JPH1114558A - Measuring method for surface resistance - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a measuring method, for the surface resistance of a conductor, in which the surface resistance can be measured simply and with high accuracy in a high-frequency region. SOLUTION: A process is installed in such a way that a first dielectric 5a whose height is H and which is composed of a dielectric material is arranged and installed between one pair of conductors 1a, 1b which are arranged and installed at a prescribed interval of H, that a first standard resonator R1 is formed and that a resonance frequency f1 and no-loads Q, Q1 are measured on the basis of a resonance waveform generated by the first standard resonator R1 . A process is installed in such a way that a second dielectric 5b whose height is smaller than H and which is composed of the same material as the first dielectric 5a is arranged and installed between a pair of conductors which are arranged and installed at a prescribed interval of H, that a second standard resonator R2 is formed and that a resonance frequency f2 and no-loads Q, Q2 are measured on the basis of a resonance waveform generated by the second standard resonator R2 . The surface resistance of the conductors 1a, 1b is computed on the basis of the resonance frequencies f1 , f2 and then n-loads Q, Q1 , Q2 which are measured by the first and second standard resonators R1 , R2 .

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for evaluating a dielectric property of a dielectric material in a high frequency range and a method for measuring a surface resistance of a conductor in a high frequency range.

[0002]

2. Description of the Related Art In recent years, attention has been paid to millimeter waves in order to cope with the spread of mobile communication and speeding up of communications, and various dielectric materials such as ceramics that can be used in the millimeter wave region have been actively developed. . Therefore, in order to evaluate the dielectric material, it is desired to establish a technique for easily and accurately measuring the complex permittivity (εr = ε′−jε ″) (j: imaginary unit) in the millimeter wave region. ing.

[0003] Usually, when measuring the complex permittivity in a high frequency region such as a microwave or a millimeter wave, the resonance characteristics of a measurement sample made of a dielectric material and a resonator constituted by a pair of conductors such as metals are measured. Therefore, a method of calculating a complex permittivity is used as a high-accuracy measuring method. When the dielectric loss tangent tan δ (= ε ″ / ε ′) of the measurement sample is obtained by this method, the surface resistance of the conductor, which is one component of the resonator, is used for the calculation of the dielectric loss tangent. Surface resistance must be measured.

[0004] The actual surface resistance of a conductor varies depending on the measurement frequency, and also varies depending on the degree of irregularities on the conductor surface. Therefore, it is necessary to measure the surface resistance at the measurement frequency before obtaining the dielectric loss tangent of the measurement sample.

A technique for measuring surface resistance in millimeter waves is described by Ishikawa et al. In "Measurement of Complex Permittivity of Millimeter-Wave Dielectric Material Using NRD Guide" (Transactions of the Institute of Electronics, Information and Communication Engineers, C-1, Vol. J78-). CI, No. 9, pp418
-429, September 1995) and Japanese Patent Application Laid-Open No.
No. 220159.

FIG. 6 shows the configuration of a standard resonator for surface resistance measurement in millimeter waves disclosed in these documents. 6, the surface resistance measuring resonator is cut out of the same dielectric material as a ring-shaped resonator 40 and a columnar resonator 41 cut out of the same dielectric material, and is cut out of a soft and the same dielectric material. And support tables 44 and 45 for keeping the positional relationship constant and preventing contact between the resonators 40 and 41 and the conductor plates 42 and 43.

[0007] The resonators 40 and 41 are electromagnetically coupled to each other to form an odd mode resonance peak at a frequency fodd and a frequency f
Even has an even mode resonance peak. Due to the difference in the magnetic field distribution between the two modes, the current density in the odd mode is stronger than that in the even mode on the surfaces of the conductor plates 42 and 43, and the conductor loss in the odd mode is larger than the conductor loss in the even mode. Therefore, the odd-mode no-load Q, Qodd is the even-mode no-load Q,
Smaller than Qeven. The Qodd and Qeven are measured, and the difference is used to calculate the surface resistance.

[0008]

However, in the surface resistance measurement method for millimeter waves disclosed in these documents, since the difference between the odd-mode conductor loss and the even-mode conductor loss is small, the odd-mode no-load Q, The difference between Qodd and the no-load Q and Qeven in the even mode is small. Therefore, there is a problem that the measurement accuracy of the surface resistance is low.

Therefore, an object of the present invention is to solve the above-mentioned technical problems and to provide a method capable of measuring surface resistance with high accuracy.

[0010]

The inventor of the present invention has studied the above-mentioned problems, and as a result, has found that a pair of conductors disposed at a predetermined distance H are formed of a dielectric material having a height H between the pair of conductors. 1
Are disposed to form a first standard resonator, and the first standard resonator is formed.
The resonance frequency f ₁ and the no-load Q, Q ₁ are measured by measuring the resonance waveform generated by the standard resonator of the above, and the height between the pair of conductors wired at a predetermined interval H is higher than H A second dielectric made of the same material as the small first dielectric is provided to form a second standard resonator, and resonance is measured by measuring a resonance waveform generated by the second standard resonator. The frequency f ₂ and the no-load Q, Q ₂ are measured, and the resonance frequency f ₁ measured by the first and second standard resonators,
f ₂ and unloaded Q, based on Q _1, Q _2, by calculating the surface resistivity of the conductor, in which it has been found that can measure the surface resistivity with high accuracy.

That is, according to the above method of the present invention, the first dielectric having the first dielectric having the same height as the distance H between the conductors is provided.
The first standard resonator is designed to have a smaller unloaded Q than the first standard resonator at the same or close frequency as the first standard resonator. Measuring a resonance waveform generated by a second standard resonator including a second dielectric having a height smaller than a spacing H between conductors, the second standard resonator being made of a dielectric material having the same complex permittivity as the standard resonator of Since the difference in the no-load Q obtained from the resonance waveform can be set to be larger than that in the conventional method, the accuracy of the surface resistance value of the conductor calculated based on the difference in the no-load Q can be improved.

[0012]

DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic view for explaining an example of a measuring jig used to measure the surface resistance according to the present invention, wherein (a) is a plan view and (b) is a plan view. It is XX sectional drawing. According to FIG. 1, the measuring jig comprises a pair of circular metal conductor plates 1a and 1b for measuring surface resistance, and the conductor plates 1a and 1b are detachably attached to the conductor plates 1a and 1b.
Are provided with conductive plate supporting members 2a and 2b made of metal for supporting the members in parallel with a predetermined interval H. Then, a standard dielectric is formed by arranging a predetermined dielectric between the conductor plates 1a and 1b.

Input / output ports 3a, 3b are attached to ends of the conductor plate supporting members 2a, 2b, and the input / output ports 3a, 3b are made of a dielectric material having a predetermined dielectric constant. The dielectric strips 4a and 4b are connected. The conductive plates 1a and 1b, the conductive plate support portions 2a and 2b, and the available ports 3a and 3b are all formed by processing a metal material such as copper into a predetermined shape.

The dielectric strips 4a and 4b are formed of a low-loss material in the millimeter wave band, for example, Teflon (PTFE) having a relative dielectric constant of 2.0, and have a width of 2.5 mm and a high width generally used in the 60 GHz band. It is formed in a shape of 2.25 mm in length. The dielectric strips 4a and 4b are composed of conductive plates 1a and 1b made of metal on the top and bottom, and conductive plate support members 2a and 2b.
b, and the right and left sides thereof are symmetrically surrounded by the atmosphere. Therefore, the dielectric strips 4a and 4b, the conductor plates 1a and 1b, and the conductor plate support portions 2a and 2b are used to provide a non-radiative dielectric line (NRD guide). Is formed.

The other ends of the dielectric strips 4a and 4b are separated from the standard resonator formed by the dielectric provided between the conductor plates 1a and 1b by a predetermined distance M so as to be magnetically coupled. It is extended to the position.

Since a waveguide is usually used for the transmission path of the millimeter wave band measurement system, the input / output ports 3a, 3b
Has a well-known structure that functions as a converter between the waveguide and the non-radiative dielectric line. Such a structure is specifically described in JP-A-8-70209 and JP-A-7-140186.

According to the present invention, in the above-mentioned measuring jig, a resonator is constituted by the conductor plates 1a, 1b and the dielectric 5 by disposing the dielectric 5 between the conductor plates 1a, 1b.

FIG. 2 is a block diagram showing one embodiment of the entire configuration of the measuring system in the measuring method of the present invention.
According to FIG. 2, the high-frequency signal output from the synthesized sweeper is amplified by the microwave amplifier and converted to the millimeter wave by the millimeter wave module. The millimeter wave signal is split into two, one of which is input to a network analyzer as a reference. The other is configured so that a signal input to a measurement jig and transmitted therethrough is input to a network analyzer.

FIG. 3 is a diagram showing one measurement example of the reference transmission characteristics and the direct coupling characteristics of the measuring jig according to the present invention and the results thereof.

As shown in FIG. 3 (a), the reference transmission characteristic is such that a dielectric strip 4c having a length of 14 mm is interposed between dielectric strips 4a and 4b arranged at an interval of 14 mm.
This is the transmission characteristic when "." This reference transmission characteristic is used as a reference level of the measurement system.

On the other hand, the direct coupling characteristic is a transmission characteristic in a state where nothing is mounted between the dielectric strips 4a and 4b, as shown in FIG. From the results shown in FIG. 3, in this measurement system, the direct coupling is as small as −50 dB in the range of 56 GHz to 63 GHz, so that the resonance characteristics of the standard resonator can be measured in this frequency range, and the surface resistance can be measured based on the measurement. .

Next, the method of measuring the surface resistance of the present invention using the above-mentioned measuring jig and its principle will be described with reference to FIG.

The measuring method of the present invention, by utilizing a difference in magnetic field distribution, relatively conductor loss is small, in other words, the unloaded Q is higher TE _0M1 Mode Standard resonator, the TE _0M1
It has the same or close resonance frequency as the mode standard resonator, and has relatively large conductor loss.
Design a small TE _0Md mode Standard resonator, and requests the surface resistance of the conductive plate from the difference between the measured values of the unloaded Q of these TE _0M1 Mode Standard resonator and TE _0Md mode standard resonator. Subscripts 0md, 0m1,
In 0md, m is an integer of 1 or more, and 0md is
It means 0mδ.

That is, according to the present invention, as shown in FIG. 4A, for example, it is made of an arbitrary dielectric material such as alumina or sapphire and has the same height H as the interval H between the conductor plates 1a and 1b. It has a cylindrical dielectric 5a having a radius D _{1
Is provided} between the conductor plates 1a and 1b, so that TE _0m1
Form a _first standard resonator R1 of the mode.

Next, as shown in FIG. 4 (b), a circle having a radius D ₂ having the same material as that of the dielectric 5a and having a height H ′ smaller than the interval H between the conductor plates 1a and 1b. by installing a columnar dielectric 5b conductive plates 1a, between 1b, to form a second standard resonator R ₂ in TE _0Md mode.

[0026] Then, TE _0M1 first standard resonator R ₁ mode, TE second for a standard resonator R ₂ of _0md mode measures the resonance waveform, from the resonance waveform, respectively resonant frequency f _0M1, f _0md and no-load Q, Q _0m1 , Q
_{Measure 0md} . At this time, the unloaded Q of the second standard resonator TE _0Md mode, Q _0Md is unloaded Q of the first standard resonator TE _0M1 mode, the Q _0m1, Q _0md <Q
_0m1 . Also, the resonance frequencies f _0m1 , f
_0Md, like a _f 0m1 ≒ f _0md, is adjusted by the radius D ₂ of the dielectric 5b.

[0027] In this way, the resonance caused by the measured two standard resonator frequency _f 0m1, f _{0m d} and unloaded Q,
The surface resistance of the conductor plates 1a and 1b can be obtained by the finite element method using the difference between _Q0m1 and _Q0md .

More specifically _[0028], TE 0m1 first standard resonator modes R ₁ and TE _0Md second standard resonator R ₂ of the resonance frequency f of the mode _0m1, f _0md and unloaded _Q, Q 0m1, Q _0md
From the measured values, the number 1 below (1) (2) simultaneously calculates conductive plates 1a, 1b of the resonance frequency f _{0 m 1} ~f effective conductivity σ and dielectric loss tangent tanδ at the frequency of _0md by formula, the number 1 The surface resistance Rs of the conductor plates 1a and 1b at the frequencies f _{0m1 to} f _0md is _obtained from the equation (3).

[0029]

(Equation 1)

[0030] However, in general f / tan [delta = constant law micro, millimeter wave band, known as an empirical rule in the ion binding of the dielectric material is established exactly at the frequency f _0M1 and f _{0 m d} close Therefore, f _0m1 / tanδ _0m1
= F _0md / tan δ _0md . The effective conductivity σ is
The frequencies f _0m1 and f _0md are close to each other.

In Equation 1, μ is the magnetic permeability of the conductor plates 1a and 1b, and ω (= 2πf) is the angular frequency. Also, Equation 1
The coefficients A _0m1 , A _0md and B _0m1 , B _0md in the middle are calculated from (4), (5), (6), and (7) in _Equation 2.

[0032]

(Equation 2)

A _0m1 and B _0m1 were obtained by analytical integral calculation, and A _0md and B _0md were calculated by the axisymmetric finite element method. By comparison with the analytical solution of a 60 GHz TE ₀₂₁ resonator, the calculation error of the resonance frequency (f ₀ ) of the finite element method is about 0.07%, and the calculation error of the no-load Q (Q _u ) is 0.2 %. These calculation errors are values that do not affect the measured value of the surface resistance.

[0034]

Next, a first standard resonator R _{1 in the} TE _0m1 mode will be described.
And TE second standard resonator R ₂ resonant waveform and the conductor plate 1a of _0md mode, an example of measurement results of the surface resistivity of 1b will be described.

Embodiment 1 First, as a dielectric, a sapphire formed of a cylindrical body whose end face is machined so as to be perpendicular to the c-axis is sandwiched by a conductive plate made of copper, and a TE _0m1 mode first standard resonator is formed. FIG. 5 shows the resonance waveform of the second standard resonator. Then, based on these resonance waveforms, the resonance frequency f
₀ , no-load Q and Qu were obtained, and the specific conductivity σr and surface resistance Rs of the conductive plate were obtained from the data. The results are shown in Table 1.
It was shown to. Here, the specific conductivity σr is a value obtained by standardizing the effective conductivity with a conductivity of copper of 5.8 × 10 ⁷ (1 / Ω · m) in direct current.

Table 1 also shows the diameter D, height H, relative permittivity ε ', and dielectric loss tangent tan δ of the sapphire dielectric used.

Example 2 Next, the specific conductivity σr was exactly the same as in Example 1 except that alumina was used instead of sapphire as the dielectric.
And the surface resistance Rs were determined. The results are shown in Table 1.
Table 1 shows the diameter D, height H, relative dielectric constant ε ′, and dielectric loss tangent tan δ of the alumina dielectric used together.

[0038]

[Table 1]

As is clear from the results shown in Table 1, the values of the surface resistance Rs obtained from the standard resonator formed of sapphire and the standard resonator formed of alumina agree within an error range. As a result, reproducibility by the method of measuring the surface resistance of the present invention and a highly accurate value with an error of ± 3.1 mΩ or less were obtained.

[0040]

As described above in detail, the method for measuring surface resistance according to the present invention measures the surface resistance from the difference between the no-load Q measured from the resonance waveforms generated by two standard resonators having different resonance modes. Therefore, the surface resistance value can be obtained with high accuracy. As a result, using this surface resistance value,
High-precision measurement is also possible in the evaluation of dielectric properties such as millimeter-wave resonator materials.

[Brief description of the drawings]

FIG. 1 is a diagram showing a configuration of a jig for measuring surface resistance according to one embodiment of the present invention.

FIG. 2 is a block diagram showing an overall configuration of a surface resistance measuring system according to the present invention.

FIG. 3 is a diagram showing a reference transmission characteristic and a direct coupling characteristic of a measuring jig according to the present invention.

FIG. 4 is a diagram showing a structure of a standard resonator used in the present invention.

[Figure 5] is a diagram showing the obtained resonance waveform by standard resonator using sapphire dielectric is due to (a) is TE ₀₂₁ mode, (b) is a TE _02d mode resonator.

FIG. 6 is a diagram showing a configuration of a conventional standard resonator for measuring surface resistance.

[Explanation of symbols]

1a, 1b Conductor plate 2a, 2b Conductor plate support member 3a, 3b Input / output port 4a, 4b Dielectric strip 5a, 5b Dielectric R ₁ First standard resonator R ₂ Second standard resonator

Claims (1)

[Claims] 1. A first standard resonator is formed by disposing a first dielectric made of a dielectric material having a height H between a pair of conductors disposed at a predetermined interval H, and forming a first standard resonator. Measuring the resonance frequency f ₁ and the no-load Q, Q ₁ from the resonance waveform generated by the standard resonator of claim 1; A second dielectric made of the same material as the first dielectric is provided to form a second standard resonator, and a resonance frequency f ₂ and a resonance frequency f _{2 are obtained} from a resonance waveform generated by the second standard resonator. load Q, a step of measuring the Q _2, the first and second resonant frequencies f _1, which is measured by a standard resonator, f ₂ and unloaded Q, based on Q _1, Q _2, the surface resistance of the conductor Calculating the surface resistance.