JPH10275312A - Production of thin film magnetic head - Google Patents

Production of thin film magnetic head

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Publication number
JPH10275312A
JPH10275312A JP8034897A JP8034897A JPH10275312A JP H10275312 A JPH10275312 A JP H10275312A JP 8034897 A JP8034897 A JP 8034897A JP 8034897 A JP8034897 A JP 8034897A JP H10275312 A JPH10275312 A JP H10275312A
Authority
JP
Japan
Prior art keywords
film
recording
core
ion milling
sio2
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8034897A
Other languages
Japanese (ja)
Inventor
Toru Suzuki
徹 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP8034897A priority Critical patent/JPH10275312A/en
Publication of JPH10275312A publication Critical patent/JPH10275312A/en
Pending legal-status Critical Current

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  • Magnetic Heads (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable forming a recording core without burr at the time of forming the recording core of a sputtered magnetic film by ion milling. SOLUTION: A flattened film and a recording coil are formed by film-forming a recording gap 2 on a lower core 1. Then, a core material of an upper core 5 is film-formed by sputtering to 3 μm film thickness, SiO2 film 6 is film-formed to 2.5 μm, then a resist film 7 is applied onto the SiO2 film 6 and is subjected to optical exposure to form a pattern of the upper core 5 (b). After the SiO2 film 6 is etched by RIE(reactive ion etching),the resist film 7 is stripped to form the mask of the SiO2 film 6 (c). Being different from the resist film 7 in which film thickness varies from position to position, the mask has approximately equal film thickness over whole surface. By appropriately selecting the film thickness of the SiO2 film 6, burrs 5a are generated during proceeding of the ion milling of the upper core 5 (d), but if the film thickness of the SiO2 film 6 is made to be a suitable value, the upper core 5 made of the magnetic film in which finally burr 5a does not remain is formed (e).

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ハードディスクド
ライブ等の磁気記録装置の薄膜磁気ヘッドに関する。
The present invention relates to a thin film magnetic head for a magnetic recording device such as a hard disk drive.

【0002】[0002]

【従来の技術】ハードディスクドライブ等の磁気記録装
置の面記録密度を高めるために、磁界感度の高い磁気抵
抗効果素子(以下MR素子)を用いた薄膜磁気ヘッドが
実用化されておりその有効性が高められている。実用と
なっているMR素子では異方性磁気抵抗効果と呼ばれる
効果に基づいており、一般に2%程度の抵抗変化率を示
す。一方で、巨大磁気抵抗効果(以下GMR効果)と呼
ばれる全く異なる原理に基づいて5%以上の抵抗変化率
を示す素子が種々の構成で提案されている。
2. Description of the Related Art In order to increase the surface recording density of a magnetic recording apparatus such as a hard disk drive, a thin film magnetic head using a magnetoresistive element having a high magnetic field sensitivity (hereinafter, MR element) has been put to practical use. Has been enhanced. A practical MR element is based on an effect called anisotropic magnetoresistance effect, and generally shows a resistance change rate of about 2%. On the other hand, based on a completely different principle called the giant magnetoresistance effect (hereinafter referred to as GMR effect), devices exhibiting a resistance change rate of 5% or more in various configurations have been proposed.

【0003】以上述べたように磁気記録装置の記録密度
の向上に伴い、高再生出力の素子が開発される一方、高
密度の記録能力を持った記録ヘッドが要求されている。
これを実現するためには媒体の高Hc(保持力)に対応
した、挟トラック幅で高記録磁界が発生できる構造と材
料が必要になる。材料の面ではBs(飽和磁束密度)の
高い材料、例えばFeCoNiやFeNのようなものが
開発されている。
As described above, with the improvement in the recording density of the magnetic recording apparatus, an element having a high reproduction output has been developed, while a recording head having a high recording capacity has been required.
In order to realize this, a structure and a material that can generate a high recording magnetic field with a narrow track width corresponding to the high Hc (holding force) of the medium are required. In terms of materials, materials having a high Bs (saturation magnetic flux density) such as FeCoNi and FeN have been developed.

【0004】従来、NiFeのようなメッキ膜が記録ヘ
ッド材料として使われてきたが、飽和磁化が高くとれる
高Bsの材料または高周波記録に対応して渦電流損を抑
制するために高抵抗率の材料として、CoZrNbのよ
うなスパッタ磁性膜が使われるようになってきた。スパ
ッタ磁性膜で記録コアを形成する場合は、従来のメッキ
に変わり、イオンミリングのような新しいプロセスが必
要となる。
Conventionally, a plating film such as NiFe has been used as a recording head material. However, in order to suppress eddy current loss corresponding to a high Bs material capable of obtaining a high saturation magnetization or high frequency recording, a high resistivity is used. As a material, a sputtered magnetic film such as CoZrNb has been used. When a recording core is formed from a sputtered magnetic film, a new process such as ion milling is required instead of conventional plating.

【0005】[0005]

【発明が解決しようとする課題】記録コアをイオンミリ
ングで形成すると図3に示すように記録ヘッド先端付近
にイオンミリングの再付着による大きなバリ5aが発生
する。バリ5aが発生すると記録ポールの磁区を乱した
り、不要な磁化分布を生じて記録ヘッドの記録能力が低
下するおそれがある。また、アルミナ保護膜を形成する
際にバリ5aの間にアルミナ保護膜がスパッタされにく
く、膜質の低下による研磨不良を生じる可能性もある。
このため、バリ5aを発生させないプロセスが必要とな
る。レジスト膜を薄くすればバリ5aの高さを低くでき
るが、図4に示すように平坦化膜3の斜面部上のレジス
ト膜7の厚みが薄くなる傾向にあり、記録ポール先端部
のレジスト膜7の厚み分だけを薄くすることは難しい。
When the recording core is formed by ion milling, a large burr 5a is generated near the tip of the recording head due to the reattachment of the ion milling, as shown in FIG. When the burr 5a occurs, the magnetic domain of the recording pole may be disturbed, or an unnecessary magnetization distribution may be generated, and the recording performance of the recording head may be reduced. Further, when forming the alumina protective film, the alumina protective film is less likely to be sputtered between the burrs 5a, and there is a possibility that poor polishing due to deterioration of the film quality may occur.
Therefore, a process that does not generate the burr 5a is required. Although the height of the burr 5a can be reduced by making the resist film thinner, the thickness of the resist film 7 on the slope portion of the flattening film 3 tends to become thinner as shown in FIG. It is difficult to reduce only the thickness of 7.

【0006】本発明の課題はイオンミリングによりスパ
ッタ磁性膜で記録コアを形成する場合にバリのない記録
コアを形成することができる薄膜磁気ヘッドの製造方法
を提供することである。
An object of the present invention is to provide a method of manufacturing a thin-film magnetic head capable of forming a recording core without burrs when forming a recording core with a sputtered magnetic film by ion milling.

【0007】[0007]

【課題を解決するための手段】本発明の上記課題は次の
構成によって解決される。すなわち、下記録コアと記録
ギャプと記録コイルと記録コイルを覆う平坦化膜と上記
録コアからなる薄膜磁気ヘッドの製造方法であって、上
記録コア用の磁性膜の上にマスク層を形成し、これをR
IE法(反応性イオンエッチング法)によりパターニン
グした後にこれをマスクにイオンミリングにより上記録
コアを形成する薄膜磁気ヘッドの製造方法である。ま
た、前記イオンミリング終了時にマスク層がほぼ残らな
い程度のマスク層の膜厚にすることによりイオンミリン
グ時に形成されるバリの発生を押さえることができる。
本発明のマスク層は反応性イオンエッチングのエッチン
グレートが速い材料からなるものであれば良く、例えば
SiO2膜、TiO2膜などを用いる。
The above object of the present invention is attained by the following constitution. That is, a method for manufacturing a thin film magnetic head including a lower recording core, a recording gap, a recording coil, a planarizing film covering the recording coil, and an upper recording core, wherein a mask layer is formed on the magnetic film for the upper recording core. , This is R
This is a method of manufacturing a thin-film magnetic head in which an upper recording core is formed by ion milling using a pattern as a mask after patterning by an IE method (reactive ion etching method). Further, by setting the thickness of the mask layer such that the mask layer hardly remains at the end of the ion milling, it is possible to suppress the generation of burrs formed during the ion milling.
The mask layer of the present invention only needs to be made of a material having a high reactive ion etching rate. For example, a SiO 2 film, a TiO 2 film, or the like is used.

【0008】[0008]

【作用】本発明によればSiO2膜などのマスク層の膜
厚は平坦化膜の上部、斜面部、底部とも同じ膜厚にする
ことができる。従って、全体的にレジスト膜のみを用い
てイオンミリングをする場合に比べてSiO2膜などを
マスクにした方が膜厚を薄くすることができる。この膜
厚を磁性膜のイオンミリング終了時にエッチングによっ
て無くなるようなものとすることにより、エッチング終
了時には再付着により記録コアのバリもエッチングされ
るために、バリのない記録コアを形成することができ
る。
[Action] thickness of the mask layer, such as SiO 2 film according to the present invention may be the same thickness with an upper, inclined surface portion, the bottom portion of the planarizing film. Therefore, the film thickness can be reduced by using the SiO 2 film or the like as a mask as compared with the case where ion milling is performed using only the resist film as a whole. By making this film thickness such that it disappears by etching at the end of ion milling of the magnetic film, burrs of the recording core are also etched by re-adhesion at the end of etching, so that a recording core without burrs can be formed .

【0009】[0009]

【発明の実施の形態】図1は本発明の実施の形態の磁気
ヘッドの構成を示す図であり、図2はその作製手順を示
す図である。以下、順を追って磁気ヘッドの作製の手順
を説明する。まず、めっき、イオンミリング等の方法に
より磁性膜からなる下コア1を形成する。この上に記録
ギャップ2を成膜し、次に平坦化膜3を形成する。次に
めっき法により記録コイル4を形成する。この上にさら
に記録コイル4の上方を平坦化するために平坦化膜3の
一部を構成する膜を形成する。
FIG. 1 is a diagram showing a configuration of a magnetic head according to an embodiment of the present invention, and FIG. 2 is a diagram showing a manufacturing procedure thereof. Hereinafter, the procedure of manufacturing the magnetic head will be described step by step. First, the lower core 1 made of a magnetic film is formed by a method such as plating or ion milling. A recording gap 2 is formed thereon, and then a flattening film 3 is formed. Next, the recording coil 4 is formed by plating. On top of this, a film constituting a part of the flattening film 3 is formed to flatten the upper part of the recording coil 4.

【0010】次に、上コア5のコア材をスパッタにより
例えば3μmの膜厚で成膜する。続けて、SiO2膜6
を例えば2.5μm成膜する。この状態をABS面から
見た図を図2(a)に示す。次にSiO2膜6上にレジ
スト膜7を塗布して、光学露光を行い、上コア5のパタ
ンを形成する(図2(b))。
Next, a core material of the upper core 5 is formed by sputtering to a thickness of, for example, 3 μm. Then, the SiO 2 film 6
Is formed, for example, in a thickness of 2.5 μm. FIG. 2A shows this state as viewed from the ABS. Next, a resist film 7 is applied on the SiO 2 film 6 and optically exposed to form a pattern of the upper core 5 (FIG. 2B).

【0011】次に、RIEを用いてSiO2膜6をエッ
チングした後にレジスト膜7を剥離すると図2(c)に
示すようにSiO2膜6のマスクを形成することができ
る。このマスクは膜厚が場所によって異なるレジスト膜
7と違い、全面にわたってほぼ同一の膜厚である。
Next, when the resist film 7 is removed after etching the SiO 2 film 6 using RIE, a mask of the SiO 2 film 6 can be formed as shown in FIG. This mask has substantially the same thickness over the entire surface, unlike the resist film 7 whose thickness varies depending on the location.

【0012】次に、SiO2膜6をマスクとして上コア
5のスパッタ磁性膜をイオンミリングでエッチングをす
る。SiO2膜6の膜厚を適当に選ぶことによりエッチ
ング終了後にSiO2膜6はエッチングされて残らな
い。イオンミリングが進行中は図2(d)に示すように
バリ5aが発生するが、SiO2膜6の膜厚を適切なも
のにすると、図2(e)に示すようにエッチングの進行
と共にバリ5aがエッチングされるために最終的に、バ
リ5aは残らない。
Next, the sputtered magnetic film of the upper core 5 is etched by ion milling using the SiO 2 film 6 as a mask. SiO 2 film 6 after completion of the etching by choosing the thickness of the SiO 2 film 6 suitably does not remain etched. While ion milling is in progress, burrs 5a are generated as shown in FIG. 2 (d). However, if the thickness of the SiO 2 film 6 is made appropriate, burrs 5a as shown in FIG. Ultimately, no burr 5a remains because 5a is etched.

【0013】[0013]

【発明の効果】本発明によれば、スパッタ膜からなる薄
膜磁気ヘッドの上コアを形成する際、イオンミリングの
再付着によるバリを発生させることなく、上コアを形成
することができるため、記録特性に優れ、保護膜の膜質
が向上し信頼性の高い磁気ヘッドを形成することができ
る。
According to the present invention, when forming the upper core of a thin film magnetic head made of a sputtered film, the upper core can be formed without generating burrs due to reattachment of ion milling. It is possible to form a highly reliable magnetic head having excellent characteristics and improved protective film quality.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の一実施例の薄膜磁気ヘッドの断面図
である。
FIG. 1 is a sectional view of a thin-film magnetic head according to an embodiment of the present invention.

【図2】 本発明の一実施例の薄膜磁気ヘッドの製造プ
ロセスを説明する図である。
FIG. 2 is a diagram illustrating a manufacturing process of the thin-film magnetic head according to one embodiment of the present invention.

【図3】 従来技術の薄膜磁気ヘッドの製造プロセスに
おけるイオンミリングによって上コアに形成されたバリ
を表す図である。
FIG. 3 is a diagram showing burrs formed on an upper core by ion milling in a manufacturing process of a thin-film magnetic head according to a conventional technique.

【図4】 従来技術の薄膜磁気ヘッドの製造プロセスに
おけるイオンミリングによってバリの形成を防ぐ方法に
よる不具合を説明する図である。
FIG. 4 is a diagram for explaining a problem caused by a method of preventing formation of burrs by ion milling in a conventional thin film magnetic head manufacturing process.

【符号の説明】[Explanation of symbols]

1 下コア 2 記録ギャップ 3 平坦化膜 4 記録コイル 5 上コア 6 SiO2膜 7 レジスト膜 DESCRIPTION OF SYMBOLS 1 Lower core 2 Recording gap 3 Flattening film 4 Recording coil 5 Upper core 6 SiO2 film 7 Resist film

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 下記録コアと記録ギャプと記録コイルと
記録コイルを覆う平坦化膜と上記録コアからなる薄膜磁
気ヘッドの製造方法であって、上記録コア用の磁性膜の
上にマスク層を形成し、これをRIE法によりパターニ
ングした後にこれをマスクにイオンミリングにより上記
録コアを形成することを特徴とする薄膜磁気ヘッドの製
造方法。
1. A method of manufacturing a thin film magnetic head comprising a lower recording core, a recording gap, a recording coil, a planarizing film covering the recording coil, and an upper recording core, wherein a mask layer is formed on the magnetic film for the upper recording core. And forming an upper recording core by ion milling using the resultant as a mask and forming an upper recording core.
【請求項2】 イオンミリング終了時にマスク層がほぼ
残らない程度のマスク層の膜厚にすることによりイオン
ミリング時に形成されるバリの発生を押さえることを特
徴とした請求項1記載の薄膜磁気ヘッドの製造方法。
2. The thin-film magnetic head according to claim 1, wherein the thickness of the mask layer is such that the mask layer hardly remains at the end of the ion milling to suppress the generation of burrs formed during the ion milling. Manufacturing method.
JP8034897A 1997-03-31 1997-03-31 Production of thin film magnetic head Pending JPH10275312A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8034897A JPH10275312A (en) 1997-03-31 1997-03-31 Production of thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8034897A JPH10275312A (en) 1997-03-31 1997-03-31 Production of thin film magnetic head

Publications (1)

Publication Number Publication Date
JPH10275312A true JPH10275312A (en) 1998-10-13

Family

ID=13715763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8034897A Pending JPH10275312A (en) 1997-03-31 1997-03-31 Production of thin film magnetic head

Country Status (1)

Country Link
JP (1) JPH10275312A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7554764B2 (en) 2006-04-07 2009-06-30 Hitachi Global Storage Technologies Netherlands B.V. Lift-off method for forming write pole of a magnetic write head and write pole formed thereby

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7554764B2 (en) 2006-04-07 2009-06-30 Hitachi Global Storage Technologies Netherlands B.V. Lift-off method for forming write pole of a magnetic write head and write pole formed thereby

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