JPH11338082A - Adjusting jig for image recognition device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To eliminate the need of the exchanging operation of a dedicated adjusting sample and an instrument and to improve the operability of adjusting operation by disposing a lens magnification adjusting reference gauge, a lens focusing pattern and an illuminance adjusting pattern on the upper surface of a metallic plate-like substrate. SOLUTION: As for this adjusting jig A, a plane part 2 is provided to be recessed on the upper surface of the metallic plate-like substrate 1. The lens magnification adjusting reference gauge 10, the lens focusing pattern 20 and the illuminace adjusting pattern 30 are formed on the plane part 2. The gauge 10 is constituted of square hole parts 11 and 12. The pattern 20 is constituted of a white part 21 and a black part 22 being squares. The pattern 30 is constituted of a light gray part 31 and a dark gray part 32 being the squares having the same area. The adjusting jig A is carried with electronic parts and visually confirmed by the camera of the image recognition device, and a visually confirmed image is displayed on a monitor.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an adjustment jig used for adjusting a camera in an image recognition device used in a process of manufacturing electronic components.

[0002]

2. Description of the Related Art Conventionally, in the manufacturing process of electronic parts,
In order to improve productivity, judgment of the appearance of a product, measurement of product dimensions, positioning of the product, and the like are performed using an image recognition device, and an automated manufacturing line is constructed.

When using such an image recognition device,
It is necessary for a camera that reads an image to have a high level of recognition capability, and it is necessary to constantly maintain the recognition capability of the camera at a certain level or higher.

In order to maintain the recognition ability of the camera, adjustment and confirmation are usually performed on three items of the lens magnification, lens focus, and illuminance of the camera before starting the inspection and measurement work by the image recognition device. Adjustments and confirmations are regularly performed on the above three items even during the inspection and measurement work.

The adjustment of the lens magnification is performed by mounting a sample for adjusting the lens magnification, reading the sample with a camera, measuring the image displayed on the monitor with a scale or the like, and correcting the measurement difference.

The adjustment of the lens focus is performed by attaching a sample for lens focus adjustment, reading the sample with a camera, and correcting the out-of-focus of the image displayed on the monitor.

The illuminance is adjusted by mounting an illuminometer and correcting the illuminance based on the measurement result of the illuminometer.

[0008]

However, in the adjustment work as described above, the work of attaching a special sample and a tool for each adjustment item, removing after checking and adjusting, and attaching another special sample and a tool again is repeated. And the work was very complicated.

In particular, in the adjustment of the lens magnification and the lens focus, since the judgment of the adjustment depends on the subjectivity of the adjustment operator, the adjustment level varies for each adjustment operator, and as a result, the manufactured product In addition, there was a risk that quality variations would occur.

Further, in the camera adjustment work that is periodically performed during the inspection and measurement work by the image recognition device, the production line must be stopped once for the work, which is inefficient. .

[0011]

SUMMARY OF THE INVENTION The present invention relates to an adjusting jig for an image recognition device used in a manufacturing process of an electronic component.
A flat portion is formed on the upper surface of the metal plate-like substrate, and a lens magnification adjustment reference gauge in which a hole having a reference dimension is formed in the flat portion, and a white portion and a black portion contacted at a linear boundary portion. A lens focus adjustment pattern and an illuminance adjustment pattern composed of a light gray portion and a dark gray portion are provided, and an outer dimension of the plate-shaped substrate is substantially the same as an outer dimension of the electronic component or the collective electronic component substrate. An adjustment jig for an image recognition device characterized by doing the above is provided.

[0012]

DESCRIPTION OF THE PREFERRED EMBODIMENTS In the present invention, an adjustment jig for an image recognition device is configured as follows.

First, the adjusting jig is a metal plate-like substrate, and the outer shape and dimensions of the plate-like substrate are electronic components to be inspected and measured by an image recognition device or a collective electronic component substrate. And have substantially the same shape and dimensions.

The collective electronic component substrate referred to here is a collective substrate in which a plurality of single electronic component substrates are arranged vertically and horizontally, and the external dimensions of electronic components such as chip resistor components are small. This is a manufacturing form of a product at an early stage of manufacturing.

[0015] The assembled electronic components are finally divided into individual electronic components.

A flat portion is formed on the upper surface of the plate-like substrate, and the thickness of the plate-like substrate in the flat portion is the same as that of an electronic component or a collective electronic component substrate to be inspected and measured by an image recognition device. It is formed to have a thickness.

Therefore, the thickness of the flat portion of the plate-shaped substrate is adjusted to be one step lower or one step higher than the outer peripheral thickness.

In the plane portion, a square hole having a side of 5 mm and a square hole having a side of 2 mm are formed as holes having standard dimensions serving as a lens magnification adjustment reference gauge.

The flat portion is provided with a white portion and a black portion serving as a lens focus adjustment pattern. The white portion and the black portion each have a square shape to form a linear boundary portion. They are arranged with one side in contact with each other.

Further, a light gray portion and a dark gray portion serving as an illuminance adjustment pattern are provided on the flat surface portion, and the light gray portion and the dark gray portion are each formed in a square shape. It is arranged in contact.

Therefore, since the lens magnification adjustment reference gauge, the lens focus adjustment pattern, and the illuminance adjustment pattern are formed on a single adjustment jig, when adjusting the camera of the image recognition apparatus, By using this adjustment jig, there is no need to replace a special sample or instrument for adjustment.

Further, since the outer dimension of the adjustment jig is the same as the outer dimension of the electronic component or the collective electronic component board inspected and measured by the camera of the image recognition device, The adjustment jig can be transported by the transport device that transports the electronic component substrate in the same manner as the transport of the electronic component or the collective electronic component substrate.

Therefore, by disposing the adjusting jig at the head of the electronic component or the collective electronic component board to be transported by the transport device, the adjusting jig is transported by the transport device, and the electronic component or the collective electronic component substrate is mounted. Before the inspection and measurement of the product, the degree of recognition of the camera by the adjustment jig is first checked and adjusted, and then the inspection and measurement work of the electronic component or the collective electronic component board can be started immediately, improving the work efficiency. Can be done.

Further, in the camera adjustment work that is periodically performed, the adjustment jig is transported by disposing the adjustment jig between the electronic components conveyed by the transport device or the collective electronic component substrates. When it is transported by the device and reaches the image recognition device arranged at a predetermined position on the production line, it is possible to check and adjust the degree of recognition of the camera, so there is no need to stop the production line, Productivity can be improved.

[0025]

Embodiments of the present invention will be described in detail with reference to the drawings.
The adjustment jig A is formed by a metal plate-shaped substrate 1. As shown in FIG. 1, the plate-shaped substrate 1 is an electronic component whose outer shape and dimensions are inspected and measured by an image recognition device. B has substantially the same shape and dimensions.

In this embodiment, the case of the electronic component B will be described. However, not only the electronic component B but also a collective electronic component substrate (not shown) or the like may be used.

The collective electronic component substrate referred to here is a collective substrate in which a plurality of single electronic component substrates are arranged in a row in a row and column, and products having small external dimensions of electronic components such as chip resistor components. In the manufacturing stage at the early stage of manufacturing.

As shown in FIGS. 2 and 3, a flat portion 2 having a required area is recessed on the upper surface of the plate-like substrate 1 so as to be one step lower than the thickness of the outer periphery of the plate-like substrate 1. The thickness of the plate-shaped substrate 1 in the plane portion 2 is formed to be the same as the thickness of the electronic component B.

The position of the flat part 2 with respect to the plate-like substrate 1 is such that the electronic part B corresponds to the part of the electronic part B which is actually visually recognized by the camera D of the image recognition device.
It is arranged so that it may become a part of.

That is, if the image recognition device visually recognizes the peripheral edge of the central part of the electronic component B, the flat part 2 of the plate-like substrate 1 is disposed on the peripheral edge of the central part of the plate-like substrate 1.

Further, the reason why the flat portion 2 is recessed on the upper surface of the plate-like substrate 1 is that the actual distance between the camera D and the electronic component B is adjusted in the lens magnification adjustment and the lens focus adjustment of the camera D of the image recognition apparatus. This is because it is necessary to perform the adjustment with the adjustment jig A in the state where the adjustment is made.

At this time, the thickness of the plate-like substrate 1 may be made substantially the same as the thickness of the electronic component B from the beginning, but considering the durability of the plate-like substrate 1, The thickness of the portion is larger than the thickness of the electronic component B.

As shown in FIG. 2 or 3, a lens magnification adjustment reference gauge 10, a lens focus adjustment pattern 20, and an illuminance adjustment pattern 30 are formed on the plane portion 2.

The lens magnification adjustment reference gauge 10 includes a square hole 11 having a side of 5 mm and a square hole 12 having a side of 2 mm formed in the plane portion 2.

The lens focus adjustment pattern 20 is composed of a white portion 21 and a black portion 22 which are squares having the same area, and the white portion 21 and the black portion 22 are disposed so that one side thereof is in contact with each other. Thus, a linear boundary portion is formed.

The illuminance adjustment pattern 30 includes a light gray portion 31 and a dark gray portion 32 which are squares having the same area. Have been.

The light gray portion 31 has a color sample N-6.5
Is used as the reference color for the dark gray portion 32 using the color sample N-5.5.

The adjusting jig A configured as described above is disposed at a required position while being transported by the transport device C together with the electronic component B or the collective electronic component substrate, as shown in FIG. Camera D of image recognition device (not shown)
And the recognized image is displayed on the monitor E.

The monitor E is used to check the operation status of the image recognition device, and to judge the quality of the actual product appearance, measure the product dimensions,
The determination of product positioning is performed by a processing unit (not shown) of the image recognition device.

The cameras D are a positioning confirmation camera D1 and a print inspection recognition camera D2, respectively.

The adjustment work of the cameras D1 and D2 is performed as follows.

In the adjustment of the lens magnification, first, the positioning confirmation camera D1 visually recognizes the square hole 12 having a side of 2 mm of the lens magnification adjustment reference gauge 10, and the printing inspection recognition camera D2 determines the lens magnification adjustment reference. The square hole 11 with one side of the gauge 10 having a length of 5 mm is visually recognized.

The visually recognized image is processed in the processing section of the image recognition apparatus, and the opening width of each of the square openings is measured at five points, and the average value is obtained.

The same average value is a reference value of 5 m.
m or within 2 mm from 0.05 mm before and after, it is determined that adjustment is unnecessary, and the lens magnification adjustment is terminated.
If it is 0.05 mm or more, each camera D1, D
The lens magnification is adjusted by raising and lowering the lens disposed in 2 and repeating the measurement until the error is within 0.05 mm.

Next, in the adjustment of the lens focus, first, each of the cameras D1 and D2 visually recognizes the lens focus adjustment pattern 20.

In the visually recognized image, the processing unit of the image recognition device recognizes the white portion 21 of the lens focus adjustment pattern 20 as a bright region and the black portion 22 as a dark region.

At this time, if the lens is out of focus, the visually recognized image will be out of focus, so that the boundary between the white portion 21 and the black portion 22 will be blurred, and the vicinity of the boundary will be a bright region. An intermediate area that cannot be distinguished from a dark area.

The width of the intermediate region itself indicates the degree of deviation of the lens focal point.

Therefore, by performing a differentiation process on the visually recognized image, the width of the intermediate region can be measured as a numerical value.

The position of the camera is moved up and down so that the focal point of the lens is adjusted so that the width of the intermediate area on the differential processing screen measured as described above becomes 2 bits or less.

In the adjustment of the illuminance, first, each of the cameras D1, D
2 visually recognizes the illuminance adjustment pattern 20.

The light gray part 31 and the dark gray part 32 of the square that has been visually recognized are binarized and recognized by the processing unit of the image recognition device, so that if the illuminance is appropriate, the light gray part 31 is recognized as white. Then, the dark gray portion 32 is recognized as black.

However, if the illuminance is inappropriate, a portion which is recognized as a black portion is generated in a region of the light gray portion 31 which should be recognized as white, and a region of the dark gray portion 32 which is to be recognized as black. In this case, a portion recognized as a white portion occurs.

Therefore, in the binarized processing screen,
A 50-bit square measurement range is set for each of the area recognized as white by the light gray part 31 and the area recognized as black by the dark gray part 32. The illumination is adjusted so that the generated bit unit area of the black portion and the generated bit unit area of the white portion in the black region become 0 bits.

Therefore, an appropriate illuminance can be set.

As described above, the lens magnification adjustment reference gauge 10, the lens focus adjustment pattern 20, and the illuminance adjustment pattern 30 are provided on the single adjustment jig A, and all the adjustments are performed by the image recognition device. By handling and adjusting numerically, it is possible to eliminate the variation in the adjustment work for each adjustment operator, and to suppress the variation in the quality of the product itself.

Further, since all adjustment operations are performed by controlling numerical values, the adjustment operations themselves can be automated.

In another embodiment, the position of the flat portion 2 with respect to the plate-like substrate 1 is adjusted according to the inspection site of the electronic component B to be actually inspected and measured by the camera D of the image recognition apparatus. Since the flat portion 2 should be provided at the corresponding portion of the plate 1, the flat portion 2 may be provided at a portion other than the central portion of the plate-like substrate 1 as shown in FIG.

When an image recognition device is used only for positioning, only a hole 12 having a square shape of 2 mm on a side is formed as a lens magnification adjustment reference gauge 10 so that a lens focus adjustment pattern 20 is formed. The arrangement provided with the illuminance adjustment pattern 30 may be used as the adjustment jig A, or may be a combination according to the purpose of use of the image recognition device.

In particular, the lens magnification adjustment reference gauge 10
A square hole 11 having a side of 5 mm for printing inspection measurement,
Although it is a square hole 12 of 2 mm for positioning,
This is used as a reference for the electronic component B. Some products have holes of different dimensions corresponding to the dimensions of the measurement site, and are set as reference distances in image processing by the image recognition device. May be.

Further, depending on the setting method of the image processing, a reference gauge having a square hole having one side of 5 mm and another side of 2 mm may be used instead of a square hole.

Further, the lens focus adjustment pattern 20 is
It is composed of a white part 21 and a black part 22 which are squares of the same area, but the present invention is not limited to a square, and a pattern in which the white part 21 and the black part 22 are in contact with each other at one linear side. It should just be.

Further, the illuminance adjustment pattern 30 is composed of a light gray portion 31 and a dark gray portion 32, which are squares having the same area, but the invention is not limited to the square, and the binarization processing of the image recognition apparatus is not limited to the square. In the processed processing screen, it is only necessary that the set measurement ranges each having a square of 50 bits each overlap the white area of the light gray part 31 and the black area of the dark gray part 32, respectively.

The arrangement positions of the lens magnification adjustment reference gauge 10, the lens focus adjustment pattern 20, and the illuminance adjustment pattern 30 with respect to the plane portion 2 have no arrangement rule and depend on the adjustment method of the image recognition device. And each may be appropriately arranged.

[0065]

According to the present invention, in an adjusting jig for an image recognition device used in a manufacturing process of an electronic component, a flat portion is provided on an upper surface of a metal plate-like substrate, and a reference size and A lens magnification adjustment reference gauge having a hole formed therein, a lens focus adjustment pattern consisting of a white portion and a black portion touching at a linear boundary portion, and an illuminance adjustment pattern consisting of a light gray portion and a dark gray portion. By arranging, when adjusting the camera of the image recognition device, it is not necessary to exchange dedicated adjustment samples and instruments, and the workability of the adjustment operation can be improved.

Further, since each adjustment item can be numerically recognized and adjusted, it is possible to prevent adjustment variations among coordinators and to automate the adjustment work, so that the adjustment work is always uniform. It is possible to suppress variations in product quality.

Further, by making the outer dimension of the plate-shaped substrate in the adjusting jig substantially the same as the outer dimension of the electronic component or the collective electronic component substrate, the adjusting jig can be transported to the electronic component or the collective electronic component substrate. It can be transported by the device.

Therefore, when performing the adjustment work of the image recognition device, the adjustment jig is set on the transfer device and is transferred by the transfer device. When the adjustment jig reaches the position of the image recognition device,
By automatically performing the adjustment work, the adjustment work can be performed more efficiently.

[Brief description of the drawings]

FIG. 1 is a diagram illustrating the use of an adjustment jig according to the present invention.

FIG. 2 is a plan view of the adjustment jig according to the present invention.

FIG. 3 is a sectional view of an adjustment jig according to the present invention.

FIG. 4 is a plan view of another embodiment.

[Explanation of symbols]

 Reference Signs List A Adjusting jig B Electronic component 1 Plate-shaped substrate 2 Flat part 10 Lens magnification adjustment reference gauge 11 Hole part 12 Hole part 20 Lens focus adjustment pattern 21 White part 22 Black part 30 Illuminance adjustment pattern 31 Light gray part 32 Dark gray part

Claims (1)

[Claims] An adjusting jig (A) for an image recognition device used in a manufacturing process of an electronic component (B), wherein a flat portion (2) is formed on an upper surface of a metal plate-like substrate (1). A lens magnification adjustment reference gauge (10) in which a hole having a reference dimension is formed in a portion (2), and a lens focus adjustment including a white portion (21) and a black portion (22) contacting at a linear boundary. A pattern (20) and an illuminance adjustment pattern (30) including a light gray portion (31) and a dark gray portion (32) are provided, and the outer dimension of the plate-like substrate (1) is determined by an electronic component ( B)
Alternatively, an adjusting jig for an image recognition device, wherein the outer dimension of the collective electronic component substrate is substantially the same.