JPH09181157A - Wafer holder - Google Patents
Wafer holderInfo
- Publication number
- JPH09181157A JPH09181157A JP19931496A JP19931496A JPH09181157A JP H09181157 A JPH09181157 A JP H09181157A JP 19931496 A JP19931496 A JP 19931496A JP 19931496 A JP19931496 A JP 19931496A JP H09181157 A JPH09181157 A JP H09181157A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- wafer holder
- edge
- width
- holder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68721—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は半導体の製造装置に
係り、特にウェーハの損傷が防止できるウェーハホルダ
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor manufacturing apparatus, and more particularly to a wafer holder capable of preventing damage to a wafer.
【0002】[0002]
【従来の技術】半導体産業は精密産業である。したがっ
て、半導体装置の製造工程はすべての汚染源を取り除い
た非常に清潔な場所で行われる。現在ほとんどの半導体
装置の製造工程は清浄室で行われる。The semiconductor industry is a precision industry. Therefore, the manufacturing process of the semiconductor device is performed in a very clean place where all the pollution sources are removed. Currently, most semiconductor device manufacturing processes are performed in a clean room.
【0003】半導体装置の集積度が増加することにより
ウェーハ上に形成される各種パターン間の間隔も共に狭
まる。パターン間の間隔はサブミクロン単位である。こ
のような微細な間隔を有する各種パターンをウェーハ上
に形成する過程で流入される汚染粒子はいくら小さいも
のであっても半導体装置の製造工程に重大な影響を及ぼ
し得る。As the degree of integration of semiconductor devices increases, the intervals between various patterns formed on a wafer also decrease. The spacing between the patterns is submicron. No matter how small the contaminant particles may be when the various patterns having such fine intervals are formed on the wafer, they may have a serious influence on the manufacturing process of the semiconductor device.
【0004】最近の半導体装置の製造工程は、清浄室内
でこのような汚染粒子が発生することを最大限減少させ
るため、ほとんどの工程を自動化しようとする趨勢にあ
る。Recent semiconductor device manufacturing processes tend to automate most processes in order to minimize the generation of such contaminant particles in a clean room.
【0005】半導体の製造工程のうち、発生する汚染粒
子によりウェーハが損なわれることを防止するためウェ
ーハの保管や運搬時にはウェーハホルダを用いる。In the semiconductor manufacturing process, a wafer holder is used when the wafer is stored or transported in order to prevent the wafer from being damaged by the generated contaminant particles.
【0006】図1は従来の技術によるウェーハホルダの
平面図である。図1を参照すると、ウェーハホルダの胴
体10の外側縁には二つの溝14が対称的に形成されて
いる。この溝14はウェーハホルダが装着される装備と
ウェーハホルダが結合される部分である。ウェーハホル
ダの内側縁にはウェーハと直接に接触される突出した八
つのピン12がある。八つのピン12は同一な大きさで
ある。かつ、ピン12の間の角度は一定である。参照符
号Aはウェーハのフラットゾーンに該当する。FIG. 1 is a plan view of a conventional wafer holder. Referring to FIG. 1, two grooves 14 are symmetrically formed on an outer edge of a body 10 of a wafer holder. The groove 14 is a portion where the equipment for mounting the wafer holder and the wafer holder are coupled. On the inner edge of the wafer holder are eight protruding pins 12 that come into direct contact with the wafer. The eight pins 12 have the same size. Moreover, the angle between the pins 12 is constant. Reference numeral A corresponds to the flat zone of the wafer.
【0007】このような構成を有する従来の技術による
半導体装置のウェーハホルダはウェーハを八つのピン1
2にて支持する。したがって、ウェーハは八つのピン1
2と直接に接触される部分に集中した力を受ける。それ
故に、ウェーハ上に薄膜が形成された場合、薄膜は八つ
のピンにより掻かれ損なわれる可能性が大きい。ウェー
ハ上に形成された薄膜が掻かれる場合、微細なほこりが
発生されてこのようなほこりは次の工程で汚染物質とし
て作用する。このような汚染粒子を含む半導体装置は正
常的に作動しない。結果的に、従来の技術によるウェー
ハホルダを用いることは半導体装置の収率を低下させる
一つの原因を提供する。The wafer holder of the conventional semiconductor device having the above-mentioned structure has a wafer with eight pins 1.
Support in 2. Therefore, the wafer has eight pins 1
Receives concentrated force on the part that directly contacts 2. Therefore, if a thin film is formed on the wafer, the thin film is likely to be scratched and damaged by the eight pins. When the thin film formed on the wafer is scratched, fine dust is generated, and the dust acts as a contaminant in the next process. A semiconductor device containing such contaminant particles does not operate normally. As a result, using a wafer holder according to the prior art provides one cause of reducing the yield of semiconductor devices.
【0008】[0008]
【発明が解決しようとする課題】本発明は、前述した従
来の技術により発生される問題点を解決するため案出さ
れたものであり、半導体装置の収率を高め得るウェーハ
ホルダを提供するにその目的がある。SUMMARY OF THE INVENTION The present invention has been devised to solve the problems caused by the above-mentioned conventional techniques, and provides a wafer holder capable of increasing the yield of semiconductor devices. Has that purpose.
【0009】[0009]
【課題を解決するための手段】前記の目的を達成するた
めに、本発明によるウェーハホルダは、内側縁はウェー
ハの外周と相似形であり、外側縁には複数の脚部が形成
されており、前記外側縁と内側縁との間の幅は前記ウェ
ーハの縁全体を支持するに十分な幅を有する。To achieve the above object, a wafer holder according to the present invention has an inner edge similar to the outer circumference of a wafer and a plurality of legs formed on the outer edge. , The width between the outer edge and the inner edge is wide enough to support the entire edge of the wafer.
【0010】前記ウェーハホルダにより支持されるウェ
ーハの外周部分はパターンが形成されない部分である。
前記ウェーハホルダの外側縁には四つの脚部が形成され
ている。The outer peripheral portion of the wafer supported by the wafer holder is a portion where no pattern is formed.
Four legs are formed on the outer edge of the wafer holder.
【0011】本発明はウェーハの外周部分の全体に均一
な支持力を加えられる手段を具備しているので従来の技
術によるウェーハホルダのように汚染粒子を発生させる
恐れが無い。したがって、本発明によるウェーハホルダ
を用いる場合、半導体装置の収率を従来よりなおさら高
めることができる。Since the present invention is provided with means for applying a uniform supporting force to the entire outer peripheral portion of the wafer, there is no risk of generating contaminant particles as in the conventional wafer holder. Therefore, when the wafer holder according to the present invention is used, the yield of semiconductor devices can be further increased compared to the conventional case.
【0012】[0012]
【発明の実施の形態】以下、添付した図面に基づき本発
明をさらに詳細に説明する。図2に示されたウェーハホ
ルダ40は、外側縁に複数(例えば、四つ)の脚部42
が形成されており、脚部42は相互に所定の角度ずつ離
れている。そして、前記外側縁と内側縁の間の幅は前記
ウェーハの外周全体を支持し得る程度の十分な幅を有し
ている。すなわち、前記ウェーハの外周は本発明による
ウェーハホルダ40の内側縁と外側縁との間に位置す
る。このとき、前記ウェーハホルダ40のフラットゾー
ン44とウェーハのフラットゾーンは一致するようにな
る。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in more detail with reference to the accompanying drawings. The wafer holder 40 shown in FIG. 2 has a plurality of (eg, four) legs 42 on the outer edge.
Are formed, and the legs 42 are separated from each other by a predetermined angle. The width between the outer edge and the inner edge is large enough to support the entire outer circumference of the wafer. That is, the outer circumference of the wafer is located between the inner edge and the outer edge of the wafer holder 40 according to the present invention. At this time, the flat zone 44 of the wafer holder 40 and the flat zone of the wafer are aligned.
【0013】前記ウェーハホルダ40の外側縁の形態に
は制限が無い。したがって、図2では円形に示したが、
他の形態(例えば、四角形)であることもできる。The shape of the outer edge of the wafer holder 40 is not limited. Therefore, although shown as a circle in FIG.
Other forms (eg, square) are also possible.
【0014】本発明による実施例で、ウェーハホルダ4
0は前記フラットゾーン44を除いた残りの部分では縁
の幅が一定である。In the embodiment according to the present invention, the wafer holder 4
In 0, the width of the edge is constant in the remaining portion except the flat zone 44.
【0015】前記ウェーハホルダ40はウェーハの外周
全体を支持する。その故に、局部的に集中された力がウ
ェーハに加えられることを阻み得る。かつ、本発明によ
るウェーハホルダはウェーハを支持するため連続された
面積を用いる。したがって、均一な力がウェーハに加え
られる。このような理由により前記ウェーハ上の薄膜が
剥げる可能性はほとんど無い。The wafer holder 40 supports the entire outer circumference of the wafer. Therefore, it may prevent locally concentrated forces from being applied to the wafer. And, the wafer holder according to the present invention uses a continuous area to support the wafer. Therefore, a uniform force is applied to the wafer. For this reason, there is almost no possibility that the thin film on the wafer will come off.
【0016】前記脚部42の立体的な形態はウェーハホ
ルダ40の斜視図を示した図3で見られるが、脚部42
は下方に曲がった部分を有している。The three-dimensional shape of the leg portion 42 can be seen in FIG. 3 which is a perspective view of the wafer holder 40.
Has a downward bent portion.
【0017】[0017]
【発明の効果】以上、前述したように本発明によるウェ
ーハホルダは従来の技術によるウェーハホルダのように
ウェーハに局部的な支持力を加えずに広い面にかけて均
一な支持力を加える。したがって、ウェーハ上に形成さ
れた薄膜の損傷を防止し半導体装置の収率を高めること
ができる。As described above, the wafer holder according to the present invention applies a uniform supporting force to a wide surface without applying a local supporting force to the wafer unlike the conventional wafer holder. Therefore, the thin film formed on the wafer can be prevented from being damaged and the yield of semiconductor devices can be increased.
【図面の簡単な説明】[Brief description of the drawings]
【図1】 従来の技術によるウェーハホルダの平面図で
ある。FIG. 1 is a plan view of a conventional wafer holder.
【図2】 本発明の一実施例によるウェーハホルダの平
面図である。FIG. 2 is a plan view of a wafer holder according to an embodiment of the present invention.
【図3】 本発明によるウェーハホルダの斜視図であ
る。FIG. 3 is a perspective view of a wafer holder according to the present invention.
40 ウェーハホルダ、42 脚部、44 フラットゾ
ーン40 wafer holders, 42 legs, 44 flat zones
Claims (2)
り、外側縁には複数の脚部が形成されており、前記外側
縁と内側縁との間の幅は前記ウェーハの外周全体を支持
するに十分な幅を有することを特徴とするウェーハホル
ダ。1. The inner edge is similar to the outer circumference of the wafer, and the outer edge is formed with a plurality of legs, and the width between the outer edge and the inner edge supports the entire outer circumference of the wafer. Wafer holder having a width sufficient to
する請求項1に記載のウェーハホルダ。2. The wafer holder according to claim 1, wherein the number of the legs is four.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1995-P-052705 | 1995-12-20 | ||
KR1019950052705A KR970051805A (en) | 1995-12-20 | 1995-12-20 | Semiconductor manufacturing device with new wafer holder |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH09181157A true JPH09181157A (en) | 1997-07-11 |
Family
ID=19441874
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19931496A Pending JPH09181157A (en) | 1995-12-20 | 1996-07-29 | Wafer holder |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPH09181157A (en) |
KR (1) | KR970051805A (en) |
TW (1) | TW300328B (en) |
-
1995
- 1995-12-20 KR KR1019950052705A patent/KR970051805A/en not_active Application Discontinuation
-
1996
- 1996-06-10 TW TW085106965A patent/TW300328B/en active
- 1996-07-29 JP JP19931496A patent/JPH09181157A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
TW300328B (en) | 1997-03-11 |
KR970051805A (en) | 1997-07-29 |
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