JPH09500204A - 測定増幅器 - Google Patents
測定増幅器Info
- Publication number
- JPH09500204A JPH09500204A JP7502372A JP50237295A JPH09500204A JP H09500204 A JPH09500204 A JP H09500204A JP 7502372 A JP7502372 A JP 7502372A JP 50237295 A JP50237295 A JP 50237295A JP H09500204 A JPH09500204 A JP H09500204A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- integrator
- output
- amplifier
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 18
- 239000003990 capacitor Substances 0.000 claims description 16
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 230000010354 integration Effects 0.000 claims description 2
- 238000011156 evaluation Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/70—Charge amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/252—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques using analogue/digital converters of the type with conversion of voltage or current into frequency and measuring of this frequency
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06G—ANALOGUE COMPUTERS
- G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
- G06G7/12—Arrangements for performing computing operations, e.g. operational amplifiers
- G06G7/18—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals
- G06G7/184—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements
- G06G7/186—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop
- G06G7/1865—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals using capacitive elements using an operational amplifier comprising a capacitor or a resistor in the feedback loop with initial condition setting
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/30—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters
- H03F1/303—Modifications of amplifiers to reduce influence of variations of temperature or supply voltage or other physical parameters using a switching device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Software Systems (AREA)
- Computer Hardware Design (AREA)
- Measurement Of Current Or Voltage (AREA)
- Amplifiers (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.測定増幅器であって、該測定増幅器は、 少なくとも1つのコンデンサ(C1)を有する積分器(2)から構成されてい る電荷バランス増幅器を備え、 基準電流源(33)を備え、該基準電流源は、積分器(2)の出力側(9)に 現れる電圧(Ua)が基準電圧(Uref)を上回った時/下回った時に、基準 電流(Iref)を所定の時間(T)の間、積分器(2)の入力側(11)へ供 給する形式の、測定増幅器において、 積分器(2)の出力側に現れる電圧(Ua)が加えられ、この電圧の時間変化 に比例する出力量を供給する回路が設けられていることを特徴とする、測定増幅 器。 2.差動装置(4)に積分器(2)の出力側に現れる電圧が加えられ、積分器 (2)の出力側における電圧(Ua)の変化がこれに比例する電圧に変換される 、請求項1記載の測定増幅器。 3.電圧(Ua)の時間変化が、積分器(2)の出力側における電圧の少なく とも2回の時間順序での測定により検出される、請求項1記載の測定増幅器。 4.差動装置の出力電圧および/または積分器(2)の出力側における電圧( Ua)の入力されるアナロ グ/デイジタル変換器および/またはアナログ/周波数変換器が設けられている 、請求項1から3までのいずれか1項記載の測定増幅器。 5.積分器が演算増幅器(1)から構成されており、該演算増幅器(1)は、 反転入力側(7)と出力側(9)との間の少なくとも1つの負帰還結合分岐路を 有し、該分岐路はコンデンサ(C1)を含む、請求項1から4までのいずれか1 項記載の測定増幅器。 6.積分器が非反転形式で構成されており、積分コンデンサ(C1)が基準電 位へ接続される、請求項1から5までのいずれか1項記載の測定増幅器。 7.コンデンサ(C2)が、積分器として動作する回路の入力側に直列に設け られており、該コンデンサ(C2)に並列にスイッチング素子(13)が設けら れていて、その閉位置において該コンデンサを橋絡する、請求項1から6までの いずれか1項記載の測定増幅器。 8.固定または可変の補償電流(Ik)を供給する補償用電流源が設けられて おり、該補償電流は、積分器として動作する回路の反転入力側(7)に供給され る、請求項1から7までのいずれか1項記載の測定増幅器。 9.スイッチング素子(13)が開かれた時と閉じられた時とで演算増幅器( 3)の出力側における電圧が等しくなるように、補償電流(Ik)が設定されて いる、請求項8記載の測定増幅器。 10.エラー電流は補償されないかまたは部分的に補償され、残留エラーが検出 されて後続の評価において補正される、請求項1から9までのいずれか1項記載 の測定増幅器。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4320817A DE4320817A1 (de) | 1993-06-23 | 1993-06-23 | Meßverstärker |
DE4320817.7 | 1993-06-23 | ||
PCT/EP1994/001686 WO1995000856A1 (de) | 1993-06-23 | 1994-05-26 | Messverstärker |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH09500204A true JPH09500204A (ja) | 1997-01-07 |
JP3580817B2 JP3580817B2 (ja) | 2004-10-27 |
Family
ID=6490997
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50237295A Expired - Fee Related JP3580817B2 (ja) | 1993-06-23 | 1994-05-26 | 測定増幅器 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5770956A (ja) |
EP (1) | EP0705438B1 (ja) |
JP (1) | JP3580817B2 (ja) |
DE (2) | DE4320817A1 (ja) |
WO (1) | WO1995000856A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6414318B1 (en) | 1998-11-06 | 2002-07-02 | Bridge Semiconductor Corporation | Electronic circuit |
WO2000028337A2 (en) | 1998-11-06 | 2000-05-18 | Onguard Systems, Inc. | Electronic circuit with a non-continuous discharge path |
DE10040629B4 (de) * | 2000-08-16 | 2006-04-27 | Günter Prof. Dr.-Ing.habil. Rösel | Diskrete Niedrigststrommessung |
US6919835B2 (en) * | 2002-12-16 | 2005-07-19 | General Electric Company | Infinite electronic integrator |
FR2890750B1 (fr) * | 2005-09-09 | 2007-11-02 | Commissariat Energie Atomique | Dispositif de mesure d'impulsions de courant tres breves |
US8278909B2 (en) * | 2009-07-16 | 2012-10-02 | Mks Instruments, Inc. | Wide-dynamic range electrometer with a fast response |
FR3025606B1 (fr) * | 2014-09-10 | 2016-09-23 | Commissariat Energie Atomique | Dispositif pour la mesure de courant |
CN105548941B (zh) * | 2015-12-10 | 2018-01-30 | 国网四川省电力公司电力科学研究院 | 带校准功能的互感器校验仪 |
US11232937B2 (en) | 2017-03-16 | 2022-01-25 | Isotopx Ltd | Amplifier |
GB2552232B (en) * | 2017-03-16 | 2020-03-25 | Isotopx Ltd | An amplifier |
US11422203B1 (en) * | 2019-02-15 | 2022-08-23 | Maxim Integrated Products, Inc. | Current sensing line fault detector |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944920A (en) * | 1972-02-22 | 1976-03-16 | Taylor Servomex Limited | Current measurement |
US3971984A (en) * | 1974-09-04 | 1976-07-27 | B-Cubed Engineering, Inc. | Wide-range logarithmic responding translation circuit |
US4050019A (en) * | 1976-07-26 | 1977-09-20 | The United States Of America As Represented By The Secretary Of The Army | Range switching circuit for solid state electrometer |
DE3115195A1 (de) * | 1981-04-15 | 1982-11-11 | Robert Bosch Gmbh, 7000 Stuttgart | Schaltungsanordnung zum integrieren elektrischer signale |
DE3322483A1 (de) * | 1983-06-22 | 1985-01-03 | Siemens AG, 1000 Berlin und 8000 München | Messanordnung zur erfassung von strom- oder spannungswerten |
DE3322471A1 (de) * | 1983-06-22 | 1985-01-03 | Siemens AG, 1000 Berlin und 8000 München | Messanordnung zur erfassung von strom- oder spannungswerten |
US4620148A (en) * | 1984-08-27 | 1986-10-28 | Baird Corporation | Current meter |
US4697151A (en) * | 1986-06-05 | 1987-09-29 | Analog Devices, Inc. | Method and apparatus for testing operational amplifier leakage current |
US4839788A (en) * | 1988-01-29 | 1989-06-13 | Dionex Corporation | Bipolar voltage to frequency converter |
FR2634559B1 (fr) * | 1988-07-21 | 1990-11-30 | Commissariat Energie Atomique | Procede de mesure de courants faibles a grande dynamique par conversion courant frequence et dispositif de mise en oeuvre |
US4992673A (en) * | 1989-02-24 | 1991-02-12 | John Fluke Mfg. Co., Inc. | Fast settling voltage to frequency converter for high speed analog to digital conversion |
GB2252829B (en) * | 1991-02-15 | 1994-10-19 | Crystal Semiconductor Corp | Method and apparatus for decreasing the interference and noise sensitivity of a ratiometric converter type of circuit |
CH682276A5 (ja) * | 1991-04-02 | 1993-08-13 | Kk Holding Ag | |
JP3275547B2 (ja) * | 1994-07-01 | 2002-04-15 | 株式会社デンソー | 電圧−周波数変換回路 |
-
1993
- 1993-06-23 DE DE4320817A patent/DE4320817A1/de not_active Withdrawn
-
1994
- 1994-05-26 JP JP50237295A patent/JP3580817B2/ja not_active Expired - Fee Related
- 1994-05-26 US US08/578,574 patent/US5770956A/en not_active Expired - Lifetime
- 1994-05-26 DE DE59404108T patent/DE59404108D1/de not_active Expired - Lifetime
- 1994-05-26 EP EP94918785A patent/EP0705438B1/de not_active Expired - Lifetime
- 1994-05-26 WO PCT/EP1994/001686 patent/WO1995000856A1/de active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
DE4320817A1 (de) | 1995-01-05 |
EP0705438A1 (de) | 1996-04-10 |
JP3580817B2 (ja) | 2004-10-27 |
EP0705438B1 (de) | 1997-09-17 |
DE59404108D1 (de) | 1997-10-23 |
WO1995000856A1 (de) | 1995-01-05 |
US5770956A (en) | 1998-06-23 |
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