for a steel sphere, ceramic sphere and resin sphere, the worked sphere having sizes of about 0.1 mm-10 mm can be ground and polished with high sphericity, and high sphericity within ±0.2 μm of a roundness error is attained in the case of a sphere of 1 mm diameter.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、球状の単結晶シリ
コンあるいは多結晶シリコンのような球体の研削研磨に
関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to grinding and polishing of a sphere such as spherical single-crystal silicon or polycrystalline silicon.

【0002】[0002]

【従来の技術】従来から、半導体装置の形成に際して
は、板状単結晶シリコンウェハー上に回路パターンを形
成し、これを必要に応じてダイシングすることにより半
導体チップを形成するに際して球状の単結晶シリコン上
に回路パターンを形成する技術が知られている。
2. Description of the Related Art Conventionally, when a semiconductor device is formed, a circuit pattern is formed on a plate-like single-crystal silicon wafer, and this is diced as needed to form a spherical single-crystal silicon when forming a semiconductor chip. A technique for forming a circuit pattern thereon is known.

【0003】ここで用いられる球状シリコンは真球であ
ることが要求されるが、球状の半導体チップに対するニ
ーズがなかったこともあって、研削研磨装置は、シリコ
ンウェハー用のものしか実用化されておらず、球状の単
結晶シリコンを研削研磨するための装置は提案もなされ
ていない。
[0003] The spherical silicon used here is required to be a true sphere, but there is no need for a spherical semiconductor chip. Therefore, only grinding and polishing apparatuses for silicon wafers have been commercialized. No device has been proposed for grinding and polishing spherical single-crystal silicon.

【0004】従来、球状体の研削研磨装置としては、パ
チンコ球及びべアリングなどの製造に用いられる装置が
ある。しかしながら、このような研削研磨装置では、真
球度および鏡面であることを厳しく要求される上、キズ
が付き易く酸化され易い上汚染に対して深刻である球状
シリコンを多数、且つ、連続的にインライン化して生産
することは難しい。
Conventionally, as a grinding and polishing apparatus for a spherical body, there is an apparatus used for manufacturing pachinko balls and bearings. However, in such a grinding and polishing apparatus, in addition to being strictly required to have a sphericity and a mirror surface, a large amount of spherical silicon which is easily scratched, easily oxidized, and serious for contamination, and is continuously produced. It is difficult to produce inline.

【0005】[0005]

【発明が解決しようとする課題】本発明は、研削研磨効
率が高く、比較的簡単に真球度の高い、例えば単結晶シ
リコン球体のような球体の生産に適した球体研削研磨装
置を提供する。
SUMMARY OF THE INVENTION The present invention provides a sphere grinding and polishing apparatus which has a high grinding and polishing efficiency and is relatively easy to produce a sphere such as a single crystal silicon sphere having a high sphericity. .

【0006】[0006]

【課題を解決するための手段】本発明の球体研削研磨装
置は、被加工球状体の通行溝を外周に螺旋状に形成した
回転ならびに上下動自在な回転軸と、この回転軸の外周
に配置され、その内面に研削研磨面を有するハウジング
を備えている。
SUMMARY OF THE INVENTION A spherical grinding and polishing apparatus according to the present invention comprises: a rotating shaft having a passage formed in a helical shape formed on the outer periphery of a spherical body to be worked; And a housing having a ground and polished surface on its inner surface.

【0007】これによって、被加工球状体が回転軸の外
周面に螺旋状に形成した通行溝を研削研磨用ハウジング
内面に接して回転移動している間に、球状体の外周面は
真球状に研削研磨される。
Thus, the outer peripheral surface of the spherical body is formed into a true spherical shape while the processing spherical body is rotationally moved in contact with the inner surface of the housing for grinding and polishing in a spirally formed passage groove formed on the outer peripheral surface of the rotating shaft. It is ground and polished.

【0008】本発明の装置は、被加工球状体としては、
半導体シリコン球体に限らず鋼球、セラミック球、樹脂
球にも適用でき、また、被加工球状体の大きさは0.1
mm程度から10mm径程度まで真球状に研削研磨で
き、1mm径の球体の場合、真円の誤差が±0.2μm
以内の高い真球度を得ることができる。
In the apparatus of the present invention, the spherical body to be processed is
It can be applied not only to a semiconductor silicon sphere but also to a steel sphere, a ceramic sphere, and a resin sphere.
It can be ground and polished from a diameter of about 10 mm to a diameter of about 10 mm. In the case of a sphere with a diameter of 1 mm, the error of a perfect circle is ± 0.2 μm.
High sphericity within the range can be obtained.

【0009】[0009]

【発明の実施の形態】本発明の実施の形態を1mm径の
半導体用の球状基板としての単結晶シリコン球体の製造
に適用した実施例に基づいて説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described based on an example in which the present invention is applied to the production of a single-crystal silicon sphere as a spherical substrate for a semiconductor having a diameter of 1 mm.

【0010】実施例1 図1は、本発明の実施例に係る球体研削研磨装置10の
全体構造を示す。
Embodiment 1 FIG. 1 shows the entire structure of a sphere grinding and polishing apparatus 10 according to an embodiment of the present invention.

【0011】同図において、1は装置の基台であって、
その基台1には、設けられた上下動ガイド2に支持さ
れ、上下ストローク用シリンダー3とサポーター4によ
って上下動する支え台5が配置されている。
In FIG. 1, reference numeral 1 denotes a base of the apparatus,
The base 1 is provided with a support base 5 supported by a vertical movement guide 2 provided and vertically moved by a vertical stroke cylinder 3 and a supporter 4.

【0012】この支え台5には、その外周面に螺旋状に
被研削研磨球体である単結晶シリコン球状体の通行溝6
を形成した回転軸7が、回転可能、上下動可能に取り付
けられている。また、回転軸の外周に設けられた通行溝
6は、研削領域において下方にいくにしたがって深さが
次第に浅くなるように構成することができる。
A support groove 5 is formed on the outer peripheral surface of the support groove 5 so as to have a spiral groove of a single-crystal silicon spherical body which is a polished spherical ball.
Is mounted to be rotatable and vertically movable. Further, the passage groove 6 provided on the outer periphery of the rotating shaft can be configured so that the depth gradually decreases as it goes down in the grinding area.

【0013】8は、回転軸7を回転駆動するための回転
用モーターであり、9はこの回転力を回転軸7に伝達す
るためカップリングを示す。
Reference numeral 8 denotes a rotation motor for driving the rotation shaft 7 to rotate. Reference numeral 9 denotes a coupling for transmitting the rotation force to the rotation shaft 7.

【0014】さらに、この回転軸7の外周面に沿ってハ
イス鋼、ダイス鋼等の合金鋼の他、セラミックなど任意
の硬質材によって形成されたハウジング11が設けら
れ、このハウジング11の斜め上方には単結晶シリコン
球状体Mを収納したホッパー12が配設されている。そ
してホッパー12内の球状体Mは重力によってシュート
13を経て、回転軸7の通行溝6とハウジング11の間
に供給され、回転軸7の上下動と回転によって、ハウジ
ング11の内面に形成された砥粒層に摺動接触し、その
外周面は一様に研削研磨されて真球状に仕上げられる。
Further, a housing 11 made of an arbitrary hard material such as ceramics in addition to alloy steels such as high-speed steel and die steel is provided along the outer peripheral surface of the rotary shaft 7. Is provided with a hopper 12 containing a single crystal silicon spherical body M. The spherical body M in the hopper 12 is supplied between the passage groove 6 of the rotating shaft 7 and the housing 11 through the chute 13 by gravity, and is formed on the inner surface of the housing 11 by the vertical movement and rotation of the rotating shaft 7. It comes into sliding contact with the abrasive layer, and its outer peripheral surface is uniformly ground and polished to be finished into a true spherical shape.

【0015】14は、ハウジング11の研磨領域の下流
側に、その研磨領域より径を大きくして形成した溜り部
分であって、研磨の終了した球状体は、溜り部分14に
一時的に収納した後、整列され、次の回路パターン形成
工程へと供給するようにすることが可能となる。これに
よって、研磨の終了した球状体は外気に触れることな
く、連続してパターン形成を行うことが可能となる。シ
リコンは酸化され易いため、外気に触れると自然酸化膜
が形成され、コンタクト抵抗の低下などを招くことが多
々あり、また、汚染によるショートの発生などの問題は
解消する。
Reference numeral 14 denotes a pool portion formed on the downstream side of the polishing area of the housing 11 with a diameter larger than that of the polishing area. The polished spherical body is temporarily stored in the pool section 14. Thereafter, they are aligned and can be supplied to the next circuit pattern forming step. Thus, the polished spherical body can continuously form a pattern without contacting the outside air. Since silicon is easily oxidized, a natural oxide film is formed when exposed to outside air, which often leads to a reduction in contact resistance and the like, and also eliminates problems such as occurrence of short circuit due to contamination.

【0016】この実施例の場合には、さらに、溜り部分
14に、洗浄水を供給する洗浄水供給部31と、洗浄後
の洗浄水を排出する洗浄水排出部32とを配設してい
る。これらの配置と数は、必要に応じて任意数、任意の
間隔で設置することができる。これによって、研磨の終
了した被加工球状体を、一時的に収納している間に洗浄
することになり、製造に要する時間の低減を図ることが
可能となる。さらにその洗浄水供給部31と洗浄水排出
部32の下流側には、不活性ガス供給口33、および不
活性ガス排出口34が形成されている。これによって、
洗浄の完了した被加工球状体を乾燥することが可能とな
る。また、18は、球体の研削研磨の促進剤としての研
磨剤を供給する装置である。図2はハウジング11の断
面を示す。同図において、上下動可能なこの回転軸7
は、金属製であり、外周面に、その全長にわたって形成
された螺旋状の通行溝6は、供給された球状体がその溝
内で自在に回転できるように、供給される球体Mより、
僅かに大きい径を有し、球体Mの径の例えば、ほぼ半分
のその深さを有する断面が半円形をなすように形成され
ている。
In the case of this embodiment, a washing water supply unit 31 for supplying washing water and a washing water discharge unit 32 for discharging washing water after washing are further provided in the pool portion 14. . These arrangements and numbers can be set at any number and at any intervals as needed. As a result, the polished spherical body to be processed is washed while it is temporarily stored, so that the time required for manufacturing can be reduced. Further, an inert gas supply port 33 and an inert gas discharge port 34 are formed downstream of the cleaning water supply section 31 and the cleaning water discharge section 32. by this,
It is possible to dry the processed spherical body after the cleaning. Reference numeral 18 denotes an apparatus for supplying an abrasive as an accelerator for grinding and polishing a sphere. FIG. 2 shows a cross section of the housing 11. In FIG.
Is made of metal, and the spiral passage groove 6 formed on the outer peripheral surface over the entire length thereof is formed from the supplied sphere M so that the supplied spherical body can freely rotate in the groove.
It has a slightly larger diameter, and is formed such that a cross section having a depth, for example, approximately half the diameter of the sphere M forms a semicircle.

【0017】回転軸7の外周に配置されたハウジング1
1の内面は、供給される球体の装入時から仕上げまでの
球体の径に応じて上方から下方に縮径した研削領域15
と、ほぼ垂直に形成された仕上げ研磨のための研磨領域
16に分離される。研削領域15は、研削に適したダイ
ヤモンドやボラゾンからなる砥粒層からなり、研磨領域
16は、仕上げのための微細なダイヤモンドやボラゾン
等からなる砥粒層から形成されている。
The housing 1 arranged on the outer periphery of the rotating shaft 7
1 has a grinding area 15 reduced in diameter from above to below in accordance with the diameter of the sphere from when the sphere to be supplied is charged to when it is finished.
Then, it is separated into a polishing region 16 for finish polishing which is formed almost vertically. The grinding region 15 is made of an abrasive layer made of diamond or borazon suitable for grinding, and the polishing region 16 is made of an abrasive layer made of fine diamond or borazon for finishing.

【0018】この研削領域15及び研磨領域16の長さ
は、被研削研磨球体の硬さ、大きさ、目標仕上面の緻密
さ等により変更することが望ましい。
The lengths of the grinding region 15 and the polishing region 16 are desirably changed depending on the hardness and size of the ball to be ground and the density of the target surface.

【0019】上記図1と図2に示す装置において、供給
シュート13から、回転軸7とハウジング11との上端
開口17から研削領域15に供給される球体Mは、研磨
剤供給装置18から供給される研磨剤と共に、回転軸7
の回転と上下動によって回転しながら研削領域15の砥
粒層と強制接触されて球体Mの外周面は一様に研削さ
れ、次いで、研磨領域16で仕上げ研磨される。研磨剤
の供給量は、研削・研磨の進行度により適宜変更され
る。
In the apparatus shown in FIGS. 1 and 2, the sphere M supplied from the supply chute 13 to the grinding area 15 from the upper end opening 17 of the rotating shaft 7 and the housing 11 is supplied from the abrasive supply device 18. Rotating shaft 7
The outer surface of the sphere M is ground uniformly by being forcedly brought into contact with the abrasive layer in the grinding area 15 while being rotated by the rotation and vertical movement of the sphere M, and then is finished polished in the polishing area 16. The supply amount of the abrasive is appropriately changed depending on the degree of progress of the grinding and polishing.

【0020】さらにまた、前記溜り部分14は、整列し
た被加工球状体を、1つずつ順次送出する送出管30を
具備している。望ましくは、この送出管30内に旋回流
形成手段を配設し、この旋回流にのせて、被加工球状体
を搬送するようにしてもよい。これにより、表面にキズ
が付くのを防ぐことができ、形成される回路パターンの
不良発生率を低減することができる。
Further, the reservoir portion 14 is provided with a delivery pipe 30 for sequentially delivering the aligned workpieces one by one. Desirably, a swirl flow forming means may be provided in the delivery pipe 30, and the spherical body to be processed may be conveyed on the swirl flow. Thereby, it is possible to prevent the surface from being scratched, and it is possible to reduce the defect occurrence rate of the formed circuit pattern.

【0021】また、研磨の終了した単結晶シリコン球状
体は、必要に応じてカソード水洗浄あるいはアノード水
洗浄工程を経て、乾燥せしめられ、後続の回路パターン
形成工程へと導かれる。このとき、単結晶シリコン球状
体を外気に接触させることなく、次の成膜工程へと導く
ようにすることも可能であり、汚染を防ぎ、収率の向上
をはかることも可能である。
The polished single-crystal silicon sphere is dried through a cathode water washing or anode water washing step, if necessary, and led to a subsequent circuit pattern forming step. At this time, the single-crystal silicon spherical body can be led to the next film forming step without contacting with the outside air, so that contamination can be prevented and the yield can be improved.

【0022】なお、前記ハウジングは、前記回転軸の通
行溝表面との距離が次第に減少するように、断面テーパ
ー状に形成された研削領域と、前記研削領域に隣接して
配設され、前記回転軸の通行溝表面との距離が一定とな
るように、断面が直線状に形成された研磨領域とを具備
するように構成することもできる。
The housing is disposed adjacent to the grinding region having a tapered cross-section so that the distance between the housing and the surface of the passage groove of the rotary shaft is gradually reduced. It is also possible to provide a polishing region having a linear cross section so that the distance between the shaft and the surface of the passage groove is constant.

【0023】実施例2 図3は、ハウジング11が、直列の第1の分室11Aお
よび第2の11Bに分割された例を示し、第1の分室1
1Aでは研削加工が行われ、第2の分室11Bでは研磨
加工が行われる。
Embodiment 2 FIG. 3 shows an example in which the housing 11 is divided into a first compartment 11A and a second compartment 11B in series.
In 1A, grinding is performed, and in the second compartment 11B, polishing is performed.

【0024】実施例3 図4は、ハウジングを水平に配置した例を示す。この水
平配置によって砥液が均一に被加工単結晶球状体に接触
し、より高い真球度を得ることが可能となる。この例の
場合、ハウジング11Sは水平方向に設けられ、その長
手方向に沿って、所定の間隔を隔ててハウジング11S
の周面上部に設けられた複数の砥液供給口28と、前記
ハウジングの周面下部には砥液排出口29が配設されて
いる。これによって、砥液がより均一にシリコン単結晶
球状体に接触し、良好に排出され、高効率で信頼性の高
い鏡面を得ることが可能となる。複数の砥液供給口28
は、ハウジングの周面上部に設けられ、砥液排出口29
は前記ハウジングの周面下部に設けられており、その方
向は転換可能である。
Embodiment 3 FIG. 4 shows an example in which the housing is arranged horizontally. With this horizontal arrangement, the abrasive liquid uniformly contacts the single crystal spherical body to be processed, and higher sphericity can be obtained. In the case of this example, the housing 11S is provided in the horizontal direction, and the housing 11S is provided at a predetermined interval along the longitudinal direction.
A plurality of abrasive fluid supply ports 28 are provided in the upper part of the peripheral surface, and a abrasive liquid outlet 29 is provided in the lower part of the peripheral surface of the housing. As a result, the polishing liquid comes into contact with the silicon single crystal spherical body more uniformly, is discharged well, and a highly efficient and highly reliable mirror surface can be obtained. Multiple abrasive fluid supply ports 28
Is provided at the upper part of the peripheral surface of the housing,
Is provided at the lower part of the peripheral surface of the housing, and its direction can be changed.

【0025】さらに、上記実施例に示すハウジングを被
加工球状体の通行溝を内周に螺旋状に形成した回転なら
びに上下動自在なハウジングとし、このハウジング内に
通行溝を通る被加工球状体の外周を摺動せしめる研削研
磨面を有する摺動軸を設けた構造とすることもできる。
Further, the housing shown in the above embodiment is a housing in which the passage of the spherical body to be processed is spirally formed on the inner periphery and is freely rotatable and movable up and down. A structure in which a sliding shaft having a ground and polished surface for sliding the outer periphery may be provided.

【0026】[0026]

【発明の効果】本発明によって以下の効果を奏する。According to the present invention, the following effects can be obtained.

【0027】(1) その材質を問わず真球度の高い球
体を一工程で得ることができる。
(1) A sphere with high sphericity can be obtained in one step regardless of its material.

【0028】(2) 研削と研磨の二種類の表面加工を
同時に行うことができるので製造効率が高い。
(2) Since two types of surface processing, grinding and polishing, can be performed simultaneously, the production efficiency is high.

【0029】(3) キズが付き易く酸化され易いシリ
コン球表面を極めて良好に鏡面研磨し、回路素子形成工
程へと導くことができる。
(3) The surface of a silicon sphere which is easily scratched and easily oxidized can be extremely well mirror-polished, leading to a circuit element forming step.

【0030】(4) 全体構造がユニット部品からなる
ために、組立てが簡単で、保守整備性に優れている。
(4) Since the entire structure is made up of unit parts, assembly is simple and maintenance is excellent.

【0031】(5) 回転軸及び研削研磨ハウジング
は、その機能を低減することなく、多様な球径に対して
も柔軟に対応することができる。
(5) The rotating shaft and the grinding and polishing housing can flexibly cope with various ball diameters without reducing their functions.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の実施例にかかる球体研削研磨装置の
全体構造を示す。
FIG. 1 shows the overall structure of a sphere grinding and polishing apparatus according to an embodiment of the present invention.

【図2】 ハウジングの断面構造の第1の例を示す。FIG. 2 shows a first example of a sectional structure of a housing.

【図3】 ハウジングの断面構造の他の例を示す。FIG. 3 shows another example of the sectional structure of the housing.

【図4】 ハウジングの断面構造のさらに他の例を示
す。
FIG. 4 shows still another example of the sectional structure of the housing.

【符号の説明】[Explanation of symbols]

1 基台 2 上下動ガイド 3 上下ストロ
ーク用シリンダー 4 サポーター 5 支え台 6 球状体の通
行溝 7 回転軸 8 回転用モーター 9 カップリング 10
球体研削研磨装置 11、11S ハウジング 11A、11B 分室
12 ホッパー 13 シュート 14 研磨済み球状体の溜まり部
分 15 研削領域 16 研磨領域 1
7 上端開口 18 研磨剤供給装置 28 砥液供給口 29 砥液排出口 M 球
DESCRIPTION OF SYMBOLS 1 Base 2 Vertical movement guide 3 Vertical stroke cylinder 4 Supporter 5 Support base 6 Spherical passage groove 7 Rotation shaft 8 Rotation motor 9 Coupling 10
Spherical grinding and polishing apparatus 11, 11S Housing 11A, 11B Compartment 12 Hopper 13 Chute 14 Reservoir of polished sphere 15 Grinding area 16 Polishing area 1
7 Upper end opening 18 Abrasive supply device 28 Abrasive liquid supply port 29 Abrasive liquid outlet M sphere

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 被加工球状体の通行溝を外周に螺旋状に
形成した回転ならびに上下動自在な回転軸と、この回転
軸の外周に配置され、前記通行溝を通る被加工球状体の
外周を摺動せしめる研削研磨面を有するハウジングとを
備えたことを特徴とする球体研削研磨装置。
1. A rotating shaft having a passage formed in a spiral shape formed on the outer periphery of a spherical body to be processed and movable freely up and down, and an outer periphery of the spherical body arranged on the outer periphery of the rotating shaft and passing through the passage groove. And a housing having a ground and polished surface for sliding the sphere.
【請求項2】 ハウジングの設置上部に臨ませて研磨剤
供給装置を設けたことを特徴とする請求項1に記載の球
体研削研磨装置。
2. The sphere grinding and polishing apparatus according to claim 1, wherein an abrasive supply device is provided so as to face an installation upper portion of the housing.
【請求項3】 研削研磨ハウジングは、回転軸の通行溝
表面との距離が次第に減少するように、断面テーパー状
に形成された研削領域と、この研削領域に隣接して配設
され、且つ、回転軸の通行溝表面との距離が一定となる
ように、断面が直線状に形成された研磨領域とを具備し
たことを特徴とする請求項1または請求項2に記載の球
体研削研磨装置。
3. The grinding and polishing housing is provided with a grinding region formed in a tapered cross section and adjacent to the grinding region so that the distance between the rotating shaft and the surface of the passage groove is gradually reduced, and 3. The sphere grinding and polishing apparatus according to claim 1, further comprising: a polishing region having a linear cross section so that a distance between the rotating shaft and a surface of the passage groove is constant.
【請求項4】 研削研磨ハウジングの研削領域は、ダイ
ヤモンド砥粒層からなることを特徴とする請求項1から
請求項3の何れかに記載の球体研削研磨装置。
4. The sphere grinding and polishing apparatus according to claim 1, wherein the grinding area of the grinding and polishing housing is made of a diamond abrasive layer.
【請求項5】 研削研磨ハウジングは、直列に接続され
た複数の分室に分割されている請求項1から請求項3の
何れかに記載の球体研削研磨装置。
5. The sphere grinding and polishing apparatus according to claim 1, wherein the grinding and polishing housing is divided into a plurality of compartments connected in series.
【請求項6】 研削研磨ハウジングは、垂直方向に設け
られている請求項1から請求項5の何れかに記載の球体
研削研磨装置。
6. The sphere grinding and polishing apparatus according to claim 1, wherein the grinding and polishing housing is provided in a vertical direction.
【請求項7】 研削研磨ハウジングは、水平方向に設け
られている請求項1から請求項5の何れかに記載の球体
研削研磨装置。
7. The sphere grinding and polishing apparatus according to claim 1, wherein the grinding and polishing housing is provided in a horizontal direction.
【請求項8】 被加工球状体の通行溝を外周に螺旋状に
形成した回転ならびに上下動自在な回転軸と、この回転
軸の外周に配置され、前記通行溝を通る被加工球状体の
外周を摺動せしめる研削研磨面を有するハウジングとを
備えた球体研削研磨装置を使用するシリコン球の研削研
磨方法であって、 前記装置の通行溝に、シリコン球を供給し、前記回転軸
を回転させることにより、前記シリコン球を前記研削研
磨面に摺動せしめることにより、研削および研磨を行
い、表面が鏡面研磨されたシリコン球を得るようにした
ことを特徴とするシリコン球の研削研磨方法。
8. A rotating shaft which is formed on the outer periphery of a passage groove of the spherical body to be processed in a spiral shape and is rotatable and movable up and down, and an outer periphery of the spherical body arranged on the outer periphery of the rotating shaft and passing through the passage groove. And a housing having a ground and polished surface that slides the sphere. A method for grinding and polishing a silicon sphere using a sphere grinding and polishing apparatus, comprising supplying a silicon sphere to a passage groove of the apparatus and rotating the rotating shaft. A method of grinding and polishing a silicon sphere, wherein the silicon sphere is slid on the ground and polished surface to perform grinding and polishing to obtain a silicon sphere having a mirror-polished surface.
JP15326998A 1997-06-02 1998-06-02 Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same Pending JPH1148115A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15326998A JPH1148115A (en) 1997-06-02 1998-06-02 Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP9-144366 1997-06-02
JP14436697 1997-06-02
JP15326998A JPH1148115A (en) 1997-06-02 1998-06-02 Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same

Publications (1)

Publication Number Publication Date
JPH1148115A true JPH1148115A (en) 1999-02-23

Family

ID=26475797

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15326998A Pending JPH1148115A (en) 1997-06-02 1998-06-02 Device for grinding and polishing sphere, and grinding and polishing method for silicon sphere using the same

Country Status (1)

Country Link
JP (1) JPH1148115A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001013433A1 (en) * 1999-08-13 2001-02-22 Ball Semiconductor, Inc. Spherical shaped integrated circuit utilizing an inductor
CN107471086A (en) * 2017-09-26 2017-12-15 浙江工业大学 A kind of precise sphere processing unit (plant) based on screwing motion manner

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001013433A1 (en) * 1999-08-13 2001-02-22 Ball Semiconductor, Inc. Spherical shaped integrated circuit utilizing an inductor
CN107471086A (en) * 2017-09-26 2017-12-15 浙江工业大学 A kind of precise sphere processing unit (plant) based on screwing motion manner

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