JPH10163495A - Semiconductor device and fabrication thereof - Google Patents

Abstract

PROBLEM TO BE SOLVED: To stabilize the characteristics among thin film transistors by forming the channel region in a thin film transistor of Si chrystallized through irradiation with pulse laser light at a scanning pitch P and specifying the relationship between the size of channel region and the scanning pitch of pulse laser light. SOLUTION: N type TFTs 121 are formed in matrix as elements for switching pixels. An underlying SiO2 102 is deposited on a glass substrate 101 and an amorphous Si 103 is deposited thereon. Unnecessary part is then removed from the amorphous Si 103 and an insular Si 108 constituting the active region of the TFT is obtained through isolation. Subsequently, the insular Si 108 is irradiated with a laser pulse 107 from above the substrate and crystallized. The size S of the TFT channel region in the laser pulse scanning direction and the sequential scanning pitch P of laser pulse are specified to satisfy a relationship S=nP (n is an integer other than O). According to the structure, uneven display due to uneven characteristics of TFT is suppressed and a high display quality is realized.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a semiconductor device in which a plurality of thin film transistors are formed on a substrate having an insulating surface, and more particularly, to a semiconductor device using a thin film transistor having a crystalline Si film as an active region and its manufacture. In particular, the present invention relates to an active matrix substrate and a thin film integrated circuit for a liquid crystal display device, an image sensor, and a three-dimensional IC.
The present invention relates to a semiconductor device that can be used for a semiconductor device and the like and a method for manufacturing the same.

[0002]

2. Description of the Related Art In recent years, large and high-resolution liquid crystal display devices, monolithic liquid crystal display devices in which driver circuits are formed on the same substrate for cost reduction, high-speed and high-resolution contact image sensors, and three-dimensional display devices For the realization of ICs and the like, attempts have been made to form a high-performance semiconductor element on an insulating substrate such as glass or an insulating film. Generally, a thin film Si (silicon) semiconductor is used for a semiconductor element used in these semiconductor devices.

Here, Si semiconductors in the form of a thin film are roughly classified into two types: those made of an amorphous Si semiconductor (a-Si) and those made of a crystalline Si semiconductor.

[0004] Among them, amorphous Si semiconductors have been used most commonly because they have the advantages of low production temperature, relatively easy production by the vapor phase method, and high mass productivity. .

On the other hand, amorphous Si semiconductors have the disadvantage that their physical properties such as conductivity are inferior to those of crystalline Si semiconductors. Therefore, it is difficult to apply the present invention to a semiconductor device requiring higher speed characteristics. Under such circumstances, in order to realize a semiconductor device requiring higher speed characteristics, there is a strong demand at present to establish a method for manufacturing a semiconductor device made of a crystalline Si semiconductor.

As the Si semiconductor having crystallinity, polycrystalline Si, microcrystalline Si, amorphous Si containing a crystal component, and the like are known.

As a method of obtaining these crystalline silicon semiconductors in the form of a thin film, (1) a crystalline film is directly formed at the time of film formation.

(2) An amorphous semiconductor film is formed in advance,
Crystallinity is imparted by applying heat energy.

(3) An amorphous semiconductor film is formed in advance,
Crystallinity is imparted by the energy of the laser beam (laser light).

There are mainly three known methods.

However, in the above method (1), crystallization proceeds simultaneously with the film-forming step, so that it is difficult to obtain crystalline Si having a large grain size. Therefore, in this way,
In order to obtain crystalline Si having a large grain size, it is conceivable to increase the thickness of the Si film. However, even though the film thickness is increased, only a crystal grain size substantially equal to the film thickness can be basically obtained.
It is impossible in principle to produce an i-film. Further, since the film formation temperature is as high as 600 ° C. or higher, there is a problem in cost that an inexpensive glass substrate cannot be used.

Further, the method (2) requires a heat treatment at a high temperature of 600 ° C. or more for several tens of hours for crystallization, and thus has a problem that productivity cannot be improved. Also, in order to utilize the solid-phase crystallization phenomenon, the crystal grains spread parallel to the substrate surface and even appear with a grain size of several μm, but since the grown crystal grains collide with each other to form a grain boundary, The grain boundaries serve as trap levels for carriers, and are a major cause of lowering the mobility of a thin film transistor (hereinafter, referred to as TFT). Further, each crystal grain has a twin structure, and a large number of crystal defects called so-called twin defects exist in one crystal grain.

For the above reasons, the above-mentioned method (3) is mainly used at present. Here, in the method (3), since the crystallization is performed by utilizing the melting and solidification process, the crystallinity in each crystal grain is very good. In addition, by selecting the wavelength of the irradiation light, only the Si film to be annealed can be efficiently heated, so that thermal damage to the lower glass substrate can be prevented. Further, since the process for a long time as in the method (2) is not required, the productivity can be improved. In addition, a high-output excimer laser annealing apparatus has been developed in terms of the apparatus, and it is becoming possible to cope with large-area substrates.

As a conventional example of a method for fabricating a semiconductor device using the method (3), for example, Japanese Patent Laid-Open No. 8-201
No. 846 discloses this. This method uses a driver monolithic type (pixel TFT) for a liquid crystal display device.
A driver part for driving the semiconductor substrate is simultaneously formed on the same substrate). A pulse laser beam (hereinafter referred to as a laser pulse) is irradiated so as to be partially overlapped with the active matrix substrate to crystallize the Si film in the active region. Is adopted.

In addition, in this method, the edge portion of the laser pulse is applied to the Si film of the TFT forming the driver portion at this time. Further, a method of irradiating the semiconductor thin film with the width of the semiconductor thin film in the shift direction of the laser pulse being equal to or larger than the shift amount or an integral multiple of the shift amount is also adopted.

[0016]

The method of the above (3) is as follows.
As described above, the crystallization method of the Si film on the insulating film includes:
It is the best, but it leaves a major challenge in the uniformity of crystallinity. That is, as a laser oscillator serving as a light source,
A device having an output capable of simultaneously irradiating a large-area substrate has not yet been developed, and at present, has an area of 10
This is achieved by sequentially scanning a beam of about 0 to ²⁰⁰ mm ² . Therefore, it is a matter of course that the non-uniformity of crystallinity accompanying the sequential scanning of the laser becomes a serious problem. Needless to say, since the variation in crystallinity is directly reflected in the device characteristics of the semiconductor device, it causes a variation in characteristics between the devices.

More specifically, scanning / irradiation of a laser pulse is generally performed by a method as shown in FIG. In FIG. 6A, reference numeral 608 indicates the scanning direction of the laser pulse, and reference numeral P indicates the scanning pitch. FIG. 6A shows the energy distribution of the laser beam as viewed from a cross section. The energy distribution (profile) of each of the laser pulses 601 to 605 scanned at the scanning pitch P is generally equal to the beam distribution. It has a Gaussian shape with a width 607. Each laser pulse is 60
Irradiation is performed on the Si film in the order of 1 to 602, 603, 604, and 605.

Here, at certain points a, b, c, and d of the Si film, 602 laser pulses are first irradiated, and subsequently, 603 and 604 laser pulses are irradiated three times in total. That is, in FIG. 6A, the overlap amount of the laser pulse is set to about 67%. The reason why the laser pulses are scanned and irradiated such that the laser pulses 601 to 605 partially overlap each other is to increase the uniformity of crystallinity at any point of the Si film.

In a crystalline Si film that is crystallized by irradiation with a laser pulse, it is the laser pulse that is irradiated first that has the greatest influence on the crystallinity. This is because, when the amorphous Si film is crystallized, its melting point rises by about 200 ° C. as compared with the initial stage, and the absorption coefficient for the laser beam decreases. On the other hand, the laser pulse irradiated from the second time onward is not an amorphous Si film, but a crystalline Si film crystallized by the first laser pulse.
Since the film is recrystallized and its effect is greatly reduced as compared with the first time, the laser pulse after the second time is 1
This is because it does not contribute as much as the last time.

At positions a, b, c, and d in FIG.
First, a laser pulse denoted by reference numeral 602 is irradiated, and amorphous S
The i film is crystallized into a crystalline Si film. Then, the code 6
03,604 laser pulses are subsequently applied.
When the first laser pulse 602 is emitted, a, b,
The energy given to each position of c and d is shown by the size of the arrow drawn in the vertical axis direction from each point, and is the smallest at a and the largest at d.

As a result, the crystallinity at the position a is worse than that at the position d. Similarly, non-uniformity of crystallinity also occurs at positions b and c. In order to repair this, laser pulses with reference numerals 603 and 604 are subsequently irradiated. However, due to the above-mentioned reason, sufficient repair cannot be performed.
At each of the positions b, c, and d, the non-uniformity of crystallinity caused by the first laser pulse 602 is dragged later.

The crystalline S obtained by the above process is
The crystallinity distribution of the i film in the laser scanning direction 608 is in a sawtooth shape as indicated by reference numeral 609 in FIG. 6B. That is, a periodic non-uniformity occurs due to the laser scanning pitch 606, and the crystallinity at each of the positions a, b, c, and d has a difference as shown in FIG. 6B. This is the main cause of the non-uniformity of the crystalline Si film which has been sequentially scanned and crystallized by the laser pulse, which causes variations in element characteristics. For example, in a liquid crystal display device, display (contrast) unevenness and the like are caused. Display failure appears.

In the above publication, attention is paid to the characteristic variation of the driver TFT in a driver monolithic active matrix substrate for a liquid crystal display device, and a method for reducing this variation is proposed. Shows the relationship between the width of the semiconductor thin film and the amount of shift during the sequential scanning of the laser pulse. The width of the semiconductor thin film described here means the island forming the active region (source / drain region and channel region) of the TFT. Si film. TF
Since the film quality (crystallinity) of the channel region largely determines the T characteristic, even if the method described in the above publication is used, the desired sufficient uniformity can be obtained for a plurality of driver TFTs. It is difficult to achieve.

The present invention has been made in view of the above-mentioned situation, and can stabilize the characteristics among the thin film transistors despite the non-uniformity of crystallization, and achieve high performance, reliability and stability. It is an object to provide a semiconductor device with high reliability.

Another object of the present invention is to provide a method of manufacturing a semiconductor device having such characteristics, which can be manufactured at low cost and with a simple process.

[0026]

According to the present invention, there is provided a semiconductor device comprising:
In a semiconductor device in which a plurality of thin film transistors are formed over a substrate having an insulating surface, a channel region of the plurality of thin film transistors is made of a crystalline Si film crystallized by sequentially irradiating pulse laser light at a scanning pitch P, The size S of the channel region in the scanning direction of the pulsed laser light and the scanning pitch P of the pulsed laser light at the time of crystallization of the crystalline Si film are approximately S = nP (where n is an integer other than 0) ), Whereby the object is achieved.

Preferably, the substrate is an active matrix substrate on which a plurality of pixel electrodes corresponding to the plurality of thin film transistors are formed, and the plurality of thin film transistors are pixel switching thin film transistors connected to the respective pixel electrodes. .

Preferably, the substrate is a driver monolithic active matrix substrate in which an active matrix portion and a driver circuit are simultaneously formed on the same substrate, and the thin film transistors constitute a driver circuit.

Preferably, the size S of the channel region and the scanning pitch P are set so that S = P.

Preferably, a ratio S / P of the size S of the channel region to the scanning pitch P is 0.9 <.
S / P should be within the range of 1.1.

Further, a method of manufacturing a semiconductor device according to the present invention
A step of forming a Si film on a substrate having an insulating surface, a step of sequentially irradiating the Si film with a pulse laser beam at a scanning pitch P to crystallize the Si film, a scanning direction of the pulse laser beam and a channel The crystallized Si film is patterned so as to be perpendicular to the element regions of the plurality of thin film transistors, and the channel width W of the channel region of the thin film transistors that will be later becomes the width of the pulse laser light. And a step of forming the scanning pitch so as to be substantially an integral multiple of the scanning pitch P, thereby achieving the above object.

Further, a method of manufacturing a semiconductor device according to the present invention
A step of forming a Si film on a substrate having an insulating surface, a step of sequentially irradiating the Si film with a pulse laser beam at a scanning pitch P to crystallize the Si film, a scanning direction of the pulse laser beam and a channel A step of patterning the crystallized Si film so that the directions become parallel so as to be element regions of a plurality of thin film transistors; and a channel length L of a channel region of the thin film transistor corresponding to the width of the gate electrode,
Forming a gate electrode on the crystallized Si film so as to be approximately an integral multiple of the scanning pitch P of the pulsed laser beam, thereby achieving the above object.

Further, the method for manufacturing a semiconductor device according to the present invention
A step of forming a Si film on a substrate having an insulating surface, and a scanning direction of the pulse laser light for crystallizing the Si film and a thin film transistor to be performed later by sequentially irradiating the Si film with the scanning pitch P So that the channel direction of the thin film transistor becomes perpendicular to the channel direction of the thin film transistor and the channel width of the channel region of the thin film transistor becomes W.
patterning the i-film into element regions of the plurality of thin-film transistors; and forming a scan pitch on the Si film that becomes the element regions of the patterned plurality of thin-film transistors so as to be approximately a fraction of the channel width W. P to sequentially scan the pulse laser beam in a preset direction to crystallize the Si film, thereby achieving the above object.

The method of manufacturing a semiconductor device according to the present invention
A step of forming a Si film on a substrate having an insulating surface, and a scanning direction of the pulse laser light for crystallizing the Si film and a thin film transistor to be performed later by sequentially irradiating the Si film with the scanning pitch P Patterning the Si film so as to be the element regions of the plurality of thin film transistors so that the channel direction becomes parallel to the channel direction. Scanning the pulse laser light sequentially to crystallize the Si film; and setting the channel length L of the channel region of the thin film transistor corresponding to the width of the gate electrode to approximately an integral multiple of the scan pitch P of the pulse laser light. Forming a gate electrode on the crystallized Si film so that the above object is achieved. .

Further, a method of manufacturing a semiconductor device according to the present invention
10. The method for manufacturing a semiconductor device according to claim 6, wherein a Si film is formed on the substrate having the insulating surface, and the Si film is sequentially irradiated with a pulse laser beam at a scanning pitch P. A step of forming an amorphous Si film on the substrate and heating it to crystallize it in a solid state instead of a step of crystallizing the Si film, and applying a pulse laser beam to the crystallized Si film. Are sequentially irradiated at a scanning pitch P to recrystallize the Si film, thereby achieving the above object.

Preferably, the step of forming an amorphous Si film on the substrate and crystallizing it in a solid state by heating is performed by introducing a catalytic element which promotes the crystallization into the amorphous Si film. After that.

Preferably, an amorphous S is formed on the substrate.
The step of forming an i-film and crystallizing in a solid state by heating is performed by selectively introducing a catalyst element that promotes the crystallization into the amorphous Si film, Crystallization is performed in the lateral direction from the selectively introduced region to the periphery thereof.

Preferably, N is used as the catalyst element.
i element is used.

Preferably, an excimer laser beam having a wavelength of 400 nm or less is used as the pulse laser beam.

Preferably, the pulse laser beam has a beam shape set to be long on an irradiation surface, and sequentially scans in a direction perpendicular to the long direction of the beam shape. Thereby, the channel regions of the plurality of thin film transistors are crystallized.

The operation of the present invention will be described below.

As described above, in a semiconductor device having a plurality of TFTs, the size S of the channel region of the TFT in the sequential scanning direction of the pulse laser beam, ie, the laser pulse.
And the sequential scanning pitch P of the laser pulse at the time of crystallization of the channel region of the TFT is set such that S = nP, the channel region of each TFT along the scanning direction of the laser pulse is sequentially scanned. All the crystallinity distributions within the scanning pitch P of each laser pulse are included. That is, the above-described distribution of crystallinity from position a to position d in FIG. 6B is entirely included in the channel region of an arbitrary TFT, and the states of a, b, c, and d are changed to the channel region. Are crystallized in the same amount.
Therefore, it is possible to eliminate variations in characteristics of each TFT.

As described above, the present invention provides a method for producing uniform crystalline Si
Rather than solving the above problems by obtaining a membrane,
A method of recognizing non-uniformity of a crystalline Si film obtained by scanning with a laser pulse and using the periodicity to solve the above problem is adopted.

Then, when a liquid crystal display device was actually manufactured by using the present invention, it was confirmed that the uniformity of the characteristics of the individual pixel TFTs was very good, and that a display defect caused by scanning with a laser pulse could be eliminated. .

The present invention is effective when a plurality of TFTs are required to have uniform characteristics, and the best example is the above-described active matrix substrate for a liquid crystal display device. Since this is a field that can be visually judged, the pixel TFT requires extremely high uniformity of element characteristics. By using the present invention for a pixel TFT of an active matrix substrate for a liquid crystal display device, it is possible to completely eliminate display defects such as uneven contrast due to scanning of a laser pulse as described above, and to achieve a very high display quality liquid crystal display. The device can be realized.

The pixels TF arranged in a matrix
In a driver monolithic active matrix semiconductor device having a driver circuit for driving the TFT on the same substrate in addition to the T, in addition to the pixel TFT, a plurality of TFTs constituting the driver circuit, especially a shift register circuit, etc. Requires very high uniformity of properties. That is, if the TFT characteristics vary, the drive waveforms for each line differ, and in this case, the display appears as striped display unevenness on the screen.

As described above, the human eye is very severe and has the ability to discriminate subtle display irregularities. However, by applying the present invention to such a TFT, a driver circuit is formed. The channel region of the plurality of TFTs is
Despite the crystallinity variation due to the scanning of the laser pulse, each TFT has the same crystallinity in the same state, so that excellent characteristic uniformity can be obtained over the entire TFT element. As a result, the characteristics of the driver circuit for driving the pixel TFT are stabilized, and in a liquid crystal display device, defects such as display unevenness due to variations in the characteristics of the driver circuit can be reduced.

In particular, in the present invention, the configuration is such that the size S of the TFT channel region in the scanning direction of the laser pulse and the sequential scanning pitch P of the laser pulse are substantially the same, that is, approximately P = S. preferable. This is because the number of laser pulse irradiation increases as the area of the substrate increases, so that it is necessary to perform processing at the maximum scanning pitch from the viewpoint of throughput. In the present invention, the process margin increases in theory as the number of n increases, but n =
1, that is, it was confirmed that the best result was obtained when approximately P = S.

The allowable error range of the approximate P = S is as follows.
It is preferable that the ratio S / P is within a range of at least 0.9 <S / P <1.1. This is a value obtained from actual experimental values by the present inventors, and although there is no theoretical basis, the present inventors have found that a liquid crystal display which is considered to require the most uniformity of the element actually This is based on the result of applying the present invention to the pixel TFT of the active matrix substrate for a device and examining whether or not contrast unevenness, which is considered to be caused by laser pulse scanning, is clearly seen.

That is, if the non-uniformity of the crystallinity in the channel of the TFT is about ± 10% or less, even if the pixel TFT is formed by using the crystalline Si film as a channel, a non-defective product which can be used as a liquid crystal display device can be obtained. Will be done.

In the first method of manufacturing a semiconductor device according to the present invention, an amorphous Si film is formed on a substrate, and the Si film is irradiated with a laser pulse to sequentially scan at a scanning pitch P. Then, after crystallizing the Si film, when patterning this Si film so as to be a plurality of TFT element regions,
The scanning direction of the laser pulse and the channel direction of the TFT, that is, the moving direction of the carrier, are such that the direction from the source to the drain is vertical, and the channel width W of the channel region of the TFT is the width of the laser pulse. It is formed so as to be approximately an integral multiple of the scanning pitch P.

In a second manufacturing method according to the present invention, an amorphous Si film is formed on a substrate, and the Si film is irradiated with a laser pulse and sequentially scanned at a scanning pitch P. After crystallizing the Si film with the above, when patterning the Si film so as to be a plurality of TFT device regions, the device region is formed such that the scanning direction of the laser pulse and the channel direction of the TFT are parallel, When forming the gate electrode later, the width of the gate electrode on the Si film, that is, the channel length L of the channel region of the TFT is formed so as to be substantially an integral multiple of the scanning pitch P of the laser pulse.

That is, in the former method, the scanning direction of the laser pulse is perpendicular to the channel direction of the TFT, and W = nP between the channel width W and the scanning pitch P of the laser pulse.
In the latter method, the scanning direction of the laser pulse and the channel direction of the TFT are parallel, and the relationship of L = nP is established between the channel length L and the scanning pitch P of the laser pulse.

Therefore, the scanning direction of the laser pulse and TF
Although the manufacturing method differs depending on the arrangement of T, the effect of the present invention can be similarly obtained. In fact, T
It is possible to irradiate the laser pulse so that the scanning direction of the laser pulse is not parallel or perpendicular to the moving direction of the carrier in the FT, but obliquely crosses the scanning direction. However, there are disadvantages in the space utility and the structure from the viewpoint of the element layout and the laser annealing apparatus.

In the third manufacturing method of the present invention, an amorphous Si film is formed on a substrate, and this Si film is first
Patterning is performed so as to be an element region of T, and in a subsequent laser pulse scanning / irradiation step for crystallization of the Si film, the scanning direction of the laser pulse is perpendicular to the channel direction of the TFT, and The channel width of the channel region of the TFT is formed so as to be W, and the Si film which becomes the element region of the plurality of patterned TFTs has a channel width W which is approximately 1 / integer. A laser pulse is sequentially scanned in a predetermined direction at a scanning pitch P to crystallize the Si film.

In the fourth manufacturing method of the present invention, an amorphous Si film is formed on a substrate, and this Si film is first
Patterning is performed so as to be an FT element region, and scanning of a laser pulse for crystallization of a Si film performed later is performed.
In the irradiation step, an element region is formed so that the scanning direction of the laser pulse and the channel direction of the TFT are parallel,
Si to be an element region of a plurality of patterned TFTs
After irradiating the film with a laser pulse and sequentially scanning at a scanning pitch P to crystallize the Si film, when forming the gate electrode, the width of the gate electrode on the Si film, that is, the channel region of the TFT is formed. The channel length L is formed so as to be approximately an integral multiple of the scanning pitch P of the laser pulse.

The former method and the latter method have the same relationship as the first method and the second method, and the manufacturing method differs depending on the relationship between the scanning direction of the laser pulse and the arrangement of the TFT.

The first method and the third method use TF
The patterning step of the Si film serving as the channel region of T is performed before the laser irradiation step, and the second and fourth methods perform the patterning step of the Si film after the laser irradiation step. In the second method and the fourth method, laser irradiation is performed on the patterned island-shaped Si film, so that during crystallization of the Si film, the edge of the island-shaped region has more heat dissipation than the center. Is small. As a result, crystal grains grow large at the end of the island region.

Therefore, the TFTs manufactured by the second and fourth methods are different from those of the first and third methods.
Is better than its T, reflecting the better crystallinity in the channel.
FT characteristics are better.

Specifically, the ON characteristics are particularly improved, and the field effect mobility is improved by about 20%. However, in the second method and the fourth method, the crystallinity at the end of the island region of the Si film is good, but the surface irregularities also become large at the end. As a result, the reliability of the TFT element is inferior to those of the first and third methods.

Therefore, it is preferable to use the first method, the second method, the third method, and the fourth method depending on the type of the intended semiconductor device.

As a start film for laser irradiation,
In addition to the above-mentioned amorphous Si film, solid-phase crystallized crystalline Si
Using a film is also an effective method. This is because a crystalline Si film obtained by subjecting an amorphous Si film to solid phase crystallization by heat treatment has poor crystallinity and is unsuitable as a TFT channel region as it is, but has good crystallinity uniformity. This is because it is effective in that a seed crystal is formed at the time of crystallization by laser irradiation.

That is, when the crystalline Si film is irradiated with a laser pulse, the crystalline Si film is recrystallized with a certain amount of its crystal information remaining, and the crystalline Si film obtained by solid-phase crystallization has good uniformity. Therefore, even after recrystallization by laser irradiation, the uniformity is reflected to some extent.

Therefore, if the method of the present invention includes a step of sequentially scanning a crystalline Si film by solid-phase crystallization with a laser pulse and recrystallizing the same, the uniformity of the device characteristics aimed at by the present invention can be obtained. Performance can be further improved.

In this solid phase crystallization step, amorphous Si
It is preferable to carry out the method after introducing a catalytic element for promoting crystallization into the film. This is because if this method is used, the heating temperature can be lowered, the processing time can be shortened, and the crystallinity can be improved.

Specifically, the surface of the amorphous Si film
(Nickel) and Pd (palladium) are introduced in a trace amount, and then heated to 550 ° C.
The crystallization is completed in a processing time of about an hour. In contrast,
Heat treatment at 600 ° C. or higher for several tens of hours is required for solid-phase crystallization without using a normal catalyst element. In a crystalline Si film crystallized by a catalytic element, one grain of a crystalline Si film crystallized by a normal solid-phase growth method has a twin structure, whereas the number of grains in the grain is limited. Each of the columnar crystals is substantially in a single crystal state.

The crystalline S crystallized by this catalyst element
The i film is very compatible with the recrystallization step by laser pulse irradiation. That is, in the recrystallization step by laser pulse irradiation, the initial crystallinity is reflected to some extent, and in a crystalline Si film formed by ordinary solid-phase crystallization, the crystalline Si film having many crystal defects reflects the twin structure. On the other hand, in the case of a solid-phase crystallized Si film into which a catalytic element has been introduced, each columnar crystal is bonded by recrystallization by irradiation of a laser pulse, resulting in a crystal having very good crystallinity over a wide range. This is because a crystalline Si film is obtained.

Further, by selectively introducing a catalyst element into a part of the amorphous Si film and heating, only a region where the catalyst element is selectively introduced is first crystallized. Crystal growth can be performed in a lateral direction from the region, that is, in a direction parallel to the substrate. Within this lateral crystal growth region, columnar crystals whose growth directions are almost aligned in one direction are crowded, and the crystallinity is lower than that of the region where the catalyst element is directly introduced and crystal nuclei are generated randomly. It is a good area.

Therefore, by using the crystalline Si film in the lateral crystal growth region for the channel region of the TFT, the performance of the semiconductor device can be further improved. At this time, if the direction in which the crystal grows in the lateral direction in the Si film and the direction in which the carrier moves in the TFT are substantially parallel, in principle, there is no crystal grain boundary in the direction in which the carrier moves. However, since the probability of carrier scattering is reduced, a TFT having higher mobility can be realized.

The types of catalyst elements that can be used in the method of the present invention include Ni, Co, Pd, Pt, Cu, Ag, Au,
In, Sn, Al and Sb can be mentioned. One or more elements selected from these elements have a slight effect on crystallization.

Among them, the most remarkable effect can be obtained particularly when Ni is used. The reason for this has not been fully understood, but the following model can be considered. That is, the catalyst element does not act alone, but acts on crystal growth by bonding to the Si film and forming silicide. This is a model in which the crystal structure at that time acts like a kind of template when the amorphous Si film is crystallized, and promotes the crystallization of the amorphous Si film.

Here, Ni forms silicide of _two Si and NiSi ₂ . NiSi ₂ exhibits a fluorite-type crystal structure, which is very similar to the diamond structure of single crystal silicon. Moreover, NiSi ₂
Has a lattice constant of 0.5406 nm and a lattice constant of 0.5430 nm in a diamond structure of crystalline silicon.
Has a value very close to.

Therefore, NiSi ₂ is the best as a template for crystallizing an amorphous Si film, and Ni is most preferably used as a catalyst element in the present invention.

When the laser pulse has a wavelength of 400 nm or less, the energy of the laser pulse must be efficiently applied to the Si film because the Si film has a large absorption coefficient in the wavelength region. Can be. Therefore, a favorable crystalline Si film can be obtained, and thermal damage to a lower glass substrate or the like can be extremely small.

Further, among these laser beams having a wavelength of 400 nm or less, the XeCl excimer laser beam having a wavelength of 308 nm has a high oscillation output and a high stability.
Because the beam size can be expanded to some extent,
It is most suitable as a means for annealing a Si film on a large-area substrate.

The laser pulse is designed so that its beam shape is elongated on the irradiation surface, and is sequentially scanned in a direction perpendicular to the elongated direction of the beam shape. Preferably, the TFT channel region is crystallized. Because, in scanning and irradiation, the uniformity in the direction perpendicular to the scanning direction is relatively good, and by expanding the beam size in that direction, more uniform processing can be performed on large substrates and the like. This is because the processing efficiency can be improved.

[0077]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be specifically described below with reference to the drawings.

(Embodiment 1) FIGS. 1 and 2 show Embodiment 1 of the present invention. Embodiment 1 shows an example in which the present invention is applied to an active matrix substrate for a liquid crystal display device.
This active matrix substrate has an N-type TFT as an element for switching each pixel as shown in FIG.
121 are formed in a matrix.

FIG. 1 shows an outline of an active matrix substrate. In an actual active matrix substrate, hundreds of thousands or more TFTs 121 are arranged.

Next, the structure of the active matrix substrate will be described with reference to FIG. First, as shown in FIG. 2A, a silicon substrate having a thickness of about 300 nm is formed on a glass substrate 101 by, for example, a sputtering method.
A base film 102 made of O ₂ is formed. This SiO ₂ film 1
02 is provided to prevent diffusion of impurities from the glass substrate 101.

Next, on the SiO ₂ film 102, a reduced pressure CV
A thickness of 20 to 100 by a D method, a plasma CVD method, or the like.
nm, for example, 30 nm, amorphous Si (a-Si) film 10
3 is formed. When the a-Si film 103 is formed by a plasma CVD method, a large amount of hydrogen is contained in the film, which causes peeling of the film during irradiation with a laser pulse. Heat treatment is performed at a temperature of about several hours to release hydrogen in the film.

Next, unnecessary portions of the a-Si film 103 are removed, and element isolation as shown in FIG. 2B is performed. Thereafter, active regions (source / drain regions, channel regions) of the TFT are formed. An island-shaped Si film 108 is formed. At this time, when the glass substrate 101 is viewed from above, as shown in FIG. 1, the active regions 108 of each TFT 121 are arranged. Here, reference numeral 114 in FIG.
T121 is a source region, 115 is a drain region, 127
Is a channel area, and 128 is an offset area. TF
At the time of driving T121, carriers move from the source region 114 to the drain region 115. That is, the channel direction,
That is, the moving direction of the carrier is the vertical direction in FIG.

Thereafter, as shown in FIG. 2C, a laser pulse 107 is irradiated from above the substrate to crystallize the island-like a-Si film 108. Here, as the laser beam,
XeCl excimer laser (wavelength 308 nm, pulse width 4
0 nsec). The irradiation condition of the laser beam 107 is such that the glass substrate 101 is heated to 200 to 500 ° C., for example, 400 ° C. at the time of irradiation, and the energy density is 200 to 350 m
J / cm ² , for example, 300 mJ / cm ² .

The laser pulse 107 is formed by a homogenizer so that the beam size on the substrate surface becomes a long rectangular shape of 300 mm × 0.2 mm.
Scanning is sequentially performed in a direction perpendicular to the long side direction. TF
The scanning direction of the laser pulse 107 at this time with respect to T121 is set to the direction indicated by reference numeral 124 in FIG. That is, the channel direction of the TFT 121 and the scanning direction 124 of the laser pulse 107 are set to be parallel (the same direction). At this time, the overlap amount of the laser pulse 107 accompanying the sequential scanning was set to 95%.

Therefore, the scanning pitch P in FIG.
μm, and for any one point of the a-Si film 108,
Each laser irradiation is performed 20 times. By this step, the a-Si film 108 is heated to the melting point or more,
Crystalline Si that has good crystallinity by melting and solidifying
It becomes the film 108a. At this time, the crystalline distribution of the crystalline Si film 108a has a saw-tooth shape indicated by reference numeral 126 in FIG. Here, the horizontal axis represents the crystallinity, and indicates that the crystallinity becomes better as going rightward. This principle is as described with reference to FIG.
Here, it is omitted.

Next, as shown in FIG. 2D, the crystalline Si film 108a serving as the active region is covered with
SiO ₂ with a thickness of 20 to 150 nm, here 100 nm
A film is formed as the gate insulating film 109. For forming the SiO ₂ film, TEOS (Tetra Ethox) is used here.
y Ortho Silicate) as a raw material, with oxygen at a substrate temperature of 150 to 600 ° C., preferably 300 to 600 ° C.
Decomposition and deposition were performed at 450 ° C. by RF plasma CVD.
In addition, decompression C with TEOS as a raw material together with ozone gas
The substrate temperature is set to 35 by the VD method or the normal pressure CVD method.
It is also possible to form at 0 to 600C, preferably 400 to 550C.

Subsequently, by a sputtering method,
An Al film having a thickness of 300 to 600 nm, for example, 400 nm is formed. Then, the Al film is patterned to form a gate electrode 110. Further, the gate electrode 1
10 is anodized to form an anodic oxide layer 111 on the surface (see FIG. 2D).

The anodization is performed in an ethylene glycol solution containing 1 to 5% of tartaric acid.
The voltage is increased to V, the state is maintained for one hour, and the process is terminated. The thickness of the obtained anodic oxide layer 111 is 200 nm. Note that since the anodic oxide layer 111 has a thickness for forming an offset gate region in a later ion doping process, the length of the offset gate region can be determined in the anodic oxidation process. The offset gate region is provided for the purpose of reducing a leakage current at the time of TFT off operation. At this time, the finally obtained gate width of the gate electrode 110 determines the channel length L of the TFT 121.

In the first embodiment, the gate width finally obtained is 10 μm in consideration of the thickness to be anodized in advance.
It was designed to be. That is, the TFT 121 shown in FIG.
The channel length L of the channel region 127 and the scanning pitch P of the laser pulse are also set to 10 μm. The channel region 127 of the TFT 121 at this time
Inside is 131 for each TFT in a different row.
Although the crystallinity distributions of the areas represented by a, 131b, and 131c are included, they are all the same area, and the crystallinity distribution is not reflected on the in-channel crystallinity between the TFTs 121. That is, as described in the above operation, the same amount of crystallinity distribution caused by the scanning of the laser pulse is included in the channel region 127 of each TFT 121, and
That is, the variation between the FTs 121 is canceled.

Next, impurities (phosphorus) are implanted into the active region by ion doping using the gate electrode 110 and the surrounding anodic oxide layer 111 as a mask. Phosphine (PH ₃ ) is used as a doping gas, the acceleration voltage is 60 to 90 kV, for example, 80 kV, and the dose is 1 ×.
10 ¹⁵ to 8 × 10 ¹⁵ cm ⁻² , for example, 2 × 10 ¹⁵ cm ⁻²
And By this step, the region 11 into which the impurities are implanted is formed.
4 and 115 will be the source / drain regions of the TFT later. On the other hand, the region 11 which is masked by the gate electrode 110 and the surrounding anodic oxide layer 111 and is not implanted with impurities.
3 forms a channel region 127 and an offset gate region 128 of the TFT 121 later.

Thereafter, as shown in FIG. 2D, annealing is performed by irradiating a laser beam 112 to activate the ion-implanted impurities, and at the same time, a portion where crystallinity is deteriorated in the above-described impurity introducing step is reduced. Improves crystallinity.
At this time, as a laser to be used, XeCl excimer laser (wavelength 308 nm, pulse width 40 nsec) was used, and irradiation was performed at an energy density of 150 to 400 mJ / cm ² , preferably 200 to 250 mJ / cm ² . N-type impurity (phosphorus) regions 114 and 1 thus formed
The sheet resistance of No. 15 was 200 to 800 Ω / □.

Then, as shown in FIG.
A SiO ₂ film of about 00 nm is formed as the interlayer insulating film 116. If this SiO ₂ film is formed by a plasma CVD method using TEOS as a raw material and oxygen, or a reduced pressure CVD method or a normal pressure CVD method using ozone, a good interlayer insulating film having excellent step coverage can be obtained. Can be

Next, a contact hole is formed in the interlayer insulating film 116, and a source electrode 117 and a pixel electrode 120 are formed. The source electrode 117 is made of a metal material, for example, Ti
It is formed of a two-layer film of N (titanium nitride) and Al. T
The iN film is provided as a barrier film for preventing Al from diffusing into the semiconductor layer. The pixel electrode 120 is made of ITO
And the like.

Finally, in a hydrogen atmosphere of 1 atm.
Annealing is performed at 0 ° C. for about one hour to complete the N-type TFT 121 shown in FIG. The annealing process supplies hydrogen atoms to the interface between the active region of the TFT 121 and the gate insulating film, and has the effect of reducing dangling bonds that deteriorate TFT characteristics. In order to further protect the TFT 121, only a necessary portion may be covered with a TiN film formed by a plasma CVD method using SiH ₄ and NH ₃ as a source gas.

Each TFT manufactured according to the above steps
121 is a field-effect mobility of 60 to 60 in all panels.
Good characteristics such as 80 cm ² / Vs and a threshold voltage of 1.5 to ² V were exhibited. The uniformity of the TFT 121 in the panel is about ± 8% in field effect mobility and ± 0.2 V in threshold voltage.
The degree was very good. As a result, a liquid crystal display panel was manufactured using the active matrix substrate manufactured in the present embodiment, and the entire display was performed. As a result, display unevenness due to non-uniformity of TFT characteristics was greatly reduced, and high display quality was obtained. A liquid crystal display device was realized.

(Embodiment 2) FIGS. 3 to 5 show Embodiment 2 of the present invention. In the second embodiment, the present invention is applied to a semiconductor device on which a plurality of circuits (circuit elements) having a CMOS structure in which an N-type TFT and a P-type TFT are configured in a complementary manner are formed on a substrate, which is the basis of a thin film integrated circuit. Here is an example.

As shown in FIG. 3, this CMOS circuit
A plurality of N-type TFTs 222 and P-type TFTs 223 are formed on a substrate, and FIG. 5F shows a cross-sectional structure of the completed state. The configuration will be described below together with the manufacturing process.

First, as shown in FIG. 5A, a glass substrate 201 having a thickness of 3
A base film 202 of about 00 nm made of SiO ₂ is formed. The base film 202 is provided to prevent diffusion of impurities from the glass substrate 201. Next, the decompression CV
The thickness is 20 to 10 by the D method or the plasma CVD method.
An intrinsic (I-type) amorphous Si film (a-Si film) 203 having a thickness of 0 nm, for example, 50 nm is formed.

Next, a photosensitive resin (photoresist) is applied on the a-Si film 203, and is exposed and developed to form a photoresist mask 204. At this time, the through hole of the photoresist mask 204 exposes the a-Si film 203 in a slit shape in the region 200 as shown in FIG. That is, when the state of FIG. 5A is viewed from above,
As shown in FIG. 4, the a-Si film 203 is exposed in the region 200, and the other portions are masked by the photoresist.

Next, as shown in FIG. 5A, a thin film of Ni 205 is deposited on the surface of the glass substrate 201. In the second embodiment, the distance between the deposition source and the glass substrate 201 is made larger than usual, and the deposition rate is reduced, so that N
The thickness of the i thin film 205 is controlled to be about 1 nm or less. At this time, Ni on the glass substrate 201
When the areal density of the thin film 205 is actually measured, 1 × 10 ¹³ a
toms / cm ² .

Subsequently, the photoresist mask 204 is removed. As a result, the Ni thin film 205 on the photoresist mask 204 is lifted off, and the a-S
In the i-film 203, a small amount of Ni205 is selectively added. Then, this is annealed in an inert atmosphere, for example, at a heating temperature of 550 ° C. for 8 hours to be crystallized.

At this time, as shown in FIG.
00, N added to the surface of the a-Si film 203
a- in the direction perpendicular to the glass substrate 201 with i as a nucleus
Crystallization of the Si film 203 occurs, and the crystalline Si film 203b
Is formed (see FIG. 4). Then, in the peripheral region of the region 200, as shown by an arrow 206 in FIGS.
Crystal growth is performed in a direction parallel to the above), and a crystalline Si film 203c formed by lateral crystal growth is formed. Also, a-Si
The other area of the film 203 remains as an amorphous Si film area 203d. In the above crystal growth, the distance of crystal growth in the direction parallel to the glass substrate 201 indicated by the arrow 206 was about 40 μm.

Thereafter, as shown in FIG. 5C, a laser pulse 207 is irradiated from above the substrate to recrystallize the Si film 203. At this time, the laser beam is X
eCl excimer laser (wavelength 308 nm, pulse width 4
0 nsec). The laser pulse 207 at this time
Irradiation conditions are as follows.
Heated to 00 ° C., for example 400 ° C., with an energy density of 200
３５０350 mJ / cm ² , for example, 320 mJ / cm ² . The laser pulse 207 is formed so that the beam size on the substrate surface becomes a long rectangular shape of 150 mm × 1 mm.
It is molded by a homogenizer, and is sequentially scanned in a direction perpendicular to the long side direction. The laser scanning direction at this time with respect to the subsequent TFT element arrangement has a relationship as shown in FIG. 3, and the scanning direction is indicated by reference numeral 224. At this time, the amount of beam overlap accompanying the sequential scanning was set to 90%. Therefore, the scanning pitch P in FIG. 3 is 100 μm, and an arbitrary point on the a-Si film 203 is irradiated with laser light ten times.

By this step, the crystalline Si film region 203
b and 203c are heated above their melting point, melted and solidified, and are partially recombined as a seed crystal to form better crystalline Si film regions 203b 'and 203c'. Further, the a-Si region 203d is crystallized to be a crystalline Si film 203a. At this time, the crystalline Si film 203
The crystallinity distribution of “a” has a saw-tooth shape as indicated by reference numeral 226 in FIG. Note that the horizontal axis represents crystallinity,
It shows that the crystallinity becomes better as going rightward.

Thereafter, as shown in FIGS. 4 and 5D, the high-quality crystalline Si film 203c '
The other crystalline Si film is removed by etching so that the active regions (element regions) 208n and 208p are separated from each other. When the state at this time is viewed from above the glass substrate 201, as shown in FIG.
Three active regions 208 (208n, 208p) are respectively arranged. In FIG. 3, each TFT active region 20
8n, 208p, 214 (214n, 214p) /
215 (215n, 215p) will be source / drain regions to be formed later. In addition, 213 (227), more specifically 213n, 213p (227n, 227p) indicates a channel region.

As can be seen from FIG. 3, in the second embodiment, the scanning direction 224 of the laser pulse and the channel direction of the TFT, that is, the moving direction of the carrier corresponding to the left and right direction on the paper, are set to be vertically arranged. Have been. Accordingly, the channel size of the TFT 222 in the laser scanning direction 124 in the second embodiment is the channel width W. In the step of forming the active region 208, the channel width W is formed so as to be 100 μm, which is the same as the laser scanning pitch P. did. At this time, the inside of the TFT channel 227 includes 231a,
Although the crystallinity distributions of the areas represented by 231b and 231c are included, they are all the same area, and the crystallinity distribution is not reflected on the in-channel crystallinity between TFTs. That is, the same amount of crystallinity distribution caused by laser scanning is included in each TFT channel 227, and
That is, the variation between T is canceled.

Next, as shown in FIG. 5E, a 100-nm thick SiO ₂ film is formed on the gate insulating film 20 so as to cover the crystalline Si films 208n and 208p serving as the active regions.
9 is formed. This gate insulating film 209 is formed by
Here, TEOS is used as a raw material, and a substrate temperature of 3 with oxygen.
It was decomposed and deposited at 00 to 400 ° C. by RF plasma CVD. After the film formation, annealing was performed at 400 to 600 ° C. in an inert gas atmosphere for several hours in order to improve the bulk characteristics of the gate insulating film 209 itself and the interface characteristics between the crystalline Si film and the gate insulating film 209.

Subsequently, as shown in FIG. 5E, Al (containing 0.1 to 2% of silicon) having a thickness of 400 to 800 nm, for example, 500 nm, is formed by a sputtering method.
Is formed, and the Al film is patterned to form gate electrodes 210n and 210p.

Next, the gate electrodes 210n and 210n are formed in the active regions 208n and 208p by ion doping.
Impurities (phosphorus P and boron B) are implanted using p as a mask. Phosphine (PH ₃ ) as doping gas
And diborane (B ₂ H ₆ ), and in the former case, the acceleration voltage is 60 to 90 kV, for example, 80 kV, and in the latter case,
40 kV to 80 kV, for example, 65 kV, the dose amount is 1 × 10 ¹⁵ to 8 × 10 ¹⁵ cm ⁻² , for example, P is 2 × 10 ¹⁵
cm ^-2 and B are 5 × 10 ¹⁵ cm ^-2 . By this step, the regions 213n and 213p which are masked by the gate electrodes 210n and 210p and into which impurities are not implanted are formed later by the TFT.
Channel regions 227n and 227p. At the time of doping, each element is selectively doped by covering a region not requiring doping with a photoresist.

As a result, N-type impurity regions 214n and 2n
15n, P-type impurity regions 214p and 215p are formed, and as shown in FIGS. 5E and 5F, an N-channel TFT 222 and a P-channel TFT 223 can be formed. When this state is viewed from above the substrate, it is as shown in FIG. 4, where the active regions 208n and 208
At p, the crystal growth direction 206 and the moving direction of the carrier, that is, the direction from the source to the drain are arranged to be parallel. With such an arrangement, a TFT having higher mobility can be obtained.

After that, as shown in FIG. 5E, annealing is performed by irradiation with the laser beam 212 to activate the ion-implanted impurities. As a laser beam,
Using a XeCl excimer laser (wavelength: 308 nm, pulse width: 40 nsec), the laser beam was irradiated at an energy density of 250 mJ / cm ² at four shots per location.

Subsequently, as shown in FIG.
Using a 00 nm SiO ₂ film as the interlayer insulating film 216, TE
It is formed by a plasma CVD method using OS as a raw material, and a contact hole is formed in the contact hole to form a metal material, for example,
The electrode / wiring 21 of the TFT is formed by a two-layer film of TiN and Al
7, 218 and 219 are formed. Finally, annealing is performed at 350 ° C. for about 1 hour in a hydrogen atmosphere at 1 atm, so that an N-type TFT 222 and a P-type T
FT223 is completed.

The CMOS fabricated according to the above steps
In the structural circuit, the field-effect mobility of each of the TFTs 222 and 223 is 150 to 180 for the N-type TFT 222.
cm ² / Vs, 80~100cm a P-type TFT223 ² /
Vs, and the threshold voltage is 0.5 to 1 for the N-type TFT 222.
The V and P type TFT 223 exhibited very good characteristics of -2.5 to -3 V. Also, the TFTs 222 and 223 in the substrate
Uniformity is ± 10 in field-effect mobility for both N-type and P-type.
% And a threshold voltage of ± 0.2 V or less, which was very good.

(Other Embodiments) The semiconductor device to which the present invention is applied is not limited to the above-described first and second embodiments, and various modifications described below are possible.

For example, in the first and second embodiments, the relationship between the scanning direction of the laser pulse and the channel direction of the TFT has been described in two parallel or vertical patterns. The channel length L of the TFT, the channel width W of the TFT when vertical, and the laser scanning pitch P
The relationship has to be set, and the explanation has been given using the state that is most easily understood.
Even when the channel direction of the FT and the laser scanning direction are oblique, the effect of the present invention can be obtained. In this case, the maximum length of the channel region of the TFT in the laser scanning direction may be used as the channel size in the present invention.

In the first and second embodiments,
Although an a-Si film was crystallized using a XeCl excimer laser or a solid-phase crystal-grown Si film was recrystallized, the present invention is also applicable to a case where the film is crystallized by irradiation with various other laser pulses. Of course, there is a similar effect, and the wavelength 248
The same applies to the case where a KrF excimer laser of nm is used.

In the second embodiment, the solid-phase crystal growth method employs a method in which a catalyst element is selectively used and crystal growth is performed in the lateral direction. Similar effects can be obtained by using the phase crystal growth method. Alternatively, a method may be used in which the catalyst element is not selectively introduced but is introduced over the entire surface of the Si film and the crystal is grown as it is. In this case, an excellent effect by the catalytic element can be obtained, and an extra process such as mask formation is not required.

As a method for introducing Ni as a catalyst element, various methods other than the vapor deposition method described in the second embodiment can be used. For example, a method of applying an aqueous solution in which a Ni salt is dissolved, a method of diffusing from an SiO ₂ film made of a SOG (spin-on-glass) material in which a Ni salt is dissolved, and a method of forming a thin film by a sputtering method or a plating method are effective. Alternatively, a method of directly introducing ions by an ion doping method can be used.

Further, as impurity metal elements which promote crystallization, Co, Pd, Pt, Cu, A
The effect can also be obtained by using g, Au, In, Sb, Al and Sb.

Further, as an application of the present invention, in addition to an active matrix type substrate for liquid crystal display, for example, a contact type image sensor, a thermal head with a built-in driver, and a driver built-in type using an organic EL as a light emitting element. An optical writing element, a display element, a three-dimensional IC, and the like can be considered.
By using the present invention, high performance such as high speed and high resolution of these elements is realized. Further, the present invention is not limited to the MOS transistor described in the above embodiment, and can be widely applied to all semiconductor processes including a bipolar transistor using a crystalline semiconductor as an element material and an electrostatic induction transistor.

[0121]

According to the present invention described above, the channel region of each thin film transistor along the scanning direction of the laser pulse includes all the crystallinity distributions within the scanning pitch P of each sequentially scanned laser pulse. Therefore, variations in characteristics of each thin film transistor can be eliminated. Therefore, according to the present invention, since the characteristics of a plurality of thin film transistors can be stabilized, a thin film semiconductor device having high performance and high reliability and stability can be realized.

According to the semiconductor device of the present invention, the characteristics of the individual TFTs can be made uniform within the panel without being affected by the non-uniformity of the crystallinity due to the sequential scanning of the laser pulse. And a liquid crystal display device with a high display level free from display defects due to the above.

According to the semiconductor device of the third aspect, a full driver monolithic active matrix substrate capable of achieving high performance, high integration, and uniform characteristics required for the TFTs constituting the peripheral drive circuit portion. Therefore, it is possible to enjoy a compact, high-performance, and low-cost module.

Further, according to the semiconductor device of the fourth or fifth aspect, it becomes particularly suitable for a semiconductor device having a large-area substrate.

Further, according to the method of manufacturing a semiconductor device of the present invention, a semiconductor device having the above effects can be manufactured by a low-cost and simple process.

According to the method of manufacturing a semiconductor device according to the sixth or eighth aspect, a highly reliable semiconductor device can be realized.

According to the method for manufacturing a semiconductor device according to the seventh or ninth aspect, since the crystallinity in the channel can be improved, a semiconductor device having further excellent thin film transistor characteristics can be realized.

Further, especially in the method of manufacturing a semiconductor device according to the eleventh aspect, the characteristics of the thin film transistor can be further improved.

Further, according to the method of manufacturing a semiconductor device according to the twelfth aspect, it is possible to realize a method of manufacturing a semiconductor device capable of lowering the heating temperature, shortening the processing time, and further improving the crystallinity.

Further, according to the method of manufacturing a semiconductor device according to the thirteenth aspect, a semiconductor device with higher performance can be realized.

According to the method of manufacturing a semiconductor device according to the fourteenth aspect, a good crystalline Si film can be obtained and the semiconductor device has a low thermal damage to an underlying glass substrate or the like. Can be realized.

In addition, according to the method of manufacturing a semiconductor device according to the fifteenth aspect, more uniform processing can be performed on a large-sized substrate, and a semiconductor device manufacturing method that can further improve the manufacturing efficiency is realized. it can.

[Brief description of the drawings]

FIG. 1 is a schematic plan view showing a schematic configuration of an active matrix substrate and a crystallinity distribution of a crystalline Si film, showing Embodiment 1 of the present invention.

FIG. 2 is a cross-sectional view taken along the line AA ′ of FIG. 1 showing a manufacturing process of an active matrix substrate, showing Embodiment 1 of the present invention.

FIG. 3 is a schematic plan view showing a schematic configuration of a CMOS circuit and a crystallinity distribution of a crystalline Si film, showing Embodiment 2 of the present invention.

FIG. 4 is a plan view showing the outline of the manufacturing process of the CMOS circuit, showing Embodiment 2 of the present invention.

FIG. 5 is a cross-sectional view taken along the line BB ′ of FIG. 4 illustrating a second embodiment of the present invention, which is a manufacturing process diagram of a CMOS circuit.

6A is a diagram illustrating an energy distribution of a laser beam in a sequential scanning of a laser pulse, and FIG. 6B is a diagram illustrating a crystallinity distribution of a Si film by the sequential scanning in FIG.

[Explanation of symbols]

101, 201 Glass substrate 102, 202 Base film 103, 203 Amorphous Si film 107, 207 Laser pulse 108 Active region (crystallized Si film) 109, 209 Gate insulating film 110 Gate electrode 111 Anode oxide layer 113 Non-doped region 114 Source region 115 Drain region 116, 216 Interlayer insulating film 117, 217, 218, 219 Electrode / wiring 120 Pixel electrode 121 Pixel TFT 124, 224 Laser scanning pitch 126, 226 Crystallinity distribution on substrate 127, 227 Channel region 128 Offset Regions 131a, 131b, 131c Crystallinity distribution in channel 204 Photoresist mask 205 Catalyst element (Ni) 206 Crystal growth direction 208n, 208p Active region (crystallized Si film) 210n, 210p Gate electrode 21 n, 213p doped regions 214n, 214p source region 215n, 215p drain region 222 P-type TFT 227N of the N-type TFT 223 CMOS circuit of a CMOS circuit, 227p channel region L the channel length P laser scanning pitch W the channel width

Claims (15)

[Claims] In a semiconductor device in which a plurality of thin film transistors are formed over a substrate having an insulating surface, a channel region of the plurality of thin film transistors is crystallized by sequentially irradiating pulse laser light at a scanning pitch P. The size S of the channel region in the scanning direction of the pulse laser light and the scanning pitch P of the pulse laser light at the time of crystallization of the crystalline Si film are approximately S =
A semiconductor device configured to be nP (where n is an integer other than 0). 2. The method according to claim 1, wherein the substrate is an active matrix substrate having a plurality of pixel electrodes corresponding to the plurality of thin film transistors, and the plurality of thin film transistors are pixel switching thin film transistors connected to the respective pixel electrodes. Item 2. The semiconductor device according to item 1. 3. The semiconductor device according to claim 1, wherein said substrate is a driver monolithic type active matrix substrate in which an active matrix portion and a driver circuit are simultaneously formed on the same substrate, and said thin film transistor forms a driver circuit. 4. The semiconductor device according to claim 1, wherein the size S of the channel region and the scanning pitch P are set so that S = P. 5. The semiconductor device according to claim 4, wherein a ratio S / P between the size S of the channel region and the scanning pitch P is in a range of 0.9 <S / P <1.1. 6. A step of forming a Si film on a substrate having an insulating surface, a step of sequentially irradiating the Si film with a pulse laser beam at a scanning pitch P to crystallize the Si film, The crystallized Si film is patterned so as to be the element regions of the plurality of thin film transistors so that the scanning direction and the channel direction are perpendicular to each other, and the channel width W of a portion that will later become the channel region of the thin film transistors is Forming the semiconductor laser device so as to be substantially an integral multiple of the scanning pitch P of the pulsed laser light. 7. A step of forming a Si film on a substrate having an insulating surface; a step of sequentially irradiating the Si film with a pulse laser beam at a scanning pitch P to crystallize the Si film; Patterning the crystallized Si film so as to be an element region of a plurality of thin film transistors so that the scanning direction and the channel direction are parallel to each other; and a channel of a channel region of the thin film transistor corresponding to a width of a gate electrode. Forming a gate electrode on a Si film crystallized such that the length L is substantially an integral multiple of the scanning pitch P of the pulsed laser light. 8. A step of forming a Si film on a substrate having an insulating surface, and a step of irradiating the pulsed laser beam to the Si film sequentially at a scanning pitch P to perform a pulsed laser beam for crystallization of the Si film. The Si film is patterned so that the scanning direction of the thin film transistor is perpendicular to the channel direction of the thin film transistor, and the channel width of a portion to be the channel region of the thin film transistor is W, so that the Si film becomes the element region of the plurality of thin film transistors. And a step of sequentially applying the pulsed laser light in a predetermined direction to the Si film that is to be an element region of the plurality of patterned thin film transistors at a scanning pitch P that is substantially an integral number of the channel width W. Scanning and crystallizing the Si film. 9. A step of forming a Si film on a substrate having an insulating surface, and a step of sequentially irradiating the Si film with the scanning laser beam at a scanning pitch P to perform a pulse laser beam for crystallizing the Si film to be performed later. Patterning the Si film so as to be an element region of the plurality of thin film transistors so that the scanning direction of the thin film transistor is parallel to the channel direction of the thin film transistor; Scanning the pulse laser beam sequentially at a scanning pitch P to crystallize the Si film; and determining the channel length L of the channel region of the thin film transistor corresponding to the width of the gate electrode by the scanning pitch of the pulse laser beam. Forming a gate electrode on a Si film crystallized so as to be approximately an integral multiple of P. 10. The method for manufacturing a semiconductor device according to claim 6, wherein a step of forming a Si film on the substrate having the insulating surface and a step of scanning the Si film with a pulse laser beam A step of forming an amorphous Si film on the substrate and heating it to crystallize in a solid phase instead of a step of sequentially irradiating with P to crystallize the Si film; A step of sequentially irradiating the film with a pulse laser beam at a scanning pitch P to recrystallize the Si film. 11. An amorphous Si film is formed on the substrate,
The method of manufacturing a semiconductor device according to claim 10, wherein the step of heating to crystallize in a solid state is performed after introducing a catalytic element for promoting crystallization into the amorphous Si film. 12. An amorphous Si film is formed on the substrate,
The step of crystallization in the solid phase state by heating is performed by selectively introducing a catalytic element that promotes crystallization into the amorphous Si film, and selectively introducing the catalytic element by heat treatment. The method of manufacturing a semiconductor device according to claim 10, wherein the crystal is grown laterally from a region to a peripheral portion thereof. 13. The method according to claim 11, wherein a Ni element is used as the catalyst element. 14. The pulse laser beam having a wavelength of 40
14. The method for manufacturing a semiconductor device according to claim 6, wherein an excimer laser beam of 0 nm or less is used. 15. The pulse laser beam has a beam shape set to be an elongated shape on an irradiation surface, and is sequentially scanned in a direction perpendicular to the elongated direction of the beam shape, 2. The method according to claim 1, wherein channel regions of said plurality of thin film transistors are crystallized.
5. The method of manufacturing a semiconductor device according to any one of 4.