JPH0875667A - Visual inspection device for chip part - Google Patents

Abstract

PURPOSE: To perform the inspection of the surface and the rear face of a chip part automatically and quickly. CONSTITUTION: Two disk-shaped index tables 10 and 20 having indexes 11 and 21 at the circumference parts containing a chip part are provided side by side. The tables are rotated with a stepping motor 40 by pitch sending. The chip part is supplied on the first index table with a part feeder 30 and the surface is inspected with a camera 60. The surface and the rear face are reversed, and the chip part is mounted on the second index table. The rear face is inspected with the camera 60. The nondefective product and the defectifve product are fractionated with a discharging station 70 and discharged into fractionation case 71.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention continuously inspects the front and back surfaces of a chip component in the chip component inspection process,
The present invention relates to a chip component visual inspection device for sorting.

[0002]

2. Description of the Related Art When inspecting the front surface and the back surface of a chip component, a technique of transferring the chip component to a surface inspection jig by batch processing, inspecting the surface, and then manually inverting the chip component and inspecting the back surface. There is. In this inspection by batch processing, a certain number of chip parts are transferred to the surface inspection jig, the inspection jig is pitch-fed in the XY directions, the surface is inspected from the upper surface, then the front surface inspection jig and the back surface inspection jig. Are overlaid and the chip parts are inverted. Then, the front surface inspection jig is pitch-fed in the XY directions to inspect the back surface.
Then, the chip components after the inspection are sorted.

Also, in one carrying system, there is a technique of positioning chip parts in the carrying system and inspecting the front surface and the back surface of the carrying system from the back surface.
No. 433 is disclosed. In this technique, chip parts are sent to a transfer system by a parts feeder or the like, the chip parts are positioned at a fixed position of the transfer system, the surface is inspected from the upper surface, and the back surface is inspected from the back side of the transfer system. After the inspection, the chip parts are sorted and delivered from the transportation system.

[0004]

Since a jig is used in batch processing, continuous processing cannot be performed, and manpower is required to invert the chip parts.
In the transport system, since the camera is installed on the back side of the transport system to inspect the back surface, dust or the like may be attached to the camera lens, resulting in misidentification. Further, since the lighting and the camera are installed on the back side of the transportation system, there is a restriction on the installation space.

It is an object of the present invention to provide a chip component visual inspection apparatus which solves the above problems.

[0006]

According to the present invention, there is provided a disk-shaped first index table which has a plurality of indexes for holding chip components on its outer peripheral portion and rotates around a horizontal axis, and the first index table and the first index table. A second index table of the same shape provided, and a parts feeder for feeding the chip parts to the indexes of the first index table,
A stepping motor that rotates the first and second index tables and pitch-feeds the indexes; a transfer station that reverses and transfers the chip parts from the index of the first index table to the index of the second index table; A camera for inspecting the front surface and the back surface of the chip component in the indexes of the first and second index tables, and a discharge station for separating the chip components after the inspection and discharging them from the second index table are provided. It is a visual inspection device for chip parts.

[0007]

According to the present invention, in the inspection of chip parts, two index tables are installed vertically, and the chip parts are reversed and transferred between them to continuously inspect the front and back surfaces of the chip parts. It is a device that can sort defective products based on this inspection.

According to the present invention, two disk-shaped index tables having indexes for accommodating chip parts on the circumference are provided side by side, the chip parts are supplied to the first index table to inspect the surface, and then this is The index table of No. 2 is transferred with the front side and the back side reversed,
Inspect the back side. After the inspection, the products are sorted into acceptable products and rejected products and discharged from the second index table.

The operation of this device is as follows. The parts feeder continuously supplies the chip parts to the indexes of the first index table, and stores the chip parts in the indexes of the first index table with the front surface side facing the same direction. The stepping motor rotates the first index table and the second index table. The stepping motor pitch-feeds the index of the index table. A camera for inspecting chip components is arranged above the first and second index tables. A transfer station for transferring the chip parts is provided between the first index table and the second index table. At this transfer station, the chip parts are transferred from the index of the first index table to the index of the second index table. At this time, the front surface and the back surface of the chip component are reversed. Therefore, in the first index table, the camera images the front surface, and in the second index table, the camera images the back surface of the chip component. The camera is equipped with lighting. The image detected by the camera is processed by the image processing device, and the quality of the chip component is immediately determined. The second index table is provided with a discharge station for discharging chip parts, and sorts and discharges the chip parts.

[0010]

Embodiments of the present invention will now be described with reference to the drawings. FIG. 1 shows an overall plan view of the transportation and transfer section of the chip part appearance inspection apparatus 1 of the embodiment, FIG. 2 shows its side view, and FIG. 3 shows its front view. 1 to 3, the chip component visual inspection apparatus 1 according to the embodiment includes a first index table 1
0, second index table 20, parts feeder 30, stepping motor 40, transfer station 5
0, a camera 60, and a discharge station 70.

The first index table 10 has a plurality of indexes 11 for holding chip components on its outer peripheral portion and a disk 13 which rotates about a horizontal axis 12 in the direction of arrow 14. Chip parts are continuously supplied to the indexes 11 from the parts feeder 30, and one chip part is stored in each index 11. At this time, the surface is supplied so as to face in a fixed direction. The first index table 10 is pitch-fed and rotated by the stepping motor 40, and the chip parts that are directly below the camera 60 are
The image is taken by the camera 60. The camera 60 is installed on the camera support frame 61, and is configured to be able to adjust the imaging position, the focal length, and the like.

When the first index table rotates and the indexes containing the chip parts sequentially reach the image pickup positions, the camera 60 takes images. The captured image is transmitted to an image analysis device (not shown), and the determination device determines whether the image is good or bad. The second index table 20 has a plurality of indexes 21 having the same shape as the first index table and holding chip components on the outer peripheral portion, and has an arrow 2 around the horizontal axis 22.
It has a disk 23 that rotates in four directions.

The stepping motor 40 rotates the horizontal rotary shaft 12 of the first index table 10 to feed the chip components at a pitch, and at the same time, the pulley 4 having the same diameter.
The second index table 2 is synchronized with the first index table 10 by the first and the second 42 and the synchronization belt 43.
Rotate 0 by pitch feed. A transfer station 50 for transferring the chip component from the index 11 of the first index table 10 to the index 21 of the second index table 20 is provided. The transfer station 50 transfers the chip components held at the index 11 of the first index table 10 to the index 21 of the second index table 20 by reversing the front surface and the back surface.

4 and 5 are a side view and a front view of the chip component transfer section. The first index table 10 rotates in the direction of arrow 14, and when the index 11 reaches the position of the transfer station 50, it faces the index 21 of the second index table 20. The air 52 is blown from the transfer air blowing pipe 51, while the air suction pipe 53 sucks the air 54. As a result, the chip component 2 becomes the index 1 of the first index table 10.
It moves from 1 to the index 21 of the second index table 20. At this time, the front surface and the back surface of the chip component are reversed. With the positional relationship shown in FIGS. 4 and 5, when the chip component 2 is moved in the direction indicated by the arrow 55,
The chip parts 2 in the indexes 11 and 21 of the first and second index tables 10 and 20 are attached to the cameras 60 located above the respective index tables.
The front and back faces are opposite.

First and second index tables 10,
The camera 60 for inspecting the front surface and the back surface of the chip component 2 in the indexes 11 and 21 of 20 is a CCD camera and is attached to the camera support frame 61 and sends the captured image to a determination device (not shown) for determination. The device immediately determines the quality of the chip component. The chip components after the inspection are sorted into good products and defective products and are stored from the second index table 20 in the discharge station 70 into the sorted storage box 71 via the transfer paths 72, 73 and 74, respectively.

As described above, in the apparatus of the embodiment, both sides of the chip component can be automatically and continuously inspected, the accuracy of the inspection is improved, the time is shortened, and the problem of labor is eliminated.

[0017]

According to the present invention, the front and back of a chip component can be inspected at high speed with a single device.
Further, since the CCD camera is installed on the upper surface, it is possible to freely change the illumination and the installation space of the camera. Further, since the index table is used, it is possible to easily increase the number of inspection stations and the number of discharge sections and the apparatus by changing the size.

[Brief description of drawings]

FIG. 1 is an overall plan view of a chip component appearance inspection device according to an embodiment.

FIG. 2 is a side view of the chip component appearance inspection device according to the embodiment.

FIG. 3 is a front view of the chip component visual inspection apparatus of the embodiment.

FIG. 4 is a side view of a transfer unit.

FIG. 5 is a front view of a transfer unit.

[Explanation of symbols]

1 Chip Part Appearance Inspection Device 2 Chip Part 10 First Index Table 11 Index 12 Axis 13 Disc 14 Arrow 20 Second Index Table 21 Index 22 Axis 23 Disc 24 Arrow 30 Parts Feeder 40 Motor 41, 42 Pulley 43 Synchronous Belt 50 Transfer station 51, 53 Tube 52, 54 Air 55 Arrow 60 CCD camera 61 Camera support frame 70 Ejection station 71 Sorting storage box 72, 73, 74 Transfer path 75 Air tube

Claims (1)

[Claims] 1. A disk-shaped first index table having a plurality of indexes for holding chip components on its outer periphery and rotating around a horizontal axis, and a second index table of the same shape arranged in parallel with the first index table. An index table, a parts feeder that feeds chip parts into the index of the first index table, a stepping motor that rotates the first and second index tables to pitch feed the index, and a second index from the first index table. Transfer station for reversing and transferring the chip part to the index of the index table of No. 1, a camera for inspecting the front and back surfaces of the chip part in the indexes of the first and second index tables, and the chip part after the inspection. Sorted and discharged from the second index table Chip components appearance inspection apparatus is characterized in that a discharge station that.