JPH10170413A - Sample holder - Google Patents

Sample holder

Info

Publication number
JPH10170413A
JPH10170413A JP32558696A JP32558696A JPH10170413A JP H10170413 A JPH10170413 A JP H10170413A JP 32558696 A JP32558696 A JP 32558696A JP 32558696 A JP32558696 A JP 32558696A JP H10170413 A JPH10170413 A JP H10170413A
Authority
JP
Japan
Prior art keywords
sample
sample holder
wall
block
fixed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32558696A
Other languages
Japanese (ja)
Inventor
Noriyoshi Konno
憲美 今野
Ayako Sato
綾子 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP32558696A priority Critical patent/JPH10170413A/en
Publication of JPH10170413A publication Critical patent/JPH10170413A/en
Pending legal-status Critical Current

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  • Sampling And Sample Adjustment (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a sample holder which is not displaced by outside force even with light cylindrical sample, by fixing the cylindrical sample with sure for stable holding. SOLUTION: Relating to a sample holder 1, a V block 4 is provided inside an opening 3 formed on the upper surface of a base body 2, and a sample is held on the V block 4. At one end part of the V block 4, in the direction across the V block 4, a fixing wall 11 is provided, and at the other end part of the V block 4, a moving wall 12 comprising a coil spring 13 which biases the sample toward the fixing wall 11, is provide. Into the coil spring 13, supporting rod 15 whose one end is fixed to the rear surface of the moving wall 12 and the other end inserted in a supporting rod slide hole 14 while free movement allowed, is inserted. Thereby, the sample is surely fixed for stable holding, so dislocation is prevented even with a light sample. Thus, using such measurement instrument as a scanning prove microscope, etc., measurement precision is improved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は試料ホルダに関する
ものであり、特に、測定装置を用いて試料の表面を測定
等する際に、試料を安定して保持固定できるようにした
試料ホルダに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample holder, and more particularly to a sample holder that can stably hold and fix a sample when measuring the surface of the sample using a measuring device.

【0002】[0002]

【従来の技術】試料の表面形状や物理量等を測定する装
置においては、通常、試料の取り扱いを容易にするため
に試料を予め試料ホルダに固定して測定が行われている
が、例えば、円筒状の試料を固定するのに好適な試料ホ
ルダが従来より知られている。
2. Description of the Related Art In an apparatus for measuring the surface shape and physical quantity of a sample, the sample is usually fixed to a sample holder in advance in order to facilitate the handling of the sample. 2. Description of the Related Art A sample holder suitable for fixing a sample in the shape of a plate has been conventionally known.

【0003】図5は従来の試料ホルダ及びこの試料ホル
ダを固定する試料ステージを示す斜視図である。図5に
示すように、試料ホルダ10は、基体2の上面に開口3
を有しており、開口3の内部中央に、それぞれ45°の
角度に形成されたV字状の傾斜面4(以下、Vブロック
と表記する)が設けられている。また、基体2の上面に
は、ネジ穴5が複数形成されている。試料ステージ6
は、試料ホルダ10の開口3とほぼ同形の開口を有して
おり、試料ホルダ10のネジ穴5と同位置にネジ穴7が
形成されている。この試料ホルダ10は、試料ステージ
6の下部にOリング8を介して装着され、試料ステージ
6の上方からネジ穴7、5にネジ9を螺入することによ
り固定される。円筒状の試料は、その外周面をVブロッ
ク4上に当接させ自重により立てて使用する。なお、試
料ステージ6上面左側の平坦な部分は、例えば底面が平
面状の試料を載置して測定する場合に利用される。
FIG. 5 is a perspective view showing a conventional sample holder and a sample stage for fixing the sample holder. As shown in FIG. 5, the sample holder 10 has an opening 3
And a V-shaped inclined surface 4 (hereinafter, referred to as a V block) formed at an angle of 45 ° is provided in the center of the inside of the opening 3. A plurality of screw holes 5 are formed on the upper surface of the base 2. Sample stage 6
Has an opening having substantially the same shape as the opening 3 of the sample holder 10, and a screw hole 7 is formed at the same position as the screw hole 5 of the sample holder 10. The sample holder 10 is mounted below the sample stage 6 via an O-ring 8, and is fixed by screwing a screw 9 into the screw holes 7 and 5 from above the sample stage 6. The cylindrical sample is used upright by its own weight with its outer peripheral surface abutting on the V-block 4. The flat portion on the left side of the upper surface of the sample stage 6 is used, for example, when a sample having a flat bottom surface is placed and measured.

【0004】このような試料ホルダ10は、円筒状試
料、例えば磁気ヘッドを円筒状の回転ドラムに固定した
磁気ヘッドドラムを保持するのに好適に用いられる。磁
気ヘッドは、現在、ビデオカメラ、VTR等に広く用い
られているが、走査型プローブ顕微鏡で磁気力測定が実
用化されたことも手伝い、その摺動面の形状情報に加え
磁気情報の測定要求が高まっている。
Such a sample holder 10 is suitably used for holding a cylindrical sample, for example, a magnetic head drum in which a magnetic head is fixed to a cylindrical rotating drum. Currently, magnetic heads are widely used in video cameras, VTRs, and the like. However, the magnetic force measurement has been put into practical use with a scanning probe microscope, and in addition to the shape information of the sliding surface, a magnetic information measurement request has been required. Is growing.

【0005】図6はビデオカメラに用いられている磁気
ヘッドドラムの一例を示す斜視図である。磁気ヘッドド
ラム20は、金属製ドラム21の一方の面に記録再生及
び消去用の磁気ヘッド22が、例えば5個ネジ止めされ
て構成されている。磁気ヘッド22の摺動面23は金属
製ドラム21の外周面より僅かに突出しており、金属製
ドラム21の外縁より1mm程度入り込んだところに位
置し、磁気テープ等の記録媒体と接触する。また、金属
製ドラム21は外観上円筒状であるが、金属製ドラム2
1の他方の面はモータ設置や配線用のスペースとして確
保されており、厚み方向の半分程度は中空になってい
る。
FIG. 6 is a perspective view showing an example of a magnetic head drum used in a video camera. The magnetic head drum 20 is configured such that, for example, five magnetic heads 22 for recording / reproducing and erasing are screwed to one surface of a metal drum 21. The sliding surface 23 of the magnetic head 22 slightly protrudes from the outer peripheral surface of the metal drum 21, is located about 1 mm from the outer edge of the metal drum 21, and comes into contact with a recording medium such as a magnetic tape. Although the metal drum 21 is cylindrical in appearance, the metal drum 2
The other surface of 1 is secured as a space for installing a motor and wiring, and about half in the thickness direction is hollow.

【0006】ところで、図5に示す試料ホルダ10は、
Vブロック4上に試料の外周面を当接させ、試料自身の
重みで固定する自重固定方式である。よって、試料は、
試料ホルダ10への装着から測定終了までに外部から受
ける、種々の振動要因に耐えうる程度の重量が必要とな
る。しかしながら、現状において試料ホルダ10の主な
用途となる磁気ヘッドドラム20は、その動作機構上、
材料及び形状とも非常に軽量化されているため、自重固
定では微振動で簡単に動いてしまいその位置がずれると
いう問題があった。
Meanwhile, the sample holder 10 shown in FIG.
In this method, the outer peripheral surface of the sample is brought into contact with the V block 4 and the sample is fixed by its own weight. Therefore, the sample
It is necessary to have a weight that can withstand various vibration factors externally received from the time when the sample holder 10 is attached to the time when the measurement is completed. However, the magnetic head drum 20, which is currently the main use of the sample holder 10, is
Since both the material and the shape are very light, there has been a problem that, when the material is fixed by its own weight, it moves easily due to micro-vibration and its position shifts.

【0007】以下、その問題について図7を参照して詳
細に説明する。図7は試料表面の凹凸形状、磁気力、摩
擦力等の情報を3次元表示する走査型プローブ顕微鏡
(SPM:Scanning Probe Micro
scope)により、磁気ヘッド摺動面の凹凸を測定す
る際の概略構成図である。なお、試料(磁気ヘッドドラ
ム20)は図5に示した試料ホルダ10に保持され、カ
ンチレバー34の下方に設置された防振台上のステージ
台(いずれも図示省略)にセットされている。
Hereinafter, the problem will be described in detail with reference to FIG. FIG. 7 shows a scanning probe microscope (SPM: Scanning Probe Micro) that three-dimensionally displays information such as the uneven shape of the sample surface, magnetic force, and frictional force.
FIG. 3 is a schematic configuration diagram when measuring the unevenness of the sliding surface of the magnetic head by Scope). The sample (magnetic head drum 20) is held by the sample holder 10 shown in FIG. 5, and set on a stage table (both not shown) on a vibration isolating table installed below the cantilever 34.

【0008】走査型プローブ顕微鏡30は、制御部31
より周波数シンセサイザ32の出力周波数を設定し、そ
の出力周波数によってピエゾスキャナ33の加振器を振
動させることで、カンチレバー34を共振周波数近傍で
加振させる。加振されたカンチレバー34の探針35が
試料表面を走査し試料表面の凸部にさしかかると、カン
チレバー34の振幅が減少するようになっている。一
方、カンチレバー34の背面にはレーザ光源36からレ
ーザ光が照射されており、その反射光を光検出器37に
入射させ、カンチレバー34の振幅を光検出器37に入
射するレーザ光の変位として読み取り、その信号を振幅
検出器38に入力する。つまり、振幅検出器38により
カンチレバー34の振幅を検出するとともに、その検出
値とタップ力を決定する基準値とを比較し、両者の差信
号を制御部31にフィードバックし、ピエゾスキャナ3
3のZ軸方向の振幅を制御することによりカンチレバー
34の振幅が一定に保たれる。また、X、Y軸方向もラ
スタースキャンし、これらのX、Y、Z軸コントロール
信号をもとに試料表面の三次元の凹凸イメージを描く。
The scanning probe microscope 30 includes a control unit 31
By setting the output frequency of the frequency synthesizer 32 and vibrating the vibrator of the piezo scanner 33 with the output frequency, the cantilever 34 is vibrated near the resonance frequency. When the probe 35 of the vibrated cantilever 34 scans the sample surface and approaches a convex portion of the sample surface, the amplitude of the cantilever 34 decreases. On the other hand, a laser beam is irradiated from the laser light source 36 on the back surface of the cantilever 34, and the reflected light is made incident on the photodetector 37, and the amplitude of the cantilever 34 is read as the displacement of the laser light incident on the photodetector 37. , Is input to the amplitude detector 38. That is, the amplitude of the cantilever 34 is detected by the amplitude detector 38, the detected value is compared with a reference value for determining the tap force, and a difference signal between the two is fed back to the control unit 31.
By controlling the amplitude in the Z-axis direction of No. 3, the amplitude of the cantilever 34 is kept constant. Further, raster scanning is also performed in the X and Y axis directions, and a three-dimensional uneven image of the sample surface is drawn based on the X, Y and Z axis control signals.

【0009】このような走査型プローブ顕微鏡30で磁
気ヘッド22を測定する場合、磁気ヘッドの摺動面23
を真上に向ける(水平にする)位置調整が必要となる。
この位置調整は、試料ホルダ10及び試料ステージ6を
走査型プローブ顕微鏡30のステージ台から一旦外し、
試料ホルダ10のVブロック4に磁気ヘッドドラム20
をのせ、光学顕微鏡下で行っている。しかし、その後、
試料ホルダ10及び試料ステージ6を走査型プローブ顕
微鏡30のステージ台に設置するまでの間に、試料が外
部から受ける振動により容易に動いてしまうことが確認
された。また、試料ホルダ10をステージ台に設置した
後も、誤って防振台を揺らし試料を動かしてしまう場合
や、走査型プローブ顕微鏡30による測定中に試料が動
いたと思われる歪みやノイズ等が測定データに発生する
場合も認められた。
When measuring the magnetic head 22 with such a scanning probe microscope 30, the sliding surface 23 of the magnetic head
Is required to be directed upward (to be horizontal).
This position adjustment is performed by temporarily removing the sample holder 10 and the sample stage 6 from the stage base of the scanning probe microscope 30 and
The magnetic head drum 20 is attached to the V block 4 of the sample holder 10.
And under a light microscope. But then
It was confirmed that the sample was easily moved by the vibration received from the outside before the sample holder 10 and the sample stage 6 were set on the stage table of the scanning probe microscope 30. Also, even after the sample holder 10 is set on the stage base, the vibration isolating base is erroneously shaken to move the sample, or the distortion or noise that seems to have moved during the measurement by the scanning probe microscope 30 is measured. Occasions in the data were also recognized.

【0010】以上、説明したように、円筒状試料に好適
な試料ホルダ10を用いても、磁気ヘッドドラム20等
の円筒形状を有する試料を確実に固定することができな
いため、試料の位置調整を繰り返し行わなければならな
かったり、試料を精度よく測定することが困難であっ
た。
As described above, even if a sample holder 10 suitable for a cylindrical sample is used, a sample having a cylindrical shape, such as the magnetic head drum 20, cannot be reliably fixed. It has to be repeated and it is difficult to measure the sample with high accuracy.

【0011】[0011]

【発明が解決しようとする課題】従って、本発明が解決
しようとする課題は、円筒状試料を確実に固定して保持
の安定化を図り、軽量の円筒状試料であっても外力によ
り位置ずれすることがない試料ホルダを提供することに
ある。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to stabilize the holding of a cylindrical sample by securely fixing it, and to displace even a lightweight cylindrical sample due to an external force. An object of the present invention is to provide a sample holder that does not need to be mounted.

【0012】[0012]

【課題を解決するための手段】上記課題を解決するため
に、本発明の試料ホルダは、基体の上面に形成された開
口の内部にV字状傾斜面を有し、V字状傾斜面上に試料
を保持する試料ホルダにおいて、V字状傾斜面と交差す
る方向の、V字状傾斜面の一端部に固定壁を設けるとと
もに、V字状傾斜面の他端部には、試料を固定壁の方向
に付勢するコイルバネ等の付勢手段を有する移動壁を設
けたことを特徴とする。なお、ここでいうV字状傾斜面
と交差する方向とは、V字状の一対の傾斜面が互いに対
向する方向と交差する方向を指している。また、コイル
バネには、一端が移動壁の背面に固定され、他端が基体
に遊嵌した支持棒が挿通されていることが好ましい。
In order to solve the above-mentioned problems, a sample holder according to the present invention has a V-shaped inclined surface inside an opening formed on an upper surface of a base, and the V-shaped inclined surface has In a sample holder for holding a sample, a fixed wall is provided at one end of the V-shaped inclined surface in a direction intersecting with the V-shaped inclined surface, and the sample is fixed at the other end of the V-shaped inclined surface. A moving wall having an urging means such as a coil spring for urging in the direction of the wall is provided. Here, the direction intersecting with the V-shaped inclined surface refers to a direction intersecting the direction in which a pair of V-shaped inclined surfaces oppose each other. Further, it is preferable that one end of the coil spring is fixed to the rear surface of the moving wall, and the other end of the support rod is loosely fitted to the base.

【0013】上記構成の試料ホルダによれば、試料をV
字状傾斜面に載置し、固定壁及び移動壁間に挿入するこ
とにより、試料は、移動壁に付加された付勢手段により
固定壁の方向へ付勢され、固定壁及び移動壁間で確実に
固定されるので、試料が軽量のものであっても、試料の
位置ずれを防止することができる。
According to the sample holder having the above structure, the sample is
By placing the sample on the inclined surface and inserting it between the fixed wall and the moving wall, the sample is urged in the direction of the fixed wall by the urging means added to the moving wall, and the sample is moved between the fixed wall and the moving wall. Since the sample is securely fixed, it is possible to prevent the sample from shifting even if the sample is lightweight.

【0014】[0014]

【発明の実施の形態】以下、本発明の実施の形態例を図
面を参照して説明する。なお、図中の構成要素で、従来
の技術と同様の構成をなしているものについては同一の
参照符号を付し、その説明は一部省略する。
Embodiments of the present invention will be described below with reference to the drawings. In the drawings, components having the same configuration as that of the conventional technology are denoted by the same reference numerals, and the description thereof is partially omitted.

【0015】図1は本発明の試料ホルダの実施の形態例
を示す斜視図、図2は図1の平面図、図3は図2におけ
るA−A’線断面図、図4は図2におけるB−B’線断
面図である。図1に示すように、本発明の試料ホルダ1
は、基体2の上面に開口3を有しており、開口3の内部
中央に、それぞれ45°の角度に形成されたV字状の傾
斜面、即ちVブロック4が設けられている。また、Vブ
ロック4と交差する方向の、Vブロック4の一端部には
金属製の固定壁11が設けられており、他端部にはVブ
ロック4上を図中矢印X方向へ移動可能な金属製の移動
壁12が設けられている。固定壁11及び移動壁12
は、基体2の上面と垂直に設けられている。
FIG. 1 is a perspective view showing an embodiment of a sample holder according to the present invention, FIG. 2 is a plan view of FIG. 1, FIG. 3 is a sectional view taken along line AA 'in FIG. 2, and FIG. It is a BB 'line sectional view. As shown in FIG. 1, the sample holder 1 of the present invention
Has an opening 3 in the upper surface of the base 2, and a V-shaped inclined surface formed at an angle of 45 °, that is, a V block 4, is provided in the center of the inside of the opening 3. Further, a metal fixed wall 11 is provided at one end of the V block 4 in a direction intersecting with the V block 4, and the other end thereof is movable on the V block 4 in the arrow X direction in the figure. A moving wall 12 made of metal is provided. Fixed wall 11 and moving wall 12
Is provided perpendicular to the upper surface of the base 2.

【0016】移動壁12の下部はVブロック4と同様に
V字状に形成されており、移動壁12は、一端が移動壁
12の背面に係止され、他端が開口3の内壁に係止され
たコイルバネ13により、常時固定壁11の方向へ付勢
されている。また、コイルバネ13の内部には、一端が
移動壁12の背面に溶着等により固定され、他端が開口
3の内壁から基体2に穿設された支持棒スライド穴14
に遊嵌した支持棒15が挿通されている。支持棒15の
他端が、支持棒スライド穴14内を移動することによ
り、支持棒15と移動壁12の移動を安定して行うこと
ができる。なお、固定壁11及び移動壁12間で試料を
挟持し、固定するが、その際の試料の滑り防止及び試料
自体の損傷防止のため、図2及び図4に示すように、固
定壁11及び移動壁12の試料と接触する面(両者が対
向する面)にそれぞれゴム16等の弾性体を貼着するこ
とが好ましい。
The lower portion of the moving wall 12 is formed in a V shape like the V block 4. One end of the moving wall 12 is locked to the rear surface of the moving wall 12, and the other end is connected to the inner wall of the opening 3. The stationary coil spring 13 is constantly urged in the direction of the fixed wall 11. Inside the coil spring 13, one end is fixed to the back surface of the moving wall 12 by welding or the like, and the other end is a support rod slide hole 14 formed in the base 2 from the inner wall of the opening 3.
Is inserted through the support rod 15 which is loosely fitted. By moving the other end of the support rod 15 in the support rod slide hole 14, the support rod 15 and the moving wall 12 can be moved stably. The sample is sandwiched and fixed between the fixed wall 11 and the moving wall 12, and in order to prevent the sample from slipping and to prevent the sample itself from being damaged at that time, as shown in FIGS. It is preferable to attach an elastic body such as rubber 16 to each of the surfaces of the moving wall 12 that come into contact with the sample (the surfaces facing each other).

【0017】図3に示すように、試料ホルダ1に、例え
ば図6に示したビデオカメラ用磁気ヘッドドラム20の
ような円筒状試料を装着した場合、試料中心線Cは基体
2の上面より高いところに位置するが、試料を保持する
目的から固定壁11及び移動壁12の高さは、少なくと
も試料中心線Cより高くする必要がある。ただし、試料
ホルダ1を試料ステージ6に設置した状態で、試料ステ
ージ6から突出しない範囲とする。
As shown in FIG. 3, when a cylindrical sample such as the magnetic head drum 20 for a video camera shown in FIG. 6 is mounted on the sample holder 1, the sample center line C is higher than the upper surface of the base 2. However, the height of the fixed wall 11 and the moving wall 12 needs to be at least higher than the sample center line C for the purpose of holding the sample. However, when the sample holder 1 is set on the sample stage 6, the range is set so as not to project from the sample stage 6.

【0018】また、試料ホルダ1に、所定の磁気ヘッド
の摺動面が真上に位置するように磁気ヘッドドラム20
を装着した場合、図3に示すように、他の磁気ヘッドの
摺動面がVブロック4部分に接触する虞が生じる。磁気
ヘッドの摺動面が物理的に金属等に接触した場合、正確
な表面情報が得られなくなってしまう。そこで、図2及
び図4に示すように、固定壁11をVブロック4の端面
より2mm程度離れた位置に設置する。Vブロック4の
端面と固定壁11とで形成されるスペースSに他の磁気
ヘッドの摺動面を配置させることにより、測定される磁
気ヘッド以外の磁気ヘッドの摺動面がVブロック4に接
触するのを防止できる。従って、同一磁気ヘッドドラム
内の他の磁気ヘッドの測定も弊害なく行うことができ
る。なお、固定壁11は試料ホルダ1の基体2に固定し
てもよいが、試料の大きさ(厚み)の変更にも対応でき
るように、Vブロック4の一端部に溝を設け、この溝に
着脱可能としてもよい。
The magnetic head drum 20 is placed on the sample holder 1 such that the predetermined sliding surface of the magnetic head is positioned directly above.
In the case where is mounted, as shown in FIG. 3, there is a possibility that the sliding surface of another magnetic head comes into contact with the V block 4 portion. If the sliding surface of the magnetic head physically contacts metal or the like, accurate surface information cannot be obtained. Therefore, as shown in FIGS. 2 and 4, the fixed wall 11 is installed at a position about 2 mm away from the end face of the V block 4. By arranging the sliding surface of another magnetic head in the space S formed by the end face of the V block 4 and the fixed wall 11, the sliding surface of the magnetic head other than the magnetic head to be measured comes into contact with the V block 4. Can be prevented. Therefore, measurement of other magnetic heads in the same magnetic head drum can be performed without any adverse effect. The fixing wall 11 may be fixed to the base 2 of the sample holder 1, but a groove is provided at one end of the V-block 4 so as to cope with a change in the size (thickness) of the sample. It may be detachable.

【0019】次に、試料をこの試料ホルダ1に固定する
方法を説明する。まず、図2において、コイルバネ13
を収縮させるように移動壁12を図中左方に移動させ、
固定壁11と移動壁12の間に、試料を、被測定面(例
えば、磁気ヘッド摺動面等)を上向きにしてVブロック
4上に載置して挿入し、そしてその後、移動壁12をコ
イルバネ13の付勢力で固定壁11の方に移動させ、固
定壁11と移動壁12との間に挟み固定する。この場
合、試料の厚みによってコイルバネ13が伸縮する。こ
のようにして、試料が固定された試料ホルダ1は、光学
顕微鏡下で、被測定面が真上となるように微妙な位置調
整が行われ、さらに、試料ホルダ1を走査型プローブ顕
微鏡30のステージ台に装着し、試料の測定が行われ
る。
Next, a method for fixing a sample to the sample holder 1 will be described. First, in FIG.
The moving wall 12 is moved to the left in the figure so that
The sample is placed and inserted on the V-block 4 between the fixed wall 11 and the moving wall 12 with the surface to be measured (for example, the sliding surface of the magnetic head) facing upward. It is moved toward the fixed wall 11 by the urging force of the coil spring 13, and is sandwiched and fixed between the fixed wall 11 and the moving wall 12. In this case, the coil spring 13 expands and contracts according to the thickness of the sample. In this manner, the sample holder 1 on which the sample is fixed is finely adjusted under the optical microscope so that the surface to be measured is right above. Further, the sample holder 1 is moved to the position of the scanning probe microscope 30. The sample is mounted on the stage base and the sample is measured.

【0020】本発明の試料ホルダによれば、上述したよ
うな試料の位置調整時、試料ホルダのステージ台への装
着時あるいは試料の測定時において、試料が外部からの
振動を受けた場合でも、試料は固定壁と移動壁間にしっ
かりと固定されているため、試料が試料ホルダ内で動
き、位置ずれが生じることを防止できる。
According to the sample holder of the present invention, when the position of the sample is adjusted as described above, when the sample holder is mounted on the stage table, or when the sample is measured, even if the sample receives external vibration, Since the sample is firmly fixed between the fixed wall and the moving wall, it is possible to prevent the sample from moving in the sample holder and causing displacement.

【0021】以上、実施の形態例について詳細に述べた
が、本発明はこれに限定されるものではない。例えば、
上記形態例では固定壁及び移動壁を互いに平行に設けた
が、試料の形状によっては、必ずしも両者を平行に設け
たものでなくてもよい。また、上記形態例では、V字状
傾斜面の一端部に固定壁、他端部に移動壁を設けたが、
V字状傾斜面の両端部に付勢手段を有する移動壁を設け
て構成してもよい。本発明の試料ホルダは、磁気ヘッド
ドラムのような円筒状の試料に用いて好適であるが、こ
れに限定されるものではなく、球状や四角錐等の異形の
試料の試料ホルダとしても広く用いることができる。ま
た、本発明の試料ホルダは、従来技術の項で述べたよう
な走査型プローブ顕微鏡による試料の測定に限らず、表
面観察を行う光学顕微鏡等、試料を所定の位置に保持す
る場合に広く用いることができる。
Although the embodiment has been described in detail, the present invention is not limited to this. For example,
In the above embodiment, the fixed wall and the moving wall are provided in parallel to each other, but depending on the shape of the sample, both may not necessarily be provided in parallel. In the above embodiment, the fixed wall is provided at one end of the V-shaped inclined surface, and the movable wall is provided at the other end.
A movable wall having a biasing means may be provided at both ends of the V-shaped inclined surface. The sample holder of the present invention is preferably used for a cylindrical sample such as a magnetic head drum, but is not limited to this, and is widely used as a sample holder for a deformed sample such as a spherical or square pyramid. be able to. In addition, the sample holder of the present invention is not limited to measurement of a sample by a scanning probe microscope as described in the section of the prior art, and is widely used when holding a sample at a predetermined position, such as an optical microscope for surface observation. be able to.

【0022】[0022]

【発明の効果】本発明の試料ホルダによれば、試料を確
実に固定し、安定して保持することができるため、微振
動で動く軽量な試料であっても、位置ずれを防止するこ
とができる。従って、本発明の試料ホルダを、走査型プ
ローブ顕微鏡をはじめとする各種の測定装置に用いるこ
とにより、測定精度の向上を図ることができる。
According to the sample holder of the present invention, the sample can be securely fixed and stably held, so that even a lightweight sample that moves due to microvibration can prevent displacement. it can. Therefore, the measurement accuracy can be improved by using the sample holder of the present invention for various types of measuring devices such as a scanning probe microscope.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の試料ホルダの実施の形態例を示す斜
視図。
FIG. 1 is a perspective view showing an embodiment of a sample holder of the present invention.

【図2】 図1の平面図。FIG. 2 is a plan view of FIG.

【図3】 図2におけるA−A’線断面図。FIG. 3 is a sectional view taken along line A-A ′ in FIG. 2;

【図4】 図2におけるB−B’線断面図。FIG. 4 is a sectional view taken along line B-B ′ in FIG. 2;

【図5】 従来の試料ホルダと試料ステージを示す斜視
図。
FIG. 5 is a perspective view showing a conventional sample holder and a sample stage.

【図6】 ビデオカメラ用の磁気ヘッドドラムの一例を
示す斜視図。
FIG. 6 is a perspective view showing an example of a magnetic head drum for a video camera.

【図7】 走査型プローブ顕微鏡により磁気ヘッド摺動
面の凹凸を測定する際の概略構成図。
FIG. 7 is a schematic configuration diagram when measuring unevenness of a magnetic head sliding surface by a scanning probe microscope.

【符号の説明】[Explanation of symbols]

1…試料ホルダ、2…基体、3…開口、4…Vブロッ
ク、5…ネジ穴、6…試料ステージ、11…固定壁、1
2…移動壁、13…コイルバネ、14…支持棒スライド
穴、15…支持棒、16…ゴム、20…磁気ヘッドドラ
ム、30…走査型プローブ顕微鏡
DESCRIPTION OF SYMBOLS 1 ... sample holder, 2 ... base, 3 ... opening, 4 ... V block, 5 ... screw hole, 6 ... sample stage, 11 ... fixed wall, 1
2: moving wall, 13: coil spring, 14: support rod slide hole, 15: support rod, 16: rubber, 20: magnetic head drum, 30: scanning probe microscope

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 基体の上面に形成された開口の内部にV
字状傾斜面を有し、前記V字状傾斜面上に試料を保持す
る試料ホルダにおいて、 前記V字状傾斜面と交差する方向の、前記V字状傾斜面
の一端部に固定壁を設けるとともに、 前記V字状傾斜面の他端部には、試料を前記固定壁の方
向に付勢する付勢手段を有する移動壁を設けたことを特
徴とする試料ホルダ。
1. A method according to claim 1, further comprising the step of:
In a sample holder having a V-shaped inclined surface and holding a sample on the V-shaped inclined surface, a fixed wall is provided at one end of the V-shaped inclined surface in a direction intersecting with the V-shaped inclined surface. And a moving wall having an urging means for urging the sample in the direction of the fixed wall is provided at the other end of the V-shaped inclined surface.
【請求項2】 前記付勢手段は、一端が前記移動壁の背
面に係止され、他端が前記開口の内壁に係止されたコイ
ルバネであることを特徴とする請求項1記載の試料ホル
ダ。
2. The sample holder according to claim 1, wherein the biasing means is a coil spring having one end locked to the back of the moving wall and the other end locked to the inner wall of the opening. .
【請求項3】 前記コイルバネには、一端が前記移動壁
の背面に固定され、他端が前記基体に遊嵌した支持棒が
挿通されていることを特徴とする請求項2記載の試料ホ
ルダ。
3. The sample holder according to claim 2, wherein one end of the coil spring is fixed to a rear surface of the moving wall, and the other end of the coil spring has a support rod loosely fitted to the base.
【請求項4】 前記固定壁及び移動壁の対向面に、それ
ぞれ弾性体を貼着したことを特徴とする請求項1記載の
試料ホルダ。
4. The sample holder according to claim 1, wherein an elastic body is adhered to each of the opposing surfaces of the fixed wall and the moving wall.
JP32558696A 1996-12-05 1996-12-05 Sample holder Pending JPH10170413A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32558696A JPH10170413A (en) 1996-12-05 1996-12-05 Sample holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32558696A JPH10170413A (en) 1996-12-05 1996-12-05 Sample holder

Publications (1)

Publication Number Publication Date
JPH10170413A true JPH10170413A (en) 1998-06-26

Family

ID=18178540

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32558696A Pending JPH10170413A (en) 1996-12-05 1996-12-05 Sample holder

Country Status (1)

Country Link
JP (1) JPH10170413A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101009899B1 (en) * 2008-10-28 2011-01-20 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101042505B1 (en) * 2008-11-27 2011-06-16 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR102465133B1 (en) * 2022-06-27 2022-11-09 (주)쏘일테크엔지니어링 Sample strength measuring device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101009899B1 (en) * 2008-10-28 2011-01-20 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR101042505B1 (en) * 2008-11-27 2011-06-16 현대제철 주식회사 A holder apparatus for specimen in scanning elctron microscope
KR102465133B1 (en) * 2022-06-27 2022-11-09 (주)쏘일테크엔지니어링 Sample strength measuring device

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