JPH085707A - Semiconductor device testing device - Google Patents

Abstract

PURPOSE:To provide a semiconductor device testing device the testing time of which can be shortened. CONSTITUTION:Output voltage value measured data are stored in a measured data storing RAM 2 in the order of output terminal numbers and, when output data are accumulated by one hierarchy, the maximum value, minimum value, and mean value of the output data are calculated. Then the calculated maximum, minimum, and mean values are respectively stored in maximum, minimum, and mean value storing sections 4, 5, and 6 and respectively compared with reference values. Since the output voltage in another hierarchy can be measured and the measured data can be stored in the RAM 2 in parallel with the calculation of the maximum, minimum, and mean values, the testing time of a semiconductor testing device can be shortened.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor test device for measuring and comparing output voltage values of liquid crystal driving semiconductor devices at high speed.

[0002]

2. Description of the Related Art In recent years, liquid crystal displays have been attracting attention as image display devices replacing CRTs. And
Due to its small size and light weight, a large market is expected in the future, centering on portable information devices.

In the field of this liquid crystal display, T
Focusing on the FT (thin film transistor) type, it is considered that rapid technological innovation will be promoted toward full color and cost reduction in the future. The key to this is the liquid crystal driving semiconductor device, which is becoming more accurate and 8-bit compatible for full-color, and multi-terminal for the cost reduction.

Before manufacturing these liquid crystal driving semiconductor devices, it is always tested whether or not the output voltage value meets the product standard.

A conventional semiconductor test apparatus will be described below with reference to FIG. A digitizer 1 reads the output voltage value of a liquid crystal driving semiconductor device (not shown) with a digital signal. One or a plurality of digitizers 1 are provided in the semiconductor test equipment and usually have a resolution of 16 to 18 bits. A measurement data storage RAM 2 stores the digital signal data read by the digitizer 1. Reference numeral 3 is a digital signal processor (hereinafter referred to as DSP), which takes out data from the measurement data storage RAM 2 and outputs the maximum value, the minimum value,
The average value is calculated.

The operation of the conventional semiconductor test device configured as described above will be described below.

First, the digitizer 1 sequentially writes the measurement result obtained by reading the output voltage value of the liquid crystal driving semiconductor device (not shown) as a digital signal into the measurement data storage RAM 2 in the order of measurement.

When all the writing to the RAM 2 for storing the measurement data is completed, the R for storing the measurement data is stored in the DSP 3.
Necessary data is extracted from AM2, and the maximum value, minimum value, and average value are calculated. Then, the DSP 3 calculates the maximum value and the minimum value of the output voltage value of all the output terminals for each gradation level and compares them with the reference value to check whether the variation of the output voltage of the semiconductor device is within the standard. Make a decision. Further, the DSP 3 calculates the average value of the output voltage values of all the output terminals for each gradation level and compares it with the ideal straight line to determine whether the linearity of the output voltage gradation level is within the standard. If the value calculated by the DSP does not meet the standard, it is removed as a defective product.

[0009]

Recently, as the liquid crystal driving semiconductor device has higher gradations and multiple terminals, such as 256 gradations and 240 output terminals, the ratio of the calculation time to the total test time becomes smaller. It's getting bigger. Therefore, the reduction of the test time immediately leads to the cost reduction of the semiconductor device. Therefore, there has been a demand for a method that can reduce the test time.

The present invention solves the above conventional problems.
It is an object of the present invention to provide a semiconductor test device that can reduce the test time.

[0011]

In order to achieve the above object, the present invention provides a measurement data storage unit for storing measurement data of output voltage values in order according to a certain standard, and the measurement data storage unit. A maximum value storage unit that stores the maximum value of the measurement data for one gradation of the stored measurement data, or
A minimum value storage unit for storing the minimum value of the measurement data for one gradation or an average value storage unit for storing the average value of the measurement data for one gradation.

In order to achieve the above object, the present invention further comprises a measurement data storage unit for storing the measurement data of the output voltage value in order according to a certain standard, and the measurement data stored in the measurement data storage unit. It has an average value storage unit that stores the average value of the measurement data for one gradation of the data, or a dispersion storage unit that stores the variances σ, 2σ, and 3σ of the measurement data for one gradation.

In order to achieve the above object, the present invention further stores a measurement data storage RAM for storing the measurement data of the output voltage value in order according to a certain standard, and the measurement data storage RAM. A maximum value storage unit that stores the maximum value of the measurement data output from the same output terminal among the measured data, and a minimum value storage unit that stores the minimum value of the measurement data output from the same output terminal, An average value storage unit for storing an average value of the measurement data output from the same output terminal.

[0014]

According to the present invention, with the above-described configuration, the measured data of the output voltage value is stored in the measured data storage unit in the order according to a certain standard, and it is stored for each gradation or each output from one output terminal. Maximum value, minimum value, average value, etc. can be calculated and stored in the maximum value storage unit, minimum value storage unit, average value storage unit, etc. Therefore, the maximum value, minimum value, average value, etc. should be calculated and compared with the reference value at the time when one gradation or the measurement data for the output from one output terminal is stored in the measurement data storage section. You can Then, in parallel with calculating the maximum value, the minimum value, the average value, etc., it is possible to measure another gradation or an output voltage from another output terminal.

[0015]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIG.

FIG. 1 is a diagram showing the configuration of a semiconductor test apparatus of the present invention. In FIG. 1, reference numeral 2 denotes a measurement data storage RAM for storing the output voltage value of a digital signal read by a digitizer (not shown) or the like, in which the horizontal direction is set to the output terminal order and the vertical direction is set to the output voltage gradation level order. Has been done. Reference numeral 4 is a maximum value storage unit for capturing the maximum value of the horizontal data in the data storage RAM 2, and 5 is a data storage R.
A minimum value storage unit that captures the minimum value of the horizontal data of AM2, and an average value storage unit 6 that captures the average value of the horizontal data of the data storage RAM2.

The operation of one embodiment of the present invention constructed as above will be described below.

The RAM 2 for storing measured data in FIG. 1 is assumed to be stored in the horizontal direction in order from the output terminal 1 to the output terminal 240 and in the vertical direction in order from the gradation level 1 to the gradation level 256.

First, the measurement data measured for each gradation by a digitizer (not shown) is stored in the measurement data storage RAM 2
The output terminals 1 to 240 are sequentially stored in the horizontal direction. A RAM for storing measurement data of one gradation
At the same time as the storage in the memory, the maximum value, the minimum value, and the average value are calculated by a computing unit (not shown), and the respective values are stored in the maximum value storage unit 4, the minimum value storage unit 5, and the average value storage unit 6. Store. The values are stored in the maximum value storage unit 4, the minimum value storage unit 5, and the average value storage unit 6 while the arithmetic unit (not shown) calculates the maximum value, the minimum value, and the average value. While measurement is in progress, the measurement data of the next gradation is stored in the measurement data storage RAM 2
Is written to.

By repeating such an operation, the measurement data from the output terminal 1 to the output terminal 240 for all the gradation levels 1 to 256 are stored in the measurement data storage RAM 2 and at the same time, respectively. The maximum value, the minimum value, and the average value of the gradation levels are stored in the maximum value storage unit 4, the minimum value storage unit 5, and the average value storage unit 6, respectively.

Then, the maximum value, the minimum value, and the average value stored in the maximum value storage unit 4, the minimum value storage unit 5, and the average value storage unit 6 are compared with the reference value, and variations in the output voltage of the semiconductor device are performed. It is judged whether the value is within the standard.

As described above, according to the first embodiment of the present invention, by providing a dedicated storage unit for each of the maximum value, the minimum value, the average value, etc., the measurement data for one gradation can be stored as the measurement data. The maximum value, the minimum value, and the average value are calculated at the time when the data is stored in the RAM 2 for comparison, and the comparison determination is performed. A measurement can be made. Therefore, the test time of the semiconductor test device can be shortened.

In addition, since the present invention is generally used to judge whether the semiconductor device is a good product or a defective product, when it is judged as a defective product when the first gradation is compared and judged,
It is not necessary to newly measure the data of the gradation for which the judgment has not been completed, and the time required for the test time of the semiconductor test device can be significantly reduced.

Next, a second embodiment in which the present invention is adopted for another purpose will be described. In the present embodiment, the maximum value storage unit 4, the minimum value storage unit 5, and the average value storage unit 6 that can store the maximum value, the minimum value, and the average value in the first embodiment described above are stored.
On the other hand, the maximum deviation value storage unit that stores the calculation result of the maximum deviation value with respect to the average value of the measurement data in the output terminal direction, and the variance σ that the measurement data in the output terminal direction is normally distributed, A distributed storage unit for storing the calculation results of 2σ and 3σ is provided.

Thus, the maximum separation value and the variance σ, 2
By providing the maximum distance value storage unit that stores the calculation results of σ and 3σ, and the distributed storage unit, it is possible to use it for another purpose.

In the present embodiment, one gradation is collected and the measured data is written in the measured data storage RAM 2 and the maximum value and the like are calculated. However, the maximum value and the like are calculated for each output terminal number. It is clear that the same effect can be obtained even if

[0027]

According to the present invention, the maximum value, the minimum value, the average value, etc. are calculated at the time when one gradation or the measurement data for the output from one output terminal is stored in the measurement data storage section.・ Comparison judgment is possible, and maximum value, minimum value, average value, etc. are calculated. ・ In parallel with comparison judgment, another gradation or output voltage from another output terminal can be measured. Therefore, the test time by the semiconductor test device can be shortened.

Before the measurement of all the output voltages is completed, the maximum value, the minimum value, the average value, etc. of the measurement data of one gradation or the output from one output terminal conforms to the standard. If it is determined that the conditions are not satisfied, it is not necessary to measure the total output voltage, and the test time can be shortened considerably.

Further, the reduction of the test time leads to the reduction of the test cost.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a semiconductor test apparatus according to an embodiment of the present invention.

FIG. 2 is a configuration diagram of a conventional semiconductor test device.

[Explanation of symbols]

 1 Digitizer 2 RAM for measurement data storage 3 DSP 4 Maximum value storage 5 Minimum value storage 6 Average value storage

Claims (7)

[Claims] 1. A measurement data storage unit for storing measurement data of output voltage values in order according to a certain standard, and one gradation of measurement data among the measurement data stored in the measurement data storage unit. A semiconductor test device having an arithmetic unit for calculating the maximum value of the above and a maximum value storage unit for storing the maximum value. 2. A measurement data storage unit for storing the measurement data for measuring the output voltage value in order according to a certain standard, and one gradation of the measurement data stored in the measurement data storage unit. And a minimum value storage unit that stores the minimum value. 3. A measurement data storage unit for storing the measurement data of the output voltage value in order according to a certain standard, and one gradation of the measurement data stored in the measurement data storage unit. 2. A semiconductor test device having an arithmetic unit for calculating the average value of 1. and an average value storage unit for storing the average value. 4. A measurement data storage unit for storing the measurement data for measuring the output voltage value in order according to a certain standard, and one gradation of the measurement data stored in the measurement data storage unit. A maximum value storage unit for storing the maximum value of, a minimum value storage unit for storing the minimum value of the measurement data for one gradation, and an average value storage unit for storing the average value of the measurement data for one gradation. And a semiconductor test device having. 5. A measurement data storage unit that stores the measurement data obtained by measuring the output voltage value in order according to a certain standard, and one gradation of the measurement data stored in the measurement data storage unit. Of the average value, an average value storage unit for storing the average value, an arithmetic unit for calculating the maximum distance value with respect to the average value stored in the average value storage unit, the maximum distance value Semiconductor test equipment having a maximum distance value storage for storing. 6. A measurement data storage unit for storing the measurement data of the output voltage value in order according to a certain standard, and one gradation of the measurement data stored in the measurement data storage unit. A semiconductor test device having an arithmetic unit for calculating the variances σ, 2σ, and 3σ and a variance storage unit for storing the variances σ, 2σ, and 3σ. 7. The measurement data storage unit for storing the measurement data of the output voltage value in order according to a certain standard, and the measurement data stored in the measurement data storage unit are output from the same output terminal. The maximum value storage section for storing the maximum value of the measured data, the minimum value storage section for storing the minimum value of the measured data output from the same output terminal, and the minimum value storage section for storing the measured data output from the same output terminal. A semiconductor test device having an average value storage unit for storing an average value.