JPH0846311A - Electrode pad for connecting electric signal - Google Patents

Electrode pad for connecting electric signal

Info

Publication number
JPH0846311A
JPH0846311A JP6193539A JP19353994A JPH0846311A JP H0846311 A JPH0846311 A JP H0846311A JP 6193539 A JP6193539 A JP 6193539A JP 19353994 A JP19353994 A JP 19353994A JP H0846311 A JPH0846311 A JP H0846311A
Authority
JP
Japan
Prior art keywords
electrode pad
contact
conductive elastomer
probe pin
inner layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6193539A
Other languages
Japanese (ja)
Inventor
Shigeru Matsumura
茂 松村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP6193539A priority Critical patent/JPH0846311A/en
Publication of JPH0846311A publication Critical patent/JPH0846311A/en
Priority to PCT/JP1996/000433 priority patent/WO1997031510A1/en
Priority claimed from PCT/JP1996/000433 external-priority patent/WO1997031510A1/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/11Printed elements for providing electric connections to or between printed circuits

Abstract

PURPOSE:To stabilize the repeated contact characteristics by a method wherein one or more trenches are formed on the electrode pad connected to a probe pin or conductive elastomer connector by pressurization. CONSTITUTION:A trench 4 is formed by chemical etching or mechanical processing, etc., on the surface of an electrode pad 2 ranging over an inner layer connecting land 5 forming a through hole 3 of a multilayer printed board 1. In such a case, any number of trenches may be formed. After the formation of the trench 4, plating process for contact e.g. Au plating step, etc., is performed for improving the electric contact property. Through these procedures, the chamfering of a probing pin or conductive elastomer conductor, etc., in contact with the electrode pad 2 can be improved thereby enabling the contact characteristics to be enhanced.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】プリント配線基板等の基板表面上
に形成する電気信号接続用の電極パッドに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electrode pad for electrical signal connection formed on a surface of a printed wiring board or the like.

【0002】[0002]

【従来の技術】例えば表面実装用LSIや高密度プリン
ト配線基板等の電気的特性の測定を行いたい場合には、
被測定対象物と測定機器の測定部とを何らかの手段によ
って接続し、必要とする電気信号が入出力できるように
構成されなければならない。従来技術によれば、例えば
図2−2A〜2Cに示すように、多層プリント基板1表
面上に電気信号接続用の電極パッド2を設け、その部分
に対して一方の側である測定機器側のプローブピン6又
は、導電性と伸縮性がある導電性エラストマコネクタ
(導電性ゴムコネクタ)7等を押しつけてコンタクトを
とるという構成となっているのが通常であった。
2. Description of the Related Art For example, when it is desired to measure the electrical characteristics of a surface mounting LSI or a high density printed wiring board,
The object to be measured and the measuring section of the measuring device must be connected by some means so that the necessary electric signals can be input and output. According to the conventional technique, as shown in FIGS. 2-2A to 2C, for example, an electrode pad 2 for electrical signal connection is provided on the surface of the multilayer printed circuit board 1, and one side of the electrode pad 2 is connected to the measuring instrument side. Usually, the probe pin 6 or the conductive elastomer connector (conductive rubber connector) 7 having conductivity and elasticity is pressed to make a contact.

【0003】ところが、電極パッド2とプローブピン6
又は導電性エラストマコネクタ7とが押しつけられて接
続する接触面は、単なる平滑面であるため“点接触”と
なり易く、繰り返しの接触特性の安定が得られないとい
う欠点を有していた。
However, the electrode pad 2 and the probe pin 6
Alternatively, the contact surface to which the conductive elastomer connector 7 is pressed and connected is simply a smooth surface, so that it is apt to be "point contact", and it is not possible to obtain stable contact characteristics repeatedly.

【0004】[0004]

【発明が解決しようとする課題】近時、例えば被測定対
象物とする半導体デバイス等の高密度化、高速化等によ
り、それに構成される電気信号の入出力のための接続端
子部は、ますます小型化し配置密度も高くなっている。
従って、測定を行うために電気的接続が必要な測定部の
構成も、小型化、高密度化せざるを得ない。そのため
に、接触面となる電極パッドの面積も、またそこに接触
させるプローブピン及び導電性エラストマコネクタ等の
接触面の面積も、大きくとることができず、単なる平滑
面からなる接触面の欠点である繰り返しの接触特性の不
安定が増強されることはあっても、排除することができ
ないという問題点を有していた。
Recently, due to, for example, higher density and higher speed of semiconductor devices, etc., to be measured, connection terminals for inputting / outputting electric signals are being formed. It is becoming smaller and the arrangement density is higher.
Therefore, the structure of the measurement unit, which requires electrical connection for performing measurement, must be miniaturized and densified. Therefore, the area of the electrode pad to be the contact surface and the area of the contact surface of the probe pin and the conductive elastomer connector to be contacted therewith cannot be made large. Even if the instability of the contact characteristics is increased for a certain number of times, it has a problem that it cannot be eliminated.

【0005】そこで、本発明においては、接触させるプ
ローブピンや導電性エラストマコネクタ等の小型化、高
密度化に対応できて、かつ繰り返しの接触特性の安定化
を図ることができる電極パッドを提供することを目的と
した。
In view of the above, the present invention provides an electrode pad that can be used for miniaturizing and increasing the density of a probe pin, a conductive elastomer connector or the like to be brought into contact and can stabilize repeated contact characteristics. It was intended.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に、本発明の電気信号接続用の電極パッドにおいては、
プローブピンや導電性エラストマコネクタ等が接触する
面を単なる平滑面とはせずに、電極パッドの表面に溝を
付けて凹凸を形成した。そのことで、接触の際にプロー
ブピンや導電性エラストマコネクタに対する食いつきが
良くなり、複数の点で接触するいわゆる多点接触が行わ
れるようにした。
In order to achieve the above object, in the electrode pad for electrical signal connection of the present invention,
The surface with which the probe pin, the conductive elastomer connector, or the like contacts is not a smooth surface, but a groove is formed on the surface of the electrode pad to form irregularities. As a result, the contact with the probe pin or the conductive elastomer connector is improved at the time of contact, and so-called multi-point contact in which contact is made at a plurality of points is performed.

【0007】電極パッドの表面の凹凸の溝は円形でも方
形でも形状は問わず、またその段差の高さや幅や長さも
特に問わないが、使用する特定のプローブにフィットす
る形状を実験により選べば良い。
The concave and convex grooves on the surface of the electrode pad may be circular or rectangular, and the height, width and length of the steps are not particularly limited. good.

【0008】[0008]

【作用】[Action]

(1)電極パッドの表面を凹凸にする溝は化学的エッチン
グや機械的加工によっても得られ、接触面となる表面に
は接点用のメッキである例えば金メッキを行う。 (2)導電性エラストマコネクタにより接触する場合に
は、当該コネクタには伸縮性があるため電極パッドの表
面の凹凸面に対してフィットしやすく、その分より多点
接触が得易い。
(1) Grooves that make the surface of the electrode pad uneven are also obtained by chemical etching or mechanical processing, and the surface to be the contact surface is plated with gold for contact, for example. (2) When the contact is made by the conductive elastomer connector, since the connector has elasticity, it is easy to fit on the uneven surface of the surface of the electrode pad, and the multipoint contact is more easily obtained.

【0009】[0009]

【実施例】図1−1A〜1Dは、本発明による実施例を
示す概念図である。 (1)図1Aに示すように、多層プリント基板1のスルー
ホール3を形成する内層接続用ランド5に連なる電極パ
ッド2の表面に対し、凹凸となる溝4を形成する。凹凸
の溝4の形成は、化学的エッチング及び機械的加工等に
よって行う。溝の数に制約はない。 (2)電極パッド2の外形形状は、図1Bに示すような方
形のものでもよく、また、他の外形形状であっても良
い。 (3)凹凸の溝4の形成後は、電気的接触性の向上のため
に接点用のメッキ加工例えばAuメッキ等を通常は行う。 (4)図1Cは、図1Aと同様に電極パッド2の形状は円
形であり、かつ、凹凸の溝4を同心円上に設け、中心に
は内層接続用ランド5を設けた形状の電極パッド2であ
る。この場合には、内層接続用ランド5のスルーホール
3も凹凸の溝4形成の1部を構成する。
1A to 1D are conceptual views showing an embodiment according to the present invention. (1) As shown in FIG. 1A, an uneven groove 4 is formed on the surface of the electrode pad 2 which is continuous with the inner layer connecting land 5 which forms the through hole 3 of the multilayer printed board 1. The uneven grooves 4 are formed by chemical etching, mechanical processing, or the like. There is no limit to the number of grooves. (2) The outer shape of the electrode pad 2 may be a rectangular shape as shown in FIG. 1B, or may be another outer shape. (3) After forming the concave-convex groove 4, in order to improve the electrical contactability, a plating process for contacts such as Au plating is usually performed. (4) In FIG. 1C, similarly to FIG. 1A, the shape of the electrode pad 2 is circular, and the concave and convex grooves 4 are provided on concentric circles, and the inner layer connection land 5 is provided at the center thereof. Is. In this case, the through hole 3 of the land 5 for connecting the inner layer also constitutes a part of the formation of the uneven groove 4.

【0010】(5)図1Dには、伸縮性のある導電性エラ
ストマコネクタ7が、図1Cの形状の場合の電極パッド
2に接触した状況を示す。スルーホール3を形成する内
層接続用ランド5を含めた凹凸の溝4に押しつけられて
表面によくフィットしている状態を示す。 (6)凹凸の溝4の数やその段差の高さ、幅、長さは、プ
ローブピン6や導電性エラストマコネクタ7の形状と、
電極パッド2の形状や大きさ等から決める。 (7)本実施例は、多層プリント基板上の電極パッド2に
ついて述べたが、電極パッド2が形成されるベースとな
る部分に対しての制約はない。 (8)また、接触する一方の側であるプローブピン6に凹
凸加工をすることで、さらに接触特性の安定性の向上が
得られる。
(5) FIG. 1D shows a situation in which the elastic conductive elastomer connector 7 is in contact with the electrode pad 2 in the case of the shape shown in FIG. 1C. A state is shown in which the surface is pressed against the concave and convex grooves 4 including the inner layer connecting lands 5 forming the through holes 3 and fits well to the surface. (6) The number of concave and convex grooves 4 and the height, width, and length of the steps are the same as the shapes of the probe pins 6 and the conductive elastomer connector 7.
It is determined from the shape and size of the electrode pad 2. (7) In this embodiment, the electrode pad 2 on the multilayer printed circuit board has been described, but there is no restriction on the portion which will be the base on which the electrode pad 2 is formed. (8) Further, by making the probe pin 6 on one side in contact with the probe pin 6 uneven, it is possible to further improve the stability of the contact characteristics.

【0011】[0011]

【発明の効果】本発明は、以上説明したように構成され
ているので、以下に記載されるような効果を奏する。 (1)電気信号接続用の電極パッドに凹凸の溝を形成した
ことで、電極パッドに接触するプローブピンや導電性エ
ラストマコネクタ等の食いつきが良くなったので、接触
特性が格段に向上した。 (2)電極パッドの凹凸の溝の構成に、内層接続用ランド
も含めてその1部としてしまったことで、電極パッドと
内層接続用ランドを合わせた所要面積が減少するので、
その分電極パッドの配列を高密度にすることができた。
また、内層接続用ランドの面積が減少した分電極パッド
を大きくすることができる。
Since the present invention is configured as described above, it has the following effects. (1) By forming the concave and convex grooves on the electrode pad for electrical signal connection, the biting of the probe pin, the conductive elastomer connector or the like contacting the electrode pad is improved, so that the contact characteristics are significantly improved. (2) By including the inner layer connection lands as a part of the configuration of the concave and convex grooves of the electrode pad, the required area of the electrode pad and the inner layer connection lands is reduced,
Therefore, the arrangement of the electrode pads can be increased in density.
In addition, the electrode pad can be made larger by the reduction of the area of the inner layer connection land.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例を示す概念図である。FIG. 1 is a conceptual diagram showing an embodiment of the present invention.

【図2】従来技術による電気信号接続用の電極パッドの
構成を示す概念図である。
FIG. 2 is a conceptual diagram showing a configuration of an electrode pad for electrical signal connection according to a conventional technique.

【符号の説明】[Explanation of symbols]

1 多層プリント基板 2 電極パッド 3 スルーホール 4 凹凸の溝 5 内層接続用ランド 6 プローブピン 7 導電性エラストマコネクタ 1 Multilayer Printed Circuit Board 2 Electrode Pad 3 Through Hole 4 Uneven Groove 5 Inner Layer Connection Land 6 Probe Pin 7 Conductive Elastomer Connector

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 プローブピン(6)又は導電性エラスト
マコネクタ(7)と押圧により電気的に接続する基板上
の電極パッド(2)において、 1つ又は複数個の凹凸の溝(4)を形成した電極パッド
(2)である、ことを特徴とする電気信号接続用の電極
パッド。
1. An electrode pad (2) on a substrate which is electrically connected to a probe pin (6) or a conductive elastomer connector (7) by pressing, wherein one or a plurality of concave and convex grooves (4) are formed. An electrode pad for electrical signal connection, which is the electrode pad (2).
【請求項2】 電極パッド(2)と基板のスルーホール
(3)を形成する内層接続用ランド(5)とを一体とし
た請求項1記載の電気信号接続用の電極パッド。
2. The electrode pad for electrical signal connection according to claim 1, wherein the electrode pad (2) and the inner layer connection land (5) forming the through hole (3) of the substrate are integrated.
JP6193539A 1994-07-26 1994-07-26 Electrode pad for connecting electric signal Pending JPH0846311A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP6193539A JPH0846311A (en) 1994-07-26 1994-07-26 Electrode pad for connecting electric signal
PCT/JP1996/000433 WO1997031510A1 (en) 1994-07-26 1996-02-26 Electrode pad for electric signal connection

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6193539A JPH0846311A (en) 1994-07-26 1994-07-26 Electrode pad for connecting electric signal
PCT/JP1996/000433 WO1997031510A1 (en) 1994-07-26 1996-02-26 Electrode pad for electric signal connection

Publications (1)

Publication Number Publication Date
JPH0846311A true JPH0846311A (en) 1996-02-16

Family

ID=16309763

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6193539A Pending JPH0846311A (en) 1994-07-26 1994-07-26 Electrode pad for connecting electric signal

Country Status (1)

Country Link
JP (1) JPH0846311A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006041521A (en) * 2004-07-23 2006-02-09 Samsung Electronics Co Ltd Printed circuit board and display utilizing same
JP2007136711A (en) * 2005-11-15 2007-06-07 Seiko Epson Corp Device mounting structure, method for mounting device, and liquid droplet jet head
WO2012089555A1 (en) * 2010-12-28 2012-07-05 Robert Bosch Gmbh Printed circuit board, method for producing a printed circuit board and testing device for testing a printed circuit board
US9459285B2 (en) 2013-07-10 2016-10-04 Globalfoundries Inc. Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006041521A (en) * 2004-07-23 2006-02-09 Samsung Electronics Co Ltd Printed circuit board and display utilizing same
JP2007136711A (en) * 2005-11-15 2007-06-07 Seiko Epson Corp Device mounting structure, method for mounting device, and liquid droplet jet head
JP4687410B2 (en) * 2005-11-15 2011-05-25 セイコーエプソン株式会社 Device mounting structure and droplet discharge head
WO2012089555A1 (en) * 2010-12-28 2012-07-05 Robert Bosch Gmbh Printed circuit board, method for producing a printed circuit board and testing device for testing a printed circuit board
US9301388B2 (en) 2010-12-28 2016-03-29 Robert Bosch Gmbh Printed circuit board, method of producing a printed circuit board and testing device for testing a printed circuit board
US9459285B2 (en) 2013-07-10 2016-10-04 Globalfoundries Inc. Test probe coated with conductive elastomer for testing of backdrilled plated through holes in printed circuit board assembly

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