JPH1038772A - Measuring method for liquid sample, sample holder and x-ray diffractometer therefor - Google Patents
Measuring method for liquid sample, sample holder and x-ray diffractometer thereforInfo
- Publication number
- JPH1038772A JPH1038772A JP8190627A JP19062796A JPH1038772A JP H1038772 A JPH1038772 A JP H1038772A JP 8190627 A JP8190627 A JP 8190627A JP 19062796 A JP19062796 A JP 19062796A JP H1038772 A JPH1038772 A JP H1038772A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample holder
- ray
- container
- ray diffraction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
- Devices For Use In Laboratory Experiments (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明は、液状試料の測定
方法とそれに用いる試料ホルダおよびX線回折装置に関
する。The present invention relates to a method for measuring a liquid sample, a sample holder used for the method, and an X-ray diffractometer.
【0002】[0002]
【従来の技術】X線回折によって固体試料を分析する方
法には粉末X線回折法があり、図6に示すような試料ホ
ルダが用いられている。図6は従来の試料ホルダの斜視
図であり、試料ホルダ31は、X線照射される測定面に
凹部31aを有し、前記凹部31aには粉末試料が充填
成形されて試料を薄い板状にして測定する。この試料ホ
ルダ31は、アルミニウム製で、測定時には図6に示す
とおり立てた状態にして用いられる。2. Description of the Related Art There is a powder X-ray diffraction method for analyzing a solid sample by X-ray diffraction, and a sample holder as shown in FIG. 6 is used. FIG. 6 is a perspective view of a conventional sample holder. The sample holder 31 has a concave portion 31a on the measurement surface to be irradiated with X-rays, and the concave portion 31a is filled with a powder sample and formed into a thin plate shape. And measure. The sample holder 31 is made of aluminum and is used in an upright state as shown in FIG. 6 during measurement.
【0003】前記試料ホルダでは、液状の試料を測定す
ることができず、液状を乾燥等により粉末化して測定し
ている。例えば、セラミックの製造方法で、原料の混合
・粉砕時や仮焼後の混合・粉砕で、溶剤やバインダーを
混合する湿式混合法があり、溶剤やバインダーを混合し
たセラミックスラリー内のセラミック粉末の結晶状態か
ら、混合・粉砕時間を決定している。図6に示す試料ホ
ルダ31では粉末状態のものしか測定できないため、乾
燥蒸発等によりセラミックスラリーから溶剤やバインダ
ーを除去し、粉末状態にして測定していた。[0003] In the sample holder, a liquid sample cannot be measured, but the liquid is powdered by drying or the like for measurement. For example, in a method for producing ceramics, there is a wet mixing method in which a solvent and a binder are mixed during mixing and pulverization of raw materials and after mixing and pulverization after calcination, and a crystal of ceramic powder in a ceramic slurry in which a solvent and a binder are mixed is used. The mixing / crushing time is determined from the state. Since the sample holder 31 shown in FIG. 6 can measure only a powder state, the solvent and binder were removed from the ceramic slurry by dry evaporation or the like, and the measurement was performed in a powder state.
【0004】[0004]
【発明が解決しようとする課題】しかし、セラミックス
ラリーから溶剤やバインダーを除去するには、時間を要
し、一試料の測定時間が長くなるという問題があった。
また、スラリー状態と粉末状態でセラミック粉末の結晶
構造が変化するものや、乾燥蒸発中に反応が促進するも
のがあり、スラリー状態でのセラミック粉末の結晶構造
を正確に測定できないという問題があった。さらに、粉
砕中の結晶の歪みを評価して粉砕時間を決定する場合、
溶剤やバインダーの除去に数時間を要し、粉砕時間を決
定するまでに時間がかかり、分析期間が長くなる要因と
なっていた。However, it takes a long time to remove the solvent and the binder from the ceramic slurry, and there is a problem that the measurement time of one sample becomes long.
In addition, there is a problem that the crystal structure of the ceramic powder changes between the slurry state and the powder state, and that the reaction is accelerated during drying and evaporation, so that the crystal structure of the ceramic powder in the slurry state cannot be measured accurately. . In addition, when evaluating the distortion of the crystal during grinding to determine the grinding time,
It took several hours to remove the solvent and the binder, and it took a long time to determine the pulverization time, which was a factor of lengthening the analysis period.
【0005】液状の試料を測定できる試料ホルダやX線
回折装置もあるが、比重の異なる物質が含まれている
と、比重差により液の上下相において成分分布が経時的
に変化するため、測定結果が不正確になるという欠点を
有していた。例えば、セラミックスラリーの場合、測定
時間の長時間化に伴い、セラミックスラリー内のセラミ
ック原料粉やセラミック仮焼粉が沈降し、溶剤やバイン
ダーが多く含まれた相とセラミック原料粉やセラミック
仮焼粉が多く含まれた相に分離して、測定結果がばらつ
いていた。There are sample holders and X-ray diffractometers that can measure liquid samples. However, if substances having different specific gravities are contained, the component distribution in the upper and lower phases of the liquid changes with time due to the difference in specific gravity. It had the disadvantage of inaccurate results. For example, in the case of ceramic slurry, as the measurement time becomes longer, the ceramic raw material powder and ceramic calcined powder in the ceramic slurry settle, and the phase containing a large amount of solvent and binder and the ceramic raw material powder and ceramic calcined powder Was separated into phases containing a large amount of, and the measurement results varied.
【0006】この発明の目的は、前記問題点を解決する
ものであり、比重の異なる物質を含む液状試料の正確な
測定を実現し、迅速で測定値の精度が向上する液状試料
の測定方法とそれに用いる試料ホルダおよびX線回折装
置を堤供することにある。SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems, and a method for measuring a liquid sample which realizes accurate measurement of a liquid sample containing substances having different specific gravities and which is quick and has improved accuracy of measured values. An object of the present invention is to provide a sample holder and an X-ray diffractometer for use therein.
【0007】[0007]
【課題を解決するための手段】すなわち、第1の発明
は、所定の試料にX線を照射し、試料により回折された
X線の強度を測定して物質の分析を行うX線回折にあた
り、試料測定面と重力方向とが平行の粉末X線回折装置
を用いて、試料ホルダに比重の異なる物質を含む液状試
料を充填、密閉し、前記試料ホルダを3回/秒以下(但
し、0は除く)の回転速度で回転させ、これにより前記
試料ホルダ内の前記液状試料を強制的に攪拌し前記液状
試料を均質化する液状試料の測定方法である。That is, a first aspect of the present invention relates to X-ray diffraction in which a predetermined sample is irradiated with X-rays, the intensity of the X-ray diffracted by the sample is measured, and the substance is analyzed. A sample holder is filled with a liquid sample containing a substance having a different specific gravity and sealed using a powder X-ray diffractometer having a sample measurement surface parallel to the direction of gravity, and the sample holder is closed three times / second or less (where 0 is This is a method for measuring a liquid sample in which the liquid sample in the sample holder is forcibly agitated to thereby homogenize the liquid sample.
【0008】また、第2の発明は、前記液状試料が、セ
ラミック粉末を含むセラミックスラリーである液状試料
の測定方法である。The second invention is a method for measuring a liquid sample, wherein the liquid sample is a ceramic slurry containing ceramic powder.
【0009】また、第3の発明は、液状試料を密閉して
X線回折分析するための試料ホルダであって、中央部に
凹部を有する容器と、前記容器の凹部の開口面を覆う有
機膜と、前記有機膜を前記容器の凹部開口面に固定する
固定リングとからなる試料ホルダである。A third invention is a sample holder for sealing a liquid sample for X-ray diffraction analysis, comprising a container having a concave portion in the center, and an organic film covering an opening surface of the concave portion of the container. And a fixing ring for fixing the organic film to the opening surface of the concave portion of the container.
【0010】また、第4の発明は、前記有機膜が、ポリ
プロピレンのマイラー膜からなる試料ホルダである。A fourth invention is a sample holder in which the organic film is made of a polypropylene mylar film.
【0011】また、第5の発明は、前記試料ホルダが、
試料測定面と重力方向とが平行の粉末X線回折装置に用
いられることである。According to a fifth aspect of the present invention, the sample holder comprises:
This is to be used for a powder X-ray diffractometer in which the sample measurement surface and the direction of gravity are parallel.
【0012】また、第6の発明は、所定の試料にX線を
照射し、試料により回折されたX線の強度を測定して物
質の分析を行うX線回折にあたり、X線源部と、X線検
出部と、ゴニオメータ部と、前記ゴニオメータを回転さ
せる第1の駆動部と、試料ホルダと、前記試料ホルダを
保持する支持部と、前記試料ホルダを回転させる第2の
駆動部とを備え、前記第1の駆動部の回転軸と前記第2
の駆動部の回転軸が互いに直交しているX線回折装置で
ある。According to a sixth aspect of the present invention, there is provided an X-ray diffraction apparatus for irradiating a predetermined sample with X-rays, measuring the intensity of the X-ray diffracted by the sample, and analyzing a substance, wherein an X-ray source unit includes: An X-ray detection unit, a goniometer unit, a first drive unit that rotates the goniometer, a sample holder, a support unit that holds the sample holder, and a second drive unit that rotates the sample holder , The rotation axis of the first drive unit and the second
Are X-ray diffraction apparatuses in which the rotation axes of the driving units are orthogonal to each other.
【0013】また、第7の発明は、前記X線回折装置に
用いる試料ホルダが、中央部に凹部を有する容器と、前
記容器の凹部の開口面を覆う有機膜と、前記有機膜を前
記容器の凹部開口面に固定する固定リングとからなるX
線回折装置である。According to a seventh aspect of the present invention, the sample holder used in the X-ray diffractometer has a container having a concave portion at the center, an organic film covering an opening surface of the concave portion of the container, and X comprising a fixing ring fixed to the opening surface of the concave portion of
It is a line diffraction device.
【0014】また、第8の発明は、前記試料ホルダが、
3回/秒以下(但し、0は除く)の回転速度で回転して
いるX線回折装置である。According to an eighth aspect of the present invention, the sample holder comprises:
The X-ray diffractometer rotates at a rotation speed of 3 times / second or less (excluding 0).
【0015】[0015]
【発明の実施の形態】以下、この発明の測定方法および
試料ホルダと装置を図面に基づいて説明する。図1は、
この発明の試料ホルダを示す図であり、(a)は分解斜
視図、(b)は測定時の外観斜視図、(c)は(b)の
A−A線における拡大断面図である。試料ホルダ1は、
中央部に凹部2aを有する容器2と、その凹部2aの開
口面を覆う有機膜3と、その有機膜3を容器2の凹部2
aの開口面に固定する固定リング4とからなる。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A measuring method, a sample holder and an apparatus according to the present invention will be described below with reference to the drawings. FIG.
It is a figure which shows the sample holder of this invention, (a) is an exploded perspective view, (b) is an external appearance perspective view at the time of a measurement, (c) is an enlarged sectional view in the AA line of (b). The sample holder 1
A container 2 having a recess 2a in the center, an organic film 3 covering the opening surface of the recess 2a, and the organic film 3
and a fixing ring 4 to be fixed to the opening surface of FIG.
【0016】容器2は、孔2b,2cがあり、孔2bは
液状試料6を注入する孔であり、孔2cは液状試料6注
入時に凹部2aから空気を抜く孔である。液状試料6を
注入する孔2bと空気を抜く孔2cは、逆に用いてもよ
い。また、孔2b,2cは、X線回折測定時には、栓5
b,5cにより閉じられて、液状試料6の漏出を防ぎ、
凹部2aが密閉された空間になっている。前記栓5b,
5cは、容器2の孔2b,2cに嵌合するものであり、
その材質としては油脂系粘土等や有機物のゴムや金属等
からなる。その形状は嵌合するものであれば、塊やねじ
等であってもよい。有機膜3は、ポリプロピレンフィル
ムのマイラー膜からなり、容器2や固定リング4に沿っ
て自由な形状にできるものである。また、この有機膜3
は、X線の吸収が比較的小さく、感度を低下させること
なく、測定値の精度が低下しないものである。容器2と
固定リング4は、アルミニウムからなり、有機膜3を挟
んで嵌合される構造である。The container 2 has holes 2b and 2c. The hole 2b is a hole for injecting the liquid sample 6, and the hole 2c is a hole for removing air from the concave portion 2a when the liquid sample 6 is injected. The hole 2b for injecting the liquid sample 6 and the hole 2c for removing air may be used in reverse. The holes 2b and 2c are provided with plugs 5 during X-ray diffraction measurement.
b, 5c to prevent leakage of the liquid sample 6,
The recess 2a is a closed space. The stopper 5b,
5c fits into the holes 2b and 2c of the container 2,
The material is made of oil-based clay or the like, organic rubber, metal or the like. The shape may be a lump or a screw as long as it fits. The organic film 3 is made of a mylar film of a polypropylene film, and can be formed freely along the container 2 and the fixing ring 4. The organic film 3
Indicates that the X-ray absorption is relatively small, the sensitivity is not reduced, and the accuracy of the measured value is not reduced. The container 2 and the fixing ring 4 are made of aluminum, and have a structure fitted with the organic film 3 interposed therebetween.
【0017】図2は、この発明のX線回折装置を示す構
成図であり、(a)は光学系を示す配置図、(b)は
(a)の試料測定部分の拡大側面図である。図2のX線
回折装置は、X線を発生させるX線源部7より出射され
た入射X線8が、入射スリット9を経たのち試料測定部
10の試料6を照射し、試料6により回折された回折X
線11が受光スリット12を経て検出部13により検出
される。検出部13で検出された回折X線11は電気信
号に変換され図示しないコンピュータで処理されX線回
折パターンとして表示される。FIGS. 2A and 2B are configuration diagrams showing the X-ray diffraction apparatus of the present invention, wherein FIG. 2A is a layout view showing an optical system, and FIG. The X-ray diffractometer of FIG. 2 irradiates a sample 6 of a sample measuring unit 10 after an incident X-ray 8 emitted from an X-ray source unit 7 for generating X-rays passes through an entrance slit 9, and is diffracted by the sample 6. Diffraction X
The line 11 is detected by the detection unit 13 via the light receiving slit 12. The diffracted X-rays 11 detected by the detection unit 13 are converted into electric signals, processed by a computer (not shown), and displayed as an X-ray diffraction pattern.
【0018】試料測定部10は、試料ホルダ1、試料ホ
ルダ支持部14、試料ホルダ駆動部15、ゴニオメータ
17、ゴニオメータ駆動部18からなる。試料ホルダ1
は、試料ホルダ駆動部15からの心棒15aに接続さ
れ、駆動部15の回転に合わせて回転軸16を中心に3
回/秒以下の速度で回転される。また、試料ホルダ1
は、試料ホルダ支持部14により支持されており、該試
料ホルダ支持部14は、該試料ホルダ支持部14の心棒
14aによりゴニオメータ17の中心部に載置される。
前記ゴニオメータ17は、ゴニオメータ駆動部18によ
り回転軸19を中心に回折角0〜2θの範囲となるよう
回動する。The sample measuring section 10 comprises a sample holder 1, a sample holder supporting section 14, a sample holder driving section 15, a goniometer 17, and a goniometer driving section 18. Sample holder 1
Is connected to a mandrel 15 a from the sample holder driving unit 15, and is rotated about the rotation shaft 16 in accordance with the rotation of the driving unit 15.
It is rotated at a speed of less than times / second. Also, the sample holder 1
Is supported by a sample holder support 14, and the sample holder support 14 is mounted on the center of the goniometer 17 by the mandrel 14 a of the sample holder support 14.
The goniometer 17 is rotated by a goniometer driving section 18 about a rotation axis 19 so as to be in a diffraction angle range of 0 to 2θ.
【0019】前記試料ホルダ1の孔2bから比重の異な
る物質を含む液状試料6を凹部2aに注入し、孔2cよ
り液状試料6が出てくるまで注入し続ける。凹部2aを
液状試料6で充填した後、孔2b,2cを栓5b,5c
で塞いで、凹部2aから液状試料6が漏れないようにす
る。液状試料6の充填された試料ホルダ1を、前記X線
回折装置の試料ホルダ支持部14に固定して、試料ホル
ダ1を3回/秒以下で回転させながら、X線を照射し、
そこから得られる液状試料6の回折X線11を測定し、
X線回折パターンを得る。A liquid sample 6 containing a substance having a different specific gravity is injected from the hole 2b of the sample holder 1 into the concave portion 2a, and is continuously injected until the liquid sample 6 comes out of the hole 2c. After filling the concave portion 2a with the liquid sample 6, the holes 2b and 2c are closed with plugs 5b and 5c.
To prevent the liquid sample 6 from leaking from the concave portion 2a. The sample holder 1 filled with the liquid sample 6 is fixed to the sample holder supporting portion 14 of the X-ray diffraction apparatus, and is irradiated with X-rays while rotating the sample holder 1 at three times / second or less.
The diffraction X-ray 11 of the liquid sample 6 obtained therefrom was measured,
Obtain an X-ray diffraction pattern.
【0020】上記試料ホルダとX線回折装置を用いて、
下記の実験を行った。 (実施例1)酸化ネオジム80gを純水160mlに混入
しスラリー化して、スラリーを70℃に温める。70℃
での反応時間を0〜40分まで変化させ、この試料を試
料ホルダに充填し、試料ホルダを1回/秒の回転速度で
回転させながら、反応時間の変化によるX線回折パター
ンの変化を測定した。図3は酸化ネオジムの水酸化反応
におけるX線回折パターンの経時変化を示す線図であ
り、実線は反応直後、点線は10分後、破線は20分
後、1点鎖線は30分後、2点鎖線は40分後のX線回
折パターンを示している。反応時間の変化に伴いNd2
O3ピークが低くなり、Nd(OH)3ピークが現れてい
ることがわかり、経時変化を時間ごとにとらえることが
できる。Using the sample holder and the X-ray diffractometer,
The following experiment was performed. (Example 1) 80 g of neodymium oxide was mixed with 160 ml of pure water to form a slurry, and the slurry was heated to 70 ° C. 70 ° C
The reaction time was changed from 0 to 40 minutes, the sample was filled in a sample holder, and the change in the X-ray diffraction pattern due to the change in the reaction time was measured while rotating the sample holder at a rotation speed of once / second. did. FIG. 3 is a diagram showing the change over time of the X-ray diffraction pattern in the hydroxylation reaction of neodymium oxide. The solid line is immediately after the reaction, the dotted line is after 10 minutes, the dashed line is after 20 minutes, and the dashed line is after 30 minutes. The dotted line shows the X-ray diffraction pattern after 40 minutes. As the reaction time changes, Nd 2
It can be seen that the O 3 peak becomes lower and the Nd (OH) 3 peak appears, and the change with time can be captured every hour.
【0021】(実施例2)比較的比重の大きいBaTi
O3粉末25gを純水50mlに分散させたスラリー
を、実施例1と同じ試料ホルダとX線回折装置を用いて
回折X線を測定した。試料ホルダを1回/秒回転させる
場合と回転させない場合とで、BaTiO3(111)
面のP/B(ピーク強度/バックグランド強度)比を比
較した結果、1回/秒回転させた場合は、P/B=5.
5になるのに対して、回転させない場合は、P/B=
2.5になった。試料ホルダを回転させる場合と回転さ
せない場合とで、P/B比に約2倍の差が生じるのは、
試料ホルダを回転させない場合、BaTiO3粉が沈降
して、BaTiO3の回折線強度が低下し、水によるバ
ックグランドの上昇からP/B比が小さくなるからであ
り、試料ホルダを回転させる場合、測定中もBaTiO
3が均一に分散されてBaTiO3の回折線強度が強く現
れるからである。(Embodiment 2) BaTi having a relatively large specific gravity
X-ray diffraction of a slurry in which 25 g of O 3 powder was dispersed in 50 ml of pure water was measured using the same sample holder and X-ray diffractometer as in Example 1. When the sample holder is rotated once / second and when the sample holder is not rotated, BaTiO 3 (111) is used.
As a result of comparing the P / B (peak intensity / background intensity) ratio of the surface, when rotated once / second, P / B = 5.
In contrast to 5, when not rotating, P / B =
2.5. The difference of about twice the P / B ratio between the case where the sample holder is rotated and the case where the sample holder is not rotated is as follows.
If the sample holder is not rotated, the BaTiO 3 powder will settle down, the diffraction line intensity of BaTiO 3 will decrease, and the P / B ratio will decrease due to an increase in the background due to water. BaTiO during measurement
This is because 3 is uniformly dispersed and the diffraction line intensity of BaTiO 3 appears strongly.
【0022】また、前記スラリーを用いて、回転数の違
いによるX線回折パターンの変化を測定した。図4は試
料ホルダの回転数の違いにおけるX線回折パターンの変
化を示す線図であり、BaTiO3(110)(10
1)面のピーク強度を測定した。実線は0回/秒、点線
は2回/秒、破線は3回/秒、1点鎖線は4回/秒のX
線回折パターンを示している。図4より回転がない場
合、スラリー中のBaTiO3粉が沈降して、BaTi
O3(110)(101)面のピーク強度が低下し、ブ
ロードなピークとなっているが、回転がある場合、スラ
リーが均質化して、BaTiO3(110)(101)
面のピーク強度が高く、シャープなものが得られる。4
回転以上になると、BaTiO3粉と水が分離しやすく
なり、ピークがブロードになっている。高速回転にすれ
ば、遠心分離と同じ原理で相分離が生じるため、このB
aTiO3を含むスラリーでは、3回/秒以下が最適な
回転条件である。Using the slurry, the change in the X-ray diffraction pattern due to the difference in the number of rotations was measured. Figure 4 is a graph showing the change in X-ray diffraction pattern of the rotation speed difference of the sample holder, BaTiO 3 (110) (10
1) The peak intensity of the plane was measured. The solid line is 0 times / second, the dotted line is 2 times / second, the broken line is 3 times / second, and the dashed line is 4 times / second.
2 shows a line diffraction pattern. As shown in FIG. 4, when there is no rotation, the BaTiO 3 powder in the slurry sediments,
Although the peak intensity of the O 3 (110) (101) plane decreases and becomes a broad peak, when there is rotation, the slurry is homogenized and BaTiO 3 (110) (101)
A sharp peak is obtained with a high peak intensity on the surface. 4
When the rotation speed is higher than that, the BaTiO 3 powder and the water are easily separated, and the peak is broad. If the rotation speed is high, phase separation occurs on the same principle as centrifugation.
In a slurry containing aTiO 3 , the optimal rotation condition is 3 times / second or less.
【0023】(実施例3)酸化チタン(Anatase)50
gを純水100mlで6時間混合したスラリーを、実施例
1と同じ試料ホルダとX線回折装置を用いて、試料ホル
ダを1回/秒回転させて測定した。酸化チタン(20
0)面の回折線強度を測定した。回折角から算出したd
値と、回折強度を表1に示す。(Example 3) Titanium oxide (Anatase) 50
g was mixed with 100 ml of pure water for 6 hours, and the slurry was measured by rotating the sample holder once / second using the same sample holder and X-ray diffractometer as in Example 1. Titanium oxide (20
The diffraction line intensity of the 0) plane was measured. D calculated from the diffraction angle
Table 1 shows the values and the diffraction intensities.
【0024】[0024]
【表1】 [Table 1]
【0025】d値は治具の角度の精度を示すもので、強
度は測定方法の精度を示すものである。この発明のX線
回折装置を用いると、角度再現性も高く、また強度のバ
ラツキも統計変動誤差で比較して誤差なしの範囲である
ことから、沈降の影響が低減でき、高い精度を有してい
ることがわかる。The d value indicates the accuracy of the angle of the jig, and the strength indicates the accuracy of the measuring method. The use of the X-ray diffractometer of the present invention has a high angle reproducibility, and the variation in intensity is within the range of no error compared with the statistical fluctuation error. You can see that it is.
【0026】図5は、この発明の試料ホルダの異なる実
施例を示した図であり、(a)は測定時の斜視図、
(b)は(a)のB−B線での拡大断面図である。試料
ホルダ21は、中央部に凹部22aを有する容器22
と、その凹部22aの開口面を覆う有機膜23と、その
有機膜23を容器22の凹部22aの開口面に固定する
固定リング24とからなる。FIG. 5 is a view showing another embodiment of the sample holder according to the present invention, wherein (a) is a perspective view at the time of measurement,
(B) is an enlarged sectional view taken on line BB of (a). The sample holder 21 includes a container 22 having a concave portion 22a at the center.
And an organic film 23 covering the opening surface of the concave portion 22a, and a fixing ring 24 for fixing the organic film 23 to the opening surface of the concave portion 22a of the container 22.
【0027】有機膜23は、ポリプロピレンフィルムの
マイラー膜からなり、容器22や固定リング24に沿っ
て自由な形状にできるものである。容器22と固定リン
グ24は、アルミニウム製であり、有機膜23を挟んで
嵌合される構造である。この異なる実施例の試料ホルダ
21の容器22には、孔を設けていないが、前述の実施
例と同様に孔を設けても良い。The organic film 23 is formed of a mylar film of a polypropylene film, and can be formed freely along the container 22 and the fixing ring 24. The container 22 and the fixing ring 24 are made of aluminum, and have a structure in which they are fitted with the organic film 23 interposed therebetween. A hole is not provided in the container 22 of the sample holder 21 according to the different embodiment, but a hole may be provided as in the above-described embodiment.
【0028】また、実施例の試料ホルダ1の容器2に
は、異なる実施例の試料ホルダ21のように孔を設けな
くても良い。さらに、有機膜3,23は、ポリプロピレ
ンフィルムのマイラー膜を用いたが、X線の感度低下を
起こさないものであればポリイミド、ポリエーテルイミ
ド、ポリエーテルエーテルケトンの膜を用いても良い。
また、試料ホルダ1,21の容器2,22、固定リング
4,24はアルミニウム製を用いたが、ステンレスなど
の金属製あるいはポリエチレンなどのプラスチック製で
もよい。さらにまた、試料ホルダの回転数は、測定試料
の組成や粘度や濃度により、3回/秒以下の範囲内で最
適条件を決定して測定するほうがよい。Further, the container 2 of the sample holder 1 of the embodiment need not be provided with a hole unlike the sample holder 21 of the different embodiment. Furthermore, the organic films 3 and 23 use a Mylar film of a polypropylene film, but a film of polyimide, polyetherimide, or polyetheretherketone may be used as long as the film does not cause a decrease in X-ray sensitivity.
Although the containers 2 and 22 and the fixing rings 4 and 24 of the sample holders 1 and 21 are made of aluminum, they may be made of metal such as stainless steel or plastic such as polyethylene. Furthermore, it is better to determine the rotation number of the sample holder by determining the optimum condition within the range of 3 times / second or less according to the composition, viscosity and concentration of the measurement sample.
【0029】[0029]
【発明の効果】この発明の液状試料の測定方法によれ
ば、比重の異なる物質を含む液状試料の比重差による相
分離を防いで、均質化した状態で測定でき、測定精度の
向上が図れる。また、液状試料の乾燥、蒸発等の工程を
省略でき測定時間の短縮化が図れ、乾燥、蒸発工程で生
じていた反応促進や液状と粉末状で結晶状態の変化をな
くし、正確な結晶状態を評価できる。さらに、セラミッ
クスラリーの乾燥、蒸発工程を省略できることから、粉
砕中の結晶の歪みを迅速に測定でき、粉砕時間を早く決
定することができ、分析期間の短縮が図れる。According to the method for measuring a liquid sample of the present invention, phase separation due to a difference in specific gravity of a liquid sample containing substances having different specific gravities can be prevented, measurement can be performed in a homogenized state, and measurement accuracy can be improved. In addition, the steps of drying and evaporating the liquid sample can be omitted, the measurement time can be shortened, the reaction promoted in the drying and evaporating steps and the change of the crystal state between the liquid and the powder are eliminated, and the accurate crystal state is obtained. Can be evaluated. Further, since the steps of drying and evaporating the ceramic slurry can be omitted, the distortion of the crystal during grinding can be measured quickly, the grinding time can be determined quickly, and the analysis period can be shortened.
【0030】次に、この発明の試料ホルダは、試料ホル
ダの測定面を有機膜で覆い、液状試料を密閉して測定す
ることができる。また、有機膜にX線吸収係数が低くX
線透過が良好なポリプロピレンのマイラー膜を用いるこ
とから、測定時の影響を低減できる。さらに、従来の粉
末X線回折装置に用いることができる。Next, in the sample holder of the present invention, the measurement surface of the sample holder is covered with an organic film, and the liquid sample can be sealed and measured. Further, the organic film has a low X-ray absorption coefficient and a low X-ray absorption coefficient.
Since a Mylar film of polypropylene having good line transmission is used, the influence at the time of measurement can be reduced. Further, it can be used for a conventional powder X-ray diffraction apparatus.
【0031】さらに、この発明のX線回折装置は、試料
ホルダを低速で回転させることができる。また、試料ホ
ルダを回転させることから液状試料が攪拌され、比重差
により生じる相分離を防ぎ、測定精度を向上させること
ができる。さらに、液状試料の乾燥、蒸発工程を省略で
き、液状状態での正確な評価が可能である。Further, the X-ray diffraction apparatus according to the present invention can rotate the sample holder at a low speed. In addition, since the sample holder is rotated, the liquid sample is stirred, phase separation caused by a difference in specific gravity is prevented, and measurement accuracy can be improved. Further, the steps of drying and evaporating the liquid sample can be omitted, and accurate evaluation in the liquid state can be performed.
【図1】この発明の試料ホルダを示す図であり、(a)
は分解斜視図、(b)は測定時の外観斜視図、(c)は
(b)のA−A線における拡大断面図である。FIG. 1 is a view showing a sample holder of the present invention;
Is an exploded perspective view, (b) is an external perspective view at the time of measurement, and (c) is an enlarged cross-sectional view taken along line AA of (b).
【図2】この発明のX線回折装置を示す構成図であり、
(a)は光学系を示す配置図、(b)は(a)の試料測
定部分の拡大側面図である。FIG. 2 is a configuration diagram showing an X-ray diffraction apparatus according to the present invention;
(A) is an arrangement view showing an optical system, and (b) is an enlarged side view of a sample measurement portion of (a).
【図3】酸化ネオジムの水酸化反応におけるX線回折パ
ターンの経時変化を示す線図である。FIG. 3 is a diagram showing a change over time of an X-ray diffraction pattern in a hydroxylation reaction of neodymium oxide.
【図4】試料ホルダの回転数の違いにおけるX線回折パ
ターンの変化を示す線図である。FIG. 4 is a diagram showing a change in an X-ray diffraction pattern depending on a difference in rotation speed of a sample holder.
【図5】この発明の試料ホルダーの異なる実施例を示
し、(a)は測定時の外観斜視図、(b)は(a)のB
−B線における拡大断面図である。5A and 5B show different embodiments of the sample holder of the present invention, wherein FIG. 5A is an external perspective view at the time of measurement, and FIG.
It is an expanded sectional view in the -B line.
【図6】従来のX線分析用試料ホルダの測定時の外観斜
視図である。FIG. 6 is an external perspective view of a conventional sample holder for X-ray analysis during measurement.
1 試料ホルダ 2 容器 2a 凹部 2b,2c 孔 3 有機膜 4 固定リング 7 X線源部 10 試料測定部 13 X線検出部 14 試料ホルダ支持部 15 試料ホルダ駆動部 16 試料ホルダ駆動部の回転軸 17 ゴニオメータ 18 ゴニオメータ駆動部 19 ゴニオメータの回転軸 21 試料ホルダ 22 容器 22a 凹部 23 有機膜 24 固定リング DESCRIPTION OF SYMBOLS 1 Sample holder 2 Container 2a Depression 2b, 2c Hole 3 Organic film 4 Fixing ring 7 X-ray source part 10 Sample measurement part 13 X-ray detection part 14 Sample holder support part 15 Sample holder drive part 16 Rotation axis of sample holder drive part 17 Goniometer 18 Goniometer drive unit 19 Rotation axis of goniometer 21 Sample holder 22 Container 22a Depression 23 Organic film 24 Fixing ring
Claims (8)
回折されたX線の強度を測定して物質の分析を行うX線
回折にあたり、試料測定面と重力方向とが平行な粉末X
線回折装置を用いて、試料ホルダに比重の異なる物質を
含む液状試料を充填、密閉し、前記試料ホルダを3回/
秒以下(但し、0は除く)の回転速度で回転させ、これ
により前記試料ホルダ内の前記液状試料を強制的に攪拌
し前記液状試料を均質化することを特徴とする液状試料
の測定方法。An X-ray diffraction method for irradiating a predetermined sample with X-rays and measuring the intensity of X-rays diffracted by the sample to analyze a substance.
A sample holder is filled with a liquid sample containing substances having different specific gravities by using a X-ray diffractometer, and the sample holder is closed three times.
A method for measuring a liquid sample, comprising rotating the liquid sample in the sample holder forcibly by rotating the liquid sample at a rotation speed of seconds or less (excluding 0), thereby homogenizing the liquid sample.
セラミックスラリーであることを特徴とする請求項1に
記載の液状試料の測定方法。2. The method according to claim 1, wherein the liquid sample is a ceramic slurry containing a ceramic powder.
めの試料ホルダであって、中央部に凹部を有する容器
と、前記容器の凹部の開口面を覆う有機膜と、前記有機
膜を前記容器の凹部開口面に固定する固定リングとから
なることを特徴とする試料ホルダ。3. A sample holder for sealing a liquid sample for X-ray diffraction analysis, comprising: a container having a concave portion in a central portion; an organic film covering an opening surface of the concave portion of the container; A sample holder, comprising: a fixing ring fixed to an opening surface of the concave portion of the container.
ー膜からなることを特徴とする請求項3に記載の試料ホ
ルダ。4. The sample holder according to claim 3, wherein the organic film is made of a mylar film of polypropylene.
向とが平行な粉末X線回折装置に用いられることを特徴
とする請求項3または請求項4に記載の試料ホルダ。5. The sample holder according to claim 3, wherein the sample holder is used for a powder X-ray diffractometer in which a sample measurement surface and a direction of gravity are parallel.
回折されたX線の強度を測定して物質の分析を行うX線
回折にあたり、X線源部と、X線検出部と、ゴニオメー
タ部と、前記ゴニオメータを回転させる第1の駆動部
と、試料ホルダと、前記試料ホルダを保持する支持部
と、前記試料ホルダを回転させる第2の駆動部とを備
え、前記第1の駆動部の回転軸と前記第2の駆動部の回
転軸が互いに直交していることを特徴とするX線回折装
置。6. X-ray diffraction for irradiating a predetermined sample with X-rays, measuring the intensity of X-rays diffracted by the sample, and analyzing a substance, wherein an X-ray source unit, an X-ray detection unit, A first driving unit that rotates the goniometer, a first driving unit that rotates the goniometer, a sample holder, a support unit that holds the sample holder, and a second driving unit that rotates the sample holder. An X-ray diffraction apparatus, wherein a rotation axis of the unit and a rotation axis of the second drive unit are orthogonal to each other.
は、中央部に凹部を有する容器と、前記容器の凹部の開
口面を覆う有機膜と、前記有機膜を前記容器の凹部開口
面に固定する固定リングとからなることを特徴とする請
求項6に記載のX線回折装置。7. A sample holder used in the X-ray diffractometer, a container having a concave portion at a central portion, an organic film covering an opening surface of the concave portion of the container, and fixing the organic film to a concave opening surface of the container. 7. The X-ray diffraction apparatus according to claim 6, comprising a fixing ring.
し、0は除く)の回転速度で回転していることを特徴と
する請求項6または請求項7に記載のX線回折装置。8. The X-ray diffraction apparatus according to claim 6, wherein the sample holder is rotated at a rotation speed of 3 times / second or less (however, excluding 0).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8190627A JPH1038772A (en) | 1996-07-19 | 1996-07-19 | Measuring method for liquid sample, sample holder and x-ray diffractometer therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8190627A JPH1038772A (en) | 1996-07-19 | 1996-07-19 | Measuring method for liquid sample, sample holder and x-ray diffractometer therefor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH1038772A true JPH1038772A (en) | 1998-02-13 |
Family
ID=16261224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8190627A Pending JPH1038772A (en) | 1996-07-19 | 1996-07-19 | Measuring method for liquid sample, sample holder and x-ray diffractometer therefor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH1038772A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005274156A (en) * | 2004-03-22 | 2005-10-06 | Olympus Corp | Flaw inspection device |
WO2006049051A1 (en) | 2004-11-08 | 2006-05-11 | Sii Nanotechnology Inc. | Fluorescent x-ray analy sis device |
KR100706234B1 (en) | 2004-10-12 | 2007-04-11 | 삼성전자주식회사 | Sample holder for semiconductor analysis device |
JP2010060558A (en) * | 2008-08-26 | 2010-03-18 | F Hoffmann La Roche Ag | Sample carrier |
WO2012136921A1 (en) * | 2011-04-06 | 2012-10-11 | Universite De Rouen | Method of measuring scattering of x-rays, its applications and implementation device |
EP2657690A1 (en) * | 2012-04-26 | 2013-10-30 | PANalytical B.V. | Sample holder |
KR20230084898A (en) * | 2021-12-06 | 2023-06-13 | 한국원자력연구원 | Rotary apparatus for containing multi sample |
-
1996
- 1996-07-19 JP JP8190627A patent/JPH1038772A/en active Pending
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005274156A (en) * | 2004-03-22 | 2005-10-06 | Olympus Corp | Flaw inspection device |
KR100706234B1 (en) | 2004-10-12 | 2007-04-11 | 삼성전자주식회사 | Sample holder for semiconductor analysis device |
WO2006049051A1 (en) | 2004-11-08 | 2006-05-11 | Sii Nanotechnology Inc. | Fluorescent x-ray analy sis device |
JPWO2006049051A1 (en) * | 2004-11-08 | 2008-05-29 | エスアイアイ・ナノテクノロジー株式会社 | X-ray fluorescence analyzer |
US7436926B2 (en) | 2004-11-08 | 2008-10-14 | Sii Nano Technology Inc. | Fluorescent X-ray analysis apparatus |
JP2010060558A (en) * | 2008-08-26 | 2010-03-18 | F Hoffmann La Roche Ag | Sample carrier |
WO2012136921A1 (en) * | 2011-04-06 | 2012-10-11 | Universite De Rouen | Method of measuring scattering of x-rays, its applications and implementation device |
FR2973879A1 (en) * | 2011-04-06 | 2012-10-12 | Univ Rouen | METHOD FOR MEASURING X-RAY DIFFRACTION, ITS APPLICATIONS AND DEVICE FOR IMPLEMENTATION |
US9255898B2 (en) | 2011-04-06 | 2016-02-09 | Universite De Rouen | Method of measuring scattering of X-rays, its applications and implementation device |
EP2657690A1 (en) * | 2012-04-26 | 2013-10-30 | PANalytical B.V. | Sample holder |
US9239305B2 (en) | 2012-04-26 | 2016-01-19 | Panalytical B.V. | Sample holder |
KR20230084898A (en) * | 2021-12-06 | 2023-06-13 | 한국원자력연구원 | Rotary apparatus for containing multi sample |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Bugay et al. | Quantitation of cefepime· 2HCl dihydrate in cefepime· 2HCl monohydrate by diffuse reflectance IR and powder X-ray diffraction techniques | |
US1648369A (en) | Analytical centrifuge | |
JPH1038772A (en) | Measuring method for liquid sample, sample holder and x-ray diffractometer therefor | |
US20230271199A1 (en) | Method and apparatus for controlling a focus point of a stationary beam focusing on a sample in a rotating cartridge placed in a rotating disc | |
US3279305A (en) | Optical turbidimeter | |
Babick et al. | Characterisation of colloidal suspensions | |
JPH08313458A (en) | X-ray equipment | |
Nishiwaki et al. | Application of total reflection X-ray fluorescence spectrometry to small glass fragments | |
JP2802327B2 (en) | Standard substance for quality confirmation in optical sample analyzer and its use | |
Whitfield et al. | Specimen preparation | |
Hodoroaba et al. | Techniques evaluation report for selection of characterisation methods | |
Whitfield et al. | Holders | |
JP3889218B2 (en) | Particle size distribution measuring device | |
WO2022131289A1 (en) | Optical cell for sedimentation analysis, centrifugal sedimentation analysis device, and centrifugal sedimentation analysis method | |
JPS60149952A (en) | Spinner of nuclear magnetic resonance apparatus | |
Whitfield et al. | X-ray powder diffraction | |
JPS6225240A (en) | Data analyzing device for ultra centrifugal machine | |
JP2000338013A (en) | Sampler for measuring diffused reflected light | |
CN207689220U (en) | A kind of sampler for granularmetric analysis | |
JP2012117941A (en) | Quantitative method of crystal polymorphism of organic molecule | |
JPH02311741A (en) | Method for testing stability of slurry | |
Straumanis | Lattice parameters, expansion coefficients, and atomic and molecular weights | |
Issenberg et al. | Magnetic Tape Recording of Analytical Data. | |
SU441489A1 (en) | The method of determining the size of the homogeneity region of the distribution of chemical elements in solids | |
Wold et al. | Characterization of Solids |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20040618 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20040713 |
|
A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20041207 |