JPH0930170A - Ic card - Google Patents

Ic card

Info

Publication number
JPH0930170A
JPH0930170A JP7206576A JP20657695A JPH0930170A JP H0930170 A JPH0930170 A JP H0930170A JP 7206576 A JP7206576 A JP 7206576A JP 20657695 A JP20657695 A JP 20657695A JP H0930170 A JPH0930170 A JP H0930170A
Authority
JP
Japan
Prior art keywords
card
module
recess
substrate
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7206576A
Other languages
Japanese (ja)
Other versions
JP3813205B2 (en
Inventor
Masao Gokami
昌夫 後上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dai Nippon Printing Co Ltd
Original Assignee
Dai Nippon Printing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dai Nippon Printing Co Ltd filed Critical Dai Nippon Printing Co Ltd
Priority to JP20657695A priority Critical patent/JP3813205B2/en
Publication of JPH0930170A publication Critical patent/JPH0930170A/en
Application granted granted Critical
Publication of JP3813205B2 publication Critical patent/JP3813205B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • H01L2224/48228Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item the bond pad being disposed in a recess of the surface of the item

Abstract

PROBLEM TO BE SOLVED: To prevent a physical fault from generating in an IC module part and thereby, reduce the fault rate by forming a first and a second recessed part in a card base and at the same time, providing a notch, in parallel with the outer periphery of a terminal substrate, on the extended line of the peripheral part of the second recessed part within the range of the first recessed part. SOLUTION: Recessed parts 1, 2 are formed on a card base and at the same time, a # shaped stress relaxation groove 3 is formed on the outer periphery of the recessed part 2. That is, a notch is formed by cutting, etc. Further, an IC module 7 including a resilient terminal substrate which shows a larger amount of deflection than the card substrate to a load, an outer connection terminal mounted on one of the surfaces of the terminal substrate 4 td an IC chip and a resin mold part 6 for sealing the IC chip, mounted on the other surface of the terminal substrate 4, is stored in the recessed part 2. In addition, the terminal substrate 4 is adhesively fixed in the recessed part 1. Thus, the IC card is deflected, and a stress is absorbed by the part of the stress relaxation groove 3, even if the stress is applied to the IC module 7. Consequently, the IC module is prevented from being broken down.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、フィールド故障の
主要因であるICチップクラックなどのICモジュール
部の物理的故障を防止し、故障率の低減をはかることを
目的とした高信頼性ICカードに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention prevents a physical failure of an IC module, such as an IC chip crack, which is a main cause of a field failure, and aims to reduce the failure rate. Regarding

【0002】[0002]

【従来の技術】CPUを内蔵したICカードは、高度な
セキュリティーを有するため、種々の分野での利用が期
待でき、新しい情報記録媒体として、特に磁気カードに
代わる情報記録媒体として注目を集めており、次第に普
及しつつある。
2. Description of the Related Art Since an IC card having a built-in CPU has a high level of security, it can be expected to be used in various fields, and has attracted attention as a new information recording medium, especially as an information recording medium replacing a magnetic card. , Gradually becoming popular.

【0003】ICカードは、一般にはCOB(Chip
on Board)の形態をとったICモジュールを
搭載しており、ICモジュールの各端子と、R/W(リ
ーダライタ)のコンタクト部とを接触させて電気的に接
続して、I/Oラインを形成し、I/Oラインを通じて
情報の読み出し、書込みが行われている。
[0003] An IC card is generally a COB (Chip).
on-board) IC module is mounted, and each terminal of the IC module and the contact part of the R / W (reader / writer) are brought into contact and electrically connected to each other to connect the I / O line. After being formed, information is read and written through the I / O line.

【0004】しかしながら、このICモジュールを搭載
したICカードにおいては、ICカード自体が薄く、ポ
リ塩化ビニル等の基材から成っていることにより、IC
カードの曲がりが生じるが、このICカードの曲がりが
原因でICモジュール部が物理的に故障することがあり
問題となっていた。特に、物理的故障の主要因は、IC
チップクラックと言われるもので、ICカードの曲がり
の際に、ICモジュールが外部から受ける応力に対応で
きなくなり、各端子の境部等において破壊(クラック)
が発生するものである。他には、ワイヤの断線によるも
のや封止樹脂のクラックが原因の物理的故障もある。
However, in the IC card equipped with this IC module, the IC card itself is thin and is made of a base material such as polyvinyl chloride.
The bending of the card occurs, but this bending of the IC card causes a physical failure of the IC module, which has been a problem. In particular, the main cause of physical failure is IC
This is called chip crack, and when the IC card is bent, the IC module cannot cope with the external stress and breaks (cracks) at the boundaries between terminals.
Is generated. In addition, there are physical failures due to wire breakage and cracks in the sealing resin.

【0005】従来のCOBタイプのICカードにおいて
も、カード曲げに対するチップクラックを防止すること
を目的としたものがあり、具体的に特許としては、特開
平2−80299号がある。(図5) 図5においてICカードの曲がりの際に、応力集中点A
の部分で、ICモジュールが応力を受けるが、カード基
材30に切欠(応力緩和溝)36を設けることで曲げ応
力が緩和され、ICチップ(半導体素子)に応力が集中
するを防止できる。一方、図2に示すように本願のIC
モジュール(COT)は、端子基板がカード基体よりも
荷重に対して柔軟なため、カード曲がりの際の応力集中
点がBの点となる。そのため図5のような従来の切欠
(応力緩和溝)36の部分に設けても効果的に応力緩和
することができない。
Some conventional COB type IC cards are also intended to prevent chip cracks when the card is bent, and a specific patent is JP-A-2-80299. (FIG. 5) In FIG. 5, when the IC card is bent, the stress concentration point A
Although the IC module is stressed at the portion, the bending stress is relaxed by providing the notch (stress relaxation groove) 36 in the card base material 30, and it is possible to prevent the stress from being concentrated on the IC chip (semiconductor element). On the other hand, as shown in FIG.
In the module (COT), since the terminal board is more flexible than the card base body against the load, the point of stress concentration when the card is bent is point B. Therefore, stress cannot be effectively relieved even if it is provided in the conventional notch (stress relaxation groove) 36 as shown in FIG.

【0006】[0006]

【発明が解決しようとする課題】一方、近年、電子マネ
ー、電子さいふなどの金融決裁にICカードを利用する
アプリケーションシステムが有望視されている。システ
ム上、ICカードに対して高い信頼性が要求される。I
Cカードのフィールドでの故障を調査すると約80%が
ICチップのクラック、ワイヤ断線等の物理的な故障で
ある。
On the other hand, in recent years, an application system that uses an IC card for financial approval such as electronic money and electronic bill has been considered promising. High reliability is required for the IC card in the system. I
Investigating failures in the C card field shows that about 80% are physical failures such as IC chip cracks and wire breaks.

【0007】このようなICカードに用いられるICモ
ジュールは大量生産に対応するためには、従来のCOB
のような短冊形状のハードタイプのプリント基板に較べ
て、COT(Chip On Tape)のようなリー
ル形状のフレキシブル基板を用いた連続加工が可能なタ
イプが有利である。本発明では、この様な量産性に優れ
たフレキシブル基板を用いたICモジュールを用いて、
フィールド故障の主要因であるカード曲げに対するIC
チップクラックなどのICモジュール部の物理的故障を
防止し、故障率を低減することが出来るカード構造を提
供することを目的とする。
The IC module used for such an IC card has a conventional COB in order to support mass production.
As compared with the strip-shaped hard type printed circuit board as described above, a type capable of continuous processing using a reel-shaped flexible substrate such as COT (Chip On Tape) is advantageous. In the present invention, an IC module using such a flexible substrate excellent in mass productivity is used,
IC for card bending, which is the main cause of field failure
An object of the present invention is to provide a card structure capable of preventing a physical failure of an IC module part such as a chip crack and reducing a failure rate.

【0008】本発明者は以下の観点に着目し、本発明を
完成した。 (1) リール形状のフレキシブル基板を用いたICモ
ジュール(COT)は連続加工が可能であり、量産性に
優れている。 (2) このようなCOTは従来のBTレジン、ガラス
エポキシの2層基板を用いたハードタイプの従来のCO
Bと異なり、基板部分が柔軟なためたわみやすく、図5
のように、従来の応力緩和溝を最外周に設ける方法で
は、応力集中の位置が異なるため溝の効果が少ない。 (3) また、本願に用いられるCOTは1層基板のた
めスルーホールが必要なく、カード基体に接着する際の
スルーホールから接着剤のはみ出しが心配ないため、接
着剤のがしのための溝が必要がなく、最外周に溝を設け
る必要がない。 (4) 外部接続端子が6端子のCOTなどは、端子基
板の面積が少ないため、最外周に応力緩和溝を設けると
端子基板とカード基体凹部との有効接着面積を確保する
ことが困難となる。 以上の点から、本発明ではカードたわみ時に、COTで
応力が集中するモールド収納部の外周に端子基板外周と
平行する形で♯形状の応力緩和溝を形成する。形成方法
は、ルーティングなどの切削、インジェクションなどの
成形、抜き刃による押しつけなどの方法により、幅0.
3〜2mm程度の切り欠きを形成するものである。幅
0.3mm以下であると応力緩和効果が少なく、2mm
以上になると、接着面積の減少からCOTの接着強度が
低下する。切り欠きの深さは第一凹部以上、第二凹部以
下であれば良いが、テストの結果0.45〜0.55m
mの深さが効果、カード裏面外観の点から適する。0.
45mm以下であると、応力緩和効果が少なく0.55
mm以上であると、裏面の亀裂が生じやすくなり、カー
ド外観の点からも不適である。
The present inventor has completed the present invention by paying attention to the following points. (1) An IC module (COT) using a reel-shaped flexible substrate can be continuously processed and is excellent in mass productivity. (2) Such a COT is a conventional hard type CO using a conventional BT resin and a glass epoxy two-layer substrate.
Unlike B, it is easy to bend because the board part is flexible.
As described above, in the conventional method of providing the stress relaxation groove on the outermost periphery, the effect of the groove is small because the stress concentration positions are different. (3) In addition, since the COT used in the present application is a single-layer board, no through hole is required, and there is no concern that the adhesive may stick out from the through hole when it is bonded to the card base. Is unnecessary, and it is not necessary to provide a groove on the outermost periphery. (4) Since the area of the terminal board is small in a COT having six external connection terminals, it is difficult to secure an effective bonding area between the terminal board and the card base concave portion when the stress relaxation groove is provided on the outermost circumference. . From the above points, in the present invention, the # -shaped stress relaxation groove is formed in parallel with the outer periphery of the terminal substrate on the outer periphery of the mold housing portion where the stress is concentrated by COT when the card is bent. The forming method is a method such as cutting such as routing, forming such as injection, pressing with a punching blade, and the like.
A notch of about 3 to 2 mm is formed. If the width is 0.3 mm or less, the stress relaxation effect is small and it is 2 mm.
If it becomes the above, the adhesive strength of COT will fall from the reduction of an adhesion area. The depth of the notch may be greater than or equal to the first concave portion and less than or equal to the second concave portion, but the test result is 0.45 to 0.55 m.
The depth of m is suitable for the effect and the appearance of the back surface of the card. 0.
When it is 45 mm or less, the stress relaxation effect is small and 0.55.
If it is not less than mm, cracks on the back surface are likely to occur, which is not suitable in terms of the appearance of the card.

【0009】[0009]

【課題を解決するための手段】本発明の高信頼性ICカ
ードは、上記目的(課題)を達成するために、以下の4
つの発明からなる。すなわち、 (請求項1) 荷重に対して、カード基体よりも大きな
たわみ量を示す柔軟な端子基板と、この端子基板の一方
の面に設けた外部接続端子と、他方の面に設けられたI
Cチップ及びICチップを封止する樹脂モールド部とを
有するICモジュールと、ICモジュールを装備する凹
部が形成されたカード基体とを備え、前記カード基体の
凹部は前記端子基板を接着固定する比較的浅い平面の第
一凹部と、前記第一凹部の内側に設けられ前記樹脂モー
ルド部が接触しないように収納する第一凹部より深い第
二凹部とからなり、前記第一凹部の範囲内で、第二凹部
の外周部分の延長線上に、前記端子基板外周と平行に切
り欠きを設けることを特徴とするICカード。 (請求項2) 前記切り欠き部の平面形状が♯形状であ
ることを特徴とする請求項1記載のICカード。 (請求項3) 前記切り欠き部の第一凹部外周と接する
先端部分の平面形状が円弧状であることを特徴とする請
求項1または請求項2に記載のICカード。 (請求項4) 前記樹脂モールド部は封止枠を有してい
ることを特徴とする請求項1、請求項2または請求項3
に記載のICカード。 である。
In order to achieve the above-mentioned object (problem), the highly reliable IC card of the present invention has the following four features.
It consists of two inventions. That is, (Claim 1) A flexible terminal board that exhibits a greater amount of deflection than a card base body with respect to a load, external connection terminals provided on one surface of the terminal board, and I provided on the other surface.
An IC module having a C chip and a resin mold portion for encapsulating the IC chip, and a card base having a recess for mounting the IC module are provided, and the recess of the card base is used for bonding and fixing the terminal board. A first recess having a shallow plane and a second recess which is provided inside the first recess and is deeper than the first recess which is housed so as not to contact the resin mold portion, and within the range of the first recess, An IC card, characterized in that a notch is provided in parallel with the outer periphery of the terminal board on an extension of the outer periphery of the two recesses. (Claim 2) The IC card according to claim 1, wherein the planar shape of the cutout portion is a # shape. (Claim 3) The IC card according to claim 1 or 2, wherein a planar shape of a tip end portion of the cutout portion in contact with the outer periphery of the first recess is an arc shape. (Claim 4) The resin mold part has a sealing frame, claim 1, claim 2 or claim 3 characterized in that
2. The IC card according to 1. It is.

【0010】[0010]

【発明の実施の形態】カード基体としては、ポリ塩化ビ
ニル、ポリスチレン、ポリカーボネート、ポリエステ
ル、ABSまたはこれらの樹脂のアロイ等が使用され
る。
BEST MODE FOR CARRYING OUT THE INVENTION Polyvinyl chloride, polystyrene, polycarbonate, polyester, ABS, alloys of these resins, and the like are used as the card substrate.

【0011】荷重に対して、カード基体よりも大きなた
わみ量を示す柔軟な端子基板(基材)とは、例えば図2
において、基材(端子基板)210としては、フレキシ
ブルな、ガラスエポキシからなる100μm厚を用い
た。これは、通常のICカード基体であるポリ塩化ビニ
ルよりもたわみ量の大きい柔軟なものである。ガラスエ
ポキシの他には、ポリイミド、ポリエステル、紙フェノ
ール、BTレジン等を基材として用いても良い。基材
(端子基板)210の厚みは、カード基体よりも荷重に
対して大きなたわみ量を得るために、メッキを含め総厚
30〜120μmが望ましい。端子部からの押圧に対す
るクッション性の面からは、出来るだけ基材の厚みを多
くとった方が好ましい。
A flexible terminal board (base material) that exhibits a greater flexure than a card base with respect to a load is, for example, as shown in FIG.
In the above, as the base material (terminal substrate) 210, a flexible 100 μm thick glass epoxy was used. This is a flexible one having a larger amount of deflection than polyvinyl chloride which is a usual IC card substrate. Other than glass epoxy, polyimide, polyester, paper phenol, BT resin or the like may be used as a base material. The thickness of the base material (terminal board) 210 is preferably 30 to 120 μm including the plating in order to obtain a larger amount of deflection with respect to the load than the card base body. From the viewpoint of cushioning properties against the pressure from the terminal portion, it is preferable to make the thickness of the base material as large as possible.

【0012】第一凹部と、前記第一凹部内部に設けられ
樹脂モールド部を収納するより深い第二凹部と前記第一
凹部の範囲内で、第二凹部の外周部分の延長線上に、端
子基板外周と平行で、その平面形状が♯形状の切り欠き
部の形成方法は、ルーティングなどの切削、インジェク
ションなどの成形、抜き刃による押しつけなどの方法に
より、幅0.3〜2mm程度の切り欠きを形成すること
ができる。
Within the range of the first concave portion, the deeper second concave portion provided inside the first concave portion and accommodating the resin mold portion, and the first concave portion, on the extension line of the outer peripheral portion of the second concave portion, the terminal board is provided. A notch with a width of 0.3 to 2 mm can be formed by cutting such as routing, molding such as injection, pressing with a punching blade, and the like. Can be formed.

【0013】ICカードがたわみ、応力がICモジュー
ルに加わった場合、カード基体よりも柔軟な外部端子基
板には応力がかからずに、樹脂モールド部外周と端子基
板の接する部分〔図2(b)のB〕に応力集中するた
め、カード基体との接着部の応力集中位置に設けられた
応力緩和溝部分で、応力を吸収することでICモジュー
ルの破壊を防止することができる。応力緩和溝を設ける
ことによる接着強度の低下は、モジュール外周並びにコ
ーナー部の接着上有効な部分を接着部として確保できる
ことから、接着面積の減少にもかかわらず十分な接着強
度を得ることができる。また接着部分の端子基板が柔軟
であり、モールド収納部の外周に応力緩和溝部を設ける
ことにより、クリアランスが充分にとれることから、外
部端子面からの押し圧力(点圧)に対して、樹脂モール
ド部底面が収納部底面(第二凹部)に簡単に接触するた
め抵抗力が強く耐久性が向上する。(カード化による点
圧強度の低下を防止できる。)
When the IC card is deflected and stress is applied to the IC module, the external terminal board, which is more flexible than the card base, is not stressed, and the portion where the outer periphery of the resin mold portion contacts the terminal board [FIG. Since the stress is concentrated on B) in (1), the IC module can be prevented from being broken by absorbing the stress in the stress relaxation groove portion provided at the stress concentration position of the adhesion portion with the card base. The decrease in the adhesive strength due to the provision of the stress relaxation groove can secure a sufficient adhesive strength in spite of the decrease in the adhesive area because the module outer periphery and the corner effective portion for adhesion can be secured. In addition, since the terminal board at the bonded portion is flexible and the stress relaxation groove is provided on the outer periphery of the mold housing, sufficient clearance can be secured. Therefore, the resin mold can be applied against the pressing force (point pressure) from the external terminal surface. Since the bottom surface of the portion easily contacts the bottom surface (second recess) of the storage portion, the resistance is strong and the durability is improved. (It is possible to prevent the drop of point pressure strength due to carding.)

【0014】[0014]

【実施例】実施例について図面を参照して詳細に説明す
る。図1は本発明のICカードをたわめた状態の断面模
式図である。図2は本発明で用いるICモジュールを示
す図である。図2(b)は本発明の実施例1のICカー
ド用のICモジュールの断面図で、図2(a)はその上
平面図である。尚、図2(b)は図2(a)のA1−A
2における断面図である。図2中、200はICモジュ
ール、210は基材(端子基板)、220はICチッ
プ、230は封止樹脂、240は封止枠、250は端子
部、251は端子、252は絶縁溝、280はワイヤで
ある。図3は、図1のカード基体を凹部側から見た平面
図である。
Embodiments will be described in detail with reference to the drawings. FIG. 1 is a schematic sectional view of a bent state of the IC card of the present invention. FIG. 2 is a diagram showing an IC module used in the present invention. 2B is a sectional view of an IC module for an IC card according to the first embodiment of the present invention, and FIG. 2A is a plan view thereof. Note that FIG. 2B shows A1-A of FIG.
It is sectional drawing in 2. In FIG. 2, 200 is an IC module, 210 is a base material (terminal substrate), 220 is an IC chip, 230 is a sealing resin, 240 is a sealing frame, 250 is a terminal portion, 251 is a terminal, 252 is an insulating groove, 280. Is a wire. FIG. 3 is a plan view of the card substrate of FIG. 1 seen from the recess side.

【0015】〔実施例1〕 ICモジュールの製造 図2において、基材(端子基板)210としては、フレ
キシブルな、ガラスエポキシからなる100μm厚を用
いた。これは、通常のICカード基体(基板)であるポ
リ塩化ビニルよりもたわみやすい柔軟なものである。ガ
ラスエポキシの他には、ポリイミド、ポリエステル、紙
フェノール、BTレジン等を基材として用いても良い。
基材210の厚みは、メッキを含め総厚30〜120μ
mが望ましい。端子部からの押圧に対しするクッション
性からは、出来るだけ基材の厚みを多くとった方が好ま
しい。ポリイミドを基材として用いる場合、厚みをかせ
ぐ意味から多層にせざるを得ないが、この場合、接着剤
を用いることなく、銅箔に直接ポリイミドをコーテイン
グしたもの、もしくは、層間の貼り合わせに熱可塑製の
ポリイミドを用いたものがある。いずれの場合も、封止
樹脂と基板との接着強度よりも層間の剥離強度が大きい
ことが必要で、2Kg以上の強度が必要である。基材
(端子基板)210に積層して設けられた銅箔を製版、
エッチングして、フレキシブルな基材210の表裏に配
線部、端子部等を設けるが、銅箔としては、圧延銅箔、
電解銅箔いずれもでの使用も可能である。基材210と
の密着性の点およびコストの点では電解銅箔が適してい
るが、柔軟性の点では圧延銅箔が適している。端子25
1へのメッキは、硬質金メッキ、軟質金メッキ、銀メッ
キいずれも使用することができるが、信頼性の点から
は、硬質メッキが適し、耐摩耗性からは、厚み1μm以
上が好ましい。封止樹脂230としては、ICチップ
(半導体素子)220を保護する点で、ICチップ(半
導体素子)220より高強度、低変形性の封止樹脂が好
ましく、実用上ではJIS K6911の曲げ弾性率1
400Kg/mm2 以上、曲げ破壊強度11Kg/mm
2 以上の高強度、低変形性のものであれば、ICチップ
破壊防止の点では効果的で、破壊時のたわみ量1.3以
下のものが好ましい。このような高強度、低変形性の樹
脂は、従来のトランスファーモールド樹脂を上回る強度
を持つものであるが、本実施例では、常温で液状のエポ
キシ封止用樹脂に対し、エポキシ樹脂の架橋密度を向上
させ、且つ、充填剤(フィラー)形状を球状からフレー
ク状に変更することにより、樹脂封止後に所望の強度を
もつ封止樹脂230を得た。上記、常温で液状のエポキ
シ封止用樹脂の封止方法としては、一般的に用いられて
いるポッテイング方式、印刷方式の他に、液状封止用樹
脂の射出方式が挙げられるが、本実施例ICカード用I
Cモジュールの作製においては、液状封止用樹脂の射出
方式を用いた。封止枠240としては、封止樹脂230
よりも、高強度、低変形性のものであれば、ICカード
に搭載された場合のICカードの曲がり等の変形やIC
モジュールの外部端子面に直接応力が加わった場合に対
し、封止樹脂230を保護することができるものであ
り、本発明では、ガラスエポキシを用いた。ガラスクロ
スの直径が微細なもの程強度が優れるため、これにて強
度を調整した。具体的には、ガラスエポキシからなる封
止枠240としては、JIS K6911の曲げ弾性率
1600Kg/mm2 、曲げ破壊強度13Kg/mm2
以上の高強度、低変形性のものを用いた。本実施例の場
合は、端子面側のみ片面を配線した基材210の端子部
250側でない面にICチップ(半導体素子)220を
搭載し、ICチップ(半導体素子)220の電極パッド
(図示していない)と端子251との電気的接続を直接
ワイヤ280にて行ったもので、封止樹脂230を補強
する封止枠240を設けたものである。本実施例の場
合、外見上は、従来のICモジュールとは、封止枠24
0を設けている点を除き、他は殆ど変わらないが、使用
されている封止樹脂230や、基材210の強度が従来
のものと大きく異なる素材を用いて、チップクラックや
封止樹脂のクラックが発生しずらくなっている。
Example 1 Manufacture of IC Module In FIG. 2, as the base material (terminal substrate) 210, a flexible 100 μm thick glass epoxy was used. This is more flexible and flexible than polyvinyl chloride, which is an ordinary IC card substrate (substrate). Other than glass epoxy, polyimide, polyester, paper phenol, BT resin or the like may be used as a base material.
The thickness of the base material 210 is 30 to 120 μm including plating.
m is desirable. It is preferable that the thickness of the base material is as large as possible in terms of cushioning properties against the pressure from the terminal portion. When using polyimide as the base material, there is no choice but to use multiple layers from the viewpoint of increasing the thickness, but in this case, the copper foil is directly coated with polyimide without using an adhesive, or a thermoplastic resin is used for bonding between layers. There is one using a polyimide made in Japan. In any case, the peel strength between layers is required to be larger than the adhesive strength between the sealing resin and the substrate, and the strength is required to be 2 kg or more. Plate-making a copper foil laminated on the base material (terminal board) 210,
By etching, a wiring portion, a terminal portion, and the like are provided on the front and back of the flexible base material 210. As the copper foil, rolled copper foil,
It is also possible to use any of the electrolytic copper foils. Electrolytic copper foil is suitable in terms of adhesion to the substrate 210 and cost, but rolled copper foil is suitable in terms of flexibility. Terminal 25
Hard plating, soft gold plating, and silver plating can all be used for plating No. 1, but from the viewpoint of reliability, hard plating is suitable, and from the viewpoint of wear resistance, a thickness of 1 μm or more is preferable. The encapsulating resin 230 is preferably an encapsulating resin having higher strength and lower deformability than the IC chip (semiconductor element) 220 in terms of protecting the IC chip (semiconductor element) 220. In practice, the flexural modulus of JIS K6911 1
400 Kg / mm 2 or more, bending fracture strength 11 Kg / mm
As long as it has a high strength and low deformability of 2 or more, it is effective from the viewpoint of preventing IC chip breakage, and it is preferable that the amount of deflection at break is 1.3 or less. Such a high-strength, low-deformability resin has a strength higher than that of a conventional transfer molding resin. However, in this embodiment, the crosslinking density of the epoxy resin is different from that of the epoxy sealing resin which is liquid at room temperature. Was improved and the shape of the filler (filler) was changed from spherical to flake, whereby a sealing resin 230 having a desired strength after resin sealing was obtained. As a method for sealing the epoxy sealing resin which is liquid at room temperature, in addition to the generally used potting method and printing method, an injection method of a liquid sealing resin can be used. IC card I
In the production of the C module, a liquid sealing resin injection method was used. As the sealing frame 240, the sealing resin 230
Of high strength and low deformation, the deformation of the IC card when mounted on the IC card and the IC
The sealing resin 230 can be protected against the case where stress is directly applied to the external terminal surface of the module. In the present invention, glass epoxy is used. The finer the diameter of the glass cloth, the better the strength, so the strength was adjusted with this. Specifically, as a sealing frame 240 made of glass epoxy, flexural modulus 1600 kg / mm 2 of JIS K6911, bending fracture strength 13 kg / mm 2
The above high strength and low deformability was used. In the case of the present embodiment, the IC chip (semiconductor element) 220 is mounted on the surface of the base material 210 on which only one side of the terminal surface side is wired and not on the side of the terminal section 250, and the electrode pads (shown in the figure) No.) and the terminal 251 are directly electrically connected with the wire 280, and the sealing frame 240 for reinforcing the sealing resin 230 is provided. In the case of the present embodiment, it is apparent that the conventional IC module is different from the sealing frame 24.
Except for the fact that 0 is provided, the rest is almost the same, but chip cracks and sealing resin Cracks are less likely to occur.

【0016】カード基体の製造 ポリ塩化ビニルシートのカード基体に図1と図3に示す
ような第1凹部および第2凹部を形成する。次に、カー
ドのモールド収納部の外周に端子基板外周と平行する形
で♯形状の応力緩和溝を形成する。形成方法は、ルーテ
ィングなどの切削、インジェクションなどの成形、抜き
刃による押しつけなどの方法により、幅0.3〜2mm
程度の切り欠きを形成するものである。幅0.3mm以
下であると応力緩和効果が少なく、2mm以上になる
と、有効接着面積の減少からCOTの接着強度が低下す
る。切り欠きの深さは第一凹部以上、第二凹部以下であ
れば良いが、テストの結果0.45〜0.55mmの深
さが効果、カード裏面外観の点から適する。0.45m
m以下でだと応力緩和効果が少なく、0.55mm以上
であると、表面の亀裂が生じやすくなり、カード外観の
点からも不適である。
Manufacture of Card Substrate A card substrate of a polyvinyl chloride sheet is provided with first and second recesses as shown in FIGS. 1 and 3. Next, a # -shaped stress relaxation groove is formed on the outer periphery of the mold storage portion of the card in parallel with the outer periphery of the terminal substrate. The forming method is a method such as cutting such as routing, forming such as injection, and pressing with a punching blade, and the width is 0.3 to 2 mm.
It forms a notch of a certain degree. If the width is 0.3 mm or less, the stress relaxation effect is small, and if the width is 2 mm or more, the effective bonding area is decreased and the COT bonding strength is reduced. The depth of the notch may be greater than or equal to the first concave portion and less than or equal to the second concave portion, but as a result of the test, a depth of 0.45 to 0.55 mm is effective and suitable from the viewpoint of the appearance of the back surface of the card. 0.45m
If it is m or less, the stress relaxation effect is small, and if it is 0.55 mm or more, surface cracking is likely to occur, which is also unsuitable from the viewpoint of card appearance.

【0017】ICカードの製造と評価 でできたICモジュールを、でできたカード基体に
搭載してICカードとして使用してみたが、従来のIC
カードにみられた、ICカードの曲がり起因するICモ
ジュールの物理的故障を少なくできた。特に、ICチッ
プクラックは実使用上で顕著な低減が確認された。別
に、実施例1のICモジュールを実装備したICカード
について、図1のようにカードが不可逆的に変形するほ
どの大きさの撓みを与えたが、ICモジュールの物理的
故障は見られなかった。また、外部端子の中央部を直径
10mmの剛球で押圧してICが不良動作に至る荷重を
測定したところ、実施例1については20Kg以上を示
した。これに対して従来の技術に掲載した特開平2−8
0299号の実施例1(図5、図6)に相当する『基板
12と、この基板上に設けられたICチップ17と、I
Cチップ17を封止する樹脂モールド部19とを有する
ICモジュール11とICモジュール11を装着する凹
部35が形成されたカード基材30とを備え、前記カー
ド基材30の凹部は前記基板12を接着固定する比較的
浅い平面が略矩形状の第1凹部35aと、前記第1凹部
内部に設けられ前記樹脂モールド部19を受け入れる比
較的浅い平面が略矩形状の第2凹部35bとからなり、
前記第1凹部の周縁に沿って周縁切り欠き36を設ける
とともに、前記第1凹部に前記第2凹部と前記周縁切り
欠きとを連結しかつ前記周縁切り欠きに平行する連結切
り欠きを設けたICカード10』すなわち、溝切りCO
BタイプのICカードについては、6Kg程度であっ
た。
An IC module made by the manufacture and evaluation of an IC card was mounted on a card base made of and used as an IC card.
The physical failure of the IC module caused by the bending of the IC card, which was observed in the card, could be reduced. In particular, it was confirmed that IC chip cracking was remarkably reduced in actual use. Separately, the IC card actually equipped with the IC module of Example 1 was bent to such an extent that the card was irreversibly deformed as shown in FIG. 1, but no physical failure of the IC module was observed. . Further, when the central portion of the external terminal was pressed by a hard ball having a diameter of 10 mm and the load at which the IC failed was measured, it was 20 kg or more for Example 1. On the other hand, Japanese Unexamined Patent Publication No. 2-8 described in the prior art
No. 0299, which corresponds to Example 1 (FIGS. 5 and 6), a “substrate 12, an IC chip 17 provided on this substrate, and I”.
An IC module 11 having a resin mold portion 19 for encapsulating the C chip 17 and a card base 30 having a recess 35 for mounting the IC module 11 are provided. The recess of the card base 30 covers the substrate 12. A relatively shallow plane to be bonded and fixed has a substantially rectangular first concave portion 35a, and a relatively shallow plane provided inside the first concave portion for receiving the resin mold portion 19 has a substantially rectangular second concave portion 35b,
An IC provided with a peripheral cutout 36 along the peripheral edge of the first recess, and a connecting cutout that connects the second recess and the peripheral cutout to the first recess and is parallel to the peripheral cutout. Card 10 ", that is, grooved CO
For the B type IC card, it was about 6 kg.

【0018】[0018]

【発明の効果】本発明によるICカードは、カードが不
可逆的に変形するほどの大きなたわみが与えられても物
理的故障が生じることなく、ICの動作は良好であっ
た。外部端子中央を直径10mmの鋼球で押圧してIC
が動作不良に至る荷重を測定したところ、本発明のカー
ドは、従来カード(COBタイプ)の3倍以上の強度を
示した。(本発明カードの破壊強度が20Kg以上であ
るのに対して、従来カードでは6Kgであった。)
According to the IC card of the present invention, the operation of the IC is good without causing any physical failure even if the IC card is subjected to a large deflection that causes irreversible deformation. IC is pressed by pressing the center of the external terminal with a steel ball with a diameter of 10 mm.
When the load leading to malfunction was measured, the card of the present invention showed a strength three times or more that of the conventional card (COB type). (The breaking strength of the card of the present invention is 20 kg or more, whereas that of the conventional card is 6 kg.)

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のICカードをたわめた状態の断面模式
図である。
FIG. 1 is a schematic sectional view of a bent state of an IC card of the present invention.

【図2】本発明で用いるICモジュールを示す図であ
る。図2(b)は本発明の実施例1のICカード用のI
Cモジュールの断面図で、図2(a)はその上平面図で
ある。尚、図2(b)は図2(a)のA1−A2におけ
る断面図である。
FIG. 2 is a diagram showing an IC module used in the present invention. FIG. 2B shows the I for IC card of the first embodiment of the present invention.
2A is a sectional view of the C module, and FIG. Note that FIG. 2B is a cross-sectional view taken along line A1-A2 of FIG.

【図3】図1のカード基体を凹部側から見た平面図であ
る。本発明のカード基体のフレキシブル一層基板COT
用溝切りザグリ形状を示す平面図である。
FIG. 3 is a plan view of the card substrate of FIG. 1 viewed from the side of a recess. Flexible Single Layer Substrate COT of Card Base of the Present Invention
It is a top view which shows the groove cutting counterbore shape.

【図4】本発明のカード基体(電話カードタイプ)のフ
レキシブル一層基板COT用溝切りザグリ形状を示す平
面図である。
FIG. 4 is a plan view showing a grooved counterbore shape for a flexible single-layer substrate COT of a card substrate (telephone card type) of the present invention.

【図5】従来のICカードを説明するための側断面図で
ある。
FIG. 5 is a side sectional view for explaining a conventional IC card.

【図6】従来のICカードを説明するためのカード基材
の凹部を示す平面図である。
FIG. 6 is a plan view showing a concave portion of a card substrate for explaining a conventional IC card.

【符号の説明】[Explanation of symbols]

1 第1凹部(接着エリア) 2 第2凹部(モールド部 収納部) 3 応力緩和溝 4 外部端子基板 5 接着部 6 樹脂モールド 7 ICモジュール(COTモジュール) 10 ICカード 11 ICモジュール 12 基板 13 外部端子 13a 絶縁溝 14 スルーホール 15 パタン層 16 保護レジスト層 17 ICチップ 18 ボンディングワイヤ 19 樹脂モールド部 20 ダイボンディング接着剤 30 カード基材 34 接着剤 35 凹部 35a 第1凹部 35b 第2凹部 36 切欠 200 ICモジュール 210 基材(端子基板) 220 ICチップ 230 封止樹脂 240 封止枠 250 端子部 251 端子 252 絶縁溝 280 ワイヤ 1 1st recessed part (adhesion area) 2 2nd recessed part (mold part storage part) 3 Stress relaxation groove 4 External terminal board 5 Adhesive part 6 Resin mold 7 IC module (COT module) 10 IC card 11 IC module 12 Board 13 External terminal 13a Insulation groove 14 Through hole 15 Pattern layer 16 Protective resist layer 17 IC chip 18 Bonding wire 19 Resin mold part 20 Die bonding adhesive 30 Card base material 34 Adhesive 35 Recess 35a First recess 35b Second recess 36 Notch 200 IC module 210 Base Material (Terminal Substrate) 220 IC Chip 230 Sealing Resin 240 Sealing Frame 250 Terminal Part 251 Terminal 252 Insulation Groove 280 Wire

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 荷重に対して、カード基体よりも大きな
たわみ量を示す柔軟な端子基板と、この端子基板の一方
の面に設けた外部接続端子と、他方の面に設けられたI
Cチップ及びICチップを封止する樹脂モールド部とを
有するICモジュールと、ICモジュールを装備する凹
部が形成されたカード基体とを備え、前記カード基体の
凹部は前記端子基板を接着固定する比較的浅い平面の第
一凹部と、前記第一凹部の内側に設けられ前記樹脂モー
ルド部が接触しないように収納する第一凹部より深い第
二凹部とからなり、前記第一凹部の範囲内で、第二凹部
の外周部分の延長線上に、前記端子基板外周と平行に切
り欠きを設けることを特徴とするICカード。
1. A flexible terminal board that exhibits a greater amount of deflection than a card base body under load, external connection terminals provided on one surface of the terminal board, and I provided on the other surface.
An IC module having a C chip and a resin mold portion for encapsulating the IC chip, and a card base having a recess for mounting the IC module are provided, and the recess of the card base is used for bonding and fixing the terminal board. A first recess having a shallow plane and a second recess which is provided inside the first recess and is deeper than the first recess which is housed so as not to contact the resin mold portion, and within the range of the first recess, An IC card, characterized in that a notch is provided in parallel with the outer periphery of the terminal board on an extension of the outer periphery of the two recesses.
【請求項2】 前記切り欠き部の平面形状が♯形状であ
ることを特徴とする請求項1記載のICカード。
2. The IC card according to claim 1, wherein the notch portion has a planar shape of # shape.
【請求項3】 前記切り欠き部の第一凹部外周と接する
先端部分の平面形状が円弧状であることを特徴とする請
求項1または請求項2に記載のICカード。
3. The IC card according to claim 1, wherein a planar shape of a tip end portion of the cutout portion in contact with the outer periphery of the first recess is an arc shape.
【請求項4】 前記樹脂モールド部は封止枠を有してい
ることを特徴とする請求項1、請求項2または請求項3
に記載のICカード。
4. The resin mold portion has a sealing frame, claim 1, claim 2 or claim 3.
2. The IC card according to 1.
JP20657695A 1995-07-20 1995-07-20 IC card Expired - Fee Related JP3813205B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20657695A JP3813205B2 (en) 1995-07-20 1995-07-20 IC card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20657695A JP3813205B2 (en) 1995-07-20 1995-07-20 IC card

Publications (2)

Publication Number Publication Date
JPH0930170A true JPH0930170A (en) 1997-02-04
JP3813205B2 JP3813205B2 (en) 2006-08-23

Family

ID=16525694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20657695A Expired - Fee Related JP3813205B2 (en) 1995-07-20 1995-07-20 IC card

Country Status (1)

Country Link
JP (1) JP3813205B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999004367A1 (en) * 1997-07-18 1999-01-28 Dai Nippon Printing Co., Ltd. Ic module, ic card, sealing resin for ic module, and method for manufacturing ic module
EP2063383A1 (en) 2007-11-21 2009-05-27 Fujitsu Limited RFID tag and method of manufacturing the same
JP2019142011A (en) * 2018-02-16 2019-08-29 株式会社東芝 IC card

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999004367A1 (en) * 1997-07-18 1999-01-28 Dai Nippon Printing Co., Ltd. Ic module, ic card, sealing resin for ic module, and method for manufacturing ic module
EP2063383A1 (en) 2007-11-21 2009-05-27 Fujitsu Limited RFID tag and method of manufacturing the same
US7916029B2 (en) 2007-11-21 2011-03-29 Fujitsu Limited RFID tag and method for manufacturing the same
JP2019142011A (en) * 2018-02-16 2019-08-29 株式会社東芝 IC card

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