JPH09269602A - Manufacture of electrophotographic photoreceptor - Google Patents

Manufacture of electrophotographic photoreceptor

Info

Publication number
JPH09269602A
JPH09269602A JP8099491A JP9949196A JPH09269602A JP H09269602 A JPH09269602 A JP H09269602A JP 8099491 A JP8099491 A JP 8099491A JP 9949196 A JP9949196 A JP 9949196A JP H09269602 A JPH09269602 A JP H09269602A
Authority
JP
Japan
Prior art keywords
cleaning
substrate
cleaning material
photosensitive member
electrophotographic photosensitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8099491A
Other languages
Japanese (ja)
Other versions
JP3723631B2 (en
Inventor
Susumu Taguchi
将 田口
Masakatsu Murayama
正勝 村山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Chemical Corp
Original Assignee
Mitsubishi Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Chemical Corp filed Critical Mitsubishi Chemical Corp
Priority to JP09949196A priority Critical patent/JP3723631B2/en
Publication of JPH09269602A publication Critical patent/JPH09269602A/en
Application granted granted Critical
Publication of JP3723631B2 publication Critical patent/JP3723631B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Photoreceptors In Electrophotography (AREA)
  • Cleaning In General (AREA)

Abstract

PROBLEM TO BE SOLVED: To attain homogeneous cleaning and to draw out physical detergency up to almost the upper limit of a range where the surface of a substrate is not damaged by scanning the full surface of the conductive substrate, while keeping the contact state of the same part of a sliding cleaning material constant. SOLUTION: This photoreceptor is constituted of the conductive substrate 1 (its center axis 2) as a material to be cleaned, the sliding cleaning material 3 (its center axis 4 and the relative moving direction 5 of the sliding cleaning material) and a contact part 6. Then, the substrate 1 is restrained by a clamping mechanism in the end part or inside and rotated on the center axis 2 of the substrate 1 as the axis of rotation by an external mechanism. The sliding cleaning material 3 is deformed in the contact part, to impart the physical detergency. For instance, a brush, a sponge, etc., are exemplified. The sliding cleaning material 3 is reduced in size and weight, so that a high-speed rotation is attained and a processing speed is increased. The rotational direction is set to be a vertical direction in the contact part with the material to be cleaned and the resticking of soiling is prevented. Moreover, an angle formed by two axis 2 and 4 is 90 deg..

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は電子写真感光体の製
造方法に関するものであり、詳しくは電子写真感光体用
の導電性基体の洗浄方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing an electrophotographic photosensitive member, and more particularly to a method for cleaning a conductive substrate for an electrophotographic photosensitive member.

【0002】[0002]

【従来の技術】一般的に電子写真感光体は円筒状の導電
性基体に光導電層を形成したものである。この円筒状導
電性基体としてはアルミニウム、鉄、ステンレス、銅、
亜鉛、ニッケル、導電化処理したプラスチック、ガラス
等が材料として挙げられるが、これらの中では比較的安
価、軽量で加工性が良く、電気特性を損なわないアルミ
ニウムが広く用いられている。
2. Description of the Related Art Generally, an electrophotographic photosensitive member is one in which a photoconductive layer is formed on a cylindrical conductive substrate. The cylindrical conductive substrate includes aluminum, iron, stainless steel, copper,
Examples of the material include zinc, nickel, conductive plastic, and glass. Among these, aluminum is widely used because it is relatively inexpensive, lightweight, has good workability, and does not impair electrical characteristics.

【0003】通常、アルミニウムを円筒状の基体として
用いる場合は、アルミニウムビレットをポートホール
法、マンドレル法等により押出管に加工し、続いて所定
の肉厚、外径寸法の円筒とするため、引抜加工、インパ
クト加工、しごき加工、あるいは切削による鏡面加工を
行うことで作ることができる。また、ちりかぶり等の画
像欠陥を防止するために基体表面に陽極酸化皮膜を形成
する場合もある。基体表面は引抜油や鏡面加工に用いる
切削油、空気中のダスト、切粉、陽極酸化皮膜形成時の
封孔剤等が付着するため、基体表面を洗浄処理してこれ
らを除去した後に光導電層が設けられる。光導電層とし
ては無機系、有機系の各種光導電層が使用できるが、電
荷発生層と電荷移動層からなる積層型光導電層が極めて
有用である。
Usually, when aluminum is used as a cylindrical substrate, an aluminum billet is processed into an extruded tube by a porthole method, a mandrel method or the like, and then a cylinder having a predetermined wall thickness and outer diameter is formed, so that it is drawn out. It can be made by processing, impact processing, ironing, or mirror finishing by cutting. In addition, an anodized film may be formed on the surface of the substrate in order to prevent image defects such as dust fog. The drawing oil, cutting oil used for mirror finishing, dust in the air, cutting chips, and a sealing agent at the time of forming an anodic oxide film adhere to the surface of the base material, so the surface of the base material is cleaned and removed to remove photoconductivity. Layers are provided. As the photoconductive layer, various inorganic and organic photoconductive layers can be used, but a laminated photoconductive layer including a charge generation layer and a charge transfer layer is extremely useful.

【0004】電荷発生層および電荷移動層は、電荷発生
層および電荷移動層を構成する物質をそれぞれ含有する
塗布液に、円筒状導電性基体を公知の方法で浸漬するこ
とによって該基体の表面に形成される。この浸漬塗布方
法としては例えば特開昭49−130736、特開昭5
7−5047および特開昭59−46171各号公報に
示される方法が挙げられる。浸漬塗布方法において前処
理である導電性基体表面の洗浄が不十分であると、その
表面に加工油やダスト、陽極酸化皮膜形成時の封孔剤等
が付着したまま残り、塗布の際に塗布ムラや異物等の塗
布欠陥原因となる。このような電子写真感光体上に発生
した欠陥は、画像上黒点、白点、ハーフトーン画像ムラ
等として現れ、品質に悪影響を及ぼすため、実用に適さ
ない。
The charge generating layer and the charge transfer layer are formed on the surface of the cylindrical conductive substrate by immersing the cylindrical conductive substrate in a coating method containing the substances constituting the charge generating layer and the charge transfer layer by a known method. It is formed. Examples of the dip coating method include JP-A-49-130736 and JP-A-5-
7-5047 and the methods disclosed in JP-A-59-46171. If the surface of the conductive substrate, which is a pretreatment in the dip coating method, is insufficiently cleaned, processing oil, dust, and a sealing agent used for forming the anodic oxide film will remain on the surface and will be applied during coating. It causes coating defects such as unevenness and foreign matter. Such defects generated on the electrophotographic photosensitive member appear as black spots, white spots, uneven halftone images on the image, and adversely affect the quality, and are not suitable for practical use.

【0005】基体表面の洗浄方法としては、必要に応じ
て加温された有機溶媒中に、基体を浸漬処理または超音
波の作用下で浸漬する浸漬洗浄、基体を溶媒に浸漬し、
または基体に溶媒を振りかけながら、ブラシやスポンジ
等の擦り洗浄材により物理的洗浄力を与える擦り洗浄、
溶媒を高圧下でノズルより基体表面に噴出するジェット
洗浄、溶媒蒸気中に基体を挿入する蒸気洗浄等の方法が
挙げられ、これらの組み合わせにより基体表面の洗浄が
行われている。ただし、実際の洗浄機では、洗浄剤自身
の溶解力だけでは洗浄力が不十分であり、超音波におい
ては対象とする汚れ粒子がμmオーダーと小さかったり
空間的位置によって洗浄力が異なるなど制約が多い等の
理由から、ブラシやスポンジ等を用いた擦り洗浄工程は
洗浄プロセス中の核として用いられている。
As the method for cleaning the surface of the substrate, immersion cleaning is carried out by immersing the substrate in an organic solvent heated as necessary or under the action of ultrasonic waves, and the substrate is immersed in a solvent.
Alternatively, while sprinkling the solvent on the substrate, a rubbing cleaning that gives a physical cleaning power by a rubbing cleaning material such as a brush or sponge,
Methods such as jet cleaning in which a solvent is jetted from the nozzle onto the surface of the substrate under high pressure, vapor cleaning in which the substrate is inserted into solvent vapor, and the like are mentioned, and the combination thereof is used to clean the surface of the substrate. However, in an actual cleaning machine, the dissolving power of the cleaning agent itself is not sufficient for cleaning, and ultrasonic waves have restrictions such as the target dirt particles being small on the order of μm and the cleaning power differing depending on the spatial position. For many reasons, the scrubbing cleaning step using a brush or sponge is used as the core of the cleaning process.

【0006】一般的に基体表面を擦り洗浄しようとする
場合、図3に示すように被洗浄物である導電性基体1を
中心軸2が鉛直方向になるように配置して、中心軸2を
軸として回転させながら、基体1より実質的に長尺であ
る円柱状の擦り洗浄材3をその中心軸4が2と同様に鉛
直方向になるよう配置して4を軸として接触回転させ、
接触部に連続的に洗浄液を供給するような洗浄方式が採
られる。
Generally, when the surface of a substrate is to be cleaned by rubbing, the conductive substrate 1 which is the object to be cleaned is arranged with the central axis 2 in the vertical direction as shown in FIG. While rotating about the axis, a cylindrical scrubbing cleaning material 3 which is substantially longer than the base 1 is arranged so that its central axis 4 is in the vertical direction like 2 and is contact rotated about the axis 4.
A cleaning method in which a cleaning liquid is continuously supplied to the contact portion is adopted.

【0007】ここで回転軸を鉛直方向にするのは、導電
性基体の液切れを良くすること、洗浄後の塵埃付着を抑
制すること、搬送機構が簡潔にできること等の理由によ
る。擦り洗浄材としてはブラシ、スポンジ等が用いられ
ており、洗浄液としては1,1,1−トリクロロエタン
やトリクロロエチレンといった有機溶剤が多く用いられ
ているが、環境への問題対策上これらの利用を抑制する
要求が高まっており、炭化水素系、アルコール系、水系
等の洗浄剤に置き変わる傾向にある。
The reason why the axis of rotation is vertical is that the conductive substrate is well drained, dust adhesion after cleaning is suppressed, and the transport mechanism can be simplified. Brushes, sponges, etc. are used as scrubbing cleaning agents, and organic solvents such as 1,1,1-trichloroethane and trichlorethylene are often used as cleaning fluids, but use of these is suppressed as a countermeasure against environmental problems. Demand is increasing, and there is a tendency to replace hydrocarbon-based, alcohol-based, water-based, etc. detergents.

【0008】[0008]

【発明が解決しようとする課題】図3に示す従来式の洗
浄法に見られるような基体と擦り洗浄材の回転軸が実質
的に平行な位置関係にある場合、擦り洗浄材の特定部分
が基体表面の特定部分に選択的に接触することにより、
擦り洗浄材側の不均一さが基体表面に転写される問題が
生じる。すなわち、一般に使用されている洗浄装置で
は、基体と擦り洗浄材の回転軸が厳密な意味で平行では
ない場合が多いことから、基体の回転軸方向に擦り洗浄
材の押し付け圧力分布が生じて洗浄ムラとなる場合があ
る。
When the rotation axis of the substrate and the rubbing cleaning material are in a substantially parallel positional relationship as in the conventional cleaning method shown in FIG. 3, a specific portion of the rubbing cleaning material is By selectively contacting a specific part of the substrate surface,
There arises a problem that unevenness on the side of the cleaning material is transferred to the surface of the substrate. In other words, in a commonly used cleaning device, the rotation axis of the scrubbing cleaning material is not parallel to the rubbing cleaning material in a strict sense in many cases. It may be uneven.

【0009】また、例えば擦り洗浄材としてブラシを用
いる場合、厳密な意味でブラシの植え込み密度や各部で
の毛足の長さを均一にすることが一般的には考慮されな
いことから基体の回転軸方向に圧力分布が生じることは
不可避であり、洗浄ムラが生じたり接触圧力の高い箇所
では基体表面に傷が付くなどの問題が生じやすい。当然
これらの問題はブラシ以外の擦り洗浄材でも生じ得る。
さらに、感光体の品種によって基体の大きさや形状が異
なるため、擦り洗浄材の摩耗は回転軸方向に不均一に生
じ、これによっても洗浄ムラが生じやすい。これらの洗
浄ムラやブラシ傷は、感光体層形成後の画像検査で白す
じや黒すじ、白点や黒点といった画像欠陥につながるた
め、品質上大きな問題となる。
Further, when a brush is used as a scrubbing cleaning material, for example, in a strict sense, it is not generally taken into consideration that the density of the brush is planted and the length of the bristle at each part is considered. It is unavoidable that a pressure distribution is generated in the direction, and problems such as uneven cleaning and scratches on the surface of the substrate are apt to occur at locations where the contact pressure is high. Of course, these problems can occur with scrubbing cleaning materials other than brushes.
Furthermore, since the size and shape of the substrate differ depending on the type of the photoconductor, the abrasion of the scrubbing cleaning material occurs unevenly in the rotation axis direction, and this also easily causes uneven cleaning. These cleaning irregularities and brush scratches cause image defects such as white streaks, black streaks, white spots and black spots in the image inspection after the photoconductor layer is formed, and thus become a serious quality problem.

【0010】仮にこの問題を考慮した擦り洗浄材を作成
する場合、擦り洗浄材は少なくとも対象とする最長の被
洗浄物以上の長さが必要であり、さらに接触面全面が均
質であることが必要なため、製造に際しては相当の技術
と細心の注意が要求されコストを押し上げることになる
が、これは消耗品としてふさわしくないことである。ま
た、摩耗等に起因する欠陥が一部に生じるだけで使用不
可となることもコストを押し上げる一因となる。
If a scrubbing cleaning material is prepared in consideration of this problem, the scrubbing cleaning material needs to have at least a length equal to or longer than the longest object to be cleaned, and further, the entire contact surface must be uniform. Therefore, a considerable amount of technology and careful attention are required in manufacturing, which increases the cost, but this is not suitable as a consumable item. In addition, the fact that defects due to wear or the like only partially occur makes it unusable also contributes to the cost increase.

【0011】これら以外にも、擦り洗浄材の回転軸方向
が鉛直に近い場合に、基体表面の汚れとともに流れ落ち
る洗浄液が擦り洗浄材の下部に溜まることにより基体表
面が再汚染されることも生じるなど、多岐に渡る問題が
生じている。すなわち、以上述べたような従来式の洗浄
方法では、電子写真用の導電性基体を均一に洗浄するこ
とは機構上実質的に困難であることから、新しい洗浄方
式の開発が望まれていた。
In addition to the above, when the rotation axis direction of the scrubbing cleaning material is close to vertical, the cleaning liquid that flows down along with the dirt on the surface of the substrate accumulates at the bottom of the scrubbing cleaning material, and the surface of the substrate may be re-contaminated. , There are a wide variety of problems. That is, in the conventional cleaning method as described above, it is substantially difficult to uniformly clean the electroconductive substrate for electrophotography. Therefore, the development of a new cleaning method has been desired.

【0012】[0012]

【課題を解決するための手段】そこで本発明者等は、こ
れらの問題を解決する電子写真感光体用導電性基体の新
規洗浄法に関して鋭意検討した結果、円筒状である基体
と擦り洗浄材を両者の回転軸が幾何学的にねじれの関係
あるいは交差する位置関係に配置し、互いに接触回転さ
せながら相対的に擦り洗浄材を基体の回転軸方向に移動
することで、前記問題点を克服し均一な洗浄を実現でき
ることを見出し、本発明に到達した。即ち、本発明は、
被洗浄物である電子写真感光体用の円筒状導電性基体
を、その中心軸を回転軸として回転させ、一方、擦り洗
浄材を、前記基体の回転軸と幾何学上実質的にねじれの
関係にある軸を回転軸として回転させ、接触させなが
ら、前記基体の回転軸方向に相対的に移動させて洗浄す
ることを特徴とする、電子写真感光体の製造方法を要旨
とするものである。
The inventors of the present invention have diligently studied a new method for cleaning a conductive substrate for an electrophotographic photosensitive member which solves these problems, and as a result, have found that a cylindrical substrate and a scrubbing cleaning material are used. The rotating shafts of the two are arranged in a geometrical twisting relationship or a positional relationship where they intersect with each other, and the rubbing cleaning material is relatively moved in the rotating shaft direction of the base body while rotating in contact with each other to overcome the above problems. The present invention has been accomplished by finding that uniform cleaning can be realized. That is, the present invention
A cylindrical conductive substrate for an electrophotographic photosensitive member, which is an object to be cleaned, is rotated with its central axis as a rotation axis, while the scrubbing cleaning material is geometrically substantially twisted with respect to the rotation axis of the substrate. The gist of the present invention is to provide a method for manufacturing an electrophotographic photosensitive member, which comprises rotating the shaft of FIG.

【0013】[0013]

【発明の実施の形態】図1および図2において1は被洗
浄物である電子写真感光体用の導電性基体、2は基体の
中心軸、3は擦り洗浄材、4は擦り洗浄材の中心軸、5
は擦り洗浄材の相対的な移動方向、6は接触部分を示
す。図1および図2の1に示す基体は、端部または内部
で把持機構により拘束され、図1および図2の2に示す
基体の中心軸を回転軸として外部駆動機構により回転す
る。
1 and 2, 1 is a conductive substrate for an electrophotographic photosensitive member which is an object to be cleaned, 2 is a central axis of the substrate, 3 is a scrubbing cleaning material, 4 is a scrubbing cleaning material center Axis, 5
Is a relative moving direction of the scrubbing cleaning material, and 6 is a contact portion. The base body 1 shown in FIGS. 1 and 2 is constrained by a gripping mechanism at an end or inside, and is rotated by an external drive mechanism with the central axis of the base body 2 shown in FIGS. 1 and 2 as a rotation axis.

【0014】図3に示す従来式の洗浄法では、基体はそ
の母線全体に擦り洗浄材から力を受けることから、基体
の両端部を支持して基体の回転を安定させる必要がある
が、図1および図2に示す本発明の洗浄法では洗浄部位
が限定されるため基体に加わる力が弱く、一端側からの
みで支持することが可能となり機構が簡略化できる利点
がある。また、従来式の洗浄法では、擦り洗浄材の同一
箇所が被洗浄物の特定部分に繰り返し接触することか
ら、局所的に接触圧力が大きくなる箇所で基体に傷がつ
きやすい欠点があるが、本発明の洗浄法では機構的理由
から本質的にこのような問題は発生し得ない。
In the conventional cleaning method shown in FIG. 3, since the base is rubbed over the generatrix of the base and receives a force from the cleaning material, it is necessary to support both ends of the base to stabilize the rotation of the base. In the cleaning method of the present invention shown in FIGS. 1 and 2, since the cleaning site is limited, the force applied to the substrate is weak, and it is possible to support only from one end side, and the mechanism can be simplified. Further, in the conventional cleaning method, since the same portion of the scrubbing cleaning material repeatedly contacts a specific portion of the object to be cleaned, there is a drawback that the substrate is easily scratched at a portion where the contact pressure locally increases. The cleaning method of the present invention essentially does not cause such a problem for mechanical reasons.

【0015】さらに、従来式の洗浄法では、接触圧力が
最大になる箇所において接触圧力を基体が傷つかない程
度まで落とす必要が生じるが、この場合接触圧力が小さ
くなる箇所では洗浄不良が生じやすくなる。対策として
は、例えば毛足の柔らかい線径の細いブラシを用いるこ
とで各部位での接触圧力差を抑えているが、傷が付かな
い範囲内で許容される物理洗浄力の上限までは使いきれ
ないのが現状である。それに対して本発明の洗浄法で
は、機構上基体各部での接触圧力の差を小さくできるた
め、許容される物理的洗浄力の上限まで使いきることが
可能である。
Further, in the conventional cleaning method, it is necessary to drop the contact pressure at the point where the contact pressure is maximized to such an extent that the substrate is not damaged. In this case, however, cleaning failure is likely to occur at the point where the contact pressure is low. . As a countermeasure, the contact pressure difference at each site is suppressed by using, for example, a brush with soft bristles and a fine wire diameter, but the upper limit of the physical cleaning power allowed within the range where scratches do not occur can be used up. The current situation is that there are none. On the other hand, in the cleaning method of the present invention, the difference in contact pressure between the various parts of the substrate can be reduced mechanically, so that the maximum allowable physical cleaning power can be used up.

【0016】図1および図2の3に示す擦り洗浄材は、
実質的に被洗浄物に比較して柔かく、接触部において変
形することで物理的洗浄力を与えるものであり、例えば
ブラシ、スポンジ等が、コスト面や製造が容易な点から
好適なものとして挙げられる。材質としては、ナイロ
ン、ポリプロピレン等任意に選ぶことができる。水系洗
浄のときにはポリプロピレンが好ましく、有機溶媒系洗
浄であればナイロンが好ましい。擦り洗浄材の形状は図
1および図2の中心軸4の軸周りに回転対称であること
が望ましい。大きさは実質的に被洗浄体より小さく、回
転軸方向各部の直径Dは最大部においてD≦10cm、
回転軸方向の長さLはL≦10cmであることが次の理
由および回転または移動の構造を複雑にすることがない
ことから望ましい。
The scrubbing cleaning material shown in 3 of FIGS. 1 and 2 is
It is substantially softer than the object to be cleaned, and gives physical cleaning power by being deformed at the contact portion. For example, brushes, sponges, etc. are preferable as they are cost effective and easy to manufacture. To be As a material, nylon, polypropylene or the like can be arbitrarily selected. Polypropylene is preferred for water-based cleaning, and nylon is preferred for organic solvent-based cleaning. The shape of the scrubbing cleaning material is preferably rotationally symmetrical about the central axis 4 in FIGS. 1 and 2. The size is substantially smaller than the object to be cleaned, and the diameter D of each part in the rotation axis direction is D ≦ 10 cm at the maximum part,
It is desirable that the length L in the direction of the rotation axis be L ≦ 10 cm for the following reason and because it does not complicate the structure of rotation or movement.

【0017】すなわち、擦り洗浄材は外部駆動機構によ
り回転するが、このように擦り洗浄材を小型軽量化する
ことにより高速回転が実現でき、処理速度の向上が可能
となる。また、小型化することでコスト面でも優れ、高
速回転による遠心力増大の効果として、物理的洗浄力の
向上や洗浄液が外部に排出されやすくなることによる擦
り洗浄材自身の自浄作用といった長所がある。接触部付
近での回転数は、要求される洗浄処理速度や被洗浄物表
面への影響あるいは擦り洗浄材の摩耗等の諸条件を考慮
して適切な値を決定するものとする。通常用いられる条
件としてはブラシ側が100〜1000rpm、基体は
100〜400rpm程度の範囲で選ばれる。図1に示
す洗浄方法における擦り洗浄材の回転方向は、被洗浄物
との接触部分において実質的に鉛直方向下向きとなるよ
うに定めることが、汚れの再付着を防止する意味でより
望ましい。
That is, the scrubbing cleaning material is rotated by an external drive mechanism, but by reducing the size of the scrubbing cleaning material as described above, high-speed rotation can be realized and the processing speed can be improved. In addition, miniaturization is also excellent in cost, and as an effect of increasing centrifugal force due to high-speed rotation, there are advantages such as improvement of physical cleaning power and self-cleaning action of the rubbing cleaning material itself due to easy discharge of cleaning liquid to the outside. . The number of rotations in the vicinity of the contact portion is determined to be an appropriate value in consideration of various conditions such as the required cleaning processing speed, the effect on the surface of the object to be cleaned, and the abrasion of the scrubbing cleaning material. As the conditions usually used, the brush side is selected in the range of 100 to 1000 rpm, and the substrate is selected in the range of about 100 to 400 rpm. In the cleaning method shown in FIG. 1, it is more desirable that the rotation direction of the scrubbing cleaning material is set to be substantially downward in the vertical direction at the contact portion with the object to be cleaned in order to prevent redeposition of dirt.

【0018】図1において2と4の2軸は幾何学上空間
的にねじれの関係にあるが、接触部分において被洗浄物
である基体の移動方向と擦り洗浄材の移動方向が交差す
ることにより、擦り洗浄材の不均質さに起因した洗浄ム
ラが抑制できるという考えから、2軸のなす角度を実質
的に90°とすることが好ましい。図2において2と4
の2軸は交差しておればよいが、接触部分における擦り
洗浄材各部の移動方向を複雑にすることにより、擦り洗
浄材の不均質さに起因した洗浄ムラが抑制できるという
考えから、2軸のなす角度を実質的に90°とすること
が好ましい。
In FIG. 1, the two axes of 2 and 4 are geometrically spatially twisted, but because the moving direction of the substrate, which is the object to be cleaned, and the moving direction of the scrubbing cleaning material intersect at the contact portion. It is preferable that the angle formed by the two axes is substantially 90 °, considering that cleaning unevenness due to inhomogeneity of the cleaning material can be suppressed. 2 and 4 in FIG.
The two axes may intersect, but from the idea that the uneven cleaning due to the non-uniformity of the scrubbing cleaning material can be suppressed by making the moving direction of each part of the scrubbing cleaning material in the contact portion complicated. It is preferable that the angle formed by is substantially 90 °.

【0019】図1および図2の5に示す擦り洗浄材の相
対移動方向は、図1および図2の2の基体の中心軸であ
る回転軸と平行であり、擦り洗浄材と基体表面は実質的
に常時等距離に保たれることから、部位によらず均一な
接触状態が得られる。なお、工業的には基体側を移動す
る方がより現実的で好ましいが、擦り洗浄材側を移動す
るあるいは基体と擦り洗浄材両方を移動しても構わな
い。相対移動の行程は、少なくとも接触部が基体の回転
軸方向に関して一端から他の一端までを含むようなもの
とする。相対移動の向きは、被洗浄物に対して擦り洗浄
材が実質的に鉛直方向下向きとなるような方向に定める
ことが、洗浄後の洗浄液が基体表面へ再付着を防ぐ上で
望ましい。
The relative movement direction of the scrubbing cleaning material shown in 5 of FIGS. 1 and 2 is parallel to the rotation axis which is the central axis of the substrate of 2 of FIGS. 1 and 2, and the scrubbing cleaning material and the surface of the substrate are substantially. Since it is always kept equidistant, a uniform contact state can be obtained regardless of the part. Industrially, it is more realistic and preferable to move the substrate side, but it is also possible to move the rubbing cleaning material side or both the substrate and the rubbing cleaning material. The relative movement process is such that at least the contact portion includes one end to the other end with respect to the rotation axis direction of the base body. It is desirable to set the direction of relative movement so that the cleaning material is rubbed against the object to be cleaned so as to be substantially downward in the vertical direction in order to prevent the cleaning liquid after cleaning from reattaching to the substrate surface.

【0020】相対移動速度Vは、基体表面において未接
触部が存在しないように、すなわち、基体表面における
接触面の回転軸方向長さの最大値を1とし、基体の回転
速度をωとするとき、V<1ωなる範囲で定めることが
好ましい。ただし、揺動を伴う等特殊な移動方式とする
場合にはこの規制範囲外の速度とすることもありうる。
なお、処理回数は基本的に1回とするが、複数回処理を
しても構わない。複数回処理する場合も、洗浄方向は鉛
直方向下向きとして繰り返すことが往復運動させるより
も好ましいが、生産性を考慮して最終回が鉛直方向下向
きとなるような往復運動としても構わない。
The relative movement speed V is set so that there is no uncontacted portion on the surface of the substrate, that is, when the maximum value of the length of the contact surface in the rotation axis direction on the surface of the substrate is 1 and the rotation speed of the substrate is ω. , V <1ω. However, when a special movement method such as rocking is used, the speed may be out of the regulation range.
Note that the number of times of processing is basically one, but the processing may be performed a plurality of times. In the case of performing the treatment a plurality of times, it is preferable to repeat the cleaning direction downward in the vertical direction rather than repeating the reciprocating movement, but in consideration of productivity, the final cleaning may be performed in the vertical downward direction.

【0021】図1および図2の6に示す擦り洗浄材と基
体表面との接触箇所には洗浄液を供給することが好まし
く、さらに液供給は実質的に連続であることが好ましい
が、乾式としたり間欠供給とすることも必要に応じて実
施して構わない。洗浄液の供給方法としては洗浄部位に
選択的に供給する方法や、接触部位を洗浄液中に置いて
洗浄する方法等があるが、汚れ再付着の防止対策上前者
の供給方法が好ましく、さらには洗浄部位より上方から
供給して、洗浄液の流れを実質的に鉛直方向下向きにす
ることがより好ましい。なお、使用する洗浄液としては
水、水系洗浄剤、有機系洗浄剤、有機溶媒等が挙げられ
るが、これらに限定するものではない。
It is preferable to supply a cleaning liquid to the contact portion between the scrubbing cleaning material and the surface of the substrate shown in 6 of FIGS. 1 and 2, and it is preferable that the liquid supply is substantially continuous, but a dry system is also used. Intermittent supply may be carried out as necessary. As a method of supplying the cleaning liquid, there are a method of selectively supplying to the cleaning site and a method of cleaning by placing the contact site in the cleaning liquid, but the former supply method is preferable for preventing redeposition of stains, and further cleaning It is more preferable that the cleaning liquid is supplied from above the portion so that the flow of the cleaning liquid is substantially vertically downward. Examples of the cleaning liquid to be used include, but are not limited to, water, an aqueous cleaning agent, an organic cleaning agent, an organic solvent, and the like.

【0022】[0022]

【実施例】以下、実施例により本発明を具体的に説明す
るが、本発明はこれら実施例に限定されるものではな
い。 実施例1 導電性基体の製造から長期間保管の後に洗浄および感光
体層形成を行った電子写真感光体において、従来式の洗
浄法で洗浄したものでは基体保管時の下端側に相当する
箇所で画像白すじ欠陥の発生が多く見られる問題があっ
た。そこでこの問題に対する本発明の洗浄法の効果を確
認するため、基体の洗浄後に実際に感光体層を形成して
画像による評価を行った。
EXAMPLES The present invention will be described below in detail with reference to examples, but the present invention is not limited to these examples. Example 1 An electrophotographic photosensitive member which has been washed and formed with a photosensitive layer after being stored for a long time since the production of a conductive substrate, and the electrophotographic photosensitive member washed by a conventional cleaning method is at a portion corresponding to the lower end side during storage of the substrate. There was a problem that many white streak defects were observed. Therefore, in order to confirm the effect of the cleaning method of the present invention on this problem, the photoreceptor layer was actually formed after the cleaning of the substrate, and the evaluation by the image was performed.

【0023】被洗浄物である電子写真感光体の導電性基
体として、直径30mm、長さ348mm、肉厚1mm
であるA6063製の鏡面切削円管を用い、鏡面切削に
よる基体形成から洗浄処理までの保管期間は3週間およ
び3ケ月間とした。導電性基体は、まず水系洗浄剤によ
る脱脂工程および純水による洗浄工程を通り、50℃純
水での湯洗工程を経た後、本発明の洗浄法に基づくブラ
シ洗浄工程に移る。このブラシ洗浄工程では基体とブラ
シの接触部に純水を供給する。続いて超純水による仕上
げ洗浄工程に移り、最後に乾燥を行った。ここで純水は
常温での比抵抗が1MΩcm以上、超純水は常温での比
抵抗が5MΩcm以上の水である。なお、比較例として
この洗浄プロセスからブラシ洗浄工程を除いた処理を行
ったものを併せて評価した。
A conductive substrate of an electrophotographic photosensitive member, which is an object to be cleaned, has a diameter of 30 mm, a length of 348 mm, and a wall thickness of 1 mm.
The mirror-cutting circular tube made of A6063 was used, and the storage period from the substrate formation by mirror-cutting to the cleaning treatment was 3 weeks and 3 months. The conductive substrate first passes through a degreasing process with an aqueous cleaning agent and a cleaning process with pure water, and after a hot water cleaning process with pure water at 50 ° C., the process proceeds to a brush cleaning process based on the cleaning method of the present invention. In this brush cleaning step, pure water is supplied to the contact portion between the base and the brush. Subsequently, the process was moved to a final cleaning step using ultrapure water, and finally, drying was performed. Here, pure water is water having a resistivity of 1 MΩcm or more at room temperature, and ultrapure water is water having a resistivity of 5 MΩcm or more at room temperature. In addition, as a comparative example, the results obtained by performing the treatment excluding the brush cleaning step from this cleaning process were also evaluated.

【0024】本発明の洗浄法に基づくブラシ洗浄工程部
分についての詳細を図4に示す。導電性基体1は内拡式
把持具7によって拘持され外部駆動装置8により中心軸
2の周りに回転し、円柱状の擦り洗浄材3は外部駆動装
置9によりその中心軸4の周りに10の方向すなわち鉛
直方向下向きに回転する。ここで2と4は両者のなす角
度が実質的に90°となるようなねじれの位置関係にあ
る。基体1は回転しながら擦り洗浄材3の下方から上方
に向かう11の方向に移動し、擦り洗浄材3と接触す
る。ここで基体1の移動方向11はその中心軸2と平行
である。なお、接触部には洗浄液供給管12から洗浄液
13である超純水を供給した。
FIG. 4 shows details of the brush cleaning step portion based on the cleaning method of the present invention. The conductive substrate 1 is held by the inner expansion type gripping tool 7 and is rotated about the central axis 2 by the external driving device 8, and the cylindrical scrubbing cleaning material 3 is rotated about the central axis 4 by the external driving device 9. The direction of rotation, that is, the vertical direction is downward. Here, 2 and 4 are in a positional relationship of twist so that the angle formed by both is substantially 90 °. The base body 1 moves in a direction 11 from the lower side to the upper side of the rubbing and cleaning material 3 while rotating, and comes into contact with the rubbing and cleaning material 3. Here, the moving direction 11 of the base 1 is parallel to the central axis 2. The contact portion was supplied with ultrapure water as the cleaning liquid 13 from the cleaning liquid supply pipe 12.

【0025】ここで、ブラシ材はポリプロピレン、ブラ
シ線径は200μm、ブラシ外径は80mm、ブラシ部
長さは80mm、ブラシ回転数は500rpm、接触代
は5mm、円管回転数は240rpm、円管引き上げ速
度は10mm/秒、行程回数は1回すなわち実接触時間
として30秒弱である。
Here, the brush material is polypropylene, the brush wire diameter is 200 μm, the brush outer diameter is 80 mm, the brush portion length is 80 mm, the brush rotation speed is 500 rpm, the contact margin is 5 mm, the circular tube rotation speed is 240 rpm, and the circular tube is pulled up. The speed is 10 mm / sec, the number of strokes is once, that is, the actual contact time is less than 30 seconds.

【0026】このようにして洗浄を行った導電性基体に
対し、感光体層を電荷発生層、電荷移動層の順に形成し
て電子写真感光体を得た。具体的説明を以下に示す。電
荷発生物質としてビスアゾ化合物1部を用い、これにジ
メトキシエタン20部に加え、サンドグラインダーで分
散処理した後、ポリビニルアセタール樹脂(電気化学工
業(株)製、商品名 電荷ブチラール#6000C)
0.5部をジメトキシエタン10部に溶解した溶液に加
え電荷発生層形成用分散液を得た。この分散液に、先に
洗浄処理を行ったアルミニウム基体を浸漬塗布し、乾燥
後の膜厚が0.63μmになるように電荷発生層を設け
た。この電荷発生層上に電荷移動物質として下記構造を
有するヒドラゾン化合物110部、
An electrophotographic photosensitive member was obtained by forming a photoconductor layer of a charge generation layer and a charge transfer layer in this order on the conductive substrate thus washed. A specific explanation is given below. 1 part of a bisazo compound was used as a charge generating substance, 20 parts of dimethoxyethane was added to this, and after dispersion treatment with a sand grinder, polyvinyl acetal resin (manufactured by Denki Kagaku Kogyo Co., Ltd., trade name: Butyral # 6000C)
0.5 part was added to a solution prepared by dissolving 10 parts of dimethoxyethane to obtain a charge generation layer forming dispersion liquid. An aluminum substrate that had been previously washed was applied by dip coating to this dispersion, and a charge generation layer was provided so that the film thickness after drying was 0.63 μm. 110 parts of a hydrazone compound having the following structure as a charge transfer material on the charge generation layer,

【0027】[0027]

【化1】 下記の繰り返し構造単位を有するポリカーボネート樹脂
(粘度平均分子量:約22000)100部、
Embedded image 100 parts of a polycarbonate resin having the following repeating structural unit (viscosity average molecular weight: about 22000),

【0028】[0028]

【化2】 Embedded image

【0029】および、フェノール化合物8部をテトラヒ
ドロフラン500部に溶解した溶液を作成し、この溶解
液に、電荷発生層を設けたアルミニウム基体を浸漬塗布
し、125℃で20分間乾燥した。乾燥後の膜厚が21
μmになるように電荷移動層を設け、電子写真感光体を
製造した。
A solution was prepared by dissolving 8 parts of the phenol compound in 500 parts of tetrahydrofuran, and an aluminum substrate provided with a charge generation layer was dip-coated on this solution and dried at 125 ° C. for 20 minutes. The film thickness after drying is 21
An electrophotographic photosensitive member was manufactured by providing a charge transfer layer so as to have a thickness of μm.

【0030】得られた電子写真感光体を市販の複写機に
装着して実写試験を行い、ハーフトーン画像を目視観察
により評価した。その結果を表1に示す。
The obtained electrophotographic photosensitive member was mounted on a commercially available copying machine and a real copying test was conducted to evaluate the halftone image by visual observation. Table 1 shows the results.

【0031】[0031]

【表1】 [Table 1]

【0032】ブラシによる擦り洗浄がない場合には、切
削後3ケ月間保管したもので6本中4本、切削後3週間
という比較的短かい期間保管したものでも9本中3本に
画像白すじ欠陥が見られたが、本発明に基づくブラシ洗
浄工程を入れた場合には画像白すじ欠陥は1本も見られ
ず、本発明の洗浄法が持つ高い洗浄効果が示される結果
となった。なお、この実験ではブラシ傷や洗浄不良に起
因する画像欠陥は見られなかった。
When there is no scrubbing with a brush, 4 out of 6 were stored for 3 months after cutting, and 3 out of 9 were stored even for a relatively short period of 3 weeks after cutting. Although streak defects were observed, no white streak defects were observed in the image when the brush cleaning step according to the present invention was added, which resulted in the high cleaning effect of the cleaning method of the present invention. . In this experiment, no image defect caused by brush scratches or poor cleaning was observed.

【0033】[0033]

【発明の効果】本発明で実現する洗浄方法により、先に
述べた従来洗浄法での課題が解決可能となる。すなわ
ち、擦り洗浄材における実質的な同一部位が接触状態を
一定に保ちながら導電性基体の全表面を走査することに
より、導電性基体表面の均質洗浄が実現でき、物理的洗
浄力を導電性基体表面に損傷を与えない範囲の上限近く
まで引き出すことができる。さらに副次的効果として、
従来式に比較して小型軽量の擦り洗浄材が使用できるこ
とから、コスト面で優れることや擦り洗浄材の高速回転
の結果として、接触面付近での遠心力増大による物理的
洗浄力の向上や擦り洗浄材自身の自浄効果などがある。
The cleaning method realized by the present invention can solve the above-mentioned problems in the conventional cleaning method. That is, by scanning the entire surface of the conductive substrate while keeping the contact state substantially constant with substantially the same portion of the scrubbing cleaning material, uniform cleaning of the surface of the conductive substrate can be realized, and the physical cleaning force is reduced. It can be pulled up to the upper limit of the range that does not damage the surface. As a side effect,
Compared with the conventional method, a smaller and lighter scrubbing agent can be used, which is superior in terms of cost and as a result of the high-speed rotation of the scrubbing agent, the physical cleaning force is improved and the scrubbing is increased by the centrifugal force increase in the vicinity of the contact surface. There is a self-cleaning effect of the cleaning material itself.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施態様を示す説明図。FIG. 1 is an explanatory diagram showing an embodiment of the present invention.

【図2】本発明の他の実施態様を示す説明図。FIG. 2 is an explanatory view showing another embodiment of the present invention.

【図3】従来の態様を示す説明図。FIG. 3 is an explanatory view showing a conventional mode.

【図4】本発明の実施態様を示す詳細な説明図。FIG. 4 is a detailed explanatory diagram showing an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1 導電性基体 2 導電性基体の中心軸 3 擦り洗浄材 4 擦り洗浄材の中心軸 7 内拡式把持具 12 洗浄液供給管 13 洗浄液 1 Conductive Substrate 2 Central Axis of Conductive Substrate 3 Rubbing Cleaning Material 4 Central Axis of Rubbing Cleaning Material 7 Inner Expansion Grip 12 Cleaning Liquid Supply Pipe 13 Cleaning Liquid

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 被洗浄物である電子写真感光体用の円筒
状導電性基体を、その中心軸を回転軸として回転させ、
一方、擦り洗浄材を、前記基体の回転軸と幾何学上実質
的にねじれの関係にある軸を回転軸として回転させ、接
触させながら、前記基体の回転軸方向に相対的に移動さ
せて洗浄することを特徴とする、電子写真感光体の製造
方法。
1. A cylindrical conductive substrate for an electrophotographic photosensitive member, which is an object to be cleaned, is rotated about its central axis as a rotation axis,
On the other hand, the scrubbing cleaning material is rotated around an axis that is geometrically substantially twisted with respect to the rotation axis of the base body as a rotation axis, and while being in contact with the base body, it is relatively moved in the rotation axis direction of the base body for cleaning. A method of manufacturing an electrophotographic photosensitive member, comprising:
【請求項2】 電子写真感光体用円筒状導電性基体と擦
り洗浄材の回転軸が幾何学上交差する関係にある請求項
1記載の電子写真感光体の製造方法。
2. The method for producing an electrophotographic photosensitive member according to claim 1, wherein the cylindrical conductive substrate for the electrophotographic photosensitive member and the rotation axis of the scrubbing cleaning material have a geometrically intersecting relationship.
【請求項3】 電子写真感光体用円筒状導電性基体の回
転軸が実質的に鉛直方向を向き、前記基体に対する擦り
洗浄材の相対移動方向が実質的に鉛直方向下向きである
請求項1または2記載の電子写真感光体の製造方法。
3. A cylindrical conductive substrate for an electrophotographic photosensitive member has a rotation axis oriented substantially in the vertical direction, and a relative direction of movement of the scrubbing cleaning material with respect to the substrate is oriented substantially vertically downward. 2. The method for producing an electrophotographic photosensitive member according to 2.
【請求項4】 電子写真感光体用円筒状導電性基体の回
転軸が実質的に鉛直方向を向き、接触部における擦り洗
浄材の掃引方向が実質的に鉛直方向下向きである請求項
1記載の電子写真感光体の製造方法。
4. The cylindrical conductive substrate for an electrophotographic photosensitive member has a rotation axis oriented substantially in the vertical direction, and a sweeping direction of the scrubbing cleaning material at the contact portion is oriented substantially in the vertical direction downward. Manufacturing method of electrophotographic photoreceptor.
【請求項5】 電子写真感光体用円筒状導電性基体の回
転軸が実質的に鉛直方向を向き、洗浄液を洗浄液を接触
部に向けて擦り洗浄材の上方から供給する請求項1〜4
のいずれかに記載の電子写真感光体の製造方法。
5. A cylindrical conductive substrate for an electrophotographic photosensitive member has a rotation axis oriented substantially in a vertical direction, and a cleaning liquid is supplied from above the cleaning material by rubbing the cleaning liquid toward a contact portion.
The method for producing an electrophotographic photosensitive member according to any one of the above.
JP09949196A 1996-03-29 1996-03-29 Method for producing electrophotographic photosensitive member Expired - Lifetime JP3723631B2 (en)

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JP09949196A JP3723631B2 (en) 1996-03-29 1996-03-29 Method for producing electrophotographic photosensitive member

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JPH09269602A true JPH09269602A (en) 1997-10-14
JP3723631B2 JP3723631B2 (en) 2005-12-07

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006159288A (en) * 2004-11-09 2006-06-22 Showa Denko Kk Aluminum pipe production method

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50140262U (en) * 1974-05-07 1975-11-19
JPS5239409A (en) * 1975-09-23 1977-03-26 Wako Kk Method of washing hickey picker roller for printng
JPS6462651A (en) * 1987-09-03 1989-03-09 Fuji Xerox Co Ltd Method for regenerating electrophotographic sensitive body
JPH0370792U (en) * 1989-11-08 1991-07-16
JPH03257456A (en) * 1990-03-08 1991-11-15 Fuji Electric Co Ltd Method for washing cylindrical substrate of electrophotographic sensitive body
JPH04175759A (en) * 1990-11-08 1992-06-23 Minolta Camera Co Ltd Photoreceptor roughened on surface with cross line scars
JPH04175760A (en) * 1990-11-08 1992-06-23 Minolta Camera Co Ltd Manufacture of organic photoreceptor with surface protective layer
JPH07146576A (en) * 1993-11-25 1995-06-06 Showa Alum Corp Production of aluminum pipe for photosensitive drum

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50140262U (en) * 1974-05-07 1975-11-19
JPS5239409A (en) * 1975-09-23 1977-03-26 Wako Kk Method of washing hickey picker roller for printng
JPS6462651A (en) * 1987-09-03 1989-03-09 Fuji Xerox Co Ltd Method for regenerating electrophotographic sensitive body
JPH0370792U (en) * 1989-11-08 1991-07-16
JPH03257456A (en) * 1990-03-08 1991-11-15 Fuji Electric Co Ltd Method for washing cylindrical substrate of electrophotographic sensitive body
JPH04175759A (en) * 1990-11-08 1992-06-23 Minolta Camera Co Ltd Photoreceptor roughened on surface with cross line scars
JPH04175760A (en) * 1990-11-08 1992-06-23 Minolta Camera Co Ltd Manufacture of organic photoreceptor with surface protective layer
JPH07146576A (en) * 1993-11-25 1995-06-06 Showa Alum Corp Production of aluminum pipe for photosensitive drum

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006159288A (en) * 2004-11-09 2006-06-22 Showa Denko Kk Aluminum pipe production method

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