JPH10134873A - Contact terminal and its manufacture - Google Patents

Contact terminal and its manufacture

Info

Publication number
JPH10134873A
JPH10134873A JP28530096A JP28530096A JPH10134873A JP H10134873 A JPH10134873 A JP H10134873A JP 28530096 A JP28530096 A JP 28530096A JP 28530096 A JP28530096 A JP 28530096A JP H10134873 A JPH10134873 A JP H10134873A
Authority
JP
Japan
Prior art keywords
contact terminal
lead
contact
shaped
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28530096A
Other languages
Japanese (ja)
Other versions
JP3444335B2 (en
Inventor
Yoji Uchikura
洋二 内倉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP28530096A priority Critical patent/JP3444335B2/en
Publication of JPH10134873A publication Critical patent/JPH10134873A/en
Application granted granted Critical
Publication of JP3444335B2 publication Critical patent/JP3444335B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a contact terminal in which manufacturing is easy, and contact with a lead is excellent by providing plural protrusions of an obtuse angle cone shape at the tip of the contact terminal through a V-shaped blade shape cutter whose vertical angle is obtuse. SOLUTION: Plural V-shaped slits are cut on the surface of the head portion 63 of contact terminal raw material formed by good conduction material such as copper or the like by a cutter of a V-shaped blade shape whose vertical angle is 90 deg. to 160 deg.. Next, plural V-shaped slits orthogonal thereto are cut so as to form quadrangle pyramid protrusions 1, 1... to obtain a cotact terminal A. Thereby, the protrusions 1 can easily be provided on the contact terminal. When the contact terminal is used for the test or the inspection of a semiconductor device such as a PGA package or the like, sure contact with a lead can be obtained regardless of the surface conditions of the pin-like lead 60. No change of the contact terminal in response to the lead conditions is required so that the efficiency of the test or the inspection can be enhanced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はコンタクト端子に関
し、特に、PGAパッケージ等の半導体装置の試験、検
査装置に使用するコンタクト端子に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a contact terminal, and more particularly to a contact terminal used for a test and inspection device for a semiconductor device such as a PGA package.

【0002】[0002]

【従来の技術】一般にPGAパッケージ等、ピン状、あ
るいはバンプ状のリードを有する半導体パッケージの試
験、検査は試験機側のコンタクト端子に半導体パッケー
ジのリード先端を押しつけて各リードをプロービングす
ることにより行われており、コンタクト端子としては、
従来、図6に示すものが多用されている。
2. Description of the Related Art In general, a semiconductor package having a pin-shaped or bump-shaped lead such as a PGA package is tested and inspected by pressing the tip of the lead of the semiconductor package against a contact terminal of a testing machine and probing each lead. As contact terminals,
Conventionally, those shown in FIG. 6 are frequently used.

【0003】すなわち、図6(a)に示すコンタクト端
子Aは、リード60との接触面を可及的に大きくするた
めに、中央部を凹ませてカップ型に形成され、図6
(b)に示すものは、先端が鋭角な円錐形状の針状部7
が先端部に形成される。
[0006] That is, the contact terminal A shown in FIG. 6A is formed in a cup shape with a concave central portion in order to make the contact surface with the lead 60 as large as possible.
(B) shows a needle-like portion 7 having a conical shape with a sharp tip.
Is formed at the tip.

【0004】[0004]

【発明が解決しようとする課題】しかし、前者のものに
あっては、はんだ等が表面に付着していないリード60
に対しては有効であるが、基板から取り外した状態で、
表面にはんだが残留しているリード60に対しては、付
着はんだの表面に形成される酸化膜、あるいははんだ屑
のためにリード60との良好な接触状態を得ることがで
きないという欠点を有する。
However, in the case of the former, a lead 60 having no solder or the like attached to the surface is used.
Is effective for
The lead 60 having solder remaining on the surface has a disadvantage that a good contact state with the lead 60 cannot be obtained due to an oxide film formed on the surface of the adhered solder or solder dust.

【0005】一方、後者のものは、表面にはんだが付着
しても針状部7が付着はんだの酸化膜を破るために、は
んだが残留したリード60に対しては有効であるが、は
んだが表面に付着していないリード60に対しては、図
6(b)に示すように、針状部7がリード60表面に形
成された金メッキ膜61を破り、リード60の下地が露
出するために、検査後における実装基板へのはんだ接合
行程において、はんだ濡れ不良、あるいははんだ付け不
良等を惹起するするおそれがあるという欠点を有する。
On the other hand, the latter is effective for the lead 60 on which the solder remains because the needle-like portion 7 breaks the oxide film of the adhered solder even if the solder adheres to the surface. As shown in FIG. 6B, the needle-shaped portion 7 breaks the gold plating film 61 formed on the surface of the lead 60 and exposes the base of the lead 60 to the lead 60 not attached to the surface. In addition, there is a disadvantage in that in the process of joining the solder to the mounting board after the inspection, poor solder wetting or poor soldering may be caused.

【0006】この結果、従来、コンタクト端子Aは、リ
ード60の状態に応じて変更する必要があり、試験、検
査工数の増加をもたらすという欠点を有している。本発
明は、以上の欠点を解消すべくなされたもので、リード
の表面状態如何にかかわらず、リードとの良好な接触が
可能なコンタクト端子、およびその製造方法の提供を目
的とする。
As a result, conventionally, the contact terminal A has to be changed according to the state of the lead 60, and has a drawback that the number of testing and inspection steps is increased. SUMMARY OF THE INVENTION The present invention has been made to solve the above-described drawbacks, and has as its object to provide a contact terminal capable of making good contact with a lead regardless of the surface state of the lead, and a method of manufacturing the same.

【0007】[0007]

【課題を解決するための手段】本発明によれば上記目的
は、図1に示すように、頂角θが鈍角の錐体形状を有す
る複数の突起1、1・・を先端に備えたコンタクト端子
を提供することにより達成される。
According to the present invention, there is provided a contact having a plurality of protrusions 1, 1,... Having a conical shape having an obtuse angle .theta. This is achieved by providing terminals.

【0008】頂角θが鈍角な突起1を複数個並べること
により、リード60の表面膜への貫通力は弱くなり、は
んだの表面酸化膜を破ることは可能であるが、金メッキ
膜61への受傷を防止、あるいは可及的に少なくするこ
とが可能となる。
By arranging a plurality of projections 1 whose apex angle θ is obtuse, the penetrating force of the lead 60 to the surface film is weakened, and it is possible to break the surface oxide film of the solder. Injury can be prevented or minimized.

【0009】この結果、一種類のコンタクトをはんだ残
留の有無に関わらず使用することが可能となり、検査、
試験工数を低減させることができる。錐体形状とは円錐
体、角錐体であり、頂部が底面の中心線上にあることを
要しないが、請求項2に記載されるように、突起1を正
多角形錐体とし、各突起1の側面は隣接する他の突起1
の側面と同一面となるように配置すると、コンタクト端
子素材2の端面をV字状のカッター5で縦横に切削する
だけで、容易に所望の突起1を形成することが可能とな
り、製造工程を低減させることが可能になる。
As a result, it is possible to use one type of contact regardless of the presence or absence of the residual solder.
Testing man-hours can be reduced. The cone shape is a cone or a pyramid, and it is not necessary that the top is on the center line of the bottom surface, but as described in claim 2, the projection 1 is a regular polygonal pyramid, and each projection 1 Side of the other protrusion 1 adjacent
When arranged so as to be flush with the side surfaces of the contact terminal material 2, it is possible to easily form a desired projection 1 simply by cutting the end face of the contact terminal material 2 vertically and horizontally with a V-shaped cutter 5. It becomes possible to reduce.

【0010】請求項3記載の発明において、コンタクト
端子Aの製造方法が提供される。本発明において、コン
タクト端子Aは、コンタクト端子素材2の端面に平行な
V字状溝3を切削して頂角θが鈍角の三角形断面の突条
4を複数条形成し、次いで、頂角θが鈍角のV字状刃型
のカッター5を前記突条4に交差する方向に走行させて
突条4をV字状溝3により切り離して製造される。
According to the third aspect of the present invention, a method for manufacturing a contact terminal A is provided. In the present invention, the contact terminal A is formed by cutting a V-shaped groove 3 parallel to the end face of the contact terminal material 2 to form a plurality of ridges 4 having a triangular cross section with an obtuse angle θ being obtuse. Is manufactured by running a V-shaped blade-type cutter 5 having an obtuse angle in a direction intersecting the ridges 4 and separating the ridges 4 by the V-shaped grooves 3.

【0011】[0011]

【発明の実施の形態】まず、本発明にかかるコンタクト
端子Aが使用される試験機8を図3に例示する。試験機
8は制御部80と、制御部80に接続される試験用プリ
ント基板81とを有し、試験用プリント基板81には、
プローブ用プリント基板82が接続される。プローブ用
プリント基板82上には、評価対象の半導体パッケージ
6のリードピッチに対応してリード挿入孔90が穿孔さ
れたコネクタ9が固定されており、各リード挿入孔90
内に本発明にかかるコンタクト端子Aが配置される。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS First, FIG. 3 shows an example of a tester 8 using a contact terminal A according to the present invention. The test machine 8 includes a control unit 80 and a test printed board 81 connected to the control unit 80.
The probe printed board 82 is connected. On the probe printed circuit board 82, connectors 9 having lead insertion holes 90 formed therein corresponding to the lead pitch of the semiconductor package 6 to be evaluated are fixed.
The contact terminal A according to the present invention is disposed therein.

【0012】図示の例は、PGA(ピングリッドアレ
イ)パッケージの検査を示すもので、PGAパッケージ
の検査は、ピン状のリード60をリード挿入孔90内に
挿入し、先端をコンタクト端子Aに圧接させた状態で行
われる。
The illustrated example shows the inspection of a PGA (pin grid array) package. In the inspection of the PGA package, a pin-shaped lead 60 is inserted into a lead insertion hole 90 and the tip is pressed against a contact terminal A. It is performed in the state where it is made.

【0013】コンタクト端子Aは、銅等の導電性の良好
な材料により形成され、図1、2に示すように、プロー
ブ用プリント基板82への保持部62と、φ0.6mm
程度のヘッド部63とからなり、ヘッド部63の表面に
は0.1mm程度のピッチpで複数の突起1、1・・が
形成される。ヘッド部63の表面に形成される各突起1
は、頂角θが90°から160°の範囲、望ましくは1
20゜の正四角錐形状をなしており(本実施の形態にお
いては120°の場合についてのみ説明する。)、底面
の辺縁を接触させた状態で隣接して形成される。なお、
図1、2において突起群の周辺に平面部64が形成され
ているが、後述するように、突起1を切削により形成す
る場合には、図5に示すように、切削上がりの状態で使
用することも可能である。
The contact terminal A is formed of a material having good conductivity such as copper, as shown in FIGS.
, And a plurality of projections 1, 1,... Formed at a pitch p of about 0.1 mm on the surface of the head section 63. Each projection 1 formed on the surface of the head portion 63
Means that the apex angle θ is in the range of 90 ° to 160 °, preferably 1
It has a regular quadrangular pyramid shape of 20 ° (only the case of 120 ° will be described in the present embodiment), and is formed adjacently with the edges of the bottom surface in contact with each other. In addition,
In FIGS. 1 and 2, a flat portion 64 is formed around the projection group. However, as described later, when the projection 1 is formed by cutting, as shown in FIG. It is also possible.

【0014】上述したコンタクト端子Aは、例えば、以
下のようにして製造することが可能である。すなわち、
まず、端部にヘッド部63を備えたコンタクト端子素材
2を銅等の良導電性材料により形成する。コンタクト端
子素材2の形状は、プローブ用プリント基板82等、コ
ンタクト端子Aの使用部品に合致する形状とされ、本実
施の形態においてはピン形状に形成される。
The above-mentioned contact terminal A can be manufactured, for example, as follows. That is,
First, a contact terminal material 2 having a head portion 63 at an end is formed of a highly conductive material such as copper. The contact terminal material 2 has a shape conforming to a component used for the contact terminal A, such as the probe printed circuit board 82, and is formed in a pin shape in the present embodiment.

【0015】次に、図4に示すように、上記ヘッド部6
3の表面を頂角θが120゜のV字状刃型を有するカッ
ター5で複数本の平行なV字状溝3、3・・を切削す
る。ヘッド部63の表面を切削することにより、該表面
には頂角θが鈍角の突条4が複数条形成されることとな
り、次いで、図4(c)に示すように、上記カッター5
の走行方向に直交する方向(図4(a)における矢印A
方向)にカッター5を移動させて突条4、4・・を新た
なV字状溝3により分離する。
Next, as shown in FIG.
A plurality of parallel V-shaped grooves 3, 3... Are cut from the surface of the surface 3 by a cutter 5 having a V-shaped blade having an apex angle θ of 120 °. By cutting the surface of the head portion 63, a plurality of ridges 4 having an obtuse angle θ are formed on the surface, and then, as shown in FIG.
(The arrow A in FIG. 4A)
), The ridges 4 are separated by the new V-shaped groove 3.

【0016】以上のように、直交する方向から平行なV
字状溝3を切削することにより、ヘッド部63の表面に
は、図5に示すように、頂角θ、すなわち、頂点と対向
する一対の側壁の中心を通る線分により形成される角度
が120゜の四角錐形状をなした複数の突起1、1・・
が形成され、所望により図2に示すように、周縁部の突
起1を切除して平面部64を形成し、コンタクト端子A
が完成する。
As described above, the parallel V
As shown in FIG. 5, by cutting the groove 3, the surface of the head portion 63 has an apex angle θ, that is, an angle formed by a line segment passing through the center of the pair of side walls facing the apex. A plurality of protrusions 1, 1...
If necessary, as shown in FIG. 2, the projection 1 at the periphery is cut off to form a flat portion 64, and the contact terminal A is formed.
Is completed.

【0017】なお、上述した実施の形態においては、刃
型の頂角θが120゜のカッター5によりヘッド部63
の表面を縦横に切削して正四角錐形状の突起1を形成す
る場合を示したが、縦方向に切削するカッター5と横方
向に切削するカッター5の頂角θを異ならせてもよく、
さらには、例えば、カッター5を互いに60゜で交差す
るように3方向に走行させて三角錐形状の突起1を形成
することもできる。
In the above-described embodiment, the head section 63 is formed by the cutter 5 having the blade mold having an apex angle θ of 120 °.
Although the surface 1 is vertically and horizontally cut to form the projection 1 having a regular quadrangular pyramid shape, the vertical angle θ of the cutter 5 for cutting in the vertical direction and the cutter 5 for cutting in the horizontal direction may be different.
Further, for example, the triangular pyramid-shaped projections 1 can be formed by running the cutters 5 in three directions so as to cross each other at 60 °.

【0018】[0018]

【発明の効果】以上の説明から明らかなように、本発明
によれば、リードの表面状態によらずにリードとの接触
を確実にすることができるために、試験機等に採用した
場合には、リード状態によってコンタクト端子をその都
度変更する必要がなくなる。
As is apparent from the above description, according to the present invention, the contact with the lead can be ensured irrespective of the surface condition of the lead. In this case, it is not necessary to change the contact terminal each time depending on the lead state.

【0019】また、突起はカッターを複数方向から走行
させるだけで形成することができるために、製造が容易
である。
Further, since the projection can be formed only by moving the cutter from a plurality of directions, the manufacture is easy.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明を示す図で、(a)は平面図、(b)は
(a)の側面図である。
1A and 1B are diagrams showing the present invention, wherein FIG. 1A is a plan view and FIG. 1B is a side view of FIG.

【図2】図1の斜視図である。FIG. 2 is a perspective view of FIG.

【図3】試験機を示す図で、(a)は全体図、(b)は
コネクタを示す説明図である。
FIGS. 3A and 3B are views showing a tester, wherein FIG. 3A is an overall view and FIG. 3B is an explanatory view showing a connector.

【図4】コンタクト端子の製造工程を示す図で、(a)
は1方向から複数のV字状溝を切削加工した状態を示す
平面図、(b)は正面図、(c)は右側面図である。
FIG. 4 is a diagram showing a manufacturing process of a contact terminal, wherein (a)
FIG. 2 is a plan view showing a state in which a plurality of V-shaped grooves are cut from one direction, FIG. 2B is a front view, and FIG. 1C is a right side view.

【図5】図1の変形例を示す図で、(a)は平面図、
(b)は(a)のB−B線断面図である。
FIG. 5 is a view showing a modification of FIG. 1, wherein (a) is a plan view,
(B) is a sectional view taken along line BB of (a).

【図6】従来例を示す図である。FIG. 6 is a diagram showing a conventional example.

【符号の説明】[Explanation of symbols]

1 突起 2 コンタクト端子素材 3 V字状溝 4 突条 5 カッター A コンタクト端子 θ 頂角 Reference Signs List 1 projection 2 contact terminal material 3 V-shaped groove 4 ridge 5 cutter A contact terminal θ apex angle

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】頂角が鈍角の錐体形状を有する複数の突起
を先端に備えたコンタクト端子。
1. A contact terminal provided with a plurality of projections having a pyramid shape with an obtuse angle at an apex at an end.
【請求項2】前記突起は正多角形錐体であり、各突起の
側面は隣接する他の突起の錐面と同一面である請求項1
記載のコンタクト端子。
2. The projection is a regular polygonal pyramid, and the side surface of each projection is flush with the conical surface of another adjacent projection.
The described contact terminal.
【請求項3】コンタクト端子素材の端面に平行なV字状
溝を切削して頂角が鈍角の三角形断面の突条を複数条形
成し、 次いで、頂角が鈍角のV字状刃型のカッターを前記突条
に交差する方向に走行させて突条をV字状溝により切り
離し、 コンタクト端子素材の端面に頂角が鈍角の多角形錐体形
状の突起を形成するコンタクト端子の製造方法。
3. A V-shaped groove parallel to the end face of the contact terminal material is cut to form a plurality of ridges having a triangular cross section having an obtuse angle, and then a V-shaped blade having an obtuse angle is formed. A method of manufacturing a contact terminal in which a cutter is run in a direction intersecting the ridge to separate the ridge by a V-shaped groove, and a polygonal pyramid-shaped projection having an obtuse angle formed on an end face of the contact terminal material.
JP28530096A 1996-10-28 1996-10-28 Contact terminal and manufacturing method thereof Expired - Fee Related JP3444335B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28530096A JP3444335B2 (en) 1996-10-28 1996-10-28 Contact terminal and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28530096A JP3444335B2 (en) 1996-10-28 1996-10-28 Contact terminal and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH10134873A true JPH10134873A (en) 1998-05-22
JP3444335B2 JP3444335B2 (en) 2003-09-08

Family

ID=17689749

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28530096A Expired - Fee Related JP3444335B2 (en) 1996-10-28 1996-10-28 Contact terminal and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP3444335B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007012618A (en) * 2005-06-30 2007-01-18 Hitachi-Lg Data Storage Korea Inc Terminal and connector using the same
JP2009198238A (en) * 2008-02-20 2009-09-03 Totoku Electric Co Ltd Probe needle and method of manufacturing the same
JP2010146954A (en) * 2008-12-22 2010-07-01 Shin Etsu Polymer Co Ltd Connection structure of insulation displacement connector
KR101000735B1 (en) 2008-07-17 2010-12-14 리노공업주식회사 Test socket
JP2012156116A (en) * 2011-01-28 2012-08-16 Toyota Boshoku Corp Connector
JP2012169051A (en) * 2011-02-10 2012-09-06 Toyota Boshoku Corp Connector
WO2015163410A1 (en) * 2014-04-24 2015-10-29 矢崎総業株式会社 Contact connection structure
JP2016195045A (en) * 2015-03-31 2016-11-17 ニッタ株式会社 Connector device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007012618A (en) * 2005-06-30 2007-01-18 Hitachi-Lg Data Storage Korea Inc Terminal and connector using the same
JP2009198238A (en) * 2008-02-20 2009-09-03 Totoku Electric Co Ltd Probe needle and method of manufacturing the same
KR101000735B1 (en) 2008-07-17 2010-12-14 리노공업주식회사 Test socket
JP2010146954A (en) * 2008-12-22 2010-07-01 Shin Etsu Polymer Co Ltd Connection structure of insulation displacement connector
JP2012156116A (en) * 2011-01-28 2012-08-16 Toyota Boshoku Corp Connector
JP2012169051A (en) * 2011-02-10 2012-09-06 Toyota Boshoku Corp Connector
WO2015163410A1 (en) * 2014-04-24 2015-10-29 矢崎総業株式会社 Contact connection structure
JP2016195045A (en) * 2015-03-31 2016-11-17 ニッタ株式会社 Connector device

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