JPH11149467A - 規則検査のためのフレームワーク - Google Patents
規則検査のためのフレームワークInfo
- Publication number
- JPH11149467A JPH11149467A JP10244774A JP24477498A JPH11149467A JP H11149467 A JPH11149467 A JP H11149467A JP 10244774 A JP10244774 A JP 10244774A JP 24477498 A JP24477498 A JP 24477498A JP H11149467 A JPH11149467 A JP H11149467A
- Authority
- JP
- Japan
- Prior art keywords
- node
- elements
- nodes
- structures
- block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/32—Circuit design at the digital level
- G06F30/33—Design verification, e.g. functional simulation or model checking
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/36—Circuit design at the analogue level
- G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Geometry (AREA)
- Evolutionary Computation (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Complex Calculations (AREA)
- Information Retrieval, Db Structures And Fs Structures Therefor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US922793 | 1997-09-02 | ||
| US08/922,793 US5987237A (en) | 1997-09-02 | 1997-09-02 | Framework for rules checking |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH11149467A true JPH11149467A (ja) | 1999-06-02 |
| JPH11149467A5 JPH11149467A5 (enExample) | 2005-10-27 |
Family
ID=25447583
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10244774A Withdrawn JPH11149467A (ja) | 1997-09-02 | 1998-08-31 | 規則検査のためのフレームワーク |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US5987237A (enExample) |
| EP (1) | EP0901088A3 (enExample) |
| JP (1) | JPH11149467A (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6321365B1 (en) * | 1999-01-26 | 2001-11-20 | Hewlett-Packard Company | System and method for detecting storage nodes that are susceptible to charge sharing |
| US6701290B1 (en) * | 1999-02-18 | 2004-03-02 | Hewlett-Packard Development Company, L.P. | Method and apparatus for evaluating the design quality of network nodes |
| US7031889B1 (en) * | 1999-03-22 | 2006-04-18 | Hewlett-Packard Development Company, L.P. | Method and apparatus for evaluating the design quality of network nodes |
| US6367055B1 (en) * | 1999-04-27 | 2002-04-02 | Hewlett-Packard Company | Method and apparatus for determining certain characteristics of circuit elements |
| US6990643B1 (en) * | 1999-05-13 | 2006-01-24 | Hewlett-Packard Development Company, L.P. | Method and apparatus for determining whether an element in an integrated circuit is a feedback element |
| US6523152B1 (en) | 2000-03-08 | 2003-02-18 | Hewlett-Packard Company | Framework for rules checking utilizing resistor, nonresistor, node and small node data structures |
| US7082104B2 (en) | 2001-05-18 | 2006-07-25 | Intel Corporation | Network device switch |
| US7093224B2 (en) | 2001-08-28 | 2006-08-15 | Intel Corporation | Model-based logic design |
| US7107201B2 (en) | 2001-08-29 | 2006-09-12 | Intel Corporation | Simulating a logic design |
| US6983427B2 (en) | 2001-08-29 | 2006-01-03 | Intel Corporation | Generating a logic design |
| US7130784B2 (en) | 2001-08-29 | 2006-10-31 | Intel Corporation | Logic simulation |
| US6640329B2 (en) * | 2001-08-29 | 2003-10-28 | Intel Corporation | Real-time connection error checking method and process |
| US6859913B2 (en) | 2001-08-29 | 2005-02-22 | Intel Corporation | Representing a simulation model using a hardware configuration database |
| US7073156B2 (en) | 2001-08-29 | 2006-07-04 | Intel Corporation | Gate estimation process and method |
| US7197724B2 (en) | 2002-01-17 | 2007-03-27 | Intel Corporation | Modeling a logic design |
| US6631506B1 (en) * | 2002-04-02 | 2003-10-07 | Hewlett-Packard Development Company, L.P. | Method and apparatus for identifying switching race conditions in a circuit design |
| US7489139B2 (en) | 2004-02-25 | 2009-02-10 | Panasonic Corporation | System and method for checking decoupling of power supply in printed wiring board |
| US7900178B2 (en) * | 2008-02-28 | 2011-03-01 | International Business Machines Corporation | Integrated circuit (IC) design method, system and program product |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4858146A (en) * | 1986-08-13 | 1989-08-15 | The Babcock & Wilcox Company | Automated design of structures using a finite element database |
| US5289567A (en) * | 1991-04-01 | 1994-02-22 | Digital Equipment Corporation | Computer apparatus and method for finite element identification in interactive modeling |
| JP2788820B2 (ja) * | 1991-08-30 | 1998-08-20 | 三菱電機株式会社 | シミュレーション装置 |
| US5394524A (en) * | 1992-08-07 | 1995-02-28 | International Business Machines Corporation | Method and apparatus for processing two graphics data streams in parallel |
| DE69327389T2 (de) * | 1992-10-29 | 2000-06-15 | Altera Corp., San Jose | Verfahren zum Prüfen von Entwürfen für programmierbare Logikschaltungen |
| US5522022A (en) * | 1993-11-24 | 1996-05-28 | Xerox Corporation | Analyzing an image showing a node-link structure |
| US5787274A (en) * | 1995-11-29 | 1998-07-28 | International Business Machines Corporation | Data mining method and system for generating a decision tree classifier for data records based on a minimum description length (MDL) and presorting of records |
| US5802508A (en) * | 1996-08-21 | 1998-09-01 | International Business Machines Corporation | Reasoning with rules in a multiple inheritance semantic network with exceptions |
-
1997
- 1997-09-02 US US08/922,793 patent/US5987237A/en not_active Expired - Fee Related
-
1998
- 1998-08-21 EP EP98306711A patent/EP0901088A3/en not_active Withdrawn
- 1998-08-31 JP JP10244774A patent/JPH11149467A/ja not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| EP0901088A2 (en) | 1999-03-10 |
| EP0901088A3 (en) | 2002-03-20 |
| US5987237A (en) | 1999-11-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH11149467A (ja) | 規則検査のためのフレームワーク | |
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| Seth et al. | Gutting chip-testing costs: Designing VLSI circuits for testability is the most efficient way to reduce the relative costs of assuring high chip reliability | |
| Dahlgren et al. | Efficient modeling of switch-level networks containing undetermined logic node states | |
| US7747972B2 (en) | Methods and apparatuses for timing analysis of electronic circuits | |
| Shukoor et al. | Diagnostic test set minimization and full-response fault dictionary | |
| US6321365B1 (en) | System and method for detecting storage nodes that are susceptible to charge sharing | |
| Lioy | Adaptative backtrace and dynamic partitioning enhance ATPG (IC testing) | |
| US6523152B1 (en) | Framework for rules checking utilizing resistor, nonresistor, node and small node data structures | |
| US6539346B1 (en) | Method for the electric dynamic simulation of VLSI circuits | |
| JP2006313133A (ja) | 集積回路の故障診断方法および故障診断装置、素子レベルの故障候補特定システム、並びに、集積回路の故障診断プログラムおよび該プログラムを記録した媒体 | |
| JPH11274023A (ja) | 半導体装置の信頼性評価方法及び半導体装置の信頼性評価プログラムを記録したコンピュータ読み取り可能な記録媒体 | |
| US6990643B1 (en) | Method and apparatus for determining whether an element in an integrated circuit is a feedback element | |
| US6484295B1 (en) | Electrical rules checker system and method providing quality assurance of tri-state logic | |
| Miyase et al. | On improving defect coverage of stuck-at fault tests | |
| Jinling et al. | A fault simulation method based on mutated truth table of logic gates | |
| Renovell et al. | Improving defect detection in static-voltage testing | |
| US7698079B2 (en) | Characterizing across-die process variation | |
| Jenihhin et al. | PSL Assertion Checking Using Temporally Extended High-Level Decision Diagrams |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050819 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050819 |
|
| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20051208 |