JPH11237350A - Method and apparatus for analysis of slug - Google Patents

Method and apparatus for analysis of slug

Info

Publication number
JPH11237350A
JPH11237350A JP10057457A JP5745798A JPH11237350A JP H11237350 A JPH11237350 A JP H11237350A JP 10057457 A JP10057457 A JP 10057457A JP 5745798 A JP5745798 A JP 5745798A JP H11237350 A JPH11237350 A JP H11237350A
Authority
JP
Japan
Prior art keywords
sample
slag
analysis
molten
slug
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10057457A
Other languages
Japanese (ja)
Inventor
Akira Yamamoto
山本  公
Noriko Makiishi
規子 槙石
Wataru Tanimoto
亘 谷本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Original Assignee
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Steel Corp filed Critical Kawasaki Steel Corp
Priority to JP10057457A priority Critical patent/JPH11237350A/en
Publication of JPH11237350A publication Critical patent/JPH11237350A/en
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Carbon Steel Or Casting Steel Manufacturing (AREA)

Abstract

PROBLEM TO BE SOLVED: To obtain a method and an apparatus by which the composition of a slug generated inside a refining furnace in the refining process of especially ion and steel can be analyzed quickly and with high accuracy, by sampling a molten slug sample from the refining furnace, and holding the molten slug sample in a molten state so as to be subjected to an X-ray fluorescence analysis, an emission spectral analysis or an atomic absorption analysis. SOLUTION: When a molten slug of iron and steel is subjected to an X-ray fluorescence analysis, a sample mounting part 20 is removed from an X-ray fluorescence analyzer body 10, and the molten slug is sampled by a slug sampler so as to be injected into the recessed part 31 of a tungsten plate 32. At this time, an electrification chuck 32 is electrified, and the tungsten plate is heated due to its resistance. While the slug is being maintained in a molten state, the sample mounting part 20 is moved to the lower part of the analyzer body 10. Then, the sample mounting part 20 is decompressed. When it becomes the same vacuum as the inside of the analyzer body 10, a shutter 17 is opened, X-rays are radiated to a sample S from an X-ray tube 13, and fluorescent X-rays which are generated from the sample S are spectrally diffracted by an X-ray spectroscope 14 so as to be detected by a detector 15.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は金属の精錬過程で
生成するスラグの分析方法および分析装置に係り、特に
鉄鋼の精錬の際に生成するスラグを極めて迅速かつ正確
に分析できるスラグの分析方法および分析装置に関す
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for analyzing slag generated in the course of refining metal, and more particularly to a method and an apparatus for analyzing slag which can analyze slag generated during refining of steel very quickly and accurately. It relates to an analyzer.

【0002】[0002]

【従来の技術】金属の精錬過程において生成するスラグ
は精錬される金属の組成に対して大きな影響を与えるの
で、そのコントロールは重要な問題であり、そのため精
錬過程を通じスラグの分析が行われる。このスラグの分
析には、多元素を同時に精度よく分析することから、一
般にガラスビード蛍光X線分析法が用いられる。この方
法は、粉砕したスラグに対しその10倍程度の融剤を用
いて融解して均質なガラス状の試料を調整し、これに対
して蛍光X線分析を行う方法であり、試料が均質な状態
になっており、かつ、融剤によって希釈されているた
め、共存元素の影響が小さく分析精度が高いのが特徴で
あるが、試料調整のためのスラグの粉砕、秤量、融解の
作業に少なくとも30分を要し、鋼の精錬のような短時
間で精錬工程が完了するプロセスの制御のためには利用
できないという問題があった。
2. Description of the Prior Art Controlling slag generated during a metal refining process has a significant effect on the composition of the metal to be refined, and its control is an important issue, and therefore, slag is analyzed through the refining process. In analyzing the slag, a glass bead fluorescent X-ray analysis method is generally used because multiple elements are simultaneously analyzed with high accuracy. In this method, a homogenous glassy sample is prepared by melting a pulverized slag using a flux about 10 times that of a slag, and a fluorescent X-ray analysis is performed on the sample. Since it is in a state and is diluted with a flux, it is characterized by a small effect of coexisting elements and high analysis accuracy.However, it is at least necessary to grind, weigh, and melt slag for sample preparation. There is a problem that it takes 30 minutes and cannot be used for controlling a process in which the refining process is completed in a short time such as steel refining.

【0003】この問題の解決のため、ブリケット法、す
なわち、スラグを粉砕したのち成形し、その成型体を蛍
光X線分析に供するという方法が提案されており、ガラ
スビード法に比べ秤量や融解の作業が省略されるため分
析時間が短縮される利点があるが、それでもなお、20
分以下に短縮することは困難である。
[0003] In order to solve this problem, a briquette method, that is, a method in which slag is pulverized and then formed and then subjected to X-ray fluorescence analysis, has been proposed. Although there is an advantage that the analysis time is shortened because the operation is omitted, it is still possible to reduce the analysis time.
It is difficult to reduce to less than a minute.

【0004】特開昭54−153694号公報には樋を
流れる高炉滓中に、表面粗さが25μm以下、かつ、表
面温度が600〜700℃のサンプリング用の鋼板を浸
して高炉滓を付着・固化させて引き上げ、これに打撃を
与えて剥離し、剥離したスラグ片を直接蛍光X線分析に
供する方法が示されている。また、特開平9−1665
89号公報には、溶融スラグに平滑な面を有する金属板
を浸漬してスラグを固化させ、得られた平滑面を直接蛍
光X線分析に供する方法が開示されている。これらの方
法はスラグを固化させた状態で直接分析するため、分析
時間をかなり短くすることができる。
Japanese Patent Application Laid-Open No. 54-153694 discloses that a blast furnace slag having a surface roughness of 25 μm or less and a surface temperature of 600 to 700 ° C. is immersed in a blast furnace slag flowing through a gutter. There is disclosed a method in which the slag is solidified, pulled up, impacted and separated, and the separated slag pieces are directly subjected to fluorescent X-ray analysis. Further, Japanese Patent Application Laid-Open No.
No. 89 discloses a method in which a metal plate having a smooth surface is immersed in molten slag to solidify the slag, and the obtained smooth surface is directly subjected to X-ray fluorescence analysis. Since these methods directly analyze the slag in a solidified state, the analysis time can be considerably shortened.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、これら
の方法においても、高温のスラグサンプルを分析試料に
調整するには数分を要し、なお、上記短時間で行われる
精錬反応に対応するには十分ではない。さらに、たとえ
ば鉄鋼の転炉精錬においては、酸素の吹き付け、ガスバ
ブリング等により、炉中の溶鋼およびスラグが激しく撹
拌されており、かかる炉内から採取されたスラグには溶
鋼が混入している場合が多い。かかる溶鋼が混入してい
るスラグサンプルを用いて分析を行うと、Feの蛍光X
線によってスラグ中各成分が励起されることによる分析
誤差も生ずる。さらに、蛍光X線分析ではX線の侵入深
さや蛍光X線のマトリックスによる吸収などの問題から
実際に分析している領域は表層の約10μmまででしか
ない。このためスラグが冷却する過程で大気または鋼板
と接触している部分は炉内のスラグ組成と異質の組成に
変化してしまっていることも多い。
However, even in these methods, it takes several minutes to adjust a high-temperature slag sample into an analysis sample, and it is necessary to use the above-described refining reaction performed in a short time. Not enough. Furthermore, in converter refining of steel, for example, molten steel and slag in a furnace are vigorously stirred by blowing oxygen, gas bubbling, etc., and molten steel is mixed in slag collected from the furnace. There are many. When analysis is performed using a slag sample containing such molten steel, the fluorescence X of Fe
Analysis errors also occur due to the excitation of each component in the slag by the line. Furthermore, in the X-ray fluorescence analysis, the area actually analyzed is only about 10 μm in the surface layer due to problems such as the penetration depth of the X-rays and absorption of the X-ray fluorescence by the matrix. Therefore, in the process of cooling the slag, the portion in contact with the atmosphere or the steel sheet often changes to a composition different from the slag composition in the furnace.

【0006】このような問題は上記蛍光X線分析に留ま
らず、スラグを迅速分析する場合に共通の問題である。
したがって、本発明は、上記従来技術の問題点を解決す
ることを目的とし、金属の溶融精錬、特に鋼の精錬工程
で精錬炉内に生成するスラグ組成を迅速かつ高精度で分
析する方法および装置を提供することを目的とする。
[0006] Such a problem is not limited to the above-mentioned X-ray fluorescence analysis, but is a common problem when slag is rapidly analyzed.
Accordingly, an object of the present invention is to solve the above-mentioned problems of the prior art, and a method and an apparatus for quickly and accurately analyzing a slag composition generated in a smelting furnace in a metal refining process, particularly in a steel refining process. The purpose is to provide.

【0007】[0007]

【課題を解決するための手段】本発明は上記課題を解決
するために、スラグ分析方法を、溶融スラグサンプルを
精錬炉から採取し、該溶融スラグサンプルを溶融状態に
保持した状態で蛍光X線分析、発光分光分析あるいは、
原子吸光分析に供することとするものである。
In order to solve the above-mentioned problems, the present invention provides a method for analyzing slag, which comprises extracting a molten slag sample from a refining furnace, and holding the molten slag sample in a molten state by X-ray fluorescence. Analysis, emission spectroscopy or
It is to be subjected to atomic absorption analysis.

【0008】また、上記方法を実施するためのスラグ分
析装置を、蛍光X線分析、発光分光分析あるいは、原子
吸光分析を行う分析装置本体と、試料取付け部からなる
ものとし、上記分析装置本体はウィンドーおよびシャッ
ターを介して上記試料取付け部を取付け・取外し可能に
構成されているものとするとともに、上記試料取付け部
は上記分析装置本体への取付け機構と真空系に接続され
る排気口とを有する筐体内に、溶融スラグ試料加熱手段
を備え、かつ、スラグ保持部を有するスラグ溶融保持機
構を納めてなるものとする。
A slag analyzer for carrying out the above method comprises an analyzer body for performing X-ray fluorescence analysis, emission spectroscopy analysis or atomic absorption analysis, and a sample mounting portion. The sample mounting portion is configured to be attachable / detachable via a window and a shutter, and the sample mounting portion has a mechanism for mounting to the analyzer main body and an exhaust port connected to a vacuum system. It is assumed that the housing is provided with a molten slag sample heating means and a slag melting and holding mechanism having a slag holding portion is housed in the housing.

【0009】[0009]

【発明の実施の形態】以下、本発明を蛍光X線分析を例
にとって詳細に説明する。図1は、本発明により溶融ス
ラグを蛍光X線分析する装置の1例を示す断面図であ
る。ここに示すように、本発明にかかる蛍光X線分析装
置は、蛍光X線分析を行う蛍光X線分析装置本体10
と、溶融スラグサンプルを溶融状態のまま上記分析装置
にセットする試料取付け部20からなり、試料取付け部
20は本体10から取外し可能になっている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail by taking X-ray fluorescence analysis as an example. FIG. 1 is a sectional view showing an example of an apparatus for performing X-ray fluorescence analysis of molten slag according to the present invention. As shown here, the X-ray fluorescence analyzer according to the present invention comprises a main body 10 of the X-ray fluorescence analyzer that performs X-ray fluorescence analysis.
And a sample mounting section 20 for setting the molten slag sample in the above-mentioned analyzer in a molten state, and the sample mounting section 20 is detachable from the main body 10.

【0010】本体10は通常の蛍光X線分析装置と同
様、真空系に接続される排気口12を備えた筐体11の
中にX線管球13、X線分光結晶14、および検出器1
5を備えている。また、上記本体はその底部にたとえば
マイラー膜などで製作されたウィンドー16を具備し、
X線管球から発せられるX線および試料Sから生ずる蛍
光X線を通過させながら試料Sから生ずるガスが本体1
0内に流れ込んで装置内を汚染することのないようにし
ている。また、上記本体下部には、シャッター17を設
け試料取り付け部20が取り外されている間、あるいは
その中が未だ十分排気されていない間でも上記蛍光X線
分析装置本体10内は常に真空に保つことができるよう
になっている。なお、図示しないが、上記本体10の下
部に試料取付け部20を一体に固定するための接続手段
を有する。
The main body 10 includes an X-ray tube 13, an X-ray spectral crystal 14, and a detector 1 in a housing 11 having an exhaust port 12 connected to a vacuum system, similarly to a normal X-ray fluorescence analyzer.
5 is provided. In addition, the main body includes a window 16 made of, for example, a Mylar film or the like at the bottom thereof,
The X-ray emitted from the X-ray tube and the fluorescent X-rays generated from the sample S pass through the main body 1 while passing through the gas generated from the sample S.
0 to prevent contamination of the inside of the apparatus. Further, the inside of the X-ray fluorescence analyzer main body 10 is always kept at a vacuum even when a shutter 17 is provided at the lower part of the main body and the sample mounting part 20 is removed or the inside of the main body is not exhausted yet. Is available. Although not shown, a connecting means for integrally fixing the sample mounting portion 20 is provided below the main body 10.

【0011】一方、試料取付け部20は、上記蛍光X線
分析装置本体10と同様、真空系に接続される排気口2
2を有し、また上部にはウィンドー23を有している。
さらに、上記取付け部20には、スラグ溶融保持機構3
0が収められており、精錬炉などから汲み上げられた溶
融スラグを溶融状態のまま維持できるようにしている。
On the other hand, like the X-ray fluorescence analyzer main body 10, the sample mounting section 20 has an exhaust port 2 connected to a vacuum system.
2 and a window 23 at the top.
Further, the slag melting and holding mechanism 3
0, so that the molten slag pumped from a refining furnace or the like can be maintained in a molten state.

【0012】このスラグ溶融保持機構30は、図2に示
すようにタングステン板32の一部に凹部を設け、その
中にスラグSを収容できる構造をしており、通電チャッ
ク33を介して電源(図示しない)に接続され、電流を
通ずることによりタングステン板32が抵抗加熱される
ようになっており、これによりスラグSを溶融状態に保
つために必要な温度が維持されるようになっている。
As shown in FIG. 2, the slag melting and holding mechanism 30 has a structure in which a recess is provided in a part of a tungsten plate 32 so that slag S can be accommodated therein. (Not shown), and the resistance is applied to the tungsten plate 32 by passing an electric current, so that the temperature required to keep the slag S in a molten state is maintained.

【0013】本発明により溶融スラグを直接蛍光X線分
析に供する場合には、試料取付部20を蛍光X線分析装
置本体10から取り外し、精錬炉前に移動しておき、例
えば柄杓などのスラグサンプラー(図示せず)で溶融ス
ラグを採取し、これをタングステン板32の凹部31に
注入する。その際、タングステン板32を支持する通電
チャック33に電源から通電することによってタングス
テン板を抵抗加熱しておき、スラグを溶融状態に維持し
ながら、試料取付け部20を蛍光X線分析装置本体10
の下方に移動する。
When the molten slag is directly subjected to the fluorescent X-ray analysis according to the present invention, the sample mounting section 20 is detached from the main body 10 of the fluorescent X-ray analyzer, moved to a position before the refining furnace, and a slag sampler such as a ladle is used. A molten slag is collected (not shown) and injected into the recess 31 of the tungsten plate 32. At this time, the tungsten plate is resistance-heated by supplying a current to a power supply chuck 33 that supports the tungsten plate 32, and the sample mounting part 20 is connected to the fluorescent X-ray analyzer main body 10 while maintaining the slag in a molten state.
To move down.

【0014】蛍光X線分析装置本体10内は、スラグ保
持機構30が溶融スラグの受け入れのため取り外されて
いる間は、シャッター17が閉ざされ、真空に保たれて
いる。試料取付け部20は上記本体下部に移動後、本体
下部に設けた接続手段、たとえばリフター34とO−リ
ング35、によって本体10と一体に固定され、排気孔
22に繋がる真空系を稼働して排気し、スラグ溶融保持
機構30を含む試料取付け部20内を減圧し、その内部
が蛍光X線分析装置本体10内と同じ真空度になったと
ころで、シャッター17を開き、X線管球13からX線
を試料Sに対して放射し試料から生ずる蛍光X線をX線
分光器14によって分光し、これを検出器15によって
検出する。
While the slag holding mechanism 30 is being removed for receiving the molten slag, the shutter 17 is closed and the inside of the X-ray fluorescence analyzer 10 is kept at a vacuum. After moving to the lower part of the main body, the sample mounting part 20 is fixed integrally with the main body 10 by connecting means provided at the lower part of the main body, for example, a lifter 34 and an O-ring 35, and operates a vacuum system connected to the exhaust hole 22 to exhaust air. Then, the inside of the sample mounting portion 20 including the slag melting and holding mechanism 30 is decompressed. When the inside of the sample mounting portion 20 has the same degree of vacuum as the inside of the X-ray fluorescence analyzer main body 10, the shutter 17 is opened, and the X-ray tube 13 A line is emitted to the sample S, and fluorescent X-rays generated from the sample are separated by an X-ray spectroscope 14 and detected by a detector 15.

【0015】[0015]

【実施例】本発明を用いて、真空脱炭炉で炉中に生成さ
れるスラグの組成を分析した結果を表1に示す。表1に
は、比較のため、スラグを粉砕後ガラスビードを作成
し、蛍光X線分析した場合を、従来法として、併せ示し
た。表1より明らかなように本発明による分析結果は従
来の方法と良く一致している。なお、試料採取後、分析
終了までの時間は合計で2分であった。
EXAMPLES Table 1 shows the results of analyzing the composition of slag generated in a furnace in a vacuum decarburization furnace using the present invention. Table 1 also shows, as a conventional method, a case where a slag was pulverized to form a glass bead and subjected to fluorescent X-ray analysis for comparison. As is clear from Table 1, the analysis results according to the present invention are in good agreement with the conventional method. In addition, the time from the sampling to the end of the analysis was 2 minutes in total.

【0016】[0016]

【表1】 [Table 1]

【0017】なお、本発明によって溶融スラグサンプル
を分析後、スラグを冷却し、その縦断面をEPMAによ
って分析し結果、Feの分布が図3に模式的に示すよう
にスラグ試料Sの下方(底部)に沈降していることが明
らかとなった。これは比重差によってFe分(溶鋼)が
分析過程中においてサンプル底部に沈降することを示し
ており、スラグが溶鋼を含まない状態で分析できること
を示している。なお、蛍光X線分析で分析される領域は
高々数十μm以内であるから、本発明によれば、試料中
に分散している溶鋼の影響を全く受けないことでスラグ
分析を行えることが確認できた。
After analyzing the molten slag sample according to the present invention, the slag is cooled, and the longitudinal section is analyzed by EPMA. As a result, the distribution of Fe is shown below (bottom) of the slag sample S as schematically shown in FIG. ). This indicates that the Fe component (molten steel) settles at the bottom of the sample during the analysis process due to the difference in specific gravity, and indicates that the slag can be analyzed without the molten steel. Since the area analyzed by the fluorescent X-ray analysis is at most within several tens of μm, it was confirmed that the slag analysis can be performed according to the present invention without being affected by the molten steel dispersed in the sample at all. did it.

【0018】なお、本実施例では、スラグのサンプリン
グに柄杓を用いたが、これに限定されず、また、スラグ
の溶融のための加熱手段を通電加熱方式としたが、これ
に限定されず、抵抗加熱方式、赤外線照射加熱方式など
を用いることもできる。また、分析装置として蛍光X線
分析装置を用いたが、これに限定されず、たとえばレー
ザー発光分光分析装置などを用いてもよい。
In this embodiment, the ladle is used for sampling the slag. However, the present invention is not limited to this, and the heating means for melting the slag is an electric heating method. However, the present invention is not limited to this. A resistance heating method, an infrared irradiation heating method, or the like can also be used. Although the X-ray fluorescence analyzer was used as the analyzer, the present invention is not limited to this. For example, a laser emission spectrometer may be used.

【0019】[0019]

【発明の効果】以上述べたように、本発明は上記のよう
に金属の精錬過程におけるスラグを溶融状態のままで分
析に供することとしたので、その組成を極めて迅速かつ
精度よく分析できるようになった。その結果、鋼の転炉
精錬、真空脱炭精錬など極めて短時間に精錬工程が終了
する工程の制御にスラグ分析結果を利用することがで
き、上記精錬工程の精度が一層向上した。
As described above, according to the present invention, since the slag in the refining process of the metal is subjected to the analysis in the molten state as described above, the composition can be analyzed very quickly and accurately. became. As a result, the results of the slag analysis can be used for controlling processes in which the refining process is completed in a very short time, such as converter refining of steel and vacuum decarburization refining, and the accuracy of the refining process has been further improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明を実施する装置の1例を示す断面図であ
る。
FIG. 1 is a sectional view showing an example of an apparatus for implementing the present invention.

【図2】本発明において用いるスラグ溶融保持機構の1
例の斜視図である。
FIG. 2 shows a slag melting and holding mechanism used in the present invention.
It is a perspective view of an example.

【図3】本発明による分析後の試料内のFeの分布図で
ある。
FIG. 3 is a distribution diagram of Fe in a sample after analysis according to the present invention.

【符号の説明】[Explanation of symbols]

10:蛍光X線分析装置本体 11:匡体 12:排気口 13:X線管球 14:X線分光結晶 15:検出器 16:ウィンドー 17:シャッター 20:試料取付部 21:筐体 22:排気口 23:ウィンドー 30:スラグ溶融保持機構 31:凹部 32:タングステン板 33:通電チャック 34:リフター 35:O−リング S:溶融スラグ 10: X-ray fluorescence analyzer main body 11: Housing 12: Exhaust port 13: X-ray tube 14: X-ray spectral crystal 15: Detector 16: Window 17: Shutter 20: Sample mounting part 21: Housing 22: Exhaust Mouth 23: Window 30: Slag melting and holding mechanism 31: Recess 32: Tungsten plate 33: Electric chuck 34: Lifter 35: O-ring S: Molten slag

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI G01N 21/64 G01N 1/28 W K ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification code FI G01N 21/64 G01N 1/28 W K

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 溶融スラグサンプルを精錬炉から採取
し、該溶融スラグサンプルを溶融状態に保持した状態で
蛍光X線分析、発光分光分析あるいは、原子吸光分析に
供することを特徴とするスラグ分析方法。
1. A slag analysis method comprising: collecting a molten slag sample from a refining furnace; and subjecting the molten slag sample to a fluorescent X-ray analysis, an emission spectroscopic analysis, or an atomic absorption analysis while maintaining the molten slag sample in a molten state. .
【請求項2】 蛍光X線分析、発光分光分析あるいは、
原子吸光分析を行う分析装置本体と、試料取付け部から
なり、 上記分析装置本体はウィンドーおよびシャッターを介し
て上記試料取付け部を取付け・取外し可能に構成されて
おり、 上記試料取付け部は上記分析装置本体への取付け機構と
真空系に接続される排気口とを有する筐体内に、溶融ス
ラグ試料加熱手段を備え、かつ、スラグ保持部を有する
スラグ溶融保持機構を納めてなるものであることを特徴
とするスラグ分析装置。
2. X-ray fluorescence analysis, emission spectroscopy or
An analyzer main body for performing atomic absorption analysis, and a sample mounting portion, wherein the analyzer main body is configured to be able to attach and detach the sample mounting portion via a window and a shutter, and the sample mounting portion is the analyzer. In a housing having a mechanism for attaching to a main body and an exhaust port connected to a vacuum system, a molten slag sample heating means is provided, and a slag melting and holding mechanism having a slag holding portion is housed. Slag analyzer.
JP10057457A 1998-02-23 1998-02-23 Method and apparatus for analysis of slug Pending JPH11237350A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10057457A JPH11237350A (en) 1998-02-23 1998-02-23 Method and apparatus for analysis of slug

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10057457A JPH11237350A (en) 1998-02-23 1998-02-23 Method and apparatus for analysis of slug

Publications (1)

Publication Number Publication Date
JPH11237350A true JPH11237350A (en) 1999-08-31

Family

ID=13056212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10057457A Pending JPH11237350A (en) 1998-02-23 1998-02-23 Method and apparatus for analysis of slug

Country Status (1)

Country Link
JP (1) JPH11237350A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001349852A (en) * 2000-04-06 2001-12-21 Seiko Instruments Inc Apparatus for chamber open-type x-ray fluorescence analysis
KR101956168B1 (en) * 2018-04-24 2019-03-08 한국산업기술대학교산학협력단 Method for testing slag dissolution behavior

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001349852A (en) * 2000-04-06 2001-12-21 Seiko Instruments Inc Apparatus for chamber open-type x-ray fluorescence analysis
JP4646418B2 (en) * 2000-04-06 2011-03-09 エスアイアイ・ナノテクノロジー株式会社 X-ray fluorescence analyzer
KR101956168B1 (en) * 2018-04-24 2019-03-08 한국산업기술대학교산학협력단 Method for testing slag dissolution behavior

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