JPH11170378A - Manufacture of minute-hole film using electron beam - Google Patents

Manufacture of minute-hole film using electron beam

Info

Publication number
JPH11170378A
JPH11170378A JP34142197A JP34142197A JPH11170378A JP H11170378 A JPH11170378 A JP H11170378A JP 34142197 A JP34142197 A JP 34142197A JP 34142197 A JP34142197 A JP 34142197A JP H11170378 A JPH11170378 A JP H11170378A
Authority
JP
Japan
Prior art keywords
electron beam
film
diameter
holes
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP34142197A
Other languages
Japanese (ja)
Other versions
JP3647009B2 (en
Inventor
Masaharu Asano
雅春 浅野
Hiroshi Ito
洋 伊藤
Masaru Yoshida
勝 吉田
Takeshi Suwa
武 諏訪
Tadao Seguchi
忠男 瀬口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Atomic Energy Agency
Original Assignee
Japan Atomic Energy Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Atomic Energy Research Institute filed Critical Japan Atomic Energy Research Institute
Priority to JP34142197A priority Critical patent/JP3647009B2/en
Publication of JPH11170378A publication Critical patent/JPH11170378A/en
Application granted granted Critical
Publication of JP3647009B2 publication Critical patent/JP3647009B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To form a large number of holes by a method wherein an electron beam narrowed down to the size of a diameter 0.2 nm-200 μm is cast on the surface of a film and then chemical etching is applied to the surface. SOLUTION: In a method for manufacturing a minute-hole film wherein a large number of holes are formed by casting an electron beam on the surface of the film and then by applying thereto chemical etching by an alkali solution, an acid solution, an oxidizing agent, etc., the electron beam having the energy of 20-2000 keV and a total current value of 10 μA-1 mA is narrowed down to the size of a diameter 0.2 nm 200 μm and cast.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属す技術分野】本発明は、0.2nm〜200
um径のサイズに絞った電子ビームを膜表面に照射後、
化学エッチング処理を施すことにより多数の孔を形成し
た微細孔膜の製造法に関するものである。
BACKGROUND OF THE INVENTION
After irradiating the film surface with an electron beam focused to the size of um diameter,
The present invention relates to a method for manufacturing a microporous film in which a large number of holes are formed by performing a chemical etching process.

【0002】[0002]

【従来の技術】高分子フィルムやコンタクトレンズに貫
通孔を形成させて機能性を付与するなどの付加価値を高
める技術は従来から種々の方法で行われている。たとえ
ば、高分子フィルムでは、精密ろ過膜や眼外ろ過膜など
の多孔性膜として広範な分野で応用されているが、この
ような多孔性膜の製造方法は、 高分子フィルムを延伸する機械的方法。 高分子の溶解度差を利用する化学的方法。 溶剤可溶の固体微粒子を混入後、溶出する方法。 焼結による方法、及び 気泡入り高分子シートの圧潰による方法などによっ
て行われている。
2. Description of the Related Art Various techniques have been used to increase added value, such as forming a through hole in a polymer film or a contact lens to impart functionality. For example, polymer films have been applied in a wide range of fields as porous membranes such as microfiltration membranes and extraocular filtration membranes. Method. A chemical method that utilizes the difference in solubility of polymers. A method in which solid fine particles soluble in a solvent are mixed and then eluted. It is performed by a method such as sintering or a method by crushing a bubbled polymer sheet.

【0003】また、近年では、高分子フィルムに原子炉
から発生した中性子を含む高エネルギーの荷電粒子(イ
オン)を照射して、ポリマー鎖が切断された飛跡を作
り、この飛跡をアルカリ性溶液や酸性溶液などを用いて
処理(エッチング)することによって多孔膜を得るエッ
チング法が提案されている(例えば、特公昭52−39
87号公報、特開昭54−11971号公報、特開昭5
4−117546号公報、及び特開平5−51479号
公報)。
In recent years, high-energy charged particles (ions) including neutrons generated from a nuclear reactor are irradiated on a polymer film to form a track in which a polymer chain is cut, and the track is converted into an alkaline solution or an acidic solution. An etching method for obtaining a porous film by processing (etching) using a solution or the like has been proposed (for example, Japanese Patent Publication No. 52-39).
No. 87, Japanese Patent Application Laid-Open No. 54-11971, Japanese Patent Application Laid-Open
4-117546 and JP-A-5-51479.

【0004】更にまた、コンタクトレンズでは、酸素透
過性を高めたり、涙液の通過を良くして、角膜の細胞呼
吸を妨げないようにするための手段として、放電、レー
ザー光線やイオン照射などによる穿孔化技術が提案され
ている(例えば、特開昭49−53451号公報、特開
昭49−75348号公報、特開昭58−29627号
公報、特開平1−500577号公報、特開平1−29
8312号公報、及び特開平5−19132号公報)。
Further, in contact lenses, as a means for increasing oxygen permeability or improving tear passage so as not to hinder cell respiration of the cornea, perforation by discharge, laser beam or ion irradiation, etc. For example, Japanese Patent Application Laid-Open Nos. 49-53451, 49-75348, 58-29627, 1-500577, and 1-29 have been proposed.
8312, and JP-A-5-19132).

【0005】[0005]

【発明が解決しようとする課題】精密ろ過膜や限外ろ過
膜などの多孔性膜の製造方法で行われる穿孔化技術で得
られるものは、三次元網目状、独立気泡型、連通型など
の不規則な孔を有するものや連続的に孔径が変わるもの
など多種多様であり、その孔径も不均一である。
What is obtained by a perforation technique performed in a method for producing a porous membrane such as a microfiltration membrane or an ultrafiltration membrane is a three-dimensional mesh, a closed-cell type, a communicating type or the like. There are various types such as those having irregular pores and those having continuously changing pore diameters, and the pore diameters are also non-uniform.

【0006】また、イオン照射後、化学エッチング処理
により多孔膜を製造する穿孔化技術では、孔径が均一で
ほぼ完全な円筒状の孔を有する膜を得ることができる
が、孔の位置や孔の形状コントロールはできない。しか
も、そのイオン照射装置は大型であり、高価なものにな
り、その操作も容易でない。
In the perforation technique for producing a porous film by chemical etching after ion irradiation, a film having a uniform hole diameter and a substantially perfect cylindrical hole can be obtained. Shape control is not possible. Moreover, the ion irradiation device is large and expensive, and its operation is not easy.

【0007】さらに、レーザー光線による穿孔化技術で
は、孔の位置、大きさ、形状、数などのコントロールに
難があり、再現性の面で問題がある。この場合、孔径は
500μm以上になり、それ以下の微細孔を作ることは
不可能である。
Further, in the perforation technique using a laser beam, it is difficult to control the position, size, shape, number, etc. of the holes, and there is a problem in reproducibility. In this case, the pore diameter becomes 500 μm or more, and it is impossible to produce fine pores smaller than 500 μm.

【0008】したがって、本発明の目的は孔の位置、大
きさ、形状、数などがコントロールされた均一の孔を有
する微細孔膜を製造するところにある。具体的には、こ
こで言う微細孔膜はナノメーターサイズ(nm)からマ
イクロメーターサイズ(μm)の孔径をもつ膜である。
Accordingly, an object of the present invention is to produce a microporous film having uniform holes in which the positions, sizes, shapes, numbers, etc. of the holes are controlled. Specifically, the microporous membrane referred to here is a membrane having a pore size from nanometer size (nm) to micrometer size (μm).

【0009】本発明の微細孔化技術と似ているのにイオ
ン照射後、化学エッチング処理を施すことによって孔を
形成させるエッチング法による穿孔化技術がある。この
技術は膜表面にエネルギーをもったアルゴンイオン、ク
リプトンイオン、キセノンイオン、金イオン、ウランイ
オンなどの重イオンを照射し、その後水酸化ナトリウ
ム、水酸化カリウムなどのアルカリ性溶液中に照射した
膜を浸潰することによって孔を形成するものである。こ
れによって、孔径が均一でほぼ完全な円筒状の孔を有す
る膜を得ることができる。
Similar to the microporation technique of the present invention, there is a perforation technique by an etching method in which holes are formed by performing a chemical etching treatment after ion irradiation. This technology involves irradiating the film surface with heavy ions such as argon ions, krypton ions, xenon ions, gold ions, and uranium ions that have energy, and then irradiating the film in an alkaline solution such as sodium hydroxide or potassium hydroxide. The holes are formed by immersion. As a result, a membrane having a substantially perfect cylindrical hole with a uniform hole diameter can be obtained.

【0010】しかし、この技術ではイオン一個一個をコ
ントロールして照射する方法でないためにエッチングに
よって出現した孔は重なりあったり、離れたりして、孔
の位置がバラバラである(不均一分布)。しかも、孔の
形状は円柱状のみであり、イオンの選択およびその調整
などのテクニックを用いても形状を変えることはできな
い。
[0010] However, in this technique, the holes generated by etching overlap or separate, and the positions of the holes are uneven (non-uniform distribution) because the irradiation is not a method of controlling and irradiating each ion individually. Moreover, the shape of the hole is only cylindrical, and the shape cannot be changed even by using techniques such as selection and adjustment of ions.

【0011】[0011]

【課題を解決するための手段】そこで、これらの問題点
を解決するために、イオンビームに代わる電子ビームを
用いた穿孔化技術を確立した。電子ビーム装置はイオン
照射装置に比べて小型であり、操作も容易である。この
電子ビームを用いた膜の穿孔化は膜表面に電子線ビーム
を照射後、化学エッチング処理によって行うものであ
り、重イオンに比べて物質に与えるダメージが極端に低
い電子線を用いたところに特徴がある。
In order to solve these problems, a perforation technique using an electron beam instead of an ion beam has been established. The electron beam device is smaller and easier to operate than the ion irradiation device. This perforation of the film using an electron beam is performed by irradiating the film surface with an electron beam and then performing a chemical etching process.When the electron beam is used, the damage to a substance is extremely low compared to heavy ions. There are features.

【0012】即ち、本発明は、膜の表面に電子ビームを
照射した後に、アルカリ溶液、酸性溶液、酸化剤などに
よる化学エッチング処理を施すことによって多数の孔を
形成する微細孔膜を製造する方法であり、その電子ビー
ム照射は、20〜2000keVのエネルギー、10μ
A〜1mAの総電流値をもつ電子ビームを0.2nm〜
200μm径のサイズに絞って照射することによって行
われる。
That is, the present invention provides a method for producing a microporous film in which a large number of holes are formed by irradiating an electron beam on the surface of the film and then performing a chemical etching treatment with an alkaline solution, an acidic solution, an oxidizing agent or the like. The electron beam irradiation has an energy of 20 to 2000 keV,
An electron beam having a total current value of A to 1 mA
The irradiation is performed by irradiating with a diameter of 200 μm.

【0013】[0013]

【発明の実施の形態】もともとこのエッチング法は高エ
ネルギーの荷電粒子(イオン)を照射して、ポリマー鎖
が切断された飛跡を作り、この飛跡をアルカリ性溶液や
酸性溶液などを用いて処理(エッチング)することによ
って多孔膜を得る方法である。したがって、ここでのイ
オン照射の役割が、ポリマー鎖を切断するためのもので
あることから、照射されたイオンが物質に対してどの程
度のダメージを与えたかによって、エッチング処理後の
孔形成は決まる。一般的には、ポリマー鎖の切断の程度
(物質に対するダメージの大きさ)は重いイオンほど、
またエネルギーの低いイオンほど大きい。
DETAILED DESCRIPTION OF THE INVENTION Originally, this etching method irradiates high-energy charged particles (ions) to form a track in which a polymer chain is cut, and treats the track using an alkaline solution or an acidic solution (etching). ) To obtain a porous membrane. Therefore, since the role of ion irradiation here is to cut the polymer chain, pore formation after the etching process is determined by how much the irradiated ions damage the substance. . Generally, the higher the degree of polymer chain breakage (the degree of damage to a substance),
Also, ions having lower energy are larger.

【0014】さらに、重イオンと電子では、イオンの方
が数千倍から数十万倍の大きさでダメージを与える。こ
のことは、電子線を単に膜表面に照射しても孔形成は不
可能であることを示している。どうすれば孔形成が可能
になるか。一つの考えは、重イオンと同じ効果(同じ程
度のダメージ)を与える量を照射してやることである。
そのためには、電子線のビーム径を絞って一点に集中し
て照射を行えば短時間照射でイオンと同じダメージ状態
を創ることができる。イオン照射装置と違って電子ビー
ム発生装置は容易にビーム径を絞ることができる。この
電子線ビームの照射技術とエッチング処理技術によっ
て、微細孔膜の製造が可能になった。
[0014] Furthermore, heavy ions and electrons cause damage by a factor of several thousand to several hundred thousand times. This indicates that holes cannot be formed simply by irradiating the film surface with an electron beam. How can pore formation be possible? One idea is to irradiate an amount that gives the same effect (same degree of damage) as heavy ions.
For this purpose, if the beam diameter of the electron beam is reduced and the irradiation is performed at a single point, the same damage state as the ions can be created in a short time. Unlike an ion irradiation device, an electron beam generator can easily reduce the beam diameter. With this electron beam irradiation technique and etching technique, it has become possible to produce a microporous film.

【0015】この場合、孔径は電子ビーム径とエッチン
グ処理条件のコントロールによって、ナノメーターサイ
ズ(nm)からマイクロメーターサイズ(μm)が可能
になった。また、孔の位置は照射サンプル台(ステー
ジ)の可動および電子ビームのスキャニングによって任
意に選択可能になった。更にまた、孔の形状は電子線ビ
ームのスキャニングによって任意の形、たとえば四角
形、菱形、楕円形などが可能になった。
In this case, the hole diameter can be changed from nanometer size (nm) to micrometer size (μm) by controlling the electron beam diameter and the etching condition. The position of the hole can be arbitrarily selected by moving the irradiation sample stage (stage) and scanning the electron beam. Further, the shape of the hole can be changed to an arbitrary shape, for example, a square, a rhombus, an ellipse, etc. by scanning the electron beam.

【0016】本発明において使用される膜は、一例とし
てポリエチレンテレフタレート、ポリジエチレングリコ
ールビスアリルカーボネート、ポリエチレン、ポリ塩化
ビニル、ポリ塩化ビニリデン、ポリフッ化ビニル、ポリ
フッ化ビニリデン、ポリステレン、ポリメチルメタクリ
レート、ポリイミド、ポリエーテルエーテルケトン、ポ
リエチレンナフタレートなどを挙げることができるが、
種類は問わない。
The membrane used in the present invention is, for example, polyethylene terephthalate, polydiethylene glycol bisallyl carbonate, polyethylene, polyvinyl chloride, polyvinylidene chloride, polyvinyl fluoride, polyvinylidene fluoride, polysterene, polymethyl methacrylate, polyimide, poly Ether ether ketone, polyethylene naphthalate and the like can be mentioned,
The type does not matter.

【0017】本発明において使用されるエッチング処理
剤の一例としては、水酸化ナトリウム、水酸化カリウム
などのアルカリ溶液、硫酸、硝酸などの酸性溶液、重ク
ロム酸カリウム、過マンガン酸カリウムなどの酸化剤な
どを挙げることができる。特に、重クロム酸カリウムの
硫酸溶液、過マンガン酸カリウムを含むアルカリ溶液、
次亜塩素酸ナトリウムのアルカリ溶液などの酸化性溶液
が好ましい。また、この酸化性溶液エッチング処理剤
に、アルコールや界面活性剤を添加したものも用いるこ
とができる。次に、本発明を実施例に基づいて具体的に
説明する。
Examples of the etching agent used in the present invention include alkaline solutions such as sodium hydroxide and potassium hydroxide, acidic solutions such as sulfuric acid and nitric acid, and oxidizing agents such as potassium dichromate and potassium permanganate. And the like. In particular, sulfuric acid solution of potassium dichromate, alkaline solution containing potassium permanganate,
An oxidizing solution such as an alkaline solution of sodium hypochlorite is preferred. Further, a product obtained by adding an alcohol or a surfactant to the oxidizing solution etching treatment agent can also be used. Next, the present invention will be specifically described based on examples.

【0018】[0018]

【実施例1〜2】12μmの厚さをもつポリエチレンテ
レフタレート(実施例1)と6μmの厚さをもつポリエ
チレンナフタレート(実施例2)のフィルムに 加速電
圧200KeV、総電流値100μAの電子ビームを1
μm径に絞って5秒間照射した。その後、照射フィルム
を6規定の水酸化ナトリウム水溶液中に漬けて、60
℃、1時間処理した。処理後、フィルムを水洗し、乾燥
させて電子顕微鏡観察したところ、各々円柱状の貫通孔
が得られた。結果 ボリエチレンテレフタレート(実施例1)18μm径貫
通孔 ポリエチレンナフタレート(実施例2)6μm径貫通孔
Examples 1 and 2 An electron beam having an accelerating voltage of 200 KeV and a total current value of 100 μA was applied to a film of polyethylene terephthalate having a thickness of 12 μm (Example 1) and a film of polyethylene naphthalate having a thickness of 6 μm (Example 2). 1
Irradiation was performed for 5 seconds with a diameter of μm. Thereafter, the irradiated film is immersed in a 6N aqueous sodium hydroxide solution,
C. for 1 hour. After the treatment, the film was washed with water, dried, and observed with an electron microscope. As a result, cylindrical through holes were obtained. Result Polyethylene terephthalate (Example 1) 18 μm diameter through hole Polyethylene naphthalate (Example 2) 6 μm diameter through hole

【0019】[0019]

【実施例3〜6】12μmの厚さをもつポリエチレンテ
レフタレートのフィルムに加速電圧200KeV、総電
流値100μAの電子ビームを0.4μm径(実施例
3)、lμm径(実施例4)、10μm径(実施例
5)、100μm径(実施例6)に絞って5秒間照射し
た。その後、照射フィルムを6規定の水酸化ナトリウム
水溶液中に漬けて、60℃、10分間処理した。処理
後、フィルムを水洗し、乾燥させて電子顕微鏡観察した
ところ、各々円柱状の貫通孔が得られた。 結果 0.4μmビーム径(実施例3)0.7μm径の貫通孔 1μmビーム径(実施例4)1.2μm径の貫通孔 10μmビーム径(実施例5)13μm径の貫通孔 100μmビーム径(実施例6)50μm径の貫通孔
Examples 3 to 6 An electron beam having an accelerating voltage of 200 KeV and a total current value of 100 μA was applied to a 12 μm thick polyethylene terephthalate film by a 0.4 μm diameter (Example 3), a 1 μm diameter (Example 4), and a 10 μm diameter. (Example 5) Irradiation was performed for 5 seconds while focusing on a 100 μm diameter (Example 6). Thereafter, the irradiated film was immersed in a 6N aqueous sodium hydroxide solution and treated at 60 ° C. for 10 minutes. After the treatment, the film was washed with water, dried, and observed with an electron microscope. As a result, cylindrical through holes were obtained. Result 0.4 μm beam diameter (Example 3) 0.7 μm diameter through hole 1 μm beam diameter (Example 4) 1.2 μm diameter through hole 10 μm beam diameter (Example 5) 13 μm diameter through hole 100 μm beam diameter Example 6) 50 μm diameter through-hole

【0020】[0020]

【実施例7】7μmの厚さをもつポリイミドのフィルム
に加速電圧200KeV、総電流値100μAの電子ビ
ームをlμm径に絞って5秒間照射した。その後、照射
フィルムを30%次亜塩素酸ナトリウムの6規定水酸化
ナトリウム溶液中に漬けて、60℃、1時間間処理し
た。処理後、フィルムを水洗し、乾燥させて電子顕微鏡
観察したところ、2μm径の円柱状の貫通孔が得られ
た。
EXAMPLE 7 An electron beam having an accelerating voltage of 200 KeV and a total current value of 100 μA was focused on a polyimide film having a thickness of 7 μm for 5 seconds with a diameter of 1 μm. Thereafter, the irradiated film was immersed in a 6% sodium hydroxide solution of 30% sodium hypochlorite and treated at 60 ° C. for 1 hour. After the treatment, the film was washed with water, dried, and observed with an electron microscope. As a result, a cylindrical through hole having a diameter of 2 μm was obtained.

【0021】[0021]

【発明の効果】本発明は、膜の表面に電子ビームを照射
した後に化学エッチング処理を施して多数の孔を形成す
る方法であるので、この孔の形成に、従来の重イオンを
用いた穿孔化技術に比べて処理対象物質に与えるダメー
ジが極端に低い電子線を用いることができ、また電子ビ
ーム装置という操作の容易な小型装置を使用することが
できる利点がある。
According to the present invention, since a large number of holes are formed by irradiating the surface of a film with an electron beam and then performing a chemical etching treatment, the hole is formed by using a conventional heavy ion. There is an advantage that it is possible to use an electron beam with extremely low damage to the substance to be treated as compared with the conversion technology, and to use a small-sized device such as an electron beam device which is easy to operate.

【0022】また、本発明は、膜の表面に電子ビームを
照射する際に、20〜2000keVのエネルギー、1
0μA〜1mAの総電流値をもつ電子ビームを0.2n
m〜200μm径のサイズに絞って照射することによっ
て、孔の位置、大きさ、形状、数などがコントロールさ
れた均一の孔を有する微細孔膜を製造することができる
利点がある。
Further, according to the present invention, when the surface of the film is irradiated with an electron beam, an energy of 20 to 2000 keV, 1
An electron beam having a total current value of 0 μA to 1 mA is 0.2 n
By irradiating with a diameter of m to 200 μm, there is an advantage that a microporous film having uniform holes in which the position, size, shape, number, and the like of the holes are controlled can be produced.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 諏訪 武 群馬県高崎市綿貫町1233番地 日本原子力 研究所高崎研究所内 (72)発明者 瀬口 忠男 群馬県高崎市綿貫町1233番地 日本原子力 研究所高崎研究所内 ──────────────────────────────────────────────────の Continued on the front page (72) Inventor Takeshi Suwa 1233 Watanukicho, Takasaki City, Gunma Prefecture Inside the Japan Atomic Energy Research Institute Takasaki Research Institute (72) Inventor Tadao Seguchi 1233 Watanukicho Takasaki City, Gunma Prefecture Japan Atomic Energy Research Institute Takasaki Research Inside

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 膜の表面に電子ビームを照射することに
よって多数の孔を形成することを特徴とする微細孔膜の
製造法。
1. A method for producing a microporous film, wherein a large number of holes are formed by irradiating the surface of the film with an electron beam.
【請求項2】 請求項1の膜に化学エッチング処理を施
すことを特徴とする微細孔膜の製造法。
2. A method for producing a microporous film, comprising subjecting the film of claim 1 to a chemical etching treatment.
【請求項3】 20〜2000keVのエネルギー、1
0μA〜1mAの総電流値をもつ電子ビームを0.2n
m〜200μm径のサイズに絞って照射することを特徴
とする微細孔膜の製造法。
3. Energy of 20 to 2000 keV, 1
An electron beam having a total current value of 0 μA to 1 mA is 0.2 n
A method for producing a microporous membrane, characterized in that irradiation is performed with a diameter of m to 200 μm.
JP34142197A 1997-12-11 1997-12-11 Manufacturing method of microporous membrane using electron beam Expired - Fee Related JP3647009B2 (en)

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JPH11170378A true JPH11170378A (en) 1999-06-29
JP3647009B2 JP3647009B2 (en) 2005-05-11

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008525180A (en) * 2004-12-22 2008-07-17 ドレセル プライヴェイト リミテッド Membrane card and method for producing and using the same
US7883930B2 (en) 2005-05-19 2011-02-08 Kabushiki Kaisha Toshiba Phase change memory including a plurality of electrically conductive bodies, and manufacturing method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008525180A (en) * 2004-12-22 2008-07-17 ドレセル プライヴェイト リミテッド Membrane card and method for producing and using the same
US7883930B2 (en) 2005-05-19 2011-02-08 Kabushiki Kaisha Toshiba Phase change memory including a plurality of electrically conductive bodies, and manufacturing method thereof

Also Published As

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