JPH10198942A - Glass substrate for recording medium and recording medium using this substrate - Google Patents

Glass substrate for recording medium and recording medium using this substrate

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Publication number
JPH10198942A
JPH10198942A JP8359286A JP35928696A JPH10198942A JP H10198942 A JPH10198942 A JP H10198942A JP 8359286 A JP8359286 A JP 8359286A JP 35928696 A JP35928696 A JP 35928696A JP H10198942 A JPH10198942 A JP H10198942A
Authority
JP
Japan
Prior art keywords
glass substrate
recording medium
glass
polishing
chemical strengthening
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8359286A
Other languages
Japanese (ja)
Other versions
JP3254157B2 (en
Inventor
Jun Ozawa
潤 小澤
Takemi Miyamoto
武美 宮本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hoya Corp
Original Assignee
Hoya Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoya Corp filed Critical Hoya Corp
Priority to JP35928696A priority Critical patent/JP3254157B2/en
Publication of JPH10198942A publication Critical patent/JPH10198942A/en
Application granted granted Critical
Publication of JP3254157B2 publication Critical patent/JP3254157B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Magnetic Record Carriers (AREA)
  • Optical Record Carriers And Manufacture Thereof (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)
  • Surface Treatment Of Glass (AREA)
  • Glass Compositions (AREA)

Abstract

PROBLEM TO BE SOLVED: To improve the strength and the durability to breakage with the lapse of time, etc., of a glass substrate by strictly controlling three of compressive stress, tensile stress and depth of the compressive stress layer generated when the glass substrate is chemically strengthening to an adequate range and polishing the end surface of the glass substrate, thereby removing the cracks, which are the causes for the breakage with the lapse of time. SOLUTION: The glass compsn. of the glass substrate 1 is formed by incorporating, by molar%, 57 to 74% SiO2 , 0 to 2.8% ZnO2 , 3 to 15% Al2 O3 , 7 to 16% LiO2 and 4 to 14% Na2 O into the compsn. This sheet glass is cut out to a disk shape of a diameter of 96mm and is ground to 1.5mm thickness. The end faces are subjected to polishing then to washing and the substrate is immersed for 0.5 to 5 hours in a chemical strengthening treatment liquid kept at 200 to 500 deg.C. Consequently, the depth of the compressive stress generated in the glass substrate 1 attains 30 to 100μm, the value of the compressive stress <=2 to 15kg/mm<2> and the value of the internal tensile stress <=1.5kg/mm<2> . As a result, the factors that affect the strength of the glass substrate 1 are most adequately controlled and the strength and the durability to the breakage with the lapse of time are improved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、コンピュータ等の
記録媒体用ガラス基板、及びその基板を用いた記録媒体
等に関する。
[0001] 1. Field of the Invention [0002] The present invention relates to a glass substrate for a recording medium such as a computer and a recording medium using the substrate.

【0002】[0002]

【従来の技術】磁気ディスク等の磁気記録媒体用基板と
しては、アルミニウム基板が広く用いられてきたが、磁
気ディスクの小型・薄板化と、高密度記録化に伴い、ア
ルミニウム基板に比べ強度や平坦性などに優れたガラス
基板に徐々に置き換わりつつある。
2. Description of the Related Art Aluminum substrates have been widely used as substrates for magnetic recording media such as magnetic disks. However, as magnetic disks have become smaller and thinner and recording density has increased, the strength and flatness of aluminum substrates have been reduced. Is gradually being replaced by a glass substrate with excellent properties.

【0003】これは、ガラス基板は、最近のハードディ
スクの小径・薄板化に対応できる十分な硬度を有する等
の特性を有し、物理的・化学的耐久性にも優れ、しか
も、その表面を比較的容易に高い平面精度に形成でき、
したがってスペーシングを小さくでき磁気ヘッドの低浮
上走行化を達成しやすい性質を有していることが高密度
記録化実現により適しているからである。
[0003] This is because glass substrates have characteristics such as having sufficient hardness to cope with recent small-diameter and thinner hard disks, have excellent physical and chemical durability, and have a comparative surface. Can be easily formed with high plane accuracy.
Therefore, it is more suitable for realizing high-density recording to have a property that the spacing can be reduced and the magnetic head can easily achieve a low flying running.

【0004】また、ガラス基板の強度をさらに向上させ
る目的で、ガラス基板の表面を化学強化処理することが
多い。
In order to further improve the strength of the glass substrate, the surface of the glass substrate is often subjected to a chemical strengthening treatment.

【0005】詳しくは、ガラス基板を磁気ディスク用基
板として用いる場合には、耐衝撃性や耐振動性を向上さ
せ衝撃や振動によって基板が破損するのを防止する目的
で、ガラス基板の表面に(低温)イオン交換法による化
学強化処理を施すことが多い。
More specifically, when a glass substrate is used as a substrate for a magnetic disk, the surface of the glass substrate is formed on the surface of the glass substrate in order to improve the shock resistance and vibration resistance and to prevent the substrate from being damaged by shock or vibration. In many cases, chemical strengthening treatment is performed by a (low temperature) ion exchange method.

【0006】化学強化処理は、例えば、ガラス中のL
i、Naイオン等をそれらよりもイオン半径の大きいN
a、Kイオン等でイオン交換により置換して、ガラス表
面層に強い圧縮応力を発生させて強度を増大させる処理
である。
The chemical strengthening treatment is performed, for example, by using L in glass.
i, Na ions, etc. are converted to N
This is a process of increasing the strength by generating a strong compressive stress in the glass surface layer by replacing the ions with a, K ions or the like by ion exchange.

【0007】ガラス基板の薄板化に伴い、化学強化処理
によってガラス基板の表層部に生ずる圧縮応力層を過度
に厚くすると、ガラス基板内部に大きな引張応力が発生
し、強度の低下を招くことが知られている(特開平7−
230621号公報)。同公報では、圧縮応力層の厚さ
は5〜25μmの範囲内とするのが好ましいとしてい
る。
[0007] If the compressive stress layer generated on the surface layer of the glass substrate is excessively thickened by the chemical strengthening process accompanying the thinning of the glass substrate, it is known that a large tensile stress is generated inside the glass substrate and the strength is reduced. (Japanese Patent Laid-Open No. 7-
No. 230621). The publication states that the thickness of the compressive stress layer is preferably in the range of 5 to 25 μm.

【0008】また、本願出願人は、ガラス基板表層に通
常存在するクラックの深さと、化学強化によるガラス基
板表層の圧縮応力層の深さとをほぼ一致させ、さらに、
ガラス基板内部に生ずる引張応力の最大値を4kg/m
2以下とすることで、強度及び耐久性を向上させる技
術について出願を行っている(特開平2−31325号
公報)。
The applicant of the present invention has made the depth of a crack usually present in the surface layer of a glass substrate substantially equal to the depth of a compressive stress layer of the surface layer of the glass substrate due to chemical strengthening.
The maximum value of the tensile stress generated inside the glass substrate is 4 kg / m
An application has been filed for a technique for improving the strength and durability by controlling the strength to m 2 or less (Japanese Patent Application Laid-Open No. 2-31325).

【0009】[0009]

【発明が解決しようとする課題】ガラス基板の薄板化
は、厚い場合に比べ、相対的に、ガラス基板の強度の低
下をもたらす。したがって、ガラス基板の強度に影響を
与える因子の制御が従来以上に重要であり、厳密である
ことを要する。
The thinning of the glass substrate relatively lowers the strength of the glass substrate as compared with the case where the glass substrate is thick. Therefore, control of the factors that affect the strength of the glass substrate is more important than before and needs to be strict.

【0010】しかしながら、従来のガラス基板は、薄板
化した場合、ガラス基板の強度に影響を与える因子の制
御が不十分であるという問題がある。
However, when the conventional glass substrate is thinned, there is a problem that control of a factor which affects the strength of the glass substrate is insufficient.

【0011】本発明は上記問題点にかんがみてなされた
ものであり、ガラス基板の強度に影響を与える因子を最
適な範囲で厳密に制御して、強度及び経時破損に対する
耐久性の向上を図った記録媒体用ガラス基板の提供を第
一の目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and strictly controls the factors affecting the strength of a glass substrate within an optimum range to improve the strength and the durability against breakage with time. A first object is to provide a glass substrate for a recording medium.

【0012】また、強度及び経時破損に対する耐久性に
優れた記録媒体の提供を第二の目的とする。
It is a second object of the present invention to provide a recording medium having excellent strength and durability against damage with time.

【0013】[0013]

【課題を解決するための手段】上記目的を達成するため
に本発明者らは鋭意研究を重ねた結果、ガラス基板を化
学強化した際に生ずる圧縮応力、引張応力、圧縮応力層
の深さの三者のバランスが悪いと経時破損(長期に渡り
使用することで生じる破損)を引き起こすことがあるこ
とを見出し、適度な化学強化によって、三者を厳密にバ
ランスさせることが必要であることを見出した。そし
て、三者を最適な範囲で厳密に制御することで、ガラス
基板の強度及び経時破損に対する耐久性が著しく向上す
ることを見出した。
Means for Solving the Problems In order to achieve the above object, the present inventors have conducted intensive studies, and as a result, the compressive stress, tensile stress, and depth of the compressive stress layer generated when the glass substrate is chemically strengthened. We found that improper balance between the three could cause damage over time (breaks caused by prolonged use), and found that it was necessary to balance the three strictly by moderate chemical strengthening. Was. Then, it has been found that by strictly controlling the three in an optimum range, the strength of the glass substrate and the durability against breakage with time are significantly improved.

【0014】さらに、ガラス基板の端面に存在するクラ
ックを研磨により取り除くことで、端面のクラックが原
因で発生する強度の低下や経時破損に対する耐久性の低
下等を防ぎ、さらに強度及び経時破損に対する耐久性の
向上が図られることを見出し本発明を完成するに至っ
た。
Further, by removing the cracks present on the end face of the glass substrate by polishing, it is possible to prevent a decrease in strength caused by the cracks on the end face and a decrease in durability against breakage with time, and to further reduce the strength and durability against breakage with time. The inventors have found that the improvement of the performance can be achieved, and have completed the present invention.

【0015】すなわち、本発明の記録媒体用ガラス基板
は、化学強化されたガラス基板であって、化学強化によ
りガラス基板表層に生じる圧縮応力層の深さを30〜1
00μmとし、圧縮応力の値を2〜15kg/mm2
下とし、かつ、化学強化によりガラス基板内部に生ずる
引張応力の値を1.5kg/mm2以下とした構成とし
てある。
That is, the glass substrate for a recording medium of the present invention is a chemically strengthened glass substrate, and the depth of the compressive stress layer generated in the surface layer of the glass substrate by the chemical strengthening is 30 to 1
The thickness is set to 00 μm, the value of the compressive stress is set to 2 to 15 kg / mm 2 or less, and the value of the tensile stress generated inside the glass substrate by chemical strengthening is set to 1.5 kg / mm 2 or less.

【0016】また、本発明の記録媒体用ガラス基板は、
上記本発明の記録媒体用ガラス基板において、ガラス基
板のガラス組成が、モル%表示で、SiO2を57〜7
4%、ZnO2を0〜2.8%、Al23を3〜15
%、LiO2を7〜16%、Na2Oを4〜14%含有す
る組成である構成、ガラス基板の化学強化を、温度20
0〜500℃の化学強化処理液に、0.5〜5時間浸漬
して行う構成、ガラス基板の端面を研磨して、経時破損
の原因となるクラックを除去した構成、ガラス基板の端
面の研磨量が、0.5〜15μmである構成、ガラス基
板の端面研磨が、ブラシ又は研磨粉(ポリシャ)あるい
は研磨剤によってなされる構成、あるいは、ガラス基板
の端面の表面粗さが、Rmax:0.01〜1μm、R
a:0.001〜0.8μmである構成としてある。
Further, the glass substrate for a recording medium of the present invention comprises:
In the above-described glass substrate for a recording medium of the present invention, the glass composition of the glass substrate is expressed in terms of mol%, and SiO 2 is 57 to 7%.
4%, ZnO 2 from 0 to 2.8%, Al 2 O 3 from 3 to 15
%, 7 to 16% of LiO 2, and 4 to 14% of Na 2 O.
A configuration in which the substrate is immersed in a chemical strengthening treatment solution at 0 to 500 ° C. for 0.5 to 5 hours, a configuration in which the end surface of the glass substrate is polished to remove cracks that cause damage with time, and a polishing in the end surface of the glass substrate The amount is 0.5 to 15 μm, the end surface of the glass substrate is polished with a brush, a polishing powder (polisher) or an abrasive, or the end surface of the glass substrate has a surface roughness of Rmax: 0. 01-1 μm, R
a: It is configured to be 0.001 to 0.8 μm.

【0017】さらに、本発明の記録媒体は、上記本発明
の記録媒体用ガラス基板上に、少なくとも記録層を形成
した構成としてある。
Further, the recording medium of the present invention has a configuration in which at least a recording layer is formed on the glass substrate for a recording medium of the present invention.

【0018】[0018]

【作用】本発明では、ガラス基板を化学強化した際に生
ずる圧縮応力、引張応力、圧縮応力層の深さの三者を最
適な範囲で厳密に制御することで、ガラス基板の強度及
び経時破損に対する耐久性等が著しく向上する。
According to the present invention, the strength of the glass substrate and the breakage with time are controlled by strictly controlling the three factors of compressive stress, tensile stress, and the depth of the compressive stress layer generated when the glass substrate is chemically strengthened within an optimum range. , Etc., is significantly improved.

【0019】また、ガラス基板の端面を研磨して、経時
破損等の原因となるクラックを除去することで、さらに
強度及び経時破損に対する耐久性の向上が図られる。
In addition, by polishing the end face of the glass substrate to remove cracks that cause temporal damage, etc., the strength and durability against temporal damage can be further improved.

【0020】以下、本発明を詳細に説明する。Hereinafter, the present invention will be described in detail.

【0021】本発明では、ガラス基板を化学強化した際
に生ずる圧縮応力、引張応力、圧縮応力層の深さの三者
を最適な範囲で厳密に制御する。
In the present invention, the compression stress, the tensile stress, and the depth of the compression stress layer generated when the glass substrate is chemically strengthened are strictly controlled within an optimum range.

【0022】化学強化によりガラス基板表面に生じる圧
縮応力層の深さは、30〜100μmとする必要があ
る。
The depth of the compressive stress layer generated on the surface of the glass substrate by chemical strengthening needs to be 30 to 100 μm.

【0023】圧縮応力層の深さが30μm未満である
と、化学強化の効果(耐衝撃性や耐振動性)が小さすぎ
て必要な強度が得られない。また、圧縮応力層の深さが
100μmを超えると、引張応力が大きくなりすぎて強
度が低下する。
When the depth of the compressive stress layer is less than 30 μm, the effect of chemical strengthening (shock resistance and vibration resistance) is too small to obtain required strength. On the other hand, if the depth of the compressive stress layer exceeds 100 μm, the tensile stress becomes too large and the strength is reduced.

【0024】上記の観点から、圧縮応力層の深さは、3
0〜200μmとすることが好ましく、50〜100μ
mとすることがさらに好ましい。
From the above viewpoint, the depth of the compressive stress layer is 3
0 to 200 μm, preferably 50 to 100 μm
m is more preferable.

【0025】化学強化によりガラス基板表層に生じる圧
縮応力の値は、2〜15kg/mm2以下とする必要が
ある。
The value of the compressive stress generated in the surface layer of the glass substrate by the chemical strengthening needs to be 2 to 15 kg / mm 2 or less.

【0026】圧縮応力の値が2kg/mm2未満である
と、強度不足となる。また、圧縮応力の値が15kg/
mm2を超えると、強度過剰となり割れやすくなる。
If the value of the compressive stress is less than 2 kg / mm 2 , the strength becomes insufficient. The value of the compressive stress is 15 kg /
If it exceeds mm 2 , the strength becomes excessive and it is easily broken.

【0027】上記の観点から、圧縮応力の値は、1〜2
0kg/mm2とすることが好ましく、2〜15kg/
mm2とすることがさらに好ましい。
From the above viewpoint, the value of the compressive stress is from 1 to 2
0 kg / mm 2 , preferably 2 to 15 kg / mm 2
mm 2 is more preferable.

【0028】化学強化によりガラス基板内部に生ずる引
張応力の値は、1.5kg/mm2以下とする必要があ
る。
The value of the tensile stress generated inside the glass substrate by the chemical strengthening must be 1.5 kg / mm 2 or less.

【0029】引張応力の値が1.5kg/mm2を超え
ると、破壊しやすくなる。
When the value of the tensile stress exceeds 1.5 kg / mm 2 , it is easy to break.

【0030】上記の観点から、引張応力の値は、0.1
〜10kg/mm2とすることが好ましく、0.5〜
1.5kg/mm2とすることがさらに好ましい。
From the above viewpoint, the value of the tensile stress is 0.1
-10 kg / mm 2 , preferably 0.5-
More preferably, it is 1.5 kg / mm 2 .

【0031】本発明の記録媒体用ガラス基板は、ガラス
基板を化学強化した際に生ずる圧縮応力、引張応力、圧
縮応力層の深さの三者が、結果的にそれぞれ上述した最
適範囲内にあればよく、それに至るまでの過程は特に制
限されない。
In the glass substrate for a recording medium of the present invention, the compression stress, the tensile stress, and the depth of the compression stress layer, which are generated when the glass substrate is chemically strengthened, are consequently within the above-mentioned optimum ranges. The process up to that point is not particularly limited.

【0032】圧縮応力、引張応力、圧縮応力層の深さの
三者を最適な範囲で厳密に制御するには、例えば、ガラ
ス組成、化学強化条件(化学強化液、温度、時間など)
を適宜選択、制御して化学強化を行えばよい。
In order to strictly control the three of the compressive stress, the tensile stress and the depth of the compressive stress layer within the optimum range, for example, the glass composition, the chemical strengthening conditions (chemical strengthening solution, temperature, time, etc.)
May be appropriately selected and controlled to perform chemical strengthening.

【0033】化学強化方法としては、従来より公知の化
学強化法であれば特に制限されない。 ガラス基板の化
学強化は、例えば、加熱した化学強化溶液にガラス基板
を浸漬し、ガラス基板表層のイオンを化学強化溶液中の
イオンでイオン交換して行う。
The chemical strengthening method is not particularly limited as long as it is a conventionally known chemical strengthening method. The chemical strengthening of the glass substrate is performed, for example, by immersing the glass substrate in a heated chemical strengthening solution and exchanging ions in the surface layer of the glass substrate with ions in the chemical strengthening solution.

【0034】ここで、イオン交換法としては、低温型イ
オン交換法、高温型イオン交換法、表面結晶化法、ガラ
ス表面の脱アルカリ法などが知られているが、ガラス転
移点の観点からガラス転移温度を超えない領域でイオン
交換を行う低温型イオン交換法を用いることが好まし
い。
Here, as the ion exchange method, a low-temperature type ion exchange method, a high-temperature type ion exchange method, a surface crystallization method, a dealkalization method for a glass surface, and the like are known. It is preferable to use a low-temperature ion exchange method in which ion exchange is performed in a region not exceeding a transition temperature.

【0035】低温型イオン交換法は、ガラスの転移温度
Tg以下の温度域で、ガラス中のアルカリイオンを、そ
れよりもイオン半径の大きいアルカリイオンと置換し、
イオン交換部の容積増加によってガラス表層に強い圧縮
応力を発生させてガラス表面を強化する方法である。
In the low-temperature ion exchange method, alkali ions in glass are replaced with alkali ions having a larger ionic radius in a temperature range not higher than the glass transition temperature Tg,
This is a method in which a strong compressive stress is generated in the glass surface layer by increasing the volume of the ion exchange section, thereby strengthening the glass surface.

【0036】化学強化溶液としては、硝酸カリウム(K
NO3)、硝酸ナトリウム(NaNO3)、炭酸カリウム
(K2CO3)などの溶融塩や、これらの塩を混合したも
の(KNO3+NaNO3、KNO3+K2CO3など)の
溶融塩、あるいは、これらの塩にCu、Ag、Rb、C
sなどのイオンの塩を混合したものの溶融塩等が挙げら
れる。なお、化学強化溶液は、溶融塩でなく上記塩の溶
液であってもよい。
As the chemical strengthening solution, potassium nitrate (K
Molten salts such as NO 3 ), sodium nitrate (NaNO 3 ) and potassium carbonate (K 2 CO 3 ), and molten salts of a mixture of these salts (KNO 3 + NaNO 3 , KNO 3 + K 2 CO 3 ); Alternatively, Cu, Ag, Rb, C
Examples thereof include a molten salt of a mixture of salts of ions such as s. Note that the chemical strengthening solution may be a solution of the above salt instead of the molten salt.

【0037】化学強化溶液の加熱温度は、イオン交換等
の観点から、280〜660℃、特に300〜400℃
であることが好ましい。
The heating temperature of the chemical strengthening solution is from 280 to 660 ° C., particularly from 300 to 400 ° C. from the viewpoint of ion exchange and the like.
It is preferred that

【0038】浸漬時間は、数時間〜数十時間とすること
が好ましい。
The immersion time is preferably several hours to several tens of hours.

【0039】なお、ガラス基板を溶融塩に浸漬する前
に、予備加熱の目的ため、ガラス基板を100〜300
℃に予熱しておくことが好ましい。また、化学強化後の
ガラス基板は、冷却、洗浄工程等を経て製品とされる。
Before the glass substrate is immersed in the molten salt, the glass substrate must be 100 to 300 mm for the purpose of preheating.
It is preferred to preheat to ° C. Further, the glass substrate after the chemical strengthening is made into a product through a cooling step, a washing step, and the like.

【0040】ガラス基板としては、化学強化可能なガラ
ス基板であれば特に制限されない。また、ガラス基板の
サイズ、厚さ等は特に制限されない。
The glass substrate is not particularly limited as long as it can be chemically strengthened. Further, the size, thickness, and the like of the glass substrate are not particularly limited.

【0041】なお、ガラス基板の厚さは、0.3〜20
mm程度が好ましく、0.5〜1.0mm程度がさらに
好ましい。ガラス基板の厚さが0.3mm未満である
と、必要な強度が得られない。また、ガラス基板の厚さ
が20mmを超える場合は、本発明を適用する必要性が
ない。
The thickness of the glass substrate is 0.3 to 20.
mm, more preferably about 0.5 to 1.0 mm. If the thickness of the glass substrate is less than 0.3 mm, the required strength cannot be obtained. When the thickness of the glass substrate exceeds 20 mm, there is no need to apply the present invention.

【0042】ガラス基板の材質としては、例えば、アル
ミノシリケートガラス、ソーダライムガラス、ソーダア
ルミノケイ酸ガラス、アルミノボロシリケートガラス、
ボロシリケートガラス、石英ガラス、チェーンシリケー
トガラス、又は、結晶化ガラス等のガラスセラミックな
どが挙げられる。なお、アルミノシリケートガラスは、
耐衝撃性や耐振動性に優れるため特に好ましい。
Examples of the material of the glass substrate include aluminosilicate glass, soda lime glass, sodaaluminosilicate glass, aluminoborosilicate glass,
Examples thereof include borosilicate glass, quartz glass, chain silicate glass, and glass ceramics such as crystallized glass. In addition, aluminosilicate glass is
It is particularly preferable because it has excellent impact resistance and vibration resistance.

【0043】アルミノシリケートガラスとしては、Si
2:62〜75重量%、Al23:5〜15重量%、
Li2O:4〜10重量%、Na2O:4〜12重量%、
ZrO2:5.5〜15重量%を主成分として含有する
とともに、Na2O/ZrO2の重量比が0.5〜2.
0、Al23/ZrO2の重量比が0.4〜2.5であ
る化学強化用ガラス等が好ましい。
As the aluminosilicate glass, Si
O 2 : 62 to 75% by weight, Al 2 O 3 : 5 to 15% by weight,
Li 2 O: 4 to 10% by weight, Na 2 O: 4 to 12% by weight,
ZrO 2: 5.5 to 15 with containing by weight% as the main component, the weight ratio of Na 2 O / ZrO 2 is 0.5 to 2.
0, Al 2 O 3 / weight ratio of ZrO 2 of glass for chemical strengthening is 0.4 to 2.5 is preferred.

【0044】また、ZrO2の未溶解物が原因で生じる
ガラス基板表面の突起をなくすためには、モル%表示
で、SiO2を57〜74%、ZnO2を0〜2.8%、
Al23を3〜15%、LiO2を7〜16%、Na2
を4〜14%含有する化学強化用ガラス等を使用するこ
とが好ましい。
In order to eliminate projections on the glass substrate surface caused by undissolved ZrO 2 , 57% to 74% of SiO 2 , 0% to 2.8% of ZnO 2 ,
The Al 2 O 3 3~15%, the LiO 2 7~16%, Na 2 O
It is preferable to use glass for chemical strengthening containing 4 to 14%.

【0045】このようなアルミノシリケートガラスは、
化学強化することによって、圧縮応力、引張応力、圧縮
応力層の深さの三者のバランスに優れるとともに、抗折
強度や、耐熱性に優れ、高温環境下であってもNaの析
出がないとともに平坦性を維持し、ヌープ硬度にも優れ
る。
Such an aluminosilicate glass is
By chemical strengthening, compressive stress, tensile stress, and the excellent balance of the three of the depth of the compressive stress layer, while also excellent in bending strength and heat resistance, without Na precipitation even under high temperature environment It maintains flatness and has excellent Knoop hardness.

【0046】本発明では、上述した本発明の記録媒体用
ガラス基板において、ガラス基板の端面を研磨して、経
時破損等の原因となるクラックを除去することが好まし
い。
In the present invention, in the above-mentioned glass substrate for a recording medium of the present invention, it is preferable that the end face of the glass substrate is polished to remove cracks which cause damage with time and the like.

【0047】ここで、ガラス基板の端面とは、ガラス基
板の主表面(記録層が形成される面)以外の部分を指
し、外周端面(側壁部及び面取部を含む)及び内周端面
(側壁部及び面取部を含む)を指す。
Here, the end surface of the glass substrate refers to a portion other than the main surface (the surface on which the recording layer is formed) of the glass substrate, and includes an outer peripheral end surface (including a side wall portion and a chamfered portion) and an inner peripheral end surface ( (Including side wall and chamfer).

【0048】ガラス基板の端面の研磨方法は、特に制限
されず、公知の研磨方法が利用できる。
The method for polishing the end face of the glass substrate is not particularly limited, and a known polishing method can be used.

【0049】研磨方法としては、例えば、ブラシ研磨、
軟質ポリシャ、硬質ポリシャ等の研磨パッド(研磨粉)
による研磨、研磨剤(砥粒など)による研磨などの機械
研磨等が挙げられる。なお、これらの機械研磨は、必要
な表面粗さの鏡面を得るため、異なる種類の機械研磨、
あるいは、ポリシャの種類や粒径等を異とする機械研磨
等を適宜組み合わせて実施できる。
As a polishing method, for example, brush polishing,
Polishing pad (polishing powder) for soft polisher, hard polisher, etc.
Polishing, mechanical polishing such as polishing with an abrasive (abrasive particles or the like), and the like. In addition, these mechanical polishing, in order to obtain a mirror surface of the required surface roughness, different types of mechanical polishing,
Alternatively, mechanical polishing or the like having different types of polishers, different particle diameters, or the like can be performed in appropriate combination.

【0050】ここで、軟質ポリシャとしては、例えば、
スウェード、ベロアを素材とするもの等が挙げられ、硬
質ポリシャとしては、例えば、硬質ベロア、ウレタン発
砲、ピッチ含浸スウェード等が挙げられる。また、研磨
剤として、酸化セリウム(CeO2)、アルミナ(γ−
Al23)、べんがら(Fe23)、酸化クロム(Cr
23)、酸化ジルコニウム(ZrO2)、酸化チタン
(TiO2)などが挙げられる。
Here, as the soft polisher, for example,
Suedes and velours are used as materials. Examples of the hard polisher include hard velours, urethane foam, and pitch impregnated suede. Cerium oxide (CeO 2 ), alumina (γ-
Al 2 O 3 ), bran (Fe 2 O 3 ), chromium oxide (Cr
2 O 3 ), zirconium oxide (ZrO 2 ), titanium oxide (TiO 2 ) and the like.

【0051】ガラス基板の端面の研磨は、ガラス基板の
研削、研磨工程のいずれの工程の後に行ってもよく、あ
るいは、各工程の後に行ってもよい。ガラス基板の研
削、研磨の工程は、通常、大きく分けて、(1)荒ずり
(粗研削)、(2)砂掛け(精研削、ラッピング)、
(3)第一研磨(ポリッシュ)、(4)第二研磨(ファ
イナル研磨、ポリッシュ)の各工程からなる。
The polishing of the end face of the glass substrate may be performed after any of the steps of grinding and polishing the glass substrate, or may be performed after each of the steps. The steps of grinding and polishing a glass substrate are generally roughly divided into (1) roughing (rough grinding), (2) sanding (fine grinding, lapping),
(3) First polishing (polishing) and (4) second polishing (final polishing, polishing).

【0052】ガラス基板の端面の研磨工程は、例えば、
荒ずり(粗研削)工程後に行う以外に、砂掛け(精研
削、ラッピング)工程後、あるいは、第一研磨(ポリッ
シュ)又は第二研磨(ファイナル研磨、ポリッシュ)工
程後に行ってもよい。ラッピング工程の前にガラス基板
端面の鏡面加工を行うと、ラッピング工程の際に、ラッ
プの砂によりガラス基板端面が若干粗くなることがあ
る。
In the polishing step of the end face of the glass substrate, for example,
In addition to the step after the roughing (rough grinding) step, the step may be performed after the sanding (fine grinding, lapping) step or after the first polishing (polishing) or the second polishing (final polishing, polishing) step. If the mirror surface processing of the glass substrate end surface is performed before the lapping process, the glass substrate end surface may be slightly roughened due to sand of the lap during the lapping process.

【0053】ガラス基板の端面の研磨量(研磨深さ)
は、経時破損等に影響を及ぼすクラック除去の観点か
ら、適宜調節することがさらに好ましい。
Polishing amount (polishing depth) of end face of glass substrate
It is more preferable to adjust the value appropriately from the viewpoint of removing cracks that affect temporal damage and the like.

【0054】ガラス基板の端面の表面粗さは、端面に起
因する異物の発生を防止する等の観点から、好ましく
は、Rmax:0.01〜2μm、Ra:0.001〜
1μm未満、さらに好ましくは、Rmax:0.01〜
1μm、Ra:0.001〜0.8μm、より以上に好
ましくは、Rmax:0.01〜1μm、Ra:0.0
01〜0.5μmである。
The surface roughness of the end face of the glass substrate is preferably Rmax: 0.01 to 2 μm, Ra: 0.001 to 0.001 from the viewpoint of preventing generation of foreign matter due to the end face.
Less than 1 μm, more preferably Rmax: 0.01 to
1 μm, Ra: 0.001 to 0.8 μm, more preferably, Rmax: 0.01 to 1 μm, Ra: 0.0
01 to 0.5 μm.

【0055】ガラス基板の端面部分の表面粗さを上記範
囲の鏡面とすることにより、ガラス基板を収納容器に出
し入れする際、ガラス基板が斜めになって容器と接触す
るときに発生するパーティクルを効果的に抑えることが
できる。
By setting the surface roughness of the end surface portion of the glass substrate to a mirror surface within the above range, when the glass substrate is taken in and out of the storage container, particles generated when the glass substrate is inclined and come into contact with the container are effectively prevented. Can be suppressed.

【0056】また、ガラス基板の端面部分の表面粗さを
上記範囲の鏡面とすることにより、サーマル・アスペリ
ティ(Thermal Asperity)の原因とな
るパーティクルが発生することがなく、サーマル・アス
ペリティによる再生機能の低下を防止することができ
る。特に、磁気抵抗型ヘッドで再生を行う磁気記録媒体
にとって効果が著しい。
Further, by setting the surface roughness of the end surface of the glass substrate to a mirror surface within the above range, particles causing thermal asperity (Thermal Asperity) are not generated, and the reproduction function by the thermal asperity is not generated. The drop can be prevented. In particular, the effect is remarkable for a magnetic recording medium that performs reproduction with a magnetoresistive head.

【0057】上述した本発明の記録媒体用ガラス基板
は、磁気記録媒体用ガラス基板の他、光磁気ディスク用
のガラス基板や、光ディスクなどの電子光学用ディスク
基板としても利用できる。
The above-described glass substrate for a recording medium of the present invention can be used as a glass substrate for a magnetic recording medium, a glass substrate for a magneto-optical disk, and a disk substrate for an electro-optical disk such as an optical disk.

【0058】次に、本発明の記録媒体について説明す
る。
Next, the recording medium of the present invention will be described.

【0059】本発明の記録媒体は、上記本発明の記録媒
体用ガラス基板上に、少なくとも記録層を形成したもの
である。
The recording medium of the present invention is obtained by forming at least a recording layer on the glass substrate for a recording medium of the present invention.

【0060】本発明の記録媒体は、強度及び経時破損に
対する耐久性に優れた記録媒体用ガラス基板を使用して
いるので、強度及び経時破損に対する耐久性に優れ、高
い信頼性を有する。
Since the recording medium of the present invention uses a glass substrate for a recording medium having excellent strength and durability against damage over time, it has excellent strength and durability against damage over time and high reliability.

【0061】ここで、記録媒体の一例である磁気記録媒
体について説明する。磁気記録媒体は、通常、磁気ディ
スク用ガラス基板上に、下地層、磁性層、保護層、潤滑
層を順次積層して製造する。
Here, a magnetic recording medium which is an example of the recording medium will be described. A magnetic recording medium is usually manufactured by sequentially laminating an underlayer, a magnetic layer, a protective layer, and a lubricating layer on a glass substrate for a magnetic disk.

【0062】磁気記録媒体は、通常、所定の平坦度、表
面粗さを有し、表面の化学強化処理を施した磁気ディス
ク用ガラス基板上に、下地層、磁性層、保護層、潤滑層
を順次積層して製造する。
The magnetic recording medium usually has a predetermined flatness and surface roughness, and is provided with an underlayer, a magnetic layer, a protective layer, and a lubricating layer on a glass substrate for a magnetic disk on which the surface is chemically strengthened. It is manufactured by sequentially laminating.

【0063】本発明の磁気記録媒体における下地層は、
磁性層に応じて選択される。
The underlayer in the magnetic recording medium of the present invention comprises:
It is selected according to the magnetic layer.

【0064】下地層としては、例えば、Cr、Mo、T
a、Ti、W、V、B、Alなどの非磁性金属から選ば
れる少なくとも一種以上の材料からなる下地層等が挙げ
られる。Coを主成分とする磁性層の場合には、磁気特
性向上等の観点からCr単体やCr合金であることが好
ましい。また、下地層は単層とは限らず、同一又は異種
の層を積層した複数層構造とすることもできる。例え
ば、Cr/Cr、Cr/CrMo、Cr/CrV、Cr
V/CrV、Al/Cr/CrMo、Al/Cr/C
r、Al/Cr/CrV、Al/CrV/CrV等の多
層下地層等が挙げられる。
As the underlayer, for example, Cr, Mo, T
a, an underlayer made of at least one material selected from nonmagnetic metals such as Ti, W, V, B, and Al. In the case of a magnetic layer containing Co as a main component, it is preferable to use Cr alone or a Cr alloy from the viewpoint of improving magnetic properties. The underlayer is not limited to a single layer, and may have a multilayer structure in which the same or different layers are stacked. For example, Cr / Cr, Cr / CrMo, Cr / CrV, Cr
V / CrV, Al / Cr / CrMo, Al / Cr / C
r, a multilayer base layer of Al / Cr / CrV, Al / CrV / CrV and the like.

【0065】本発明の磁気記録媒体における磁性層の材
料は特に制限されない。
The material of the magnetic layer in the magnetic recording medium of the present invention is not particularly limited.

【0066】磁性層としては、例えば、Coを主成分と
するCoPt、CoCr、CoNi、CoNiCr、C
oCrTa、CoPtCr、CoNiPtや、CoNi
CrPt、CoNiCrTa、CoCrTaPt、Co
CrPtSiOなどの磁性薄膜が挙げられる。磁性層
は、磁性膜を非磁性膜(例えば、Cr、CrMo、Cr
Vなど)で分割してノイズの低減を図った多層構成(例
えば、CoPtCr/CrMo/CoPtCr、CoC
rTaPt/CrMo/CoCrTaPtなど)として
もよい。
As the magnetic layer, for example, CoPt, CoCr, CoNi, CoNiCr, C
oCrTa, CoPtCr, CoNiPt, CoNi
CrPt, CoNiCrTa, CoCrTaPt, Co
A magnetic thin film such as CrPtSiO may be used. The magnetic layer is made of a non-magnetic film (for example, Cr, CrMo, Cr).
V, etc. to reduce noise (for example, CoPtCr / CrMo / CoPtCr, CoC
rTaPt / CrMo / CoCrTaPt).

【0067】磁気抵抗型ヘッド(MRヘッド)又は大型
磁気抵抗型ヘッド(GMRヘッド)対応の磁性層として
は、Co系合金に、Y、Si、希土類元素、Hf、G
e、Sn、Znから選択される不純物元素、又はこれら
の不純物元素の酸化物を含有させたものなども含まれ
る。
As a magnetic layer corresponding to a magnetoresistive head (MR head) or a large magnetoresistive head (GMR head), a Co-based alloy is prepared by adding Y, Si, a rare earth element, Hf, G
An impurity element selected from e, Sn, and Zn, or an element containing an oxide of these impurity elements is also included.

【0068】また、磁性層としては、上記の他、フェラ
イト系、鉄−希土類系や、SiO2、BNなどからなる
非磁性膜中にFe、Co、FeCo、CoNiPt等の
磁性粒子が分散された構造のグラニュラーなどであって
もよい。また、磁性層は、内面型、垂直型のいずれの記
録形式であってもよい。
As the magnetic layer, in addition to the above, magnetic particles such as Fe, Co, FeCo, and CoNiPt are dispersed in a nonmagnetic film made of ferrite, iron-rare earth, SiO 2 , BN, or the like. It may be a granular structure or the like. Further, the magnetic layer may have any of an inner surface type and a perpendicular type recording format.

【0069】本発明の磁気記録媒体における保護層は特
に制限されない。
The protective layer in the magnetic recording medium of the present invention is not particularly limited.

【0070】保護層としては、例えば、Cr膜、Cr合
金膜、カーボン膜、ジルコニア膜、シリカ膜等が挙げら
れる。これらの保護膜は、下地層、磁性層等とともにイ
ンライン型スパッタ装置で連続して形成できる。また、
これらの保護膜は、単層としてもよく、あるいは、同一
又は異種の膜からなる多層構成としてもよい。
Examples of the protective layer include a Cr film, a Cr alloy film, a carbon film, a zirconia film, and a silica film. These protective films can be continuously formed with an underlayer, a magnetic layer, and the like by an in-line type sputtering apparatus. Also,
These protective films may have a single-layer structure or a multilayer structure composed of the same or different films.

【0071】本発明では、上記保護層上に、あるいは上
記保護層に替えて、他の保護層を形成してもよい。例え
ば、上記保護層に替えて、Cr膜の上にテトラアルコキ
シランをアルコール系の溶媒で希釈した中に、コロイダ
ルシリカ微粒子を分散して塗布し、さらに焼成して酸化
ケイ素(SiO2)膜を形成してもよい。
In the present invention, another protective layer may be formed on the protective layer or in place of the protective layer. For example, instead of the above-mentioned protective layer, colloidal silica fine particles are dispersed and applied to a Cr film after diluting tetraalkoxylan with an alcohol-based solvent, and then fired to form a silicon oxide (SiO 2 ) film. It may be formed.

【0072】本発明の磁気記録媒体における潤滑層は特
に制限されない。
The lubricating layer in the magnetic recording medium of the present invention is not particularly limited.

【0073】潤滑層は、例えば、液体潤滑剤であるパー
フロロポリエーテル(PFPE)をフレオン系などの溶
媒で希釈し、媒体表面にディッピング法、スピンコート
法、スプレイ法によって塗布し、必要に応じ加熱処理を
行って形成する。
The lubricating layer is prepared, for example, by diluting perfluoropolyether (PFPE), which is a liquid lubricant, with a solvent such as Freon, and applying it to the medium surface by dipping, spin coating, or spraying. It is formed by performing heat treatment.

【0074】[0074]

【実施例】以下、実施例にもとづき本発明をさらに具体
的に説明する。
EXAMPLES The present invention will be described below more specifically based on examples.

【0075】実施例1 Embodiment 1

【0076】ガラス基板の製造 (1)荒ずり工程 まず、ダウンドロー法で形成したシートガラスから、研
削砥石で直径96mmφ、厚さ3mmの円盤状に切り出
したアルミノシリケイトガラスからなるガラス基板を、
比較的粗いダイヤモンド砥石で研削加工して、直径96
mmφ、厚さ1.5mmに成形した。この場合、ダウン
ドロー法の代わりに、溶融ガラスを、上型、下型、胴型
を用いてダイレクト・プレスして、円盤状のガラス体を
得てもよい。
Manufacturing of Glass Substrate (1) Roughing Step First, a glass substrate made of aluminosilicate glass cut out into a disk shape having a diameter of 96 mmφ and a thickness of 3 mm with a grinding wheel from a sheet glass formed by a downdraw method was prepared.
Grinding with a relatively rough diamond wheel
It was molded to a diameter of 1.5 mm and a thickness of 1.5 mm. In this case, instead of the downdraw method, the molten glass may be directly pressed using an upper mold, a lower mold, and a body mold to obtain a disk-shaped glass body.

【0077】なお、アルミノシリケイトガラスとして
は、モル%表示で、SiO2を57〜74%、ZnO2
0〜2.8%、Al23を3〜15%、LiO2を7〜
16%、Na2Oを4〜14%、を主成分として含有す
る化学強化用ガラス(例えば、モル%表示で、Si
2:67.0%、ZnO2:1.0%、Al23:9.
0%、LiO2:12.0%、Na2O:10.0%を主
成分として含有する化学強化用ガラス)を使用した。
As the aluminosilicate glass, in terms of mol%, SiO 2 is 57 to 74%, ZnO 2 is 0 to 2.8%, Al 2 O 3 is 3 to 15%, and LiO 2 is 7 to 74%.
Glass for chemical strengthening containing 16% and 4 to 14% of Na 2 O as main components (for example, Si
O 2 : 67.0%, ZnO 2 : 1.0%, Al 2 O 3 : 9.
Glass for chemical strengthening containing 0%, LiO 2 : 12.0%, and Na 2 O: 10.0% as main components) was used.

【0078】次いで、上記砥石よりも粒度の細かいダイ
ヤモンド砥石で上記ガラス基板の両面を片面ずつ研削加
工した。このときの荷重は100kg程度とした。これ
により、ガラス基板両面の表面粗さをRmax(JIS
B 0601で測定)で10μm程度に仕上げた。
Next, both surfaces of the glass substrate were ground one by one with a diamond grindstone having a finer grain size than the grindstone. The load at this time was about 100 kg. As a result, the surface roughness of both surfaces of the glass substrate can be reduced to Rmax (JIS
B 0601) (about 10 μm).

【0079】次に、円筒状の砥石を用いてガラス基板の
中央部分に孔を開けるとともに、外周端面も研削して直
径を95mmφとした後、外周端面及び内周面に所定の
面取り加工を施した。このときのガラス基板端面の表面
粗さは、Rmaxで4μm程度であった。
Next, a hole is made in the center of the glass substrate using a cylindrical grindstone, and the outer peripheral end surface is also ground to a diameter of 95 mm. Then, the outer peripheral end surface and the inner peripheral surface are subjected to predetermined chamfering. did. At this time, the surface roughness of the end face of the glass substrate was about 4 μm in Rmax.

【0080】(2)端面研磨工程 次いで、ブラシ研磨により、ガラス基板を回転させなが
らガラス基板の端面を研磨するとともに、端面の表面粗
さが、Rmaxで1μm、Raで0.3μm程度になる
よう研磨した。
(2) End Surface Polishing Step Next, the end surface of the glass substrate is polished by brush polishing while rotating the glass substrate, and the surface roughness of the end surface is about 1 μm in Rmax and about 0.3 μm in Ra. Polished.

【0081】上記端面研磨加工を終えたガラス基板の表
面を水洗浄した。
The surface of the glass substrate that had been subjected to the above edge polishing was washed with water.

【0082】(3)砂掛け(ラッピング)工程 次に、ガラス基板に砂掛け加工を施した。この砂掛け工
程は、寸法精度及び形状精度の向上を目的としている。
砂掛け加工は、ラッピング装置を用いて行い、砥粒の粒
度を#400、#1000と替えて2回行った。
(3) Sanding (Wrapping) Step Next, the glass substrate was sanded. This sanding step aims at improving dimensional accuracy and shape accuracy.
The sanding process was performed using a lapping device, and was performed twice while changing the grain size of the abrasive grains to # 400 and # 1000.

【0083】詳しくは、はじめに、粒度#400のアル
ミナ砥粒を用い、荷重Lを100kg程度に設定して、
内転ギアと外転ギアを回転させることによって、キャリ
ア内に収納したガラス基板の両面を面精度0〜1μm、
表面粗さ(Rmax)6μm程度にラッピングした。
More specifically, first, a load L was set to about 100 kg using alumina abrasive grains having a grain size of # 400.
By rotating the internal rotation gear and the external rotation gear, both sides of the glass substrate housed in the carrier are surface-accurate 0-1 μm,
Lapping was performed to a surface roughness (Rmax) of about 6 μm.

【0084】次いで、アルミナ砥粒の粒度を#1000
に替えてラッピングを行い、表面粗さ(Rmax)2μ
m程度とした。
Next, the particle size of the alumina abrasive grains was changed to # 1000.
Perform lapping instead of surface roughness (Rmax) 2μ
m.

【0085】上記砂掛け加工を終えたガラス基板を、中
性洗剤、水の各洗浄槽に順次浸漬して、洗浄した。
The glass substrate that had been subjected to the above sanding process was washed by immersing it sequentially in a washing tank of a neutral detergent and water.

【0086】(4)第一研磨工程 次に、第一研磨工程を施した。この第一研磨工程は、上
述した砂掛け工程で残留したキズや歪みの除去を目的と
するもので、研磨装置を用いて行った。
(4) First Polishing Step Next, a first polishing step was performed. This first polishing step is intended to remove scratches and distortion remaining in the above sanding step, and was performed using a polishing apparatus.

【0087】詳しくは、ポリシャ(研磨粉)として硬質
ポリシャ(セリウムパッドMHC15:スピードファム
社製)を用い、以下の研磨条件で第一研磨工程を実施し
た。
More specifically, the first polishing step was performed under the following polishing conditions using a hard polisher (cerium pad MHC15: manufactured by Speed Fam) as a polisher (polishing powder).

【0088】研磨液:酸化セリウム+水 荷重:300g/cm2(L=238kg) 研磨時間:15分 除去量:30μm 下定盤回転数:40 rpm 上定盤回転数:35 rpm 内ギア回転数:14 rpm 外ギア回転数:29 rpmPolishing liquid: cerium oxide + water Load: 300 g / cm 2 (L = 238 kg) Polishing time: 15 minutes Removal amount: 30 μm Lower platen rotation speed: 40 rpm Upper platen rotation speed: 35 rpm Gear rotation speed in the inner part: 14 rpm Outer gear rotation speed: 29 rpm

【0089】上記第一研磨工程を終えたガラス基板を、
中性洗剤、純水、純水、IPA(イソプロピルアルコー
ル)、IPA(蒸気乾燥)の各洗浄槽に順次浸漬して、
洗浄した。
The glass substrate after the first polishing step is
Immerse in each washing tank of neutral detergent, pure water, pure water, IPA (isopropyl alcohol), IPA (steam drying) sequentially,
Washed.

【0090】(5)第二研磨工程 次に、第一研磨工程で使用した研磨装置を用い、ポリシ
ャを硬質ポリシャから軟質ポリシャ(ポリラックス:ス
ピードファム社製)に替えて、第二研磨工程を実施し
た。研磨条件は、荷重を100g/cm2、研磨時間を
5分、除去量を5μmとしたこと以外は、第一研磨工程
と同様とした。
(5) Second Polishing Step Next, using the polishing apparatus used in the first polishing step, the polisher was changed from a hard polisher to a soft polisher (Polyac: manufactured by Speed Fam), and the second polishing step was performed. Carried out. The polishing conditions were the same as in the first polishing step, except that the load was 100 g / cm 2 , the polishing time was 5 minutes, and the removal amount was 5 μm.

【0091】上記第二研磨工程を終えたガラス基板を、
中性洗剤、中性洗剤、純水、純水、IPA(イソプロピ
ルアルコール)、IPA(蒸気乾燥)の各洗浄槽に順次
浸漬して、洗浄した。なお、各洗浄槽には超音波を印加
した。
The glass substrate after the second polishing step is
Washing was performed by sequentially immersing in a washing tank of a neutral detergent, a neutral detergent, pure water, pure water, IPA (isopropyl alcohol), and IPA (steam drying). In addition, ultrasonic waves were applied to each cleaning tank.

【0092】(6)化学強化工程 次に、上記研削、研磨工程を終えたガラス基板に化学強
化を施した。化学強化は、硝酸カリウム(60%)と硝
酸ナトリウム(40%)を混合した化学強化溶液を用意
し、この化学強化溶液を400℃に加熱し、300℃に
予熱された洗浄済みのガラス基板を約3時間浸漬して行
った。この浸漬の際に、ガラス基板の表面全体が化学強
化されるようにするため、複数のガラス基板が端面で保
持されるようにホルダーに収納した状態で行った。
(6) Chemical strengthening process Next, the glass substrate after the grinding and polishing processes was subjected to chemical strengthening. For the chemical strengthening, a chemical strengthening solution in which potassium nitrate (60%) and sodium nitrate (40%) are mixed is prepared, and the chemical strengthening solution is heated to 400 ° C., and the cleaned glass substrate preheated to 300 ° C. is washed. The immersion was performed for 3 hours. In this immersion, in order to chemically strengthen the entire surface of the glass substrate, the immersion was performed in a state where a plurality of glass substrates were housed in a holder so as to be held at end faces.

【0093】このように、化学強化溶液に浸漬処理する
ことによって、ガラス基板表層のリチウムイオン、ナト
リウムイオンは、化学強化溶液中のナトリウムイオン、
カリウムイオンにそれぞれ置換されガラス基板は強化さ
れる。
As described above, by performing the immersion treatment in the chemical strengthening solution, the lithium ions and the sodium ions on the surface layer of the glass substrate become the sodium ions in the chemical strengthening solution,
The glass substrate is strengthened by being respectively substituted by potassium ions.

【0094】上記化学強化を終えたガラス基板を、20
℃の水槽に浸漬して急冷し約10分間維持した。
The glass substrate that has been chemically strengthened is
It was immersed in a water bath at a temperature of 10 ° C. and rapidly cooled and maintained for about 10 minutes.

【0095】上記急冷を終えたガラス基板を、約40℃
に加熱した硫酸に浸漬し、超音波をかけながら洗浄を行
った。
The glass substrate that has been quenched is heated to about 40 ° C.
The substrate was immersed in heated sulfuric acid and washed while applying ultrasonic waves.

【0096】上記の工程を経て得られたガラス基板の主
表面の表面粗さRaは0.5〜1nmであった。
The surface roughness Ra of the main surface of the glass substrate obtained through the above steps was 0.5 to 1 nm.

【0097】また、上記と同様の工程を経て得られたガ
ラス基板(8枚)について、圧縮応力、引張応力、及び
圧縮応力層の深さをそれぞれ測定したところ、表1に示
す値となった。
Further, the compressive stress, the tensile stress, and the depth of the compressive stress layer of the glass substrates (8 sheets) obtained through the same steps as above were measured, and the values shown in Table 1 were obtained. .

【0098】上記測定結果(平均値)に基づき作成した
応力分布図(歪みのプロフィル)を図1に示す。
FIG. 1 shows a stress distribution diagram (strain profile) created based on the above measurement results (average values).

【0099】[0099]

【表1】 [Table 1]

【0100】磁気ディスクの製造 上述した工程を経て得られた磁気ディスク用ガラス基板
の両面に、インライン式のスパッタリング装置を用い
て、AlNのスパッタによるテクスチャー層、Cr下地
層、CrMo下地層、CoPtCrTa磁性層、C保護
層を順次成膜して磁気ディスクを得た。
Manufacture of Magnetic Disk A texture layer, a Cr underlayer, a CrMo underlayer, and a CoPtCrTa magnetic layer were formed on both surfaces of a glass substrate for a magnetic disk obtained through the above-described processes by using an in-line type sputtering apparatus. A layer and a C protective layer were sequentially formed to obtain a magnetic disk.

【0101】得られた磁気ディスクについて、高速回転
による破壊試験、落下による破壊試験、及び経時破損に
対する耐久性試験を実施したところ、破壊や破損は認め
られなかった。
The obtained magnetic disk was subjected to a breaking test by high-speed rotation, a breaking test by dropping, and a durability test against breakage with time, and no breakage or breakage was observed.

【0102】なお、得られた磁気ディスクについてグラ
イドテストを実施したところ、ヒット(ヘッドが磁気デ
ィスク表面の突起にかすること)やクラッシュ(ヘッド
が磁気ディスク表面の突起に衝突すること)は認められ
なかった。
A glide test was performed on the obtained magnetic disk. As a result, a hit (the head touches a protrusion on the surface of the magnetic disk) and a crash (the head hit the protrusion on the surface of the magnetic disk) were recognized. Did not.

【0103】比較例1 圧縮応力、引張応力、及び圧縮応力層の深さの測定値が
表1に示す値である磁気ディスク用ガラス基板(8枚)
を製造し、この基板を用いて磁気ディスクを製造した。
また、上記測定値(平均値)に基づき作成した応力分布
図(歪みのプロフィル)を図1に示す。
Comparative Example 1 A glass substrate for magnetic disk (eight pieces) in which the measured values of the compressive stress, the tensile stress, and the depth of the compressive stress layer are the values shown in Table 1.
Was manufactured, and a magnetic disk was manufactured using this substrate.
FIG. 1 shows a stress distribution diagram (strain profile) created based on the measured values (average values).

【0104】得られた磁気ディスクについて、高速回転
による破壊試験、落下による破壊試験、及び経時破損に
対する耐久性試験を実施したところ、破壊や破損が認め
られた。
The obtained magnetic disk was subjected to a breaking test by high-speed rotation, a breaking test by dropping, and a durability test against breakage with time.

【0105】実施例2 ガラス組成を、SiO2:62〜75重量%、Al
23:5〜15重量%、Li2O:4〜10重量%、N
2O:4〜12重量%、ZrO2:5.5〜15重量%
を主成分として含有するとともに、Na2O/ZrO2
重量比が0.5〜2.0、Al23/ZrO2の重量比
が0.4〜2.5であるアルミノシリケートガラスとし
たこと以外は実施例1と同様にして磁気ディスク用ガラ
ス基板及び磁気ディスクを得た。
Example 2 The glass composition was as follows: SiO 2 : 62 to 75% by weight, Al
2 O 3 : 5 to 15% by weight, Li 2 O: 4 to 10% by weight, N
a 2 O: 4 to 12 wt%, ZrO 2: 5.5 to 15 wt%
And aluminosilicate glass having a weight ratio of Na 2 O / ZrO 2 of 0.5 to 2.0 and a weight ratio of Al 2 O 3 / ZrO 2 of 0.4 to 2.5. A glass substrate for a magnetic disk and a magnetic disk were obtained in the same manner as in Example 1 except for the above.

【0106】得られた磁気ディスクについて実施例1と
同様の試験を行った結果、破壊や破損は認められなかっ
た。
The same test as in Example 1 was performed on the obtained magnetic disk, and no destruction or damage was found.

【0107】実施例3〜4 アルミノシリケートガラスの代わりにソーダライムガラ
ス(実施例3)、ソーダアルミノケイ酸ガラス(実施例
4)を用いたこと以外は実施例1と同様にして、磁気デ
ィスク用ガラス基板及び磁気ディスクを得た。
Examples 3 and 4 Glasses for magnetic disks were prepared in the same manner as in Example 1 except that soda lime glass (Example 3) and soda aluminosilicate glass (Example 4) were used instead of aluminosilicate glass. A substrate and a magnetic disk were obtained.

【0108】得られた磁気ディスクについて実施例1と
同様の試験を行った結果、破壊や破損は認められなかっ
た。
The same test as in Example 1 was performed on the obtained magnetic disk, and no destruction or damage was found.

【0109】実施例5 実施例1で得られた磁気ディスク用ガラス基板の両面
に、Al(膜厚50オングストローム)/Cr(100
0オングストローム)/CrMo(100オングストロ
ーム)からなる下地層、CoPtCr(120オングス
トローム)/CrMo(50オングストローム)/Co
PtCr(120オングストローム)からなる磁性層、
Cr(50オングストローム)保護層をインライン型ス
パッタ装置で形成した。
Example 5 On both surfaces of the glass substrate for a magnetic disk obtained in Example 1, Al (film thickness: 50 Å) / Cr (100
0 Å / CrMo (100 Å), CoPtCr (120 Å) / CrMo (50 Å) / Co
A magnetic layer made of PtCr (120 Å),
A Cr (50 Å) protective layer was formed by an in-line type sputtering apparatus.

【0110】上記基板を、シリカ微粒子(粒経100オ
ングストローム)を分散した有機ケイ素化合物溶液(水
とIPAとテトラエトキシシランとの混合液)に浸し、
焼成することによってSiO2からなるテクスチャー機
能を持った保護層を形成し、さらに、この保護層上をパ
ーフロロポリエーテルからなる潤滑剤でディップ処理し
て潤滑層を形成して、MRヘッド用磁気ディスクを得
た。
The above substrate is immersed in an organic silicon compound solution (a mixed solution of water, IPA and tetraethoxysilane) in which fine silica particles (particle size: 100 Å) are dispersed,
A protective layer having a texture function made of SiO 2 is formed by firing, and a dip treatment is performed on the protective layer with a lubricant made of perfluoropolyether to form a lubricating layer. Got a disc.

【0111】得られた磁気ディスクについて、高速回転
による破壊試験、落下による破壊試験、及び及び経時破
損に対する耐久性試験を実施したところ、破壊や破損は
認められなかった。
The obtained magnetic disk was subjected to a breaking test by high-speed rotation, a breaking test by dropping, and a durability test against breakage with time, and no breakage or breakage was observed.

【0112】実施例6 下地層をAl/Cr/Crとし、磁性層をCoNiCr
Taとしたこと以外は実施例5と同様にして薄膜ヘッド
用磁気ディスクを得た。
Example 6 The underlayer was made of Al / Cr / Cr, and the magnetic layer was made of CoNiCr.
A magnetic disk for a thin film head was obtained in the same manner as in Example 5 except that Ta was used.

【0113】上記磁気ディスクについて実施例5と同様
のことが確認された。
It was confirmed that the above magnetic disk was the same as in Example 5.

【0114】以上好ましい実施例を挙げて本発明を説明
したが、本発明は必ずしも上記実施例に限定されるもの
ではない。
Although the present invention has been described with reference to the preferred embodiments, the present invention is not necessarily limited to the above embodiments.

【0115】例えば、ガラス基板の種類や磁性層等の記
録層の種類は実施例のものに限定されない。
For example, the type of the glass substrate and the type of the recording layer such as the magnetic layer are not limited to those of the embodiment.

【0116】[0116]

【発明の効果】以上説明したように本発明では、ガラス
基板を化学強化した際に生ずる圧縮応力、引張応力、圧
縮応力層の深さの三者を最適な範囲で厳密に制御するこ
とで、ガラス基板の強度及び経時破損に対する耐久性等
が著しく向上する。
As described above, according to the present invention, the compression stress, the tensile stress, and the depth of the compression stress layer generated when the glass substrate is chemically strengthened are strictly controlled within the optimum range. The strength and durability against breakage with time of the glass substrate are significantly improved.

【0117】また、ガラス基板の端面を研磨して、経時
破損等の原因となるクラックを除去することで、さらに
強度及び経時破損に対する耐久性の向上が図られる。
Further, by polishing the end face of the glass substrate to remove cracks that cause damage with time, the strength and durability against damage with time can be further improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】化学強化されたガラス基板の応力分布を示す図
である。
FIG. 1 is a diagram showing a stress distribution of a chemically strengthened glass substrate.

【符号の説明】[Explanation of symbols]

1 ガラス基板 2 表面 1 Glass substrate 2 Surface

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.6 識別記号 FI G11B 11/10 511 G11B 11/10 511A 541 541E ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 6 Identification code FI G11B 11/10 511 G11B 11/10 511A 541 541E

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 化学強化されたガラス基板であって、 化学強化によりガラス基板表層に生じる圧縮応力層の深
さを30〜100μmとし、 圧縮応力の値を2〜15kg/mm2以下とし、かつ、
化学強化によりガラス基板内部に生ずる引張応力の値を
1.5kg/mm2以下としたことを特徴とする記録媒
体用ガラス基板。
1. A chemically strengthened glass substrate, wherein a depth of a compressive stress layer generated on a surface layer of the glass substrate by chemical strengthening is 30 to 100 μm, a value of compressive stress is 2 to 15 kg / mm 2 or less, and ,
A glass substrate for a recording medium, wherein a value of a tensile stress generated inside the glass substrate by chemical strengthening is set to 1.5 kg / mm 2 or less.
【請求項2】 ガラス基板のガラス組成が、モル%表示
で、SiO2を57〜74%、ZnO2を0〜2.8%、
Al23を3〜15%、LiO2を7〜16%、Na2
を4〜14%含有する組成であることを特徴とする請求
項1記載の記録媒体用ガラス基板。
2. The glass composition of a glass substrate is as follows: SiO 2 , 57-74%; ZnO 2 , 0-2.8%;
The Al 2 O 3 3~15%, the LiO 2 7~16%, Na 2 O
2. The glass substrate for a recording medium according to claim 1, wherein the composition comprises 4 to 14%.
【請求項3】 ガラス基板の化学強化を、温度200〜
500℃の化学強化処理液に、0.5〜5時間浸漬して
行うことを特徴とする請求項1又は2記載の記録媒体用
ガラス基板。
3. The chemical strengthening of a glass substrate is performed at a temperature of 200 to
The glass substrate for a recording medium according to claim 1, wherein the glass substrate is immersed in a chemical strengthening treatment solution at 500 ° C. for 0.5 to 5 hours.
【請求項4】 ガラス基板の端面を研磨して、経時破損
の原因となるクラックを除去したことを特徴とする請求
項1乃至3記載の記録媒体用ガラス基板。
4. The glass substrate for a recording medium according to claim 1, wherein an end face of the glass substrate is polished to remove cracks that cause damage with time.
【請求項5】 ガラス基板の端面の研磨量が、0.5〜
15μmであることを特徴とする請求項4記載の記録媒
体用ガラス基板。
5. The polishing amount of the end face of the glass substrate is 0.5 to
The glass substrate for a recording medium according to claim 4, wherein the thickness is 15 µm.
【請求項6】 ガラス基板の端面研磨が、ブラシ又は研
磨粉(ポリシャ)あるいは研磨剤によってなされること
を特徴とする請求項5記載の記録媒体用ガラス基板。
6. The glass substrate for a recording medium according to claim 5, wherein the end surface of the glass substrate is polished with a brush, a polishing powder (polisher), or an abrasive.
【請求項7】 ガラス基板の端面の表面粗さが、Rma
x:0.01〜1μm、Ra:0.001〜0.8μm
であることを特徴とする請求項4乃至6記載の記録媒体
用ガラス基板。
7. An end face of a glass substrate having a surface roughness of Rma
x: 0.01-1 μm, Ra: 0.001-0.8 μm
The glass substrate for a recording medium according to claim 4, wherein:
【請求項8】 請求項1乃至7記載の記録媒体用ガラス
基板上に、少なくとも記録層を形成したことを特徴とす
る記録媒体。
8. A recording medium comprising at least a recording layer formed on the glass substrate for a recording medium according to claim 1.
JP35928696A 1996-12-29 1996-12-29 Glass substrate for recording medium, and recording medium using the substrate Expired - Fee Related JP3254157B2 (en)

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