JPH09311880A - Method and device for judging noise analytic result of transmission line - Google Patents

Abstract

PROBLEM TO BE SOLVED: To facilitate the judging operation of the signal waveform of a noise analytic result in the noise analytic operation of a signal waveform flowing through the transmission line of a printed board. SOLUTION: An input device part 110 inputs a criterion to a signal waveform criterion storing part 105 and a noise analyzing object signal to a noise analyzing object signal editing part 111. Then, the editing part 111 fetches connection information from a connection information file 112 and sends connection information of analyzing object signal, a using part type, etc., to a judging point searching part 106 and a noise analytic part 102. The analytic part 102 analyzes noise from wiring layout information and analyzing object signal information. An analytic result judging part 107 judges the signal waveform of a judging point searched from the signal waveform of the noise analytic result by the searching part 106 by a signal waveform judging criterion. The judging result is stored in a file 108, error contents are displayed on an error contents display part 109 and the judging result is outputted to a noise analytic judging result gathering table 113.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a noise analysis support device and method used for designing a printed board.

[0002]

2. Description of the Related Art In recent years, with the speeding up of logic circuits, the speeding up of elements mounted on printed boards, and the high density mounting, electrical noise of signals flowing through transmission lines of printed boards has become a problem. The analysis of noise generated on the transmission line of the printed circuit board has so far been confirmed on the actual machine at the inspection stage after the production of the printed circuit board. For this reason, the printed board is remanufactured as a countermeasure against noise, which is a major cause of delaying the shipment of products. Recently, in order to solve the above-mentioned problems, it has become possible to analyze a noise generation condition before manufacturing a printed board by using a transmission line noise simulator. Current,
To evaluate the noise analysis result of this transmission line noise simulator, the waveform analysis result of each signal line is printed out, and the designer visually checks whether the noise level of the waveform is below the signal waveform judgment reference value of each element. Have confirmed.

As conventional noise simulators, Japanese Patent Laid-Open Nos. 1-309435 and 5-34230 are available.
No. 5 publication.

[0004]

Currently, the analysis and judgment work of noise generated in the transmission line of the printed circuit board is performed visually by printing out the noise analysis result of the transmission line noise simulator. In the determination of the analysis result by, the number of man-hours required for the designer's confirmation and determination is enormous, and there is a serious problem that the defective portion of the analysis result is overlooked.

In recent years, there has been proposed a system for judging a noise analysis result, but each of them only makes a judgment within a very limited range such as overshoot and undershoot.

However, if the logic circuit becomes faster and the operating voltage becomes lower and the noise margin becomes smaller, the problematic factors are analyzed over the entire signal waveform (for example, points V1 to V10) as shown in FIG. It is necessary to take measures.

FIG. 13 is a flow chart showing a conventional noise analysis result evaluation procedure performed in that case.

In step 200, a noise analysis target signal is input and noise analysis is performed by a transmission line noise simulator.

In step 201, the analysis result of the noise analysis is printed out for each analysis signal.

In step 202, the noise level of each element is checked at the points V1 to V10 by printing out the analysis result waveform.

In step 203, if there is a problematic part in the result of checking the noise levels of V1 to V10, a noise countermeasure for the corresponding signal line is taken.

The above noise level is checked for all signal lines to be analyzed, and analysis result evaluation is completed (step 2
04).

As can be seen from the above analysis result evaluation procedure, checking the noise level at 10 points for one signal raises problems such as an increase in the number of man-hours for judging the analysis result by the designer and overlooking of defective points. .

An object of the present invention is whether or not the waveform of the noise analysis target signal deviates from the signal waveform determination reference value, based on the determination point and the signal waveform determination reference value designated in advance for the signal waveform of the noise analysis result. By providing a function for automatically determining the above, it is possible to reduce the number of steps required for the designer to confirm and determine the noise analysis result, and to avoid missing a defective portion of the analysis result.

[0015]

The above-mentioned object is to input a noise analysis target signal, select the noise analysis target signal information from a connection information file for each signal of the printed board, and input a noise analysis result determination standard. Then, the noise analysis is performed from the noise analysis target signal information and the wiring layout information of the connection between the elements for each signal in the printed board, the determination point is extracted from the signal waveform of the noise analysis result, and the signal waveform of the determination point is This is achieved by determining whether or not the criterion is deviated.

Further, the above object is achieved by outputting the judgment result to a noise analysis judgment result summary table and displaying an error portion.

The determination criterion is at least one of a reference voltage value, an excess time exceeding the reference voltage value, and an integral value of a voltage value and an excess time of a portion exceeding the reference voltage value.

The determination points are extracted by the first point, the last point, the rising point, the highest voltage point, the starting point from the stable point of the signal waveform of the noise analysis result, and Extract the point with the lowest voltage.

In the above determination, at least one of the voltage value of the signal waveform, the excess time of the signal waveform exceeding the reference voltage value, and the integrated value of the voltage value of the signal waveform exceeding the reference voltage value and the excess time is determined. It is compared with the judgment standard, and if the signal waveform exceeds the judgment standard, it is judged as an error.

Further, the above object describes means for determining a noise analysis target signal to be a noise analysis target from a connection information file representing a connection relation of a logic diagram, and a signal waveform judgment criterion necessary as a judgment criterion for a noise analysis result. Means, a means for performing a noise analysis from the noise analysis target signal and the wiring layout information, a means for searching a determination point from the signal waveform of the noise analysis result, and a signal waveform of the determination point deviating from the signal waveform determination criteria. A means for determining whether or not there is a wiring layout information, a means for displaying the error content at a position deviating from the signal waveform determination criteria of the wiring layout information, and a means for generating an inspection specification and a noise analysis result determination specification from the determination result. It is achieved by having.

The means for determining the noise analysis target signal is provided with means for inputting an attribute indicating whether or not the signal is noise analysis target to the signal in the logic diagram at the input stage of the logic diagram. The noise analysis target signal information is determined by previously capturing an attribute indicating whether or not the target is noise analysis.

Further, the means for describing the signal waveform determination standard comprises means for designating the signal waveform determination standard for each type of the input / output element used for the noise analysis target signal in the wiring layout information. Whether or not the waveform of the analysis target signal deviates from the signal waveform determination standard is determined for each element type.

In addition, the means for describing the signal waveform determination reference is not limited to the determination reference voltage value as the signal waveform determination reference, and the excess time from when the determination reference voltage value is exceeded to when the signal waveform determination reference value falls within the determination reference voltage value, And, at least one of the integral value of the voltage value and the excess time from the time when the judgment reference voltage value is exceeded until it falls within the judgment reference voltage value is designated as the signal waveform judgment reference.

Further, the means for determining whether or not the waveform of the noise analysis target signal deviates from the signal waveform determination reference is within the determination reference voltage value after the signal waveform voltage value or the determination reference voltage value is exceeded. At least one of the excess time of the signal waveform until it falls and the integral value of the voltage value of the signal waveform from the time when it exceeds the judgment reference voltage value until it falls within the judgment reference voltage value and the excess time is defined as the signal waveform judgment reference. The noise analysis result is determined by comparison.

Further, the means for retrieving the judgment point of the noise analysis judges whether the signal waveform is converged, oscillated or diverged from the change in voltage value over time of the signal waveform. Search for noise analysis decision points.

Further, in the noise analysis judgment result,
A noise specification for each analysis signal and a means to output the judgment result to the noise analysis judgment result summary table, and a test specification that specifies the signal name and driver for each signal, the device of the signal receiver, and the pin number necessary for the printed circuit board inspection. And means for outputting.

According to the apparatus equipped with the above means, the noise analysis target signal is automatically noise-analyzed, and the analysis result is automatically judged according to the signal waveform judgment standard. It is possible to reduce the number and eliminate missing parts.

Further, by displaying the wiring layout information of the defective portion, the portion causing the noise can be confirmed instantly, so that the time for studying the countermeasure can be shortened. Furthermore, by utilizing a function that can externally specify a judgment standard and a judgment point, it is possible to easily deal with a logic circuit designed by a new technology.

[0029]

Embodiments of the present invention will be described below in detail with reference to the drawings.

FIG. 1 is a functional block diagram of a transmission line noise analysis result determination device according to an embodiment of the present invention.

The wiring layout information file 101 stores wiring layout information for connecting the elements for each signal in the printed board, and supplies the wiring layout information to the noise analysis section 102 and the error content display section 109.

The noise analysis unit 102 fetches wiring layout information from the wiring layout information file 101,
From the noise analysis target signal editing unit 111, the part type and electrical characteristics of the element connected to the noise analysis target signal and the position information of the element mounted on the printed circuit board are taken in and noise analysis is performed from these information.

The noise analysis result file 103 stores the analysis result of the noise analysis signal analyzed by the noise analysis unit 102.

In the input device section 110, the waveform determination reference for each element type and the noise analysis target signal necessary for determining the noise analysis result are input.

The signal waveform determination reference storage unit 105 stores the waveform determination reference for each element type input by the input device unit 110.

The signal waveform judgment reference file 104 stores the judgment reference of the element connected to the analysis target signal from the judgment reference stored in the signal waveform judgment reference storage section 105.

The connection information file 112 stores the connection information for each signal of the printed board, the part type and electrical characteristics of the element, and the position information of the element to be mounted on the printed board.

In the noise analysis target signal editing section 111, the part model and electrical characteristics of the element connected to the noise analysis target signal input from the input device section 110 from the connection information file 112, and the printed board of the element. Import and edit the installed location information.

In the decision point search unit 106, the noise analysis result from the noise analysis result file 103, the part type and electrical characteristics of the element connected to the noise analysis target signal from the noise analysis target signal editing unit 111, and the printed board of the element. The position information mounted on the top is taken in and the noise judgment point is searched for each noise analysis target signal.

In the analysis result judging unit 107, whether the noise analysis result of the judgment point searched by the judgment point searching unit 106 is fetched from the signal waveform judgment reference file 104, and the judgment criterion for each element type is deviated or not. To judge.

The judgment result file 108 stores the result judged by the analysis result judging unit 107.

The error content display unit 109 fetches the determination result from the determination result file 108, fetches the wiring layout information connecting the elements for each signal line in the printed board from the wiring layout file 101, and deviates from the determination standard. Display signal connection information and analysis results on the screen.

The noise analysis judgment result summary table 113 collectively outputs the judgment results for each noise analysis target signal line fetched from the judgment result file 108.

The inspection specification 114 takes in the part type and electrical characteristics of the element connected to the noise analysis target signal from the noise analysis target signal editing section 111 and the position information of the element to be mounted on the printed board, and submits the inspection specification. Output the signal name of the signal to be inspected, the driver mounting position of the signal connected to the signal, the component mounting position of the receiver, and the connection pin number of the device to the inspection specification document.

FIG. 5 is a diagram showing ten points (V1 to V10) that need to be determined based on the noise analysis result.

FIG. 2 shows that the noise analysis result judgment is necessary.
It is a figure which shows the incorrect waveform by the noise generation at the point of a place. The ten points that need to be determined are referred to as V1 to V10 and will be described below.

As for V1, the element senses when the noise V1 exceeding the threshold voltage of L occurs when the input waveform is at L level, and the pulse waveform of H is output.

For V2 and V3, the input waveform is from L level to H level.
When noise V2 and V3 occur between the H and L thresholds in the rising state to the level, the element senses and the output waveform once raised to the H level falls to L and a pulse is output.

V4 becomes a breakdown of the element when the voltage level of the noise V4 exceeds the rated voltage of the element in the rising state of the input waveform from the L level to the H level.

V5 and V6 are noises V5 and V that exceed the H threshold voltage when the input waveform is at the H level.
When 6 occurs, the element senses and L pulse is output.

For V7 and V8, the input waveform is from H level to L
When noises V7 and V8 occur between the H and L thresholds in the falling state to the level, the element senses and the output waveform once dropped to the L level rises to the H level and a pulse is output again.

V9 is a breakdown of the element when the voltage level of the noise V9 exceeds the rated voltage of the element when the input waveform falls from the H level to the L level.

V10 is L when the input waveform is L level.
When a noise V10 exceeding the threshold voltage is generated, the element senses and a pulse of H is output.

As described above, the number of places where noise is generated increases due to the speedup of the logic circuit, the increase in the operating frequency of the elements mounted on the printed board, the reduction in size and the increase in density, and it is necessary to judge the noise from V1 to V10. Become.

FIG. 3 is a flow chart showing the operation procedure of the noise analysis result judging device of FIG.

In step 300, a signal to be analyzed for noise analysis is selected from the input device section 110. The selection of the analysis target signal is realized by the noise analysis target signal editing unit 111 that takes in the connection information of the analysis target printed board, and adds the analysis target attribute to the signals to be analyzed from all the signals. It This setting method is shown in Fig. 4.
This is realized by selecting the analysis target signal from all signals displayed in the left window in the signal name selection window of (a) and displaying the analysis target signal in the right window. After that, the simulation attribute of the analysis target is added to the signal for which the analysis target is set. In addition to the analysis target, the inspection attribute of the signal output to the inspection test specification can be added as an attribute.

In step 301, the waveform judgment criterion for each element type required for automatic judgment is input from the input device section 110. The criterion input for each element type should be selected from the list of criteria templates set for each element type displayed in the left window of the criterion input window as shown in FIG. 4B. Enter the criteria (voltage, voltage + overtime, or area) in the right window in the table format. Further, this criterion can be partially changed if necessary.

The criteria entered once are stored in the signal waveform criteria file 104 and retrieved when necessary. As a result, it is possible to input a criterion for a new element at any time.

In step 302, based on the determination standard input in step 301, the determination standard of the element used for each signal is taken in and a signal waveform determination standard table for each signal line of the target printed board is created.

In step 303, the signal to which the inspection attribute is added in step 300 is based on the signal waveform judgment reference table for each signal line of the printed board created in step 302, and the inspection specification shown in FIG. In addition, the signal waveform judgment reference for each element used for each signal line is also added at the same time to create an inspection specification.

In step 304, noise analysis is performed based on the wiring layout information of the signal to which the simulation attribute is added in step 300, the electrical characteristics of the target printed board and the element, and the like.

In step 305, the determination points (V1 to V10) for each waveform are searched from the simulation result waveform of the target signal analyzed in step 304. At this time, the determination points for each element type set in step 301 are not searched for points that are not the target.

At steps 306, 307 and 308, the analysis result is judged.

In determining the analysis result, first, from the noise analysis result, analysis reference points P1 to P of the waveform of FIG.
6 is calculated under the following conditions.

P1 (at the start of measurement): The first point of the analysis result.

P2 (at the end of measurement): the end point of the analysis result.

P3 (tlh): The starting point when the voltage rises from the waveform analysis point (when the voltage exceeds the Low threshold voltage and tends to rise further).

P4 (V4): The highest voltage point in the analysis result waveform.

P5 (thl): The point at which the voltage starts to drop (when it exceeds the High threshold voltage and tends to further drop) after the analysis result stabilizes at the High level.

P6 (V9): The lowest voltage point in the analysis result waveform.

Next, when the determination condition of the analysis determination target signal is voltage, voltage + excess time, or area, step 301
Judgment is made based on the judgment condition for each element type set in.

When the determination condition is voltage, the analysis result determination is performed in step 306, when the determination condition is voltage + excess time, the analysis result determination is performed in step 307, and when the determination condition is area, the process proceeds to step 308. To determine the analysis result.

In step 306, the detection of the judgment points V1 to V10 shown in FIG. 6 is searched from the analysis result under the following conditions. The detection conditions of V1 to V10 below will be described with reference to FIG.

V1: The maximum voltage value in the Low level voltage state before the time point tlh from the measurement start time point (the time point when the input pulse is applied) is detected.

V2: In the rising state between tlh and V4, the highest point of the peak is detected when a staircase state of the voltage is raised between Vtl and Vth while the voltage is lower than before and rises again. (A plurality of cases may be detected.) V3: In the rising state between tlh and V4, the stepped state of the voltage is Vt, where the voltage is lower than before and rises again in the middle.
Report the valley bottom as an error if it occurs between 1 and Vth.

V4: The maximum voltage value between tlh and thl is detected.

V5: The minimum voltage value in the voltage convergence state is detected between V4 and th1. The voltage convergence state refers to a time when the valley voltage value rises and the peak voltage value falls. In any case, changes in the ascending state or the descending state are excluded from the target.

V6: Between V4 and V5 and up to thl,
The minimum voltage value of the waveform after voltage convergence is detected.

V7: In the falling state between thl and V9, the lowest point of the valley is detected when the staircase state of the voltage that rises and falls again during the period between Vtl and Vth occurs.

V8: In the falling state between thl and V9, the highest point of the peak is reported as an error when the stepped state of the voltage in which the voltage rises and falls again during the period from Vtl to Vth.

V9: thl-The minimum voltage value at the end of measurement is detected.

After V10: V9, the largest voltage value among the voltage values in the voltage converged state is detected.

The voltage convergence state means an increase in the voltage value of the valley,
It refers to when the voltage drop in the mountain is seen. In any case, changes in the ascending state or the descending state are excluded from the target.

If the voltage value at each point detected above exceeds the waveform judgment reference voltage value set in step 301, it is reported as an error.

At step 307, it is possible to determine the time when the specified voltage value is exceeded for the points V1 to V10 designated as shown in FIG. 7 from the analysis result. For example, the specified voltage value Vn of V9 and the value tpw of the time when the specified voltage value is exceeded are determined under the following conditions.

V9: After thl, individual specified voltage values (V9a, V
9b, V9c) and the value (tpw, tpw2, tpw1) of the time when the specified voltage value is exceeded is determined.
The determination of V9 is problematic because the excess time when the voltage is OV or lower than the instantaneous voltage value is a problem, and therefore all the portions below the voltage OV are targeted. FIG. 9 is a format showing an example of specified voltage value determination and overtime determination criteria for the determination points V1 to V10.

At step 308, as shown in FIG.
The total of the specified voltage value and the area of the trapezoidal portion during the time when the specified voltage value is exceeded is calculated and compared with the set judgment reference value. In the figure, (a) is an example in which OV is used as a reference voltage and the total area of the portion exceeding this is obtained. As shown in the right figure, the total area of each divided trapezoidal portion is obtained. What is shown in (b) is O
It is an example of obtaining the area between V and the reference voltage, and the duration.

The area value detected above and step 301
If it exceeds the judgment reference area value set in, it will be reported as an error.

FIG. 10 is a noise analysis determination result summary table format showing noise values and determination results for each analysis signal, and FIG. 11 is a noise analysis determination result summary table format showing details of the determination results.
Based on the analysis result determinations of 06 to 308, as shown in FIG. 11, the determination results (OK, NG) of the points V1 to V10 for each target signal line are output as a noise analysis determination result summary table.

In step 310, the mounting position of the element connected to the corresponding signal, the pin number, and the wiring route are highlighted on the wiring layout for the signal line which is NG as a result of the noise analysis determination, as shown in FIG. .

As described above, according to the transmission line noise analysis result judging apparatus of the present embodiment, the noise analysis result is judged and the analysis result summary table is prepared by adding the simulation attribute, the inspection attribute, etc. to the signal to be analyzed. It is possible to create inspection specifications and the like without manual labor.

As a result, it is possible to greatly reduce the determination time as compared with the case where the analysis result determination is performed manually, and it is possible to prevent the error from being overlooked.

Further, by displaying the analysis waveform determination result on the screen, it is possible to instantly determine whether or not the cause of noise is due to the arrangement of the elements, and the countermeasure work can be performed quickly.

[0094]

According to the present invention, it is possible to automatically analyze and judge all signals to be subjected to noise analysis, and the number of man-hours required for the designer's analysis and judgment is greatly reduced. Eliminate missing spots. For example, at present, there are 1.
Although it takes 5 man-months, it can be reduced to about 0.5 man-months by using the transmission line noise analysis result judging device according to the present invention. Further, by displaying the layout information of the defective portion, the location of the noise occurrence can be confirmed instantly, so that the countermeasure study period can be shortened.
Further, there is an effect that it is possible to easily cope with an element created by a new technology by utilizing a function of externally specifying a judgment standard and a judgment point.

[Brief description of drawings]

FIG. 1 is a functional configuration diagram of a transmission line noise analysis result determination device according to an embodiment of the present invention.

FIG. 2 is a diagram showing causes up to a malfunction due to noise generation at a determination point.

FIG. 3 is a flowchart showing an operation procedure of the transmission line noise analysis result determination device according to the embodiment of the present invention.

FIG. 4 is a format diagram of a noise analysis target signal input unit required for automatic determination according to an embodiment of the present invention, a determination reference input unit for each element type, and an output specification selection unit.

FIG. 5 is a waveform pattern diagram showing ten noise determination points (V1 to V10) that pose a problem in actual operation according to an embodiment of the present invention.

FIG. 6 shows determination points V1 to V1 according to an embodiment of the present invention.
Explanatory drawing explaining the detection method of the maximum voltage value and minimum voltage value with respect to V10.

FIG. 7 is a diagram illustrating determination points V1 to V1 according to an embodiment of the present invention.
Explanatory drawing explaining the voltage with respect to V10, and the excess time determination method.

FIG. 8 is an explanatory diagram illustrating an area determination method for a determination point V9 according to an embodiment of the present invention.

FIG. 9 is a diagram illustrating determination points V1 to V1 according to an embodiment of the present invention.
The format figure which shows an example of the reference voltage with respect to V10, and an excess time determination standard.

FIG. 10 is a noise analysis determination result summary table format showing noise values and determination results for each analysis signal according to an embodiment of the present invention.

FIG. 11 is a noise analysis determination result summary table format diagram showing details of noise values and determination results for each analysis signal name according to the embodiment of the present invention.

FIG. 12 is a conceptual diagram of an apparatus for displaying error contents on a wiring layout for a signal line that has an error as a result of noise analysis according to an embodiment of the present invention.

FIG. 13 is a flowchart showing a procedure for evaluating a conventional noise analysis result.

[Explanation of symbols]

101 ... Wiring layout information file, 102 ... Noise analysis unit, 103 ... Noise analysis result file, 104 ... Signal waveform determination reference file, 105 ... Judgment reference storage / holding device, 106 ... Judgment point search unit, 107 ... Analysis result determination unit, 108 ... Judgment result file, 109 ... Error content display section, 110 ... Input device section, 111 ... Noise analysis target signal editing section, 112 ... Connection information file, 113 ... Noise analysis judgment result summary table, 114 ... Inspection specification, 300 …
Analysis target signal selection step, 301 ... Judgment criterion input step for each element, 302 ... Design rule generation step, 303 ... Inspection specification issuing step, 304 ... Noise analysis step, 305 ... Judgment point extraction step, 3
06 ... voltage value determination step, 307 ... voltage + excess time determination step, 308 ... area determination step, 309 ... noise analysis determination result summary table issuing step, 310 ... error location display step.

─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. ⁶ Identification code Internal reference number FI Technical display location G06F 11/22 330 G06F 11/22 330J (72) Inventor Michio Ishii Go Omikamachi Oita, Ibaraki Prefecture 2-2-1 Nisitsu Process Computer Engineering Co., Ltd. (72) Inventor Shinichi Terunuma 5-2-1 Omika-cho, Hitachi City, Ibaraki Prefecture Hitec Process Computer Engineering Co., Ltd. (72) Inventor Toshiaki Kawamura Hitachi, Ibaraki Prefecture 5-2-1 Omika-cho, Oita-shi, Hitachi, Ltd. Process Computer Engineering Co., Ltd. (72) Inventor Hideaki Sonoda 5-2-1 Omika-cho, Hitachi-shi, Ibaraki Hitachi Ltd. Omika Plant

Claims (14)

[Claims] 1. A method of determining a signal waveform in a noise analysis result of a signal waveform flowing through a transmission line of a printed circuit board, wherein a noise analysis target signal is input and noise analysis target signal information is obtained from a connection information file for each signal of the printed circuit board. In addition to selecting, input the noise analysis result judgment criteria, perform noise analysis from the noise analysis target signal information and wiring layout information of the connection between elements for each signal in the printed board, and judge from the signal waveform of the noise analysis result. A transmission line noise analysis result determination method comprising extracting points and determining whether or not the signal waveform at the determination points deviates from the determination criteria. 2. The determination criterion is at least one of a reference voltage value, a time when the reference voltage value is exceeded, and a voltage value of a portion where the reference voltage value is exceeded and an integral value of the excess time. The transmission line noise analysis result determination method according to claim 1. 3. The extraction of the determination points is performed at the beginning point, the ending point, the rising point, the highest voltage point, the stable starting point of the noise analysis result signal waveform, And a point having the lowest voltage is extracted, the transmission line noise analysis result determination method according to claim 1. 4. The determination as to whether or not the signal waveform deviates from a determination criterion is performed by determining the voltage value of the signal waveform, the excess time of the signal waveform exceeding the reference voltage value, and the signal waveform exceeding the reference voltage value. 2. The transmission line noise analysis result determination method according to claim 1, wherein at least one of a voltage value and an integral value of the excess time is compared with a determination reference, and if the signal waveform exceeds the determination reference, an error is determined. . 5. A method of determining a signal waveform in a noise analysis result of a signal waveform flowing through a transmission line of a printed circuit board, wherein a noise analysis target signal is input and noise analysis target signal information is obtained from a connection information file for each signal of the printed circuit board. In addition to selecting, input the noise analysis result judgment criteria, perform noise analysis from the noise analysis target signal information and wiring layout information of the connection between elements for each signal in the printed board, and judge from the signal waveform of the noise analysis result. Transmission characterized by extracting points and judging whether or not the signal waveform of the judgment point deviates from the judgment standard, outputting the judgment result to a noise analysis judgment result summary table and displaying an error location Line noise analysis result judgment method. 6. A means for determining a noise analysis target signal to be a noise analysis target from a connection information file representing a connection state of a logic circuit, and a means for describing a signal waveform judgment reference necessary as a judgment reference for a noise analysis result, A means for performing noise analysis from the noise analysis target signal and wiring layout information,
Means for searching a judgment point from the signal waveform of the noise analysis result, means for judging whether or not the signal waveform of the judgment point deviates from the signal waveform judgment standard, and deviating from the signal waveform judgment standard of the wiring layout information A transmission line noise analysis result determination device comprising: a unit for displaying the error content at a location; and a unit for generating an inspection specification and a noise analysis determination result summary table from the determination result. 7. The means for determining the noise analysis target signal determines whether or not each signal in the logic diagram is a signal to be subjected to noise analysis to an input device section that provides a function of inputting the logic diagram. The noise analysis target signal information is determined by including a means capable of inputting the attribute indicating the noise analysis target signal in advance from the connection information file. The transmission line noise analysis result determination device according to claim 6. 8. The means for describing the signal waveform determination reference includes an input device section that provides a function of inputting the signal waveform determination reference, of an element used for inputting and outputting a signal line to be subjected to noise analysis. A means for designating a signal waveform determination criterion for each type is provided, and whether or not the waveform of the noise analysis target signal deviates from the signal waveform determination criterion can be determined for each element type. Item 6. A transmission line noise analysis result determination device according to item 6. 9. The means for describing the signal waveform determination reference includes, as a signal waveform determination reference, not only a determination reference voltage value but also an excess time from when the determination reference voltage value is exceeded to when the signal waveform determination reference falls within the determination reference voltage value. It is characterized in that it has a function of inputting at least one of an integrated value of a voltage value and an excess time from when the judgment reference voltage value is exceeded until it falls within the judgment reference voltage value as a signal waveform judgment reference. The transmission line noise analysis result determination device according to claim 8. 10. The means for determining whether or not the waveform of the noise analysis target signal deviates from a signal waveform determination criterion,
Signal waveform voltage value, signal waveform excess time from exceeding the judgment reference voltage value to falling within the judgment reference voltage value, and signal from exceeding the judgment reference voltage value to falling within the judgment reference voltage value By comparing at least one of the integral value of the voltage value of the waveform and the excess time with the signal waveform criterion,
7. The transmission line noise analysis result determination device according to claim 6, which determines whether or not the noise analysis result deviates from a signal waveform determination standard. 11. The means for searching the determination point of the noise analysis, from the start of measurement of the input signal waveform of the noise analysis target signal line to the end of measurement, until the output signal waveform changes to a certain voltage value. 7. The transmission line noise analysis result determination device according to claim 6, wherein a determination point for noise analysis is searched for based on changes in excess time and voltage value. 12. The means for searching the judgment point of the noise analysis judges whether the signal waveform is converged, oscillated or diverged from the temporal change of the voltage value of the output signal waveform. The transmission line noise analysis result determination device according to claim 11, which is for searching a determination point for noise analysis. 13. The means for generating an inspection specification and a noise analysis determination result summary table from the determination result outputs the noise voltage value for each noise analysis target signal and the determination result to the noise analysis determination result summary table. 7. The transmission according to claim 6, further comprising means and means for outputting an inspection specification in which a noise analysis target signal name, a driver mounting the signal, a component mounting position of the receiver, and a pin number are specified. Line noise analysis result judgment device. 14. The means for displaying the error content at a portion deviating from the signal waveform determination standard of the wiring layout information is a component mounting position and pin of a driver or receiver related to a signal line deviating from the signal waveform determination standard. 7. The transmission line noise analysis result determination device according to claim 6, further comprising means for outputting the number, the wiring route, and the determination result.