JPH10253534A - Luster measuring apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enable measuring of luster on a surface to be measured with large variations without elongating the size of an optical system, by switching the normal measuring mode to a sequential averaging mode to sequentially average data obtained by measurement. SOLUTION: A surface 9 to be measured is irradiated with near infrared rays 10 from a light source 8 and the reflected light 14 is detected by a photo detector 13. The resulting detection output is amplified by a preamplifier 22 and inputted by a microcomputer 19 to perform various computations based on an output of an operating part. In other words, by depressing a mode switch key of the operating part, when luster is uniform, the operation is switched to the normal mode and is switched to the sequential average mode when variations are large. In the normal measuring mode, the degree of luster of the surface 9 to be measured is measured and displayed. The sequential average mode is a surface measuring mode and in this mode, a data is brought in at each time interval while a data in key is depressed continuously and a mean obtained is displayed. Upon the stop of depressing the key, a mean of measured values thus far collected is held and displayed.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to an apparatus for measuring the gloss of the surface of an object.

[0002]

2. Description of the Related Art A method generally used as a method for measuring the gloss of the surface of an object is a specular gloss measurement method, and an optical system thereof is shown, for example, in FIG. That is,
As shown in FIG. 10, the light source 51 and the light receiver 52 are arranged so that the incident angle θ ₁ and the reflection angle θ ₂ are the same with respect to the surface 50 to be measured. When the light is irradiated toward the surface to be measured 50, the light 53 irradiates the surface to be measured 50 as a parallel light beam 55 through an optical lens 54, and the light 56 reflected here is received through an optical lens 57 and a light receiving side slit 58. Incident on the vessel 52.

The output of the light receiver 52 indicates an average gloss within an irradiation area determined by a parallel light beam 55 on the incident side, and the diameter of the light beam 55 is 6 mm or 12 mm. And the JIS standard recommends such a size.

[0004]

However, the method for measuring the specular glossiness is applied when the glossiness of the surface to be measured 50 is relatively uniform, and for example, the variation in glossiness such as a tile for a floor. Is not always appropriate when measuring the gloss of the surface of relatively large objects. Thus, it is conceivable to increase the diameter of the light beam 55 to increase the measurement area. However, in such a case, the optical system becomes larger, and the device becomes larger accordingly. Further, the measured surface 50 is set to 5 to 1
A method of selecting and measuring zero points and taking the average value of the measured values is conceivable, but has a disadvantage that it takes time and effort.

On the other hand, in order to simplify the operation of calculating the average value, there is a gloss measuring device having a built-in data memory function and an average value calculation function. In this type of gloss measuring device, data is stored one by one by an operation such as pressing a data input key, and an average value is calculated after measurement. It is not always effective as a method of taking the average value of the surface, and a simpler method of measuring the average value has been required.

SUMMARY OF THE INVENTION The present invention has been made in consideration of the above-mentioned problems, and has as its object to easily and easily measure a gloss on a surface to be measured having a large variation in gloss without increasing the size of an optical system. It is to provide a gloss measuring device that can be operated.

[0007]

In order to achieve the above object, the present invention provides a gloss measuring apparatus in which light is emitted from a light source to a surface to be measured and reflected light at that time is detected by a light receiver. Is configured to be switchable between a normal measurement mode and a mode in which data obtained by measurement can be sequentially averaged and displayed.

More specifically, according to the present invention, in a gloss measuring device in which light is irradiated from a light source onto a surface to be measured and reflected light at that time is detected by a light receiver, an average value is calculated during measurement. Switching means for starting the calculation, means for calculating the average value of the measured values sampled after the start of the switching, means for displaying the calculation result, and the measurement values sampled immediately before the calculation was stopped. Means for holding the average value and displaying the data for a certain period of time, and then returning to the original sequential data display.

In the gloss measuring device having the above-described structure, when the gloss of the surface to be measured is uniform, the measurement is performed in the normal measurement mode as in the conventional gloss measuring device of this type. When the variation in the gloss of the surface to be measured is large, the mode is sequentially switched to the averaging mode, the surface to be measured is slid while the "data in" key is pressed, and the average value of the data sampled during that time is obtained. As a result, compared to a conventional gloss measuring device that can perform only the normal measurement mode and the data display mode, averaged gloss information of a wider measurement surface can be obtained.

[0010]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below with reference to the drawings.

First, FIGS. 1 to 4 show an example of a gloss measuring apparatus according to the present invention. FIG. 1 is a block diagram schematically showing the entire configuration of the apparatus, and FIG. 2 is a perspective view showing the appearance of the apparatus. 3 is a longitudinal sectional view showing the configuration of the optical system, FIG. 4A is a plan view showing the configuration of the display unit, and FIG. 4B is a plan view showing the arrangement of keys in the operation unit.

First, in FIG. 2, reference numeral 1 denotes a gloss measuring device main body, an optical system 2 (to be described later) is provided at the lower center, and a display unit 3 (to be described later) and an operation unit 4 (to be described later) are provided on the upper surface. ) Is provided. A protective cap 7 provided with a battery box 5 and a calibration standard plate 6 is provided below the apparatus main body 1. The protective cap 7 is described in detail in Japanese Utility Model Publication No. 6-19081.

The structure of the optical system 2 will be described with reference to FIG. 3. Reference numeral 8 denotes a light source which emits near-infrared light 10 having a peak wavelength of, for example, 0.88 μm to a surface 9 to be measured. It consists of a light emitting diode and is held at the upper end side of a holder 11 inclined at a predetermined angle. 12 is a holder 1
An optical lens provided on the lower end side of the light source 1 for irradiating near-infrared light 10 having a parallel light beam to the surface 9 to be measured.

A photodetector 13 detects the light 14 reflected on the surface 9 to be measured. The photodetector 13 is a photodiode having a detection peak wavelength of, for example, 0.9 μm, and is tilted so as to correspond to the holder 11. Holder 15
Is held on the upper end side. 16 is an optical lens, and 17 is a slit. Note that the holders 11 and 15 receive the incident light 1
0 and the reflected light 14 are inclined so that the angle between the normal line 18 and the normal line 18 is, for example, 60 °.

In FIG. 1, reference numeral 19 denotes a microcomputer which controls the entire apparatus based on an input from the operation unit 4 and performs various calculations. Reference numeral 20 denotes a light emission drive circuit for causing the light source 8 to emit light intermittently. The light emission drive circuit 20 has, for example, a duty 1 based on a pulse from an oscillation circuit 21 controlled by the microcomputer 19.
/ 20 (light emission cycle 1msec, light emission time 50μsec)
Is output. Reference numeral 22 denotes a preamplifier for appropriately amplifying the output of the photodetector 13, and reference numeral 23 denotes an A / D
The output of the light receiver 13 is a converter,
The data is input to the microcomputer 19 through 23.

Further, the configurations of the display unit 3 and the operation unit 4 will be described with reference to FIG. First, the operation unit 4
The power key 24, the "calibration" key 25, the "data in" key 26,
A "mode switching" key 27, a clear key 28, an "average" key 29, an "all average" key 30, and an up / down key 31 are provided. The display unit 3 is made of, for example, a liquid crystal panel. As shown in FIG. 1A, the gloss value display unit 32, the mode display unit “DATA” 33A, the mode display unit “MEAS” 33B, and the average value display unit “ AVG "3
4, an overrange display section "OVER" 35, a battery alarm display section "BAT" 36, a data number display section "DATA NO."

The "calibration" key 25 is used for calibrating the sensitivity before measurement, and the "data in" key 26 is pressed while the "calibration" key 25 is pressed.

The "data in" key 26 is used to store measurement data.

The clear key 28 is for erasing all stored data, and the "data in" key 26 is pressed while holding this key 28.

The "average" key 29 is a key used for obtaining an average value of stored data.

The "total average" key 30 is a key used for obtaining an average (total average) of the stored average values.

The gloss measuring device of the present invention cyclically switches to three modes of a "normal measurement mode", a "data display mode" and a "sequential averaging mode" by appropriately pressing a "mode switching" key 27. It is configured to be switchable. Here, of the three modes, the “normal measurement mode” and the “data display mode” are the modes provided in the conventional gloss measurement device, but the “sequential averaging mode” is newly added by the present invention. Mode. Hereinafter, these modes will be described in detail.

The "normal measurement mode" is a continuous display mode in which the glossiness of the surface 9 to be measured is measured, displayed, and stored. When in this mode, the "mode display section 33A""MEAS" is displayed and "DATA IN"
Each time the key 26 is pressed, the measurement data at that time can be stored.

The "data display mode" is a mode for displaying stored data or an average value. When in this mode, "DATA" on the mode display section 33B is displayed, and the data stored by the up / down key 31 is displayed. (For example, up to 99) can be confirmed. Then, an average value of the stored data can be obtained by the “average” key 34.

The "sequential averaging mode" is a mode which can be called a "surface measurement mode". When in this mode, "MEAS" of the mode display section 33A and "DATA" of the mode display section 33B are displayed. Both are displayed,
When the "Data In" key 26 is pressed, the "MEAS" 3
3A, the “DATA” 33B flashes and the “Data In” key 26 is kept pressed for a certain period of time (for example, 0.5
Every second) and display the average value (for example, moving average value). Then, the "data in" key 26
When the user stops pressing, the average value of the measurement values collected so far is held and displayed.

FIGS. 5 to 7 show an example of a program for performing the operation in each of the above modes.
Indicates the “normal measurement mode”, and FIG. 6 indicates the “data display mode”.
FIG. 7 shows the “successive averaging mode”.
Such a program is stored in a ROM (not shown) of the microcomputer 19.

FIG. 8 is a diagram schematically showing the function of the gloss measuring device having the above-mentioned configuration. In FIG. 8, reference numeral 38 denotes a driver for driving the display unit 3 formed of a liquid crystal panel.

In the gloss measuring device having the above-described configuration, any one of the "normal measurement mode", the "data display mode", and the "successive averaging mode" can be selected and set by appropriately pressing the "mode switching" key 27. When the “normal measurement mode” is set, as shown in FIG. 5, the glossiness of the surface 9 to be measured can be measured, and the result can be displayed or stored.

When the mode is set to the "data display mode", the stored data or the average value can be displayed as shown in FIG.

When the "sequential averaging mode" is set, as shown in FIG. 7, by sliding the surface 9 to be measured while pressing the "data-in" key 26, the data sampled during that time is displayed. An average value is determined. When the user stops pressing the "data in" key 26, the average value of the measured values collected so far is held and displayed.

In the above embodiment, when averaging data, the average value is calculated from the start of sampling. However, the present invention is not limited to this.
A moving average value may be calculated.

FIG. 9 is a diagram for explaining the effect of moving average of the data obtained in the "sequential averaging mode". When the gloss measuring device is moved on the surface 9 to be measured, its gloss distribution is measured. The instruction varies according to (see (B) in the figure) (see (C) in the figure), but by taking the moving average, a value with relatively small fluctuation (see (D) in the figure) can be obtained. I understand.

[0033]

The present invention is embodied in the above-described embodiment and has the following effects.

The gloss measuring apparatus according to the present invention is configured so that the mode can be switched between a normal measuring mode and a mode in which data obtained by the measurement can be sequentially averaged and displayed. Is simplified, so that it is possible to easily measure the gloss of the surface to be measured having a large variation in gloss.

Since the measurement area can be equivalently enlarged by the mode switching operation, it is not necessary to increase the luminous flux used for measurement, and the optical system can be small and compact. Can be

[Brief description of the drawings]

FIG. 1 is a block diagram schematically showing an overall configuration of a gloss measuring device according to the present invention.

FIG. 2 is a perspective view showing the appearance of the gloss measuring device.

FIG. 3 is a longitudinal sectional view showing a configuration of an optical system in the gloss measuring device.

FIG. 4A is a plan view showing a configuration of a display unit in the gloss measuring device, and FIG. 4B is a plan view showing an arrangement of keys on an operation unit in the gloss measuring device.

FIG. 5 is a flowchart for explaining the operation of the gloss measuring device together with FIGS. 6 and 7, and mainly shows a normal measurement mode.

FIG. 6 is a flow chart for explaining the operation of the gloss measuring device together with FIGS. 5 and 7, showing a data display mode.

FIG. 7 is a flow chart for explaining the operation of the gloss measuring device together with FIG. 5 and FIG. 6, showing a sequential averaging mode.

FIG. 8 is a diagram schematically showing a function of the gloss measuring device.

FIG. 9 is a diagram for explaining the operation and effect of a moving average calculation when the gloss measuring device performs measurement in a sequential average mode.

FIG. 10 is a diagram for explaining a conventional technique.

[Explanation of symbols]

8 light source, 9 measured surface, 10 incident light, 13 light receiver, 14 reflected light, 27 mode switching key.

Claims (3)

[Claims] 1. A light source irradiates light to a surface to be measured,
In the gloss measuring device in which the reflected light at that time is detected by a light receiver, the gloss measuring device is configured to be switchable between a normal measurement mode and a mode in which data obtained by the measurement can be sequentially averaged and displayed. Gloss measuring device. 2. A light source irradiates light to a surface to be measured,
In a gloss measuring device configured to detect the reflected light at that time in a light receiver, a switching unit for starting an average value calculation during measurement, and a unit for calculating an average value of measured values sampled after the start of switching. Means for displaying the calculation result, and means for holding the average value of the measurement values sampled immediately before the calculation is stopped, displaying the result for a certain period of time, and then returning to the original sequential data display. A gloss measuring device characterized by: 3. The gloss measuring device according to claim 2, wherein the average value is obtained by a moving average calculation.