JPH0962528A - Self-recovering device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To enable self-recovery after forwarding functional equipment, namely, during service or during operating, to reduce the frequency of repair/exchange of functional equipment and to facilitate maintenance. SOLUTION: A functional circuit part 11 is defined by a program and functioned as a required circuit. A fault detection part 12 detects a fault and discriminates the fault area. An internal memory 14 stores plural pieces of layout pattern definition information for defining the functions for providing the function of the functional circuit part 11. Based on the discriminated result of the fault area from the fault detection part 12, a definition processing part 13 selects the layout pattern definition information not including the divided area, where the fault is generated, out of the layout pattern definition information stored in the internal memory 14 and defines the functional circuit part 11 again according to that layout pattern definition information.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a functional device constituting a system requiring high reliability such as a communication network system and an information processing system,
The present invention relates to a self-repair device that achieves high reliability by self-repairing hardware.

[0002]

2. Description of the Related Art Conventionally, in order to ensure the reliability of the hardware itself, various functional devices that make up a system that requires high reliability such as a communication network system and an information processing system have a redundant configuration. I was trying to deal with the obstacle by adopting it. That is,
Multiple functional systems, such as functional parts and package devices, are installed in parallel, one of them is used, and the other system is used as a backup in the event of a failure. When the occurrence occurs, the system is switched to the backup system and the backup system substitutes the function.

[0003] However, since the functional part or the package device which has been damaged cannot essentially self-recover, when the backup system is used, the damaged system cannot be used as the backup system. . Therefore, if only one backup system is originally prepared, a non-redundant operation state without a backup system will occur when a failure occurs. Further, even when there are a plurality of backup systems, the backup system will be reduced each time a failure occurs. Prompt repair was required to avoid such a situation.

Conventionally, as a proposal of a self-repairable circuit device, there is, for example, "self-repairable logic LSI" disclosed in Japanese Patent Laid-Open No. 5-267607. The technology disclosed in this publication is originally intended to improve the yield at the time of manufacturing an LSI (large-scale integrated circuit), and only copes with the failure of the combinational logic in the LSI found in the test before shipment. It is a limited function that can be performed. That is,
When the failure of the combinational logic in the logic circuit block is detected, the corresponding logic is stored in the memory, and the logic value is output based on the stored content of the memory. With the technique disclosed in this publication, it is not possible to self-repair the function of the device after shipping, that is, in service or in operation.

[0005]

As described above, a plurality of functional devices, for example, functional components and package devices, are provided in parallel, one of them is used, and the other is used for backup in the event of a failure. Even if it is used as, the affected functional component, the package device, or the like cannot essentially self-recover, so that the once affected system cannot be used as a backup system again. Therefore, the backup system is reduced each time a failure occurs.

Further, as disclosed in, for example, Japanese Unexamined Patent Publication No. 5-267607, when a failure of a combinational logic in a logic circuit block is detected, the corresponding logic is stored in a memory, and the logic is stored in the memory. With the technique of outputting a logical value based on the stored contents of the above, it is not possible to self-repair the function of the device after shipment, that is, during service or operation.

The present invention has been made to solve such a problem, and enables self-repair after shipment of functional devices such as functional parts and package devices, that is, during service or operation. It is an object of the present invention to provide a self-repair device that can reduce the frequency of repair / replacement of functional devices and facilitate maintenance.

[0008]

A first self-repairing device according to the present invention comprises a functional device having a set of functional constituent elements, the function of which can be programmed and defined after mounting. Of the plurality of divided areas obtained by dividing the physical layout area of the functional component in the functional device in advance, the function of the functional device is realized by using a predetermined number of divided areas less than all the divided areas. Layout pattern storage means for storing a plurality of obtained layout pattern definition information, and for detecting an obstacle area in the divided area forming a predefined layout pattern in the functional device in units of the divided area In response to the detection of a failure area by the failure detection means and the failure detection means, instead of the predefined layout pattern definition, a failure is detected. Choose a layout pattern definition information may avoid the detected the divided regions, it is characterized by comprising a restoration processing means for redefining the function of the functional device [Claim 1].

The layout pattern storage means may store a plurality of pieces of layout pattern definition information other than a predefined layout pattern definition [claim 2].

The layout pattern storage means may store a plurality of layout pattern definition information including a predefined layout pattern definition [claim 3].

The fault detecting means may be means defined as a part of the function of the functional device according to the layout pattern definition information [claim 4]. The fault detection means may include a fault table storage means for storing table information including layout pattern definition information, fault information, and information indicating a correspondence relationship between fault area information (claim 5).

The fault detecting means may include a test pattern storing means for storing test pattern information for detecting a fault area [claim 6]. The repair processing means may include pattern selection means for storing a layout pattern definition in which a failure has occurred and selecting layout pattern definition information to be redefined from layout pattern definition information other than the layout pattern definition. Claim 7].

The layout pattern storage means may be provided inside the functional device [claim 8]. The layout pattern storage means is an external storage device provided outside the functional device for storing a plurality of layout pattern definition information, and an interface means for exchanging information between the functional device and the external storage device. May be included [Claim 9].

The layout pattern storage means is provided outside the functional device, and stores a plurality of external storage devices for respectively storing a plurality of layout pattern definition information, and each of the functional device and the plurality of external storage devices. A plurality of interface means for independently exchanging information between them, and one of the plurality of interface means is selected to extract the layout pattern definition information from the corresponding external storage device and supply it to the repair processing means. Interface selecting means for detecting the failure of the plurality of external storage devices and the interface means, and controlling the interface selecting means so as to select the interface means having no failure. Item 10].

A second self-repairing device according to the present invention is a functional device equipped with an assembly of functional components, the function of which can be programmed and defined after mounting, and the functional configuration of the functional device. A plurality of layout pattern definition information capable of realizing the function of the functional device by using a predetermined number of divided areas smaller than the total number of divided areas among a plurality of divided areas obtained by dividing the physical layout area of the element in advance. Pattern storage means for storing a failure pattern, a failure detection means for detecting a failure area in the divided area forming a predefined layout pattern in the functional device in units of the divided area, and the failure detection In response to the detection of a fault area by means, instead of the predefined layout pattern definition, the fault detected A plurality of functional components with a restoration processing means for selecting a layout pattern definition information can avoid the split region, to redefine the function of the functional device,
Detecting that any of the plurality of functional components cannot be repaired even by the repair processing unit, copying the definition function information of the functional component to the other functional component, and making the repair impossible. A definition duplicating means for substituting the function of the functional component is provided [claim 11].

Further, a connection means for connecting each of the plurality of functional components to an external device, and the connection means is controlled in response to the definition duplication of the definition duplication means, and the outside of the plurality of functional components by the connection means. A connection switching means for switching the connection with the device may be provided [claim 12].

The self-repairing device according to the present invention is configured with a set of functional components, which can be programmed and defined after mounting, to form a functional device, and the functional component in the functional device. Of the plurality of divided areas obtained by dividing the physical layout area of the physical layout area in advance, a plurality of pieces of layout pattern definition information capable of realizing the function of the functional device are used by using a smaller number of divided areas than the total number of divided areas. In addition to storing the stored layout pattern, a failure area in the divided area forming a predefined layout pattern is detected in units of the divided area, and a failure is detected instead of the predefined layout pattern definition information. By selecting layout pattern definition information that can avoid the detected divided area and redefining the function of the functional device, the functional device Automatically repair the function. Therefore, after shipment of the functional device, that is, during service or operation, self-repair is possible, frequency of repair / replacement of the functional device is reduced, and maintenance is facilitated.

According to the self-repairing device of the present invention, it is possible to improve the overall reliability of a device such as a communication network system and an information processing system that requires continuous operation without interruption or a functional device that constitutes the system. You can

That is, conventionally, in this type of system, a redundant configuration is adopted by multiplexing such as duplication.
In that case, if any part is affected, MTTR
In order to minimize (mean time to repair), the functional device of the relevant part must be promptly replaced or repaired to restore the original redundant configuration to maintain the original reliability. I couldn't. On the other hand, by applying the self-repairing device of the present invention, each function device itself has a self-repairing function, and the component constituted by the function device or the function device itself has redundancy, so that it is manually operated. The frequency of maintenance and repair work can be significantly reduced. Therefore, if the self-repairing device of the present invention is applied to an apparatus or system that is deployed in an environment where manual maintenance cannot be easily performed, such as a seabed, underground or space, the reliability of those systems can be improved. it can.

[0020]

BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of a self-repairing device according to the present invention will be described below with reference to the drawings. [First Embodiment] FIG. 1 shows the configuration of a functional device to which a self-repairing device according to a first embodiment of the present invention is applied. FIG. 1 shows a case where an integrated circuit device is used as a functional device to which the self-repairing device according to the present invention is applied.

The integrated circuit device of FIG. 1 is, for example, an FPGA.
(Field programmable gate array: field prog
This is a programmable integrated circuit device called an arammable gate array), and this type of integrated circuit device can be defined by programming its function even after it is mounted on a circuit board or the like (hereinafter, this Such an integrated circuit device is simply referred to as "FPGA").

The FPGA 1 of FIG. 1 has a functional circuit section 11, a failure detection section 12, a definition processing section 13, and an internal memory 14.
Is provided. The functional circuit section 11 is a section that is defined by a program and functions as a required circuit. The functional circuit section 11 performs a predetermined process according to the program definition on an input from the outside, and outputs the processing result to the outside. The failure detection unit 12
When a failure occurs in the functional circuit section 11 and the functional circuit section does not operate normally, it is detected and F
Detect the faulty part in PGA1. The FPGA 1 is virtually divided into a plurality of areas in advance, and the failure detection unit 12
Detects a failure in units of the divided areas resulting from the division, and determines in which divided area the failure has occurred.

Fault information obtained from the functional circuit section 11,
Information on the correspondence with the faulty divided areas is stored in advance in the internal memory 14 as a fault information table.
When the fault detection unit 12 obtains the fault information from the functional circuit unit 11, the fault detection unit 12 refers to the fault information table in the internal memory 14 and determines the divided area in which the fault has occurred. Fault detection unit 12
Supplies the information indicating that a failure has occurred to the definition processing unit 13 together with the determination result of the failure area.

In addition to the fault information table, the internal memory 14 stores a plurality of layout pattern definition information in units of the divided areas which define the function for realizing the function of the functional circuit section 11. . In this case, the layout pattern definition, which is a definition program for achieving the required function, is configured by using the number of divided areas obtained by subtracting a predetermined number of 1 or more from the total number of divided areas. The current gate usage rate of various integrated circuits is approximately 50-80%.
Therefore, by setting one divided area to about 20% or less, it is possible to prevent the layout efficiency from being lowered when compared with the conventional single layout configuration.

That is, as the layout pattern definition information for achieving the required function, a plurality of layout pattern definition information different in the unused divided areas are prepared. Then, among the plurality of layout pattern definitions, at least one layout pattern definition information other than the layout pattern definition used for the first definition is stored in the internal memory 14. The layout pattern definition information used for the first definition does not necessarily have to be stored in the internal memory 14.

When the definition processing unit 13 receives the determination result of the failure area from the failure detection unit 12, based on the determination result, the layout pattern definition information stored in the internal memory 14 is used to determine the divided area in which the failure has occurred. The layout pattern definition information not including is selected, and the functional circuit unit 11 is redefined according to the layout pattern definition information.

At this time, the layout pattern definition newly defined by the definition processing unit 13 must be free from obstacles. Therefore, the definition processing unit 13 includes the functional circuit unit 1 based on the newly selected layout pattern definition information.
It is desirable to have a function to confirm that 1 does not cause a failure. Further, for example, it is clear that a layout pattern definition that has been defined in the past and has already failed will cause a failure even if it is selected again. Therefore, in order to select layout pattern definition information efficiently, The definition processing unit 13 needs to exclude the layout pattern definition information used in the past and select new layout pattern definition information. Therefore, when selecting the layout pattern definition information, the definition processing unit 13 stores the history information of the selection of the layout pattern definition information,
For example, it may be stored in the internal memory 14.

The storage of the history information can be realized by, for example, deleting the once selected layout pattern definition information from the internal memory after the definition process.
Furthermore, if the layout pattern definition information using the layout pattern including the divided area in which a failure has occurred in the past is excluded from the selection target in the same manner as described above, the selection of the layout pattern definition information can be performed more efficiently. it can.

Since the layout pattern definition information used for the first definition should not be used for redefinition, it is desirable to exclude it from the layout pattern definition information stored in the internal memory 14 in advance. .

In the configuration of FIG. 1, it is assumed that the functional circuit section 11 and the failure detection section 12 constitute the defined circuit section 15 and are achieved by the program definition based on the layout pattern definition information. The defined circuit portion 15 is composed of a programmable portion of the FPGA 1. Note that the definition processing unit 13 may be included in the defined circuit unit achieved by the program definition of the layout pattern definition information, as long as no inconvenience occurs in operation.

Details of the layout pattern definition information stored in the internal memory 14 of the FPGA 1 will be described with reference to FIG. For example, it is assumed that the defined circuit section 15 is divided into n divided areas and (n-1) divided areas are used to define the layout pattern. In this case, there may be n layout patterns. Division area # 1
The layout pattern that does not use (“#” means “number”) is defined by the layout pattern definition information D # 1, and the layout pattern that does not use the divided area # 2 is the layout pattern definition information D # 2. If the layout pattern that does not use the divided area #n is defined by the layout pattern definition information D # n in the same manner as described above, the n pieces of layout pattern definition information D # are stored in the internal memory 14. 1 to D # n are stored. That is, as shown in FIG. 2, the layout pattern definition information of the layout pattern P # 1 that does not use the divided area # 1 is stored in the internal memory 14 as the layout pattern definition information D # 1. As the information D # n, layout pattern definition information of the layout pattern P # n that does not use the divided area #n is stored.

Next, details of the failure information table stored in the internal memory 14 of the FPGA 1 will be described with reference to FIG. As shown in FIG. 3, the failure information table includes the defined circuit section 1 defined by the layout pattern definition information D # 1.
5, the failure area #i to the failure area #q correspond to the failure information 1 to the failure information x output from the failure detection unit 12 and the defined circuit section 15 defined by the layout pattern definition information D # 2. Failure information # 1 to failure information #r for failure information 1 to failure information y output from the failure detection unit 12 of FIG.
In the same manner, sequentially in the same manner, for the fault information 1 to the fault information z output from the fault detection unit 12 of the defined circuit unit 15 defined by the layout pattern definition information D # n, the fault region #k to the fault It shows the correspondence relationship that the areas #s correspond to each other. That is, according to this failure information table, for example, layout pattern definition information D # 1
While using the fault information from the fault detection unit 12
It is understood that the divided area #i is the failure area when the above is obtained, and the divided area #q is the failure area when the failure information x is obtained.

Further, when the failure detection unit 12 cannot obtain failure information with sufficient resolution for specifying the divided area in which the failure has occurred, the failure detection unit 12 is required to perform failure detection with high resolution. A high-resolution discrimination function, for example, a self-test function (referred to as “BIST: built-in self-test”) (hereinafter referred to as “BIST function”) may be incorporated in the failure detection unit 12. . For example, BI
The failure detection unit 1 uses a plurality of test patterns for the ST function.
2, the failure detection unit 12 temporarily defines the definition pattern of the functional circuit unit 11 with a plurality of different test patterns to obtain failure information of each, and based on the combination thereof, the failure region By discriminating between the two, it is possible to specify the obstacle region with high resolution.

Specifically, as shown in FIG. 4, for example, in the case of detecting a failure in the functional circuit section 11, a divided area C composed of all the constituent elements such as the gates constituting the functional circuit section 11 is formed.
1 to C9 are divided into three series C1-C2-C3 and C4-C5- by the first BIST pattern which is a test pattern.
C6 and C7-C8-C9 are divided and connected, and the normality of the output signal with respect to the input signal is confirmed for each series, and then a test pattern having an independent connection relation to the first BIST pattern is used. Three sequences C1-C4-C7, C2-C5-C8 according to a certain second BIST pattern
And C3-C6-C9 are divided and connected, and the normality of the output signal with respect to the input signal is confirmed for each series. Based on the confirmation results of both of these, the divided area in which the failure has occurred is specified. In FIG. 4, for example, a failure is detected in the C4-C5-C6 sequence in the first BIST pattern and the second BIS pattern is detected.
If a failure is detected in the C2-C5-C8 series in the T pattern, the divided area C5 that is the intersection of both series is identified as the failure area.

The BIST function described with reference to FIG. 4 is an example shown in a simplified manner for easy understanding, and in many cases, a more complicated method than that of FIG. 4 is used. As described above, the failure detection unit 12 causes the functional circuit unit 1 to
The fault is detected and the fault region is specified in 1 or the defined circuit unit 15 including the functional circuit unit and fault detection unit 12, and fault information is given to the definition processing unit 13. The definition processing unit 13 responds to the given fault information and responds to the fault area indicated by the fault information, and
1 of the layout pattern definition information that does not use the divided area corresponding to the failure area from the layout pattern definition information of
Choose one. Further, the definition processing unit 13 determines the functional circuit unit 11 based on the selected layout pattern definition information.
Alternatively, the defined circuit section 15 including the functional circuit section and the failure detection section 12 is redefined.

In this way, the FPGA 1 shown in FIG.
Even when a failure occurs in the function, the self-repairing function enables the same function as before, and the required function can be continuously achieved without being affected by the failure. of course,
Although some time is required for self-repair, during that period, external input / output of the functional circuit unit 11 may be stopped.

A layout pattern which does not use a plurality of divided areas may be used to achieve a desired function. In that case, layout pattern definition information and a failure information table corresponding to the layout pattern are prepared.

Incidentally, a part or all of the memory for storing the layout pattern definition information and the failure information table in the configuration of FIG. 1 may be provided outside the FPGA. That is, in the second embodiment of the present invention, the memory for storing the layout pattern definition information and the failure information table is provided outside the FPGA.

[Second Embodiment] A functional device to which a self-repairing device according to a second embodiment of the present invention is applied includes an FPGA 2 and an external memory 21, as shown in FIG. The FPGA 2 is provided with a functional circuit unit 11, a failure detection unit 12, and a definition processing unit 13 similar to those in FIG. 1, and the external memory 21 is provided outside the FPGA 2. In this case, the FPGA 2 is not provided with the internal memory 14 as shown in FIG. 1, but the layout pattern definition information and the failure information table are stored in the external memory 21.

The function and operation of each part of the self-repairing device shown in FIG. 5 will be specifically described. The functional circuit unit 11 that is defined by a program and functions as a required circuit performs predetermined processing according to the program definition on an input from the outside and outputs the processing result to the outside. When a failure occurs in the functional circuit section 11 and the functional circuit section does not operate normally, the failure detection section 12 detects it and also detects a failure point in the FPGA 2. The failure detection unit 12 is an FP that is virtually divided into a plurality of areas in advance.
A failure is detected by using each divided area of GA2 as a unit, and which divided area has a failure is determined.

When the fault detection unit 12 obtains the fault information from the functional circuit unit 11, the fault detection unit 12 refers to the fault information table stored in advance in the external memory 21 and showing the correspondence between the fault information and the fault area, and the fault occurs. The divided areas are discriminated, and information indicating that a failure has occurred is supplied to the definition processing unit 13 together with the discrimination result of the failed area.

As the layout pattern definition information for realizing the required function of the functional circuit section 11, a plurality of layout pattern definition information in which unused divided areas are different are prepared. Then, among the plurality of layout pattern definitions, at least one layout pattern definition information other than the layout pattern definition used for the first definition is stored in the external memory 21. In addition,
The layout pattern definition information used for the first definition does not necessarily have to be stored in the external memory 21.

When the definition processing unit 13 receives the determination result of the failure area from the failure detection unit 12, the layout pattern definition information that does not include the divided area in which the failure has occurred is generated from the layout pattern definition information based on the determination result. Is selected, and the functional circuit section 11 is redefined according to the layout pattern definition information.

At this time, the layout pattern definition newly defined by the definition processing unit 13 must be free from troubles, as in the case of FIG. Therefore,
It is desirable that the definition processing unit 13 has a function of confirming that the functional circuit unit 11 based on the newly selected layout pattern definition information does not cause a failure. Also, when selecting layout pattern definition information,
The history information of the selection of the layout pattern definition information is stored in, for example, the external memory 21, and the definition processing unit 13
The selection of layout pattern definition information can be performed more efficiently by excluding layout pattern definition information that uses a layout pattern including a divided area in which a failure has occurred in the past and selecting new layout pattern definition information. You can

In the case of FIG. 5 as well, as in the case of FIG.
The defined circuit section achieved by the program definition based on the layout pattern definition information in A2 constitutes the functional circuit section 11 and the failure detection section 12, or the functional circuit section 11, the failure detection section 12 and the definition processing section 13.

[Third Embodiment] As shown in FIG. 6, a functional device to which a self-repairing device according to a third embodiment of the present invention is applied includes an FPGA 3 and an external memory 25. The FPGA 3 has a definition processing unit 1 similar to that shown in FIG.
3, a selection circuit 26 and a check circuit 27 are provided in addition to the internal memory 14 and the defined circuit section 15.

In this case, the external memory 25 is, for example, the first memory.
And the second memory units 25A and 25B, each of which stores two identical sets of layout pattern definition information and failure information table. These first and second memory units 25A and 25B are independent first
And the second interfaces IF1 and IF2 are coupled to the selection circuit 26 in the FPGA 3. The selection circuit 26 includes first and second memory units 25A and 25A.
One of the contents of B is selected and downloaded to the internal memory 14. The check circuit 27 checks the selected output of the selection circuit 26 and switches the selection circuit 26 when an abnormality is detected in the output.

That is, the check circuit 26 includes the first memory unit 25A, the first interface IF1 and the second interface IF1.
Memory section 25B → one of the second interfaces IF2, that is, the side selected by the selection circuit 26 has no abnormality, and if an abnormality is detected, the selection circuit 26 is controlled. Then, the other path is selected and the layout pattern definition information and the failure information table are downloaded from the corresponding memory section to the internal memory 14.

In this case, the internal memory 14 stores at least the layout pattern definition information in use and the failure information table, the failure area is discriminated by the failure detection, and the redefinition is performed by the layout pattern definition information having no failure. When performing, the selection circuit 26 is selected from the external memory 25.
Appropriate layout pattern definition information is downloaded to the internal memory 14 via the. Therefore, the capacity of the internal memory 14 may be smaller than that in the case of FIG.

In the apparatus shown in FIG. 6, in order to improve the reliability of the layout pattern definition information and the failure information table data downloaded from the outside of the FPGA 3, an interface for transferring the memory section of the external memory 25 and its stored contents is provided. It is duplicated.

As shown in FIG. 6, a memory unit of the external memory 25 and an interface for transferring the stored contents are provided.
The redundant configuration can be applied to a configuration in which an internal memory is not provided as shown in FIG.

[Fourth Embodiment] FIG. 7 shows the configuration of a system to which a self-repairing device according to a fourth embodiment of the present invention is applied.
Shown in

The system shown in FIG. 7 includes a plurality of components, that is, # 1 component 41 to #n component 4n. Each component 41-4n
Has an in-component control section 51, a layout information memory 52 and a defined circuit section 53, which substantially correspond to the definition processing section 13, the internal memory 14 and the defined circuit section 15 shown in FIG. 1, respectively.

That is, the defined circuit section 15 is defined as a program and functions as a required circuit, performs a predetermined process according to the program definition on an input from the outside, and outputs the processing result to the outside. At the same time, the occurrence of a failure and the failure area are detected. The layout information memory 52 stores a plurality of pieces of layout pattern definition information each having a different unused area. Of course, the layout information memory 52 may also store a failure information table for determining a failure area and history information of layout pattern definition selection in the component.
When the in-component control unit 51 receives the information about the failure area from the defined circuit section 53, it selects layout pattern definition information that does not include the failure area from the layout pattern definition information, and selects the layout pattern definition information according to the layout pattern definition information. While redefining the definition circuit section 53,
If the failure in the component is irreparable, control is performed to substitute the function by another component as described later.

In each of the components 41 to 4n, the bus inside the component coupled to the in-component control unit 51 and the layout information memory 52 is
Dedicated interface for other components 41-4
n, and the in-component control unit 51 is
It is connected in the whole system by the control interface in the system.

In the system of FIG. 7, each component 4
The layout information memories 52 inside 1 to 4n are mutually connected by a dedicated interface, and the component 41
4n can refer to each layout information memory 52, and the components 41 to 4n are provided more than the number of components actually required in the system. That is, the components 41 to 4n are composed of the in-use component that is actually used in the system and the backup spare component that is not used.

In such a system, if any of the in-use components of the plurality of components 41 to 4n cannot be recovered by the same layout pattern redefinition processing as described in FIG.
Of the components 41 to 4n, use of the distressed in-use component is stopped, and the layout pattern definition information in the layout information memory 52 of the distressed component is used as the layout information of the other unused spare component. The data is copied to the memory 52 through the dedicated interface, and the spare pattern is defined by the layout pattern definition information to restore the system. In this case, control of processing such as discontinuation of use of the affected component, copying of layout pattern definition information of the affected component, and definition of layout pattern definition information is performed by the components 41 to 4n via the in-system control interface. In-component control unit 51
Is performed in cooperation with.

[Fifth Embodiment] FIG. 8 shows the configuration of a system to which a self-repairing device according to a fifth embodiment of the present invention is applied.
Shown in

The system shown in FIG. 8 includes a plurality of components, that is, # 1 component 41 to #n component 4n, as in the system of FIG. Each of the components 41 to 4n includes a definition processing unit 13, an internal memory 14, and a defined circuit unit 15 shown in FIG.
The component control unit 51, the layout information memory 52, and the defined circuit unit 53, which substantially correspond to Further, in FIG. 8, the # 1 component 41
~ #N Layout information memory 52 of component 4n
Is stored in the system memory 6 outside the component.
0 is stored in the corresponding # 1 memory areas 61 to #n memory areas 6n.

That is, the defined circuit section 15 is defined as a program and functions as a required circuit, performs predetermined processing according to the program definition on an input from the outside, and outputs the processing result to the outside. At the same time, the occurrence of a failure and the failure area are detected. The layout information memory 52 stores a plurality of pieces of layout pattern definition information each having a different unused area. Of course, the layout information memory 52 may also store a failure information table for determining a failure area and history information of layout pattern definition selection in the component.
When the in-component control unit 51 receives the information about the failure area from the defined circuit section 53, it selects layout pattern definition information that does not include the failure area from the layout pattern definition information, and selects the layout pattern definition information according to the layout pattern definition information. While redefining the definition circuit section 53,
If the failure in the component is irreparable, control is performed to substitute the function by another component as described later.

In each of the components 41 to 4n, the in-component control section 51 is connected to the entire system by the in-system control interface. Further, the system memory 60 having the memory areas 61 to 6n
Is connected to the in-component control unit 51 of each of the components 41 to 4n by the in-system control interface. In the system of FIG. 8, the contents stored in the layout information memory 52 inside the components 41 to 4n are backed up in the memory areas 61 to 6n of the system memory 60, and all the components 41 to 4n are backed up.
Allows the contents of each layout information memory 52 to be referred to. Further, the components 41 to 4n are provided in a number larger than the number of components actually required in the system. That is, the components 41 to 4n are composed of the in-use component that is actually used in the system and the backup spare component that is not used.

In such a system, when one of the plurality of components 41 to 4n, which is in use, cannot be recovered by the same layout pattern redefinition processing as described with reference to FIG.
The discontinued in-use component of the components 41 to 4n is discontinued and the layout pattern definition information in the layout information memory 52 of the distressed component is stored in the system memory 60 as another unused spare. The component is copied to the layout information memory 52, and the spare component is defined by the layout pattern definition information to restore the system. In this case, the use of the affected component is stopped, the layout pattern definition information of the affected component is copied, and the layout pattern definition information is defined.
It will be done in cooperation with.

[Sixth Embodiment] FIG. 9 shows the configuration of a system to which a self-repairing device according to a sixth embodiment of the present invention is applied.
Shown in

The system shown in FIG. 9 has a plurality of components similar to the system of FIG. 7 or FIG.
In addition to the components 41 to #n component 4n, a system control unit 71 and a changeover switch 72 are provided. The components 41 to 4n copy the layout definition information by a method similar to that of FIG. 7 or FIG. 8 to substitute the function of a faulty component in which a fault occurs in another spare component when a fault occurs in a certain component in use. You can

When a fault occurs in the component, the system control unit 71 transfers the layout definition information in the faulty component to another spare component, uses the layout definition information to define the spare component, and the interface in the system. A switching instruction signal SX for instructing switching of components is output via the.

The changeover switch 72 is the component 4
At least one of 1 to 4n being used is coupled to an external device (not shown) via the external device interface, and in response to a switching instruction signal SX given via the in-system interface, the external device The connection path of the interface to the external device is switched from the faulty component to the spare component defined by the corresponding layout definition information.

Specifically, in FIG. 9, for example, #k
When a failure occurs in the component 4k, the system control unit 71 uses the layout definition information stored in the layout information memory (52) of the #k component 4k as the layout information memory (5) of the component 4k.
2) or from system memory (60), a spare component #n component 4n not in use
And the #n component 4n is defined by the layout definition information. Further, the system control unit 7
The reference numeral 1 supplies the changeover instruction signal SX to the changeover switch 72 to change over the changeover switch 72, and the connection path which has been connected to the external device via the external device interface from the component 4k until the component 4n is connected to the external device interface. Through an external device.

In this way, when the components 41 to 4n have a failure, the connection switch of the device when the definition content of the failed component is copied to another component is automatically switched by the changeover switch. No need for work such as changes.

[Seventh Embodiment] FIG. 10 shows a flowchart of the operation of a system to which a self-repairing device according to a seventh embodiment of the present invention is applied.

The flowchart shown in FIG. 10 is a high-resolution discrimination for discriminating a fault region with a high resolution, such as a self-test for detecting a fault region with the high resolution described in connection with FIG. 4, in a system similar to FIG. The operation when the function is installed is explained. In this case, the number of failure areas is a predetermined number T
In the following cases, it is assumed that the failure area can be identified by the normal failure detection operation of the failure detection unit 12, and when the number of failure areas exceeds the predetermined number T, the failure area is specified by the high resolution discrimination function. Be able to.

That is, the routine of FIG. 10 is started each time a fault is detected, and the fault region is detected by the normal fault detection operation of the fault detection unit 12 (step S11). At this time, the number of detected failure regions is a predetermined number T
It is determined whether or not it is below (step S12), and if the number of failure regions is not T or less, the failure region cannot be specified. Therefore, the high resolution discrimination function built in the failure detection unit 12 in advance is operated. The faulty area is specified (step S13). In step S12, when the number of failure areas is T or less, the failure area can be immediately specified.

When the failure area is specified, the internal memory 14
Appropriate layout pattern definition information is selected from the layout pattern definition information stored in (step S1).
4). At this time, the layout pattern is selected from the layout pattern definition information that does not use the corresponding failure area based on the information of the specified failure area. In order to efficiently select the layout pattern definition, in step S14, the layout pattern definition once selected and the layout pattern definition excluded at the time of selection (that is, the layout pattern definition that uses the obstacle area) are selected as the subsequent selection targets. The history information to be excluded from the error detection unit 12 or the internal memory 14 is stored.

When the layout pattern definition information is selected in step S14, the definition processing section 13 redefines the layout pattern definition using the selected layout pattern definition information (step S15). Definition processing unit 1
When the redefinition is carried out, 3 verifies whether the circuit formed by the redefinition operates normally (step S1).
6) If it is normal, the redefinition process is completed. Step S
When it is determined in 16 that the redefinition circuit is not normal, the process returns to step S14, and the layout pattern definition is reselected from other layout pattern definitions.

By performing such processing,
It is possible to build a system that can very efficiently self-repair against the occurrence of a failure. [Embodiment 8] FIG. 11 shows the configuration of a system to which a self-repairing device according to an eighth embodiment of the present invention is applied.

The system shown in FIG. 11 has substantially the same configuration as that of FIG. 9, and has a plurality of components, that is, #
In addition to 1 component 41 to #n component 4n, a system control unit 81, an external memory 82, a control link coupling unit 83, and a cross connect switch 84 are provided.

The components 41 to 4n copy the layout definition information in the same manner as in FIG. 8 to substitute the function of the faulty component in which the fault occurs by another spare component when a fault occurs in a certain component in use. You can

The external memory 82, as shown in FIG.
The backup information of the layout pattern definition information of each of the components 41 to 4n is stored. The system control unit 81 and the external memory 82 include a control link coupling unit 83.
Are connected to the control link coupling section 83, and the components 41 to 4n and the cross-connect switch 8 are connected to the control link coupling section 83.
4 are connected. The components 41 to 4n are connected to the # 1 external device to the #m via the cross-connect switch 84.
Selectively coupled to an external device.

The control link coupling unit 83 is a coupling system such as a bus system or a LAN (local area network) system. In this case, for example, serial packet information switching is used to transfer data between the systems. It is configured. The control link coupling unit 83 is configured so as to avoid a multi-connection configuration in which a bus failure of a part of the components 41 to 4n spreads to the entire system.

The # 1 external device to #m external device and the components 41 to 4n can be flexibly set by the cross-connect switch 84 so that they can be connected to each other. By copying the layout pattern definition information from, the function of the component is substituted by another component to restore the system.

When a fault occurs in the component, the system control unit 81 refers to the backup information of the layout pattern definition information of the corner component stored in the external memory 82 based on the fault area information in the fault component, and the fault If there is a layout pattern definition for another component that can be defined only by the combination of areas that do not have any failures without using an area, use the backup information to exchange the layout pattern definition between the components and restore the system. I will let you.

In this way, various obstacles are
It becomes possible to recover the system by handling it more flexibly. [Ninth Embodiment] FIG. 13 shows the configuration of a component to which a self-repairing device according to a ninth embodiment of the present invention is applied.

FIG. 13 shows a configuration of components that can be used as each of the components 41 to 4n in the system shown in FIG. 11, for example. The component 90 shown in FIG. 13 includes three devices 91, 92 and 93, a component control circuit 94, a program memory 95, a layout information memory 96, and an interface circuit 97.

The three devices 91, 92 and 93 are
# 1 device 91, # 2 device 92 and #
3 devices 93, which are configured by FPGA, for example. BI of these # 1 device 91 to # 3 device 93
The pattern information for ST (a kind of layout pattern definition information) and the layout pattern definition information are shown in FIG.
Layout information memory 96 in the format shown in
Stored in. The BIST pattern information is, for example, the first BIST information BIST-1 and the second BIST information BI for each of the # 1 device 91 to the # 3 device 93.
It consists of two types of information, ST-2. Layout information memory 9
6, the layout pattern definition information is the layout pattern definition information D # 1-1 to D # 1-u of the # 1 device 91,
# 2 Layout pattern definition information of device 92 D # 2-1
To D # 1-v and layout pattern definition information D # 3-1 to D # 3-w of the # 3 device 93 are stored.

Since the # 3 device 93 is coupled to the external device interface, different layout pattern definition information is stored in the layout information memory 96 for each external device in order to correspond to a plurality of types of external devices. . For example, as shown in FIG. 14, layout pattern definition information D # 3a-1 to D # 3a-w corresponding to the external device A and layout pattern definition information D # 3b-1 to D # 3b-1 to the external device B.
D # 3b-w is stored in the layout information memory 96.

The component control circuit 94 operates by executing the program stored in the program memory 95. When a fault occurs, the component control circuit 94 uses the information stored in the layout information memory 96 to discriminate the fault region and to perform the fault. The failure recovery is performed by redefining the layout pattern definition for each of the devices 91 to 93 in which the error occurred.

Interface circuit 97 couples component 90 to the control interface. That is, the component 90 is coupled to other components via the interface circuit 97 and the control interface.

If the device is divided into a plurality of parts for the purpose of defining the layout pattern for recovering from the illness and the number of divisions is too large, the amount of layout pattern definition information to be stored in the memory will be enormous. However, since the usage rate of each pattern decreases and most of the patterns are not used, the number of divisions n and the number of simultaneous failures i are both within several (however, n> i). With this, it is possible to set a layout pattern definition that enables efficient restoration.

In the above description, the configuration using the FPGA capable of achieving various functions mainly by the download definition of the layout pattern definition information has been described, but the idea of self-repair according to the present invention is the electronic circuit device such as FPGA. However, the present invention is not limited to this, and can be applied to, for example, a system configured by a plurality of micromachines, or a device and a system including a combination of other mechanical components as long as a program can be defined.

[0089]

As described above, according to the present invention,
Functions can be programmed and defined after implementation,
A functional device is configured by mounting a group of functional constituent elements, and a physical layout area of the functional constituent elements in the functional device is divided into a plurality of divided areas in advance, and the number of divided areas is less than a predetermined number. A plurality of layout pattern definition information capable of realizing the function of the functional device is stored by using a number of divided areas, and the failure area in the divided areas forming a predefined layout pattern is divided into the divided areas. The area pattern is detected as a unit, and instead of the layout pattern definition information defined in advance, layout pattern definition information that can avoid the divided area in which a failure is detected is selected, and the function of the functional device is redefined. By doing so, the function of the functional device is automatically restored. Therefore, after shipment of the functional device such as a functional component and a package device, That in or in operation in service, to allow the self-healing, and reduce the frequency of repair or replacement of the functional units, the maintenance it is possible to provide a self-healing system that can facilitate.

By applying the present invention, it is possible to improve the overall reliability of a device such as a communication network system and an information processing system that requires continuous uninterrupted operation or a functional device that constitutes the system.

[Brief description of drawings]

FIG. 1 is a block diagram showing a configuration of a functional device to which a self-repairing device according to a first embodiment of the present invention is applied.

FIG. 2 is a schematic diagram for explaining layout pattern information related to the apparatus of FIG.

3 is a diagram for schematically explaining the configuration of a failure information table according to the device of FIG.

4 is a schematic diagram for explaining a high resolution fault discrimination function according to the apparatus of FIG. 1. FIG.

FIG. 5 is a block diagram showing a configuration of a functional device to which a self-repairing device according to a second embodiment of the present invention is applied.

FIG. 6 is a block diagram showing a configuration of a functional device to which a self-repairing device according to a third embodiment of the present invention is applied.

FIG. 7 is a block diagram showing a configuration of a system to which a self-repairing device according to a fourth embodiment of the present invention is applied.

FIG. 8 is a block diagram showing a configuration of a system to which a self-repairing device according to a fifth embodiment of the present invention is applied.

FIG. 9 is a block diagram showing a configuration of a system to which a self-repairing device according to a sixth embodiment of the present invention is applied.

FIG. 10 is a flowchart showing the operation of the system to which the self-repairing device according to the seventh embodiment of the present invention is applied.

FIG. 11 is a block diagram showing a configuration of a system to which a self-repairing device according to an eighth embodiment of the present invention is applied.

12 is a schematic diagram for explaining the content of backup information stored in an external memory according to the system of FIG.

FIG. 13 is a block diagram showing a configuration of a component to which a self-repairing device according to a ninth embodiment of the present invention is applied.

14 is a schematic diagram for explaining the content of information stored in the layout information memory according to the system of FIG.

[Explanation of symbols]

 1, 2, 3 ... FPGA (functional device) 11 ... Functional circuit unit 12 ... Fault detection unit 13 ... Definition processing unit 14 ... Internal memory 15, 53 ... Defined circuit unit 21, 25, 82 ... External memory 25A, 25B ... Memory unit 26 ... Selection circuit 27 ... Check circuit 41-4n, 90 ... Component 51 ... In-component control unit 52 ... Layout information memory 60 ... System memory 61-6n ... Memory area 71, 81 ... System control unit 72 ... Changeover switch 83 Control link coupling unit 84 Cross connect switches 91 to 93 Device 94 Component control circuit 95 Program memory 96 Layout information memory 97 Interface circuit

Claims (12)

[Claims] 1. A functional device having an aggregate of functional components, which can be programmed and defined after implementation, and a physical layout area of the functional components in the functional device. A layout pattern storage unit for storing a plurality of layout pattern definition information capable of realizing the function of the functional device by using a predetermined number of divided areas smaller than the total number of divided areas among the divided areas. And a failure detection unit for detecting a failure area in the divided area forming a predefined layout pattern in the functional device in units of the divided area, and a response to detection of the failure area by the failure detection unit However, instead of the previously defined layout pattern definition,
A self-healing device comprising: a repair processing unit that selects layout pattern definition information that can avoid the divided area in which a failure is detected, and redefines the function of the functional device. 2. The self-healing device according to claim 1, wherein the layout pattern storage means stores a plurality of pieces of layout pattern definition information other than the predefined layout pattern definition. 3. The self-healing device according to claim 1, wherein the layout pattern storage means stores a plurality of pieces of layout pattern definition information including a predefined layout pattern definition. 4. The fault detection means is a means defined as a part of the function of the functional device according to the layout pattern definition information.
The self-repairing device according to paragraph. 5. The fault detection means has a fault table storage means for storing table information including layout pattern definition information, fault information, and information indicating a correspondence relationship between fault area information. 5. The self-repairing device according to any one of 4 to 4. 6. The self-repairing device according to claim 1, wherein the failure detection means includes test pattern storage means for storing test pattern information for detecting a failure area. . 7. The repair processing means includes pattern selection means for storing a layout pattern definition in which a failure has occurred and selecting layout pattern definition information to be redefined from layout pattern definition information other than the layout pattern definition. The self-repairing device according to any one of claims 1 to 6, characterized in that: 8. The self-healing device according to claim 1, wherein the layout pattern storage means is provided inside the functional device. 9. The layout pattern storage means is provided outside the functional device to store a plurality of layout pattern definition information, and exchanges information between the functional device and the external storage device. The self-repairing device according to any one of claims 1 to 3, further comprising an interface unit for performing the following. 10. The layout pattern storage means is provided outside the functional device to store a plurality of layout pattern definition information, and each of the functional device and the plurality of external storage devices. A plurality of interface means for independently exchanging information with each other, and one of the plurality of interface means is selected to extract layout pattern definition information from the corresponding external storage device, and the layout processing definition information is transferred to the repair processing means. The present invention is characterized by including interface selection means to be supplied and interface failure detection means for detecting a failure in the plurality of external storage devices and interface means and controlling the interface selection means to select an interface means having no failure. The self-repairing device according to claim 1. 11. A functional device having a set of functional components, which can be programmed and defined after implementation, and a physical layout area of the functional components in the functional device is divided in advance. A layout pattern storage unit for storing a plurality of layout pattern definition information capable of realizing the function of the functional device by using a predetermined number of divided areas smaller than the total number of divided areas among the plurality of divided areas; Responsive to detection of a failure area by the failure detection means, and failure detection means for detecting a failure area in the divided area that constitutes a predefined layout pattern in the functional device in units of the divided area, Instead of the previously defined layout pattern definition, a layout pattern that can avoid the divided area in which a failure is detected. A plurality of functional components having repair processing means for selecting turn definition information and redefining the function of the functional device; and detecting that any of the plurality of functional components cannot be repaired by the repair processing means. And self-healing, which comprises: definition copying means for copying the defined function information of the functional component to the other functional component to substitute the function of the functional component that cannot be repaired. apparatus. 12. A connection means for connecting each of a plurality of functional components to an external device, and the connection means is controlled in response to the definition duplication of the definition duplication means, and the outside of the plurality of functional components by the connection means. The self-repairing device according to claim 11, further comprising connection switching means for switching connection with the device.