JPH0311666B2 - - Google Patents

Info

Publication number
JPH0311666B2
JPH0311666B2 JP58059808A JP5980883A JPH0311666B2 JP H0311666 B2 JPH0311666 B2 JP H0311666B2 JP 58059808 A JP58059808 A JP 58059808A JP 5980883 A JP5980883 A JP 5980883A JP H0311666 B2 JPH0311666 B2 JP H0311666B2
Authority
JP
Japan
Prior art keywords
frequency
circuit
oscillation
shot
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58059808A
Other languages
Japanese (ja)
Other versions
JPS59184866A (en
Inventor
Tadakazu Seki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZENERARU RISAACHI OBU EREKUTORONITSUKUSU KK
Original Assignee
ZENERARU RISAACHI OBU EREKUTORONITSUKUSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZENERARU RISAACHI OBU EREKUTORONITSUKUSU KK filed Critical ZENERARU RISAACHI OBU EREKUTORONITSUKUSU KK
Priority to JP58059808A priority Critical patent/JPS59184866A/en
Publication of JPS59184866A publication Critical patent/JPS59184866A/en
Publication of JPH0311666B2 publication Critical patent/JPH0311666B2/ja
Granted legal-status Critical Current

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  • Locating Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【発明の詳細な説明】 本発明は電子回路に於いて特定の回路部分又は
回路要素のシヨート状況を発見するための方式に
関している。従来このような目的に対しては、い
わゆるテスタのような導通測定手段が使用されて
いるが、特定の回路中に於いてはそのような手段
をもつてシヨート個所を決定することは回路要素
又は部品を実装したままでは往々不可能である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for discovering the short status of a particular circuit portion or circuit element in an electronic circuit. Conventionally, continuity measuring means such as so-called testers have been used for this purpose, but in a particular circuit, it is difficult to determine the shot location using such means. This is often impossible with components still mounted.

例えば、第1図に示すように、とのプリン
ト・パターン導電路に並列にコンデンサC1,C2
C3、ダイオードD1、コイルL1、更にはソケツト
又はコネクタP1等が接続している場合、たとえ
ばいずれかの回路要素に障害があつてシヨート状
態を呈した場合、上記のような導通測定手段をも
つてしては、各部品を順次取外して単品にてシヨ
ート・チエツクを行なわなくてはその状況の発見
は全く不可能である。また、ソケツト、コネクタ
等P1の装着部のプリント・パターンは目視不可
能なこともあつて、パターン・シヨート状態の発
見は極めて困難である。これらシヨート状況は仮
に1/1000オームの分解能をもつたオーム計を使用
したとしても決定できない。
For example, as shown in FIG. 1, capacitors C 1 , C 2 ,
If C 3 , diode D 1 , coil L 1 , or even socket or connector P 1 are connected, for example, if any of the circuit elements is faulty and exhibits a short condition, continuity measurement as described above can be carried out. It is completely impossible to discover the situation unless you remove each part one by one and shot-check each part individually. Furthermore, the printed patterns on the mounting parts of P1 such as sockets and connectors are not visible, making it extremely difficult to detect pattern shorts. These short situations cannot be determined even if an ohmmeter with a resolution of 1/1000 ohm is used.

本発明は、UHF帯の発振回路にあつてその発
振周波数が発振定数の微妙な変化に対して大きく
変動するという電子回路上の現象を利用する。そ
こで、シヨートの経路にあるインダクタとして発
振回路にとり入れる。この発振回路に関連し2本
の接触リードが設けられ、これらリードをシヨー
ト・ライン上のパーツの両端に接触させると、シ
ヨートの際に発振回路はある固有の周波数を表示
し、この周波数の値を予め知つてシヨート部を決
定する。
The present invention utilizes a phenomenon in electronic circuits in which the oscillation frequency of a UHF band oscillation circuit fluctuates greatly in response to subtle changes in the oscillation constant. Therefore, it is incorporated into the oscillation circuit as an inductor in the short path. Two contact leads are provided in connection with this oscillator circuit, and when these leads are brought into contact with both ends of the part on the shot line, the oscillator circuit will display a certain natural frequency during shooting, and the value of this frequency Determine the short part by knowing this in advance.

第2図は本発明の原理を示し、,は第1図
に関連して述べたと同様プリント回路導電パター
ンを示し、これと並列に例えば3つのコンデンサ
C1,C2及びC3が接続しているものとする。10
は400MHz帯の発振回路、11,12はその回路
から伸びる接触リード、13は発振周波数を読み
とる周波数カウンタである。周波数カウンタ13
は周知のものであつてもよい。第2図に於いて、
今仮にコンデンサC2がシヨート状態となつてい
るものと想定する。コンデンサC1の丁度真下に
リード棒11,12を接触させるものとする。こ
の場合14で示すルートに相当するインダクタ
(コイル)が発振回路に挿入されるように構成さ
れる。勿論この場合実際にはコンデンサC1,C3
やプリント・パターンの等価回路も影響を与え
る。この図に於いて、周波数カウンタ13の表示
はシヨート状態のコンデンサC2の丁度真下にリ
ード棒を当てた時に、インダクタンス即ち短絡ル
ートが最小となるため、最も高く(高周波数値)
表示する。発振周波数をUHF帯に取つているた
め、コンデンサC1とC2との間隔(a−b)が1
cm程度でも充分な判別可能である。本発明の実際
の使用に当り、予め2本のリード棒の先端をシヨ
ートし、その時の周波数表示を知り、その時の周
波数と上述した測定値の周波数との差が、実験に
より定めた所定値、例えば1MHz以下までに近づ
くパーツがあつた時そのパーツがシヨートしてい
ることが判断できることを知つた。
FIG. 2 illustrates the principle of the invention, in which , indicates a printed circuit conductive pattern similar to that described in connection with FIG. 1, in parallel with which, for example, three capacitors
Assume that C 1 , C 2 and C 3 are connected. 10
is a 400MHz band oscillation circuit, 11 and 12 are contact leads extending from the circuit, and 13 is a frequency counter that reads the oscillation frequency. Frequency counter 13
may be well known. In Figure 2,
Assume now that capacitor C2 is in the shorted state. Assume that the lead rods 11 and 12 are brought into contact just below the capacitor C1 . In this case, an inductor (coil) corresponding to the route indicated by 14 is inserted into the oscillation circuit. Of course, in this case, actually the capacitors C 1 and C 3
and the equivalent circuit of the printed pattern also have an influence. In this figure, the display on the frequency counter 13 is highest (high frequency value) when the lead rod is placed just below the shorted capacitor C 2 because the inductance, that is, the short circuit route is at its minimum.
indicate. Since the oscillation frequency is set to the UHF band, the distance (a-b) between capacitors C1 and C2 is 1
It is possible to make a sufficient distinction even at a distance of about cm. In actual use of the present invention, the tips of the two lead rods are shot in advance, the frequency display at that time is known, and the difference between the frequency at that time and the frequency of the above-mentioned measured value is a predetermined value determined by experiment. For example, I learned that when a part approaches 1MHz or less, it can be determined that that part is shooting.

第3図は第2図に示す発振回路10の一実施例
を示す。11及び12は1mmφ、25mmの銅リード
棒、15は第2図のルート14を形成するインピ
ーダンスである。同軸ケーブル16を介して周波
数カウンタ13に接続され、発振周波数が読みと
られる。この発振器はインピーダンス15がZ=
O+jO〔Ω〕の時405.0MHzを発振するように調整
されるようになつている。
FIG. 3 shows an embodiment of the oscillation circuit 10 shown in FIG. 11 and 12 are copper lead rods of 1 mmφ and 25 mm, and 15 is an impedance forming the route 14 in FIG. It is connected to a frequency counter 13 via a coaxial cable 16, and the oscillation frequency is read. This oscillator has impedance 15 of Z=
It is adjusted to oscillate at 405.0MHz when O+jO [Ω].

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明の原理を使用するた
めに用いる概略図、第3図は第2図の一部の要素
の詳細回路図を示し、図で10は発振回路、1
1,12は接触リード棒、13は周波数カウンタ
を示す。
1 and 2 are schematic diagrams used to use the principles of the present invention, and FIG. 3 is a detailed circuit diagram of some of the elements in FIG. 2, where 10 is an oscillation circuit;
1 and 12 are contact lead rods, and 13 is a frequency counter.

Claims (1)

【特許請求の範囲】[Claims] 1 複数の並列接続された回路要素又は部品のい
ずれかのシヨート状況を判別決定する方式に於い
て、高周波発振回路の発振周波数決定部分からの
2つの端子を上記回路要素又は部品に接触させ、
その時の上記高周波発振回路の周波数と、上記端
子間をシヨートさせる時の周波数の差が所定値以
下の時上記回路要素又は部品が上記シヨートして
いるとすることを特徴とする上記方式。
1. In a method for determining the shot status of any of a plurality of parallel-connected circuit elements or components, two terminals from an oscillation frequency determining portion of a high-frequency oscillation circuit are brought into contact with the circuit element or component,
The above system is characterized in that the circuit element or component is determined to be shooting when the difference between the frequency of the high frequency oscillation circuit at that time and the frequency when the terminals are shot is less than or equal to a predetermined value.
JP58059808A 1983-04-05 1983-04-05 Short-circuit determining system Granted JPS59184866A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58059808A JPS59184866A (en) 1983-04-05 1983-04-05 Short-circuit determining system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58059808A JPS59184866A (en) 1983-04-05 1983-04-05 Short-circuit determining system

Publications (2)

Publication Number Publication Date
JPS59184866A JPS59184866A (en) 1984-10-20
JPH0311666B2 true JPH0311666B2 (en) 1991-02-18

Family

ID=13123908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58059808A Granted JPS59184866A (en) 1983-04-05 1983-04-05 Short-circuit determining system

Country Status (1)

Country Link
JP (1) JPS59184866A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9368468B2 (en) 2009-07-15 2016-06-14 Qualcomm Switch Corp. Thin integrated circuit chip-on-board assembly

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63142204A (en) * 1986-12-05 1988-06-14 Nec Corp Apparatus for measuring length of pattern line
KR100430221B1 (en) * 1999-08-23 2004-05-03 엘지산전 주식회사 Test apparatus for the switch lines of digital controller

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9368468B2 (en) 2009-07-15 2016-06-14 Qualcomm Switch Corp. Thin integrated circuit chip-on-board assembly

Also Published As

Publication number Publication date
JPS59184866A (en) 1984-10-20

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