JPH10267974A - Jig for measurement of characteristic of crystal oscillator - Google Patents

Abstract

PROBLEM TO BE SOLVED: To reduce an error judgement and enhance reliability and a manufacturing yield of a measurement process by a method wherein a contact part is structured so as to penetrate through a compression coil and a fixing part, and a coil spring does not reside between a terminal of a crystal oscillator and a conductive part of an oscillating circuit. SOLUTION: An impact in the case when a contact pin 90 comes into contact with a terminal 5 of a crystal oscillator 10 is mitigated and a compression coil spring 95 for absorbing variations of heights of the terminal 5 is arranged between an insulation part 96 provided in a fixing part 91 and a stopper part 96 provided in a contact part 92, and the contact part 92 penetrates through the coil spring 95 and the fixing part 91. Thereby, an AC current passes through an end part 92b, a contactor 92, an end part 92a and a terminal 5 of the contact part 92 and is introduced into an oscillator 10, and alternately flows in an arrow direction via the other terminal 5, and as it does not pass the coil spring 95, inductance does not remain in series in the oscillator 10. Accordingly, series resonance frequency is not charged by measuring the series resonance frequency to be lower than original frequency and a degree of expansion and contraction of the spring 95, and then the measurement is not unstable.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig for measuring characteristics of a crystal unit.

[0002]

2. Description of the Related Art FIG. 1 is a perspective view of a rectangular AT-cut quartz resonator 10 housed in a cylindrical container. In FIG. 1, reference numeral 1 denotes a metal cover. The AT-cut crystal resonator is a step of processing a rough quartz crystal into a desired AT-cut crystal resonator element 2, a step of forming an electrode 3 on the resonator element 2, and a hermetic terminal 4.
Mounting step for fixing the resonator element 2 to the terminal 5, a step of adjusting the frequency to a required frequency, a step of hermetically sealing the resonator element 2 with the metal cover 1, and the characteristics of the crystal resonator satisfy the requirements of the user. It consists of a characteristic measuring step for inspecting whether or not it is performed. In the following, a rectangular AT stored in a cylinder type container
The cut crystal resonator 10 (hereinafter, referred to as a crystal resonator) will be described as an example, but is not limited to the illustration.

FIG. 2 shows an equivalent circuit of a quartz oscillator. FIG.
Shows an equivalent circuit when a capacitor CL31 is connected in series to a crystal unit. FIG. 4 shows an equivalent circuit when an inductance L41 is connected in series to the crystal unit. The series resonance frequency Fc in which a capacitor is connected in series to the crystal unit is higher than the series resonance frequency F1 in which nothing is connected. Conversely, the series resonance frequency FL when the inductance L41 is connected in series to the crystal unit becomes lower than the series resonance frequency F1 where nothing is connected. Since the crystal resonator has the above-mentioned frequency characteristics, it is manufactured by adjusting the frequency of the crystal resonator according to the load capacitance of the oscillation circuit used by the user.

FIG. 5 is a schematic view of a characteristic measuring device for inspecting whether or not the characteristics of the crystal unit satisfies the specification required by the user. FIG. FIG. 3 is a schematic diagram of a state in which the electrical characteristics are measured by contacting the. FIG. 7 is a perspective view of a carrier provided with an oscillation circuit board, a contact fixing base, and a quartz oscillator of a frequency measurement unit (parts unnecessary for description are not shown). FIG.
FIG. 9 is a perspective view of a contact pin in which a contact portion and a fixed portion are separated from each other. FIG. 9 is a schematic diagram showing a flow of an electric signal when measuring the crystal unit using the contact pins in pairs. FIG.
0 is a perspective view of a contact pin used in the present invention, in which a fixed portion and a contact portion are separated, and FIG. 11 shows a flow of an electric signal when measuring a crystal unit using the contact pins of FIG. 10 in pairs. FIG. FIG. 12 is a perspective view of a contact pin in which a contact portion and a fixed portion are integrated.

[0005] In a contact pin in which the contact portion and the fixed portion are integrated, the position of the contact portion is greatly changed depending on the manner of fixing and the length of the straight portion, and it is difficult to use. Used in the field. On the other hand, a contact pin in which a contact portion and a fixed portion are separated is used in a field requiring high positional accuracy. The present invention relates to a jig for measuring characteristics of a crystal unit using a contact pin in which a contact portion and a fixed portion are separated.

In the characteristic inspection apparatus shown in FIG. 5, the quartz oscillators 10 pooled in the sample supply unit 55 are arranged on the sample transfer table 54 via the supply path 56, and are conveyed to the front of the frequency measurement unit 51 and stopped. The crystal unit 10 includes a frequency measuring unit 51
After the frequency is inspected, the transport is stopped before the constant measuring section 52 stops. The crystal unit 10 includes a constant measuring unit 52
After the various constants of R1, L1, C1, and Co shown in FIG. 2 have been inspected, they are transported to the position before the insulation resistance measuring unit 53 and stopped. The crystal unit 10 is connected to its terminal 5 by an insulation resistance measuring unit 53.
The insulation resistance between them is checked. The above inspection information is taken into a computer (not shown), and it is determined whether or not the characteristics of the crystal unit satisfy the requirements of the user.
As a result of the determination, the accepted product is transported to the accepted product storage box (not shown) of the sample storage unit 57, and the failed product is transported to the failed product storage box (not shown) of the sample storage unit 57, respectively.

In the schematic diagram of FIG. 6, reference numeral 61 denotes a substrate for an oscillation circuit. Reference numeral 62 denotes a contact pin fixing base on which two contact pins 80 are fixed. An IC 63 constituting an oscillation circuit is mounted on the oscillation circuit substrate 61, and one end 81 a of a fixed portion 81 of the contact pin 80 is connected to the lead wire 64 via a pattern (not shown) formed on the oscillation circuit substrate 61. Is connected to Sample transfer table 54
The terminal 5 of the crystal unit 10 conveyed by the above is pressed against the contact portion 82 of the contact pin 81 to establish electrical continuity and measurement is performed.

FIG. 9 is a schematic diagram showing the flow of electric signals when measuring a crystal unit using contact pins in pairs. The current from one end 81a of the right contact pin 80 is supplied to the coil spring 83, the contact portion 82, the terminal 5 of the crystal unit,
Crystal oscillator, terminal 5 of crystal oscillator, contact portion 82 of left contact pin, coil spring 83, contact pin 80
Flows along one end 81a and the arrow. Since it is an exchange, the direction of the arrow changes each time.

[0009]

The contact pin 80 shown in FIG. 9 is shown in a sectional view taken along the line AA of the contact pin 80 shown in FIG. 8 for convenience of viewing the flow of electric signals. A compression coil spring 83 is embedded in the fixed portion 81 as shown in FIG. 9 in order to absorb variation in height of the terminals 5 of the two crystal oscillators and to reduce impact at the time of contact. . Since the electric signal flows through the compression coil spring 83 as shown in FIG. 9, an inductance is placed in series with the crystal resonator 10 as shown in FIG. 4, and the loaded series resonance frequency is measured lower than the original frequency. Further, the series resonance frequency under load changes depending on the degree of expansion and contraction of the compression coil spring 83, and stable measurement cannot be performed (in FIG. 9, the compression coil spring of the right contact pin is largely contracted). In other words, there is a problem that a non-defective product is erroneously determined as a defective product and a defective product is originally determined as a non-defective product. As described above, there is a problem that the measurement is not reliable and the measurement yield is poor. An object of the present invention is to solve the above-mentioned problems.

[0010]

SUMMARY OF THE INVENTION A characteristic measuring jig for a crystal unit having a contact pin having a rod-shaped contact portion and a cylindrical fixed portion separated from each other and having a function of extracting the vibration frequency by contacting the terminal of the crystal unit. The end of the rod-shaped contact portion of the contact pin opposite to the end in contact with the crystal oscillator terminal is fixed to the oscillation circuit substrate, and the contact pin fixing portion of the oscillation circuit substrate and the oscillation circuit are close to each other. And placed
A flexible portion that allows the contact pin to move is provided near the contact pin fixing portion of the oscillation circuit substrate, and the coil spring is not interposed between the terminal of the crystal oscillator and the electrical conduction portion of the oscillation circuit. A plurality of pairs of contact pins are fixed to the oscillation circuit board of the crystal oscillator characteristic measuring jig, and the oscillation circuit board between each pair is provided with a cut portion so that it can operate individually.

[0011]

FIG. 10 is a perspective view of a contact pin 90 used in the present invention, in which a fixed portion and a contact portion are separated from each other. FIG. 11 shows a crystal resonator using the contact pins of FIG. 10 in pairs. FIG. 4 is a schematic diagram showing a flow of an electric signal when measuring the electric field. The contact pin 90 includes a contact portion 92 and a fixing portion 91. The contact pin 90 is fixed to the contact pin fixing base 62 via the fixing portion 91. The contact portion 92 is provided with a stopper portion 93 for stopping the compression coil spring 95 and a detachment prevention portion 94. The contact portion 92 penetrates the compression coil spring 95 and the fixed portion 91. An insulating portion 96 is provided between the compression coil spring 95 and the fixed portion 91 so that an electric signal does not pass through the compression coil spring 95. Contact part 9
2 is made of brass or phosphor bronze, but is not particularly limited, and the fixing portion 91 does not need to be a conductive member and may be an insulating member. Without providing the insulating part 96,
The compression coil spring may be insulated or may be an insulating member.

In FIG. 11, the right contact pin 9
The current from one end 92b of the contact portion 92
2, the other end 92a of the contact portion 92, the crystal oscillator terminal 5, the crystal oscillator 10, the crystal oscillator terminal 5, the contact portion 92 of the left contact pin, the contact portion 92 of the contact pin 90 and one end 92b according to the arrow. Flows. Since it is an exchange, the direction of the arrow changes each time. The contact pin 90 shown in FIG.
BB section. When contacting the contact pin 90, a compression coil spring 95 is provided on the fixing portion 91 to absorb the variation in height of the terminals 5 of the two crystal oscillators and to alleviate the impact at the time of contact. Are provided between the stopper portions 93 provided in the above. Unlike the prior art, the electric signal does not flow through the compression coil spring 95, so that no inductance is added in series to the crystal unit 10 as shown in FIG. , And the series resonance frequency does not change due to the degree of expansion and contraction of the compression coil spring 95, and stable measurement cannot be performed. In other words, the problem of erroneously determining a good product as a defective product and a bad product as a non-defective product could be solved.

FIG. 7 is a perspective view of an oscillation circuit board of a frequency measuring section, a contact pin fixing base, and a carrier with a crystal unit. In mass production of the crystal unit 10, the carrier 58 that can handle a plurality of the crystal units 10 is used without using the crystal units individually. This figure shows an example in which five crystal units 10 are fixed to one carrier. Since the characteristic measurement is also performed on five crystal units at the same time, five pairs of contact pins are fixed to the contact pin fixing base 62. The oscillation circuit substrate 61 also has five oscillation circuit ICs 63 mounted thereon. The contact pins 90 and the pattern (not shown) of the circuit board 61 are fixed by lead wires 64.

In order to bring the terminal 5 of the crystal unit 10 into contact with the contact portion 92a of the contact pin 90, the contact portion 92 of the contact pin 90 is integrated regardless of whether the contact pin fixing table 62 or the carrier 58 is moved. Therefore, the contact portion 92 is pushed up above the contact pin fixing base 62. In FIG. 7, since the lead wire 64 is used for connection to the oscillation circuit, the movement of the contact portion 92 of the contact pin can be absorbed by bending the lead wire 64. However, since there is a distance between the contact pin and the oscillation circuit, there is a disadvantage that a stray capacitance is put on the circuit and the series resonance frequency is increased as described with reference to FIG.

According to the present invention, the contact pins are directly fixed to the circuit board, and the oscillation circuit is arranged as close to the contact pins as possible.
A flexible portion is provided to absorb the movement of the contact pin.

FIG. 13 is a top view and a side view of a circuit board for realizing the present invention. A flexible sheet is used for the circuit board, and cut portions 66 are provided between the contact pin fixing portions 65 so that the fixing portions can move individually. Although not shown, a cutting portion may be provided between the pair of contact pins if necessary. Since it is better not to move the portion where the IC 63 is mounted, it is reinforced by the backing member 67.
The unlined part of the circuit board can move in the direction of the arrow in the figure, and if the characteristic measurement device and the contact pin fixing base are connected by a flexible sheet circuit board, no load is applied to the circuit board .

FIG. 14 is a perspective view in which the circuit board of FIG. 13 is directly fixed to contact pins. Since the distance between the crystal unit and the oscillation circuit can be minimized, the stray capacitance can be reduced. The length of the distance between the oscillation circuit and the measuring device does not affect the measurement.

[0018]

According to the present invention described in detail above, the following effects can be obtained.

Since the electric signal does not flow through the compression coil spring, no inductance is connected in series with the crystal unit 10. Accordingly, the series resonance frequency at the time of load can be measured normally without being erroneously measured. The problem of erroneously determining a good product as a defective product and a good product as a defective product is eliminated.
The reliability and yield of the measurement process are improved.

Fixing the contact pins directly to the circuit board,
Since the contact pins can be moved on the circuit board and the oscillation circuit is mounted near the contact pins, the fluctuation of the frequency due to the load capacitance is small, and the measurement of high frequency is particularly stable.

Since the circuit board is such that a plurality of pairs of contact pins can move individually, a plurality of pairs of contact pins can be fixed to the circuit board, and the circuit board can be downsized. Also,
Maintenance has become easier.

[Brief description of the drawings]

FIG. 1 is a perspective view of a rectangular AT-cut quartz resonator.

FIG. 2 is a diagram showing an equivalent circuit of a crystal resonator.

FIG. 3 is a diagram showing an equivalent circuit of a crystal unit having a load capacitance.

FIG. 4 is a diagram showing an equivalent circuit of a crystal unit having an inductance.

FIG. 5 is an apparatus for measuring characteristics of a crystal unit.

FIG. 6 is a schematic diagram of a frequency measurement unit.

FIG. 7 is a perspective view of a frequency measurement unit.

FIG. 8 is a perspective view of a contact pin.

FIG. 9 is a schematic diagram showing a flow of an electric signal.

FIG. 10 is a perspective view of a contact pin.

FIG. 11 is a schematic diagram showing a flow of an electric signal.

FIG. 12 is a perspective view of a contact pin.

FIG. 13 is a circuit board used in the present invention.

FIG. 14 is a perspective view of a fixing portion between the circuit board and the contact pins.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 metal cover 2 vibrating piece 3 electrode 4 hermetic terminal 5 terminal 10 crystal resonator 31 capacitance CL 41 inductance L 50 characteristic inspection device 51 frequency measuring unit 52 constant measuring unit 53 insulation resistance measuring unit 54 sample carrier 55 sample supply unit 56 supply Path 57 Sample storage section 58 Carrier 61 Oscillation circuit board 62 Contact pin fixing base 63 IC 64 Lead wire 65 Contact pin fixing section 66 Cutting section 67 Backing member 80 Conventional contact pin 81 Fixing section 81 One end of fixing section 82 Contact section 83 Compression Coil spring 90 Contact pin 91 Fixed part 92 Contact part 92a End of contact part 92b One end of contact part 93 Stopper part 94 Pull-out prevention part 95 Compression coil spring 96 Insulation part

 ──────────────────────────────────────────────────続 き Continued on front page (72) Inventor Kazuo Otaka 4107 Miyoshida, Miyoshida-cho, Kitasaku-gun, Nagano Pref.

Claims (2)

[Claims] 1. A jig for measuring characteristics of a crystal unit having a contact pin having a rod-shaped contact portion and a cylindrical fixed portion having a function of taking out a vibration frequency by contacting the terminal of the crystal unit. The other end of the pin-shaped contact portion of the pin that is in contact with the terminal of the crystal resonator is fixed to the oscillation circuit substrate, and the contact pin fixing portion of the oscillation circuit substrate and the oscillation circuit are arranged close to each other. The oscillator circuit substrate has a flexible portion in the vicinity of the contact pin fixing portion near the contact pin fixing portion, and a coil spring is not interposed between the terminal of the crystal oscillator and the electrical conduction portion of the oscillation circuit. Jig for measuring the characteristics of quartz crystal resonators. 2. A plurality of pairs of contact pins are fixed to an oscillation circuit substrate of a crystal resonator characteristic measuring jig, and a cut portion is provided so that the oscillation circuit substrate between each pair can be individually moved. A jig for measuring characteristics of a quartz oscillator.