JPH09260579A - Terminal structure of flexible wiring board and ic chip mounting structure using the structure - Google Patents

Terminal structure of flexible wiring board and ic chip mounting structure using the structure

Info

Publication number
JPH09260579A
JPH09260579A JP6693196A JP6693196A JPH09260579A JP H09260579 A JPH09260579 A JP H09260579A JP 6693196 A JP6693196 A JP 6693196A JP 6693196 A JP6693196 A JP 6693196A JP H09260579 A JPH09260579 A JP H09260579A
Authority
JP
Japan
Prior art keywords
chip
wiring board
wiring
dummy
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6693196A
Other languages
Japanese (ja)
Other versions
JP3207743B2 (en
Inventor
Yoichiro Sakaki
陽一郎 榊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP6693196A priority Critical patent/JP3207743B2/en
Publication of JPH09260579A publication Critical patent/JPH09260579A/en
Application granted granted Critical
Publication of JP3207743B2 publication Critical patent/JP3207743B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives

Abstract

PROBLEM TO BE SOLVED: To provide a terminal structure which is for a flexible wiring board and hardly deformed by heat or stress induced when an IC chip is mounted on the flexible wiring board and a mounting structure enhanced in reliability by the use of the above terminal structure. SOLUTION: An inner lead connection part 6 which serves as a mounting region where a driver IC chip is mounted is provided to a two-layered flexible wiring board 1 by the use of an anisotropic conductive film, inner leads are extended into the lead connection part 6, dummy terminals 11 which are not connected to signal lines are provided to a part of the connection part 6 where inner leads are arranged sparse in wiring pitch so as to make the inner leads uniform in wiring pitch at the connection part 6, whereby the wiring pitch of the inner leads is set at the same reference value on both an input signal side and an output signal side. By this setup, a non-wiring region which makes a flexible wiring board uneven in thermal expansion coefficient and stress generation can be eliminated, so that a mounted product which is hardly deformed and high in reliability can be realized.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、液晶、プラズマ等
を用いた表示パネルへの実装に適したフレキシブル配線
基板の端子構造およびそれを用いたIC( Integrated
Circuit ) チップの実装構造に関し、特に、ICチップ
が異方性導電膜を用いて実装されるフレキシブル配線基
板の端子構造およびそれを用いたICチップの実装構造
に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a flexible wiring board terminal structure suitable for mounting on a display panel using liquid crystal, plasma or the like, and an IC (Integrated Circuit) using the same.
Circuit) The present invention relates to a chip mounting structure, and more particularly to a terminal structure of a flexible wiring board on which an IC chip is mounted using an anisotropic conductive film and an IC chip mounting structure using the terminal structure.

【0002】[0002]

【従来の技術】従来、液晶パネル等に使用されるドライ
バーICチップをフレキシブル配線基板( Flexible Pr
inted Circuits; 以下、FPCと略称する)に実装する
ために、インナリードボンディングやフリップチップボ
ンディング等の技術方式が採用されている。
2. Description of the Related Art Conventionally, a driver IC chip used for a liquid crystal panel or the like is mounted on a flexible wiring board (Flexible Pr
Intended Circuits; hereinafter, abbreviated as FPC), a technical method such as inner lead bonding or flip chip bonding is adopted.

【0003】まず、インナリードボンディングに用いる
FPC50の構成を説明すると、図3(a)に示すよう
に、ポリイミド(PI)から成る基材51の中央部に
は、デバイスホール52が形成されている。このデバイ
スホール52の形成範囲は、ドライバーICチップ53
を搭載するためのチップ搭載領域となる。
First, the structure of the FPC 50 used for inner lead bonding will be described. As shown in FIG. 3A, a device hole 52 is formed in the center of a base material 51 made of polyimide (PI). . The formation range of the device hole 52 is the driver IC chip 53.
It becomes the chip mounting area for mounting.

【0004】また、デバイスホール52が形成された基
材51上には、エポキシ(EP)樹脂を主成分とする接
着剤層54を介して、短冊状の銅端子55が配置されて
いる。このとき、銅端子55の先端部分(以下、インナ
リード55aと呼ぶ)は、ドライバーICチップ53と
の接続に備えてデバイスホール52の内方へ延び出して
おり、このインナリード55aには、スズ(Sn)メッ
キが施されている。さらに、デバイスホール52の周縁
部は、銅端子55を酸化あるいは電気化学反応による劣
化から保護するために、レジスト56により被覆されて
いる。
Further, strip-shaped copper terminals 55 are arranged on the base material 51 in which the device holes 52 are formed, with an adhesive layer 54 containing epoxy (EP) resin as a main component interposed therebetween. At this time, the tip portion of the copper terminal 55 (hereinafter referred to as the inner lead 55a) extends inward of the device hole 52 in preparation for connection with the driver IC chip 53, and the inner lead 55a has a tin (Sn) plating is applied. Further, the peripheral portion of the device hole 52 is covered with a resist 56 in order to protect the copper terminal 55 from deterioration due to oxidation or electrochemical reaction.

【0005】このように、インナリードボンディングに
用いるFPC50は、基材51、接着剤層54、銅端子
55を積層した3層で構成されている。
As described above, the FPC 50 used for the inner lead bonding is composed of three layers in which the base material 51, the adhesive layer 54, and the copper terminals 55 are laminated.

【0006】次に、FPC50にドライバーICチップ
53を搭載する場合には、ドライバーICチップ53の
電極上に金(Au)で形成されたバンプ57と、上記イ
ンナリード55aとを熱圧着することにより、界面にA
u−Sn合金が生成されるので、FPC50とドライバ
ーICチップ53とが接続される。なお、接続後には、
ドライバーICチップ53およびデバイスホール52の
周囲を樹脂58で封止することによって、強度を得るよ
うにしている。
Next, when the driver IC chip 53 is mounted on the FPC 50, the bump 57 formed of gold (Au) on the electrode of the driver IC chip 53 and the inner lead 55a are thermocompression bonded. , A at the interface
Since the u-Sn alloy is generated, the FPC 50 and the driver IC chip 53 are connected. After connecting,
The strength is obtained by sealing the periphery of the driver IC chip 53 and the device hole 52 with a resin 58.

【0007】これに対し、近年、3層FPCのような接
着剤を用いずに、基材上にメッキやエッチングの手法で
銅端子を形成した2層FPCにICチップをフリップチ
ップボンディング方式で接続する方法が、研究され実用
段階に入ろうとしている。
On the other hand, in recent years, without using an adhesive such as a three-layer FPC, an IC chip is connected by a flip-chip bonding method to a two-layer FPC in which copper terminals are formed on a base material by plating or etching. The method of doing so has been studied and is about to enter the practical stage.

【0008】上記フリップチップボンディング方式を詳
しく説明するために、2層FPC60の構成から説明す
ると、図3(b)に示すように、ポリイミドや、ポリイ
ミドより安価なポリエチレンテレフタレート(PET)
またはポリエチレンナフチレート(PEN)のようなポ
リエステル系樹脂から成る基材61の中央部には、ドラ
イバーICチップ62を搭載するためのチップ搭載領域
63が設定され、チップ搭載領域63の内方へ先端(イ
ンナリード)が延び出すように、銅端子64が形成され
ている。
In order to explain the flip chip bonding method in detail, the structure of the two-layer FPC 60 will be described. As shown in FIG. 3B, polyimide or polyethylene terephthalate (PET), which is cheaper than polyimide, is used.
Alternatively, a chip mounting area 63 for mounting the driver IC chip 62 is set in the central portion of the base material 61 made of a polyester resin such as polyethylene naphthylate (PEN), and the tip is inward of the chip mounting area 63. The copper terminal 64 is formed so that the (inner lead) extends.

【0009】上記チップ搭載領域63の周縁部は、レジ
スト56と同様のレジスト65によって被覆されてい
る。
The peripheral portion of the chip mounting region 63 is covered with a resist 65 similar to the resist 56.

【0010】次に、2層FPC60にドライバーICチ
ップ62を搭載する場合には、チップ搭載領域63上に
異方性導電膜( Anisotropic Conducting Film;AC
F)66を貼着し、この上に、ドライバーICチップ6
2を配置して、ドライバーICチップ62に熱圧着処理
を施す。異方性導電膜66は、例えばエポキシ樹脂に導
電粒子66aを分散させて成り、熱圧着の圧力によっ
て、ドライバーICチップ62の電極上に形成されたバ
ンプ67と銅端子64との間で、導電粒子66aが押し
潰され、バンプ67と銅端子64とを電気的に接続する
と共に、熱圧着の熱によって異方性導電膜66のエポキ
シ樹脂が硬化するため、バンプ67と銅端子64とが電
気的な接続状態を保持したまま固定される。
Next, when the driver IC chip 62 is mounted on the two-layer FPC 60, an anisotropic conductive film (AC) is formed on the chip mounting region 63.
F) 66 is attached and the driver IC chip 6 is put on this
2 is arranged, and the driver IC chip 62 is subjected to thermocompression bonding treatment. The anisotropic conductive film 66 is formed, for example, by dispersing conductive particles 66a in epoxy resin, and is electrically conductive between the bump 67 formed on the electrode of the driver IC chip 62 and the copper terminal 64 by the pressure of thermocompression bonding. The particles 66a are crushed, the bumps 67 and the copper terminals 64 are electrically connected, and the epoxy resin of the anisotropic conductive film 66 is cured by the heat of thermocompression bonding, so that the bumps 67 and the copper terminals 64 are electrically connected. It is fixed while maintaining the physical connection state.

【0011】この方法の場合、異方性導電膜66のエポ
キシ樹脂が、図3(a)の樹脂58の代わりとなるた
め、樹脂による封止工程を別途必要としない。
In the case of this method, the epoxy resin of the anisotropic conductive film 66 substitutes for the resin 58 of FIG. 3 (a), so that a separate resin sealing step is not required.

【0012】次に、上記2層FPC60が備える銅端子
64の端子配列を、図4の平面図を用いて説明する。
Next, the terminal arrangement of the copper terminals 64 included in the two-layer FPC 60 will be described with reference to the plan view of FIG.

【0013】矩形状の2層FPC60の一方の長辺側に
は、銅端子64としての入力端子64aが複数本配置さ
れ、他方の長辺側には、銅端子64としての出力端子6
4bが複数本配置されている。また、2層FPC60の
中央周辺には、角形のO字状に上記レジスト65が配さ
れ、その内周縁部65aの内側に、上記チップ搭載領域
63が設定されている。
A plurality of input terminals 64a as copper terminals 64 are arranged on one long side of the rectangular two-layer FPC 60, and output terminals 6 as copper terminals 64 are arranged on the other long side.
A plurality of 4b are arranged. Further, the resist 65 is arranged in a square O shape around the center of the two-layer FPC 60, and the chip mounting region 63 is set inside the inner peripheral edge portion 65a.

【0014】また、上記入力端子64aおよび出力端子
64bの各先端部が、チップ搭載領域63内に達するよ
うに、2層FPC60の余白スペースを利用して、各端
子64a・64bの配線が引き回されている。
Further, the wirings of the terminals 64a and 64b are laid out by using the blank space of the two-layer FPC 60 so that the tip portions of the input terminal 64a and the output terminal 64b reach the inside of the chip mounting area 63. Has been done.

【0015】さらに、入力端子64aは、入力側の長辺
近傍では、出力端子64bより広い幅を有し、かつ等間
隔ピッチで配置されているが、チップ搭載領域63に接
近する間に出力端子64bと同じ幅に狭められ、チップ
搭載領域63内では、ドライバーICチップ62のバン
プ67の形成位置に合うように、不等間隔で、すなわち
疎密が生じる状態で配置されている。
Further, the input terminals 64a have a width wider than the output terminals 64b in the vicinity of the long side on the input side and are arranged at equal pitches, but the output terminals 64a approach the chip mounting area 63. It is narrowed to the same width as 64b, and is arranged in the chip mounting region 63 at unequal intervals, that is, in a state in which sparseness and denseness occur so as to match the formation position of the bump 67 of the driver IC chip 62.

【0016】一方、出力端子64bは、同一幅のまま、
あるいは上記バンプ67のドライバーICチップ62に
おける形成ピッチまで狭められて、矩形状のチップ搭載
領域63の四辺に達するように、かつドライバーICチ
ップ62のバンプ67の形成位置に合わせて等間隔ピッ
チでその配線が引き回されているが、チップ搭載領域6
3の四隅では、配線の無い空白領域68が存在してい
る。
On the other hand, the output terminal 64b has the same width,
Alternatively, the bumps 67 are narrowed to the formation pitch of the driver IC chip 62 so as to reach the four sides of the rectangular chip mounting region 63, and the bumps 67 of the driver IC chip 62 are formed at equal intervals according to the formation positions of the bumps 67. Wiring is routed, but chip mounting area 6
In the four corners of No. 3, there is a blank area 68 with no wiring.

【0017】したがって、チップ搭載領域63の周囲で
は、総じて、基材61上に銅端子64が偏在していると
いえる。
Therefore, it can be said that the copper terminals 64 are generally unevenly distributed on the base material 61 around the chip mounting region 63.

【0018】なお、上記のFPC50や2層FPC60
を映画フィルムや写真フィルムのように1コマずつ縦列
形成する方式をTCP( Tape Carrier Package ) 方式
と呼んでおり、実装の量産技術において主流となってい
る。
The FPC 50 and the two-layer FPC 60 described above are used.
Is called a TCP (Tape Carrier Package) method for forming one frame at a time like a movie film or a photographic film, which is the mainstream in the mass production technology for mounting.

【0019】特開平6−53275号公報には、TCP
方式において、インナリードボンディング時にドライバ
ーICチップの周辺に集中する機械的応力を緩和する目
的で、ドライバーICチップのコーナー部の近傍に、ダ
ミー配線を配置することが開示されている。
Japanese Unexamined Patent Publication No. 6-53275 discloses a TCP.
In the method, it is disclosed that dummy wirings are arranged near the corners of the driver IC chip for the purpose of relaxing mechanical stress concentrated around the driver IC chip during inner lead bonding.

【0020】[0020]

【発明が解決しようとする課題】ところが、図4に示す
従来の端子構造では、チップ搭載領域63に異方性導電
膜66を貼着してドライバーICチップ62を熱圧着す
るフリップチップボンディングの場合、基材61とは熱
膨張率が異なる銅端子64が偏在しているため、140
℃〜200℃の接続温度を得るための熱によって、TC
Pに反りやうねり等の変形が発生するという問題点が有
る。特に、基材61の材質が、上述のPETやPENの
ように熱の影響を受けやすい場合には、熱変形が顕著に
なる。
However, in the conventional terminal structure shown in FIG. 4, in the case of flip chip bonding in which the anisotropic conductive film 66 is attached to the chip mounting region 63 and the driver IC chip 62 is thermocompression bonded. Since the copper terminals 64 having a different coefficient of thermal expansion from the base material 61 are unevenly distributed,
By the heat to get the connection temperature of ℃ ~ 200 ℃, TC
There is a problem that deformation such as warpage and undulation occurs in P. In particular, when the material of the base material 61 is easily affected by heat as in the case of PET or PEN described above, thermal deformation becomes remarkable.

【0021】こうなると、ドライバーICチップ62を
搭載した2層FPC60が変形しているため、液晶パネ
ル等と接続するときに、2層FPC60と液晶パネルと
の位置合わせが困難になる。さらに、組立て品の完成後
も、2層FPC60には応力が残留するため、銅端子6
4が断線する問題や、ドライバーICチップ62と入力
端子64aとの低抵抗接続に要求される高信頼性が低下
するという問題を招来する。
In this case, since the two-layer FPC 60 having the driver IC chip 62 mounted thereon is deformed, it becomes difficult to align the two-layer FPC 60 with the liquid crystal panel when connecting to the liquid crystal panel or the like. Furthermore, since the stress remains in the two-layer FPC 60 even after the assembly is completed, the copper terminal 6
4 causes a disconnection problem and a problem that the high reliability required for low resistance connection between the driver IC chip 62 and the input terminal 64a is deteriorated.

【0022】また、特開平6−53275号公報に開示
されたダミー配線の配置では、液晶用の2層FPC60
のように、入力端子64aの配線数と出力端子64bの
配線数とが極端に相違し、配線に疎密が有る場合に、T
CPの変形防止効果が不十分である。したがって、特に
PETやPENのような熱に弱い基材を用いる場合に
は、熱圧着時にシワや断線が発生する問題を避けること
ができない。
Further, in the layout of the dummy wiring disclosed in Japanese Patent Laid-Open No. 6-53275, the two-layer FPC 60 for liquid crystal is used.
As described above, when the number of wires of the input terminal 64a and the number of wires of the output terminal 64b are extremely different from each other and the wires are sparse and dense, T
The deformation prevention effect of CP is insufficient. Therefore, in particular, when a heat-sensitive substrate such as PET or PEN is used, the problem of wrinkles or disconnection during thermocompression bonding cannot be avoided.

【0023】本発明は、上記の問題点を解決するために
なされたもので、その目的は、FPCにICチップをフ
リップチップボンディングによって搭載するときに、F
PCの基材が熱や応力によって変形しにくいフレキシブ
ル配線基板の端子構造を提供すると共に、その端子構造
を用いて信頼性を高めた実装構造を提供することにあ
る。
The present invention has been made to solve the above problems, and an object thereof is to mount an IC chip on an FPC by flip chip bonding.
It is to provide a terminal structure of a flexible wiring board in which a base material of a PC is less likely to be deformed by heat or stress, and to provide a mounting structure having improved reliability by using the terminal structure.

【0024】[0024]

【課題を解決するための手段】請求項1の発明に係るフ
レキシブル配線基板の端子構造は、上記の課題を解決す
るために、フレキシブル配線基板に、異方性導電膜を用
いてICチップを実装する搭載領域(例えば、インナリ
ード接続部)を備え、この搭載領域内に延び出したイン
ナリードの配線ピッチの疎密を無くすように、配線ピッ
チの疎らな部分に信号ラインと結線されないダミー端子
を設け、配線ピッチを入力信号側と出力信号側のそれぞ
れで同一の基準値に揃えたことを特徴としている。
In order to solve the above-mentioned problems, a terminal structure of a flexible wiring board according to a first aspect of the present invention mounts an IC chip on the flexible wiring board by using an anisotropic conductive film. Mounting area (for example, inner lead connection part), and dummy terminals that are not connected to the signal line are provided in the sparse wiring pitch portion so as to eliminate the sparse or dense wiring pitch of the inner leads extending into this mounting area. The wiring pitch is set to the same reference value on the input signal side and the output signal side.

【0025】上記の構成によれば、フレキシブル配線基
板にICチップを実装する場合、上記搭載領域に異方性
導電膜を設け、ICチップを異方性導電膜に圧着した
後、熱処理または紫外線等の光照射処理を施す。このと
き、搭載領域内に延び出したインナリードの配線ピッチ
の疎密を、入力信号側と出力信号側のそれぞれでダミー
端子によって無くしているので、フレキシブル配線基板
の熱伝導率のばらつきを入力信号側と出力信号側のそれ
ぞれで小さくすることができる。
According to the above construction, when mounting an IC chip on a flexible wiring board, an anisotropic conductive film is provided in the mounting area, and the IC chip is pressure-bonded to the anisotropic conductive film, followed by heat treatment or ultraviolet rays. Light irradiation processing is performed. At this time, the unevenness of the wiring pitch of the inner leads extending into the mounting area is eliminated by the dummy terminals on each of the input signal side and the output signal side, so that the variation in the thermal conductivity of the flexible wiring board is suppressed on the input signal side. And the output signal side can be made smaller.

【0026】これにより、異方性導電膜に熱処理を施し
た場合、熱伝導率のばらつきに起因するフレキシブル配
線基板の反りやうねり等の変形を抑制することができ
る。その上、フレキシブル配線基板の基材に、PETや
PENのように熱の影響を受けやすいが安価な材質を用
いることが可能となる。
As a result, when the anisotropic conductive film is heat-treated, it is possible to suppress deformation such as warpage or waviness of the flexible wiring board due to variations in thermal conductivity. In addition, it is possible to use, as the base material of the flexible wiring board, an inexpensive material such as PET or PEN that is easily affected by heat.

【0027】また、熱処理または紫外線照射処理によっ
て異方性導電膜に含まれる熱硬化性樹脂または紫外線硬
化性樹脂の収縮によって生じる応力が、インナリードの
配線ピッチに疎密が無いことで、フレキシブル配線基板
の入力信号側と出力信号側のそれぞれに均一にかかるこ
とになる。これにより、異方性導電膜の硬化に起因する
フレキシブル配線基板の反りやうねり等の変形を抑制す
ることができる。
Further, since the stress generated by the shrinkage of the thermosetting resin or the ultraviolet curable resin contained in the anisotropic conductive film by the heat treatment or the ultraviolet irradiation treatment is not uneven in the wiring pitch of the inner leads, the flexible wiring board It will be evenly applied to the input signal side and the output signal side, respectively. As a result, it is possible to suppress deformation such as warpage or undulation of the flexible wiring board due to curing of the anisotropic conductive film.

【0028】なお、フレキシブル配線基板に対するIC
チップの実装をTCP方式で量産する場合にも、TCP
に反りやうねり等の変形が生じない。
An IC for the flexible wiring board
Even when mass-producing chips by TCP method, TCP
There is no deformation such as warpage or undulation.

【0029】このように、フレキシブル配線基板の変形
が抑制される結果、変形の残留応力が、インナリードと
ICチップのバンプとの接続部や、配線にかからないた
め、接続不良や断線等のトラブルの発生が抑制され、信
頼性の高い実装品を提供することができる。
As described above, as a result of suppressing the deformation of the flexible wiring board, the residual stress of the deformation does not affect the connecting portion between the inner lead and the bump of the IC chip or the wiring, so that a trouble such as a connection failure or a disconnection may occur. It is possible to provide a highly reliable mounted product in which generation is suppressed.

【0030】また、ICチップを実装したフレキシブル
配線基板を液晶、プラズマ等を用いた表示パネルに実装
する場合、フレキシブル配線基板に変形が無いので、実
装の位置合わせが正確となり、表示パネルの良品率を向
上させることができると共に、信頼性の高い表示パネル
を提供することができる。
When a flexible wiring board on which an IC chip is mounted is mounted on a display panel using liquid crystal, plasma, etc., since the flexible wiring board is not deformed, the mounting alignment becomes accurate and the display panel yield rate is good. And a highly reliable display panel can be provided.

【0031】請求項2の発明に係るフレキシブル配線基
板の端子構造は、上記の課題を解決するために、請求項
1に記載のインナリードを先端部とする入力信号線また
は出力信号線の配線の引き回しによって生じた非配線領
域を埋めるように、非配線領域の形状に合わせてダミー
端子を設けたことを特徴としている。
In order to solve the above-mentioned problems, the terminal structure of the flexible wiring board according to the invention of claim 2 is the wiring of the input signal line or the output signal line whose tip is the inner lead according to claim 1. It is characterized in that a dummy terminal is provided according to the shape of the non-wiring region so as to fill the non-wiring region generated by the routing.

【0032】上記の構成において、請求項1に記載した
インナリードの配線ピッチの疎密は、搭載するICチッ
プのバンプ形成位置にインナリードの配線を合わせるこ
とと、フレキシブル配線基板上での入出力信号線の配線
の引き回しとの両方に起因して発生するものである。配
線ピッチが疎らな領域では、自ずと配線の存在しない非
配線領域が発生する。
In the above-mentioned structure, the wiring pitch of the inner leads according to claim 1 is determined by adjusting the wiring of the inner leads to the bump forming positions of the IC chip to be mounted, and the input / output signals on the flexible wiring board. This occurs due to both the wiring of the wires. In a region where the wiring pitch is sparse, a non-wiring region where wiring does not exist naturally occurs.

【0033】そこで、非配線領域を埋め、かつ請求項1
に記載したとおりインナリードの配線ピッチの疎密を無
くすように、非配線領域の形状に合わせてダミー端子を
設ける、すなわち非配線領域の形状に合わせてダミー端
子の本数、長さ、端部形状等を設定することにより、搭
載領域の周辺から熱膨張率や応力発生を不均一にする非
配線領域が無くなるので、請求項1の構成から得られる
効果を一層向上させることができる。
Therefore, the non-wiring area is filled, and
As described in, the dummy terminals are provided according to the shape of the non-wiring area so as to eliminate the unevenness of the wiring pitch of the inner leads, that is, the number, length, end shape, etc. of the dummy terminals according to the shape of the non-wiring area. By setting, the non-wiring region that makes the thermal expansion coefficient and the stress generation non-uniform is eliminated from the periphery of the mounting region, so that the effect obtained from the configuration of claim 1 can be further improved.

【0034】請求項3の発明に係るフレキシブル配線基
板の端子構造は、上記の課題を解決するために、請求項
1または2に記載の構成に加えて、上記搭載領域内に導
かれた全てのインナリードの幅を同一の基準値に揃え、
さらに上記ダミー端子を設けることによって、インナリ
ードの配線ピッチを入力信号側と出力信号側とで同一の
基準値に揃えたことを特徴としている。
In order to solve the above-mentioned problems, the terminal structure of the flexible wiring board according to the invention of claim 3 has all the structures introduced into the above-mentioned mounting area in addition to the structure of claim 1 or 2. Align the inner lead width to the same standard value,
Further, by providing the dummy terminals, the wiring pitch of the inner leads is made uniform to the same reference value on the input signal side and the output signal side.

【0035】上記の構成によれば、全てのインナリード
の幅を同一の基準値に揃え、しかもインナリードの配線
ピッチを搭載領域全体に対して同一の基準値に揃えるこ
とで、請求項1に記載のように、インナリードの配線ピ
ッチを入力信号側と出力信号側のそれぞれで同一に揃え
るよりも、熱膨張率や、異方性導電膜の硬化時における
応力発生が、より均一化される。したがって、請求項1
または2の構成から得られる効果をより一層向上させる
ことができる。
According to the above structure, the widths of all the inner leads are set to the same reference value, and the wiring pitches of the inner leads are set to the same reference value for the entire mounting area. As described above, the coefficient of thermal expansion and the stress generation during curing of the anisotropic conductive film are made more uniform than when the wiring pitch of the inner leads is made equal on the input signal side and the output signal side respectively. . Therefore, claim 1
Alternatively, the effect obtained from the configuration of 2 can be further improved.

【0036】請求項4の発明に係るフレキシブル配線基
板の端子構造は、上記の課題を解決するために、請求項
1、2または3に記載の構成に加えて、1つの入力信号
線を上記非配線領域を利用して複数本に分岐させ、上記
搭載領域内に導き、ICチップに形成されたバンプとの
接続面積を増大させたことを特徴としている。
In order to solve the above problems, in the terminal structure of the flexible wiring board according to the invention of claim 4, in addition to the structure of claim 1, 2 or 3, one input signal line is not connected It is characterized in that it is branched into a plurality of lines using the wiring region and led into the mounting region to increase the connection area with the bumps formed on the IC chip.

【0037】上記の構成によれば、ICチップは、低抵
抗接続の要求度が特に高い電極を含んでいることがあ
る。このような場合に、その電極に対応する入力信号線
を複数本に分岐させれば、複数本のインナリードとIC
チップのバンプとを接続することができるため、接続面
積を増大させ、1つの入力信号線の接続抵抗を低減する
ことができる。
According to the above structure, the IC chip may include an electrode for which low resistance connection is particularly required. In such a case, if the input signal line corresponding to the electrode is branched into a plurality of lines, a plurality of inner leads and ICs can be formed.
Since the bumps of the chip can be connected, the connection area can be increased and the connection resistance of one input signal line can be reduced.

【0038】また、1つの入力信号線が複数箇所で接続
される結果、環境条件によりインナリードとバンプとの
接続状態が多少劣化したとしても、高い接続信頼性を維
持し続けることができる。
Further, as a result of one input signal line being connected at a plurality of points, high connection reliability can be maintained even if the connection state between the inner leads and the bumps is somewhat deteriorated due to environmental conditions.

【0039】さらに、非配線領域を利用して複数本に分
岐された入力信号線は、熱膨張率や、異方性導電膜の硬
化時における応力発生を均一化するためのダミー端子と
同じ働きをするので、請求項1、2または3に記載の構
成による効果を奏した上に、1つの入力信号線の接続抵
抗を低減し、信号のS/Nを向上させると共に、高い接
続信頼性を維持することができる。
Furthermore, the input signal line branched into a plurality of lines using the non-wiring region has the same function as the dummy terminal for equalizing the coefficient of thermal expansion and the stress generation during curing of the anisotropic conductive film. Therefore, in addition to the effect of the configuration according to claim 1, 2 or 3, the connection resistance of one input signal line is reduced, the S / N of the signal is improved, and high connection reliability is achieved. Can be maintained.

【0040】請求項5の発明に係るICチップの実装構
造は、上記の課題を解決するために、請求項1ないし4
のいずれか1項に記載のインナリードと、ICチップに
形成されたバンプとをそれぞれ接続し、上記搭載領域に
ICチップを実装したことを特徴としている。
According to a fifth aspect of the present invention, there is provided an IC chip mounting structure for solving the above problems.
The inner lead according to any one of 1 to 3 above and the bump formed on the IC chip are connected to each other, and the IC chip is mounted in the mounting region.

【0041】したがって、既に説明したとおり、信頼性
が高く、液晶やプラズマ等を用いた表示パネルの良品率
を向上させる効果を奏するICチップの実装構造を提供
することができる。
Therefore, as described above, it is possible to provide the IC chip mounting structure which is highly reliable and has an effect of improving the non-defective rate of the display panel using liquid crystal or plasma.

【0042】請求項6の発明に係るICチップの実装構
造は、上記の課題を解決するために、請求項5に記載の
ICチップには、信号ラインに結線されないダミーバン
プが上記ダミー端子に対応して設けられ、ダミー端子と
ダミーバンプとがそれぞれ接続されていることを特徴と
している。
In order to solve the above problems, in the IC chip mounting structure according to the invention of claim 6, in the IC chip according to claim 5, a dummy bump not connected to a signal line corresponds to the dummy terminal. It is characterized in that the dummy terminals and the dummy bumps are connected to each other.

【0043】上記の構成により、フレキシブル配線基板
のダミー端子とICチップのダミーバンプとを接続する
ことで、特に、フレキシブル配線基板の搭載領域に異方
性導電膜を用いてICチップを熱圧着するときに、IC
チップに加えられた熱が、ダミーバンプからダミー端子
へ伝わり、さらにフレキシブル配線基板の基材に伝わる
ので、ICチップにダミーバンプを設けない場合と比べ
て、フレキシブル配線基板における熱伝導がより均一に
行われる。この効果は、インナリードおよびダミー端子
の幅、配線ピッチが搭載領域において均一化する程、ま
たダミー端子とダミーバンプとの接続面積が搭載領域に
おいて均一化する程、向上する。
By connecting the dummy terminals of the flexible wiring board and the dummy bumps of the IC chip with the above structure, especially when the IC chip is thermocompression bonded by using the anisotropic conductive film in the mounting area of the flexible wiring board. To the IC
Since the heat applied to the chip is transferred from the dummy bumps to the dummy terminals and further to the base material of the flexible wiring board, heat conduction in the flexible wiring board is performed more uniformly than in the case where the dummy bumps are not provided on the IC chip. . This effect is improved as the widths and wiring pitches of the inner leads and the dummy terminals are made uniform in the mounting region, and the connection areas between the dummy terminals and the dummy bumps are made uniform in the mounting region.

【0044】したがって、請求項1ないし5のいずれか
1項に記載の構成によって得られる効果を一層向上させ
ることができる。
Therefore, the effect obtained by the configuration according to any one of claims 1 to 5 can be further improved.

【0045】[0045]

【発明の実施の形態】本発明の実施の一形態について図
1および図2に基づいて説明すれば、以下のとおりであ
る。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIGS.

【0046】図2に示すように、フレキシブル配線基板
としての2層FPC1は、基材2と、基材2上に、メッ
キやエッチングの手法で形成された銅端子3とで構成さ
れ、既に説明した量産対応のTCP方式により、多数の
2層FPC1が連続して縦列形成されている。また、基
材2は、ポリイミドや、ポリイミドより安価なポリエチ
レンテレフタレート(PET)またはポリエチレンナフ
チレート(PEN)のようなポリエステル系樹脂で形成
されている。
As shown in FIG. 2, a two-layer FPC 1 as a flexible wiring board is composed of a base material 2 and a copper terminal 3 formed on the base material 2 by a plating or etching method. A large number of two-layer FPCs 1 are continuously formed in a column by the TCP system for mass production. The base material 2 is made of polyimide or a polyester resin such as polyethylene terephthalate (PET) or polyethylene naphthylate (PEN), which is cheaper than polyimide.

【0047】上記銅端子3の端子配列を、図1の平面図
を用いて説明する。矩形状の2層FPC1は、大きく分
けて4つの機能領域に分かれている。「第1の機能領
域」は、矩形の一方の長辺側に設定された入力接続部4
であり、入力端子4aが等間隔に配置されている。「第
2の機能領域」は、矩形の他方の長辺側に設定された出
力接続部5であり、入力端子4aより幅の狭い出力端子
5aが、入力端子4aより狭い配線ピッチで等間隔に配
置されている。なお、入力端子4aおよび出力端子5a
は、上記銅端子3を構成している。
The terminal arrangement of the copper terminals 3 will be described with reference to the plan view of FIG. The rectangular two-layer FPC 1 is roughly divided into four functional areas. The “first functional area” is the input connection portion 4 set on one long side of the rectangle.
And the input terminals 4a are arranged at equal intervals. The “second functional area” is the output connection portion 5 set on the other long side of the rectangle, and the output terminals 5a having a width narrower than that of the input terminals 4a are arranged at equal intervals with a wiring pitch narrower than that of the input terminals 4a. It is arranged. The input terminal 4a and the output terminal 5a
Constitute the copper terminal 3.

【0048】上記のように、入力接続部4における入力
端子4aの幅が、出力端子5aより幅広に設定されてい
るのは、入力信号に対する抵抗をできるだけ低く抑え、
S/Nを確保するためであり、液晶表示パネルやプラズ
マ表示パネルの用途に適している。
As described above, the width of the input terminal 4a in the input connection portion 4 is set wider than that of the output terminal 5a, so that the resistance to the input signal can be kept as low as possible.
This is for ensuring S / N and is suitable for use in liquid crystal display panels and plasma display panels.

【0049】また、「第3の機能領域」は、図1に一点
鎖線で示すように、2層FPC1の中央部に設定された
インナリード接続部6であり、図2に示す液晶駆動用の
ドライバーICチップ7が搭載される。このインナリー
ド接続部6は、請求項に記載の搭載領域に相当してい
る。最後に、「第4の機能領域」は、入力接続部4と出
力接続部5との間で、かつインナリード接続部6の周囲
に設定された引き回し配線部8であり、図1に2重枠の
二点鎖線で示すように、レジスト9により被覆される。
このレジスト9は、銅端子3を酸化あるいは電気化学反
応による劣化から保護するために設けられるものであ
る。
The "third functional area" is the inner lead connecting portion 6 set at the center of the two-layer FPC 1 as shown by the chain line in FIG. 1, and is used for driving the liquid crystal shown in FIG. The driver IC chip 7 is mounted. The inner lead connecting portion 6 corresponds to the mounting area described in the claims. Finally, the “fourth functional area” is the routing wiring portion 8 set between the input connecting portion 4 and the output connecting portion 5 and around the inner lead connecting portion 6, and is doubled in FIG. As shown by the chain double-dashed line, it is covered with the resist 9.
The resist 9 is provided to protect the copper terminal 3 from deterioration due to oxidation or electrochemical reaction.

【0050】さらに、上記入力端子4aおよび出力端子
5aのインナリードと呼ばれる各先端部は、ドライバー
ICチップ7のバンプ10(図2参照)の形成位置に合
わせてインナリード接続部6内に達するように、引き回
し配線部8を利用して、各端子4a・5aの配線が引き
回されている。
Further, the respective tip portions called inner leads of the input terminal 4a and the output terminal 5a reach the inside of the inner lead connecting portion 6 in accordance with the formation positions of the bumps 10 (see FIG. 2) of the driver IC chip 7. In addition, the wiring of each of the terminals 4a and 5a is routed using the routing wiring section 8.

【0051】より具体的には、入力端子4aは、入力接
続部4からインナリード接続部6に接近する間に出力端
子5aとほぼ同じ幅に狭められ、そのインナリードが全
て、矩形状をなすインナリード接続部6の入力接続部4
側の長辺中央部に導かれるように、配線されている。た
だし、入力端子4aのインナリードは、ドライバーIC
チップ7のバンプ10の配列がIC作製上の制約を受け
て不等間隔になっていることに対応して、不等間隔で、
すなわち配線に疎密が生じる状態で配置されている。
More specifically, the input terminal 4a is narrowed to almost the same width as the output terminal 5a while approaching the inner lead connecting portion 6 from the input connecting portion 4, and all the inner leads thereof have a rectangular shape. Input connection part 4 of inner lead connection part 6
It is wired so as to be guided to the central part of the long side on the side. However, the inner lead of the input terminal 4a is the driver IC.
Corresponding to the fact that the arrangement of the bumps 10 of the chip 7 is unequally spaced due to restrictions in IC fabrication,
That is, the wirings are arranged in a state of being dense and dense.

【0052】一方、出力端子5aは、そのインナリード
の殆どが、インナリード接続部6の出力接続部5側の長
辺に直線的に導かれるように、等間隔に配線されてい
る。ただし、出力端子5aの一部は、入力端子4aのイ
ンナリードが配された長辺に回り込み、入力端子4aの
インナリードの両端近傍に導かれるように曲折して配線
され、他の一部がインナリード接続部6の両短辺にそれ
ぞれ導かれるように曲折して配線されている。
On the other hand, the output terminals 5a are wired at equal intervals so that most of the inner leads thereof are linearly guided to the long side of the inner lead connecting portion 6 on the output connecting portion 5 side. However, a part of the output terminal 5a is bent around the long side where the inner lead of the input terminal 4a is arranged, and is bent so as to be guided to the vicinity of both ends of the inner lead of the input terminal 4a. It is bent and wired so as to be guided to both short sides of the inner lead connecting portion 6.

【0053】このように、入力端子4aおよび出力端子
5aが、ドライバーICチップ7のバンプ10の形成位
置に合わせてインナリード接続部6内に達するように、
配線される結果、入力端子4aのインナリードが疎らに
配置された部分、およびインナリード接続部6の四隅近
傍に、従来では空白領域のまま放置されていた非配線領
域が生じている。
In this way, the input terminal 4a and the output terminal 5a reach the inside of the inner lead connecting portion 6 in accordance with the formation position of the bump 10 of the driver IC chip 7.
As a result of wiring, a non-wiring region, which has been left as a blank region in the past, is formed in a portion where the inner leads of the input terminal 4a are sparsely arranged and in the vicinity of the four corners of the inner lead connecting portion 6.

【0054】そこで、本発明では、この非配線領域の一
部を除く全てに、入力端子4aおよび出力端子5aのど
ちらにも接続されず浮遊状態にあるダミー端子11(図
1および図2にクロスハッチングで示す)を設けてい
る。これらのダミー端子11は、それぞれの非配線領域
における少なくともインナリード接続部6おいて、隣合
う入力端子4aや出力端子5aの配線間隔(配線ピッ
チ)と同じピッチで設けられている。また、フリップチ
ップボンディングの熱圧着工程における基材2の熱膨張
率の均一化を図る観点では、それぞれの非配線領域にお
いて、非配線領域の形状に合わせた本数、長さおよび端
部形状でダミー端子11を設けることが望ましい。
Therefore, in the present invention, the dummy terminals 11 which are not connected to either the input terminal 4a or the output terminal 5a and are in a floating state (crossed to FIGS. (Indicated by hatching). These dummy terminals 11 are provided at the same pitch as the wiring interval (wiring pitch) between the adjacent input terminals 4a and output terminals 5a at least in the inner lead connecting portion 6 in each non-wiring region. Further, from the viewpoint of making the coefficient of thermal expansion of the base material 2 uniform in the thermocompression bonding process of flip chip bonding, in each non-wiring region, the number, length and end shape of the dummy are matched with the shape of the non-wiring region. It is desirable to provide the terminal 11.

【0055】さらに、上記の説明から除いた非配線領域
の一部では、低抵抗接続の要求度がとりわけ高いバンプ
10と接続される入力端子4aが配置されている場合、
その入力端子4aは、図1に分岐入力端子4bで示すよ
うに、配線の途中における非配線領域を利用して、他の
入力端子4aのインナリードやダミー端子11と同一幅
の複数本に分岐され、インナリード接続部6に導かれて
いる。
Further, in a part of the non-wiring region, which is excluded from the above description, in the case where the input terminal 4a connected to the bump 10 which has a particularly high demand for low resistance connection is arranged,
The input terminal 4a is branched into a plurality of wires having the same width as the inner leads of the other input terminals 4a and the dummy terminal 11 by utilizing the non-wiring region in the middle of the wiring as shown by the branch input terminal 4b in FIG. And is guided to the inner lead connecting portion 6.

【0056】なお、配線ピッチや端子の幅について同一
とは、各端子4a・4b・5a・11の作製工程におい
て、同一の基準値に揃える意味であり、実際には配線ピ
ッチや端子の幅に一定の誤差範囲が伴うことはいうまで
もない。
The fact that the wiring pitch and the width of the terminals are the same means that they are aligned to the same reference value in the manufacturing process of the terminals 4a, 4b, 5a and 11, and in practice, the wiring pitch and the width of the terminals are the same. It goes without saying that a certain error range is involved.

【0057】上記の構成において、従来では空白領域の
まま放置されていた非配線領域が、各端子4a・5aの
インナリードと同じ配線ピッチで設けられたダミー端子
11によって埋められていると共に、非配線領域を利用
して上記インナリードと同じ配線ピッチで複数本に枝分
かれした分岐入力端子4bによって埋められている。
In the above-mentioned structure, the non-wiring area which has been left as it is in the conventional blank area is filled with the dummy terminals 11 provided at the same wiring pitch as the inner leads of the terminals 4a and 5a, and the non-wiring area is not formed. It is filled with a branch input terminal 4b which is branched into a plurality of lines at the same wiring pitch as the inner lead using the wiring region.

【0058】したがって、本発明に係る2層FPC1
は、インナリード接続部6の内周辺および外周辺の全体
に、あたかも疎密の無い均一さで配線がなされているか
のような端子構造となっている。
Therefore, the two-layer FPC1 according to the present invention
Has a terminal structure as if the wiring is made in the inner periphery and the outer periphery of the inner lead connection portion 6 as a whole without any uneven density.

【0059】これにより、図2に示すように、フリップ
チップボンディングにより、インナリード接続部6上に
異方性導電膜12を貼着し、この上にドライバーICチ
ップ7を配置して熱圧着処理を施したときに、インナリ
ード接続部6周辺の熱膨張率が均一化されているため、
基材2が不均一に熱膨張するということが無い。したが
って、2層FPC1自体や、TCP方式で縦列形成され
た2層FPC1に、反りやうねりのような変形が発生し
ない。また、これにより、基材2に、PETやPENの
ように熱の影響を受けやすいが安価な材質を用いること
が可能となる。
As a result, as shown in FIG. 2, the anisotropic conductive film 12 is pasted on the inner lead connecting portion 6 by flip chip bonding, the driver IC chip 7 is placed on the anisotropic conductive film 12, and thermocompression bonding is performed. Since the coefficient of thermal expansion around the inner lead connection portion 6 is made uniform when
The base material 2 does not expand nonuniformly. Therefore, the two-layer FPC1 itself or the two-layer FPC1 formed in a column by the TCP method does not undergo deformation such as warpage or undulation. In addition, this makes it possible to use, as the base material 2, a material such as PET or PEN that is susceptible to heat but is inexpensive.

【0060】さらに、2層FPC1に変形が発生しない
ので、2層FPC1とドライバーICチップ7とを正確
かつ容易に位置合わせすることができ、組立て品の良品
率を向上させることができる。また、ドライバーICチ
ップ7を搭載した2層FPC1にも変形が無いため、液
晶パネル等と接続するときに、2層FPC1の組立て品
と液晶パネルとの位置合わせも容易になる。さらに、組
立て後の2層FPC1に変形の応力が残留しないため、
銅端子3が断線する問題を解消することができると共
に、ドライバーICチップ7と入力端子4aとの低抵抗
接続に要求される高信頼性を維持することができる。
Further, since the two-layer FPC1 is not deformed, the two-layer FPC1 and the driver IC chip 7 can be accurately and easily aligned with each other, and the non-defective rate of the assembled product can be improved. Further, since the two-layer FPC 1 having the driver IC chip 7 mounted thereon is not deformed, it becomes easy to align the assembly of the two-layer FPC 1 with the liquid crystal panel when connecting to the liquid crystal panel or the like. Furthermore, since the deformation stress does not remain in the two-layer FPC1 after assembly,
The problem that the copper terminal 3 is disconnected can be solved, and the high reliability required for low resistance connection between the driver IC chip 7 and the input terminal 4a can be maintained.

【0061】さらに、低抵抗接続の要求度がとりわけ高
いバンプ10’に対して、複数本に枝分かれした分岐入
力端子4bを設けたので、環境条件により分岐入力端子
4bとバンプ10’との接続状態が多少劣化したとして
も、高い接続信頼性を維持し続けることができる。
Further, since the branch input terminal 4b branched into a plurality of pieces is provided for the bump 10 'which has a particularly high demand for low resistance connection, the connection state between the branch input terminal 4b and the bump 10' is provided depending on environmental conditions. Even if the quality deteriorates to some extent, high connection reliability can be maintained.

【0062】なお、本実施の形態では、インナリード接
続部6周辺において、入力端子4a・4bのインナリー
ド、出力端子5aのインナリード、ダミー端子11の全
てが等間隔に配置された場合を説明したが、これに限ら
ず、例えば入力端子4a・4bと出力端子5aとで、イ
ンナリードの幅を違える場合等には、入力端子4a・4
bのインナリードとダミー端子11とが第1の配線ピッ
チで等間隔に配置され、出力端子5aのインナリードと
ダミー端子11とが、第1の配線ピッチと異なる第2の
配線ピッチで等間隔に配置されることもある。
In the present embodiment, the case where all of the inner leads of the input terminals 4a and 4b, the inner leads of the output terminal 5a, and the dummy terminal 11 are arranged at equal intervals around the inner lead connecting portion 6 will be described. However, not limited to this, for example, when the width of the inner lead is different between the input terminals 4a and 4b and the output terminal 5a, the input terminals 4a and 4b
The inner leads of b and the dummy terminals 11 are arranged at equal intervals at a first wiring pitch, and the inner leads of the output terminals 5a and the dummy terminals 11 are equally spaced at a second wiring pitch different from the first wiring pitch. It may be placed in.

【0063】すなわち、どのような場合にも共通してい
ることは、非配線領域におけるダミー端子11や分岐入
力端子4bのピッチを、周囲の配線ピッチとできる限り
同一となるように設定することである。こうすること
で、非配線領域を空白領域のままに残しておくより、2
層FPC1の変形を防止する高い効果を得ることができ
る。
That is, what is common to all cases is that the pitch of the dummy terminals 11 and the branch input terminals 4b in the non-wiring region is set to be as close as possible to the surrounding wiring pitch. is there. By doing this, rather than leaving the non-wiring area as a blank area,
A high effect of preventing the deformation of the layer FPC1 can be obtained.

【0064】次に、ドライバーICチップ7の電極上に
形成されるバンプ10の設け方について図2に基づいて
説明する。図2は、図1のA−A’線矢視断面を示して
いる。ドライバーICチップ7には、入力端子4aに対
応するバンプ10が複数設けられており、さらに、ダミ
ー端子11に対応するダミーバンプ13が設けられてい
る。また、低抵抗接続の要求度がとりわけ高いドライバ
ーICチップ7の電極には、面積の大きなバンプ10’
が形成され、このバンプ10’と複数本に枝分かれした
分岐入力端子4bとが対向するように配されている。
Next, how to provide the bumps 10 formed on the electrodes of the driver IC chip 7 will be described with reference to FIG. FIG. 2 shows a cross section taken along the line AA ′ of FIG. The driver IC chip 7 is provided with a plurality of bumps 10 corresponding to the input terminals 4a, and further provided with dummy bumps 13 corresponding to the dummy terminals 11. In addition, the bumps 10 'having a large area are provided on the electrodes of the driver IC chip 7 for which the low resistance connection is particularly required.
Are formed, and the bumps 10 ′ and the branch input terminals 4 b branched into a plurality of lines are arranged so as to face each other.

【0065】上記の異方性導電膜12は、例えばエポキ
シ樹脂に導電粒子12aを分散させて成り、フリップチ
ップボンディング時には、熱圧着の圧力によって、バン
プ10と入力端子4aとの間、バンプ10’と分岐入力
端子4bとの間、およびダミーバンプ13とダミー端子
11との間で、導電粒子12aが押し潰される。この結
果、バンプ10と入力端子4aおよびバンプ10’と分
岐入力端子4bとを電気的に接続すると共に、ダミーバ
ンプ13とダミー端子11とを熱が互いに伝わるように
接続する。また、熱圧着の熱によって異方性導電膜12
のエポキシ樹脂が硬化するため、上記の接続は、固定さ
れ保持される。
The anisotropic conductive film 12 is formed by dispersing conductive particles 12a in, for example, an epoxy resin. During flip chip bonding, the pressure of thermocompression bonding causes a bump 10 'between the bump 10 and the input terminal 4a. And the branch input terminal 4b, and between the dummy bump 13 and the dummy terminal 11, the conductive particles 12a are crushed. As a result, the bumps 10 and the input terminals 4a and the bumps 10 'and the branch input terminals 4b are electrically connected, and the dummy bumps 13 and the dummy terminals 11 are connected so that heat can be transferred to each other. Further, the anisotropic conductive film 12 is heated by the heat of thermocompression bonding.
Since the epoxy resin of is hardened, the above connection is fixed and held.

【0066】なお、異方性導電膜12の代わりに、紫外
線等の光照射によって硬化する光硬化性樹脂に導電粒子
を分散させた異方性導電膜を用いてもよい。
Instead of the anisotropic conductive film 12, an anisotropic conductive film in which conductive particles are dispersed in a photocurable resin which is cured by irradiation with light such as ultraviolet rays may be used.

【0067】このように、バンプ10は完全に等間隔で
配列されることが望ましいが、前述のように、IC作製
上の制約によって等間隔の配列が困難な場合に、ダミー
端子11に対応するダミーバンプ13を設けたので、非
配線領域における熱伝導が均一になる。これにより、基
材2の熱膨張率を一層均一化することができる。さら
に、ダミー端子11とダミーバンプ13とを接続するこ
とで、基材2にかかる圧力が全体的に均一になることに
よっても、接続の信頼性を向上させることができる。
As described above, it is desirable that the bumps 10 are arranged at equal intervals completely, but as described above, when it is difficult to arrange the bumps at equal intervals due to restrictions in IC fabrication, the bumps 10 correspond to the dummy terminals 11. Since the dummy bumps 13 are provided, the heat conduction becomes uniform in the non-wiring region. Thereby, the coefficient of thermal expansion of the base material 2 can be made more uniform. Further, by connecting the dummy terminals 11 and the dummy bumps 13 to each other, the pressure applied to the base material 2 becomes uniform throughout, so that the connection reliability can be improved.

【0068】また、バンプ10・10’およびダミーバ
ンプ13と、各端子4a・4b・5a・11の各々との
接続面積が全て同一となり、かつ等間隔に接続されるよ
うに、バンプ10・10’およびダミーバンプ13を設
けることで、インナリード接続部6の周囲全体で熱伝導
が均一になるため、基材2の熱膨張率を一層均一化し、
変形を確実に防止することができる。
Further, the bumps 10 and 10 'and the dummy bumps 13 and the terminals 4a, 4b, 5a and 11 have the same connection area and are connected at equal intervals. By providing the dummy bumps 13 and the heat conduction becomes uniform around the inner lead connection portion 6, the coefficient of thermal expansion of the base material 2 is made more uniform,
Deformation can be reliably prevented.

【0069】なお、本実施の形態では、インナリード接
続部6における配線ピッチを同一に設定する場合を示し
たが、配線ピッチにある程度の差が有っても、従来のよ
うに非配線領域を空白領域のまま放置しておく場合に比
べて、上記の各効果を奏するものである。ただし、広い
配線ピッチが狭い配線ピッチの2倍以上になると、ボン
ディング時の熱、圧力による応力が2層FPC1に不均
一にかかるため、歪みが発生する。また、この場合、外
部よりかかる機械的な力に対して応力が集中する部分が
生じ易く、引き回し配線部8での断線につながりやすく
なる。
In this embodiment, the case where the wiring pitch in the inner lead connecting portion 6 is set to be the same is shown. However, even if there is a certain difference in the wiring pitch, the non-wiring region is formed as in the conventional case. As compared with the case where the blank area is left as it is, the above-mentioned respective effects are exhibited. However, if the wide wiring pitch is twice or more as large as the narrow wiring pitch, stress due to heat and pressure during bonding is unevenly applied to the two-layer FPC 1, so that distortion occurs. Further, in this case, a portion where the stress is concentrated with respect to a mechanical force applied from the outside is apt to occur, which easily leads to disconnection in the lead wiring portion 8.

【0070】[0070]

【発明の効果】請求項1の発明に係るフレキシブル配線
基板の端子構造は、以上のように、フレキシブル配線基
板に、異方性導電膜を用いてICチップを実装する搭載
領域を備え、この搭載領域内に延び出したインナリード
の配線ピッチの疎密を無くすように、配線ピッチの疎ら
な部分に信号ラインと結線されないダミー端子を設け、
配線ピッチを入力信号側と出力信号側のそれぞれで同一
の基準値に揃えた構成である。
As described above, the terminal structure of the flexible wiring board according to the invention of claim 1 is provided with the mounting area for mounting the IC chip on the flexible wiring board by using the anisotropic conductive film. In order to eliminate the unevenness of the wiring pitch of the inner leads extending into the area, a dummy terminal that is not connected to the signal line is provided in the portion where the wiring pitch is sparse,
The wiring pitch is the same reference value on the input signal side and the output signal side.

【0071】それゆえ、インナリードの配線ピッチの疎
密を、入力信号側と出力信号側のそれぞれでダミー端子
によって無くしているので、フレキシブル配線基板の熱
伝導率のばらつきを入出力信号側のそれぞれで小さくす
ることができる。これにより、異方性導電膜に熱処理を
施した場合、熱伝導率のばらつきに起因するフレキシブ
ル配線基板の反りやうねり等の変形を抑制することがで
きる。
Therefore, since the unevenness of the wiring pitch of the inner leads is eliminated by the dummy terminals on the input signal side and the output signal side, respectively, the variation in the thermal conductivity of the flexible wiring board is changed on the input / output signal side. Can be made smaller. Accordingly, when the anisotropic conductive film is subjected to heat treatment, it is possible to suppress deformation such as warpage or waviness of the flexible wiring board due to variations in thermal conductivity.

【0072】また、異方性導電膜に含まれる熱硬化性樹
脂または光硬化性樹脂の収縮によって生じる応力が、フ
レキシブル配線基板の入力信号側と出力信号側のそれぞ
れに均一にかかるので、異方性導電膜の硬化に起因する
フレキシブル配線基板の反りやうねり等の変形を抑制す
ることができる。
Since the stress generated by the shrinkage of the thermosetting resin or the photocurable resin contained in the anisotropic conductive film is evenly applied to the input signal side and the output signal side of the flexible wiring board, it is anisotropic. It is possible to suppress deformation such as warpage or undulation of the flexible wiring board due to hardening of the conductive conductive film.

【0073】この結果、(1) 量産対応のTCPに反りや
うねり等の変形が生じない、(2) フレキシブル配線基板
にICチップを実装した実装品において、接続不良や断
線等のトラブルの発生が抑制される、(3) 実装品を組付
ける液晶等表示パネルの良品率を向上させることができ
る、(4) 信頼性の高い表示パネルを提供できるという種
々の優れた効果を併せて奏する。
As a result, (1) no deformation such as warpage or waviness occurs in TCP for mass production, (2) problems such as connection failure or disconnection occur in a mounted product in which an IC chip is mounted on a flexible wiring board. It has various excellent effects that are suppressed, (3) it is possible to improve the non-defective rate of the display panel such as a liquid crystal to which the mounted product is assembled, and (4) it is possible to provide a highly reliable display panel.

【0074】請求項2の発明に係るフレキシブル配線基
板の端子構造は、以上のように、請求項1に記載のイン
ナリードを先端部とする入力信号線または出力信号線の
配線の引き回しによって生じた非配線領域を埋めるよう
に、非配線領域の形状に合わせてダミー端子を設けた構
成である。
As described above, the terminal structure of the flexible wiring board according to the invention of claim 2 is generated by arranging the wiring of the input signal line or the output signal line whose tip is the inner lead according to claim 1. The dummy terminals are provided so as to fill the non-wiring region according to the shape of the non-wiring region.

【0075】それゆえ、配線ピッチが疎らな領域で自ず
と発生する非配線領域の形状に合わせて、インナリード
の配線ピッチの疎密を無くすようにダミー端子を設ける
ことにより、搭載領域の周辺から熱膨張率や応力発生を
不均一にする非配線領域が無くなるので、請求項1の構
成による効果を一層向上させることができるという効果
を奏する。
Therefore, by providing dummy terminals so as to eliminate the unevenness of the wiring pitch of the inner leads in accordance with the shape of the non-wiring area which naturally occurs in the area where the wiring pitch is sparse, thermal expansion from the periphery of the mounting area is achieved. Since the non-wiring region that makes the rate and stress generation non-uniform is eliminated, the effect of the configuration of claim 1 can be further improved.

【0076】請求項3の発明に係るフレキシブル配線基
板の端子構造は、以上のように、請求項1または2に記
載の構成に加えて、上記搭載領域内に導かれた全てのイ
ンナリードの幅を同一の基準値に揃え、さらに上記ダミ
ー端子を設けることによって、インナリードの配線ピッ
チを入力信号側と出力信号側とで同一の基準値に揃えた
構成である。
As described above, the terminal structure of the flexible wiring board according to the invention of claim 3 is, in addition to the structure of claim 1 or 2, the width of all the inner leads introduced into the mounting area. To the same reference value, and by providing the dummy terminals, the wiring pitch of the inner leads is adjusted to the same reference value on the input signal side and the output signal side.

【0077】それゆえ、全てのインナリードの幅を同一
の基準値に揃え、しかもインナリードの配線ピッチを搭
載領域全体に対して同一の基準値に揃えることで、熱膨
張率や、異方性導電膜の硬化時における応力発生が、よ
り均一化されるので、請求項1または2の構成による効
果をより一層向上させることができるという効果を奏す
る。
Therefore, by matching the widths of all the inner leads to the same reference value, and further, aligning the wiring pitches of the inner leads to the same reference value for the entire mounting area, the coefficient of thermal expansion and the anisotropy are increased. Since the stress generation during curing of the conductive film is made more uniform, the effect of the structure of claim 1 or 2 can be further improved.

【0078】請求項4の発明に係るフレキシブル配線基
板の端子構造は、以上のように、請求項1、2または3
に記載の構成に加えて、1つの入力信号線を上記非配線
領域を利用して複数本に分岐させ、上記搭載領域内に導
き、ICチップに形成されたバンプとの接続面積を増大
させた構成である。
The terminal structure of the flexible wiring board according to the invention of claim 4 is as described above,
In addition to the configuration described in 1 above, one input signal line is branched into a plurality of lines by utilizing the non-wiring region and guided into the mounting region to increase the connection area with the bump formed on the IC chip. It is a composition.

【0079】それゆえ、低抵抗接続の要求度が特に高い
電極をICチップが含んでいる場合に、その電極に対応
する入力信号線を複数本に分岐させれば、ICチップの
バンプとの接続面積を増大させ、1つの入力信号線の接
続抵抗を低減することができる。また、1つの入力信号
線が複数箇所で接続される結果、環境条件によりインナ
リードとバンプとの接続状態が多少劣化したとしても、
高い接続信頼性を維持し続けることができる。さらに、
非配線領域を利用して複数本に分岐された入力信号線
は、上記ダミー端子と同じ働きをするので、請求項1、
2または3に記載の構成による効果を奏した上に、1つ
の入力信号線の接続抵抗を低減し、信号のS/Nを向上
させることができ、接続信頼性を長期間維持することが
できるという効果を奏する。
Therefore, when the IC chip includes an electrode for which a low resistance connection is particularly required, if the input signal line corresponding to the electrode is branched into a plurality of lines, the connection with the bump of the IC chip is achieved. The area can be increased and the connection resistance of one input signal line can be reduced. Further, even if the connection state between the inner leads and the bumps is slightly deteriorated due to environmental conditions as a result of one input signal line being connected at a plurality of points,
High connection reliability can be maintained. further,
The input signal line branched into a plurality of lines using the non-wiring region has the same function as the dummy terminal.
In addition to the effect of the configuration described in 2 or 3, it is possible to reduce the connection resistance of one input signal line, improve the signal S / N, and maintain the connection reliability for a long time. Has the effect.

【0080】請求項5の発明に係るICチップの実装構
造は、以上のように、請求項1ないし4のいずれか1項
に記載のインナリードと、ICチップに形成されたバン
プとをそれぞれ接続し、上記搭載領域にICチップを実
装した構成である。
As described above, the mounting structure of the IC chip according to the invention of claim 5 connects the inner lead according to any one of claims 1 to 4 with the bump formed on the IC chip. However, an IC chip is mounted in the mounting area.

【0081】それゆえ、信頼性が高く、かつ液晶やプラ
ズマ等を用いた表示パネルの良品率を向上させることが
できるICチップの実装構造を提供することができると
いう効果を奏する。
Therefore, there is an effect that it is possible to provide a mounting structure of an IC chip which is highly reliable and which can improve the non-defective rate of a display panel using liquid crystal, plasma or the like.

【0082】請求項6の発明に係るICチップの実装構
造は、以上のように、請求項5に記載のICチップに
は、信号ラインに結線されないダミーバンプが上記ダミ
ー端子に対応して設けられ、ダミー端子とダミーバンプ
とがそれぞれ接続されている構成である。
As described above, in the mounting structure of the IC chip according to the invention of claim 6, the IC chip according to claim 5 is provided with the dummy bumps which are not connected to the signal line, corresponding to the dummy terminals. In this configuration, the dummy terminal and the dummy bump are connected to each other.

【0083】それゆえ、特に、フレキシブル配線基板の
搭載領域に異方性導電膜を用いてICチップを熱圧着す
るときに、ICチップに加えられた熱が、ダミーバンプ
からダミー端子へ伝わり、さらにフレキシブル配線基板
の基材に伝わるので、ICチップにダミーバンプを設け
ない場合と比べて、フレキシブル配線基板における熱伝
導がより均一に行われる。この効果は、インナリードお
よびダミー端子の幅、配線ピッチが搭載領域において均
一化する程、またダミー端子とダミーバンプとの接続面
積が搭載領域において均一化する程、向上する。したが
って、請求項1ないし5のいずれか1項に記載の構成に
よる効果を一層向上させることができるという効果を奏
する。
Therefore, in particular, when the IC chip is thermocompression bonded by using the anisotropic conductive film in the mounting area of the flexible wiring board, the heat applied to the IC chip is transferred from the dummy bumps to the dummy terminals, and the flexibility is further improved. Since it is transmitted to the base material of the wiring board, the heat conduction in the flexible wiring board is performed more uniformly than in the case where the dummy bumps are not provided on the IC chip. This effect is improved as the widths and wiring pitches of the inner leads and the dummy terminals are made uniform in the mounting region, and the connection areas between the dummy terminals and the dummy bumps are made uniform in the mounting region. Therefore, there is an effect that it is possible to further improve the effect of the configuration according to any one of claims 1 to 5.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るフレキシブル配線基板の端子配列
の一構成例を平面的に示す説明図である。
FIG. 1 is an explanatory plan view showing one structural example of a terminal arrangement of a flexible wiring board according to the present invention.

【図2】図1のA−A’線矢視断面を示す模式図であ
る。
FIG. 2 is a schematic diagram showing a cross section taken along the line AA ′ of FIG.

【図3】(a)は、従来のインナリードボンディングに
よってICチップが実装された3層構成のフレキシブル
配線基板を示す断面図、(b)は、従来のフリップチッ
プボンディングによってICチップが実装された2層構
成のフレキシブル配線基板を示す断面図であり、図4の
X−X’線矢視断面図である。
3A is a cross-sectional view showing a flexible wiring board having a three-layer structure in which an IC chip is mounted by conventional inner lead bonding, and FIG. 3B is an IC chip mounted by conventional flip chip bonding. It is sectional drawing which shows the flexible wiring board of 2 layer structure, and is a XX 'line sectional view taken on the line of FIG.

【図4】従来のフレキシブル配線基板の端子配列の一構
成例を平面的に示す説明図である。
FIG. 4 is an explanatory view showing a planar configuration example of a terminal arrangement of a conventional flexible wiring board.

【符号の説明】[Explanation of symbols]

1 2層FPC(フレキシブル配線基板) 3 銅端子(入力信号線および出力信号線) 4a 入力端子(入力信号線) 4b 分岐入力端子 5a 出力端子(出力信号線) 6 インナリード接続部(搭載領域) 7 ドライバーICチップ 10 バンプ 10’ バンプ 11 ダミー端子 12 異方性導電膜 12a 導電粒子 13 ダミーバンプ 1 2 layer FPC (flexible wiring board) 3 copper terminal (input signal line and output signal line) 4a input terminal (input signal line) 4b branch input terminal 5a output terminal (output signal line) 6 inner lead connection part (mounting area) 7 Driver IC Chip 10 Bump 10 'Bump 11 Dummy Terminal 12 Anisotropic Conductive Film 12a Conductive Particle 13 Dummy Bump

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】フレキシブル配線基板に、異方性導電膜を
用いてICチップを実装する搭載領域を備え、この搭載
領域内に延び出したインナリードの配線ピッチの疎密を
無くすように、配線ピッチの疎らな部分に信号ラインと
結線されないダミー端子を設け、配線ピッチを入力信号
側と出力信号側のそれぞれで同一の基準値に揃えたこと
を特徴とするフレキシブル配線基板の端子構造。
1. A flexible wiring board is provided with a mounting area for mounting an IC chip by using an anisotropic conductive film, and a wiring pitch is arranged so as to eliminate the unevenness of the wiring pitch of the inner leads extending into the mounting area. The terminal structure of the flexible wiring board is characterized in that dummy terminals not connected to the signal line are provided in the sparse part of the wiring, and the wiring pitch is adjusted to the same reference value on the input signal side and the output signal side.
【請求項2】上記インナリードを先端部とする入力信号
線または出力信号線の配線の引き回しによって生じた非
配線領域を埋めるように、非配線領域の形状に合わせて
ダミー端子を設けたことを特徴とする請求項1に記載の
フレキシブル配線基板の端子構造。
2. A dummy terminal is provided in conformity with the shape of the non-wiring region so as to fill the non-wiring region generated by routing the wiring of the input signal line or the output signal line having the inner lead as the tip. The terminal structure for a flexible wiring board according to claim 1, which is characterized in that.
【請求項3】上記搭載領域内に導かれた全てのインナリ
ードの幅を同一の基準値に揃え、さらに上記ダミー端子
を設けることによって、インナリードの配線ピッチを入
力信号側と出力信号側とで同一の基準値に揃えたことを
特徴とする請求項1または2に記載のフレキシブル配線
基板の端子構造。
3. The wiring pitch of the inner leads is set to the input signal side and the output signal side by aligning the widths of all the inner leads guided in the mounting area to the same reference value and further providing the dummy terminals. 3. The terminal structure of the flexible wiring board according to claim 1 or 2, characterized in that the same reference value is set.
【請求項4】1つの入力信号線を上記非配線領域を利用
して複数本に分岐させ、上記搭載領域内に導き、ICチ
ップに形成されたバンプとの接続面積を増大させたこと
を特徴とする請求項1、2または3に記載のフレキシブ
ル配線基板の端子構造。
4. An input signal line is branched into a plurality of lines by utilizing the non-wiring region and is guided into the mounting region to increase a connection area with a bump formed on an IC chip. The terminal structure of the flexible wiring board according to claim 1, 2, or 3.
【請求項5】請求項1ないし4のいずれか1項に記載の
インナリードと、ICチップに形成されたバンプとをそ
れぞれ接続し、上記搭載領域にICチップを実装したこ
とを特徴とするICチップの実装構造。
5. An IC characterized in that the inner lead according to any one of claims 1 to 4 is connected to a bump formed on an IC chip, and the IC chip is mounted in the mounting area. Chip mounting structure.
【請求項6】上記ICチップには、信号ラインに結線さ
れないダミーバンプが上記ダミー端子に対応して設けら
れ、ダミー端子とダミーバンプとがそれぞれ接続されて
いることを特徴とする請求項5に記載のICチップの実
装構造。
6. The IC chip according to claim 5, wherein a dummy bump which is not connected to a signal line is provided corresponding to the dummy terminal, and the dummy terminal and the dummy bump are connected to each other. IC chip mounting structure.
JP6693196A 1996-03-22 1996-03-22 Terminal structure of flexible wiring board and mounting structure of IC chip using the same Expired - Fee Related JP3207743B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6693196A JP3207743B2 (en) 1996-03-22 1996-03-22 Terminal structure of flexible wiring board and mounting structure of IC chip using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6693196A JP3207743B2 (en) 1996-03-22 1996-03-22 Terminal structure of flexible wiring board and mounting structure of IC chip using the same

Publications (2)

Publication Number Publication Date
JPH09260579A true JPH09260579A (en) 1997-10-03
JP3207743B2 JP3207743B2 (en) 2001-09-10

Family

ID=13330241

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3207743B2 (en)

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