JPH09203689A - Method for inspecting liquid crystal display device - Google Patents

Method for inspecting liquid crystal display device

Info

Publication number
JPH09203689A
JPH09203689A JP8012394A JP1239496A JPH09203689A JP H09203689 A JPH09203689 A JP H09203689A JP 8012394 A JP8012394 A JP 8012394A JP 1239496 A JP1239496 A JP 1239496A JP H09203689 A JPH09203689 A JP H09203689A
Authority
JP
Japan
Prior art keywords
liquid crystal
display device
phase change
crystal display
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8012394A
Other languages
Japanese (ja)
Inventor
Kyoko Shiiba
恭子 椎葉
Seiichi Matsumura
清一 松村
Tetsu Ogawa
鉄 小川
Hirobumi Wakemoto
博文 分元
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP8012394A priority Critical patent/JPH09203689A/en
Publication of JPH09203689A publication Critical patent/JPH09203689A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306Details
    • G02F1/1309Repairing; Testing

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)

Abstract

PROBLEM TO BE SOLVED: To achieve easy and quick inspection to clarify whether residue is generated or not by arranging a polarizing plate closely at a fixed angle or at a fixed interval on a liquid crystal substrate to generate a phase change in a liquid crystal layer under a specified temperature during a specified period. SOLUTION: A polarizing plate is fitted closely or at a fixed interval on the surfaces of both substrates of a liquid crystal display device 2 built sealing a liquid crystal layer between both the substrates having a pixel electrode or an opposed electrode so that the axis of transmission is almost at 0 deg. or 90 deg. with respect to the direction of the array of liquid crystal molecules of the surfaces of the substrates. Phase change is caused in the liquid crystal layer from a nematic phase to an isotropic phase or vice versa under a high temperature environment of a specified temperature (80-150 deg.C) for a specified period of time (5-60sec.) and an image signal of the phase change taken by a camera 3 undergoes an image processing 7 to store 8 the results. The image with the phase change is compared with the image without the phase change to find a different image on a screen. Thus, the state of orientation and the surface shape of the substrates attributed to rubbing are inspected thereby comprehensively verifying whether any residual image exists or not.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は液晶表示装置の検査
方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for inspecting a liquid crystal display device.

【0002】[0002]

【従来の技術】液晶を中心とするマトリクス表示装置、
とりわけTFT(薄膜トランジスタ)をスイッチング素
子として液晶を駆動するアクティブマトリクス表示装置
による表示画質は、近年急激に改善されてきているが、
CRTと比較してもまだまだ改善すべき点が数多く残さ
れている。
2. Description of the Related Art A matrix display device centering on liquid crystal,
In particular, the display image quality of an active matrix display device that drives a liquid crystal using a TFT (thin film transistor) as a switching element has been rapidly improved in recent years.
There are still many points to be improved compared to CRTs.

【0003】改善すべき項目のひとつに残像がある。残
像は、画面切り換え時に、ゲート配線−画素電極間、ま
たはソース配線−画素電極間に働く横方向電界に影響を
受けた液晶分子が逆チルトドメインを形成し、特に液晶
の配向性の弱いラビング擦り下げ部に、時定数のある光
抜けとして観察される。
An afterimage is one of the items to be improved. The afterimage is caused by a liquid crystal molecule affected by a lateral electric field that acts between the gate line and the pixel electrode or between the source line and the pixel electrode when the screen is switched, forming a reverse tilt domain, and in particular, rubbing rubs in which the alignment of the liquid crystal is weak. At the lower part, it is observed as light leakage with a time constant.

【0004】そこで従来の残像対策としては、 1)製造工程での管理方法、生産方法からの対策、 2)基板設計へのフィードバックによる根本的な対策な
どがあげられており、1)については、基板のそりの緩
和などによるアライメント精度の向上、2)について
は、残像発生状況実測定からシミュレーションした基板
設計が含まれ、生産にフィードバックされ、一定の効果
をあげてきている。
Therefore, as conventional measures against afterimage, there are 1) management method in manufacturing process, measures from production method, 2) fundamental measures by feedback to board design, etc. Regarding the improvement of alignment accuracy by mitigating the warpage of the substrate, etc., 2), the substrate design simulated from the actual measurement of the afterimage generation state is included and fed back to the production, and a certain effect is achieved.

【0005】[0005]

【発明が解決しようとする課題】しかし、ラビングによ
る配向性状態に起因する残像の検査は、目視検査といっ
た定性的な検査で行っており、定量的には検出できてお
らず、また基板表面の凹凸形状については、その高低差
が0.数μm 〜数μm オーダーであることから、SEM
などの評価装置を用いなければ検査ができないこともあ
り、現在の残像に対する検出方法、工程での管理、対策
は不十分であり、上記対策を施しても残像が発生してい
るのが現状である。
However, the afterimage caused by the orientation state by rubbing is inspected by a qualitative inspection such as visual inspection, which cannot be detected quantitatively, and the surface of the substrate cannot be detected. Regarding the uneven shape, the height difference is 0. SEM because it is on the order of several μm to several μm
Since it may not be possible to inspect without using an evaluation device such as, the current detection method for the afterimage, control in the process, and countermeasures are insufficient, and the afterimage still occurs even if the above countermeasures are taken. is there.

【0006】そこで、本発明は、液晶パネルを構成する
基板の表面形状、ラビングによる液晶の配向状態を検査
することにより比較的容易な方法で総合的に残像が発生
するか否かを検査検証することができる液晶表示装置の
検査方法を提供することを目的としたものである。
Therefore, according to the present invention, the surface shape of the substrate constituting the liquid crystal panel and the alignment state of the liquid crystal by rubbing are inspected to check whether or not an afterimage is comprehensively produced by a relatively easy method. An object of the present invention is to provide a method for inspecting a liquid crystal display device that can perform the inspection.

【0007】[0007]

【課題を解決するための手段】前述した目的を達成する
ために、本発明は、第1の基板に画素電極、第2の基板
に対向電極を有し、両基板間に液晶層を封持した液晶表
示装置であって、両基板表面に、偏光板をその透過軸が
基板表面の液晶分子の配向方向に対して概略0°または
90°となるように密着または一定間隔で設置する条件
下で、所定期間S0 が、5(sec)≦S0 ≦60(s
ec)なる期間、所定温度T0 が、80(℃)≦T0 ≦
150(℃)なる高温環境下で液晶層をネマティック相
からアイソトロピック相へ、またはアイソトロピック相
からネマティック相へ変化させ、このときの前記基板の
液晶層の相変化により液晶表示装置の良否を判定するも
のである。
In order to achieve the above-mentioned object, the present invention has a pixel electrode on a first substrate and a counter electrode on a second substrate, and a liquid crystal layer is sealed between both substrates. In the above liquid crystal display device, polarizing plates are placed on both substrate surfaces in close contact with each other or at regular intervals so that their transmission axes are approximately 0 ° or 90 ° with respect to the alignment direction of liquid crystal molecules on the substrate surfaces. Then, the predetermined period S0 is 5 (sec) ≤S0≤60 (s
ec), the predetermined temperature T0 is 80 (° C) ≤T0≤
Under a high temperature environment of 150 (° C.), the liquid crystal layer is changed from a nematic phase to an isotropic phase or from an isotropic phase to a nematic phase, and the quality of the liquid crystal display device is judged by the phase change of the liquid crystal layer of the substrate at this time. To do.

【0008】液晶パネルを一定期間、一定高温環境下に
置き、液晶層をネマティック相からアイソトロピック相
へ、またはアイソトロピック相からネマティック相へ変
化させることにより、液晶パネルを構成する基板の表面
形状、ラビングによる液晶の配向状態に応じて、相変化
が変わり、よって比較的容易な方法でラビングによる配
向性状態、基板表面形状が検査され、総合的に残像が発
生するか否かを検査検証することができる。さらに、液
晶基板に偏光板を貼り付けない状態でも検査が可能なこ
とから、熱で偏光板を痛めることはない。
By placing the liquid crystal panel in a high temperature environment for a certain period of time and changing the liquid crystal layer from the nematic phase to the isotropic phase or from the isotropic phase to the nematic phase, the surface shape of the substrate constituting the liquid crystal panel, The phase change changes depending on the alignment state of the liquid crystal due to rubbing. Therefore, the alignment state by rubbing and the substrate surface shape are inspected by a relatively easy method, and it is inspected whether or not an afterimage is generated comprehensively. You can Further, since the inspection can be performed without attaching the polarizing plate to the liquid crystal substrate, the polarizing plate is not damaged by heat.

【0009】[0009]

【発明の実施の形態】以下、本発明の実施の形態を図面
に基づいて説明する。図1は本発明の液晶表示装置の検
査方法を使用した検査装置の構成図である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram of an inspection device using the inspection method for a liquid crystal display device of the present invention.

【0010】図1において、1はヒータを内蔵した検査
台であり、この検査台1上に被検査対象の液晶表示装置
2が載置され、この液晶表示装置2に対向してCCDカ
メラ装置3が配置されている。また検査台1には温度セ
ンサ4が取付けられており、この温度センサ4の温度検
出信号は検査台1の温度を制御する温度コントローラ5
のフィードバック信号として使用される。
In FIG. 1, reference numeral 1 is an inspection table having a built-in heater. A liquid crystal display device 2 to be inspected is placed on the inspection table 1, and a CCD camera device 3 is arranged facing the liquid crystal display device 2. Are arranged. A temperature sensor 4 is attached to the inspection table 1, and a temperature detection signal from the temperature sensor 4 is used by a temperature controller 5 for controlling the temperature of the inspection table 1.
Used as a feedback signal for.

【0011】上記液晶表示装置2は、第1の基板に画素
電極、第2の基板に対向電極を有し、両基板間に液晶層
を封持して構成されており、両基板表面に、偏光板をそ
の透過軸が基板表面の液晶分子の配向方向に対して概略
0°または90°となるように密着または一定間隔で設
置されている。
The liquid crystal display device 2 has a pixel electrode on the first substrate and a counter electrode on the second substrate, and is constituted by sealing a liquid crystal layer between the two substrates. The polarizing plates are arranged in close contact with each other or at regular intervals so that the transmission axis thereof is approximately 0 ° or 90 ° with respect to the alignment direction of the liquid crystal molecules on the substrate surface.

【0012】また、カメラ装置3のビデオ信号は高速画
像処理装置7へ入力され、この画像処理装置7により処
理された画像信号は、画像記憶装置8に記憶され、また
モニター9へ表示される。これら画像処理装置7と画像
記憶装置8とモニター9により画像処理部10が形成され
ている。
The video signal of the camera device 3 is input to the high-speed image processing device 7, and the image signal processed by the image processing device 7 is stored in the image storage device 8 and displayed on the monitor 9. An image processing unit 10 is formed by the image processing device 7, the image storage device 8 and the monitor 9.

【0013】また液晶表示装置2の液晶層をネマティッ
ク相からアイソトロピック相へ、またはアイソトロピッ
ク相からネマティック相へ変化させる液晶駆動装置11が
設けられており、この液晶駆動装置11と画像処理部10を
制御し、かつ温度コントローラ5へ設定温度T0 を出力
するメインコントローラ12が設けられている。
A liquid crystal driving device 11 for changing the liquid crystal layer of the liquid crystal display device 2 from a nematic phase to an isotropic phase or from an isotropic phase to a nematic phase is provided. The liquid crystal driving device 11 and the image processing section 10 are provided. There is provided a main controller 12 for controlling the temperature control and outputting the set temperature T0 to the temperature controller 5.

【0014】このメインコントローラ12による制御動作
を図2のフローチャートにしたがって説明する。まず、
温度コントローラ5へ設定温度T0 {80(℃)≦T0
≦150(℃)}を出力し(ステップ−1)、続けて、
タイマーを駆動し(ステップ−2)、タイマー所定時間
S0 {5(sec)≦S0 ≦60(sec)}が経過す
ると(ステップ−3)、画像処理部10へ、カメラ装置3
の撮像開始信号、画像処理装置7の画像処理開始信号、
モニター9の表示開始信号からなる画像処理駆動指令信
号を出力し(ステップ−4)、続けて液晶駆動装置11
へ、液晶駆動指令信号を出力する(ステップ−5)。
The control operation by the main controller 12 will be described with reference to the flowchart of FIG. First,
Set temperature T0 to temperature controller 5 {80 (℃) ≤T0
≤150 (° C)} is output (step-1), and then
When the timer is driven (step-2) and the timer predetermined time S0 {5 (sec) ≤S0≤60 (sec)} has elapsed (step-3), the image processing unit 10 is sent to the camera device 3.
Image pickup start signal, image processing start signal of the image processing device 7,
An image processing drive command signal composed of a display start signal of the monitor 9 is output (step-4), and then the liquid crystal drive device 11
A liquid crystal drive command signal is output to (step-5).

【0015】そして、画像処理部10へ、画像判定指令信
号を出力し(ステップ−6)、温度コントローラ5へ通
常温度の設定温度を出力し(ステップ−7)、画像処理
部10より後述する良否判定信号を入力して外部へ出力し
(ステップ−8)、終了する。
Then, an image determination command signal is output to the image processing unit 10 (step-6), and a set temperature of the normal temperature is output to the temperature controller 5 (step-7). The judgment signal is input and output to the outside (step-8), and the process is ended.

【0016】上記構成により、液晶表示装置2は一定期
間S0 、一定高温T0 の環境下で、液晶層はネマティッ
ク相からアイソトロピック相へ、またはアイソトロピッ
ク相からネマティック相へ変化される。このときの液晶
層の相変化は画像処理装置7により画像記憶装置8へ記
憶され、相変化が検査される(後述する)。
With the above structure, the liquid crystal display device 2 is changed from the nematic phase to the isotropic phase or from the isotropic phase to the nematic phase under the environment of constant temperature S0 and constant high temperature T0. The phase change of the liquid crystal layer at this time is stored in the image storage device 8 by the image processing device 7, and the phase change is inspected (described later).

【0017】図3〜図6はカメラ装置3により撮像され
た液晶表示装置の画素図であり、aはゲート電極および
ゲート配線、bはソース電極およびソース配線、cはド
レイン電極、dは画素電極、eはコンデンサ電極を示
し、矢印fはラビング方向を示している。
3 to 6 are pixel diagrams of a liquid crystal display device imaged by the camera device 3, where a is a gate electrode and a gate wiring, b is a source electrode and a source wiring, c is a drain electrode, and d is a pixel electrode. , E indicate capacitor electrodes, and an arrow f indicates the rubbing direction.

【0018】図3に配向性の弱いパネル、図4に配向性
の良いパネルを、それぞれ10秒,120℃という環境
で観察した液晶層のネマティック相からアイソトロピッ
ク相への相変化の瞬間を模式的に示す。
FIG. 3 shows a panel having a weak orientation, and FIG. 4 shows a panel having a good orientation in an environment of 10 seconds and 120 ° C., respectively, and schematically shows the moment of the phase change from the nematic phase to the isotropic phase of the liquid crystal layer. To indicate.

【0019】図3のような配向性の悪いパネルでは熱を
かけると、液晶の配向が弱く不安定なラビング擦り下げ
部から相変化が始まり、画素内が均一に変化していない
ことが分かる。一番早く相変化が発生する箇所を斜線部
gで示す。これが表示上残像となる。斜線部gは他の部
分とコントラストが異なって見える。すなわち、ノーマ
リホワイトに偏光板が配置されていれば黒く見え、ノー
マリブラックに偏光板が配置されていれば白く見える。
It can be seen that when heat is applied to a panel having poor orientation as shown in FIG. 3, a phase change starts from a rubbing rubbed portion where the orientation of the liquid crystal is weak and unstable, and the inside of the pixel does not change uniformly. The portion where the phase change occurs earliest is indicated by the shaded portion g. This is an afterimage on the display. The shaded part g looks different in contrast from other parts. That is, if the polarizing plate is arranged in normally white, it looks black, and if the polarizing plate is arranged in normally black, it looks white.

【0020】これに対して、配向が十分な図4のような
液晶パネルでは相変化は画素内均一におこることが分か
り残像は発生していない。一般的に残像は、液晶の配向
性が悪いラビング擦り下げ部に発生する。
On the other hand, in the liquid crystal panel shown in FIG. 4 in which the orientation is sufficient, it can be seen that the phase change occurs uniformly in the pixel, and no afterimage is generated. In general, an afterimage is generated at a rubbing rubbed portion where liquid crystal has poor orientation.

【0021】次に、図5には基板表面の凹凸が大きいパ
ネル、図6には基板表面の凹凸が小さいパネルを、それ
ぞれ10秒,120℃という環境で観察した液晶層のア
イソトロピック相からネマティック相への相変化の瞬間
を模式的に示す。
Next, FIG. 5 shows a panel with large unevenness on the substrate surface, and FIG. 6 shows a panel with small unevenness on the substrate surface under the environment of 10 seconds and 120 ° C., respectively. The moment of the phase change to the phase is schematically shown.

【0022】図5のような基板表面の凹凸が大きいパネ
ルでは表面の凹凸が大きい箇所(斜線部g)から相変化
を起こし、画素内で均一な変化は見られないのに対し
て、図6のような凹凸の小さいパネルでは相変化が瞬時
に画素内均一に起こる。一番早く相変化が発生する箇所
を斜線部gで示す。
In a panel having large irregularities on the substrate surface as shown in FIG. 5, a phase change occurs from a portion having large irregularities on the surface (hatched portion g), and no uniform variation is observed in the pixel. In such a panel with small unevenness, the phase change instantaneously and uniformly occurs in the pixel. The portion where the phase change occurs earliest is indicated by the shaded portion g.

【0023】上記所定期間(タイマーの設定時間)S0
が、5(sec)≦S0 ≦60(sec)なる期間、所
定温度T0 が、80(℃)≦T0 ≦150(℃)なる高
温環境下で同様の相変化が発生することが確認された。
The predetermined period (timer setting time) S0
However, it was confirmed that the same phase change occurs in a high temperature environment where the predetermined temperature T0 is 80 (° C) ≤ T0 ≤ 150 (° C) during the period of 5 (sec) ≤ S0 ≤ 60 (sec).

【0024】所定期間(タイマーの設定時間)S0 を5
(sec)≦S0 としたのは、液晶層内で温度が均一に
なるのに必要な時間で、S0 ≦60(sec)としたの
は、これ以上の長時間、液晶表示装置2を加熱すると、
液晶素子の劣化を引き起こす場合があるからである。
A predetermined period (timer setting time) S0 is set to 5
(Sec) ≤ S0 is the time required for the temperature to be uniform in the liquid crystal layer, and S0 ≤ 60 (sec) is when the liquid crystal display device 2 is heated for a longer time. ,
This is because it may cause deterioration of the liquid crystal element.

【0025】また、所定温度T0 を80(℃)≦T0 ≦
150(℃)としたのは、通常多くの液晶材料のネマテ
ィック−アイソトロピック転移点がこの範囲にあるから
である。
Further, the predetermined temperature T0 is 80 (° C.) ≤T0≤
The reason why the temperature is 150 (° C.) is that the nematic-isotropic transition point of many liquid crystal materials is usually in this range.

【0026】画像処理装置7は、上記相変化は瞬時に起
こるので、ビデオ信号を画像記憶装置8に高速で記憶
し、画像判定指令信号に応じて記憶した画面をコマ送り
して、相変化のない画面と比較し、画面上に異なる画像
を見出すことで、液晶表示装置2のラビングによる配向
性状態(斜線部gがラビング擦り下げ部に発生)の良
否、および基板表面形状(斜線部gが不規則に発生)の
良否を判定でき、上記良否判定信号を出力し、さらに異
なる画像をその面積により定量的に検査することができ
る。また、相変化が起きた画面はモニター9に静止画面
として表示することができる。
Since the phase change occurs instantaneously in the image processing device 7, the video signal is stored in the image storage device 8 at a high speed, and the stored screen is advanced frame by frame in response to the image determination command signal to change the phase. By finding a different image on the screen as compared with a screen without a screen, it is possible to determine whether or not the alignment state of the liquid crystal display device 2 due to rubbing (the shaded portion g is generated in the rubbing abrasion part) and the substrate surface shape (the shaded portion g is It is possible to judge the quality of (irregularly generated), output the quality judgment signal, and inspect different images quantitatively by the area. The screen in which the phase change has occurred can be displayed on the monitor 9 as a still screen.

【0027】このように、液晶層の相変化を検出するこ
とにより、ラビングによる配向性状態、基板表面形状を
検査でき、異常のあった液晶表示装置2を処分すること
により、残像のない画像品質のよい液晶表示装置のみを
提供できる。また比較的簡便な手法で残像の検出力をア
ップすることができ、また画像の変化をその面積により
定量的に検査することもできる。
As described above, by detecting the phase change of the liquid crystal layer, the alignment state by rubbing and the substrate surface shape can be inspected, and by discarding the liquid crystal display device 2 having an abnormality, the image quality without afterimage can be obtained. Only a good liquid crystal display device can be provided. Further, it is possible to improve the afterimage detection power by a relatively simple method, and it is also possible to quantitatively inspect the change of the image by its area.

【0028】なお、本実施の形態では液晶基板に偏光板
を貼り付けているが、偏光板を一定間隔離した状態でも
検査が可能である。このとき、熱で偏光板を痛めること
を回避できる。また、液晶表示装置2を高温にする手段
はヒータにかかわらず、熱風を吹きつける装置などその
他の手段であってもよい。
In this embodiment, the polarizing plate is attached to the liquid crystal substrate, but the inspection can be performed even when the polarizing plate is isolated for a certain period. At this time, it is possible to avoid damaging the polarizing plate with heat. Further, the means for raising the temperature of the liquid crystal display device 2 may be any other means such as a device for blowing hot air, regardless of the heater.

【0029】[0029]

【発明の効果】以上のように本発明によれば、比較的簡
便な手法で液晶層の相変化を検出することにより、ラビ
ングによる配向性状態、基板表面形状を検査でき、残像
のない画像品質のよい液晶表示装置を提供でき、実使用
上極めて有用である。さらに、液晶基板に偏光板を貼り
付けない状態でも検査が可能なことから、熱で偏光板を
痛めることを回避できる。
As described above, according to the present invention, the alignment state and the substrate surface shape by rubbing can be inspected by detecting the phase change of the liquid crystal layer by a relatively simple method, and the image quality without afterimage can be obtained. It is possible to provide a good liquid crystal display device, which is extremely useful in actual use. Furthermore, since the inspection can be performed even when the polarizing plate is not attached to the liquid crystal substrate, it is possible to prevent the polarizing plate from being damaged by heat.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の液晶表示装置の検査方法を使用した検
査装置の構成図である。
FIG. 1 is a configuration diagram of an inspection device using a liquid crystal display device inspection method of the present invention.

【図2】同検査装置のメインコントローラの動作を説明
するフローチャートである。
FIG. 2 is a flowchart illustrating an operation of a main controller of the inspection apparatus.

【図3】液晶表示装置の画素図であり、配向性の悪い液
晶パネルを10秒,120℃という環境で観察した液晶
層のネマティック相からアイソトロピック相への相変化
の瞬間を模式的に示した図である。
FIG. 3 is a pixel diagram of a liquid crystal display device, schematically showing a moment of a phase change from a nematic phase of a liquid crystal layer to an isotropic phase when a liquid crystal panel having poor alignment is observed in an environment of 120 ° C. for 10 seconds. It is a figure.

【図4】液晶表示装置の画素図であり、配向性の良い液
晶パネルを10秒,120℃という環境で観察した液晶
層のネマティック相からアイソトロピック相への相変化
の瞬間を模式的に示した図である。
FIG. 4 is a pixel diagram of a liquid crystal display device, schematically showing an instant of a phase change from a nematic phase to an isotropic phase of a liquid crystal layer observed in a liquid crystal panel having good orientation in an environment of 120 ° C. for 10 seconds. It is a figure.

【図5】液晶表示装置の画素図であり、基板表面の凹凸
が大きいパネルを10秒,120℃という環境で観察し
た液晶層のアイソトロピック相からネマティック相への
相変化の瞬間を模式的に示した図である。
FIG. 5 is a pixel diagram of a liquid crystal display device, and schematically shows a moment of a phase change of a liquid crystal layer from an isotropic phase to a nematic phase, which is observed in a panel with large irregularities on a substrate surface in an environment of 120 seconds for 10 seconds. It is the figure shown.

【図6】液晶表示装置の画素図であり、基板表面の凹凸
が小さいパネルを10秒,120℃という環境で観察し
た液晶層のアイソトロピック相からネマティック相への
相変化の瞬間を模式的に示した図である。
FIG. 6 is a pixel diagram of a liquid crystal display device, and schematically shows a moment of a phase change of a liquid crystal layer from an isotropic phase to a nematic phase, which is observed in a panel with small irregularities on a substrate surface in an environment of 120 ° C. for 10 seconds. It is the figure shown.

【符号の説明】[Explanation of symbols]

1 検査台 2 液晶表示装置 3 カメラ装置 4 温度センサ 5 温度コントローラ 7 画像処理装置 8 画像記録装置 9 モニター 10 液晶駆動装置 11 メインコントローラ a ゲート電極/配線 b ソース電極/配線 c ドレイン電極 d 画素電極 e コンデンサ電極 f ラビング方向 g 一番早く相変化を起こす箇所 1 inspection table 2 liquid crystal display device 3 camera device 4 temperature sensor 5 temperature controller 7 image processing device 8 image recording device 9 monitor 10 liquid crystal drive device 11 main controller a gate electrode / wiring b source electrode / wiring c drain electrode d pixel electrode e Capacitor electrode f Rubbing direction g Location where phase change occurs first

───────────────────────────────────────────────────── フロントページの続き (72)発明者 分元 博文 大阪府門真市大字門真1006番地 松下電器 産業株式会社内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Hirofumi Minen 1006 Kadoma, Kadoma City, Osaka Prefecture Matsushita Electric Industrial Co., Ltd.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 第1の基板に画素電極、第2の基板に対
向電極を有し、両基板間に液晶層を封持した液晶表示装
置の検査方法であって、 前記両基板表面に、偏光板をその透過軸が基板表面の液
晶分子の配向方向に対して概略0°または90°となる
ように密着または一定間隔で設置し、 所定期間S0 、高温T0 なる環境下で前記液晶層をネマ
ティック相からアイソトロピック相へ、またはアイソト
ロピック相からネマティック相へ変化させ、このときの
前記基板の液晶層の相変化により液晶表示装置の良否を
判定することを特徴とする液晶表示装置の検査方法。
1. A method for inspecting a liquid crystal display device, comprising a pixel electrode on a first substrate and a counter electrode on a second substrate, wherein a liquid crystal layer is sealed between both substrates, the method comprising: The polarizing plates are placed in close contact with each other or at regular intervals so that the transmission axis thereof is approximately 0 ° or 90 ° with respect to the alignment direction of the liquid crystal molecules on the substrate surface, and the liquid crystal layer is placed under an environment of high temperature T0 for a predetermined period S0. A method for inspecting a liquid crystal display device, characterized by changing from a nematic phase to an isotropic phase or from an isotropic phase to a nematic phase, and judging the quality of the liquid crystal display device based on the phase change of the liquid crystal layer of the substrate at this time. .
【請求項2】 所定期間S0 を、5(sec)≦S0 ≦
60(sec)としたことを特徴とする請求項1記載の
液晶表示装置の検査方法。
2. The predetermined period S0 is set to 5 (sec) ≦ S0 ≦
The method for inspecting a liquid crystal display device according to claim 1, wherein the inspection time is 60 (sec).
【請求項3】 高温T0 を、80(℃)≦T0 ≦150
(℃)としたことを特徴とする請求項1記載の液晶表示
装置の検査方法。
3. The high temperature T0 is set to 80 (° C.) ≦ T0 ≦ 150.
(° C.) The method for inspecting a liquid crystal display device according to claim 1, wherein
JP8012394A 1996-01-29 1996-01-29 Method for inspecting liquid crystal display device Pending JPH09203689A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8012394A JPH09203689A (en) 1996-01-29 1996-01-29 Method for inspecting liquid crystal display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8012394A JPH09203689A (en) 1996-01-29 1996-01-29 Method for inspecting liquid crystal display device

Publications (1)

Publication Number Publication Date
JPH09203689A true JPH09203689A (en) 1997-08-05

Family

ID=11804063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8012394A Pending JPH09203689A (en) 1996-01-29 1996-01-29 Method for inspecting liquid crystal display device

Country Status (1)

Country Link
JP (1) JPH09203689A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039462A (en) * 2006-08-02 2008-02-21 Fujitsu Ltd Display panel inspection device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008039462A (en) * 2006-08-02 2008-02-21 Fujitsu Ltd Display panel inspection device and method

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