JPH11209745A - Grinder composition for grinding glass and grinding - Google Patents
Grinder composition for grinding glass and grindingInfo
- Publication number
- JPH11209745A JPH11209745A JP1425798A JP1425798A JPH11209745A JP H11209745 A JPH11209745 A JP H11209745A JP 1425798 A JP1425798 A JP 1425798A JP 1425798 A JP1425798 A JP 1425798A JP H11209745 A JPH11209745 A JP H11209745A
- Authority
- JP
- Japan
- Prior art keywords
- magnesium
- grinding
- glass
- polishing
- composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、ガラス研磨用研磨
材組成物に関し、詳しくは欠陥のない優れた研磨面を形
成することができるガラス研磨用研磨材組成物であり、
特に低浮上量で磁気ヘッドが飛行するのに適した高精度
鏡面に研磨できる磁気ディスク用ガラス研磨用研磨材組
成物およびその研磨方法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an abrasive composition for glass polishing, and more particularly to an abrasive composition for glass polishing capable of forming an excellent polished surface without defects.
In particular, the present invention relates to an abrasive composition for polishing a glass for a magnetic disk, which can be polished to a high-precision mirror surface suitable for a magnetic head to fly with a low flying height, and a polishing method thereof.
【0002】[0002]
【従来の技術】パソコン等の記憶媒体として、ドライブ
装置に組み込まれて使用される磁気ディスク用基板とし
て、アルミニウム基板に比べて衝撃性に強く、かつ平滑
度を高くすることが可能という利点から、ガラス基板が
利用されている。最近、高記録密度化への要求から、磁
気ヘッドと磁気ディスク基板の間隔がますます小さくな
る傾向にあり、磁気ディスク用ガラス基板はより高精度
な平坦度、より小さい表面粗さおよび欠陥の少ないもの
が強く求められている。各種ガラス研磨には、酸化セリ
ウム、酸化ジルコニウム、酸化鉄、二酸化ケイ素等の材
料が古くから使用されている。現在、研磨能率が高いこ
とから酸化セリウムを主成分とする研磨材組成物(以
下、「酸化セリウム系研磨材組成物」という)が主に用
いられている。2. Description of the Related Art As a substrate for a magnetic disk used as a storage medium for a personal computer or the like incorporated in a drive device, it has higher shock resistance and higher smoothness than an aluminum substrate. Glass substrates are used. Recently, due to the demand for higher recording density, the distance between the magnetic head and the magnetic disk substrate has been getting smaller and smaller, and the glass substrate for the magnetic disk has a higher precision flatness, smaller surface roughness and less defects. Things are in great demand. Materials such as cerium oxide, zirconium oxide, iron oxide, and silicon dioxide have been used for various types of glass polishing for a long time. At present, an abrasive composition containing cerium oxide as a main component (hereinafter referred to as “cerium oxide-based abrasive composition”) is mainly used because of its high polishing efficiency.
【0003】磁気ディスク用ガラス基板の研磨材組成物
は、酸化セリウム、酸化ジルコニウム、酸化アルミニウ
ムを主成分とする研磨材に添加剤を加えスラリー特性を
調整することによって、研磨能率、研磨精度を向上させ
ることを目的とした以下のような技術がある。 特開平3−146584「ガラス研磨用研磨材」 酸化ジルコニウムを主成分とするものにアルミン酸カル
シウム、硫酸マグネシウム、塩化マグネシウムを含有さ
せるもの 特開平3−146585「ガラス研磨用研磨材」 酸化セリウムを主成分とするものに塩化マグネシウムを
含有させるもの 特開平9−109020「磁気ディスク研磨用組成物
及びそれを用いた研磨液」 酸化アルミニウムを主成分とするものにギブサイト及び
分散剤を含有させるもの 磁気ディスク用ガラス基板は日進月歩で表面精度を益々
高めている。磁気ディスク用ガラス基板の特性として要
求されている低浮上量を安定的に確保するためには、従
来の研磨材組成物ではそれに必要な表面粗さと付着物の
ない清浄なガラス表面を確保することができない。An abrasive composition for a glass substrate for a magnetic disk has improved polishing efficiency and polishing accuracy by adjusting the slurry characteristics by adding an additive to an abrasive mainly composed of cerium oxide, zirconium oxide and aluminum oxide. There are the following technologies for the purpose of causing the following. JP-A-3-146584 "Abrasive for glass polishing" A material mainly containing zirconium oxide containing calcium aluminate, magnesium sulfate and magnesium chloride JP-A-3-146585 "Abrasive for glass polishing" Mainly cerium oxide JP-A-9-109020 "Magnetic disk polishing composition and polishing liquid using the same" Japanese Patent Application Laid-open No. 9-109020 "A magnetic disk polishing composition containing gibbsite and a dispersant in an aluminum oxide-based component" For glass substrates for use, the surface accuracy is increasing more and more as the day progresses. In order to stably maintain the low flying height required as a characteristic of a glass substrate for a magnetic disk, a conventional abrasive composition must have a surface roughness and a clean glass surface free of deposits necessary for the abrasive composition. Can not.
【0004】[0004]
【発明が解決しようとする課題】前述のように、磁気デ
ィスクの高記録密度化のためには、磁気ヘッド浮上高さ
を小さくすることが必須となり、そのために磁気ディス
ク面精度の高精度化への要求が一段と厳しくなりつつあ
る。磁気ディスク用ガラス基板に使用される結晶化ガラ
スや強化ガラス基板において、従来より用いられている
酸化セリウム系研磨材組成物を用いて研磨しても、磁気
ヘッドの浮上高さを要求されるレベルまで低くするため
に必要な面粗さが得られないという問題が生じている。
また、酸化セリウム系研磨材組成物は、ガラスとの化学
的反応性が高いことから、磁気ディスク用ガラス基板表
面に付着物が残留し、超音波洗浄やスクラブ洗浄等の機
械的エネルギーを加えても付着物を完全に除去すること
が難しく、残留付着物に磁気ヘッドが接触するため実質
的に磁気ヘッドの浮上高さを低下するのに適した高精度
の磁気ディスク表面を得るには難点がある。As described above, in order to increase the recording density of a magnetic disk, it is essential to reduce the flying height of a magnetic head. Are becoming more stringent. Even if the crystallized glass or tempered glass substrate used for the magnetic disk glass substrate is polished using the conventionally used cerium oxide-based abrasive composition, the flying height of the magnetic head is required There is a problem that the required surface roughness cannot be obtained because the surface roughness is lowered.
In addition, since the cerium oxide-based abrasive composition has a high chemical reactivity with glass, deposits remain on the surface of the glass substrate for a magnetic disk, and mechanical energy such as ultrasonic cleaning or scrub cleaning is applied. However, it is difficult to completely remove the deposits, and the magnetic head comes into contact with the remaining deposits.Therefore, it is difficult to obtain a high-precision magnetic disk surface suitable for substantially reducing the flying height of the magnetic head. is there.
【0005】[0005]
【課題を解決するための手段】本発明者は、磁気ディス
ク用ガラス基板に対して高精度な研磨面を得るため最適
な研磨材の研究を鋭意重ねた結果、マグネシウムの塩基
性塩、なかでも特に水酸化マグネシウム、炭酸マグネシ
ウム、塩基性炭酸マグネシウム、各種リン酸マグネシウ
ムから選ばれる少なくとも1種からなるガラス研磨用研
磨材組成物を使用することにより、従来の酸化セリウム
系研磨材組成物では到達できなかった高精度な研磨面が
得られることを見い出した。また、酸化セリウム、酸化
ジルコニウム、酸化鉄、二酸化ケイ素の少なくとも1種
を主成分とする研磨材を用いて研磨することにより得ら
れるガラス研磨面を、マグネシウムの塩基性塩、なかで
も特に、水酸化マグネシウム、炭酸マグネシウム、塩基
性炭酸マグネシウム、各種リン酸マグネシウムから選ば
れる少なくとも1種以上を含有する研磨材組成物を用い
て研磨をすることにより、酸化セリウム系研磨材等の残
留付着物の除去が可能となり、同時に高精度のガラス研
磨面を得ることができる。その結果、従来達成できなか
った磁気ヘッド浮上高さの低下が可能となる。The inventor of the present invention has conducted intensive studies on the most suitable abrasive for obtaining a highly polished surface on a glass substrate for a magnetic disk. As a result, the basic salt of magnesium, especially In particular, by using a glass polishing abrasive composition comprising at least one selected from magnesium hydroxide, magnesium carbonate, basic magnesium carbonate, and various magnesium phosphates, a conventional cerium oxide-based abrasive composition can be achieved. It has been found that a highly accurate polished surface can be obtained. In addition, a glass polished surface obtained by polishing using an abrasive mainly containing at least one of cerium oxide, zirconium oxide, iron oxide and silicon dioxide is used as a basic salt of magnesium, especially, hydroxide. By polishing using an abrasive composition containing at least one selected from magnesium, magnesium carbonate, basic magnesium carbonate and various magnesium phosphates, removal of residual deposits such as cerium oxide-based abrasives can be achieved. This makes it possible to obtain a highly polished glass surface at the same time. As a result, the flying height of the magnetic head, which cannot be achieved conventionally, can be reduced.
【0006】[0006]
【発明の実施の形態】本発明に用いられるマグネシウム
の塩基性塩の具体例としては、水酸化マグネシウム、炭
酸マグネシウム、塩基性炭酸マグネシウム(3MgCO
3 ・Mg(OH)2 )およびリン酸マグネシウム、リン
酸水素マグネシウム等の各種リン酸マグネシウムなどを
挙げることができるが、これらに本発明は限定されるも
のではない。また、本発明においては、これらの化合物
の純度は特に限定されるものではない。本発明に用いら
れるマグネシウムの塩基性塩は、それ自身粉末状態で研
磨に寄与するため、その好ましい粒度は平均粒子径とし
て0.1〜10μmである。10μmを越えるとスラリ
ーでの沈降が著しくなり作業的に問題となるだけでな
く、場合により必要とされる研磨面粗さが得られなくな
り、一方0.1μm未満では研磨能率が低下し過ぎ好ま
しくない。DESCRIPTION OF THE PREFERRED EMBODIMENTS Specific examples of the basic salt of magnesium used in the present invention include magnesium hydroxide, magnesium carbonate and basic magnesium carbonate (3MgCO3).
3 , Mg (OH) 2 ) and various magnesium phosphates such as magnesium phosphate and magnesium hydrogen phosphate, but the present invention is not limited thereto. In the present invention, the purity of these compounds is not particularly limited. Since the basic salt of magnesium used in the present invention itself contributes to polishing in a powder state, the preferred particle size is 0.1 to 10 μm as an average particle size. If it exceeds 10 μm, sedimentation in the slurry becomes remarkable and not only poses a problem in work, but also the required polishing surface roughness may not be obtained in some cases. .
【0007】本発明に用いられるマグネシウムの塩基性
塩の添加量は、スラリー中の固形分濃度として(2種以
上のマグネシウムの塩基性塩を使用する場合はその総量
として)、1〜40wt.%が好ましく、より好ましく
は、5〜30wt.%である。1wt.%未満では高精
度表面が得難く、表面欠陥も発生し易い。また、40w
t.%を越えると増量による更なる向上効果が得難く好
ましくない。マグネシウムの塩基性塩を1種以上混合す
る場合には、それらの混合比率は任意に選択し得る。ま
た、本発明に用いられるマグネシウムの塩基性塩は、結
晶水を除いた化学式が同じで、結晶水の数が異なった
り、結晶系が異なったり、外観的形状、形態の異なるも
のもあるが、特にそれらに限定されるものではない。本
発明の研磨材組成物の溶媒は水に限定されるものではな
いが、多くの場合水系が種々の点で好ましい。The amount of the basic magnesium salt used in the present invention is 1 to 40 wt.% As the solid content concentration in the slurry (when two or more basic salts of magnesium are used). %, More preferably 5 to 30 wt. %. 1 wt. %, It is difficult to obtain a highly accurate surface, and surface defects are liable to occur. Also, 40w
t. %, It is difficult to obtain a further improvement effect by increasing the amount. When one or more basic salts of magnesium are mixed, their mixing ratio can be arbitrarily selected. In addition, the basic salt of magnesium used in the present invention has the same chemical formula excluding water of crystallization, the number of water of crystallization is different, or the crystal system is different, the appearance is different, the shape is different, It is not particularly limited to them. The solvent of the abrasive composition of the present invention is not limited to water, but in many cases, an aqueous system is preferred in various respects.
【0008】本発明の研磨材組成物には更に分散性向
上、沈降防止、安定性向上および作業性向上のため、必
要によりエチレングリコール、ポリエチレングリコール
等のグリコール類、トリポリリン酸塩、ヘキサメタリン
酸塩等のリン酸塩、ポリアクリル酸塩のような高分子分
散剤、メチルセルロース、カルボキシメチルセルロース
等のセルロースエーテル類、ポリビニルアルコール等の
水溶性高分子を添加してもよい。これらの研磨材に対す
る添加量は0.05〜20wt.%の範囲が通常であ
り、好ましくは0.1〜15wt.%、より好ましくは
0.1〜10wt.%である。The abrasive composition of the present invention may further contain glycols such as ethylene glycol and polyethylene glycol, tripolyphosphate, hexametaphosphate and the like, if necessary, for further improving dispersibility, preventing sedimentation, improving stability and improving workability. Or a polymer dispersant such as a phosphate or polyacrylate, a cellulose ether such as methylcellulose or carboxymethylcellulose, or a water-soluble polymer such as polyvinyl alcohol. The amount of addition to these abrasives is 0.05 to 20 wt. % Is normal, preferably 0.1 to 15 wt. %, More preferably 0.1 to 10 wt. %.
【0009】また、本発明の研磨材組成物の研磨能率を
向上させるため、ガラスに対し研磨促進効果を有する物
質、例えばアルギニンなどのアミノ酸系、メラミン、ト
リエタノールアミンなどのアミン系、フッ化セリウムな
どのフッ化希土化合物、クエン酸、酒石酸、リンゴ酸、
グルコン酸等の有機酸を添加してもよい。本発明の研磨
材組成物の造り方は、種々原材料を混合すればよく、特
に限定されるものではなく、好ましくは、ボールミル、
高速ミキサー等により、上記混合割合にて機械的に混合
調製すればよい。本発明の研磨材組成物を使用する方法
は、通常の研磨材組成物と同様に行えることができる
が、更によい研磨方法としては、酸化セリウム、酸化ジ
ルコニウム、酸化鉄、二酸化ケイ素の少なくとも1種を
主成分とする研磨材により粗研磨した後、マグネシウム
の塩基性塩、なかでも特に、水酸化マグネシウム、炭酸
マグネシウム、塩基性炭酸マグネシウム、リン酸マグネ
シウム、リン酸水素マグネシウム等の各種リン酸マグネ
シウムから選ばれる少なくとも1種以上のマグネシウム
の塩基性塩を含有する研磨材組成物を用いて研磨するこ
とであり、このことにより従来にはない高精度の研磨を
効率的に行なうことができる。In order to improve the polishing efficiency of the polishing composition of the present invention, substances having a polishing promoting effect on glass, for example, amino acids such as arginine, amines such as melamine and triethanolamine, cerium fluoride Rare earth fluoride compounds such as citric acid, tartaric acid, malic acid, etc.
An organic acid such as gluconic acid may be added. The method of producing the abrasive composition of the present invention may be any mixture of various raw materials, and is not particularly limited. Preferably, a ball mill,
What is necessary is just to mix and prepare mechanically by the high-speed mixer etc. in the said mixing ratio. The method of using the abrasive composition of the present invention can be performed in the same manner as a normal abrasive composition, but a more preferred polishing method is at least one of cerium oxide, zirconium oxide, iron oxide and silicon dioxide. After rough polishing with an abrasive mainly composed of, a basic salt of magnesium, especially, from various magnesium phosphates such as magnesium hydroxide, magnesium carbonate, basic magnesium carbonate, magnesium phosphate, magnesium hydrogen phosphate, etc. Polishing is performed using an abrasive composition containing at least one or more selected basic salts of magnesium, whereby highly accurate polishing which has not been achieved in the past can be efficiently performed.
【0010】研磨後の被研磨物は、純水中にて、場合に
より界面活性剤を添加し、超音波洗浄するのが通常であ
る。更に、容易に洗浄するためには、塩酸、硫酸、硝酸
等の強酸の場合は希釈した水溶液、弱酸の場合はそのま
まか、多少希釈した水溶液を、水酸化マグネシウムの場
合には更にアンモニウム塩の水溶液を使用するとよい。
本発明の研磨材組成物による研磨では、上記のような洗
浄後ガラス表面に残留付着物は、従来品に比べて皆無で
あり、磁気ヘッドの浮上高さを0.25マイクロインチ
程度に下げることができ、磁気ディスク用ガラス基板の
高密度化に対して多大な効果が得られる。The object to be polished after polishing is usually subjected to ultrasonic cleaning in pure water, optionally with the addition of a surfactant. Further, for easy washing, a diluted aqueous solution for a strong acid such as hydrochloric acid, sulfuric acid, nitric acid, etc., a weak acid or a slightly diluted aqueous solution, and an aqueous solution of an ammonium salt for magnesium hydroxide. It is better to use
In the polishing with the abrasive composition of the present invention, there is no residual deposit on the glass surface after washing as described above as compared with the conventional product, and the flying height of the magnetic head is reduced to about 0.25 microinch. Thus, a great effect can be obtained for increasing the density of the glass substrate for a magnetic disk.
【0011】[0011]
【実施例】以下、実施例および比較例に基づき本発明を
詳細に説明する。マグネシウムの塩基性塩の具体例とし
て水酸化マグネシウム、炭酸マグネシウムについて、実
施例を記載するが、本発明はこれらに限定されるもので
はない。The present invention will be described below in detail based on examples and comparative examples. Examples are given of magnesium hydroxide and magnesium carbonate as specific examples of the basic salt of magnesium, but the present invention is not limited to these.
【0012】実施例1〜14 協和化学工業社製水酸化マグネシウム(キョーワスイマ
グF、平均粒子径d50=4μm)を原料として分級し、
粗大粒子を除去し、平均粒子径d50=3.5μmのもの
を造った(「水酸化マグネシウムA」とする)。上記原
料の水酸化マグネシウムを粉砕した後、分級し、細粒
(平均粒子径d50=0.5μm)を造った(「水酸化マ
グネシウムB」とする)。また、炭酸マグネシウムは、
協和化学工業社製のもの(平均粒子径d50=1.0μ
m、フィラー用)を粉砕後、分級し、平均粒子径d50=
0.5μmの細粒を造った。Examples 1 to 14 Classification was performed using magnesium hydroxide (Kyowa Suimag F, average particle diameter d 50 = 4 μm) manufactured by Kyowa Chemical Industry Co., Ltd. as a raw material.
Coarse particles were removed to produce a particle having an average particle diameter d 50 = 3.5 μm (referred to as “magnesium hydroxide A”). The raw material magnesium hydroxide was pulverized and classified to produce fine particles (average particle diameter d 50 = 0.5 μm) (referred to as “magnesium hydroxide B”). Also, magnesium carbonate is
Manufactured by Kyowa Chemical Industry Co., Ltd. (average particle diameter d 50 = 1.0 μm)
m, for filler), and then classified to obtain an average particle diameter d 50 =
Fine granules of 0.5 μm were made.
【0013】表1に示す条件で高速ミキサーを用い、純
水分散系の研磨材組成物実施例1〜14を造った。この
際、総てのものにつきポリアクリル酸系分散剤(花王
(株)社製、ポイズ530)を上記粉末に対し、1w
t.%を添加した。被加工物として、予め酸化セリウム
系研磨材(東北金属化学(株)製ROXH−1)で研磨
した2.5インチリチウムシリケートを主成分とする結
晶化ガラス基板((リチウムシリケートとクリストバラ
イトの結晶相とアモルファス相を含んでいる)Ra =1
0Å、Rmax =250Å)(表1において「ワーク甲」
とする。)又は、アルミノシリケートを主成分とする強
化ガラス基板(Ra =9Å、Rmax =180Å)(表1
において「ワーク乙」とする。)を用いて下記の条件で
研磨した。Using a high-speed mixer under the conditions shown in Table 1, pure water dispersion-based abrasive compositions Examples 1 to 14 were produced. At this time, a polyacrylic acid-based dispersant (Poise 530, manufactured by Kao Corporation) was added to all the powders for 1 w
t. % Was added. As a work piece, a crystallized glass substrate mainly composed of 2.5 inch lithium silicate ((crystal phase of lithium silicate and cristobalite) polished in advance with a cerium oxide-based abrasive (ROXH-1 manufactured by Tohoku Metal Chemical Co., Ltd.) And an amorphous phase) R a = 1
0 °, R max = 250 °)
And ) Or a tempered glass substrate mainly composed of aluminosilicate (R a = 9 °, R max = 180 °) (Table 1)
"Work B". ) Was polished under the following conditions.
【0014】研磨機:4ウェイタイプ両面研磨機(不二
越機械工業(株)製、5B型) 研磨パッド:スウェードタイプ(千代田(株)製、シガ
ール1900W) スラリー供給速度:60ml/min 下定盤回転数:45rpm 加工圧力:75g/cm2 研磨時間:7minPolishing machine: 4-way type double-side polishing machine (Fujikoshi Kikai Kogyo Co., Ltd., 5B type) Polishing pad: Suede type (Chiyoda Co., Ltd., Shigaru 1900W) Slurry supply speed: 60 ml / min Lower platen rotation speed : 45 rpm Processing pressure: 75 g / cm 2 Polishing time: 7 min
【0015】研磨後のガラスディスクを研磨機より取り
出し、純水による超音波洗浄を行ない、次いで希硝酸水
溶液(1wt.%濃度)浴中での超音波洗浄を行なっ
た。その後、純水により洗浄を行ない、乾燥し下記の評
価を行なった。 (i)ディスク表面粗さ:Ra 、Rmax 原子間力顕微鏡(AFM)を用いて表面粗さRa 及びR
max を測定した。 (ii)ディスク表面欠陥 表面欠陥は微分干渉顕微鏡を用いて付着、ピット、スク
ラッチについて観察し、○:良好、△:普通、×:不良
の3段階方式で評価した。 (iii)ヘッド浮上高さ:GA(グライドアバランチ) 研磨したディスクに磁性膜を塗布し、ヘッド浮上高さG
Aを測定した。具体的には、スパッタリング法により、
基板温度200℃にて、下地層としてCr60nm、磁
性層としてCo13Cr6 Pt3 Ta合金20nm、保護
層としてカーボン10nmを逐次成膜し、更にPFPE
系潤滑剤を塗布して作成した磁性記録媒体をグライドハ
イトテスター(ソニーテクトロニクス社製)を用いてG
Aの測定を行なった。これらの結果を表1に示す。な
お、研磨材の平均粒子径はCilas社製Granul
ometer HR850により測定したものである。The polished glass disk was taken out of the polishing machine, subjected to ultrasonic cleaning with pure water, and then subjected to ultrasonic cleaning in a dilute nitric acid aqueous solution (1 wt.% Concentration) bath. Thereafter, the substrate was washed with pure water, dried, and evaluated as follows. (I) Disk surface roughness: Ra , Rmax Surface roughness Ra and R using an atomic force microscope (AFM)
The max was measured. (Ii) Disk surface defects Surface defects were observed for adhesion, pits and scratches using a differential interference microscope, and evaluated by a three-level system of ○: good, Δ: normal, ×: poor. (iii) Head flying height: GA (glide avalanche) A magnetic film is applied to a polished disk, and the head flying height G
A was measured. Specifically, by the sputtering method,
At a substrate temperature of 200 ° C., a 60 nm Cr as a base layer, a 20 nm Co 13 Cr 6 Pt 3 Ta alloy as a magnetic layer, and a 10 nm carbon as a protective layer are successively formed.
The magnetic recording medium created by applying a system lubricant is applied to a Glide Height Tester (manufactured by Sony Tektronix).
A was measured. Table 1 shows the results. The average particle size of the abrasive was Granul manufactured by Cilas.
It is a value measured by an instrument HR850.
【0016】比較例1〜2 比較例として、本発明に用いられるマグネシウムの塩基
性塩にかえて、予め研磨した前述ガラス基板を仕上げ研
磨用酸化セリウム研磨材(東北金属化学(株)製、RO
X F620)の10wt.%水分散スラリーを用いて
研磨し、評価した。これらの条件等は、上記の実施例に
記した条件等と同じである。Comparative Examples 1-2 As a comparative example, the above-mentioned glass substrate polished in advance was replaced with a basic cerium oxide abrasive (RO, manufactured by Tohoku Metal Chemical Co., Ltd.) in place of the basic salt of magnesium used in the present invention.
XF620). Polishing was performed using a% aqueous dispersion slurry and evaluated. These conditions are the same as those described in the above embodiment.
【0017】実施例、比較例の結果からわかるように、
表面粗さ・表面欠陥・グライドアバランチのいずれで
も、実施例では優れた結果を得た。ここで得られたグラ
イドアバランチは従来の研磨材では得られない低い数値
である。As can be seen from the results of Examples and Comparative Examples,
In any of the examples, excellent results were obtained in any of the surface roughness, the surface defect, and the glide avalanche. The glide avalanche obtained here is a low value that cannot be obtained with a conventional abrasive.
【0018】[0018]
【表1】 [Table 1]
【0019】[0019]
【発明の効果】本発明によると、従来の研磨材組成物で
は得られなかった面精度が得られ、磁気ディスク用ガラ
ス基板の場合には、磁気ヘッドの浮上高さをより下げる
ことができ、ハードディスクの高密度化に大きく寄与
し、本発明は極めて有用な研磨材組成物である。According to the present invention, a surface accuracy which cannot be obtained with the conventional abrasive composition can be obtained, and in the case of a glass substrate for a magnetic disk, the flying height of the magnetic head can be further reduced, The present invention is an extremely useful abrasive composition, which greatly contributes to increasing the density of a hard disk.
フロントページの続き (72)発明者 山内 豊 千葉県市原市八幡海岸通5−1 昭和電工 株式会社HD工場内Continued on the front page (72) Inventor Yutaka Yamauchi 5-1 Yawata Kaigandori, Ichihara-shi, Chiba Prefecture Showa Denko Corporation HD Factory
Claims (3)
を特徴とするガラス研磨用研磨材組成物。An abrasive composition for polishing glass, comprising a basic salt of magnesium.
シウム、炭酸マグネシウム、塩基性炭酸マグネシウム、
各種リン酸マグネシウムから選ばれる少なくとも1種以
上であることを特徴とする特許請求の範囲第1項記載の
組成物。2. The method according to claim 1, wherein the basic salt of magnesium is magnesium hydroxide, magnesium carbonate, basic magnesium carbonate,
2. The composition according to claim 1, wherein the composition is at least one selected from various magnesium phosphates.
鉄、二酸化ケイ素の少なくとも1種を主成分とする研磨
材により研磨されたガラスを、請求項1又は請求項2記
載のガラス研磨用研磨材組成物を用いて研磨を行うこと
を特徴とするガラス研磨方法。3. The glass polishing abrasive composition according to claim 1, wherein the glass polished with an abrasive mainly containing at least one of cerium oxide, zirconium oxide, iron oxide and silicon dioxide is used. A glass polishing method characterized in that polishing is performed by using.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1425798A JP3857799B2 (en) | 1998-01-27 | 1998-01-27 | Abrasive composition for glass polishing and polishing method thereof |
MYPI9900276 MY121041A (en) | 1998-01-27 | 1999-01-26 | Composition for polishing glass and polishing method |
US09/238,782 US6248143B1 (en) | 1998-01-27 | 1999-01-27 | Composition for polishing glass and polishing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1425798A JP3857799B2 (en) | 1998-01-27 | 1998-01-27 | Abrasive composition for glass polishing and polishing method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH11209745A true JPH11209745A (en) | 1999-08-03 |
JP3857799B2 JP3857799B2 (en) | 2006-12-13 |
Family
ID=11856050
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1425798A Expired - Lifetime JP3857799B2 (en) | 1998-01-27 | 1998-01-27 | Abrasive composition for glass polishing and polishing method thereof |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP3857799B2 (en) |
MY (1) | MY121041A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002031079A1 (en) | 2000-10-06 | 2002-04-18 | Mitsui Mining & Smelting Co.,Ltd. | Abrasive material |
JP2006088320A (en) * | 2004-08-27 | 2006-04-06 | Showa Denko Kk | Substrate for magnetic disk and manufacturing method of magnetic disk |
WO2007119775A1 (en) * | 2006-04-14 | 2007-10-25 | Showa Denko K.K. | Method of processing glass base and rinse composition for glass base processing |
-
1998
- 1998-01-27 JP JP1425798A patent/JP3857799B2/en not_active Expired - Lifetime
-
1999
- 1999-01-26 MY MYPI9900276 patent/MY121041A/en unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002031079A1 (en) | 2000-10-06 | 2002-04-18 | Mitsui Mining & Smelting Co.,Ltd. | Abrasive material |
EP1338636A4 (en) * | 2000-10-06 | 2007-08-29 | Mitsui Mining & Smelting Co | Abrasive material |
JP2006088320A (en) * | 2004-08-27 | 2006-04-06 | Showa Denko Kk | Substrate for magnetic disk and manufacturing method of magnetic disk |
WO2007119775A1 (en) * | 2006-04-14 | 2007-10-25 | Showa Denko K.K. | Method of processing glass base and rinse composition for glass base processing |
Also Published As
Publication number | Publication date |
---|---|
JP3857799B2 (en) | 2006-12-13 |
MY121041A (en) | 2005-12-30 |
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