JPH0833345B2 - Data processing method - Google Patents
Data processing methodInfo
- Publication number
- JPH0833345B2 JPH0833345B2 JP5772487A JP5772487A JPH0833345B2 JP H0833345 B2 JPH0833345 B2 JP H0833345B2 JP 5772487 A JP5772487 A JP 5772487A JP 5772487 A JP5772487 A JP 5772487A JP H0833345 B2 JPH0833345 B2 JP H0833345B2
- Authority
- JP
- Japan
- Prior art keywords
- value
- coefficient
- variation
- cvo
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analysing Materials By Optical Means (AREA)
Description
【発明の詳細な説明】 （産業上の利用分野） 本発明は原子吸光光度計を初め、紫外・可視分光光度
計やガスクロマトグラフなどにおいて、繰返し測定を行
ない、異常測定値を自動的に削除したりするために、異
常測定値が存在することを検出するデータ処理方法に関
するものである。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention performs repeated measurement in an atomic absorption spectrophotometer, an ultraviolet / visible spectrophotometer or a gas chromatograph, and automatically deletes abnormal measurement values. Therefore, the present invention relates to a data processing method for detecting the presence of an abnormal measurement value.
（従来の技術） 原子吸光光度計では測定値の信頼性を高めるために、
同一の試料について複数回繰り返し測定を行ない、その
測定値の平均値を求めるとともに、変動係数（相対標準
偏差）CVを算出し、その変動係数CVが予め設定された基
準値を越えた場合に異常測定値があると装置が判断し、
再度測定を繰り返すようにしている。(Prior art) In atomic absorption spectrophotometer, in order to increase the reliability of the measured value,
Repeated measurements are performed multiple times on the same sample, the average value of the measured values is calculated, the coefficient of variation (relative standard deviation) CV is calculated, and if the coefficient of variation CV exceeds a preset reference value, an error occurs. The device determines that there is a measured value,
The measurement is repeated.
個々の測定値Ｘの繰返し測定の平均値をとし、標準
偏差をSDとすると、変動係数CVは CV＝SD/ ……（１） と表わされる。The coefficient of variation CV is expressed as CV = SD / ... (1), where the average value of repeated measurement of each measured value X is taken and the standard deviation is taken as SD.
（発明が解決しようとする問題点） 微量な試料を測定する場合、吸光度が非常に小さくて
０に近い場合には、繰返し測定の測定値Ｘの平均値が
０又は０に近い値になる。そのため、従来のように
（１）式によって変動係数CVを算出すると、各測定値Ｘ
のばらつきが十分小さくても変動係数CVが非常に大きく
なり、装置は異常測定値が発生したと判断してしまう。(Problems to be Solved by the Invention) When a small amount of sample is measured and the absorbance is very small and close to 0, the average value of the measured values X of the repeated measurement becomes 0 or a value close to 0. Therefore, if the coefficient of variation CV is calculated by the equation (1) as in the conventional case, each measured value X
The variation coefficient CV becomes extremely large even if the variation of is sufficiently small, and the device determines that an abnormal measurement value has occurred.
例えば、次の２つのデータを比較してみる。第１のデ
ータでは３回の測定値Ｘが0.001,0.000,−0.001であっ
たとすると、平均値は0.000であり、変動係数CVは無
限大となってしまう。これに対して、第２のデータでは
３回の測定値Ｘが0.001,0.000,0.005であったとする
と、平均値が0.003であり、変動係数CVは0.81となる。
このように、第２のデータの方がばらつきが大きいにも
拘らず変動係数CVが小さくなるという不合理な結果にな
る。For example, compare the following two data. In the first data, if the measured value X of three times is 0.001, 0.000, -0.001, the average value is 0.000 and the coefficient of variation CV becomes infinite. On the other hand, in the second data, if the measured value X of three times is 0.001, 0.000, 0.005, the average value is 0.003 and the coefficient of variation CV is 0.81.
In this way, the variation coefficient CV becomes small despite the large variation in the second data, resulting in an irrational result.
本発明は、原子吸光光度計の吸光度のように、測定値
が非常に小さい試料の場合でも、その繰返し測定におい
て正しく異常測定値の判定を行なうことのできるデータ
処理方法を提供することを目的とするものである。The present invention has an object to provide a data processing method capable of correctly determining an abnormal measurement value in repeated measurement even in the case of a sample having a very small measurement value, such as the absorbance of an atomic absorption spectrophotometer. To do.
（問題点を解決するための手段） 本発明のデータ処理方法では、繰返し測定された測定
値Ｘから変動係数CVoを CVo＝SD/（＋ｋ） ……（２） として算出し、この変動係数CVoと予め設定値として入
力された判断の基準値Ｔとの大小関係を比較し、CVo＞
Ｔであれば異常測定値ありと判断し、CVo≦Ｔであれば
異常測定値なしと判断する。ただし、SDは繰返し測定値
Ｘの標準偏差、は繰返し測定値Ｘの平均値、ｋは装置
及び試料によって定まる係数である。(Means for Solving Problems) In the data processing method of the present invention, the coefficient of variation CVo is calculated from the repeatedly measured measurement value X as CVo = SD / (+ k) (2), and the coefficient of variation CVo is calculated. And the reference value T of the judgment input as a preset value are compared in magnitude, and CVo>
If T, it is judged that there is an abnormal measured value, and if CVo ≦ T, it is judged that there is no abnormal measured value. Here, SD is the standard deviation of the repeated measurement value X, is the average value of the repeated measurement value X, and k is a coefficient determined by the device and the sample.
係数ｋを試料ごとに定めて判断の精度を上げるため
に、係数ｋをＫ・SDoとして、 CVo＝SD/（＋Ｋ・SDo） ……（３） により変動係数CVoを算出し、この変動係数CVoを用いて
判断の基準値Ｔとの大小関係を比較し、CVo＞Ｔであれ
ば異常測定値ありと判断し、CVo≦Ｔであれば異常測定
値なしと判断してもよい。ただし、SDoはブランク試料
又はベースラインの繰返し測定値Ｘの標準偏差、Ｋは１
以上の定数てある。In order to determine the coefficient k for each sample and improve the accuracy of judgment, the coefficient k is set to K · SDo, and the coefficient of variation CVo is calculated by CVo = SD / (+ K · SDo) (3). May be used to compare the magnitude relationship with the reference value T for determination, and if CVo> T, it may be determined that there is an abnormal measured value, and if CVo ≦ T, it may be determined that there is no abnormal measured value. However, SDo is standard deviation of blank sample or baseline repeated measurement value X, K is 1
The above is a constant.
（作用） （２）式又は（３）式を用いて変動係数CVoを算出す
ると、繰返し測定値Ｘの平均値が０になっても（２）
式又は（３）式の分母は０にはならないため、装置が誤
って異常測定値ありと判断することがなくなる。(Operation) When the coefficient of variation CVo is calculated using the equation (2) or the equation (3), even if the average value of the repeated measurement values X becomes 0 (2)
Since the denominator of the expression or the expression (3) does not become 0, the device does not erroneously determine that there is an abnormal measurement value.
（実施例） （３）式における定数Ｋは実験によって最適な値を決
定する必要があるが、概ね２〜５程度が適当である。(Embodiment) The constant K in the equation (3) needs to be determined to be an optimum value by an experiment, but about 2 to 5 is suitable.
図に（３）式を用いて異常測定値の有無を判断する場
合の手順を示す。The figure shows the procedure for determining the presence / absence of an abnormal measurement value using equation (3).
まず、判断の基準値Ｔを入力する（ステップS1）。 First, a reference value T for judgment is input (step S1).
ブランク試料を繰り返し測定し、その測定値Ｘから標
準偏差SDoを算出し、メモリに記憶する（ステップS2,S
3,S4）。The blank sample is repeatedly measured, the standard deviation SDo is calculated from the measured value X, and stored in the memory (steps S2, S
3, S4).
次に、測定試料を繰り返し測定し（ステップS5）、そ
の測定値Ｘの平均値と標準偏差SDを計算する（ステッ
プS6）。Next, the measurement sample is repeatedly measured (step S5), and the average value of the measured values X and the standard deviation SD are calculated (step S6).
以上で求めたブランク試料の標準偏差SDo、測定試料
の平均値及び測定試料の標準偏差SDと、予め設定して
おいた基準値Ｋとから（３）式により変動係数CVoを計
算し、そのCVoと基準値Ｔとの大小関係を比較する（ス
テップS7）。計算された変動係数CVoが基準値Ｔより大
きい場合は測定値に異常値ありと判断し（ステップS
8）、変動係数CVoが基準値Ｔ以下であれば異常値なしと
判断する（ステップS9）。The coefficient of variation CVo is calculated by the equation (3) from the standard deviation SDo of the blank sample, the average value of the measurement sample and the standard deviation SD of the measurement sample obtained above, and the preset reference value K, and the CVo thereof is calculated. Is compared with the reference value T (step S7). If the calculated coefficient of variation CVo is larger than the reference value T, it is determined that the measured value has an abnormal value (step S
8) If the coefficient of variation CVo is less than or equal to the reference value T, it is determined that there is no abnormal value (step S9).
（発明の効果） 本発明では繰り返し測定された測定値から、従来の変
動係数CVに代えて、（２）式又は（３）式で与えられる
変動係数CVoを算出し、その変動係数CVoを用いて異常測
定値の有無を判断するようにしたので、極めて濃度の小
さい試料の繰返し測定においても、正しく異常測定値の
有無を判断することができる。(Effect of the Invention) In the present invention, the coefficient of variation CVo given by the equation (2) or the equation (3) is calculated from the repeatedly measured value, instead of the conventional coefficient of variation CV, and the coefficient of variation CVo is used. Since the presence / absence of the abnormal measurement value is determined by the above method, the presence / absence of the abnormal measurement value can be correctly determined even in the repeated measurement of the sample having an extremely low concentration.
図は一実施例の手順を示すフローチャートである。 The figure is a flow chart showing the procedure of one embodiment.
Claims (2)
oを CVo＝SD/（＋ｋ） （SDは繰返し測定値Ｘの標準偏差、は繰返し測定値Ｘ
の平均値、ｋは装置及び試料によって定まる係数）とし
て算出し、この変動係数CVoが設定値を越えたときに異
常測定値があったと判断するデータ処理方法。1. The coefficient of variation CV from the repeatedly measured value X.
o is CVo = SD / (+ k) (SD is the standard deviation of repeated measurement value X, is the repeated measurement value X
Is a data processing method in which an abnormal measured value is determined when the coefficient of variation CVo exceeds a set value.
スラインの繰返し測定値Ｘの標準偏差、Ｋは１以上の定
数）とする特許請求の範囲第１項に記載のデータ処理方
法。2. The data processing method according to claim 1, wherein k = K · SDo (SDo is a standard deviation of repeated measurement values X of a blank sample or a baseline, and K is a constant of 1 or more).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5772487A JPH0833345B2 (en) | 1987-03-11 | 1987-03-11 | Data processing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5772487A JPH0833345B2 (en) | 1987-03-11 | 1987-03-11 | Data processing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63222241A JPS63222241A (en) | 1988-09-16 |
| JPH0833345B2 true JPH0833345B2 (en) | 1996-03-29 |
Family
ID=13063884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5772487A Expired - Lifetime JPH0833345B2 (en) | 1987-03-11 | 1987-03-11 | Data processing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0833345B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4594120B2 (en) * | 2005-02-02 | 2010-12-08 | 東亜ディーケーケー株式会社 | Environmental measurement equipment |
| WO2020053703A1 (en) * | 2018-09-10 | 2020-03-19 | Alma Mater Studiorum - Universita' Di Bologna | Impedentiometric system for the assessment of muscle mass |
-
1987
- 1987-03-11 JP JP5772487A patent/JPH0833345B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63222241A (en) | 1988-09-16 |
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