JPH10144191A - Thermal fuse material and electronic component using it - Google Patents

Thermal fuse material and electronic component using it

Info

Publication number
JPH10144191A
JPH10144191A JP8296110A JP29611096A JPH10144191A JP H10144191 A JPH10144191 A JP H10144191A JP 8296110 A JP8296110 A JP 8296110A JP 29611096 A JP29611096 A JP 29611096A JP H10144191 A JPH10144191 A JP H10144191A
Authority
JP
Japan
Prior art keywords
thermal fuse
metal film
glass powder
fuse material
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8296110A
Other languages
Japanese (ja)
Inventor
Kazushige Koyama
一茂 小山
Yasuo Wakahata
康男 若畑
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP8296110A priority Critical patent/JPH10144191A/en
Publication of JPH10144191A publication Critical patent/JPH10144191A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01CRESISTORS
    • H01C7/00Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
    • H01C7/10Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material voltage responsive, i.e. varistors

Abstract

PROBLEM TO BE SOLVED: To break current-carrying so as to secure the safety of an electronic component by breaking metal conductivity so as to be insulative when thermal fuse material formed by coating the outer surface of glass powder through metal film is fused so as to react with the metal film. SOLUTION: A varistor 1 is a sintered body composed of ZnO, as a main component, and Bi2 O3 , or the like, as a sub-component, electrodes 2a, 2b are provided on its surface. A terminal 4 is attached onto the electrode 2a via a thermal fuse layer, and is coated by resin 6. When the varistor 1 is deteriorated and heated by abnormal high voltage or the like, glass powder is low melting point lead glass powder so as to fuse at about 400 deg.C. The same reacts with the Cu metal film 8 of an inner layer, and further reacts with a Sn metal film 9 in a fused state so as to break its conductivity, and the thermal fuse layer 3 becomes insulative substantially. Thereafter, no current flows in the deteriorated varistor 1 so as to be safe.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、温度ヒューズ材料
及びそれを用いた電子部品に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a thermal fuse material and an electronic component using the same.

【0002】[0002]

【従来の技術】従来の電子部品においては、それに過電
流が流れると温度上昇が起こり、これを安全な状態で通
電を絶たなければならないという問題があった。
2. Description of the Related Art In a conventional electronic component, there has been a problem that when an overcurrent flows through the electronic component, a temperature rise occurs, and it is necessary to cut off the power supply in a safe state.

【0003】[0003]

【発明が解決しようとする課題】そこで従来は、この電
子部品に別個に温度ヒューズ部品を直列に接続するなど
の対策をとっていたが、別個に温度ヒューズ部品を用い
ると高価になるとともに、大型化してしまうという問題
があった。そこで本発明はこれらの問題、即ち高価にな
る、大型化するという問題を改善することを目的とする
ものである。
Conventionally, measures have been taken such as connecting a thermal fuse component to the electronic component separately in series. However, the use of a separate thermal fuse component is expensive and large. There was a problem that would be. Therefore, an object of the present invention is to solve these problems, that is, problems of becoming expensive and increasing in size.

【0004】[0004]

【課題を解決するための手段】そしてこの目的を達成す
るために、本発明はガラス粉末の外表面を金属膜で覆う
ことにより温度ヒューズ材料を形成するものである。そ
してこの温度ヒューズ材料を電子部品の電極上に設けて
電子部品を構成するものである。
SUMMARY OF THE INVENTION To achieve this object, the present invention is to form a thermal fuse material by covering the outer surface of glass powder with a metal film. The thermal fuse material is provided on the electrodes of the electronic component to constitute the electronic component.

【0005】[0005]

【発明の実施の形態】本発明の請求項1に記載の発明
は、ガラス粉末の外表面を金属膜で覆った温度ヒューズ
材料であって、高温になりガラス粉末が溶融するとその
外表面の金属膜と反応し、これによって金属膜の導電性
を絶ち、実質的に絶縁化することになるのでそれ以降は
通電は絶たれ、よって安全なものとなるものである。
DETAILED DESCRIPTION OF THE INVENTION The invention according to claim 1 of the present invention is a thermal fuse material in which the outer surface of a glass powder is covered with a metal film, and when the temperature becomes high and the glass powder is melted, the metal on the outer surface is melted. It reacts with the film, thereby cutting off the conductivity of the metal film and substantially insulating the metal film, so that the current is cut off thereafter, and the device is safe.

【0006】請求項2に記載の発明は、ガラス粉末を低
融点ガラスで形成した請求項1に記載のものであって、
ガラス粉末が低融点ガラスより形成されているので低温
で溶融し、より安全性の高い状態で動作させることがで
きるものである。
According to a second aspect of the present invention, the glass powder is formed of a low melting point glass,
Since the glass powder is made of low melting point glass, it can be melted at a low temperature and operated in a more secure state.

【0007】請求項3に記載の発明は、ガラス粉末の溶
融温度を700℃以下とした請求項1または2に記載の
ものであって、700℃以下で動作させ絶縁化させるこ
とで安全性を高めることができるものである。
According to a third aspect of the present invention, the melting temperature of the glass powder is set to 700 ° C. or less, and the safety is ensured by operating at 700 ° C. or less to insulate the glass powder. It can be enhanced.

【0008】請求項4に記載の発明は、ガラス粉末を鉛
系ガラス、またはビスマス系ガラスで形成した請求項1
〜3のいずれか一つに記載の温度ヒューズ材料であっ
て、鉛系ガラス、またはビスマス系ガラスであれば、そ
れが溶融することにより外表面の金属と非常に良く反応
し、その導電性を絶ち絶縁化することがスムーズに行わ
れるものである。
According to a fourth aspect of the present invention, the glass powder is formed of a lead-based glass or a bismuth-based glass.
The thermal fuse material according to any one of (1) to (3), which is a lead-based glass or a bismuth-based glass, reacts very well with the metal on the outer surface by melting, and reduces its conductivity. Insulation is smoothly performed.

【0009】請求項5に記載の発明は、金属膜をPb,
Sn,Ni,Cu,Pd,Agの少なくとも一つよりな
る請求項1〜4のいずれか一つに記載のものであって、
金属膜の外表面がそのような金属膜で覆われることによ
り、通常時における導電性が十分に確保されるものであ
る。
According to a fifth aspect of the present invention, the metal film is made of Pb,
The method according to claim 1, comprising at least one of Sn, Ni, Cu, Pd, and Ag,
By covering the outer surface of the metal film with such a metal film, sufficient conductivity at normal times is ensured.

【0010】請求項6に記載の発明は、金属膜が多層と
なる場合、最外層にPb,Sn,Agの少なくとも一つ
からなる金属膜を形成する請求項1〜4のいずれか一つ
に記載のものであり、これにより温度ヒューズ材料の表
面にはんだ付けが可能となるものである。
According to a sixth aspect of the present invention, in the case where the metal film has a multilayer structure, a metal film made of at least one of Pb, Sn, and Ag is formed as the outermost layer. It allows for soldering to the surface of the thermal fuse material.

【0011】請求項7に記載の発明は、電子部品の電極
上の請求項1〜6のうちいずれか一つの温度ヒューズ材
料を設けた電子部品であって、この構成によれば通常時
においては、ガラス粉末表面の金属膜によって十分な導
電性が確保され、高温時にはガラス粉末が溶融すること
により金属膜と反応してこれを絶縁化し、それ以降の通
電を阻止し安全性を高めることができるものである。
According to a seventh aspect of the present invention, there is provided an electronic component provided with the thermal fuse material according to any one of the first to sixth aspects on an electrode of the electronic component. Sufficient conductivity is ensured by the metal film on the surface of the glass powder, and at high temperatures, the glass powder melts and reacts with the metal film to insulate it, preventing further energization and enhancing safety. Things.

【0012】請求項8に記載の発明は、このような温度
ヒューズ材料上に端子を設けた請求項7に記載の電子部
品であって、電子部品の電極と端子の間の温度ヒューズ
材料を介在させることによって電子部品が高温化した場
合の安全性を確保できるものである。
According to an eighth aspect of the present invention, there is provided the electronic component according to the seventh aspect, wherein a terminal is provided on the thermal fuse material, wherein the thermal fuse material is interposed between the electrode and the terminal of the electronic component. By doing so, it is possible to ensure safety when the electronic component is heated.

【0013】(実施形態1)以下、本発明の一実施形態
を添付図面とともに説明する図1において、1はバリス
タ(電圧非直線性抵抗素子)であって、ZnOを主成分
とし、副成分としてBi23,Co23,MnO2など
を含む焼結体である。そのバリスタ1の表面上には電極
2a,2bが設けられ、その電極2a上に温度ヒューズ
層3を介して端子4がはんだ5により付着されており、
それらが樹脂6により被覆されている。
(Embodiment 1) In the following, an embodiment of the present invention will be described with reference to the accompanying drawings. In FIG. 1, reference numeral 1 denotes a varistor (voltage non-linear resistance element), which contains ZnO as a main component and a sub-component as a varistor. It is a sintered body containing Bi 2 O 3 , Co 2 O 3 , MnO 2 and the like. Electrodes 2 a and 2 b are provided on the surface of the varistor 1, and a terminal 4 is attached on the electrode 2 a via a thermal fuse layer 3 by solder 5.
They are covered with a resin 6.

【0014】さて、上記温度ヒューズ層3は図2に示す
ような温度ヒューズ材料により構成されている。即ち、
温度ヒューズ材料は、PbOが85重量%、B23が1
0重量%、SiO2が5重量%の組成からなる鉛系ガラ
ス粉末7の表面にCuを化学メッキしCu金属膜8を形
成し、さらにその表面の一部をSnで置換メッキしてS
n金属膜9を形成したものである。この温度ヒューズ材
料の粒径は約10μmである。この温度ヒューズ材料に
ロジン及びフラックス成分等を混合し、ペースト状にし
て電極2a上に塗布した後、250℃まで加熱し表面の
Sn金属膜9を溶融する。この後に端子4をはんだ5に
より付着した後、エポキシ樹脂6で被覆して図1に示す
電子部品を作製する。
The thermal fuse layer 3 is made of a thermal fuse material as shown in FIG. That is,
The thermal fuse material is composed of 85% by weight of PbO and 1% of B 2 O 3.
The surface of a lead-based glass powder 7 having a composition of 0% by weight and 5% by weight of SiO 2 is chemically plated with Cu to form a Cu metal film 8, and a part of the surface is replaced with Sn to perform plating.
In this case, an n-metal film 9 is formed. The particle size of this thermal fuse material is about 10 μm. A rosin, a flux component, and the like are mixed with the temperature fuse material, applied in a paste form on the electrode 2a, and then heated to 250 ° C. to melt the Sn metal film 9 on the surface. After that, the terminal 4 is attached with the solder 5 and then covered with the epoxy resin 6 to produce the electronic component shown in FIG.

【0015】バリスタ1が異常高電圧等により劣化し発
熱すると、ガラス粉末はPbOが85重量%、B23
10重量%、SiO2が5重量%の組成からなる低融点
の鉛系ガラス粉末であるので約400℃になると溶融
し、まず内層のCu金属膜8と反応し、引き続いて既に
溶融状態にあるSn金属膜9と反応してこの導電性を絶
ち、実質的に温度ヒューズ層3は絶縁化する。よってそ
れ以降、劣化したバリスタ1に電流が流れることはな
く、安全なものとなるものである。
When the varistor 1 deteriorates due to abnormally high voltage and generates heat, the glass powder is a low melting point lead-based glass having a composition of 85% by weight of PbO, 10% by weight of B 2 O 3 and 5% by weight of SiO 2. Since it is a powder, it melts at about 400 ° C., first reacts with the inner Cu metal film 8, and subsequently reacts with the Sn metal film 9 already in a molten state to cut off this conductivity, and substantially reduces the temperature fuse layer. 3 is insulated. Therefore, after that, no current flows through the deteriorated varistor 1 and the varistor 1 is safe.

【0016】なお、本実施形態においては温度ヒューズ
層3を電極2aの片面上にしか設けなかったが、両面上
に設けても良い。
Although the thermal fuse layer 3 is provided only on one side of the electrode 2a in the present embodiment, it may be provided on both sides.

【0017】(実施形態2)次に本発明の他の実施形態
を説明する。
(Embodiment 2) Next, another embodiment of the present invention will be described.

【0018】即ち、他の実施形態は図3に示す積層型バ
リスタであって、バリスタ10はZnOを主成分とし、
副成分としてBi23,Co23,MnO2などを含む
焼結体であり、Ag−Pbからなる内部電極11と、そ
れに接続されたAgからなる外部電極12が設けられ、
その表面上を温度ヒューズ層13が覆うように構成され
ている。温度ヒューズ材料は(実施形態1)と同様の方
法で作製した。
That is, another embodiment is a multilayer varistor shown in FIG. 3, in which the varistor 10 contains ZnO as a main component,
A sintered body containing Bi 2 O 3 , Co 2 O 3 , MnO 2, etc. as subcomponents, provided with an internal electrode 11 made of Ag—Pb, and an external electrode 12 made of Ag connected thereto;
The surface is covered with a thermal fuse layer 13. The thermal fuse material was produced in the same manner as in the first embodiment.

【0019】本実施形態においては、プリント基板等に
実装された後、バリスタ10が劣化し発熱した場合、
(実施形態1)の場合と同様に温度ヒューズ層13が絶
縁化し、それ以降、劣化したバリスタ10に電流が流れ
ることはなく、安全なものとなるものである。
In the present embodiment, when the varistor 10 is deteriorated and generates heat after being mounted on a printed circuit board or the like,
As in the case of the first embodiment, the thermal fuse layer 13 is insulated, and thereafter, no current flows through the deteriorated varistor 10 and the varistor 10 is safe.

【0020】なお、本実施形態においては外部電極12
上には温度ヒューズ層13しか形成していないが、外部
電極12と温度ヒューズ層13の間にNi等の他の金属
層を形成しても良い。さらに温度ヒューズ層13上に他
の金属層を形成しても良い。
In this embodiment, the external electrodes 12
Although only the thermal fuse layer 13 is formed thereon, another metal layer such as Ni may be formed between the external electrode 12 and the thermal fuse layer 13. Further, another metal layer may be formed on the thermal fuse layer 13.

【0021】また、本実施形態においては温度ヒューズ
層13を外部電極12の両側に設けたが、片側のみに設
けても良い。
Although the thermal fuse layer 13 is provided on both sides of the external electrode 12 in the present embodiment, it may be provided on only one side.

【0022】[0022]

【発明の効果】以上、本発明の温度ヒューズ材料を用い
て電子部品を製造することにより、別個に温度ヒューズ
部品を接続する必要がないので、廉価かつ小型の温度ヒ
ューズ付き電子部品を製造することが可能となる。
As described above, by manufacturing an electronic component using the thermal fuse material of the present invention, there is no need to separately connect a thermal fuse component, and thus an inexpensive and small-sized electronic component with a thermal fuse can be manufactured. Becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施形態1における電子部品の断面図FIG. 1 is a sectional view of an electronic component according to a first embodiment of the present invention.

【図2】同温度ヒューズ材料の断面図FIG. 2 is a cross-sectional view of the thermal fuse material.

【図3】本発明の実施形態2における電子部品の断面図FIG. 3 is a sectional view of an electronic component according to a second embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 バリスタ 2a 電極 2b 電極 3 温度ヒューズ層 4 端子 5 はんだ 6 樹脂 7 ガラス粉末 8 Cu金属膜 9 Sn金属膜 10 バリスタ 11 内部電極 12 外部電極 13 温度ヒューズ層 DESCRIPTION OF SYMBOLS 1 Varistor 2a electrode 2b electrode 3 Thermal fuse layer 4 Terminal 5 Solder 6 Resin 7 Glass powder 8 Cu metal film 9 Sn metal film 10 Varistor 11 Internal electrode 12 External electrode 13 Thermal fuse layer

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 ガラス粉末の外表面を金属膜で覆った温
度ヒューズ材料。
1. A thermal fuse material comprising an outer surface of glass powder covered with a metal film.
【請求項2】 ガラス粉末は低融点ガラスよりなる請求
項1に記載の温度ヒューズ材料。
2. The thermal fuse material according to claim 1, wherein the glass powder comprises a low melting point glass.
【請求項3】 ガラス粉末の溶融点は700℃以下とし
た請求項1または2に記載の温度ヒューズ材料。
3. The thermal fuse material according to claim 1, wherein the melting point of the glass powder is 700 ° C. or less.
【請求項4】 ガラス粉末は鉛系ガラス、またはビスマ
ス系ガラスよりなる請求項1〜3のいずれか一つに記載
の温度ヒューズ材料。
4. The thermal fuse material according to claim 1, wherein the glass powder is made of lead-based glass or bismuth-based glass.
【請求項5】 金属膜はPb,Sn,Ni,Cu,P
d,Agの少なくとも一つよりなる請求項1〜4のいず
れか一つに記載の温度ヒューズ材料。
5. The metal film is made of Pb, Sn, Ni, Cu, P
5. The thermal fuse material according to claim 1, comprising at least one of d and Ag.
【請求項6】 金属膜は多層よりなり、内層はガラス粉
末の外表面に付着した金属膜、外層はPb,Sn,Ag
の少なくとも一つからなる請求項1〜4のいずれか一つ
に記載の温度ヒューズ材料。
6. The metal film is composed of multiple layers, the inner layer is a metal film attached to the outer surface of glass powder, and the outer layer is Pb, Sn, Ag.
The thermal fuse material according to any one of claims 1 to 4, comprising at least one of the following.
【請求項7】 電極上に請求項1〜6のうちいずれか一
つの温度ヒューズ材料を設けた電子部品。
7. An electronic component having an electrode provided with the thermal fuse material according to claim 1.
【請求項8】 温度ヒューズ材料上に端子を設けた請求
項7に記載の電子部品。
8. The electronic component according to claim 7, wherein terminals are provided on the thermal fuse material.
JP8296110A 1996-11-08 1996-11-08 Thermal fuse material and electronic component using it Pending JPH10144191A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8296110A JPH10144191A (en) 1996-11-08 1996-11-08 Thermal fuse material and electronic component using it

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8296110A JPH10144191A (en) 1996-11-08 1996-11-08 Thermal fuse material and electronic component using it

Publications (1)

Publication Number Publication Date
JPH10144191A true JPH10144191A (en) 1998-05-29

Family

ID=17829272

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8296110A Pending JPH10144191A (en) 1996-11-08 1996-11-08 Thermal fuse material and electronic component using it

Country Status (1)

Country Link
JP (1) JPH10144191A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1826781A1 (en) * 2006-02-24 2007-08-29 Robert Bosch Gmbh Varistor with a fuse element

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1826781A1 (en) * 2006-02-24 2007-08-29 Robert Bosch Gmbh Varistor with a fuse element
WO2007099020A1 (en) * 2006-02-24 2007-09-07 Robert Bosch Gmbh Varistor with a fuse element

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