JPH09241093A - Quartz crucible having double layer structure for fusing of silicon - Google Patents

Quartz crucible having double layer structure for fusing of silicon

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Publication number
JPH09241093A
JPH09241093A JP5302096A JP5302096A JPH09241093A JP H09241093 A JPH09241093 A JP H09241093A JP 5302096 A JP5302096 A JP 5302096A JP 5302096 A JP5302096 A JP 5302096A JP H09241093 A JPH09241093 A JP H09241093A
Authority
JP
Japan
Prior art keywords
crucible
quartz
silicon
single crystal
quartz glass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5302096A
Other languages
Japanese (ja)
Inventor
Yoshinori Shirakawa
義徳 白川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Sitix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Sitix Corp filed Critical Sumitomo Sitix Corp
Priority to JP5302096A priority Critical patent/JPH09241093A/en
Publication of JPH09241093A publication Critical patent/JPH09241093A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To obtain a quartz crucible to fuse silicon which does bend inward at its upper part even in a high temp. atmosphere so that a single crystal having a larger diameter can be obtd., and a single crystal without dislocation can be drawn, by forming a two-layer structure of transparent and translucent quartz glass for the crucible to be inserted in a carbon crucible. SOLUTION: A quartz crucible 1 to fuse silicon to be inserted inside of a carbon crucible 5 has a two-layer structure fusing crucible 6 consisting of an upper transparent quartz glass 2 and a lower translucent quartz glass 3 integrated into one body. The transparent quartz glass means that it has <=0.01vol.% air bubbles, while the translucent quartz glass means it has >=0.1vol.% air bubbles. The upper part comprising the transparent glass has length corresponding to at least 25% of the crucible height from the upper edge.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】この発明は、シリコン単結晶
の引上げに用いられるシリコン溶融用石英坩堝に関し、
さらに詳しくは引上げ中における坩堝上部の変形を防止
したシリコン溶融用石英坩堝に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a silicon melting quartz crucible used for pulling a silicon single crystal,
More specifically, it relates to a quartz crucible for melting silicon, which prevents deformation of the upper part of the crucible during pulling.

【0002】[0002]

【従来の技術】シリコン単結晶を製造するには、高純度
シリコン原料を減圧下のアルゴン雰囲気で溶融し、種結
晶を用いて上方に引き上げながら凝固させる方法が多用
されている。
2. Description of the Related Art In order to manufacture a silicon single crystal, a method of melting a high-purity silicon raw material in an argon atmosphere under reduced pressure and solidifying it while pulling it upward with a seed crystal is widely used.

【0003】図2は、引き上げながら凝固させるシリコ
ン単結晶製造装置を示す縦断面図である。図中の符号9
はシリコン単結晶12の引上げ雰囲気を減圧するチャンバ
ーであり、チャンバーの内部には溶融坩堝6 が配置さ
れ、坩堝の外側にはこれを囲んで誘導加熱コイルなどで
構成された加熱用ヒーター7 が、更にその外側に断熱材
で円筒状に構成された保温筒8 が配設されている。溶融
坩堝内にはヒーターにより溶融された結晶育成用原料、
つまりシリコン原料の溶融液10が収容されている。その
溶融液の表面に引上げワイヤ13の先に取り付けた種結晶
11の下端を接触させ、この種結晶を上方に引き上げるこ
とによって、その下端に溶融液が凝固したシリコン単結
晶12を成長させていく。
FIG. 2 is a longitudinal sectional view showing a silicon single crystal manufacturing apparatus for solidifying while pulling. Reference numeral 9 in the figure
Is a chamber for depressurizing the pulling atmosphere of the silicon single crystal 12, a melting crucible 6 is arranged inside the chamber, and a heating heater 7 composed of an induction heating coil is provided outside the crucible so as to surround it. Further, on the outer side thereof, a heat insulating cylinder 8 formed of a heat insulating material in a cylindrical shape is arranged. In the melting crucible, raw material for crystal growth melted by a heater,
That is, the melt 10 of the silicon raw material is contained. Seed crystal attached to the surface of the melt at the tip of pulling wire 13
The lower end of 11 is brought into contact and the seed crystal is pulled upward to grow a silicon single crystal 12 in which the melt is solidified at the lower end thereof.

【0004】このとき溶融坩堝は回転軸16で、シリコン
単結晶は引上げワイヤの上部に設けた回転機構(図示せ
ず)によって、お互いに反対方向に回転させられる。溶
融坩堝は二重構造であり、内側が石英ガラス製の容器1
(以下、これを「石英坩堝」という)、外側がカーボン
製の容器5 (以下、これを「カーボン坩堝」という)か
ら構成されている。
At this time, the melting crucible is rotated by the rotating shaft 16, and the silicon single crystal is rotated by the rotating mechanism (not shown) provided above the pulling wire in opposite directions. The melting crucible has a double structure and the inside is made of quartz glass.
(Hereinafter, this is referred to as "quartz crucible"), and the outer side is composed of a carbon container 5 (hereinafter referred to as "carbon crucible").

【0005】減圧チャンバー内は、約 10 torr に減圧
され、ガス供給口14からアルゴンガスを供給し、シリコ
ン溶融液の表面から発生するSiO ガスおよびカーボン坩
堝やヒーターから発生するCOガスなどをガス排気口15か
ら排出する。
The inside of the decompression chamber is decompressed to about 10 torr, argon gas is supplied from the gas supply port 14, and SiO gas generated from the surface of the silicon melt and CO gas generated from the carbon crucible and the heater are exhausted. Discharge through mouth 15.

【0006】図3は、従来使用されているシリコン溶融
用坩堝の断面を示す図であり、(a)は坩堝の縦断面、(b)
は単結晶の引上げ中に内側に倒れ込んだ状態を示す図
である。(a) 図に示すように溶融坩堝の上端部は、石英
坩堝の側壁の方がカーボン坩堝の側壁よりも上方に高く
なるように構成されている。そしてシリコン単結晶の引
上げ中には、石英坩堝のシリコン溶融液が存在しない部
分の温度は、シリコン溶融液が存在する部分よりも高く
なる。このため、直径8インチ以上の単結晶を引き上げ
ると、(b) 図に示すようにシリコン溶融液が存在しない
石英坩堝の上部が内側に倒れ込む変形が生じ、シリコン
の引上げの中止をよぎなくされる。また、シリコンの溶
融液からSiO ガスが発生し、石英坩堝とカーボン坩堝と
の間に侵入し、(b) 図に示すようにカーボン坩堝のカー
ボン(C)が珪化反応(SiO +C→SiC )するので、カ
ーボン坩堝の寿命が低下する。
FIG. 3 is a view showing a cross section of a conventionally used crucible for melting silicon, (a) is a vertical cross section of the crucible, and (b) is a cross section.
FIG. 6 is a diagram showing a state in which a single crystal is tilted inward during pulling. As shown in (a), the upper end portion of the melting crucible is configured such that the side wall of the quartz crucible is higher than the side wall of the carbon crucible. Then, during the pulling of the silicon single crystal, the temperature of the portion of the quartz crucible where the silicon melt does not exist becomes higher than the portion where the silicon melt exists. Therefore, when a single crystal with a diameter of 8 inches or more is pulled up, the upper part of the quartz crucible in which the silicon melt does not exist collapses inward as shown in FIG. . Further, SiO gas is generated from the molten liquid of silicon and invades between the quartz crucible and the carbon crucible, and carbon (C) of the carbon crucible undergoes a silicidation reaction (SiO + C → SiC) as shown in FIG. Therefore, the life of the carbon crucible is reduced.

【0007】同図(b) には、石英坩堝の上部が内部に倒
れ込んだ倒れ込み部17と、カーボン坩堝の珪化部19とが
示されている。石英坩堝の倒れ込み部の内面18にSiO ガ
スが付着し、SiO ガスが凝固してシリコン溶融液に落下
する。落下した凝固物はシリコン単結晶内に浸入する
と、無転位結晶の引上げを困難とする。また、倒れ込み
が発生するとカーボン坩堝と石英坩堝との界面20にSiO
ガスが浸入しやすくなり、カーボン坩堝が珪化され、再
利用ができなくなる。
FIG. 1B shows a collapsed portion 17 in which the upper part of the quartz crucible is collapsed inward, and a silicified portion 19 of the carbon crucible. SiO gas adheres to the inner surface 18 of the collapsed portion of the quartz crucible, and the SiO gas is solidified and drops into the silicon melt. If the solidified material that has dropped falls into the silicon single crystal, it becomes difficult to pull up the dislocation-free crystal. Further, when collapse occurs, SiO is formed at the interface 20 between the carbon crucible and the quartz crucible.
Gas easily enters and the carbon crucible is silicified and cannot be reused.

【0008】これを解決するため特開昭63-315263 号公
報には、石英坩堝の円筒状側壁の上端に、外側に広がる
フランジが一体に設けられた溶融坩堝が提案されてい
る。しかし、前記フランジを一体に設ける加工は煩雑で
あり、コスト高になる。このため、特開平3-290393号公
報には、溶融坩堝の円筒状側壁上端に、これを被う石英
リングが設けられた溶融坩堝が提案されている。しか
し、高温に曝されたとき、石英リングは石英坩堝と融合
し、取り外しできなくなり、この石英リングの再利用が
できないという問題がある。
To solve this problem, Japanese Patent Laid-Open No. 63-315263 proposes a melting crucible in which a flange extending outward is integrally provided on the upper end of a cylindrical side wall of a quartz crucible. However, the process of integrally providing the flange is complicated and costly. Therefore, Japanese Patent Application Laid-Open No. 3-290393 proposes a melting crucible in which a quartz ring covering the cylindrical side wall of the melting crucible is provided on the upper end of the side wall. However, when exposed to high temperatures, the quartz ring fuses with the quartz crucible and cannot be removed, and this quartz ring cannot be reused.

【0009】[0009]

【発明が解決しようとする課題】本発明の目的は、単結
晶の直径が大径化され、高温雰囲気中においても石英坩
堝上部の倒れ込みがなく、転位のない単結晶を引き上げ
ることのできる石英坩堝を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to increase the diameter of a single crystal so that the upper part of the quartz crucible does not collapse even in a high temperature atmosphere, and a single crystal without dislocation can be pulled up. To provide.

【0010】[0010]

【課題を解決するための手段】本発明者は、坩堝上部の
倒れ込みの原因について種々調査した結果、石英ガラス
の透明度の高いものほど、即ち気泡の存在率の低いもの
ほど倒れ込みの発生が少ないことを見いだし、本発明を
完成した。
As a result of various investigations on the cause of the collapse of the upper part of the crucible, the present inventor has found that the higher the transparency of quartz glass, that is, the lower the existence rate of bubbles, the less the occurrence of the collapse. Then, the present invention was completed.

【0011】本発明の要旨は、図1に示す下記のシリコ
ン溶融用石英坩堝にある。
The gist of the present invention resides in the following quartz crucible for melting silicon shown in FIG.

【0012】二重構造溶融坩堝6 としてカーボン坩堝5
の内部に挿入されるシリコン溶融用石英坩堝1 であっ
て、上部2 が透明石英ガラス、下部3 が半透明石英ガラ
スで一体に構成されているシリコン溶融用石英坩堝。
A carbon crucible 5 as a double structure melting crucible 6
1. A quartz glass crucible for melting silicon 1, which is inserted inside a quartz melting crucible 1 for melting, wherein upper part 2 is made of transparent quartz glass and lower part 3 is made of semitransparent quartz glass.

【0013】ここで透明石英ガラスとは気泡の存在率が
容積率で0.01%以下、半透明石英とは気泡の存在率が0.
1 %以上であることを意味する。また、透明石英ガラス
で構成される上部とは、坩堝高さに対して上端から少な
くとも 25 %の長さを有することを意味する。
Here, the transparent quartz glass has a bubble existence rate of 0.01% or less in volume ratio, and the semitransparent quartz has a bubble existence rate of 0.
It means 1% or more. The upper part made of transparent quartz glass means having a length of at least 25% from the upper end with respect to the crucible height.

【0014】[0014]

【発明の実施の形態】図1は、本発明の石英坩堝を挿入
したシリコン溶融用坩堝を示す縦断面図である。同図に
示すように、本発明の溶融坩堝6 は、外側のカーボン坩
堝5 の内部に石英坩堝1 が挿入された二重構造である。
1 is a longitudinal sectional view showing a silicon melting crucible having a quartz crucible of the present invention inserted therein. As shown in the figure, the melting crucible 6 of the present invention has a double structure in which a quartz crucible 1 is inserted inside an outer carbon crucible 5.

【0015】石英坩堝は、上部2 を透明石英ガラスで、
下部を半透明石英ガラスで構成されている。上部は、気
泡の存在率0.01容積%以下の透明石英ガラスで構成され
ているので、輻射熱の透過性が良く、従来の坩堝に比べ
て温度上昇が約 100℃軽減される。これにより、坩堝上
部の自重による座屈および坩堝内部への倒れ込みがな
い。また、下部は、気泡の存在率0.1 容積%以上の半透
明石英ガラスで構成されている。
The quartz crucible has an upper part 2 made of transparent quartz glass,
The lower part is composed of semitransparent quartz glass. Since the upper part is made of transparent quartz glass with a bubble existence rate of 0.01% by volume or less, it has good radiant heat permeability, and the temperature rise is reduced by about 100 ° C compared to the conventional crucible. As a result, there is no buckling of the upper part of the crucible due to its own weight and no fall into the crucible. The lower part is composed of semi-transparent quartz glass with a bubble existence rate of 0.1 vol% or more.

【0016】本発明の石英坩堝は、通常のアーク溶融法
で石英粉を溶融成形して製作される。その製作には、従
来からあるような下記の方法を用いることができる。
The quartz crucible of the present invention is manufactured by melting and shaping quartz powder by a usual arc melting method. For the production, the following conventional methods can be used.

【0017】モールド内周面に原料の石英粉を堆積させ
る。この際、坩堝の上部を構成する石英粉の粒度を、下
部を構成する石英粉の粒度よりも充分小さくすることに
より、上部の透明化を促すことができる。次いで、モー
ルド底面に一定の厚さで堆積させた石英粉を、例えばア
ーク加熱などによって溶融し、堆積した石英層の表面が
溶融してガラス化するとともにモールド側から減圧し、
モールドに設けた通気孔を通じて石英層内部の空気を外
部に吸引して石英層表面部分に透明ガラス層を形成す
る。その後、加熱源の位置を調整し、加熱源を上部に近
づけ、減圧下で上部を再溶融することにより、上部を透
明化する。
A raw material quartz powder is deposited on the inner peripheral surface of the mold. At this time, by making the particle size of the quartz powder forming the upper part of the crucible sufficiently smaller than the particle size of the quartz powder forming the lower part, the transparency of the upper part can be promoted. Next, the quartz powder deposited on the bottom surface of the mold with a certain thickness is melted by, for example, arc heating, the surface of the deposited quartz layer is melted and vitrified, and the pressure is reduced from the mold side.
Air inside the quartz layer is sucked to the outside through a vent hole provided in the mold to form a transparent glass layer on the surface portion of the quartz layer. After that, the position of the heating source is adjusted, the heating source is brought close to the upper part, and the upper part is remelted under reduced pressure to make the upper part transparent.

【0018】この方法で製作された石英坩堝は、上部と
下部の接合部4 には明確な境界が顕れないが、前記気泡
の存在率が変化することにより確認される。また、別の
方法としては、製作時に上部と下部に石英の仕切り板を
設け、上下の真空度を変えることで上部を透明に下部を
半透明にすることができる。その後、石英の仕切り板を
削除することにより坩堝を仕上げることもできる。
In the quartz crucible manufactured by this method, no clear boundary appears in the upper and lower joints 4, but it is confirmed by the change in the abundance ratio of the bubbles. As another method, a quartz partition plate may be provided on the upper and lower portions during manufacturing, and the upper and lower portions may be made transparent and the lower portion may be made semi-transparent by changing the upper and lower vacuum levels. Then, the crucible can be finished by removing the quartz partition plate.

【0019】[0019]

【実施例】【Example】

(実施例1)表1に示すような上下二層構造の石英坩堝
を図2に示す単結晶製造装置の溶融坩堝として用い、直
径12インチのシリコン単結晶を引き上げる試験を行っ
た。引上げ装置の観察窓から石英坩堝上部の変形量(上
部の倒れ込み量)の測定と転位(欠陥)発生の有無の観
察をおこない、それらの結果を表1に示した。
(Example 1) A quartz crucible having an upper and lower two-layer structure as shown in Table 1 was used as a melting crucible of a single crystal manufacturing apparatus shown in FIG. 2 to perform a test for pulling a silicon single crystal having a diameter of 12 inches. From the observation window of the pulling device, the amount of deformation of the upper part of the quartz crucible (the amount of collapse of the upper part) was measured and the presence or absence of dislocation (defect) was observed, and the results are shown in Table 1.

【0020】[0020]

【表1】 [Table 1]

【0021】発明例1〜5は、坩堝の上部を気泡存在率
0.01容量%以下の透明石英ガラスを使用したので、坩堝
上部の倒れ込みはなく、引上げられた単結晶に転位(欠
陥)の発生も見られなかった。
In Invention Examples 1 to 5, in the upper part of the crucible, the bubble existence rate is set.
Since 0.01% by volume or less of transparent quartz glass was used, the upper part of the crucible did not collapse and dislocation (defect) was not observed in the pulled single crystal.

【0022】これに対し、比較例6は、透明石英ガラス
で構成した上部の長さが50mmと小さいため、坩堝上部に
は50mmの倒れ込みがあり、単結晶の一部に転位(欠陥)
が認められた。
On the other hand, in Comparative Example 6, since the length of the upper part made of transparent quartz glass is as small as 50 mm, there is a collapse of 50 mm in the upper part of the crucible, and dislocations (defects) occur in a part of the single crystal.
Was observed.

【0023】比較例7および8は、坩堝上部の透明石英
ガラスの透明度が悪いため、坩堝上部には 35 mmの倒れ
込みまたは座屈が観察され、いずれも単結晶に転位(欠
陥)が認められた。
In Comparative Examples 7 and 8, since the transparent quartz glass in the upper part of the crucible was poor in transparency, collapse or buckling of 35 mm was observed in the upper part of the crucible, and dislocations (defects) were observed in the single crystal in all cases. .

【0024】比較例9および10は、従来の坩堝を使用し
た場合であるが、坩堝上部に座屈が観察され、単結晶に
転位(欠陥)が認められた。
In Comparative Examples 9 and 10, the conventional crucible was used, but buckling was observed in the upper part of the crucible, and dislocations (defects) were observed in the single crystal.

【0025】(実施例2)坩堝の上部から高さ方向に約
200 mmを、気泡の存在率0.01容量%以下の透明石英ガラ
スとし、それより下部を気泡の存在率0.1 容量%以上の
半透明石英ガラスとし、内径750 mm、高さ400 mmの石英
坩堝を25体製作した。
(Embodiment 2) Approximately in the height direction from the top of the crucible.
200 mm is a transparent quartz glass with a bubble existence rate of 0.01 vol% or less, and a lower part is a semi-transparent quartz glass with a bubble existence rate of 0.1 vol% or more, and a quartz crucible with an inner diameter of 750 mm and a height of 400 mm is 25 mm. I made a body.

【0026】上記の石英坩堝をカーボン坩堝に挿入した
溶融坩堝を使用し、200 kgの多結晶シリコンを溶融し、
直径12インチ、長さ800 mmの単結晶を製造した。また、
比較例として図3(a) に示すような従来の溶融坩堝を用
い、同様のシリコン単結晶を製造した。
Using a melting crucible in which the above quartz crucible is inserted into a carbon crucible, 200 kg of polycrystalline silicon is melted,
A single crystal with a diameter of 12 inches and a length of 800 mm was produced. Also,
As a comparative example, a conventional silicon crucible as shown in FIG. 3 (a) was used to manufacture the same silicon single crystal.

【0027】上部に透明石英ガラスを使用した本発明の
溶融用石英坩堝を用いると、25本の単結晶を引上げのう
ち石英坩堝の変形または座屈が認められたものはなく、
無転位のシリコン単結晶が引き上げられた。これに対
し、従来の溶融用坩堝を用いた比較例では、25本の引上
げのうち18本に石英坩堝の変形または座屈が認められ、
その18本のうち引上げを中止したものは8本に及んだ。
When the melting quartz crucible of the present invention using transparent quartz glass in the upper portion is used, no deformation or buckling of the quartz crucible was observed in the pulling of 25 single crystals.
The dislocation-free silicon single crystal was pulled up. On the other hand, in the comparative example using the conventional melting crucible, deformation or buckling of the quartz crucible was observed in 18 of the 25 pulls,
Of those 18, eight stopped pulling up.

【0028】[0028]

【発明の効果】本発明のシリコン溶融用石英坩堝を配設
したシリコンの単結晶製造装置によれば、石英坩堝上部
の倒れ込みや座屈の発生がなく、単結晶の直径が大径化
されて無転位のシリコン単結晶を引き上げることがで
きる。
According to the apparatus for producing a silicon single crystal in which the quartz crucible for melting silicon of the present invention is arranged, the diameter of the single crystal is increased without causing the upper part of the quartz crucible to collapse or buckle. Also, a dislocation-free silicon single crystal can be pulled.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の石英坩堝を挿入したシリコン溶融用二
重坩堝を示す縦断面である。
FIG. 1 is a longitudinal section showing a double crucible for melting silicon, in which a quartz crucible of the present invention is inserted.

【図2】引き上げながら凝固させるシリコン単結晶製造
装置を示す縦断面図である。
FIG. 2 is a vertical sectional view showing a silicon single crystal manufacturing apparatus for solidifying while pulling.

【図3】従来使用されているシリコン溶融坩堝の断面を
示す図であり、(a) は坩堝の縦断面、(b) は単結晶の引
上げ中に内側に倒れ込んだ状態を示す図である。
FIG. 3 is a view showing a cross section of a conventionally used silicon melting crucible, (a) is a vertical cross section of the crucible, and (b) is a view showing a state in which the single crystal is tilted inward during pulling.

【符号の説明】[Explanation of symbols]

1.石英坩堝 2.上部 3.下部 4.接合部 5.カーボン坩堝 6.二重構造溶融坩堝 7.加熱用ヒータ 8.保温筒 9.チャンバー 10.シリコン溶融液 11.種結晶 12.シリコン単結晶 13.引上げ棒 14.ガス供給口 15.ガス排出口 16.回転軸 17.石英坩堝の倒れ込み部 18.倒れ込んだ内面 19.カーボン坩堝の珪化部 20.石英坩堝とカーボン坩堝との界面 1. Quartz crucible 2. Upper 3. Lower part 4. Joint 5. Carbon crucible 6. Double structure melting crucible 7. Heater for heating 8. Heat insulation tube 9. Chamber 10. Silicon melt 11. Seed crystal 12. Silicon single crystal 13. Pull bar 14. Gas supply port 15. Gas outlet 16. Rotating shaft 17. Falling part of quartz crucible 18. Inner surface that fell down 19. Siliconized part of carbon crucible 20. Interface between quartz crucible and carbon crucible

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】二重構造坩堝としてカーボン坩堝の内部に
挿入されるシリコン溶融用石英坩堝であって、上部が透
明石英ガラス、下部が半透明石英ガラスで一体に構成さ
れていることを特徴とするシリコン溶融用石英坩堝。
1. A quartz crucible for melting silicon, which is inserted into a carbon crucible as a double-structured crucible, wherein an upper part is made of transparent quartz glass and a lower part is made of semitransparent quartz glass. A quartz crucible for melting silicon.
JP5302096A 1996-03-11 1996-03-11 Quartz crucible having double layer structure for fusing of silicon Pending JPH09241093A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5302096A JPH09241093A (en) 1996-03-11 1996-03-11 Quartz crucible having double layer structure for fusing of silicon

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5302096A JPH09241093A (en) 1996-03-11 1996-03-11 Quartz crucible having double layer structure for fusing of silicon

Publications (1)

Publication Number Publication Date
JPH09241093A true JPH09241093A (en) 1997-09-16

Family

ID=12931227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5302096A Pending JPH09241093A (en) 1996-03-11 1996-03-11 Quartz crucible having double layer structure for fusing of silicon

Country Status (1)

Country Link
JP (1) JPH09241093A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008273788A (en) * 2007-04-27 2008-11-13 Shinetsu Quartz Prod Co Ltd Quartz glass crucible for pull-up of silicon single crystal, and method for production of silicon single crystal using the crucible

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008273788A (en) * 2007-04-27 2008-11-13 Shinetsu Quartz Prod Co Ltd Quartz glass crucible for pull-up of silicon single crystal, and method for production of silicon single crystal using the crucible

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