JPH10118563A - Formation of thick film pattern - Google Patents

Formation of thick film pattern

Info

Publication number
JPH10118563A
JPH10118563A JP27676496A JP27676496A JPH10118563A JP H10118563 A JPH10118563 A JP H10118563A JP 27676496 A JP27676496 A JP 27676496A JP 27676496 A JP27676496 A JP 27676496A JP H10118563 A JPH10118563 A JP H10118563A
Authority
JP
Japan
Prior art keywords
pattern
layer
mask
mask layer
pattern forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27676496A
Other languages
Japanese (ja)
Inventor
Satoru Kuramochi
悟 倉持
Yozo Kosaka
陽三 小坂
Masaaki Asano
雅朗 浅野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP27676496A priority Critical patent/JPH10118563A/en
Publication of JPH10118563A publication Critical patent/JPH10118563A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/061Etching masks
    • H05K3/064Photoresists

Landscapes

  • Application Of Or Painting With Fluid Materials (AREA)

Abstract

PROBLEM TO BE SOLVED: To enable patterning with a good shape by removing an unnecessary part through a mask formed on a pattern forming layer while preventing peeling of the mask. SOLUTION: A mask layer 13 is formed by using a paste containing a photosensitive resin, while a small amt. of the photosensitive resin is incorporated into a pattern forming layer 12. During exposure, adhesion strength between the mask layer 13 and the pattern forming layer 12 in the exposed area is increased so that peeling of the mask layer is prevented in the succeeding etching process or sand blasting process. Therefore, a thick film pattern 14 with a good shape can be formed.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、液晶表示装置、蛍
光表示ディスプレイパネル、プラズマディスプレイパネ
ル、混成集積回路等における電極や障壁などの厚膜パタ
ーンを形成する技術に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a technique for forming a thick film pattern such as an electrode and a barrier in a liquid crystal display device, a fluorescent display panel, a plasma display panel, a hybrid integrated circuit and the like.

【0002】[0002]

【従来の技術】従来、この種の厚膜パターン形成方法と
して、材料ペーストを全面塗布して乾燥させることでパ
ターン形成層を形成した後、そのパターン形成層の上に
有機溶媒に溶けないフォトレジストでマスクを設け、露
出した部分を有機溶剤でエッチング除去して所定形状の
厚膜パターンを得る方法が知られている。また、基板上
にパターン形成層を形成した後、サンドブラスト耐性を
有するレジストで所定形状のマスクを設けた後、露出し
た部分をサンドブラスト加工で除去する方法も知られて
いる。
2. Description of the Related Art Conventionally, as a method of forming a thick film pattern of this kind, a material paste is applied over the entire surface and dried to form a pattern formation layer, and then a photoresist insoluble in an organic solvent is formed on the pattern formation layer There is known a method of obtaining a thick film pattern having a predetermined shape by providing a mask by using an organic solvent and removing an exposed portion by etching with an organic solvent. Further, a method is also known in which after a pattern forming layer is formed on a substrate, a mask having a predetermined shape is provided with a resist having sandblast resistance, and the exposed portion is removed by sandblasting.

【0003】[0003]

【発明が解決しようとする課題】従来の技術で述べた方
法は、いずれも基板上にパターン形成層を形成し、マス
クを介してその不要部分を除去するようになっている
が、そのマスクがエッチング液で剥離したり、サンドブ
ラスト加工で剥がれてしまい、その結果、良好なパター
ニングができないということがあった。
In any of the methods described in the prior art, a pattern forming layer is formed on a substrate, and unnecessary portions thereof are removed through a mask. In some cases, they are peeled off by an etching solution or peeled off by sandblasting, and as a result, good patterning cannot be performed.

【0004】本発明は、上記のような問題点に鑑みてな
されたものであり、その目的とするところは、パターン
形成層の上に設けたマスクを介して不要部分を除去する
に際して、そのマスクが剥がれないようにし、良好な形
状でのパターニングを可能にした厚膜パターン形成方法
を提供することにある。
The present invention has been made in view of the above problems, and has as its object to remove an unnecessary portion through a mask provided on a pattern forming layer. It is an object of the present invention to provide a method for forming a thick film pattern which can prevent pattern from being peeled off and enables patterning in a good shape.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するた
め、本発明に係る厚膜パターン形成方法は、少なくとも
次の各工程を含むことを特徴とする。 (1)無機粉体と樹脂バインダーを主成分とし、前記樹
脂バインダーの少なくとも一部が感光性樹脂である材料
ペーストからなるパターン形成層を形成する第1工程。 (2)前記パターン形成層上に、当該パターン形成層よ
りも感光性樹脂量の割合の多い材料ペーストを用いてマ
スク層を形成する第2工程。 (3)所望パターンのマスクを介して前記マスク層の上
からパターン露光する第3工程。 (4)現像により少なくとも前記マスク層の未露光部分
を除去する第4工程。 (5)マスク層の残った部分をマスクとして、エッチン
グ加工若しくはサンドブラスト加工により、パターン形
成層の不要部分を除去する第5工程。 (6)前記パターン形成層の残った部分とマスク層の残
った部分とを焼成しパターンとして基板に密着させる第
6工程。
In order to achieve the above object, a method of forming a thick film pattern according to the present invention is characterized by including at least the following steps. (1) A first step of forming a pattern forming layer composed of a material paste containing an inorganic powder and a resin binder as main components and at least a part of the resin binder being a photosensitive resin. (2) A second step of forming a mask layer on the pattern forming layer using a material paste having a higher proportion of the photosensitive resin than the pattern forming layer. (3) A third step of performing pattern exposure from above the mask layer through a mask having a desired pattern. (4) A fourth step of removing at least an unexposed portion of the mask layer by development. (5) A fifth step of removing unnecessary portions of the pattern formation layer by etching or sandblasting using the remaining portion of the mask layer as a mask. (6) A sixth step in which the remaining portion of the pattern forming layer and the remaining portion of the mask layer are baked and brought into close contact with the substrate as a pattern.

【0006】上記の厚膜パターン形成方法では、感光性
樹脂を含有する材料ペーストでマスク層を形成し、その
下のパターン形成層の材料ペーストにも感光性樹脂を少
し含有させておくことにより、パターン露光時に露光部
分ではマスク層とパターン形成層との密着力が高まり、
エッチング液等に浸けても剥離しにくくなる。また、サ
ンドブラスト加工時にも剥離しにくくなる。
In the above thick film pattern forming method, a mask layer is formed with a material paste containing a photosensitive resin, and a small amount of the photosensitive resin is also contained in a material paste of a pattern forming layer thereunder. At the time of pattern exposure, the adhesive strength between the mask layer and the pattern forming layer increases in the exposed portion,
Even when immersed in an etchant or the like, peeling is difficult. Also, it is difficult to peel off during sandblasting.

【0007】[0007]

【発明の実施の形態】図1は本発明に係る厚膜パターン
形成方法の工程図であり、以下この図を参照しながらそ
の手順を説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a process chart of a method of forming a thick film pattern according to the present invention. The procedure will be described below with reference to this drawing.

【0008】まず、図1(a)に示すように、ガラス基
板11上にパターン形成層12を形成し、さらにその上
にマスク層13を形成する。パターン形成層12は、感
光性樹脂量の割合の少ない材料ペーストを用い、これを
塗布して乾燥させることで形成できる。塗布方法として
は、ブレードコート法、ダイコート法等がある。また、
予めフィルムに形成した材料ペーストをガラス基板11
に圧着転写して形成することもできる。マスク層13
は、感光性樹脂量の割合の多い材料ペーストを塗布して
乾燥させることで形成する。このマスク層13の塗布方
法はも同様の方法が用いられる。
First, as shown in FIG. 1A, a pattern forming layer 12 is formed on a glass substrate 11, and a mask layer 13 is further formed thereon. The pattern forming layer 12 can be formed by using a material paste having a small proportion of the photosensitive resin, applying the material paste, and drying the paste. Examples of the coating method include a blade coating method and a die coating method. Also,
The material paste previously formed on the film is applied to the glass substrate 11.
It can also be formed by press-transfer. Mask layer 13
Is formed by applying and drying a material paste having a high proportion of the photosensitive resin. The same method is used for applying the mask layer 13.

【0009】次に、図1(b)に示すように、所望パタ
ーンのマスクMを介してマスク層13の上からパターン
露光する。この時、露光部分ではマスク層13が固まる
とともにパターン形成層12の上部も固化して密着力が
高まる。次いで、図1(c)に示すように、現像により
マスク層13の未露光部分を除去する。この場合、その
下のパターン形成層13も凹状に除去される。
Next, as shown in FIG. 1B, pattern exposure is performed from above the mask layer 13 through a mask M having a desired pattern. At this time, in the exposed portion, the mask layer 13 is solidified, and the upper portion of the pattern forming layer 12 is also solidified, so that the adhesion is increased. Next, as shown in FIG. 1C, the unexposed portions of the mask layer 13 are removed by development. In this case, the underlying pattern forming layer 13 is also removed in a concave shape.

【0010】続いて、図1(d)に示すように、マスク
層13の残った部分をマスクとしてエッチング加工を行
い、パターン形成層12の不要部分を除去する。エッチ
ングはエッチング液に研磨材を分散させた混合液をスプ
レーすると、化学的にも物理的にもエッチングされるの
で効果が大きくなる。エッチングの代わりにサンドブラ
スト加工によりパターン形成層12の不要部分を除去す
るようにしてもよい。何れの場合も、加工中にマスク層
13が剥離することがない。そして、焼成工程を経て、
パターン形成層12の残った部分とマスク層13の残っ
た部分とを図1(e)に示すように一体化させるととも
にガラス基板11に密着させて厚膜パターン14を得
る。
Subsequently, as shown in FIG. 1D, an etching process is performed using the remaining portion of the mask layer 13 as a mask to remove unnecessary portions of the pattern forming layer 12. When the etching is performed by spraying a mixed solution in which an abrasive is dispersed in an etching solution, the etching is chemically and physically performed, so that the effect is enhanced. Unnecessary portions of the pattern forming layer 12 may be removed by sandblasting instead of etching. In any case, the mask layer 13 does not peel off during processing. And, through the firing process,
The remaining portion of the pattern forming layer 12 and the remaining portion of the mask layer 13 are integrated as shown in FIG. 1 (e) and adhered to the glass substrate 11 to obtain a thick film pattern 14.

【0011】[0011]

【発明の効果】以上説明したように、本発明によれば、
感光性樹脂を含有する材料ペーストでマスク層を形成
し、パターン形成層にも感光性樹脂を少し含有させてお
くようにしたので、露光時に露光部分でマスク層とパタ
ーン形成層との密着力が高まり、続くエッチング加工時
やサンドブラスト加工時にマスク層が剥離することがな
いことから、良好な形状の厚膜パターンを形成できる。
As described above, according to the present invention,
Since the mask layer is formed from a material paste containing a photosensitive resin and the pattern forming layer is also made to contain a small amount of the photosensitive resin, the adhesive strength between the mask layer and the pattern forming layer at the exposed portion during exposure is reduced. Since the mask layer does not peel off during the subsequent etching or sandblasting, a thick film pattern having a good shape can be formed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る厚膜パターン形成方法の工程図で
ある。
FIG. 1 is a process chart of a thick film pattern forming method according to the present invention.

【符号の説明】[Explanation of symbols]

11 ガラス基板 12 パターン形成層 13 マスク層 14 パターン 11 Glass substrate 12 Pattern forming layer 13 Mask layer 14 Pattern

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 少なくとも次の各工程を含むことを特徴
とする厚膜パターン形成方法。 (1)無機粉体と樹脂バインダーを主成分とし、前記樹
脂バインダーの少なくとも一部が感光性樹脂である材料
ペーストからなるパターン形成層を形成する第1工程。 (2)前記パターン形成層上に、当該パターン形成層よ
りも感光性樹脂量の割合の多い材料ペーストを用いてマ
スク層を形成する第2工程。 (3)所望パターンのマスクを介して前記マスク層の上
からパターン露光する第3工程。 (4)現像により少なくとも前記マスク層の未露光部分
を除去する第4工程。 (5)マスク層の残った部分をマスクとして、エッチン
グ加工若しくはサンドブラスト加工により、パターン形
成層の不要部分を除去する第5工程。 (6)前記パターン形成層の残った部分とマスク層の残
った部分とを焼成しパターンとして基板に密着させる第
6工程。
1. A method for forming a thick film pattern, comprising at least the following steps: (1) A first step of forming a pattern forming layer composed of a material paste containing an inorganic powder and a resin binder as main components and at least a part of the resin binder being a photosensitive resin. (2) A second step of forming a mask layer on the pattern forming layer using a material paste having a higher proportion of the photosensitive resin than the pattern forming layer. (3) A third step of performing pattern exposure from above the mask layer through a mask having a desired pattern. (4) A fourth step of removing at least an unexposed portion of the mask layer by development. (5) A fifth step of removing unnecessary portions of the pattern formation layer by etching or sandblasting using the remaining portion of the mask layer as a mask. (6) A sixth step in which the remaining portion of the pattern forming layer and the remaining portion of the mask layer are baked and brought into close contact with the substrate as a pattern.
JP27676496A 1996-10-21 1996-10-21 Formation of thick film pattern Pending JPH10118563A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27676496A JPH10118563A (en) 1996-10-21 1996-10-21 Formation of thick film pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27676496A JPH10118563A (en) 1996-10-21 1996-10-21 Formation of thick film pattern

Publications (1)

Publication Number Publication Date
JPH10118563A true JPH10118563A (en) 1998-05-12

Family

ID=17574037

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27676496A Pending JPH10118563A (en) 1996-10-21 1996-10-21 Formation of thick film pattern

Country Status (1)

Country Link
JP (1) JPH10118563A (en)

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