JPH08327347A - Wireless film thickness gauge - Google Patents

Abstract

PURPOSE: To provide a thickness measuring gauge for a surface-treated film of metal plate wherein a damage on a cable between a body and a probe in prevented. CONSTITUTION: This film thickness measuring gauge for measuring the thickness of a film on metal has a display section 13 to show the film thickness, a keyboard 12 to input measuring conditions, a body 11 having a receiving antenna 14 for receiving a measuring signal and a film thickness measuring probe 21 which has a measuring part 24 at one end thereof to be pressed on the film on the metal while having an antenna at the other end thereof for transmitting the measuring signal being sent from the measuring part 24.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wireless film thickness measuring device.

[0002]

2. Description of the Related Art The thickness of a coating film, a plating film, or an alumite film applied for the purpose of rust prevention of metal, insulation, or appearance aesthetics ranges from several μm to several hundreds μm. As an apparatus for measuring this thickness without damaging the film, an electromagnetic film thickness meter that measures the film thickness by pressing a probe connected with a cable against the film on the magnetic metal, and on a non-magnetic metal There is an eddy current film thickness meter that measures the film thickness by pressing it against a film.
(For example, refer to Japanese Patent Application No. 5-233445, "Film thickness measuring sensor and measuring circuit")

When actually performing the measurement, by pressing one end of the probe upright against the film surface to be measured, the cable attached to the other end of the probe allows the measurement signal to pass, and the measurement circuit main body. However, since the probe operator swings his or her hand-held probe back and forth and left and right in an attempt to bring it into close contact with the membrane surface, the cable may be damaged or broken, and the At measurement sites where there is no such place, the presence of the cable itself could be a continuous obstacle.

[0004]

SUMMARY OF THE INVENTION An object of the present invention is to provide a film thickness measuring device which eliminates the cable between the film thickness measuring sensor and the measuring circuit body. According to the present invention, there is provided a film thickness measuring device for measuring the film thickness on a metal, comprising a display unit for displaying the film thickness, a keyboard for inputting measurement conditions, and a measurement signal. A main body having a receiving antenna for receiving, and a film thickness measurement probe, which has a measuring unit that presses against a film on a metal at one end, and transmits the measurement signal sent from the measuring unit at the other end. There is provided a film thickness measuring device having the film thickness measuring probe having an antenna of
A film thickness measurement that solves the above-mentioned problems of the cable is realized.

A more detailed structure of the present invention will be made clear by the following description. 1 and 2 show an embodiment of a measuring circuit body and a probe of a film thickness measuring apparatus according to the present invention, a keyboard 12 for distinguishing each measurement or inputting measurement conditions, and a measured film. The display unit 13 for displaying the thickness value, the main body 11 having the receiving antenna 14 for receiving a signal from the probe, the battery box 22, the power switch 23, and the probe 21 having the measuring unit 24 as a pair. Used for film thickness measurement.

In the probe, as shown in FIG. 3, the film thickness measurement signal obtained from an inductance element (not shown) included in the measuring section 24 and connected to the measuring device 31 is A / D.
It is converted into a digital signal by the converter 32. ES23
The 2C transmitter 33 converts this signal into a well-known RS232C code. The modulator 34 modulates this code (FM modulation) with a high frequency signal from an oscillating element (not shown) in the high frequency oscillator 35. The modulated signal is sent to the amplifier 3
The signal is amplified by 6 and sent to the transmitting antenna 37 to transmit a radio wave. FIG. 4 shows the body that receives radio waves from the probe and displays the film thickness measurement. The antenna 41 is connected to the demodulator 43 via the amplifier 42, and the signal modulated by the probe is demodulated (FM demodulation) here to become a known RS232 signal. The RS232C receiver 44 sends this signal to the arithmetic circuit 45 as a bus signal,
A predetermined calculation is performed and the measured value of the film thickness is displayed on the display 46.

Nothing interfering with the propagation of radio waves should be interposed between the receiving antenna 14 of FIG. 4 and the transmitting antenna of FIG. FIG. 5 shows the position of the coil-shaped transmitting antenna 37, and the probe operator's hand slightly moves from the center of the probe to the measuring section 24 side in order to bring the measuring section 24 into close contact with the film 52 on the metal material 51. Since the transmitter antenna 37 is located close to the position shown in the drawing,
It is housed in a non-metal case 38 at a position opposite to 4. This built-in position allows a large distance to the transmission antenna even when the area of the metal material 51 to be measured is large, which is convenient for improving the measurement accuracy. Sixth
The figure shows the rotation of the receiving antenna 14, and it is recommended to select the rotation position 62 when the main body is placed horizontally. The receiving antenna is also coil-shaped, but the operator does not have the receiving antenna portion at the time of measurement, and it is not necessary to shorten the total length unlike the transmitting antenna, and the operator may have a more elongated shape. In a place where the main body is too narrow to be placed horizontally, the rotational position 61 or 63 may give more stable radio wave propagation conditions, and can be used properly depending on the receiving sensitivity. The rotational position 62 or 63 may be convenient when the measurement is performed with the main body in one hand. Position 61 may be safe because the antenna is placed along the main body after the measurement or during transportation. By setting the shape of the transmitting antenna 37 to have a diameter of 10 mm or more, its length can be separated from the position of the operator's hand, or the entire length of the probe can be designed to fit in a pocket of clothes. . With the configuration described above, damage to the cable connected to the probe or obstacle to measurement can be eliminated.

[Brief description of drawings]

FIG. 1 is a diagram showing a film thickness measuring circuit body according to the present invention.

FIG. 2 shows a probe according to the present invention.

FIG. 3 is a diagram showing a circuit block inside a probe according to the present invention.

FIG. 4 is a diagram showing a circuit block inside a film thickness measuring circuit body according to the present invention.

FIG. 5 is a diagram showing a transmitting antenna position inside a probe according to the present invention.

FIG. 6 is a diagram showing a rotation direction of a receiving antenna attached to a film thickness measuring circuit main body according to the present invention.

[Explanation of symbols]

 11 Measuring Circuit Main Body 12 Keyboard 13 Display 14 Receiving Antenna 21 Probe 22 Battery Box 24 Measuring Section 37 Transmitting Antenna

Claims (4)

[Claims] 1. A film thickness measuring device for measuring a film thickness on a metal, comprising: a display unit for displaying the film thickness; a keyboard for inputting measurement conditions; and a measurement signal received. A main body having a receiving antenna for performing the measurement, and a film thickness measuring probe having a measuring unit that presses against a film on a metal at one end and a measuring signal sent from the measuring unit at the other end. A film thickness measuring device comprising: the film thickness measuring probe having an antenna. 2. The film thickness measuring device according to claim 1, wherein
The film thickness measuring device, wherein the receiving antenna is attached to the main body so as to be capable of half rotation. 3. The film thickness measuring device according to claim 1, wherein the transmitting antenna has a diameter of 10 mm or more,
The film thickness measuring device, wherein the receiving antenna has a shape elongated than the transmitting antenna. 4. The film thickness measuring device according to claim 1, 2 or 3, wherein the film thickness measuring probe and the main body respectively include a circuit for FM modulating and a circuit for FM demodulating the measurement signal. The film thickness measuring device.