JPH11320177A - Solder composition material - Google Patents

Solder composition material

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Publication number
JPH11320177A
JPH11320177A JP10150725A JP15072598A JPH11320177A JP H11320177 A JPH11320177 A JP H11320177A JP 10150725 A JP10150725 A JP 10150725A JP 15072598 A JP15072598 A JP 15072598A JP H11320177 A JPH11320177 A JP H11320177A
Authority
JP
Japan
Prior art keywords
solder
wire
weight
solder composition
composition material
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10150725A
Other languages
Japanese (ja)
Other versions
JP3829475B2 (en
Inventor
Kiyotaka Maekawa
清隆 前川
Masayuki Hamao
正行 浜尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP15072598A priority Critical patent/JP3829475B2/en
Publication of JPH11320177A publication Critical patent/JPH11320177A/en
Application granted granted Critical
Publication of JP3829475B2 publication Critical patent/JP3829475B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To obtain non leaded solder which is excellent in safety without containing Pb and has a characteristic equal to a Sn-Pb system solder referring to a soldering property and a Cu wire melting property by composing the solder with Sn and Bi as a main component and adding Cu at a given proportion. SOLUTION: This composition material contains, at wt.%, 5.0-90.0% Sn, 5.0-92.0% Bi, and 0.1% or more Cu. In this case, Cu satisfies the requirements that Cu additional volume (wt.%)<=(0.06×Sn volume)-0.02, and that Cu additional volume (wt.%)>=(0.06×Sn volume)-3.4. Furthermore, at least one chosen from a group of Ag, In, Zn, Sb, Ge, and P, is added to the solder composition material, so as to obtain the solder composition material having the more excellent characteristic referring to a soldering chatacteristic and a Cu wire melting property. The melting property of the Cu wire is evaluated by measuring the elapsed time from dipping the enamel coated Cu wire of 0.8 mm diameter in the solder bath of 400 deg.C till the wire is completely melted.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本願発明は、電子機器や電子
部品用のはんだ組成物に関するものであり、特に、エナ
メル被覆銅線の被覆剥離とはんだ付けの両方を同時に行
う場合に用いるのに適したはんだ組成物に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a solder composition for electronic equipment and electronic components, and more particularly, to a solder composition suitable for use in performing both stripping and soldering of an enamel-coated copper wire at the same time. The present invention relates to a solder composition.

【0002】[0002]

【従来の技術】従来、コイル部品などの製造工程におい
ては、巻線コイルのエナメル線被覆剥離とはんだ付けの
両方を同時に実施することが行われており、そのような
場合、Pb含有率の高いSn−Pb系はんだを、400
℃以上の高温で使用することが一般的に行われてきた。
2. Description of the Related Art Conventionally, in the manufacturing process of coil parts and the like, both enamel wire coating peeling and soldering of a winding coil have been performed at the same time. In such a case, the Pb content is high. 400 Sn-Pb solder
It has been common practice to use at temperatures as high as ° C. or higher.

【0003】[0003]

【発明が解決しようとする課題】しかし、従来のSn−
Pb系はんだは、毒性を有するPbを含んでいるため、
その使用が制限されつつある。
However, the conventional Sn-
Pb-based solder contains toxic Pb,
Its use is being restricted.

【0004】そのため、近年は、Sn−Pb系はんだに
代わる、いわゆるPbフリーはんだ(無鉛はんだ)が市
場に流通しつつあるが、そのほとんどがSnを主成分と
するものであり、巻線コイルのエナメル線被覆剥離とは
んだ付けの両方を同時に行うと、Cu線がはんだに溶解
する、いわゆるCu線喰われの現象が発生するという問
題点がある。
[0004] In recent years, so-called Pb-free solder (lead-free solder), which replaces Sn-Pb-based solder, has been distributed in the market, but most of them are mainly composed of Sn. If both the enamel wire coating peeling and the soldering are performed simultaneously, there is a problem that the so-called Cu wire biting phenomenon occurs in which the Cu wire dissolves in the solder.

【0005】本願発明は、上記問題点を解決するもので
あり、はんだ付性と、Cu線喰われ性(耐Cu線喰われ
性)に関し、従来のSn−Pb系はんだと少なくとも同
等の特性を有する無鉛はんだを提供することを目的とし
ている。
[0005] The present invention solves the above-mentioned problems, and has at least the same characteristics as conventional Sn-Pb-based solders in terms of solderability and Cu line erosion resistance (Cu line erosion resistance). It is intended to provide a lead-free solder having the same.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に、本願発明のはんだ組成物は、Sn、Bi及びCu
を、 Sn:5.0〜90.0重量%、 Bi:5.0〜92.0重量%、 Cu:0.1重量%以上で、かつ、下記の式(1)及び(2)
の要件を満たす範囲 で含有することを特徴としている。 Cu添加量(重量%)≦(0.06×Sn量)−0.02 ……(1) Cu添加量(重量%)≧(0.06×Sn量)−3.4 ……(2)
In order to achieve the above object, the solder composition of the present invention comprises Sn, Bi and Cu.
Sn: 5.0 to 90.0% by weight, Bi: 5.0 to 92.0% by weight, Cu: 0.1% by weight or more, and the following formulas (1) and (2)
It is characterized in that it is contained within the range that satisfies the requirements of. Cu addition amount (% by weight) ≦ (0.06 × Sn amount) −0.02 (1) Cu addition amount (% by weight) ≧ (0.06 × Sn amount) −3.4 (2)

【0007】SnとBiを主成分とし、これにさらにC
uを、上記の割合で配合することにより、Pbを含ま
ず、安全性に優れており、かつ、はんだ付性と、Cu線
喰われ性に関し、従来のSn−Pb系はんだと同等の特
性を有するはんだを得ることが可能になる。
[0007] Sn and Bi are the main components.
By mixing u in the above ratio, Pb is not contained, excellent in safety, and with respect to solderability and Cu wire erosion property, properties equivalent to conventional Sn-Pb-based solder are obtained. It becomes possible to obtain the solder which has.

【0008】なお、Snの配合割合を5.0〜90.0
重量%の範囲としたのは、Snの配合割合が5.0重量
%未満になるとはんだ付性が低下し、90重量%を超え
るとCu線喰われが発生しやすくなることによる。
In addition, the compounding ratio of Sn is adjusted to 5.0 to 90.0.
The reason for the range of the weight% is that when the compounding ratio of Sn is less than 5.0% by weight, the solderability decreases, and when it exceeds 90% by weight, the Cu wire is liable to be eroded.

【0009】また、Biの配合割合を5.0〜92.0
重量%の範囲としたのは、Biの配合割合が5.0重量
%未満になると、必然的にSnの配合割合が増えてCu
線喰われが発生しやすくなり、逆に、Biの配合割合が
92重量%を超えると、必然的にSnの配合割合が減少
してはんだ付性が低下することによる。
Further, the mixing ratio of Bi is set to 5.0 to 92.0.
The range of the weight percent is that when the blending ratio of Bi is less than 5.0 wt%, the blending ratio of Sn inevitably increases and Cu
Line erosion is likely to occur, and conversely, if the content of Bi exceeds 92% by weight, the content of Sn inevitably decreases and solderability deteriorates.

【0010】また、Cuを、0.1重量%以上で、上記
の式(1)及び(2)の要件を満たす範囲としたのは以下の理
由による。すなわち、Cuの添加割合が0.1重量%未
満になると、Cu線喰われを抑制する効果が不十分にな
り、また、上記の式(1)の要件を満たさない場合には、
はんだ融点が400℃を超え、事実上使用することがで
きなくなり、さらに、上記の式(2)の要件を満たさない
場合には、Cu線喰われを抑制することができなくなる
ことによる。
The reason why the content of Cu is not less than 0.1% by weight and which satisfies the requirements of the above formulas (1) and (2) is as follows. That is, when the addition ratio of Cu is less than 0.1% by weight, the effect of suppressing Cu line erosion becomes insufficient, and when the requirement of the above formula (1) is not satisfied,
This is because the melting point of the solder exceeds 400 ° C., and it is practically impossible to use it. Further, when the requirement of the above formula (2) is not satisfied, it is impossible to suppress the Cu wire erosion.

【0011】なお、Snの配合割合と関連して、式(1)
及び式(2)により規定される、本願発明のはんだ組成物
中のCuの配合割合を図1に示す。図1の、点A,B,
C,Dで囲まれた領域が請求項1のはんだ組成物におけ
るCuの配合割合である。
The formula (1) is related to the mixing ratio of Sn.
FIG. 1 shows the compounding ratio of Cu in the solder composition of the present invention, defined by the formula (2). In FIG. 1, points A, B,
The region surrounded by C and D is the compounding ratio of Cu in the solder composition of claim 1.

【0012】また、請求項2のはんだ組成物は、Sn、
Bi及びCuを、 Sn:14.8〜42.0重量% Bi:57.0〜85.0重量% Cu:0.1重量%以上であって、かつ、前記請求項1
の式(1)及び(2)の要件を満たす範囲 で含有することを特徴としている。
Further, the solder composition according to claim 2 is characterized in that Sn,
Bi and Cu: Sn: 14.8 to 42.0% by weight Bi: 57.0 to 85.0% by weight Cu: 0.1% by weight or more, and the said 1st aspect.
It is characterized in that it is contained within a range that satisfies the requirements of formulas (1) and (2).

【0013】Sn、Bi、及びCuを、請求項1よりも
さらに限定された上記の割合で配合することにより、P
bを含まず、安全性に優れており、かつ、はんだ付性と
耐Cu線喰われ性に関し、優れた特性を有するはんだ組
成物を確実に得ることが可能になる。
By mixing Sn, Bi, and Cu at the above-mentioned ratio, which is more limited than that of claim 1, P
It is possible to reliably obtain a solder composition which does not contain b, is excellent in safety, and has excellent characteristics with respect to solderability and Cu wire erosion resistance.

【0014】また、請求項3のはんだ組成物は、上記の
請求項1又は2記載のはんだ組成物に、さらに、Ag、
In、Zn、Sb、Ge、Pからなる群より選ばれる少
なくとも1種を添加したことを特徴としている。
Further, the solder composition according to claim 3 is the same as the solder composition according to claim 1 or 2, further comprising Ag,
At least one selected from the group consisting of In, Zn, Sb, Ge, and P is added.

【0015】上記のはんだ組成物に、さらに、Ag、I
n、Zn、Sb、Ge、Pの少なくとも1種を添加する
ことにより、Pbを含まず、安全性に優れており、か
つ、はんだ付性と、Cu線喰われ性に関し、さらに優れ
た特性を有するはんだ組成物を得ることが可能になる。
In addition to the above solder composition, Ag, I
By adding at least one of n, Zn, Sb, Ge, and P, Pb is not included, excellent in safety, and further excellent characteristics regarding solderability and Cu wire erosion. It becomes possible to obtain the solder composition which has.

【0016】なお、Ag及びSbは、はんだ付性やはん
だの機械的な強度の向上、In及びZnは、はんだの融
点の制御、Ge及びPは、はんだの酸化被膜の抑制など
に寄与する。
Ag and Sb contribute to improving the solderability and mechanical strength of the solder, In and Zn contribute to controlling the melting point of the solder, and Ge and P contribute to suppressing the oxide film of the solder.

【0017】[0017]

【発明の実施の形態】以下、本願発明の実施の形態を示
して、その特徴とするところをさらに詳しく説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Hereinafter, embodiments of the present invention will be described, and features thereof will be described in more detail.

【0018】なお、この実施形態においては、表1に示
すような組成のはんだ組成物を作製した。
In this embodiment, a solder composition having a composition shown in Table 1 was prepared.

【0019】[0019]

【表1】 [Table 1]

【0020】表1の、試料番号2,4,5,7,8,1
0は、本願発明の範囲内のはんだ組成物(実施例)であ
る。また、*を付した試料番号1,3,6,9、及び試
料番号11,12,13,14は、本願発明の範囲外の
比較例であって、そのうち、試料番号1,3,6,9
は、構成成分が本願発明のはんだ組成物と同じで、配合
割合が本願発明の範囲外のものであり、また、試料番号
11,12,13,14は、構成成分のうち、Bi、又
はCuを含まないものである。なお、試料番号11は、
Pbを含む従来のPb−Sn系はんだである。
Sample Nos. 2, 4, 5, 7, 8, 1 in Table 1
0 is a solder composition (Example) within the scope of the present invention. Sample numbers 1, 3, 6, 9 and sample numbers 11, 12, 13, 14 marked with * are comparative examples outside the scope of the present invention, and among them, sample numbers 1, 3, 6, 9
Have the same composition as the solder composition of the present invention, and the compounding ratio is out of the range of the present invention. Sample numbers 11, 12, 13, and 14 are Bi or Cu among the components. Is not included. The sample number 11 is
This is a conventional Pb-Sn-based solder containing Pb.

【0021】そして、これらの各試料(はんだ組成物)
を用いて、エナメル線をはんだ付けし、Cu線喰われ性
とはんだ付き性を調べた。なお、Cu線喰われ性につい
ては、直径0.08mmのエナメル被覆Cu線を、400
℃のはんだ浴に浸漬したときに、Cu線が消失するまで
に経過した時間(Cu線喰われ時間)を測定し、評価し
たなお、Cu線喰われ時間が長くなるほど、Cu線喰わ
れの抑制効果が高いと評価される。
Each of these samples (solder composition)
Was used to solder the enameled wire, and the Cu wire erosion and solderability were examined. In addition, regarding the Cu wire erosion property, an enamel-coated Cu wire having a diameter of 0.08 mm
The time elapsed until the Cu wire disappeared (Cu wire erosion time) was measured and evaluated when immersed in a solder bath at ℃. It is evaluated as highly effective.

【0022】また、はんだ付性については、400℃に
おける清浄Cu板に対するはんだ濡れ性をメニスコグラ
フ法におけるゼロクロスタイムで評価した。ゼロクロス
タイムが短いほどはんだ濡れ性が良好と評価される。な
お、はんだ付けには、RMAタイプのフラックスを使用
した。
Regarding the solderability, the wettability of the solder to a clean Cu plate at 400 ° C. was evaluated by the zero cross time in the meniscograph method. The shorter the zero cross time, the better the solder wettability. Note that an RMA type flux was used for soldering.

【0023】Cu線喰われ性及びはんだ付性についての
測定(評価)結果を、表1に併せて示す。表1に示すよ
うに、式(1)の条件を満たしていない試料番号1と6に
ついては、融点が400℃以上で、通常のはんだ付け温
度では、はんだが溶融せず、測定が不可能であった。
The results of the measurement (evaluation) of the Cu wire erosion and solderability are also shown in Table 1. As shown in Table 1, for Sample Nos. 1 and 6 that do not satisfy the condition of Equation (1), the melting point is 400 ° C. or more, and at normal soldering temperature, the solder does not melt, making measurement impossible. there were.

【0024】また、式(2)の条件を満たしていない試料
番号3については、Cu線喰われ時間が10秒以下とな
り、Cu線喰われ性(すなわち、Cu線喰われの抑制効
果)に関し、満足な結果が得られなかった。
For sample No. 3, which does not satisfy the condition of equation (2), the Cu line erosion time was 10 seconds or less, and the Cu line erosion property (ie, the effect of suppressing Cu line erosion) was No satisfactory results were obtained.

【0025】また、試料番号9については、Snの配合
割合が本願発明の範囲より小さく、Biの配合割合が本
願発明の範囲を超えているため、Cu線喰われ性(すな
わち、Cu線喰われの抑制効果)については満足な結果
が得られたが、ゼロクロスタイムが1秒以上と長く、十
分なはんだ濡れ性を得ることができなかった。
Further, in sample No. 9, since the compounding ratio of Sn was smaller than the range of the present invention and the compounding ratio of Bi exceeded the range of the present invention, Cu line erosion (that is, Cu line erosion) was observed. ), A satisfactory result was obtained, but the zero cross time was as long as 1 second or more, and sufficient solder wettability could not be obtained.

【0026】これに対して、Sn、Biが本願発明の範
囲内にあり、かつ式(1)及び(2)の条件を満たす、試料番
号2,4,5,7,8については、Cu線喰われ性、は
んだ付性とも、従来から使用されているSn−Pb系は
んだと同等の性能が得られた。
On the other hand, for Sample Nos. 2, 4, 5, 7, and 8 in which Sn and Bi are within the scope of the present invention and satisfy the conditions of Formulas (1) and (2), the Cu wire The performance equivalent to that of the Sn-Pb-based solder conventionally used was obtained in both the erosion property and the solderability.

【0027】また、本願発明の範囲にあるSn−Bi−
Cu系のはんだ組成物にAgを添加した試料番号10に
ついても、Cu線喰われ性やはんだ付性が損なわれるこ
とはなく、Sn−Pb系はんだと同等の性能が得られ
た。
In addition, Sn-Bi- within the scope of the present invention.
For sample No. 10 in which Ag was added to the Cu-based solder composition, the performance equivalent to that of the Sn-Pb-based solder was obtained without impairing the Cu wire erosion or solderability.

【0028】また、表1には示していないが、本願発明
の範囲にあるSn−Bi−Cu系のはんだ組成物に、I
n、Zn、Sb、Ge、Pの1種以上を添加した場合に
も、Cu線喰われ性やはんだ付性が損なわれることはな
く、Sn−Pb系はんだと同等の性能が得られることが
確認されている。
Although not shown in Table 1, the Sn-Bi-Cu based solder composition within the scope of the present invention has
Even when one or more of n, Zn, Sb, Ge, and P are added, the performance equivalent to that of the Sn-Pb-based solder can be obtained without impairing the Cu wire erosion property and the solderability. Has been confirmed.

【0029】なお、本願発明は、上記実施形態に限定さ
れるものではなく、発明の要旨の範囲内において、種々
の応用、変形を加えることが可能である。
It should be noted that the present invention is not limited to the above embodiment, and various applications and modifications can be made within the scope of the invention.

【0030】[0030]

【発明の効果】上述のように、本願発明(請求項1)の
はんだ組成物は、SnとBiを主成分とし、これにさら
にCuを、所定の割合で配合することにより、Pbを含
まず、安全性に優れており、かつ、はんだ付性やCu線
喰われ性に関し、従来のSn−Pb系はんだと同等の特
性を有するはんだを得ることができる。
As described above, the solder composition of the present invention (Claim 1) contains Sn and Bi as main components, and further contains Cu at a predetermined ratio to contain no Pb. In addition, it is possible to obtain a solder which is excellent in safety and has the same properties as the conventional Sn-Pb-based solder in terms of solderability and Cu wire erosion.

【0031】また、請求項2のはんだ組成物のように、
Sn、Bi、及びCuを、請求項1よりもさらに限定さ
れた割合で配合することにより、はんだ付性と耐Cu線
喰われ性に関し、優れた特性を有するはんだ組成物を確
実に得ることが可能になり、本願発明をさらに実効あら
しめることができる。
Also, as in the solder composition of claim 2,
By blending Sn, Bi, and Cu in a further limited ratio than in claim 1, it is possible to reliably obtain a solder composition having excellent properties with respect to solderability and Cu wire erosion resistance. This makes it possible to make the present invention more effective.

【0032】また、請求項3のはんだ組成物のように、
本願発明(請求項1又は2)のはんだ組成物に、さら
に、Ag、In、Zn、Sb、Ge、Pの少なくとも1
種を添加することにより、機械的な強度の向上、はんだ
の融点の制御、はんだの酸化被膜の抑制などを図ること
が可能になり、さらに特性を向上させることが可能にな
る。
Further, as in the third aspect of the present invention,
The solder composition of the present invention (claim 1 or 2) further includes at least one of Ag, In, Zn, Sb, Ge, and P.
By adding a seed, mechanical strength can be improved, the melting point of the solder can be controlled, the oxide film of the solder can be suppressed, and the properties can be further improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本願発明のはんだ組成物中の、Snの配合割合
に対するCuの配合割合の関係を示す図である。
FIG. 1 is a diagram showing the relationship between the compounding ratio of Cu and the compounding ratio of Cu in the solder composition of the present invention.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】Sn、Bi及びCuを、下記の割合で配合
したはんだ組成物。 Sn:5.0〜90.0重量% Bi:5.0〜92.0重量% Cu:0.1重量%以上で、かつ、下記の式(1)及び(2)
の要件を満たす範囲 Cu添加量(重量%)≦(0.06×Sn量)−0.02 ……(1) Cu添加量(重量%)≧(0.06×Sn量)−3.4 ……(2)
1. A solder composition comprising Sn, Bi and Cu in the following proportions. Sn: 5.0 to 90.0% by weight Bi: 5.0 to 92.0% by weight Cu: 0.1% by weight or more and the following formulas (1) and (2)
(1) Cu addition amount (% by weight) ≧ (0.06 × Sn amount) −3.4 (Cu content (% by weight) ≦ (0.06 × Sn amount) −0.02) …… (2)
【請求項2】Sn、Bi及びCuを、下記の割合で配合
した請求項1記載のはんだ組成物。 Sn:14.8〜42.0重量% Bi:57.0〜85.0重量% Cu:0.1重量%以上で、かつ、前記式(1)及び(2)
の要件を満たす範囲
2. The solder composition according to claim 1, wherein Sn, Bi and Cu are blended in the following ratio. Sn: 14.8 to 42.0% by weight Bi: 57.0 to 85.0% by weight Cu: 0.1% by weight or more and the above formulas (1) and (2)
Range that meets the requirements of
【請求項3】請求項1又は2記載のはんだ組成物に、さ
らに、Ag、In、Zn、Sb、Ge、Pからなる群よ
り選ばれる少なくとも1種を添加したことを特徴とする
はんだ組成物。
3. The solder composition according to claim 1, further comprising at least one selected from the group consisting of Ag, In, Zn, Sb, Ge, and P. .
JP15072598A 1998-05-13 1998-05-13 Solder composition for joining a Cu base material Expired - Lifetime JP3829475B2 (en)

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EP1103337A1 (en) * 1999-11-25 2001-05-30 Mitsui Mining & Smelting Co., Ltd. Tin-bismuth-based lead-free solder
FR2810051A1 (en) * 2000-06-12 2001-12-14 Murata Manufacturing Co Leadless solder composition with a bismuth base and the addition of two other metal elements to provide solder for use on fragile substrates such as glass
WO2002068146A1 (en) * 2001-02-27 2002-09-06 Sumida Corporation Unleaded solder alloy and electronic components using it
WO2002097145A1 (en) * 2001-05-28 2002-12-05 Honeywell International Inc. Compositions, methods and devices for high temperature lead-free solder
WO2003026834A1 (en) * 2001-09-26 2003-04-03 Infineon Technologies Ag Lead-free soft solder, especially electronics solder
WO2003026828A2 (en) * 2001-09-25 2003-04-03 Honeywell International Inc. Improved compositions, methods and devices for high temperature lead-free solder
JPWO2003020468A1 (en) * 2001-08-30 2004-12-16 スミダコーポレーション株式会社 Lead-free solder alloy and electronic component using the same
WO2005102594A1 (en) * 2004-04-21 2005-11-03 Nec Corporation Solder and mounted article using same
JP2008266791A (en) * 2002-10-15 2008-11-06 Senju Metal Ind Co Ltd Method of preliminary plating for coil end
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US20090301607A1 (en) * 2005-11-11 2009-12-10 Kosuke Nakano Solder Paste and Solder Joint
JP2010155268A (en) * 2008-12-27 2010-07-15 Senju Metal Ind Co Ltd Bi-Sn-BASED REEL-WOUND SOLDER WIRE, AND METHOD FOR MANUFACTURING SOLDER WIRE
JP2012066270A (en) * 2010-09-22 2012-04-05 Sumitomo Metal Mining Co Ltd Pb-FREE SOLDER ALLOY
CN102492870A (en) * 2011-12-13 2012-06-13 厦门大学 Tin bismuth copper silver alloy dispersed composite powder for electronic packaging and preparation method for tin bismuth copper silver alloy dispersed composite powder
WO2015019966A1 (en) 2013-08-05 2015-02-12 千住金属工業株式会社 Lead-free solder alloy
CN105261535A (en) * 2014-07-09 2016-01-20 株式会社田村制作所 Fusible alloy for temperature fuse, wires for temperature fuse, and temperature fuse
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JP2017177211A (en) * 2016-03-31 2017-10-05 株式会社タムラ製作所 Solder alloy and solder composition
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US11267080B2 (en) 2019-05-09 2022-03-08 Indium Corporation Low temperature melting and mid temperature melting lead-free solder paste with mixed solder alloy powders
US11285569B2 (en) 2003-04-25 2022-03-29 Henkel Ag & Co. Kgaa Soldering material based on Sn Ag and Cu

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Cited By (34)

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EP1103337A1 (en) * 1999-11-25 2001-05-30 Mitsui Mining & Smelting Co., Ltd. Tin-bismuth-based lead-free solder
FR2810051A1 (en) * 2000-06-12 2001-12-14 Murata Manufacturing Co Leadless solder composition with a bismuth base and the addition of two other metal elements to provide solder for use on fragile substrates such as glass
US6703113B2 (en) * 2000-06-12 2004-03-09 Murata Manufacturing Co. Ltd Pb-free solder composition and soldered article
WO2002068146A1 (en) * 2001-02-27 2002-09-06 Sumida Corporation Unleaded solder alloy and electronic components using it
WO2002097145A1 (en) * 2001-05-28 2002-12-05 Honeywell International Inc. Compositions, methods and devices for high temperature lead-free solder
EP1705258A3 (en) * 2001-05-28 2007-01-17 Honeywell International, Inc. Composition, methods and devices for high temperature lead-free solder
EP1705258A2 (en) * 2001-05-28 2006-09-27 Honeywell International, Inc. Composition, methods and devices for high temperature lead-free solder
EP1399600A1 (en) * 2001-05-28 2004-03-24 Honeywell International Inc. Compositions, methods and devices for high temperature lead-free solder
EP1399600A4 (en) * 2001-05-28 2005-05-04 Honeywell Int Inc Compositions, methods and devices for high temperature lead-free solder
JPWO2003020468A1 (en) * 2001-08-30 2004-12-16 スミダコーポレーション株式会社 Lead-free solder alloy and electronic component using the same
WO2003026828A3 (en) * 2001-09-25 2003-06-19 Honeywell Int Inc Improved compositions, methods and devices for high temperature lead-free solder
EP1429884A4 (en) * 2001-09-25 2004-10-20 Honeywell Int Inc Improved compositions, methods and devices for high temperature lead-free solder
WO2003026828A2 (en) * 2001-09-25 2003-04-03 Honeywell International Inc. Improved compositions, methods and devices for high temperature lead-free solder
WO2003026834A1 (en) * 2001-09-26 2003-04-03 Infineon Technologies Ag Lead-free soft solder, especially electronics solder
JP2008266791A (en) * 2002-10-15 2008-11-06 Senju Metal Ind Co Ltd Method of preliminary plating for coil end
US11285569B2 (en) 2003-04-25 2022-03-29 Henkel Ag & Co. Kgaa Soldering material based on Sn Ag and Cu
WO2005102594A1 (en) * 2004-04-21 2005-11-03 Nec Corporation Solder and mounted article using same
US7829199B2 (en) 2004-04-21 2010-11-09 Nec Corporation Solder, and mounted components using the same
US9162324B2 (en) * 2005-11-11 2015-10-20 Senju Metal Industry Co., Ltd. Solder paste and solder joint
US20090301607A1 (en) * 2005-11-11 2009-12-10 Kosuke Nakano Solder Paste and Solder Joint
JP2009125769A (en) * 2007-11-21 2009-06-11 Nec Lighting Ltd Solder, external electrode type fluorescent lamp, and liquid crystal display device
WO2009143677A1 (en) * 2008-05-28 2009-12-03 广州瀚源电子科技有限公司 High melting point lead-free solder and production process thereof
JP2010155268A (en) * 2008-12-27 2010-07-15 Senju Metal Ind Co Ltd Bi-Sn-BASED REEL-WOUND SOLDER WIRE, AND METHOD FOR MANUFACTURING SOLDER WIRE
JP2012066270A (en) * 2010-09-22 2012-04-05 Sumitomo Metal Mining Co Ltd Pb-FREE SOLDER ALLOY
CN102492870A (en) * 2011-12-13 2012-06-13 厦门大学 Tin bismuth copper silver alloy dispersed composite powder for electronic packaging and preparation method for tin bismuth copper silver alloy dispersed composite powder
KR20160040655A (en) 2013-08-05 2016-04-14 센주긴조쿠고교 가부시키가이샤 Lead-free solder alloy
WO2015019966A1 (en) 2013-08-05 2015-02-12 千住金属工業株式会社 Lead-free solder alloy
CN105261535A (en) * 2014-07-09 2016-01-20 株式会社田村制作所 Fusible alloy for temperature fuse, wires for temperature fuse, and temperature fuse
JP2016017210A (en) * 2014-07-09 2016-02-01 株式会社タムラ製作所 Thermal fuse fusible alloy, thermal fuse wire and thermal fuse
JP2017094368A (en) * 2015-11-26 2017-06-01 株式会社リソー技研 Solder for enamel-coated electric cable, and soldering method for enamel-coated electric cable
JP2017177211A (en) * 2016-03-31 2017-10-05 株式会社タムラ製作所 Solder alloy and solder composition
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US11267080B2 (en) 2019-05-09 2022-03-08 Indium Corporation Low temperature melting and mid temperature melting lead-free solder paste with mixed solder alloy powders
US11712762B2 (en) 2019-05-09 2023-08-01 Indium Corporation Low temperature melting and mid temperature melting lead-free solder paste with mixed solder alloy powders

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