JPH11300609A - Substrate polishing device - Google Patents

Substrate polishing device

Info

Publication number
JPH11300609A
JPH11300609A JP11674398A JP11674398A JPH11300609A JP H11300609 A JPH11300609 A JP H11300609A JP 11674398 A JP11674398 A JP 11674398A JP 11674398 A JP11674398 A JP 11674398A JP H11300609 A JPH11300609 A JP H11300609A
Authority
JP
Japan
Prior art keywords
substrate
polished
grindstone
polishing apparatus
grinding wheel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11674398A
Other languages
Japanese (ja)
Inventor
Kazuto Hirokawa
一人 廣川
Hirokuni Hiyama
浩國 檜山
Taketaka Wada
雄高 和田
Naonori Matsuo
尚典 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP11674398A priority Critical patent/JPH11300609A/en
Publication of JPH11300609A publication Critical patent/JPH11300609A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide a substrate polishing device allowing a grinding wheel to follow a warp of a polished surface of a polished substrate even with the warp and absorbing reaction generated by friction between the polished substrate and the grinding wheel in course of polishing so as to being the surface of the grinding wheel appropriately in contact with the surface of the polished substrate to attain uniform polishing. SOLUTION: In a substrate polishing device making a grinding wheel 1 abut to a substrate 5 to be polished to polish the substrate 5 by the relative motion of the substrate 5 tu be polished and grinding wheel 1, the grinding wheel 1 is fitted to a support body 2 through an elastic body 3. The grinding wheel 1 comprises a large number of pellet-like grindstones arranged in annular shape, and each pellet-like grindstone is fitted to the support body 2 through the elastic body 3. The grinding wheel 1 is supported to the support body 2 through a spherical seat bearing.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は半導体ウエハや各種
ディスク等の被研磨基板に砥石を当接し、該被研磨基板
と砥石の相対運動により、該被研磨基板を研磨する基板
研磨装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate polishing apparatus for polishing a substrate to be polished by bringing a grindstone into contact with a substrate to be polished such as a semiconductor wafer or various disks, and polishing the substrate by a relative motion between the substrate and the grindstone. is there.

【0002】[0002]

【従来の技術】従来、半導体ウエハ等の被研磨基板を研
磨する装置として、CMP装置がある。該CMP装置は
ターンテーブルの研磨クロス面上に、回転するトップリ
ングに装着された被研磨基板を当接すると共に、該研磨
クロス面上にスラリを供給しながら、該被研磨基板の研
磨面を研磨するように構成したものである。しかしなが
ら、このCMP装置による研磨では、研磨面に研磨前か
らあった段差(凹凸)が残り、段差特性の優れた(精度
のよい平坦度)研磨ができないという問題や、スラリの
消費量が増大し、ランニングコストが高くなるという問
題があった。
2. Description of the Related Art Conventionally, there is a CMP apparatus as an apparatus for polishing a substrate to be polished such as a semiconductor wafer. The CMP apparatus abuts a substrate to be polished mounted on a rotating top ring on a polishing cloth surface of a turntable, and polishes the polishing surface of the substrate to be polished while supplying a slurry on the polishing cloth surface. It is configured so that However, in the polishing by the CMP apparatus, a step (unevenness) existing before polishing remains on the polished surface, and polishing with excellent step characteristics (accurate flatness) cannot be performed, and the consumption of slurry increases. However, there is a problem that running costs are increased.

【0003】そこで、段差特性の優れた研磨ができる研
磨装置として、上記のように被研磨基板に砥石を当接
し、該被研磨基板と砥石相互の相対運動により、被研磨
基板を研磨する研磨装置がある。
[0003] Therefore, as a polishing apparatus capable of polishing with excellent step characteristics, a polishing apparatus which abuts a grindstone on a substrate to be polished as described above, and polishes the substrate to be polished by relative movement between the substrate and the grindstone. There is.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、上記砥
石を用いた研磨装置は、硬質の砥石を剛体からなる支持
体に固定した構成であるため、被研磨基板の研磨面に反
りがある場合、砥石がこの反り面に沿ってスムーズに移
動せず、均一な研磨が困難になるという問題があった。
また、研磨中に、砥石は被研磨基板との摩擦による反力
にて進行方向前側が被研磨基板面に強く当り、進行方向
後ろ側は被研磨基板から離れる力を受けるため、スムー
ズな研磨及び被研磨基板の均一な研磨が困難になるとい
う問題がある。
However, since the polishing apparatus using the above-mentioned grindstone has a configuration in which a hard grindstone is fixed to a support made of a rigid body, when the polished surface of the substrate to be polished has a warp, However, there is a problem in that it does not move smoothly along this warped surface, making uniform polishing difficult.
Also, during polishing, the grindstone is strongly opposed to the surface of the substrate to be polished in the traveling direction by a reaction force due to friction with the substrate to be polished, and the rear side in the traveling direction is subjected to a force separating from the substrate to be polished. There is a problem that uniform polishing of the substrate to be polished becomes difficult.

【0005】本発明は上述の点に鑑みてなされたもの
で、上記問題点を除去し、被研磨基板の研磨面に反りが
あっても、砥石はその反りに追従でき、且つ研磨中の砥
石と被研磨基板との摩擦により発生する反力を吸収して
砥石面が適正に被研磨基板面に接触し均一な研磨ができ
る基板研磨装置を提供すること目的とする。
The present invention has been made in view of the above problems, and eliminates the above-mentioned problems. Even if the polishing surface of the substrate to be polished has a warp, the grindstone can follow the warp and the grindstone being polished. It is an object of the present invention to provide a substrate polishing apparatus capable of absorbing a reaction force generated by friction between the substrate and a substrate to be polished, and allowing a grinding wheel surface to appropriately contact a substrate surface to be polished to perform uniform polishing.

【0006】[0006]

【課題を解決するための手段】上記課題を解決するた
め、請求項1に記載の発明は、被研磨基板に砥石を当接
し、該被研磨基板と砥石の相対運動により該被研磨基板
を研磨する基板研磨装置において、砥石は弾性体を介し
て支持体に支持されていることを特徴とする。
According to a first aspect of the present invention, a grindstone is brought into contact with a substrate to be polished, and the substrate is polished by relative motion between the substrate and the grindstone. In the above substrate polishing apparatus, the grindstone is supported by a support via an elastic body.

【0007】また、被研磨基板に砥石を当接し、該被研
磨基板と砥石の相対運動により該被研磨基板を研磨する
基板研磨装置において、砥石は環状に配列された多数の
ペレット状の砥石からなり、該ペレット状の各砥石は弾
性体を介して支持体に支持されていることを特徴とす
る。
Further, in a substrate polishing apparatus for abrading a substrate to be polished by bringing a grindstone into contact with the substrate to be polished and polishing the substrate to be polished by a relative motion between the substrate and the grindstone, the grindstone is formed by a large number of pellet-shaped grindstones arranged in a ring. Wherein each of the pellet-shaped grinding wheels is supported by a support via an elastic body.

【0008】また、請求項2に記載の発明は、被研磨基
板に砥石を当接し、該被研磨基板と砥石の相対運動によ
り該被研磨基板を研磨する基板研磨装置において、砥石
は球面座軸受を介して支持体に支持されていることを特
徴とする。
According to a second aspect of the present invention, there is provided a substrate polishing apparatus in which a grindstone is brought into contact with a substrate to be polished and the substrate is polished by relative movement between the substrate and the grindstone. Characterized by being supported by the support via

【0009】また、請求項3に記載の発明は、被研磨基
板に砥石を当接し、該被研磨基板と砥石の相対運動によ
り該被研磨基板を研磨する基板研磨装置において、砥石
は環状に配列された多数のペレット状の砥石からなり、
該ペレット状の各砥石は球面座軸受を介して支持体に支
持されていることを特徴とする。
According to a third aspect of the present invention, there is provided a substrate polishing apparatus for abutting a grindstone on a substrate to be polished and polishing the substrate to be polished by relative movement between the substrate and the grindstone, wherein the grindstones are arranged in a ring. Made of a number of pellet-shaped whetstones,
Each of the pellet-shaped grinding wheels is supported by a support via a spherical bearing.

【0010】また、請求項4に記載の発明は、請求項2
又は3に記載の基板研磨装置において、球面座軸受の砥
石の反対側は弾性体を介して支持体に支持されているこ
とを特徴とする。
[0010] Further, the invention according to claim 4 is based on claim 2.
Alternatively, in the substrate polishing apparatus according to 3, the opposite side of the grinding wheel of the spherical seat bearing is supported by a support via an elastic body.

【0011】また、請求項2又は3に記載の基板研磨装
置において、球面座軸受は弾性体で構成されていること
を特徴とする。
Further, in the substrate polishing apparatus according to the second or third aspect, the spherical seat bearing is formed of an elastic body.

【0012】また、請求項5に記載の発明は、請求項2
又は3に記載の基板研磨装置において、球面座軸受の砥
石側は弾性体を介して支持体に支持されていることを特
徴とする。
Further, the invention described in claim 5 is the same as the invention described in claim 2.
Alternatively, in the substrate polishing apparatus according to 3, the grinding wheel side of the spherical seat bearing is supported by a support via an elastic body.

【0013】また、請求項2乃至5の何れか1に記載の
基板研磨装置において、砥石の高さを調整する高さ調整
手段を設けたことを特徴とする。
Further, in the substrate polishing apparatus according to any one of claims 2 to 5, a height adjusting means for adjusting the height of the grindstone is provided.

【0014】また、請求項3乃至5の何れか1に記載の
基板研磨装置において、砥石の高さを調整する高さ調整
手段を設け、被研磨基板の研磨量又は砥石の高さを測定
し、高さ調整手段を用いて各砥石の研磨面を揃えること
を特徴とする。
Further, in the substrate polishing apparatus according to any one of claims 3 to 5, a height adjusting means for adjusting the height of the grindstone is provided, and the amount of polishing of the substrate to be polished or the height of the grindstone is measured. The polishing surface of each whetstone is made uniform using height adjusting means.

【0015】また、請求項6に記載の発明は、請求項3
乃至5の何れか1に記載の基板研磨装置において、砥石
及び支持体を含む構成部材を砥石保持構造体として纏
め、該砥石保持構造体ごと砥石リテーナーに取付け・取
り外しできるように構成したことを特徴とする。
The invention described in claim 6 is the third invention.
In the substrate polishing apparatus according to any one of the above-described embodiments, the constituent members including the grindstone and the support are combined as a grindstone holding structure, and the whole grindstone holding structure can be attached to and detached from the grindstone retainer. And

【0016】また、請求項6に記載の基板研磨装置にお
いて、砥石リテーナーは球面座軸受を介して回転シャフ
トに支持されていることを特徴とする。
Further, in the substrate polishing apparatus according to the present invention, the grinding wheel retainer is supported on the rotating shaft via a spherical bearing.

【0017】[0017]

【発明の実施の形態】以下、本発明の実施の形態例を図
面に基づいて説明する。図1は本発明の基板研磨装置に
用いる砥石保持構造の構成例を示す図で、図1(a)は
側断面図、図1(b)は底面図である。本砥石保持構造
は偏平な環状の砥石1をゴム等の弾性体3を介して円板
状の支持体2に取り付けた構造である。4は回転シャフ
トで、ここでは支持体2と一体的に設けられている。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing a configuration example of a grindstone holding structure used in the substrate polishing apparatus of the present invention. FIG. 1 (a) is a side sectional view, and FIG. 1 (b) is a bottom view. The whetstone holding structure is a structure in which a flat annular whetstone 1 is attached to a disk-shaped support 2 via an elastic body 3 such as rubber. Reference numeral 4 denotes a rotating shaft, which is provided integrally with the support 2 here.

【0018】上記のように、弾性体3を介して支持体2
に取り付けた環状の砥石1を半導体ウエハ等の被研磨基
板5の研磨面に当接し、図示しない給水パイプ等から水
を被研磨基板5の上面に供給し、回転シャフト4を矢印
Aに示すように回転することにより、被研磨基板5は研
磨される。このとき支持体2と砥石1の間には弾性体3
が介在しているので、被研磨基板5の研磨面に反りがあ
っても砥石1は該反り面に沿ってスムーズに移動できる
から、被研磨基板5の均一な研磨が可能となる。
As described above, the support 2 is provided via the elastic body 3.
The annular grindstone 1 attached to the substrate is brought into contact with the polishing surface of the substrate 5 to be polished such as a semiconductor wafer, and water is supplied to the upper surface of the substrate 5 from a water supply pipe or the like (not shown). The substrate 5 to be polished is polished. At this time, an elastic body 3 is provided between the support 2 and the grindstone 1.
, The grindstone 1 can move smoothly along the warped surface even if the polished surface of the polished substrate 5 is warped, so that the polished substrate 5 can be uniformly polished.

【0019】図2は本発明の基板研磨装置に用いる砥石
保持構造の他の構成例を示す図で、図2(a)は側断面
図、図2(b)は底面図である。本砥石保持構造は円板
状の支持体2の下面にペレット状の多数の砥石10を環
状に等間隔に配置した構造で、各砥石10は支持体2の
下面に取り付けたケーシング11内にバネ等の弾性体1
2を介して収納支持されている。即ち、ここでは砥石1
0は弾性体12及びケーシングを介して間接的に支持体
に支持されている。
FIG. 2 is a view showing another example of the structure of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention. FIG. 2 (a) is a side sectional view, and FIG. 2 (b) is a bottom view. The present whetstone holding structure is a structure in which a number of pellet-shaped whetstones 10 are annularly arranged at equal intervals on the lower surface of a disk-shaped support 2, and each whetstone 10 is provided with a spring in a casing 11 attached to the lower surface of the support 2. Elastic body 1
It is housed and supported via 2. That is, here, the whetstone 1
Numeral 0 is indirectly supported by the support via the elastic body 12 and the casing.

【0020】上記のように、支持体2の下面に環状で等
間隔に配設したケーシング11内に弾性体12を介して
収納支持した砥石10を被研磨基板5の研磨面に当接
し、図示しない給水パイプ等から水を被研磨基板5の上
面に供給し、回転シャフト4を矢印Aに示すように回転
することにより、被研磨基板5は研磨される。このとき
ケーシング11と砥石10の間に弾性体12が介在して
いるので、被研磨基板5の研磨面に反りがあっても砥石
10は該反り面にスムーズに追従して移動でき、均一な
研磨が可能となる。
As described above, the grindstone 10 housed and supported via the elastic body 12 in the casing 11 disposed annularly at equal intervals on the lower surface of the support 2 abuts on the polishing surface of the substrate 5 to be polished. Water is supplied to the upper surface of the polished substrate 5 from a water supply pipe or the like which is not used, and the polished substrate 5 is polished by rotating the rotating shaft 4 as shown by the arrow A. At this time, since the elastic body 12 is interposed between the casing 11 and the grindstone 10, even if the polished surface of the substrate 5 to be polished has a warp, the grindstone 10 can smoothly follow the warped surface and move, and the uniformity can be obtained. Polishing becomes possible.

【0021】図3は砥石10をケーシング11内に収容
支持する他の形態例を示す図である。砥石10は保持体
13に保持され、該保持体13とケーシング11の内上
面の間にゴム等の弾性体12を介在させると共に、保持
体13の外周面とケーシング11の内周面間にOリング
等の環状の弾性体14を介在させている。これにより、
砥石10に加わる上下方向の力は弾性体12で吸収し、
砥石10に加わる横方向の力は弾性体12で吸収する。
即ち、ここでは砥石10を保持する保持体13の上下方
向及び横方向が弾性体12及び弾性体14で支持されて
いることになる。これにより、被研磨基板5の研磨面に
反りが有っても砥石10は該反り面にスムーズに追従し
て移動でき、均一な研磨が可能となる。
FIG. 3 is a view showing another embodiment in which the grindstone 10 is accommodated and supported in a casing 11. The grindstone 10 is held by a holder 13, an elastic body 12 such as rubber is interposed between the holder 13 and the inner upper surface of the casing 11, and the grinding wheel 10 is placed between the outer peripheral surface of the holder 13 and the inner peripheral surface of the casing 11. An annular elastic body 14 such as a ring is interposed. This allows
The vertical force applied to the grindstone 10 is absorbed by the elastic body 12,
The lateral force applied to the grindstone 10 is absorbed by the elastic body 12.
That is, in this case, the vertical direction and the horizontal direction of the holding body 13 holding the grinding stone 10 are supported by the elastic bodies 12 and the elastic bodies 14. Thus, even if the polished surface of the substrate 5 to be polished has a warp, the grindstone 10 can move smoothly following the warped surface, and uniform polishing can be performed.

【0022】図4は本発明の基板研磨装置に用いる砥石
保持構造の他の構成例を示す側断面図である。本砥石保
持構造は、砥石10を保持する保持体13の上端面は凸
状の球面に形成されると共に、該保持体13を支持する
支持体16の下端は該球面に密接するように凹状の球面
に形成されて、該保持体13の上端の凸状球面と支持体
16の下端の凹状の球面とで球面座軸受15を構成して
いる。即ち、球面座軸受15の砥石側が保持体13とな
り、砥石側が支持体16となっている。また、砥石10
を保持する保持体13はケーシング11の下方の大径部
11aの内部に収容されると共に、支持体16はケーシ
ング11の上方の小径部11bの内部に収容される、所
定寸法の範囲で上下動できるようになっている。
FIG. 4 is a side sectional view showing another example of the structure of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention. In the present whetstone holding structure, the upper end surface of the holding body 13 holding the whetstone 10 is formed as a convex spherical surface, and the lower end of the supporting body 16 supporting the holding body 13 is formed in a concave shape so as to be in close contact with the spherical surface. The spherical seat bearing 15 is formed of a convex spherical surface at the upper end of the holder 13 and a concave spherical surface at the lower end of the support 16. That is, the grindstone side of the spherical bearing 15 is the holder 13, and the grindstone side is the support 16. In addition, whetstone 10
Is held in the large-diameter portion 11a below the casing 11, and the support 16 is accommodated in the small-diameter portion 11b above the casing 11, and moves up and down within a predetermined dimension. I can do it.

【0023】また、ケーシング11の小径部11b上方
内にはピストン18が収容され、該ピストン18と支持
体16の間にゴム材等からなる弾性体17が介在してい
る。また、ピストン18の上方には砥石10の高さを調
整するためのネジ溝19が形成されており、高さ調整つ
まみ20を回転させることにより、該ネジ溝19は小径
部11bの上端部内周面に形成されたネジ溝(図示せ
ず)に螺合してピストン18が上下動する。該ピストン
18の上下動に連動して保持体13に保持された砥石1
0も上下動し、該砥石10の高さが調整できるようにな
っている。
A piston 18 is accommodated above the small diameter portion 11b of the casing 11, and an elastic body 17 made of rubber or the like is interposed between the piston 18 and the support 16. A screw groove 19 for adjusting the height of the grindstone 10 is formed above the piston 18. By rotating the height adjustment knob 20, the screw groove 19 is formed on the inner periphery of the upper end of the small diameter portion 11 b. The piston 18 moves up and down by screwing into a thread groove (not shown) formed on the surface. The grindstone 1 held by the holder 13 in conjunction with the vertical movement of the piston 18
0 also moves up and down, so that the height of the grindstone 10 can be adjusted.

【0024】なお、上記高さ調整つまみ20の替わりに
ナットをケーシング11の上端に位置するように配置
し、且つケーシング11の小径部11bの周面ネジ溝を
無くし、このナットを上記ネジ溝19に螺合するように
構成することにより、該ナットを回転させることによ
り、砥石10の高さを調整するようにすることも可能で
ある。また、14は図3の場合と同様、ケーシング11
の内周面と保持体13の外周面の間に介在するOリング
等の環状の弾性体であり、21は保持体13等の脱落を
防止する脱落防止板である。
A nut is arranged at the upper end of the casing 11 in place of the height adjusting knob 20, and the peripheral thread of the small diameter portion 11b of the casing 11 is eliminated. The height of the grindstone 10 can be adjusted by rotating the nut. Further, 14 is the same as the case of FIG.
Is an annular elastic body such as an O-ring interposed between the inner peripheral surface of the holding member 13 and the outer peripheral surface of the holding member 13, and 21 is a fall prevention plate for preventing the holding member 13 and the like from falling.

【0025】上記構造の砥石保持構造において、砥石1
0を被研磨基板5の上面に当接し、図示しない給水パイ
プ等から水を被研磨基板5の上面に供給し、ケーシング
11又は被研磨基板5又はケーシング11と被研磨基板
5を矢印Bのように移動させ、相互の相対運動で、被研
磨基板5を研磨する。この時、砥石10に加わる上下方
向の反力は弾性体17で吸収され、砥石10と被研磨基
板5の摩擦による横方向の反力は弾性体14で吸収され
る。これにより、被研磨基板5の研磨面に反りがあって
も、砥石10は研磨面に沿ってスムーズに追従して移動
でき、均一な研磨が可能となる。
In the whetstone holding structure having the above structure, the whetstone 1
0 is in contact with the upper surface of the substrate 5 to be polished, water is supplied to the upper surface of the substrate 5 to be polished from a water supply pipe or the like (not shown), and the casing 11 or the substrate 5 to be polished or the casing 11 and the substrate 5 to be polished are Then, the substrate 5 to be polished is polished by mutual relative movement. At this time, the vertical reaction force applied to the grindstone 10 is absorbed by the elastic body 17, and the lateral reaction force due to the friction between the grindstone 10 and the substrate 5 to be polished is absorbed by the elastic body 14. Thus, even if the polished surface of the substrate 5 to be polished has a warp, the grindstone 10 can smoothly follow and move along the polished surface, and uniform polishing can be performed.

【0026】また、研磨中、砥石10は被研磨基板5と
の摩擦のために反力にて進行方向前側は被研磨基板5の
面に強く当り、進行方向後ろ側は被研磨基板5から離れ
る力を受けるが、上記のように保持体13の上端凸状球
面と支持体16の下端凹状球面とで球面座軸受を構成し
ているので、このような反力は吸収され、砥石10の面
と被研磨基板5の研磨面が適正に接触し、均一な研磨が
可能となる。
Also, during polishing, the grindstone 10 comes into strong contact with the surface of the substrate 5 to be polished by reaction force due to friction with the substrate 5 to be polished, and separates from the substrate 5 to be polished rearward due to friction. Although it receives a force, as described above, a spherical seat bearing is constituted by the upper-end convex spherical surface of the holding body 13 and the lower-end concave spherical surface of the support body 16, so such a reaction force is absorbed and the surface of the grindstone 10 is absorbed. And the polished surface of the substrate 5 to be polished properly contact, and uniform polishing is possible.

【0027】なお、上記例では球面座軸受15を構成す
る保持体13又は支持体16はいずれも剛体で構成して
いるが、保持体13又は支持体16の何れか一方又は双
方を弾性体とすることで、この場合は少なくとも弾性体
17を省略できる。
In the above example, the support 13 or the support 16 constituting the spherical seat bearing 15 is made of a rigid body, but either or both of the support 13 and the support 16 are made of an elastic body. By doing so, at least the elastic body 17 can be omitted in this case.

【0028】図5及び図6は本発明の基板研磨装置に用
いる砥石保持構造の他の構成例を示す図で、図5は側断
面図、図6は概略平面図である。本基板研磨装置は図5
に示すように、図4に示す砥石保持構造体Gのケーシン
グ11の大径部11aを砥石リテーナー22にネジ23
で取付けた構造である。砥石リテーナー22は図6に示
すように、円板状でその外周に砥石保持構造体Gのケー
シング11の小径部11bが挿入される複数(図では
8)の切り欠き部22aが形成されており、該切り欠き
部22aに砥石保持構造体Gのケーシング11の小径部
11bを挿入し、大径部11aの上端面をネジ23で砥
石リテーナー22の下面に固定する。
FIGS. 5 and 6 show another example of the structure of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention. FIG. 5 is a side sectional view and FIG. 6 is a schematic plan view. This substrate polishing apparatus is shown in FIG.
As shown in FIG. 4, the large diameter portion 11a of the casing 11 of the grinding wheel holding structure G shown in FIG.
It is the structure which was attached with. As shown in FIG. 6, the grindstone retainer 22 has a disk shape, and a plurality of (8 in FIG. 8) cutouts 22a into which the small diameter portion 11b of the casing 11 of the grindstone holding structure G is inserted. Then, the small-diameter portion 11b of the casing 11 of the grindstone holding structure G is inserted into the notch portion 22a, and the upper end surface of the large-diameter portion 11a is fixed to the lower surface of the grindstone retainer 22 with the screw 23.

【0029】本砥石保持構造を図5及び図6に示すよう
な構成とすることにより、砥石保持構造体Gごと砥石リ
テーナー22に取り付けて本砥石保持構造を組立てるこ
とができると共に、ネジ23を外すことにより、砥石保
持構造体Gごと取り外すことができ、本砥石保持構造全
体の組立て及びメンテナンスが容易となる。
5 and 6, the main wheel holding structure can be assembled by attaching the main wheel holding structure G to the main wheel retainer 22, and the screw 23 can be removed. Thereby, the whole grindstone holding structure G can be removed, and the assembling and maintenance of the whole grindstone holding structure become easy.

【0030】上記のように、砥石リテーナー22に砥石
保持構造体Gを取り付けることにより、砥石10は環状
に等間隔で配置される。このように環状に等間隔で配置
された砥石10を被研磨基板5の研磨面に当接し、図示
しない給水パイプ等から被研磨基板5の上面に水を供給
して、砥石リテーナー22の中心部に設けられた回転シ
ャフト24を回転させることにより、被研磨基板5を研
磨する。
As described above, by attaching the grindstone holding structure G to the grindstone retainer 22, the grindstones 10 are annularly arranged at equal intervals. Thus, the grindstones 10 arranged at equal intervals in a ring shape are brought into contact with the polished surface of the polished substrate 5, and water is supplied to the upper surface of the polished substrate 5 from a water supply pipe or the like (not shown) so that the center of the grindstone retainer 22 is formed. The substrate 5 to be polished is polished by rotating the rotation shaft 24 provided in the substrate.

【0031】図5及び図6に示す構成の砥石保持構造を
用いた基板研磨装置において、被研磨基板5の研磨量又
は砥石10の高さを測定し、各砥石保持構造体Gの高さ
調整つまみ20を回転することにより、各砥石10の研
磨面を揃えることができる。
In the substrate polishing apparatus using the grindstone holding structure having the structure shown in FIGS. 5 and 6, the amount of polishing of the substrate 5 to be polished or the height of the grindstone 10 is measured, and the height of each grindstone holding structure G is adjusted. By rotating the knob 20, the polishing surfaces of the respective grindstones 10 can be aligned.

【0032】図7は本発明の基板研磨装置に用いる砥石
保持構造の他の構成例を示す側断面図である。図7の砥
石保持構造が図5の砥石保持構造と相違する点は、砥石
保持構造体Gのケーシング11の大径部11aがバネ2
5を介在させてネジ23で砥石リテーナー22に取り付
けるようになっている点である。このようにバネ25を
介在させて、砥石保持構造体Gを砥石リテーナー22に
取り付けることにより、該砥石保持構造体Gに加わる上
下方向の力はバネ25により吸収され、砥石10の面は
被研磨基板5の研磨面に更にスムーズに追従して移動す
ることができる。
FIG. 7 is a side sectional view showing another example of the structure of the grindstone holding structure used in the substrate polishing apparatus of the present invention. The difference between the grindstone holding structure of FIG. 7 and the grindstone holding structure of FIG. 5 is that the large diameter portion 11a of the casing 11 of the grindstone holding structure G has a spring 2.
5 is to be attached to the grindstone retainer 22 with the screw 23 with the intermediary 5. By attaching the grindstone holding structure G to the grindstone retainer 22 with the spring 25 interposed in this way, the vertical force applied to the grindstone holding structure G is absorbed by the spring 25, and the surface of the grindstone 10 is polished. It is possible to more smoothly follow the polished surface of the substrate 5 and move.

【0033】図8は本発明の基板研磨装置に用いる砥石
保持構造の他の構成例を示す側断面図である。本砥石保
持構造は、砥石リテーナー22に図4に示す砥石保持構
造体Gを取付ける点は図5乃至図7の場合と同じである
が、砥石リテーナー22も球面座軸受29を介して回転
シャフト26に支持する構成とした点及び砥石リテーナ
ー22と回転シャフト26の連結構造を回転シャフト2
6に設けたフランジ26aをバネ28を介在させてネジ
27で砥石リテーナー22に連結した点が異なる。
FIG. 8 is a side sectional view showing another example of the structure of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention. The present grindstone holding structure is similar to the case of FIGS. 5 to 7 in that the grindstone holding structure G shown in FIG. 4 is attached to the grindstone retainer 22, but the grindstone retainer 22 also has a rotating shaft 26 via a spherical seat bearing 29. And the connecting structure between the grinding wheel retainer 22 and the rotary shaft 26 is
6 in that the flange 26a provided on the wheel 6 is connected to the grindstone retainer 22 by screws 27 with a spring 28 interposed.

【0034】上記のように砥石リテーナー22を球面座
軸受29を介して回転シャフト26に支持させる構成と
することにより、砥石リテーナー22全体が球面座軸受
29を中心に傾動できるから、研磨中に砥石10と被研
磨基板5との摩擦により反力が発生しても、本砥石保持
構造体全体に加わる反力は砥石リテーナー22の球面座
軸受29を中心とする傾動により吸収できると共に、砥
石10と被研磨基板5との摩擦による反力で、砥石10
の進行方向前側は被研磨基板5に強く当り、進行方向後
ろ側が被研磨基板5から離れようとする力は、個々の砥
石保持構造体Gの支持体16と保持体13の当接部の球
面座軸受15で吸収されるから、全部の砥石10の面は
被研磨基板の研磨面に適正に接触し、均一な研磨が可能
となる。
Since the grindstone retainer 22 is supported on the rotary shaft 26 via the spherical bearing 29 as described above, the whole grindstone retainer 22 can be tilted about the spherical bearing 29. Even if a reaction force is generated due to friction between the grinding wheel 10 and the substrate 5 to be polished, the reaction force applied to the entire grindstone holding structure can be absorbed by the tilting of the grindstone retainer 22 about the spherical bearing 29, and the grinding wheel 10 The reaction force due to friction with the substrate 5 to be polished
The force in which the front side in the traveling direction strongly touches the substrate 5 to be polished and the rear side in the traveling direction tends to separate from the substrate 5 is the spherical surface of the contact portion between the support 16 and the support 13 of the individual grindstone holding structure G. Since the surface is absorbed by the seat bearing 15, all the surfaces of the grindstones 10 properly contact the polished surface of the substrate to be polished, and uniform polishing can be performed.

【0035】図9は本発明の基板研磨装置の構成例を示
す外観図である。図示するように、本基板研磨装置は、
基台100にL型アーム101が固定されており、該L
型アーム101の先端に図8に示す構成の砥石保持構造
体104がその回転シャフト26が図示しない回転機構
により矢印Fに示す方向に回転するように取り付けられ
ている。また、基台100の上のテーブル102が矢印
X方向に移動自在に設けられている。また、テーブル1
02上には被研磨基板5が図示しない回転機構により矢
印E方向に回転するように取り付けられている。また、
基台100の下面には高さが調整できる脚103が設け
られている。
FIG. 9 is an external view showing a configuration example of a substrate polishing apparatus according to the present invention. As shown in FIG.
An L-shaped arm 101 is fixed to a base 100.
A grindstone holding structure 104 having the configuration shown in FIG. 8 is attached to the tip of the mold arm 101 so that its rotating shaft 26 rotates in the direction shown by the arrow F by a rotating mechanism (not shown). Further, a table 102 on the base 100 is provided so as to be movable in the arrow X direction. Table 1
A substrate 5 to be polished is mounted on the substrate 02 so as to rotate in the direction of arrow E by a rotating mechanism (not shown). Also,
A leg 103 whose height can be adjusted is provided on the lower surface of the base 100.

【0036】上記構成の基板研磨装置において、図示し
ない、給水パイプから水を被研磨基板5の上に供給する
と共に、回転シャフト26を矢印F方向に、被研磨基板
5を矢印E方向に回転し、砥石保持構造体104の砥石
10の面を被研磨基板5に当接させることにより、被研
磨基板5が研磨される。また、被研磨基板5の研磨量又
は砥石10の高さを測定し、高さ調整つまみ20を回転
して各砥石10の研磨面を揃える。
In the substrate polishing apparatus having the above structure, water is supplied from a water supply pipe (not shown) onto the substrate 5 to be polished, and the rotating shaft 26 is rotated in the direction of arrow F and the substrate 5 is rotated in the direction of arrow E. By bringing the surface of the grindstone 10 of the grindstone holding structure 104 into contact with the substrate 5 to be polished, the substrate 5 to be polished is polished. In addition, the polishing amount of the substrate 5 to be polished or the height of the grindstone 10 is measured, and the height adjustment knob 20 is rotated to align the polished surfaces of the respective grindstones 10.

【0037】なお、上記基板研磨装置において、砥石保
持構造体104は図8に示す砥石保持構造体を示すが、
これに限定されるものではなく、図1、図2、図3、図
4、図5、図6、図7に示す構成の砥石保持構造体を用
いてもよいことは当然である。
In the above substrate polishing apparatus, the grindstone holding structure 104 is the grindstone holding structure shown in FIG.
However, the present invention is not limited to this, and it goes without saying that a grindstone holding structure having the configuration shown in FIGS. 1, 2, 3, 4, 5, 6, and 7 may be used.

【0038】[0038]

【発明の効果】以上、説明したように、本願各請求項に
記載の発明によれば、下記のような優れた効果が期待で
きる。
As described above, according to the invention described in each claim of the present application, the following excellent effects can be expected.

【0039】請求項1に記載の発明によれば、砥石は弾
性体を介して支持体に支持されているので、被研磨基板
の研磨面に反り等があっても、砥石面が研磨面にスムー
ズに追従して移動でき、該被研磨基板の研磨面を均一に
研磨することができる。
According to the first aspect of the present invention, the grindstone is supported by the support via the elastic body. Therefore, even if the polished surface of the substrate to be polished has a warp or the like, the grindstone surface is kept on the polished surface. The polished surface of the substrate to be polished can be uniformly polished.

【0040】また、請求項2に記載の発明によれば、砥
石は球面座軸受を介して支持体に支持されているので、
砥石と被研磨基板の摩擦による反力による砥石の傾きを
防止し、砥石面が被研磨基板の研磨面に適正に接触し、
該被研磨基板の研磨面を均一に研磨することができる。
According to the second aspect of the present invention, since the grinding wheel is supported by the support via the spherical seat bearing,
Prevents the grindstone from tilting due to the reaction force caused by the friction between the grindstone and the substrate to be polished, and the grindstone surface properly contacts the polishing surface of the polished substrate,
The polished surface of the substrate to be polished can be uniformly polished.

【0041】また、請求項3に記載の発明によれば、砥
石は環状に配列された多数のペレット状の砥石からな
り、該ペレット状の各砥石は球面座軸受を介して支持体
に支持されているので、砥石と被研磨基板の摩擦による
反力による砥石の傾きを防止し、各砥石面が被研磨基板
の研磨面に適正に接触し、該被研磨基板の研磨面を均一
に研磨することができる。
According to the third aspect of the present invention, the grindstone comprises a large number of pellet-shaped grindstones arranged in a ring, and each of the pellet-shaped grindstones is supported by a support through a spherical bearing. As a result, the inclination of the grindstone due to the reaction force caused by the friction between the grindstone and the substrate to be polished is prevented, and each grindstone surface appropriately contacts the polished surface of the polished substrate to uniformly polish the polished surface of the polished substrate. be able to.

【0042】また、請求項4に記載の発明によれば、球
面座軸受の砥石の反対側は弾性体を介して支持体に支持
されているので、請求項2又は3に記載の発明の上記効
果に加え、被研磨基板の研磨面に反り等があっても砥石
面が研磨面にスムーズに追従して移動でき、該被研磨基
板の研磨面を均一に研磨することができる。
According to the fourth aspect of the present invention, the opposite side of the grinding wheel of the spherical seat bearing is supported by the support through an elastic body. In addition to the effect, even if the polished surface of the substrate to be polished has a warp or the like, the grindstone surface can smoothly follow the polished surface and move, and the polished surface of the polished substrate can be uniformly polished.

【0043】また、請求項5に記載の発明によれば、球
面座軸受の砥石側は弾性体を介して支持体に支持されて
いるので、請求項2又は3に記載の発明の上記効果に加
え、砥石に加わる横方向の力も吸収でき、被研磨基板の
研磨面を均一に研磨することができる。
According to the fifth aspect of the present invention, the grinding wheel side of the spherical seat bearing is supported by the support through the elastic body. In addition, the lateral force applied to the grindstone can be absorbed, and the polished surface of the substrate to be polished can be uniformly polished.

【0044】また、請求項6に記載の発明によれば、砥
石及び支持体を含む構成部材を砥石保持構造体として纏
め、該砥石保持構造体ごと砥石リテーナーに取付け・取
り外しできるように構成したので、砥石の取替えが容易
で研磨装置のメンテナンスが容易となる。
According to the sixth aspect of the present invention, the constituent members including the grindstone and the support are combined as a grindstone holding structure, and the whole grindstone holding structure can be attached to and detached from the grindstone retainer. The replacement of the grindstone is easy, and the maintenance of the polishing apparatus is easy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の基板研磨装置に用いる砥石保持構造の
構成例を示す図で、図1(a)は側断面図、図1(b)
は底面図である。
FIG. 1 is a view showing a configuration example of a grindstone holding structure used in a substrate polishing apparatus according to the present invention. FIG. 1 (a) is a side sectional view, and FIG. 1 (b).
Is a bottom view.

【図2】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す図で、図2(a)は側断面図、図2
(b)は底面図である。
FIG. 2 is a view showing another configuration example of a grindstone holding structure used in the substrate polishing apparatus of the present invention. FIG. 2 (a) is a side sectional view, and FIG.
(B) is a bottom view.

【図3】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す側断面図である。
FIG. 3 is a side sectional view showing another example of the configuration of the grindstone holding structure used in the substrate polishing apparatus of the present invention.

【図4】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す側断面図である。
FIG. 4 is a side sectional view showing another configuration example of the grindstone holding structure used in the substrate polishing apparatus of the present invention.

【図5】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す側断面図である。
FIG. 5 is a side sectional view showing another configuration example of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention.

【図6】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す概略平面図である。
FIG. 6 is a schematic plan view showing another configuration example of the grinding wheel holding structure used in the substrate polishing apparatus of the present invention.

【図7】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す側断面図である。
FIG. 7 is a side sectional view showing another configuration example of the grindstone holding structure used in the substrate polishing apparatus of the present invention.

【図8】本発明の基板研磨装置に用いる砥石保持構造の
他の構成例を示す側断面図である。
FIG. 8 is a side sectional view showing another configuration example of the grindstone holding structure used in the substrate polishing apparatus of the present invention.

【図9】本発明の基板研磨装置の構成例を示す外観図で
ある。
FIG. 9 is an external view illustrating a configuration example of a substrate polishing apparatus according to the present invention.

【符号の説明】[Explanation of symbols]

1 砥石 2 支持体 3 弾性体 4 回転シャフト 5 被研磨基板 10 砥石 11 ケーシング 12 弾性体 13 保持体 14 弾性体 15 球面座軸受 16 支持体 17 弾性体 18 ピストン 19 ネジ溝 20 高さ調整つまみ 21 脱落防止板 22 砥石リテーナー 23 ネジ 24 回転シャフト 25 バネ 26 回転シャフト 27 ネジ 28 バネ 29 球面座軸受 DESCRIPTION OF SYMBOLS 1 Whetstone 2 Support 3 Elastic body 4 Rotary shaft 5 Substrate to be polished 10 Grindstone 11 Casing 12 Elastic body 13 Holder 14 Elastic body 15 Spherical seat bearing 16 Support 17 Elastic body 18 Piston 19 Screw groove 20 Height adjustment knob 21 Dropout Prevention plate 22 Grindstone retainer 23 Screw 24 Rotary shaft 25 Spring 26 Rotary shaft 27 Screw 28 Spring 29 Spherical seat bearing

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松尾 尚典 神奈川県藤沢市本藤沢4丁目2番1号 株 式会社荏原総合研究所内 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Naosuke Matsuo 4-2-1 Motofujisawa, Fujisawa-shi, Kanagawa Inside Ebara Research Institute Co., Ltd.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 被研磨基板に砥石を当接し、該被研磨基
板と砥石の相対運動により該被研磨基板を研磨する基板
研磨装置において、 前記砥石は弾性体を介して支持体に支持されていること
を特徴とする基板研磨装置。
1. A substrate polishing apparatus for bringing a grinding stone into contact with a substrate to be polished and polishing the substrate to be polished by a relative motion between the substrate to be polished and the grinding stone, wherein the grinding stone is supported by a support via an elastic body. A substrate polishing apparatus, comprising:
【請求項2】 被研磨基板に砥石を当接し、該被研磨基
板と砥石の相対運動により該被研磨基板を研磨する基板
研磨装置において、 前記砥石は球面座軸受を介して支持体に支持されている
ことを特徴とする基板研磨装置。
2. A substrate polishing apparatus in which a grindstone is brought into contact with a substrate to be polished and polishes the substrate to be polished by a relative motion between the substrate to be polished and the grindstone, wherein the grindstone is supported by a support through a spherical seat bearing. A substrate polishing apparatus, comprising:
【請求項3】 被研磨基板に砥石を当接し、該被研磨基
板と砥石の相対運動により該被研磨基板を研磨する基板
研磨装置において、 前記砥石は環状に配列された多数のペレット状の砥石か
らなり、該ペレット状の各砥石は球面座軸受を介して支
持体に支持されていることを特徴とする基板研磨装置。
3. A substrate polishing apparatus that abuts a grindstone on a substrate to be polished and polishes the substrate to be polished by a relative motion between the substrate to be polished and the grindstone, wherein the grindstone is a large number of pellet-shaped grindstones arranged in an annular shape. Wherein each of the pellet-shaped grinding wheels is supported by a support via a spherical seat bearing.
【請求項4】 請求項2又は3に記載の基板研磨装置に
おいて、 前記球面座軸受の前記砥石の反対側は弾性体を介して支
持体に支持されていることを特徴とする基板研磨装置。
4. The substrate polishing apparatus according to claim 2, wherein an opposite side of said grinding wheel of said spherical seat bearing is supported by a support via an elastic body.
【請求項5】 請求項2又は3に記載の基板研磨装置に
おいて、 前記球面座軸受の砥石側は弾性体を介して支持体に支持
されていることを特徴とする基板研磨装置。
5. The substrate polishing apparatus according to claim 2, wherein the grinding wheel side of the spherical seat bearing is supported by a support via an elastic body.
【請求項6】 請求項3乃至5の何れか1に記載の基板
研磨装置において、 前記砥石及び支持体を含む構成部材を砥石保持構造体と
して纏め、該砥石保持構造体ごと砥石リテーナーに取付
け・取り外しできるように構成したことを特徴とする基
板研磨装置。
6. The substrate polishing apparatus according to claim 3, wherein the constituent members including the grindstone and the support are combined as a grindstone holding structure, and the whole grindstone holding structure is attached to a grindstone retainer. A substrate polishing apparatus configured to be detachable.
JP11674398A 1998-04-27 1998-04-27 Substrate polishing device Pending JPH11300609A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11674398A JPH11300609A (en) 1998-04-27 1998-04-27 Substrate polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11674398A JPH11300609A (en) 1998-04-27 1998-04-27 Substrate polishing device

Publications (1)

Publication Number Publication Date
JPH11300609A true JPH11300609A (en) 1999-11-02

Family

ID=14694689

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11674398A Pending JPH11300609A (en) 1998-04-27 1998-04-27 Substrate polishing device

Country Status (1)

Country Link
JP (1) JPH11300609A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008168394A (en) * 2007-01-12 2008-07-24 Techno Shinei:Kk Grinding tool
CN103072077A (en) * 2013-01-29 2013-05-01 中国科学院长春光学精密机械与物理研究所 Double-flexible self-adaptive polishing grinding head
JP2014147984A (en) * 2013-01-31 2014-08-21 Disco Abrasive Syst Ltd Grinding wheel unit
CN105619198A (en) * 2015-12-31 2016-06-01 肖世文 Flexible ceramic tile grinding machine

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008168394A (en) * 2007-01-12 2008-07-24 Techno Shinei:Kk Grinding tool
CN103072077A (en) * 2013-01-29 2013-05-01 中国科学院长春光学精密机械与物理研究所 Double-flexible self-adaptive polishing grinding head
JP2014147984A (en) * 2013-01-31 2014-08-21 Disco Abrasive Syst Ltd Grinding wheel unit
CN105619198A (en) * 2015-12-31 2016-06-01 肖世文 Flexible ceramic tile grinding machine

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