JPH1019973A - Circuit tester - Google Patents

Abstract

PROBLEM TO BE SOLVED: To reduce the trial evaluation equipment and apparatus for testing the function of an alternative IC and the labor required for evaluation significantly by comparing the output from an IC of disused type with that from the alternative IC based on the information of the electrical characteristics or the pin function of the IC of disused type. SOLUTION: Upon occurrence of an IC of disused type, the information on the electrical characteristics or the pin function thereof is inputted from a panel section 10 and stored in a memory section 20. Based on that information, a test control section 50 generates a test pattern which is then inputted to a socket part 30 to be tested inserted with the IC of disused type and a test socket part 40 inserted with the alternative IC. A comparing section 60 compares the output from the IC of disused type with that from the alternative IC for the inputted test pattern and delivers the results to a monitor section. A decision can be made easily whether the alternative IC is suitable as an alternative to the IC of disused type based on the comparison results.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test apparatus for a semiconductor integrated circuit device (hereinafter referred to as "IC"), and more particularly to a test apparatus suitable for a substitute test of a waste IC.

[0002]

2. Description of the Related Art Among IC parts constituting an apparatus, parts which cannot be obtained for any reason (referred to as "discontinued IC").
Occurs, in order to continue the manufacture of the device, it is necessary to search for a compatible IC (hereinafter referred to as “alternate IC”) having a model and performance that is substantially equivalent to the waste type IC, Accordingly, a work man-hour to change a manufacturing drawing or the like is required.

[0003] In order to confirm that there is no problem with the replacement of the alternative IC, conventionally, a prototype device or equipment for evaluation mounting the alternative IC is newly manufactured, and the test device is actually operated. , To check if there was a problem.

[0004]

However, the above-mentioned conventional method has a problem that it is difficult to reduce the cost for confirming the function of the alternative IC when a waste IC is generated. .

[0005] The reason is that, as described above, in order to confirm the function of the alternative IC, a large number of evaluation man-hours are required, such as development and manufacture of a prototype device and equipment for evaluation.

SUMMARY OF THE INVENTION Accordingly, the present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a prototype for evaluation which has conventionally been required when confirming the function of a substitute IC when a waste IC is generated. It is an object of the present invention to provide a circuit test apparatus capable of greatly reducing devices, equipment, and a large number of evaluation steps.

[0007]

To achieve the above object, a circuit test apparatus according to the present invention comprises: input means for inputting electrical characteristics of a semiconductor integrated circuit device (hereinafter referred to as "IC") component and pin functions; A storage unit that stores information input from the input unit, a test control unit that generates a test pattern based on the information stored in the storage unit, and the IC component (hereinafter, referred to as a “first IC component”). A first member that electrically contacts and inputs a test pattern from the test control means to the first IC component; and a first member that makes electrical contact with a second IC component and transmits the test pattern from the test control means to the first IC component. A second member to be input to the second IC component, a comparing unit for comparing output results of the first and second IC components with respect to a test pattern applied from the test control unit, and a ratio of the comparing unit And means for outputting the result, characterized by comprising a.

[0008]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below, followed by examples for explaining the embodiments of the present invention in more detail. According to a preferred embodiment of the present invention, a panel unit (1 in FIG. 1) for inputting the electrical characteristics and pin functions of a first IC component such as a waste IC.
0), a storage section (20 in FIG. 1) for storing information input from the panel section, a socket under test (30 in FIG. 1) into which the first IC component is inserted, and a second IC such as a substitute IC. I
A test socket section (40 in FIG. 1) into which the C component is inserted; a test control section (50 in FIG. 1) for generating a test pattern based on information stored in the storage section (20 in FIG. 1); A comparison unit (60 in FIG. 1) that compares the output results of both the output signal output from the unit and the output signal output from the test socket unit, and a monitor unit (60) that outputs the comparison result output by the comparison unit. 1 in FIG. 1).

In the embodiment of the present invention, the waste variety I
When the function of the alternative IC is confirmed when C occurs, information on the electrical characteristics and pin functions of the waste IC is displayed on the panel unit (1 in FIG. 1).
When input is made from 0), this is stored in the storage unit (20 in FIG. 1).

The test control section (50 in FIG. 1) generates a test pattern based on this information, and the socket under test (30 in FIG. 1) into which the waste type IC is inserted and the alternative IC into which the IC is inserted. This test pattern is input to the test socket section (40 in FIG. 1).

The output results of the waste IC and the substitute IC with respect to the input test pattern are output to a comparing section (60 in FIG. 1), and the comparing section compares the output results of both and outputs the result to a monitor section (FIG. 1). 70).

Therefore, by checking the comparison result output from the monitor unit, it is possible to easily confirm whether or not the substitute IC has no problem as a substitute for the waste IC.

[0013]

An embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a diagram showing a configuration of a circuit test apparatus according to one embodiment of the present invention.

Referring to FIG. 1, the present embodiment employs a waste type I
Panel section 10 for inputting electrical characteristics of C and pin functions
And a storage unit 20 for storing information input from the panel unit.
A socket unit under test 30 for inserting a waste type IC, a test socket unit 40 for inserting a substitute IC, a test control unit 50 for generating a test pattern based on information held in the storage unit 20, a socket unit for test The comparison unit 60 is configured to compare output results of both the output signal output from the output signal 30 and the output signal output from the test socket unit 40, and a monitor unit 70 that outputs the comparison result output by the comparison unit. I have. The monitor 70 may be a display device, a printer, or the like.

The operation of this embodiment shown in FIG. 1 will be described below.

When evaluating an alternative IC, first, the waste type I
The electrical characteristics of C and the function of the pins are input from the panel unit 10. Information input from the panel unit 10 is stored in the storage unit 20.

When all the necessary information is entered, the waste IC
Is inserted into the socket unit under test 30 and the alternative IC is inserted into the test socket unit 40, and the panel unit 10 instructs the start of the test.

The test control unit 50 instructed to start the test
A test pattern is generated based on the information held in the storage unit 20, and the test pattern is input to the socket unit under test 30 and the test socket unit 40, respectively. The test control unit 50 includes, for example, a clock generator for generating a clock for defining a phase of a signal, a formatter for defining a waveform format of a test pattern, a CPU for controlling the whole, and a signal for outputting signals, in addition to a memory for storing a pattern. It may be configured to include a driver or the like.

The socket unit under test 30 includes a test control unit 50.
Input the test pattern input from the
The output result from the waste type IC for the test pattern is output to the comparing unit 60. Similarly, the test socket unit 40 converts the test pattern input from the test control unit 50 into a substitute IC.
, And outputs the output result from the substitute IC for the test pattern to the comparison unit 60.

The comparing section 60 compares output results input from the socket under test 30 and the test socket section 40,
The comparison result is output to the monitor unit 70.

In the embodiment of the present invention, it is not necessary to manufacture a prototype device or the like every time the function of the substitute IC of the waste IC is confirmed, and the function confirmation is commonly performed for the various waste ICs and the substitute IC. It has the advantage that it can be done.
Further, for example, the socket or the like may be replaced in accordance with the type of the package of the IC, the number of pins, or the like, thereby reducing costs.

[0022]

As described above, according to the present invention,
When the function of the alternative IC is confirmed when the waste type IC is generated, an effect is obtained that the cost can be significantly reduced as compared with the related art.

The reason for this is that, in the past, when checking the function of a substitute IC when a discarded IC was generated, a prototype device and equipment for evaluation and a large number of evaluation man-hours were required. This is because common use is possible for each waste type IC, and there is no need to manufacture a prototype device or equipment.

[Brief description of the drawings]

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 10 Panel part 20 Storage part 30 Socket part under test 40 Socket part 50 Test control part 60 Comparison part 70 Monitor part

Claims (3)

[Claims] 1. An input unit for inputting electrical characteristics of a semiconductor integrated circuit device (hereinafter referred to as an "IC") component and a function of a pin, a storage unit for storing information input from the input unit, and Test control means for generating a test pattern based on the stored information; and electrically contacting the IC component (hereinafter referred to as a "first IC component"), and transmitting the test pattern from the test control means to the first IC. A first member to be input to the component; a second member to be in electrical contact with the second IC component and to input a test pattern from the test control means to the second IC component; A circuit testing apparatus comprising: comparing means for comparing output results of the first and second IC components with respect to an applied test pattern; and means for outputting a comparison result of the comparing means. . 2. The apparatus according to claim 1, wherein said first and second members transmit outputs of said first and second IC components to said comparing means, respectively.
The circuit test apparatus according to claim 1, wherein: 3. The semiconductor device according to claim 1, wherein said first and second IC components are each composed of a waste IC and a substitute IC.
Or the circuit test apparatus according to 2.