JPH1123624A - Method for measuring harmonic in power system - Google Patents

Method for measuring harmonic in power system

Info

Publication number
JPH1123624A
JPH1123624A JP19780697A JP19780697A JPH1123624A JP H1123624 A JPH1123624 A JP H1123624A JP 19780697 A JP19780697 A JP 19780697A JP 19780697 A JP19780697 A JP 19780697A JP H1123624 A JPH1123624 A JP H1123624A
Authority
JP
Japan
Prior art keywords
harmonic
current
point
admittance
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19780697A
Other languages
Japanese (ja)
Inventor
Isao Koda
勲 香田
Masakazu Tsukamoto
政和 塚本
Soji Nishimura
荘治 西村
Katsuhiko Uno
克彦 鵜野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chubu Electric Power Co Inc
Nissin Electric Co Ltd
Original Assignee
Chubu Electric Power Co Inc
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chubu Electric Power Co Inc, Nissin Electric Co Ltd filed Critical Chubu Electric Power Co Inc
Priority to JP19780697A priority Critical patent/JPH1123624A/en
Priority to US09/110,997 priority patent/US6326796B1/en
Publication of JPH1123624A publication Critical patent/JPH1123624A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To obtain a method for measuring the harmonic characteristics on the upstream side of a power system by injecting currents of two frequencies, higher and lower than an interesting harmonic and not equal to integer times of the basic frequency of the system, in which the harmonic characteristics are measured inexpensively through a small and simple arrangement by lowering the voltage class of an apparatus being injected with the current of both frequencies. SOLUTION: A harmonic injecting point (a) is set on the lower voltage side than a harmonic measuring point (b) of a system 1 and currents of two frequencies f1 , f2 , higher and lower than an interesting harmonic of an object to be measured and not equal to integer times of the basic frequency of the system, are injected as intermediate harmonic currents into an injecting point (a) from a current injector 16. Current and voltage having the frequencies f1 , f2 are then detected at a measuring point (b) and the admittance of an equivalent circuit is determined, respectively, for the intermediate harmonic having the frequencies f1 , f2 in the upstream of the measuring point (b). The admittance 10 of an equivalent circuit 9 is then determined from both admittances by interpolation for the interesting harmonic in the upstream of the measuring point (b) and the harmonic characteristics are measured for the interesting harmonic in the upstream of the measuring point (b) being set in the upstream of the injecting point (a).

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電力系統の高調波
計測点より上位の着目高調波についての特性(高調波特
性)を測定する電力系統の高調波測定方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a power system harmonic measurement method for measuring characteristics (harmonic characteristics) of a higher harmonic of interest than a power system harmonic measurement point.

【0002】[0002]

【従来の技術】電力系統の送,配電系統においては、高
調波を低減することが重要である。
2. Description of the Related Art In transmission and distribution systems of power systems, it is important to reduce harmonics.

【0003】ところで、高調波の周波数は、系統基本周
波数fs の整数倍であり、代表的な第5調波の周波数は
5×fs である。
Meanwhile, the frequency of the harmonic is an integer multiple of the system fundamental frequency f s, the frequency of a typical fifth harmonic is 5 × f s.

【0004】また、高調波の低減は高調波のレベルを予
測等し、適当な周波数のフィルタを設置して行われる。
The reduction of harmonics is performed by estimating the level of the harmonics and installing a filter having an appropriate frequency.

【0005】そして、高調波の電圧レベルの予測等を行
うには、電力系統のフィルタ設備の接続点を高調波計測
点とし、この計測点より上位(上流),下位(下流)の
高調波に対する特性を把握してその等価回路を求める必
要がある。
[0005] In order to predict the voltage level of the harmonic, etc., the connection point of the filter equipment of the power system is set as the harmonic measurement point, and the higher (upstream) and lower (downstream) harmonics of this measurement point are measured. It is necessary to grasp the characteristics and find its equivalent circuit.

【0006】この高調波等価回路は、ノートンの定理で
表現されたアドミタンスと電流源との並列回路とみなす
ことができる。
The harmonic equivalent circuit can be regarded as a parallel circuit of admittance expressed by Norton's theorem and a current source.

【0007】そして、電気学会論文誌B,101巻8
号,p.451−458,(昭56−8)には、配電線
の第5調波についての高調波等価回路を求める際、系統
の基本波の電圧,電流を計測し、その結果から等価回路
のアドミタンス,電流源の大きさ、位相等を算出して推
定することが記載されている。
[0007] The Transactions of the Institute of Electrical Engineers of Japan, B, 101, 8
No., p. 451-458, (Showa 56-8) discloses that when obtaining a harmonic equivalent circuit for the fifth harmonic of a distribution line, the voltage and current of the fundamental wave of the system are measured, and the admittance of the equivalent circuit is determined from the results. It describes that the magnitude and phase of the current source are calculated and estimated.

【0008】[0008]

【発明が解決しようとする課題】前記論文誌に記載の高
調波測定方法で電力系統のn次の着目高調波(周波数n
×fs )についての等価回路を求める場合、系統の基本
波電圧・電流の計測結果から高調波アドミタンス、高調
波電流源の大きさ、位相を推定して決定するため、高調
波等価回路のアドミタンス等を精度よく求めることがで
きない。
According to the harmonic measurement method described in the above-mentioned publication, the nth harmonic of interest (frequency n
× f s ), the harmonic admittance and the magnitude and phase of the harmonic current source are estimated and determined from the measurement results of the fundamental wave voltage and current of the system. Therefore, the admittance of the harmonic equivalent circuit is determined. Cannot be determined with high accuracy.

【0009】すなわち、前記従来の高調波測定方法の場
合、計測対象の着目高調波についての等価回路のアドミ
タンスや電流源を実測して求めたわけではなく、基本波
の計測情報に基づき、基本波の大きさ(ベクトル値)か
ら着目高調波の大きさ(ベクトル値)を推定して求める
に過ぎないため、その等価回路を精度よく求めることは
できない。
That is, in the case of the conventional harmonic measurement method, the admittance and current source of the equivalent circuit for the target harmonic to be measured are not actually measured and found, but the fundamental wave is measured based on the fundamental wave measurement information. Since the magnitude (vector value) of the harmonic of interest is merely estimated from the magnitude (vector value), its equivalent circuit cannot be accurately determined.

【0010】この結果、電力系統の高調波特性を正確に
把握して適当なフィルタを設ける等することができず、
高調波レベルの良好な低減が困難になる。
As a result, it is not possible to accurately grasp the harmonic characteristics of the power system and provide an appropriate filter, etc.
Good reduction of the harmonic level becomes difficult.

【0011】そこで、本出願人は特願平8−31019
2号の出願により、電力系統の高調波注入点に測定調波
(着目高調波)の上,下両側の基本波の非整数倍周波数
の電流(中間高調波の電流)それぞれを注入し、その注
入点における注入周波数の電圧及び注入点の上位,下位
に流れる注入周波数の電流の実測結果に基づき、系統の
注入点の上位,下位それぞれにつき、着目高調波の上,
下両側の注入周波数の等価回路のアドミタンスを求め、
それらの補間処理により着目高調波の等価回路のアドミ
タンスを決定してその高調波等価回路を求めることを既
に発明している。
Therefore, the present applicant has filed Japanese Patent Application No. 8-31019.
According to the application of No. 2, currents at non-integer multiple frequencies (intermediate harmonic currents) of the fundamental wave above and below the measurement harmonic (harmonic of interest) are injected into the harmonic injection points of the power system. Based on the voltage of the injection frequency at the injection point and the measured results of the current at the injection frequency flowing above and below the injection point, the upper and lower harmonics of the injection point of the
Find the admittance of the equivalent circuit of the injection frequency on both lower sides,
It has already been invented to determine the admittance of the equivalent circuit of the harmonic of interest by such interpolation processing and to find the equivalent circuit of the harmonic.

【0012】この場合、前記注入周波数の電流が系統に
本来存在しない基本波の非整数倍周波数の電流であり、
注入周波数についての等価回路のアドミタンスが実測に
より精度よく求まるため、この結果を用いて着目高調波
についての高調波特性を精度よく把握し得る。
In this case, the current of the injection frequency is a current of a non-integer multiple frequency of a fundamental wave which does not originally exist in the system,
Since the admittance of the equivalent circuit with respect to the injection frequency can be determined with high accuracy by actual measurement, the harmonic characteristics of the target harmonic can be accurately grasped using the result.

【0013】しかし、前記既出願の測定方法は、高調波
注入点と高調波計測点とが同じ点になるため、例えば、
系統の上位の高調波特性を測定する場合、高調波注入点
を高電圧の上位母線等に設定しなければならない。
However, in the measurement method of the above-mentioned application, since the harmonic injection point and the harmonic measurement point are the same point, for example,
When measuring the higher harmonic characteristic of the system, the harmonic injection point must be set to a higher voltage upper bus or the like.

【0014】この場合、高調波注入点が高電圧になるた
め、この注入点に前記中間高調波の電流を注入する装置
の電圧階級(絶縁階級)を十分に高くする必要があり、
しかも、その十分な保護対策を講じる必要もある。
In this case, since the harmonic injection point has a high voltage, it is necessary to sufficiently increase the voltage class (insulation class) of the device for injecting the intermediate harmonic current into this injection point.
Moreover, it is necessary to take sufficient protective measures.

【0015】そのため、装置が大型かつ複雑になって高
価になり、小型かつ簡素な構成で安価に系統上位側の高
調波特性を精度よく測定することができない問題点があ
る。
[0015] Therefore, there is a problem that the apparatus becomes large and complicated and expensive, and it is not possible to accurately measure the harmonic characteristics of the system upper side inexpensively with a small and simple configuration.

【0016】本発明は、着目高調波を挟む2周波数
1 ,f2 の中間高調波の電流を注入して系統上位側の
高調波特性を測定する際に、両中間高調波の電流を注入
する装置に必要な電圧階級を低くし、小型かつ簡素な構
成で安価に測定し得るようにすることを課題とする。
According to the present invention, when the current of the intermediate harmonic of two frequencies f 1 and f 2 sandwiching the harmonic of interest is injected to measure the higher harmonic characteristic of the system, the current of both intermediate harmonics is measured. It is an object of the present invention to reduce the voltage class required for the device to be injected, and to enable inexpensive measurement with a small and simple configuration.

【0017】[0017]

【課題を解決するための手段】前記の課題を解決するた
めに、本発明の電力系統の高調波測定方法においては、
系統の高調波計測点より下位低圧側に高調波注入点を設
定し、この高調波注入点に接続した電流注入装置から高
調波注入点に、計測対象のn次の着目高調波を挟む系統
基本周波数fs の非整数倍の2周波数f1 ,f2 (f1
<n×fs <f2 )の電流を中間高調波の電流としてそ
れぞれ注入し、高調波計測点の周波数f1 ,f2 それぞ
れの電流,電圧を検出して高調波計測点より上位の周波
数f1 ,f2 の中間高調波それぞれについての等価回路
のアドミタンスを求め、両アドミタンスから高調波計測
点より上位の着目高調波についての等価回路のアドミタ
ンスを補間演算して決定し、高調波注入点の上位に設定
した高調波計測点より上位の着目高調波についての高調
波特性を測定する。
In order to solve the above-mentioned problems, a method for measuring harmonics of a power system according to the present invention comprises the steps of:
A harmonic injection point is set on the lower low-voltage side from the harmonic measurement point of the system, and the current injection device connected to this harmonic injection point places the n-th target harmonic of interest at the harmonic injection point. frequency f 2 frequency of the non-integer multiple of s f 1, f 2 (f 1
<N × injected respectively f s <current f 2) as an intermediate harmonic currents, frequencies f 1, f 2 each current harmonic measurement points, higher than the harmonic measurement point by detecting the voltage frequency The admittance of the equivalent circuit for each of the intermediate harmonics of f 1 and f 2 is determined, and the admittance of the equivalent circuit for the harmonic of interest higher than the harmonic measurement point is determined from both admittances by interpolation and determined. The harmonic characteristic of the higher harmonic of interest from the higher harmonic measurement point set is measured.

【0018】したがって、高調波注入点が高調波計測点
より下位低圧側に設定され、高調波注入点に周波数
1 ,f2 の中間高調波の電流を注入する電流注入装置
は、高調波注入点が高調波計測点と同じ点になる場合よ
り電圧階級を低くすることができ、その保護回路等も簡
素化することができる。そのため、電流注入装置を小型
かつ簡素な構成にして安価にすることができる。
Therefore, the current injection device in which the harmonic injection point is set on the lower low-voltage side of the harmonic measurement point and injects the current of the intermediate harmonics of the frequencies f 1 and f 2 into the harmonic injection point is a harmonic injection device. The voltage class can be lower than when the point is the same as the harmonic measurement point, and the protection circuit and the like can be simplified. Therefore, the current injection device can be made small and simple in configuration and inexpensive.

【0019】そして、電流注入装置から高調波注入点に
系統に本来は存在しない周波数f1,f2 の中間高調波
の電流を注入し、高調波計測点における周波数f1 ,f
2 の中間高調波の電流,電圧を検出し、この検出に基づ
いて高調波計測点より上位側の両中間高調波についての
等価回路のアドミタンスを求め、この両アドミタンスか
ら高調波計測点より上位の着目高調波についての等価回
路のアドミタンスを決定してその高調波特性を測定する
ため、小型かつ簡素な構成で安価に、高調波注入点の上
位に設定した高調波計測点より上位の着目高調波につい
ての高調波特性の精度の高い測定が行える。
[0019] Then, by injecting an intermediate harmonic current of a frequency f 1, f 2 is not originally present in the system from the current injection device in harmonic injection point, the frequency f 1 in the harmonic measurement point, f
2) The current and voltage of the intermediate harmonic are detected, and based on this detection, the admittance of the equivalent circuit for both intermediate harmonics higher than the harmonic measurement point is determined. Determines the admittance of the equivalent circuit for the harmonic of interest and measures its harmonic characteristics, so it is inexpensive with a small and simple configuration, and the harmonic of interest higher than the harmonic measurement point set above the harmonic injection point High-precision measurement of harmonic characteristics of a wave can be performed.

【0020】[0020]

【発明の実施の形態】本発明の実施の1形態につき、図
1を参照して説明する。図1は例えば電力系統1の77
kV系高圧母線2の高調波特性を、その下位低圧側の
6.6kV系配電母線3に電流を注入して測定する場合
の単線系統図を示す。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described with reference to FIG. FIG. 1 shows, for example, 77
FIG. 3 is a single-line diagram showing a case where the harmonic characteristics of the kV high-voltage bus 2 are measured by injecting a current into the lower-voltage low-voltage 6.6 kV distribution bus 3.

【0021】そして、高圧母線2に遮断器4,上位線路
インピーダンス5,上位変電所(2次変電所)トランス
6,例えば22kVの第2の高圧母線7,配電用変電所
トランス8を介して配電母線3が接続され、この配電線
3のトランス8の2次側近傍に高調波注入点aが設定さ
れ、トランス8の1次側近傍に高調波計測点bが設定さ
れる。
Power is distributed to the high voltage bus 2 via a circuit breaker 4, an upper line impedance 5, an upper substation (secondary substation) transformer 6, a 22 kV second high voltage bus 7, and a distribution substation transformer 8, for example. The bus 3 is connected, a harmonic injection point a is set near the secondary side of the transformer 8 of the distribution line 3, and a harmonic measurement point b is set near the primary side of the transformer 8.

【0022】このとき、電力系統1には系統基本周波数
s の整数倍の種々の高調波が存在し、測定対象のn次
の着目高調波(n×fs )についての高圧母線2を含む
上位の等価回路9は、ノートンの定理で表現すると、ア
ドミタンス10と電流源11との並列回路になる。
[0022] At this time, the power system 1 there are various harmonics of integral multiples of the system fundamental frequency f s, comprising a high-pressure bus 2 for n-th focused harmonic measured (n × f s) Expressed by Norton's theorem, the upper equivalent circuit 9 is a parallel circuit of the admittance 10 and the current source 11.

【0023】なお、着目高調波についての高調波注入点
aの下位の等価回路12も、ノートンの定理で表現する
と、アドミタンス13と電流源14との並列回路にな
る。
Note that the equivalent circuit 12 below the harmonic injection point a for the target harmonic is also a parallel circuit of the admittance 13 and the current source 14 when expressed by Norton's theorem.

【0024】そして、高調波注入点aに高調波測定装置
15の電流注入装置16が接続され、この注入装置16
は高調波特性をくり返し測定するため、系統基本周波数
sの非整数倍の周波数f1 ,f2 (f1 <n×fs
2 )の中間高調波の電流I1 ,I2 を一定時間ずつ順
に高調波注入点aに注入することを、例えば30分周期
でくり返えす。
The current injection device 16 of the harmonic measuring device 15 is connected to the harmonic injection point a.
Is to measure repeated harmonic characteristic, the frequency f 1 of the non-integer multiple of the system fundamental frequency f s, f 2 (f 1 <n × f s <
Injecting the currents I 1 and I 2 of the intermediate harmonic of f 2 ) into the harmonic injection point a in a fixed time sequence is repeated, for example, in a cycle of 30 minutes.

【0025】このとき、中間高調波の電流I1 ,I2
系統電源に同期,非同期のいずれの電流であっても測定
可能であるが、後述の注入周波数の電流,電圧の検出を
DFT,FFT等のデジタル周波数解析で行うことが現
実的であるため、実用上は、電流I1 ,I2 を系統電源
に同期して形成する必要がある。
At this time, it is possible to measure whether the currents I 1 and I 2 of the intermediate harmonic are synchronous or asynchronous with the system power supply. Since it is practical to perform digital frequency analysis such as FFT, it is practically necessary to form the currents I 1 and I 2 in synchronization with the system power supply.

【0026】したがって、例えば高調波測定装置15に
図示省略された同期装置が設けられ、この同期装置が配
電母線3の系統基本周波数fs の系統電圧に同期したそ
の逓倍周波数の同期制御信号を形成し、この同期制御信
号が電流注入装置16に供給され、この電流注入装置1
6は同期制御信号に基づくPLL同期発振により周波数
1 ,f2 の中間高調波の電流I1 ,I2 を形成する。
[0026] Thus, for example, harmonic synchronization device that is not shown the measuring device 15 is provided, forming a synchronization control signal of the synchronous devices that multiplied frequency synchronized with the system voltage of the system fundamental frequency f s of the distribution bus 3 Then, the synchronization control signal is supplied to the current injection device 16 and the current injection device 1
Reference numeral 6 forms currents I 1 and I 2 of intermediate harmonics of frequencies f 1 and f 2 by PLL synchronous oscillation based on a synchronous control signal.

【0027】さらに、前記の30分毎に、形成した中間
高調波の電流I1 ,I2 を、例えばタイマ動作で順次に
一定時間ずつ出力して高調波注入点aに注入する。
Further, the currents I 1 and I 2 of the formed intermediate harmonics are sequentially output for a predetermined time, for example, by a timer operation, and injected into the harmonic injection point a every 30 minutes.

【0028】なお、着目高調波を第5調波(n=5)と
すると、中間高調波の電流I1 ,I2 は、具体的には、
例えば着目調波から0.5調波ずれた4.5調波,5.
5調波の電流に設定される。
Assuming that the harmonic of interest is the fifth harmonic (n = 5), the currents I 1 and I 2 of the intermediate harmonics are, specifically,
For example, 4.5 harmonics shifted from the focused harmonic by 0.5 harmonic, and 5 harmonics.
The current is set to five harmonics.

【0029】そして、高調波注入点aに注入された中間
高調波の電流I1 ,I2 が電力系統1に本来は存在しな
い周波数の電流であるため、電流注入装置16を電流容
量が小さい小型の装置にしても、高調波注入点aの上位
側及び下位側において、計測可能なレベルの中間高調波
の電流I1 ,I2 を確保できる。
The currents I 1 and I 2 of the intermediate harmonic injected into the harmonic injection point a are currents at frequencies that do not originally exist in the power system 1. Even with the device described above, measurable levels of intermediate harmonic currents I 1 and I 2 can be secured on the upper and lower sides of the harmonic injection point a.

【0030】また、高調波計測点bからみた周波数
1 ,f2 の中間高調波についての高圧母線2の等価回
路,高調波注入点aからみた配電系統3の下位の等価回
路は、ノートンの定理で表現すると、いずれも等価回路
9,12のアドミタンス10,13と同様のアドミタン
スのみとなる。
The equivalent circuit of the high voltage bus 2 for the intermediate harmonics of the frequencies f 1 and f 2 as viewed from the harmonic measurement point b, and the lower equivalent circuit of the distribution system 3 as viewed from the harmonic injection point a are Norton's. Expressed by the theorem, each of them has only the admittance similar to the admittances 10 and 13 of the equivalent circuits 9 and 12.

【0031】そして、説明を簡単にするため、線路イン
ピーダンス5等を無視し、高調波計測点bより上位が等
価回路9で表されるとし、かつ、高調波注入点aから分
流して高調波計測点bを上位方向に通流する周波数
1 ,f2 の電流をIiu(i=1,2)とし、その電圧
をViu(i=1,2)とすると、高調波計測点bからみ
たその上位の等価回路のアドミタンスYiu(i=1,
2)は、つぎの数1の式の演算から求まる。
For the sake of simplicity, it is assumed that the line impedance 5 and the like are ignored, the higher order than the harmonic measurement point b is represented by the equivalent circuit 9, and the harmonics are divided from the harmonic injection point a. Assuming that currents at frequencies f 1 and f 2 flowing through the measurement point b in the upper direction are I iu (i = 1, 2) and the voltage thereof is V iu (i = 1, 2), the harmonic measurement point b The admittance Y iu (i = 1,
2) is obtained from the operation of the following equation (1).

【0032】[0032]

【数1】Yiu=Iiu/Viu [ Expression 1] Y iu = I iu / V iu

【0033】さらに、周波数f1 ,f2 の中間高調波に
ついてのアドミタンスYiu(=Y1u,Y2u)が求まれ
ば、最も簡単には、例えば(Y1u+Y2u)/2の補間演
算により、その中間の周波数n×fs の着目高調波につ
いての等価回路9のアドミタンス10がYu(n)として求
まる。
Further, if the admittance Y iu (= Y 1u , Y 2u ) for the intermediate harmonics of the frequencies f 1 and f 2 is obtained, the simplest method is to perform, for example, an interpolation calculation of (Y 1u + Y 2u ) / 2. the admittance 10 of the equivalent circuit 9 for focus harmonics of the intermediate frequency n × f s is obtained as Y u (n).

【0034】そして、着目高調波についてのアドミタン
スYu(n)が求まると、高調波計測点bを流れる着目高調
波の電流I(n),電圧V(n)の実測に基づき、着目高調波
についての等価回路9の電流源11がつぎの数2の式の
演算から、電流源IGu(n)として求まる。
When the admittance Y u ( n ) of the target harmonic is determined, based on the actual measurement of the current I ( n ) and the voltage V ( n ) of the target harmonic flowing through the harmonic measurement point b, the target harmonic is measured. The current source 11 of the equivalent circuit 9 is obtained as a current source I Gu ( n ) from the following equation (2).

【0035】[0035]

【数2】IGu(n)=I(n)−V(n)×Yu(n)## EQU2 ## I Gu ( n ) = I ( n ) -V ( n ) × Y u ( n )

【0036】なお、数1の式の演算から求まるアドミタ
ンスYiu 及びアドミタンスYu(n),数2の式の演算か
ら求まる電流源IGu(n)は、高圧母線7から上位側をみ
たとき の値であり、例えば、アドミタンスYu(n),電
流源IGu(n)を、トランス6の変 圧比等に基づき、高圧
母線2から上位側をみたときの値に換算して求めてもよ
い。
The admittance Y iu and the admittance Y u ( n ) obtained from the operation of the expression ( 1 ) and the current source I Gu ( n ) obtained from the operation of the expression (2) are obtained when the upper side is viewed from the high voltage bus 7. For example, the admittance Y u ( n ) and the current source I Gu ( n ) can be calculated by converting the value of the upper side from the high voltage bus 2 based on the transformer 6 transformation ratio and the like. Good.

【0037】また、アドミタンスYiu,Yu(n)及び電流
源IGu(n)は、線路インピーダンス5等による電圧降下
を考慮することにより、一層精度よく求まる。
The admittances Y iu , Y u ( n ) and the current source I Gu ( n ) can be determined more accurately by taking into account the voltage drop due to the line impedance 5 and the like.

【0038】そして、アドミタンスYu(n),電流源IGu
(n)等を求めるため、高調波計測点bに計器用変圧器1
7の1次側が接続されるとともに、計測点bの上位側近
傍に計器用変流器18が設けられ、高調波計測点bの電
圧及びこの計測点bを通流する系統電流が計測される。
The admittance Y u ( n ) and the current source I Gu
In order to obtain ( n ), etc., the instrument transformer 1
7 is connected, an instrument current transformer 18 is provided near the upper side of the measurement point b, and the voltage at the harmonic measurement point b and the system current flowing through the measurement point b are measured. .

【0039】そして、計器用変圧器17の電圧の計測出
力,計器用変流器18の電流の計測出力が高調波計測装
置15のA/D変換器19に供給され、このA/D変換
器19はそれぞれサンプリングしてデジタルの計測デー
タに変換する。
The measured output of the voltage of the instrument transformer 17 and the measured output of the current of the instrument current transformer 18 are supplied to the A / D converter 19 of the harmonic measuring device 15, and this A / D converter is used. Numeral 19 samples and converts them into digital measurement data.

【0040】このとき、後段の周波数解析を正確に行う
ため、A/D変換器19のサンプリングは、系統基本波
に同期したタイミングで行う必要がある。
At this time, the sampling of the A / D converter 19 needs to be performed at a timing synchronized with the system fundamental wave in order to accurately perform the subsequent frequency analysis.

【0041】そのため、同期装置の同期制御信号がA/
D変換器19に計測指令信号として伝送され、この計測
指令信号のタイミング制御に基づき、高調波注入点aに
中間高調波の電流I1 ,I2 が注入されたときに、A/
D変換器19は系統基本波すなわち両中間高調波に同期
して計器用変圧器17,計器用変流器18の計測出力を
サンプリングする。
Therefore, the synchronization control signal of the synchronization device is A /
It is transmitted to the D converter 19 as a measurement command signal, and based on the timing control of the measurement command signal, when the intermediate harmonic currents I 1 and I 2 are injected into the harmonic injection point a, A /
The D converter 19 samples the measurement outputs of the instrument transformer 17 and the instrument current transformer 18 in synchronization with the system fundamental wave, that is, both intermediate harmonics.

【0042】なお、A/D変換器19のサンプリング周
波数は周波数f1 ,f2 それぞれより十分高い周波数で
ある。
The sampling frequency of the A / D converter 19 is sufficiently higher than the frequencies f 1 and f 2 .

【0043】また、この実施の形態にあっては、高調波
注入点aより下位側の着目高調波についての等価回路1
2についてもそのアドミタンス13,電流源14を求め
て同定するため、電流注入装置16の注入ラインに計器
用変流器20が設けられ、この変流器20が中間高調波
の注入電流I1 ,I2 を計測し、その計測出力もA/D
変換器19によりサンプリングされる。
In this embodiment, the equivalent circuit 1 for the target harmonic lower than the harmonic injection point a is described.
In order to obtain and identify the admittance 13 and the current source 14 also, an instrument current transformer 20 is provided on the injection line of the current injection device 16, and this current transformer 20 is connected to the intermediate harmonic injection current I 1 , Measures I 2 and outputs A / D
It is sampled by the converter 19.

【0044】そして、A/D変換器19の各計測データ
が信号処理装置21に供給され、この信号処理装置21
は計器用変圧器17の系統電圧,計器用変流器18の系
統電流のDFT解析,FFT解析等のデジタル周波数解
析により、それぞれの計測データに含まれた高調波計測
点bの周波数f1 ,f2 それぞれの中間高調波の電圧V
iu及び電流Iiuを検出する。
Then, each measurement data of the A / D converter 19 is supplied to the signal processing device 21, and the signal processing device 21
Are obtained by digital frequency analysis such as DFT analysis and FFT analysis of the system voltage of the instrument transformer 17 and the system current of the instrument current transformer 18, the frequency f 1 of the harmonic measurement point b included in each measurement data, f 2 The voltage V of each intermediate harmonic
iu and the current I iu are detected.

【0045】この電圧Viu ,電流Iiu のデータが演算
処理装置22に供給され、この演算処理装置22は電圧
iu ,電流Iiu に基づき、前記数1の式の演算からア
ドミタンスYiuを求める。
The data of the voltage V iu and the current I iu are supplied to the arithmetic processing unit 22. The arithmetic processing unit 22 calculates the admittance Y iu from the calculation of the equation (1) based on the voltage V iu and the current I iu. Ask.

【0046】つぎに、演算処理装置22はアドミタンス
iuを用いた前記の補間演算により、着目高調波につい
てのアドミタンス10,すなわちアドミタンスYu(n)を
決定し、高調波計測点bより上位の高圧母線2の高調波
特性を測定する。
Next, the arithmetic processing unit 22 by the interpolation calculation using the admittance Y iu, admittance 10 of interest harmonics, i.e. admittance Y u determines the (n), higher than the harmonic measurement point b The harmonic characteristics of the high voltage bus 2 are measured.

【0047】ところで、この実施の形態にあっては、高
調波特性の測定により、電流源11も決定して等価回路
9を完全に同定する。
In the present embodiment, the current source 11 is also determined by measuring the harmonic characteristics, and the equivalent circuit 9 is completely identified.

【0048】そのため、高調波計測装置15は前記の同
期制御信号の受信停止等により中間高調波の電流注入の
終了を検知すると、A/D変換器19の計測データに基
づく信号処理装置21の周波数分析により電力系統1に
存在する着目高調波の電流I(n),電圧V(n)を実測す
る。
Therefore, when the harmonic measuring device 15 detects the end of the current injection of the intermediate harmonic by stopping reception of the synchronous control signal or the like, the frequency of the signal processing device 21 based on the measurement data of the A / D converter 19 is detected. The current I ( n ) and the voltage V ( n ) of the harmonic of interest existing in the power system 1 are actually measured by analysis.

【0049】そして、決定したアドミタンスYu(n)と実
測した電流I(n),電圧V(n)とに基づき、演算処理装置
22は前記数2の式の演算から着目高調波についての電
流源11をIGu(n)として決定し、アドミタンスYu(n)
及び電流源IGu(n)により等価回路9を完全に同定す
る。
[0049] Then, the determined admittance Y u (n) and the actually measured current I (n), based on the voltage V (n), the processing unit 22 is current for interest harmonics from the calculation of the foregoing equation 2 the source 11 is determined as the I Gu (n), the admittance Y u (n)
And the current source I Gu ( n ) and the equivalent circuit 9 is completely identified.

【0050】また、高調波注入点aより下位の等価回路
12を同定するため、演算処理装置22は、電流Iiu
電圧Viuをそれぞれ高調波注入点aからみた値に換算
し、換算後の電流Iiu,すなわち電流I1u,I2uと、実
測した注入電流I1 ,I2 とに基づき、I1d=I1 −I
1u,I2d=I2 −I2uの演算により、高調波注入点aか
ら下位に分流した周波数f1 ,f2 の中間高調波の電流
1d,I2dを求める。
In order to identify the equivalent circuit 12 lower than the harmonic injection point a, the arithmetic processing unit 22 outputs the current I iu ,
The voltage V iu is converted into a value viewed from the harmonic injection point a, and I 1d = I based on the converted current I iu , that is, the currents I 1u and I 2u and the actually measured injection currents I 1 and I 2. 1 -I
1u, the calculation of I 2d = I 2 -I 2u, frequency f 1 diverted to lower the harmonic injection point a, f 2 intermediate harmonic current I 1d, seek I 2d.

【0051】さらに、中間高調波の電流I1 ,I2 の注
入に基づく高調波注入点aの下位の周波数f1 ,f2
電圧V1d,V2dが換算後の電圧Viu(=V1u,V2u)に
等しくなるため、電流I1d,I2dと換算後の電圧V1u
2uとに基づき、数1の式の演算と同様の演算により、
高調波注入点aの下位の周波数f1 ,f2 の中間高調波
についての等価回路のアドミタンスYid(i=1,2)
も求める。
Further, the voltages V 1d , V 2d of the lower frequencies f 1 , f 2 of the harmonic injection point a based on the injection of the intermediate harmonic currents I 1 , I 2 are converted into the converted voltage V iu (= V 1u , V 2u ), the currents I 1d , I 2d and the converted voltages V 1u ,
Based on V 2u , by the same operation as the operation of the expression of Expression 1,
Admittance Y id (i = 1,2) of an equivalent circuit for intermediate harmonics of lower frequencies f 1 and f 2 below harmonic injection point a
Also ask.

【0052】そして、アドミタンスYidを用いた補間演
算により、アドミタンス10と同様にして、着目高調波
についてのアドミタンス13,すなわちアドミタンスY
d(n)を決定し、配電系統3の下位の高調波特性を測定す
る。
Then, similarly to the admittance 10, the admittance 13 of the harmonic of interest, ie, the admittance Y, is obtained by interpolation using the admittance Y id.
d ( n ) is determined, and lower harmonic characteristics of the distribution system 3 are measured.

【0053】また、アドミタンスYd(n)と着目高調波の
電流I(n),電圧V(n)とに基づき、前記数2の式の演算
と同様の演算により、電流源10を電流源Igd(n)とし
て決定し、アドミタンスYd(n)及び電流源IGd(n)によ
り等価回路12を同定する。
Further, based on the admittance Y d ( n ) and the current I ( n ) and voltage V ( n ) of the harmonic of interest, the current source 10 I gd ( n ), and the equivalent circuit 12 is identified by the admittance Y d ( n ) and the current source IGd ( n ).

【0054】そして、周波数f1 ,f2 の中間高調波の
電流が注入される毎に、前記と同様にしたアドミタンス
u(n),Yd(n),電流源IGu(n),IGd(n)が求められ、
着目高調波についての上位側,下位側それぞれの最新の
等価回路9,12がくり返し同定される。
Each time the current of the intermediate harmonic of the frequencies f 1 and f 2 is injected, the admittances Y u ( n ), Y d ( n ), current sources I Gu ( n ), I Gd ( n ) is found,
The latest equivalent circuits 9 and 12 on the upper and lower sides of the target harmonic are repeatedly identified.

【0055】さらに、その結果は、表示部23に例えば
図1のような等価回路図でモニタ表示されるとともに、
記憶部24に記録情報として保持される。
Further, the result is displayed on the display unit 23 in the form of an equivalent circuit diagram as shown in FIG.
The information is stored in the storage unit 24 as recording information.

【0056】そして、高調波注入点aが高圧母線7の高
調波計測点bより下位低圧側の配電母線3に設定される
ため、電流注入装置16の電圧階級を、高調波注入点a
と高調波計測点bとを同じ点に設定する場合より低くす
ることができ、その小型化が図れるとともに保護回路構
成を簡素化することができる。
Since the harmonic injection point a is set to the distribution bus 3 on the low voltage side lower than the harmonic measurement point b of the high voltage bus 7, the voltage class of the current injection device 16 is changed to the harmonic injection point a
And the harmonic measurement point b can be made lower than when they are set to the same point, so that the size can be reduced and the protection circuit configuration can be simplified.

【0057】したがって、電力系統1に本来存在しない
周波数f1 ,f2 の中間高調波の電流I1 ,I2 を流入
するため、電流注入装置16の電流容量を低減してその
小型化を図ることができるだけでなく、前記の電圧階級
の低減に基づいて電流注入装置16の一層の小型化及び
簡素化を図ることができ、電流注入装置16が極めて小
型かつ簡素な構成で安価になる。
Therefore, currents I 1 and I 2 of intermediate harmonics of frequencies f 1 and f 2 which do not originally exist in power system 1 flow, so that the current capacity of current injection device 16 is reduced and its size is reduced. In addition to the above, the current injection device 16 can be further reduced in size and simplified based on the reduction in the voltage class, and the current injection device 16 can be reduced in cost with an extremely small and simple configuration.

【0058】そのため、小型かつ簡素で安価な高調波計
測装置15により、高調波注入点aの上位に高調波計測
点bを設け、この計測点bより上位の着目高調波につい
ての高調波特性を精度よく測定することができる。
For this reason, a small, simple, and inexpensive harmonic measuring device 15 is provided with a harmonic measuring point b above the harmonic injection point a, and the harmonic characteristic of the target harmonic higher than the measuring point b is obtained. Can be accurately measured.

【0059】しかも、この実施の形態にあっては、高調
波計測装置bより上位の高調波特性の測定に用いたデー
タを流用して、この測定と同時に、高調波注入点aより
下位の着目高調波についての高調波特性も精度よく測定
することができる。
Further, in this embodiment, the data used for the measurement of the higher harmonic characteristics than the harmonic measurement device b is diverted, and at the same time as this measurement, the data lower than the harmonic injection point a is used. Harmonic characteristics of the target harmonic can also be accurately measured.

【0060】ところで、A/D変換器19,信号処理装
置21,演算処理装置22はコンピュータのソフトウエ
アにより実現することが可能であり、この場合、A/D
変換器19,信号処理装置21,演算処理装置22及び
表示部23,記憶部24をいわゆる携帯型のパソコン等
の1台のコンピュータ装置により形成することができ
る。
Incidentally, the A / D converter 19, the signal processing device 21, and the arithmetic processing device 22 can be realized by software of a computer.
The converter 19, the signal processing unit 21, the arithmetic processing unit 22, the display unit 23, and the storage unit 24 can be formed by one computer device such as a so-called portable personal computer.

【0061】また、計器用変圧器17及び計器用変換器
18,20の計測出力は無線でA/D変換器19に伝送
するようにしてもよい。
The measurement outputs of the instrument transformer 17 and the instrument converters 18 and 20 may be transmitted to the A / D converter 19 by radio.

【0062】そして、高調波注入点a及び高調波計測点
bは、高調波注入点aが高調波計測点bの下位側に位置
するように電力系統1に任意に設定することができる。
The harmonic injection point a and the harmonic measurement point b can be arbitrarily set in the power system 1 so that the harmonic injection point a is located below the harmonic measurement point b.

【0063】そのため、例えば、配電系統3に高調波計
測点bを設定してその下位のポールトランス2次側に高
調波注入点aを設定し、配電系統3を含む上位の高調波
特性をその下位側から電流を注入して測定することもで
き、本発明は電力系統1の任意の点より上位の高調波特
性の測定に適用することができる。
For this reason, for example, a harmonic measurement point b is set in the distribution system 3 and a harmonic injection point a is set in the secondary side of the lower pole transformer, so that higher harmonic characteristics including the distribution system 3 can be obtained. The measurement can be performed by injecting a current from the lower side, and the present invention can be applied to measurement of higher harmonic characteristics than an arbitrary point of the power system 1.

【0064】その際、周波数f1 ,f2 は着目高調波を
挟む系統基本周波数fs の非整数倍の適当な中間高調波
の周波数に設定してよいのは勿論である。
At this time, the frequencies f 1 and f 2 may of course be set to appropriate intermediate harmonic frequencies which are non-integer multiples of the system fundamental frequency f s sandwiching the target harmonic.

【0065】なお、実際の系統にあっては、相毎に、中
間高調波の電流I1 ,I2 を注入して等価回路9,12
を同定することになる。
In an actual system, the intermediate harmonic currents I 1 and I 2 are injected for each phase to provide equivalent circuits 9 and 12.
Will be identified.

【0066】[0066]

【発明の効果】本発明は、以下に記載する効果を奏す
る。高調波注入点aを高調波計測点bより下位低圧側に
設定したため、高調波注入点aに周波数f1 ,f2 の中
間高調波の電流を注入する電流注入装置16の電圧階級
を、高調波注入点aが高調波計測点bと同じ点になる場
合より低くすることができ、その保護回路等も簡素化す
ることができる。
The present invention has the following effects. Since the harmonic injection point a is set to a lower low voltage side than the harmonic measurement point b, the voltage class of the current injection device 16 for injecting the intermediate harmonic current of the frequencies f 1 and f 2 into the harmonic injection point a is set to This can be lower than when the wave injection point a is the same as the harmonic measurement point b, and the protection circuit and the like can be simplified.

【0067】そのため、電流注入装置16を小型かつ簡
素な構成にして安価にすることができる。
For this reason, the current injection device 16 can be made compact and simple in construction and inexpensive.

【0068】そして、電流注入装置16から高調波注入
点aに系統1に本来は存在しない周波数f1 ,f2 の中
間高調波の電流を注入し、高調波計測点bにおける周波
数f1 ,f2 の中間高調波の電流,電圧を検出し、この
検出に基づき、高調波計測点bより上位側の両中間高調
波についての等価回路のアドミタンスを求め、この両ア
ドミタンスから着目高調波についての高調波計測点bよ
り上位の着目高調波についての等価回路9のアドミタン
スを決定してその高調波特性を測定することができる。
[0068] Then, by injecting an intermediate harmonic current of a frequency f 1, f 2 of the harmonic injection point a does not exist originally line 1 from the current injection unit 16, the frequency f 1 in the harmonic measurement points b, f The current and voltage of the intermediate harmonic 2 are detected, and based on this detection, the admittance of an equivalent circuit for both intermediate harmonics higher than the harmonic measurement point b is obtained, and the harmonics of the harmonic of interest are calculated from both admittances. It is possible to determine the admittance of the equivalent circuit 9 for the harmonic of interest higher than the wave measurement point b and measure its harmonic characteristics.

【0069】そのため、小型かつ簡素な構成で安価に、
高調波注入点aの上位に設定した高調波計測点bより上
位の着目高調波についての高調波特性の精度の高い測定
を行うことができる。
For this reason, a small and simple configuration is inexpensive,
It is possible to perform highly accurate measurement of the harmonic characteristic of the target harmonic higher than the harmonic measurement point b set above the harmonic injection point a.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の1形態の回路結線図である。FIG. 1 is a circuit connection diagram according to an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 電力系統 9,12 等価回路 10,13 アドミタンス 11,14 電流源 a 高調波注入点 b 高調波計測点 1 Power system 9,12 Equivalent circuit 10,13 Admittance 11,14 Current source a Harmonic injection point b Harmonic measurement point

───────────────────────────────────────────────────── フロントページの続き (72)発明者 西村 荘治 京都市右京区梅津高畝町47番地 日新電機 株式会社内 (72)発明者 鵜野 克彦 京都市右京区梅津高畝町47番地 日新電機 株式会社内 ──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Shoji Nishimura, 47, Umezu Takaune-cho, Ukyo-ku, Kyoto-shi, Nissin Electric Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 系統の高調波計測点より下位低圧側に高
調波注入点を設定し、 該高調波注入点に接続した電流注入装置から前記高調波
注入点に、計測対象のn次の着目高調波(周波数n×f
s )を挟む系統基本周波数fs の非整数倍の2周波数f
1 ,f2 (f1 <n×fs <f2 )の電流を中間高調波
の電流としてそれぞれ注入し、 前記高調波計測点の前記周波数f1 ,f2 それぞれの電
流,電圧を検出して前記高調波計測点より上位の前記周
波数f1 ,f2 の中間高調波それぞれについての等価回
路のアドミタンスを求め、 該両アドミタンスから前記高調波計測点より上位の前記
着目高調波についての等価回路のアドミタンスを補間演
算して決定し、 前記高調波注入点の上位に設定した前記高調波計測点よ
り上位の前記着目高調波についての高調波特性を測定す
ることを特徴とする電力系統の高調波測定方法。
1. A harmonic injection point is set to a lower voltage side lower than a harmonic measurement point of a system, and a current injection device connected to the harmonic injection point focuses on the harmonic injection point at the nth order of a measurement target. Harmonics (frequency nxf
s ) Two frequencies f that are non-integer multiples of the system fundamental frequency f s
1, f 2 and respectively injected (f 1 <n × f s <f 2) the current of the intermediate harmonic currents, the frequency f 1, f 2 respectively current of the harmonic measuring points, detects a voltage The admittance of an equivalent circuit for each of the intermediate harmonics of the frequencies f 1 and f 2 higher than the harmonic measurement point is obtained, and the equivalent circuit for the target harmonic higher than the harmonic measurement point is obtained from both admittances. The admittance of the power system is determined by interpolation calculation, and the harmonic characteristic of the target harmonic higher than the harmonic measurement point set at the higher harmonic injection point is measured. Wave measurement method.
JP19780697A 1997-07-07 1997-07-07 Method for measuring harmonic in power system Pending JPH1123624A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP19780697A JPH1123624A (en) 1997-07-07 1997-07-07 Method for measuring harmonic in power system
US09/110,997 US6326796B1 (en) 1997-07-07 1998-07-06 Harmonic measuring method and a current injection device for harmonic measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19780697A JPH1123624A (en) 1997-07-07 1997-07-07 Method for measuring harmonic in power system

Publications (1)

Publication Number Publication Date
JPH1123624A true JPH1123624A (en) 1999-01-29

Family

ID=16380666

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19780697A Pending JPH1123624A (en) 1997-07-07 1997-07-07 Method for measuring harmonic in power system

Country Status (1)

Country Link
JP (1) JPH1123624A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100755796B1 (en) * 1999-12-17 2007-09-05 동경 엘렉트론 주식회사 Coating film forming apparatus and coating unit cross-reference to related applications

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100755796B1 (en) * 1999-12-17 2007-09-05 동경 엘렉트론 주식회사 Coating film forming apparatus and coating unit cross-reference to related applications

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