JPH0912394A - Production of planar crystal - Google Patents

Production of planar crystal

Info

Publication number
JPH0912394A
JPH0912394A JP7158839A JP15883995A JPH0912394A JP H0912394 A JPH0912394 A JP H0912394A JP 7158839 A JP7158839 A JP 7158839A JP 15883995 A JP15883995 A JP 15883995A JP H0912394 A JPH0912394 A JP H0912394A
Authority
JP
Japan
Prior art keywords
silicon
plate
crystal
raw material
material rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7158839A
Other languages
Japanese (ja)
Inventor
Arata Sakaguchi
新 阪口
Toru Yamada
透 山田
Masatsugu Kamioka
正嗣 上岡
Teruhiko Hirasawa
照彦 平沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Chemical Co Ltd
Priority to JP7158839A priority Critical patent/JPH0912394A/en
Priority to DE1996125207 priority patent/DE19625207A1/en
Publication of JPH0912394A publication Critical patent/JPH0912394A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/34Edge-defined film-fed crystal-growth using dies or slits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electromagnetism (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Photovoltaic Devices (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE: To stably obtain a planar crystal having high purity and high accuracy at a low cost by holding a columnar raw material rod in such a manner that its axis is held in a perpendicular direction and heating and melting the top end thereof to form a melt layer, disposing a cap body having a slit in the upper part thereof and pulling up the crystal through the slit. CONSTITUTION: This method is preferably executed while the raw material rod is rotated around the shaft and heating and melting are preferably executed by high-frequency heating. Further, the heating and melting are preferably executed in an inert gas (e.g. argon, helium, nitrogen) or under a reduced pressure. The impurities in the atmosphere gas is preferably <=1,000ppm and the moisture content <=10<-3> atm under a vapor pressure (25 deg.C). The planar silicon crystal is formed by using the raw material rod consisting of silicon for an added effect. The raw material rod 12 of the columnar silicon is held in the lower part as shown in Fig. and the top end is melted by high-frequency induction heating to form the molten layer. The cap 15 having the slit-like aperture 14 is disposed thereon and the planar crystal 13 is pulled up through the slit 14.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は板状結晶、特には太陽電
池用基板材料として有用な板状シリコン結晶の新しい製
造方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a novel method for producing a plate crystal, particularly a plate silicon crystal useful as a substrate material for solar cells.

【0002】[0002]

【従来の技術】太陽電池、特にシリコン等の半導体材料
を用いた太陽電池は、近年の地球温暖化をはじめとする
環境対策の面からクリーンな代替エネルギー発生源とし
て注目されている。シリコン太陽電池としては、使用す
るシリコン素材の結晶構造からみても単結晶、多結晶、
アモルファスの三種類が、またその太陽電池セルの構成
や構造からみても幾多の提案がなされ、一部はすでに実
用化されているが、太陽電池の特性及び代替エネルギー
のコストからみて多くの課題をかかえている。従来のシ
リコン太陽電池としては、図2に示すように、例えばp
型のシリコン半導体基板1の表面に、Pなどを拡散させ
たn層2、その上に反射防止膜3を介して表面電極4を
形成し、裏面にはAlペーストの印刷などにより形成し
た層を焼成してp+ 層5、その上に同じくAlペースト
の印刷により裏面電極6を形成したものが一般的であ
る。この太陽電池に太陽光7を照射すると、シリコン中
に入射した光エネルギーによって自由電子および正孔対
が発生し、裏面電極6と表面電極4の間で外部の回路に
電流を取り出すことができ、太陽エネルギーを直接電気
エネルギーに変換することができる。
2. Description of the Related Art Solar cells, especially solar cells using a semiconductor material such as silicon, are attracting attention as a clean alternative energy source from the viewpoint of environmental measures such as global warming in recent years. As a silicon solar cell, single crystal, polycrystal,
A number of proposals have been made for the three types of amorphous, and also for the configuration and structure of the solar cell, and some of them have already been put into practical use, but there are many problems in view of the characteristics of solar cells and the cost of alternative energy. I have it. As a conventional silicon solar cell, as shown in FIG.
On the surface of the silicon semiconductor substrate 1 of the mold, an n layer 2 in which P or the like is diffused, a surface electrode 4 is formed thereon via an antireflection film 3, and a layer formed by printing an Al paste or the like is formed on the back surface. In general, the p + layer 5 is fired and the back electrode 6 is formed on the p + layer 5 by printing an Al paste. When this solar cell is irradiated with sunlight 7, light electrons incident on silicon generate free electron and hole pairs, and a current can be taken out to an external circuit between the back electrode 6 and the front electrode 4. Solar energy can be directly converted into electrical energy.

【0003】しかして、従来から太陽電池のコストの中
に占める結晶基板のコストを低減するために、薄いリボ
ン状ないしは板状のシリコンを製造する方法が研究提案
されており、代表的な方法として、スリット状の開口部
を有する治具を用い毛細管現象でシリコン融液を上昇さ
せ、その上端部で結晶化させて板状結晶を育成するEF
G(Edge-defined Film fed Growth)法や、シリコン融
液を同じくスリット状開口部から直接引出し結晶化させ
るゴンペルツ−ステパノフ法、あるいはこれらの変形と
して、シリコン融液を下方に引出す方法、またはシリコ
ン融液表面を過冷却状態に保って治具を用いないで板状
結晶を育成するデンドライト育成法、ないしはWeb法
等の方法が研究提案されている。しかしながらこれらの
方法は、いずれの方法においても板状シリコンが成長す
る固液界面の温度を全域に渡って安定に保つことが困難
であるため、厚さが一定の板状シリコンを連続して安定
に育成することは極めて困難であるという欠点を有す
る。
However, in order to reduce the cost of the crystal substrate in the cost of the solar cell, a method for producing thin ribbon-shaped or plate-shaped silicon has been researched and proposed as a typical method. EF for growing a plate crystal by raising the silicon melt by capillarity using a jig having a slit-shaped opening and crystallizing at the upper end thereof
G (Edge-defined Film fed Growth) method, Gompertz-Stepanov method of directly pulling out and crystallizing a silicon melt from the slit-shaped opening, or a modification of these methods, a method of pulling out a silicon melt downward, or a silicon melt. Research and proposals have been made on methods such as a dendrite growing method for growing plate crystals without using a jig while keeping the liquid surface in a supercooled state, or a Web method. However, in any of these methods, it is difficult to keep the temperature of the solid-liquid interface where the plate-like silicon grows stable over the entire area, so that plate-like silicon with a constant thickness is continuously stable. It has the drawback of being extremely difficult to grow.

【0004】すなわち従来技術による板状シリコンの製
造方法においては、育成速度は、発生する固化熱と板状
シリコンと融液の間の固液界面近傍の温度分布によって
定まる固液界面からの熱の移動量によって決定される。
したがって板状シリコンを一定速度で安定に育成するに
は、固液界面の温度ならびにその近傍の温度分布を精密
に制御することが必要であり、育成中の板状シリコンの
幅と厚みを計測して温度、およびその分布状態にフィー
ドバックをかけて制御することが望ましいが、育成炉の
構造、部材の熱容量から考えて温度制御系の時定数は一
般に大きく応答性に劣るため、制御の時間遅れが大きく
なり、その結果として育成速度を低く抑えなければな
い。さらに例えばEFG法の場合には、固液界面への融
液の供給は治具の開口部における毛細管現象に依存して
いるため、治具と融液との界面の性状によっても育成速
度が影響を受けるので、安定した製造がより困難とな
る。さらにまた、治具を用いる方法ではシリコン融液と
治具材料との化学的反応による治具表面層の変質と形状
変化が生じること、治具材料からの汚染によってシリコ
ンの純度が低下することがさけられず、とくに単結晶を
育成する場合、これらの原因によって結晶の乱れが生じ
て結晶欠陥が多く、さらには多結晶となって安定した単
結晶の板状シリコンを得ることは困難である。
That is, in the plate-like silicon manufacturing method according to the prior art, the growth rate is determined by the heat of solidification generated and the heat from the solid-liquid interface determined by the temperature distribution near the solid-liquid interface between the plate-like silicon and the melt. Determined by the amount of movement.
Therefore, in order to grow plate-like silicon stably at a constant rate, it is necessary to precisely control the temperature at the solid-liquid interface and the temperature distribution in the vicinity of it, and measure the width and thickness of the plate-like silicon during growth. It is desirable to control the temperature and its distribution by feedback.However, considering the structure of the growth furnace and the heat capacity of the members, the time constant of the temperature control system is generally large and the response is inferior. However, the growth rate must be kept low as a result. Further, for example, in the case of the EFG method, since the supply of the melt to the solid-liquid interface depends on the capillary phenomenon at the opening of the jig, the growth rate also depends on the properties of the interface between the jig and the melt. Therefore, stable manufacturing becomes more difficult. Furthermore, in the method using the jig, the quality and shape of the jig surface layer may change due to the chemical reaction between the silicon melt and the jig material, and the purity of the silicon may decrease due to contamination from the jig material. Inevitably, when growing a single crystal in particular, it is difficult to obtain a stable single crystal plate-like silicon which becomes crystalline and has many crystal defects due to these causes.

【0005】また、これらの方法はいずれも原料シリコ
ン融液を耐熱性容器に収容し、これより板状結晶を育成
するので前述の治具と同じく容器材料からシリコンが汚
染される上、育成の進行と共に容器内シリコン量が減少
することによって結晶成長の固液界面近傍の熱的条件が
変化し、一定形状の板状結晶を作成することは極めて困
難となる。このような従来からの板状結晶育成法の欠点
を克服するため、板状の原料から板状結晶を育成させる
RTR(Ribon to Ribon)法が提案されている。この方
法は板状原料の長さ方向と垂直な方向から板状原料側面
にレーザーを入射させて板状原料の一部を極めて薄い帯
状に溶融し、この溶融帯を原料板の一端から他端に向け
て移動させることによって板状結晶を作成するが、この
方法では育成させる板状結晶の巾全長に亘ってレーザー
ビームで一様に加熱するために、高出力のレーザー光源
と複雑かつ精密な光学系が必要となる。また、長時間に
亘ってレーザービームの安定性を確保するために特別の
設備が必要で、これらのことから装置が極めて高価とな
る他、レーザーの出力エネルギーの入力エネルギーに対
する効率は極めて低いために経済的な板状結晶の製造に
は問題が多い。
In each of these methods, the raw material silicon melt is housed in a heat-resistant container, and plate crystals are grown from this, so that the silicon is contaminated from the container material as in the case of the above-mentioned jig, and the growth of the crystal is promoted. As the amount of silicon in the container decreases with the progress, the thermal condition near the solid-liquid interface of crystal growth changes, and it becomes extremely difficult to form a plate-shaped crystal having a constant shape. In order to overcome such drawbacks of the conventional plate crystal growth method, an RTR (Ribon to Ribon) method of growing a plate crystal from a plate material has been proposed. In this method, a laser is incident on the side surface of the plate-shaped raw material from a direction perpendicular to the lengthwise direction of the plate-shaped raw material to melt a part of the plate-shaped raw material into an extremely thin band shape, and this melting zone is fed from one end of the raw material plate to the other end. A plate-shaped crystal is created by moving it toward the plate. In this method, since a plate-shaped crystal to be grown is uniformly heated by a laser beam over the entire width, a high-power laser light source and a complicated and precise An optical system is required. In addition, special equipment is required to secure the stability of the laser beam for a long time, which makes the device extremely expensive, and the efficiency of the laser output energy with respect to the input energy is extremely low. There are many problems in the economical production of plate crystals.

【0006】[0006]

【発明が解決しようとする課題】本発明は、このような
問題点に鑑みなされたもので、板状結晶、特に太陽電池
用基板材料として有用な板状シリコン結晶を高品質、高
精度かつ低コスト、高生産性で得ることを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and provides a plate crystal, particularly a plate silicon crystal useful as a substrate material for solar cells, with high quality, high accuracy and low cost. The purpose is to obtain at high cost and high productivity.

【0007】[0007]

【課題を解決するための手段】本発明者らは、原料棒か
ら安定して高品質の板状結晶を製造することに成功した
もので、その要旨は、軸が鉛直方向になる様に円柱状の
原料棒を保持し、その上端部を加熱溶融して該円柱状原
料棒上に融液層を形成させ、その融液層の上部にスリッ
トを有する蓋体を配設し、この開孔させたスリットを通
して引き上げることによって板状結晶を製造する方法で
ある。そしてこの方法は、原料棒をその鉛直方向の軸の
まわりに自転させながら行うのが好ましく、加熱溶融は
高周波加熱によるのが良い。そしてこれらの方法は不活
性ガスの雰囲気、例えばアルゴン、ヘリウム、窒素のう
ち少なくとも一種、又は減圧下で行うのが好ましく、用
いる雰囲気ガスの不純物は1,000ppm以下、そして、雰囲
気中の水分含有量が25℃における蒸気圧で10-3気圧以下
であるのが良い。さらに、これらの方法では製造される
板状結晶の形状を高周波加熱電力又は板状結晶の固化速
度、又はそれら両者によって制御することが可能であ
る。また、原料棒をシリコンとして、板状シリコン結晶
を作成するのに有用である。この場合、シリコン原料棒
あるいは雰囲気ガス中ないしはその両者にシリコンに対
しn型あるいはp型の導電性を付与する元素を含ませて
製造される板状シリコンの導電性および導電率を調整す
ることが可能である。そして、この方法で得られる板状
シリコン結晶は高品質、低コストであるので太陽電池用
基板として用いることができ、高効率、低コストの太陽
電池が提供される。
The present inventors have succeeded in stably producing a high quality plate crystal from a raw material rod, and the gist thereof is that a circle is formed so that the axis is in the vertical direction. A column-shaped raw material rod is held, an upper end portion thereof is heated and melted to form a melt layer on the cylindrical raw material rod, and a lid having a slit is arranged on the upper portion of the melt layer. It is a method of producing a plate crystal by pulling up through the slit. This method is preferably performed while rotating the raw material rod about its vertical axis, and the heating and melting may be performed by high frequency heating. And these methods are preferably carried out in an atmosphere of an inert gas, for example, at least one of argon, helium and nitrogen, or under reduced pressure, the impurities of the atmosphere gas used are 1,000 ppm or less, and the water content in the atmosphere is The vapor pressure at 25 ° C is preferably 10 -3 atm or less. Furthermore, in these methods, the shape of the plate crystal produced can be controlled by high-frequency heating power, the solidification rate of the plate crystal, or both. Further, it is useful for forming a plate-shaped silicon crystal by using the raw material rod as silicon. In this case, it is possible to adjust the conductivity and conductivity of the plate-like silicon produced by adding an element that imparts n-type or p-type conductivity to silicon in the silicon raw material rod or the atmosphere gas or both of them. It is possible. Since the plate-shaped silicon crystal obtained by this method has high quality and low cost, it can be used as a substrate for solar cells, and a high-efficiency, low-cost solar cell is provided.

【0008】以下、本発明につき詳述する。本発明は、
上記従来技術の問題点を克服し、板状結晶、特に板状シ
リコン結晶のコストを大幅に低減することが出来る、新
しい製造方法を提供するものである。以下、シリコンの
板状結晶を製造する場合を中心として本発明を説明する
が、本発明はシリコンに限定されるものではない。本発
明の方法は図1に例示する如く円柱状の原料棒12をその
円柱の軸が鉛直方向になる様に下部で保持し、その上端
部を例えば高周波誘導加熱によって加熱して溶融させ、
シリコンの溶融層を固体状の該原料シリコン棒上に形成
させ、その融液層の上部にスリット状の開孔14を有する
蓋体15を配設し、該スリット14を通して板状のシリコン
結晶13を引き上げるものである。すなわち、原料シリコ
ン棒上に形成された融液層の上方に、中心部に板状シリ
コン結晶を引出すためのスリットを有し、該スリットと
原料シリコン円柱棒とが同心状となるように蓋体を配置
し、このスリットを通して上方より種となる板状シリコ
ン結晶を溶融層表面で融液と融着させたのち、種を上方
に引上げることによって板状シリコン結晶を育成する。
Hereinafter, the present invention will be described in detail. The present invention
It is intended to provide a new manufacturing method capable of overcoming the above-mentioned problems of the prior art and significantly reducing the cost of a plate crystal, particularly a plate silicon crystal. Hereinafter, the present invention will be described focusing on the case of producing a plate crystal of silicon, but the present invention is not limited to silicon. In the method of the present invention, as shown in FIG. 1, a cylindrical raw material rod 12 is held at the lower part so that the axis of the cylindrical column is in the vertical direction, and its upper end is heated and melted by, for example, high frequency induction heating,
A molten layer of silicon is formed on the solid raw silicon rod, a lid 15 having slit-shaped openings 14 is arranged on the melt layer, and a plate-shaped silicon crystal 13 is provided through the slit 14. Is to raise. That is, above the melt layer formed on the raw material silicon rod, there is a slit for pulling out the plate-shaped silicon crystal in the central part, and the lid body so that the slit and the raw material silicon columnar rod are concentric. The plate-like silicon crystal serving as a seed is fused from the upper side through the slit with the melt on the surface of the molten layer, and then the seed is pulled upward to grow the plate-like silicon crystal.

【0009】このとき、スリットを有する蓋体は融液層
の温度の制御ならびに温度分布の形成に極めて重要で、
その形状はこの点を考慮して外径寸法、厚さ等を慎重に
決定することが必要である。また、この蓋体の材質は上
記の温度制御の観点のみならず作成する板状シリコン結
晶の品質に対する影響についても十分考慮して決定する
ことが重要である。例として、アルミナ、イットリア等
の高融点酸化物やSiC、カーボン、窒化ケイ素やBN
あるいはオキシナイトライド等のセラミックス、Mo、
Ta、Pt、Wやこれらの合金等の高融点材料が使用出
来るが、金属材料や高温において電気伝導率の高い材料
を用いる場合は加熱用の高周波電界の影響を考慮する必
要がある。
At this time, the lid having the slit is extremely important for controlling the temperature of the melt layer and forming the temperature distribution,
Regarding the shape, it is necessary to carefully determine the outer diameter dimension, thickness, etc. in consideration of this point. Further, it is important to determine the material of the lid body in consideration of not only the above temperature control but also the influence on the quality of the plate-shaped silicon crystal to be produced. Examples include high melting point oxides such as alumina and yttria, SiC, carbon, silicon nitride and BN.
Or ceramics such as oxynitride, Mo,
High-melting-point materials such as Ta, Pt, W, and alloys thereof can be used, but when a metal material or a material having high electric conductivity at high temperature is used, it is necessary to consider the influence of the high-frequency electric field for heating.

【0010】加熱には高周波誘導加熱の他に原料棒を取
巻く様に設けたヒーターによる方法や、レーザー等の光
又は価電粒子ビームによって行なうことも可能である
が、導電性を有する材料やシリコンの如き半導体である
程度の導電性が得られる材料では、高周波誘導加熱がエ
ネルギー効率やその制御性、設備の価額等からみて最も
適している。実用上はシリコンの如き半導体材料では補
助リングその他の装置を用いて、予め原料棒上端部を予
熱することによって導電性を高め、高周波誘導を容易に
することも可能である。原料棒上に形成された融液層の
温度を均一に保つためには、原料棒をその鉛直方向の軸
を中心に回転させることが望ましく、特に高周波加熱や
ヒーターによる加熱以外の光ビームや価電粒子ビームに
よる加熱方法では重要である。また、育成する雰囲気か
らの汚染も問題で、極めて高純度の板状シリコン結晶を
得るには減圧、例えば1Torr以下、好ましくは10-3Torr
以下とするか、あるいはArあるいはHeの如き希ガス
やN2 の如き不活性ガス雰囲気を用い、その中に含まれ
る酸素や水素あるいはハイドロカーボンの如き不純物を
1,000ppm以下に制御することが好ましい。雰囲気中の水
分は、25℃における蒸気圧で10-3気圧以下とすることが
好ましい。さらに、板状シリコンの電気特性、すなわち
その導電型や抵抗値は原料シリコン棒に予めシリコンに
n型、ないしはp型の導電性を与える元素をドープする
ことによって、または板状シリコンを育成する際の雰囲
気中にこれらの元素を化合物の形(たとえばB2H6、PH
3 )で含有させることによって任意に制御することが可
能である。
In addition to high frequency induction heating, heating can be performed by a heater provided around the raw material rod, or light such as a laser or a valence particle beam, but a conductive material or silicon. In the case of semiconductors such as those that can obtain a certain degree of conductivity, high frequency induction heating is most suitable from the viewpoint of energy efficiency, controllability thereof, equipment cost, and the like. In practice, for semiconductor materials such as silicon, an auxiliary ring or other device may be used to preheat the upper end portion of the raw material bar to enhance conductivity and facilitate high frequency induction. In order to keep the temperature of the melt layer formed on the raw material rod uniform, it is desirable to rotate the raw material rod about its vertical axis. This is important in the heating method using an electron particle beam. Further, contamination from the growing atmosphere is also a problem, and in order to obtain an extremely high-purity plate-like silicon crystal, the pressure is reduced, for example, 1 Torr or less, preferably 10 -3 Torr.
The following is used, or an atmosphere such as a rare gas such as Ar or He or an inert gas atmosphere such as N 2 is used to remove impurities such as oxygen, hydrogen or hydrocarbon contained therein.
It is preferable to control it to 1,000 ppm or less. Moisture in the atmosphere is preferably 10 -3 atm or less in vapor pressure at 25 ° C. Furthermore, the electrical characteristics of the plate-shaped silicon, that is, its conductivity type and resistance value, are obtained by previously doping a raw silicon rod with an element that imparts n-type or p-type conductivity to silicon, or when growing plate-shaped silicon. In the atmosphere of these elements in the form of compounds (eg B 2 H 6 , PH
It is possible to control it arbitrarily by including it in 3 ).

【0011】また、作成する板状シリコン結晶の形状を
精度よくコントロールするには板状シリコン結晶成長界
面の形状、寸法を例えばCCDカメラ等によって拡大し
て観測、又は計測し、その変動量を高周波電力あるいは
原料シリコン棒と生成板状シリコン結晶との相対的移動
速度(板状結晶の固化速度)にフィードバックさせる
か、あるいはその両者にフィードバック制御させること
によって生成板状シリコン結晶の形状や、成長速度を極
めて安定して制御することが可能である。
In order to accurately control the shape of the plate-shaped silicon crystal to be created, the shape and dimensions of the plate-shaped silicon crystal growth interface are enlarged and observed or measured by, for example, a CCD camera or the like, and the fluctuation amount is measured at a high frequency. The shape and growth rate of the generated plate-shaped silicon crystal are fed back to the relative movement speed (solidification speed of the plate-shaped crystal) of the power or the raw material silicon rod and the generated plate-shaped silicon crystal, or by feedback control to both of them. Can be controlled extremely stably.

【0012】尚、当然のことながら本発明の方法はシリ
コン単結晶インゴット作成法の一つである浮遊帯域法
(Floating Zone 、略してFZ法)と同一原理に基づい
ており、条件によって生成板状シリコン結晶の単結晶化
が可能であると共に、原料となるシリコン棒を高純度化
することが出来る。したがって、本発明の方法はシリコ
ン以外の他の材料、例えばFe、Cu、Al等の金属材
等特別に高純度化が求められる場合、又は単結晶化ない
しは特別に結晶粒を成長させることが望ましい場合にも
応用することが出来る。
As a matter of course, the method of the present invention is based on the same principle as the floating zone method (FZ method for short) which is one of the methods for producing a silicon single crystal ingot. It is possible to single crystallize a silicon crystal and to highly purify a silicon rod as a raw material. Therefore, in the method of the present invention, it is desirable that a material other than silicon, for example, a metal material such as Fe, Cu, Al, etc. is required to have a high degree of purification, or single crystallization or special crystal grains are grown. It can also be applied to cases.

【0013】本発明の方法は下記の点で、従来の板状シ
リコンの製造方法およびそれらの方法から得られる板状
シリコン、特に太陽電池用基板として用いられる板状シ
リコンに対し、優位性を発揮することが出来る。 (1)ルツボやその他シリコン融液と直接接触する治具
を使用しないためこれらのルツボや治具材料からの汚染
が生じない。 (2)現在、シリコン単結晶インゴット製造用に用いら
れる円柱状多結晶シリコンをそのまま使用して、直接太
陽電池用基板を製作することが出来る。その上、円柱状
シリコン単結晶を切断して基板ウェーハを製作する場合
のように材料ロスがなく、基板のコストを大幅に低減す
ることが出来る。 (3)本発明は、現在シリコン単結晶インゴットを製造
するのに一般に用いらているFZ法と同様の装置によっ
て実施可能で、基本的には円柱状原料多結晶の保持具と
種の保持具、加熱用高周波コイルとスリット付蓋体およ
びこれらを収容しかつ板状シリコン結晶作成時の雰囲気
を形成するための容器から構成され、装置構成も比較的
シンプルでかつ副資材も極めて少ないため、この点でも
コストの低減化が計れる。 (4)板状シリコン結晶の育成の進行中、原料シリコン
棒と加熱コイル、およびシリコン融液層の相対的な位置
が一定に保たれるため、原料シリコン棒が極端に短くな
らない限り、該シリコン融液層と板状シリコン形成部の
温度条件は一定に保たれる。従って、従来の板状シリコ
ン結晶作成法におけるが如く、シリコン融液の減少と共
にシリコン融液および板状シリコン結晶形成部の温度変
化によって、育成される板状シリコン結晶の形状が徐々
に変化するような事はなく、一定形状の板状シリコン結
晶を安定して作成することが出来る。
The method of the present invention is superior to the conventional methods for producing plate-like silicon and the plate-like silicon obtained by those methods, particularly the plate-like silicon used as a substrate for solar cells, in the following points. You can do it. (1) Since crucibles and other jigs that directly contact the silicon melt are not used, contamination from these crucibles and jig materials does not occur. (2) At present, the columnar polycrystalline silicon used for manufacturing a silicon single crystal ingot can be used as it is to directly manufacture a solar cell substrate. Moreover, there is no material loss as in the case of manufacturing a substrate wafer by cutting a cylindrical silicon single crystal, and the cost of the substrate can be significantly reduced. (3) The present invention can be carried out by an apparatus similar to the FZ method which is generally used for producing a silicon single crystal ingot at present, and basically, a cylindrical raw material polycrystal holder and a seed holder. , A heating high-frequency coil and a lid with a slit, and a container for accommodating them and forming an atmosphere at the time of forming a plate-shaped silicon crystal, because the device configuration is relatively simple and auxiliary materials are extremely small, Also in terms of cost reduction. (4) Since the relative positions of the raw material silicon rod, the heating coil, and the silicon melt layer are kept constant during the growth of the plate-shaped silicon crystal, the raw material silicon rod must be extremely short unless the raw silicon rod becomes extremely short. The temperature conditions of the melt layer and the plate-shaped silicon forming part are kept constant. Therefore, as in the conventional plate-shaped silicon crystal production method, the shape of the grown plate-shaped silicon crystal gradually changes due to the decrease of the silicon melt and the temperature change of the silicon melt and the plate-shaped silicon crystal forming part. Nothing happens, and it is possible to stably form a plate-shaped silicon crystal having a constant shape.

【0014】[0014]

【実施例】【Example】

(実施例1)直径 120mm、長さ 300mmのn型導電性を示
す円柱状の多結晶シリコンを、その円柱軸が鉛直になる
様に下側の回転移動軸上に保持し、アルゴン雰囲気中で
0.5rpmで回転させて、その上端部を高周波誘導加熱コイ
ル(周波数 2.0MHz)で加熱溶融させた。上側の移動
軸の下端に巾5mm、厚さ 0.6mm、長さ50mm、長さ方向の
結晶方位[211]、板面が(111)面の種結晶(デ
ンドライト)を長さ方向が鉛直になる様に取り付けた。
蓋体は外径 160mm、厚さ2mmのアルミナ製で、中心部に
長さ30mm、巾4mmのスリットを設けた。このスリットを
通して種結晶を溶融層の上面に接触融着させたのち、溶
融層の温度を加熱用高周波電力によって制御して、平均
10mm/minの速さで種結晶を引上げて、長さ 420mmの板状
シリコン結晶を作成した。得られた板状シリコン結晶
は、巾約14mm、厚さ 210μmで、(111)面を双晶界
面とする板面が(111)面の双晶であった。この板状
結晶はp型の抵抗率10Ωcmの値を示した。
(Example 1) A columnar polycrystalline silicon having a diameter of 120 mm and a length of 300 mm and exhibiting n-type conductivity was held on a lower rotation axis so that the axis of the column was vertical, and in an argon atmosphere.
It was rotated at 0.5 rpm, and its upper end was heated and melted by a high frequency induction heating coil (frequency 2.0 MHz). Width 5 mm, thickness 0.6 mm, length 50 mm, crystal orientation [211] in the length direction, and the seed crystal (dendrite) whose plate surface is the (111) plane is vertical in the length direction at the lower end of the upper moving axis. I attached it like this.
The lid was made of alumina with an outer diameter of 160 mm and a thickness of 2 mm, and a slit with a length of 30 mm and a width of 4 mm was provided at the center. After the seed crystal was contact-fused to the upper surface of the molten layer through this slit, the temperature of the molten layer was controlled by high frequency power for heating, and the average
The seed crystal was pulled up at a speed of 10 mm / min to form a plate-like silicon crystal with a length of 420 mm. The obtained plate-like silicon crystal had a width of about 14 mm and a thickness of 210 μm, and the plate plane having the (111) plane as a twin crystal interface was a twin crystal of the (111) plane. This plate crystal showed a p-type resistivity of 10 Ωcm.

【0015】(実施例2)実施例1で得られたシリコン
結晶板を10mm×100mm で切断し、 850℃にてリンを拡散
させてpn接合を形成した後、裏面拡散層を除去し、TiO2
反射防止膜をn型表面に形成し、フォトリソグラフィー
にて Al-Si表面電極を、また裏面には同様に Al-Siの裏
面電極を形成して図2に示したごとき太陽電池セルを作
製した。この太陽電池セルをAM 1.5、 100mW/cm2、28℃
の条件で変換効率を測定し13.5%の値を得た。
(Example 2) The silicon crystal plate obtained in Example 1 was cut to a size of 10 mm x 100 mm, phosphorus was diffused at 850 ° C to form a pn junction, the back diffusion layer was removed, and TiO 2 was removed. 2
An antireflection film was formed on the n-type surface, an Al-Si front surface electrode was formed by photolithography, and an Al-Si rear surface electrode was similarly formed on the rear surface to fabricate a solar battery cell as shown in FIG. . This solar cell is AM 1.5, 100mW / cm 2 , 28 ℃
The conversion efficiency was measured under the conditions of 1 and a value of 13.5% was obtained.

【0016】[0016]

【発明の効果】本発明により、高純度、高精度の板状結
晶、特に板状シリコン結晶を安定して、かつ低コストで
得ることができる。従って、このような板状シリコン結
晶から作成される太陽電池のコスト低減化に資するた
め、太陽電池の普及に寄与できる。
According to the present invention, highly pure and highly precise plate crystals, particularly plate silicon crystals, can be stably obtained at low cost. Therefore, it contributes to the cost reduction of the solar cell made from such a plate-like silicon crystal, which can contribute to the spread of the solar cell.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の板状材料の製造方法の概略図である。 (a)断面図 (b)別の実施形態における断面図 (c)(a) の溶融域を拡大した斜視図FIG. 1 is a schematic view of a method for producing a plate-shaped material of the present invention. (A) Sectional view (b) Sectional view in another embodiment (c) Perspective view showing an enlarged fusion zone in (a)

【図2】太陽電池の断面図である。FIG. 2 is a cross-sectional view of a solar cell.

【符号の説明】[Explanation of symbols]

1…p型のシリコン半導体基板 11…高周波加
熱コイル 2…n層 12…原料シリ
コン棒 3…反射防止膜 13…板状シリ
コン結晶 4…表面電極 14…スリット 5…p+ 層 15…蓋体 6…裏面電極 7…太陽光
DESCRIPTION OF SYMBOLS 1 ... P-type silicon semiconductor substrate 11 ... High frequency heating coil 2 ... N layer 12 ... Raw silicon rod 3 ... Antireflection film 13 ... Plate-shaped silicon crystal 4 ... Surface electrode 14 ... Slit 5 ... P + layer 15 ... Lid 6 ... Back electrode 7 ... Sunlight

───────────────────────────────────────────────────── フロントページの続き (72)発明者 上岡 正嗣 神奈川県川崎市高津区坂戸3丁目2番1号 信越化学工業株式会社コーポレートリサ ーチセンター内 (72)発明者 平沢 照彦 神奈川県川崎市高津区坂戸3丁目2番1号 信越化学工業株式会社コーポレートリサ ーチセンター内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Masatsugu Ueoka 3-2-1 Sakado, Takatsu-ku, Kawasaki City, Kanagawa Prefecture Corporate Research Center, Shin-Etsu Chemical Co., Ltd. (72) Teruhiko Hirasawa, Sakado, Takatsu-ku, Kawasaki City, Kanagawa Prefecture 3-2-1, Shin-Etsu Chemical Co., Ltd. Corporate Research Center

Claims (13)

【特許請求の範囲】[Claims] 【請求項1】 軸が鉛直方向になる様に円柱状の原料棒
を保持し、その上端部を加熱溶融して該円柱状原料棒上
に融液層を形成させ、その融液層の上部にスリットを有
する蓋体を配設し、この開孔させたスリットを通して引
き上げることによって板状結晶を製造する方法。
1. A cylindrical raw material rod is held so that its axis is in a vertical direction, and an upper end portion thereof is heated and melted to form a melt layer on the cylindrical raw material rod, and an upper portion of the melt layer is formed. A method for producing a plate crystal by arranging a lid having a slit on the substrate and pulling it up through the opened slit.
【請求項2】 円柱状の原料棒をその鉛直方向の軸のま
わりに自転させる請求項1の板状結晶を製造する方法。
2. The method for producing a plate crystal according to claim 1, wherein the cylindrical raw material rod is rotated about its vertical axis.
【請求項3】 加熱溶融を高周波加熱によって行なう請
求項1又は請求項2の板状結晶を製造する方法。
3. The method for producing a plate crystal according to claim 1, wherein the heating and melting are performed by high frequency heating.
【請求項4】 不活性ガス雰囲気中で行なう請求項1又
は請求項2、請求項3の板状結晶を製造する方法。
4. The method for producing a plate crystal according to claim 1, 2 or 3, which is carried out in an inert gas atmosphere.
【請求項5】 不活性ガスがアルゴン、ヘリウム、窒素
のうち少なくとも一種である請求項1又は請求項2ない
し請求項4の方法。
5. The method according to claim 1 or claim 2 or claim 4, wherein the inert gas is at least one of argon, helium and nitrogen.
【請求項6】 減圧の下で実施する請求項1又は請求項
2ないし請求項5の方法。
6. The method according to claim 1 or claim 2 to claim 5 carried out under reduced pressure.
【請求項7】 雰囲気ガスの不純物が1,000ppm以下であ
る請求項1又は請求項2ないし請求項6の方法。
7. The method according to claim 1 or claim 2 or claim 6, wherein the impurities in the atmospheric gas are 1,000 ppm or less.
【請求項8】 雰囲気中の水分含有量が25℃における蒸
気圧で10-3気圧以下である請求項7の方法。
8. The method according to claim 7, wherein the water content in the atmosphere is 10 −3 atm or less in vapor pressure at 25 ° C.
【請求項9】 製造される板状結晶の形状を高周波加熱
電力又は板状結晶の固化速度、又はそれら両者によって
制御する請求項1又は請求項2ないし請求項8の方法。
9. The method according to claim 1, wherein the shape of the plate crystal to be produced is controlled by high-frequency heating power, the solidification rate of the plate crystal, or both of them.
【請求項10】 原料棒がシリコンである請求項1又は
請求項2ないし請求項9の方法。
10. The method according to claim 1, or 2 to 9, wherein the raw material rod is silicon.
【請求項11】 シリコン原料棒あるいは雰囲気ガス中
ないしはその両者にシリコンに対しn型あるいはp型の
導電性を付与する元素を含ませて板状シリコンの導電性
および導電率を調整する請求項10の方法。
11. The conductivity and the conductivity of the plate-shaped silicon are adjusted by including an element which imparts n-type or p-type conductivity to silicon in the silicon raw material rod or the atmosphere gas or both of them. the method of.
【請求項12】 請求項10又は請求項11の方法で製
造される板状シリコン結晶。
12. A plate-like silicon crystal produced by the method according to claim 10.
【請求項13】 請求項12の板状シリコン結晶を用い
て製造される太陽電池。
13. A solar cell manufactured by using the plate-shaped silicon crystal according to claim 12.
JP7158839A 1995-06-26 1995-06-26 Production of planar crystal Pending JPH0912394A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP7158839A JPH0912394A (en) 1995-06-26 1995-06-26 Production of planar crystal
DE1996125207 DE19625207A1 (en) 1995-06-26 1996-06-25 Process for plate like silicon@ crystal prodn. - comprises forming melt layer on cylindrical raw material rod, interposing cover with slit, and pulling rod

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7158839A JPH0912394A (en) 1995-06-26 1995-06-26 Production of planar crystal

Publications (1)

Publication Number Publication Date
JPH0912394A true JPH0912394A (en) 1997-01-14

Family

ID=15680536

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7158839A Pending JPH0912394A (en) 1995-06-26 1995-06-26 Production of planar crystal

Country Status (2)

Country Link
JP (1) JPH0912394A (en)
DE (1) DE19625207A1 (en)

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* Cited by examiner, † Cited by third party
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WO2008090864A1 (en) 2007-01-25 2008-07-31 National Institute Of Advanced Industrial Science And Technology Apparatus and method for manufacturing silicon substrate, and silicon substrate
CN102906315A (en) * 2010-05-31 2013-01-30 国际商业机器公司 Producing a mono-crystalline sheet

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008090864A1 (en) 2007-01-25 2008-07-31 National Institute Of Advanced Industrial Science And Technology Apparatus and method for manufacturing silicon substrate, and silicon substrate
CN102906315A (en) * 2010-05-31 2013-01-30 国际商业机器公司 Producing a mono-crystalline sheet
JP2013530530A (en) * 2010-05-31 2013-07-25 インターナショナル・ビジネス・マシーンズ・コーポレーション Method and device for the production of single crystal sheets
US9487884B2 (en) 2010-05-31 2016-11-08 International Business Machines Corporation Producing a mono-crystalline sheet of semiconductor material
US10066312B2 (en) 2010-05-31 2018-09-04 International Business Machines Corporation Device for producing a mono-crystalline sheet of semiconductor material from a molten alloy held between at least two aperture elements

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