JPH08327349A - Method for altering film thickness measuring conditions of wireless film thickness meter - Google Patents

Abstract

PURPOSE: To achieve correct measurement of film thickness quickly by selecting a probe of either an electromagnetic type or a high frequency type and sending film thickness data to a measuring rotary body by radio communication to select or switch any one of constants or expressions. CONSTITUTION: In a probe 21, a film thickness measuring signal obtained from an inductance element connected to a measuring device 31 is converted into a digital signal by an A/D converter 32. A transmitter 33 converts ID of a probe of either an electromagnetic type or a high frequency type built in a memory and the digital signal into a specified code to be transmitted to a modulator 34. After the code is modulated by a harmonic signal from a harmonic oscillator 35, it is amplified 36 and a radio wave is transmitted from a transmitting antenna 37. An arithmetic controller stores a measuring system data indicating the distinction of the measuring system in a memory and compares measuring type data received together with film thickness data transmitted by the radio wave from the probe 21 with measuring type data stored in the memory. When it differs, the measuring system data stored in the memory are changed over.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wireless film thickness measuring device.

The thickness of a coating film, a plating film, or an alumite film applied for the purpose of rust prevention of metal, insulation, or appearance is wide ranging from several μm to several hundred μm. As a device to measure this thickness without damaging the film,
An electromagnetic film thickness meter that measures the film thickness by pressing a probe connected with a cable against a film on a magnetic metal, and a vortex that measures the film thickness by pressing against a film on a non-magnetic metal. There is a current film thickness meter. (For example, refer to Japanese Patent Application No. 5-233445, "Film thickness measuring sensor and measuring circuit")

As shown in FIGS. 1 and 2, a keyboard 12 for distinguishing each measurement or inputting measurement conditions, and a display section 1 for displaying the value of the measured film thickness.
3 and a receiving antenna 14 for receiving a signal from the probe
In a film thickness measuring device in which a main body 11 having a battery, a battery box 22, a power switch 23, and a probe 21 having a measuring unit 24 are to be used for data radio communication, a magnetic field generated by an alternating current Corresponding to a probe for measuring the film thickness on magnetic metal such as, electromagnetic film thickness measurement that performs calculations with predetermined constants and formulas stored in the main unit, and magnetic field due to higher frequency alternating current Depending on the sample to be measured, either the high-frequency type film thickness measurement that performs the calculation with the predetermined constant or the calculation formula stored in the main body corresponding to the probe for measuring the film thickness on the nonmagnetic metal Specifying to the body via 12 is error prone and impractical.

[0004]

[Means for Solving Problems, Effects, and Embodiments] An object of the present invention is to select either an electromagnetic type probe or a high frequency type probe and send film thickness data to the measuring circuit body by radio wave communication. It is an object of the present invention to provide a method for changing the film thickness measurement condition, in which a constant or an arithmetic expression is selected / switched to perform a quick film thickness measurement. According to the present invention, it is a method of changing the film thickness measurement condition in the wireless film thickness meter main body for measuring the thickness of the film on the metal, which is used as a pair with a probe corresponding to each of a plurality of measurement methods. A first step of storing in the memory the measurement method data representing the different measurement method; a second step of comparing the measurement method data received together with the film thickness data from the probe with the measurement method data stored in the memory; A method for changing film thickness measurement conditions, comprising: switching the measurement method data stored in the memory when different measurement method data is used in the second step. The film thickness measurement that solves the problem in realizing the method is realized.

A more detailed structure of the present invention will be made clear by the following description. 1 and 2 show an embodiment of a measuring circuit body and a probe of a film thickness measuring apparatus according to the present invention, a keyboard 12 for distinguishing each measurement or inputting measurement conditions, and a measured film. The display unit 13 for displaying the thickness value, the main body 11 having the receiving antenna 14 for receiving a signal from the probe, the battery box 22, the power switch 23, and the probe 21 having the measuring unit 24 as a pair. Used for film thickness measurement.

In the probe, as shown in FIG. 3, the film thickness measurement signal included in the measurement portion 24 and obtained from the inductance element (not shown) connected to the measuring device 31 is A /
It is converted into a digital signal by the D converter 32. RS2
The 32C transmitter 34 converts an ID (built-in memory) indicating whether it is an electromagnetic type or a high frequency type by 0 or 1 and this digital signal into a well-known RS232C code. The converter 34 modulates this code (FM modulation) with a high frequency signal from an oscillating element (not shown) in the high frequency oscillator 35. The modulated signal is amplified by the amplifier 36 and sent to the transmitting antenna 37, and a radio wave is transmitted. FIG. 4 shows the body that receives radio waves from the probe and displays the film thickness measurement. The antenna 41 is connected to the demodulator 43 via the amplifier 42, and the signal modulated by the probe is demodulated (FM demodulation) here to become a known RS232C signal. The RS232C receiver 44 uses this signal as a bus signal, performs a predetermined calculation in the calculation circuit 45 according to an instruction from the calculation controller 47, and displays it on the display 46 as a measured value of the film thickness.

FIG. 5 shows a flow chart of the control performed in the arithmetic and control unit 47. When the ID is already stored in the built-in memory, the display 46 displays FE (indicating electromagnetic type) or NFE (non-electromagnetic type). Formula or high frequency formula)
Is displayed (step 51). Next, the corresponding constant for calculating the received data into the film thickness is selected (step 52). After determining whether the format of the received data is normal in determination step 53, it is determined in step 54 whether the ID added to the received data is the same as the stored ID value. If the values are the same, it is determined that the same measurement method is continuous, and the film thickness is calculated in step 55.
The measured film thickness value is displayed on the display 46. In step 57, the timer is started. If it is determined in step 58 that the next data has been normally received, it means that the previous measurement operation is still continuing, and the timer is restarted. When the normal reception of data is interrupted, it is interpreted that the probe is separated from the surface of the sample to be measured, and it is determined in step 59 whether the previous timer has passed a predetermined time (for example, 300 ms). After the lapse of this predetermined time, the probe is pressed against the surface of the next sample to be measured, and the reception of normal data is awaited in step 53. On the other hand, if it is different from the value of the ID stored in step 54, as shown in steps 61 to 63, it is FE (indicating an electromagnetic type) or N.
The display is switched to FE (non-electromagnetic type, that is, high frequency type), the constants are exchanged, the received ID is stored in the memory incorporated in the arithmetic controller 47, and the process jumps to step 57.

Now, the electromagnetic probe and the high frequency probe can be used not only as a pair with one main body but also as a pair with the other, so that it is necessary to distinguish a plurality of main bodies from each other. There is. The value corresponding to the channel number 15 printed on the sticker affixed on the main body of FIG. 1 is also stored in the internal memory of the arithmetic controller 47 of FIG.
Display 4 automatically when the power switch of the main unit is turned on
By displaying in 6, the operator can be alerted not to mix up a plurality of main bodies.
Printing on the sticker may be worn out, or it may be an effective operational measure for the wireless film thickness meter in which the main body and the probe are separated.

[Brief description of drawings]

FIG. 1 is a diagram showing a film thickness measuring circuit body according to the present invention.

FIG. 2 shows a probe according to the present invention.

FIG. 3 is a diagram showing a circuit block inside a probe according to the present invention.

FIG. 4 is a diagram showing a circuit block inside a film thickness measuring circuit body according to the present invention.

FIG. 5 is a diagram showing measurement method switching performed in the film thickness measuring circuit body according to the present invention.

[Explanation of symbols]

 11 measurement circuit body 12 keyboard 13 display unit 14 reception antenna 21 probe 22 battery box 24 measurement unit 37 transmission antenna 45 arithmetic circuit 46 indicator 47 arithmetic controller

Claims (3)

[Claims] 1. A method of changing a film thickness measuring condition in a wireless film thickness meter main body for measuring a film thickness on a metal, which is used as a pair with a probe corresponding to each of a plurality of measuring methods. A first step of storing measurement method data indicating a different one of the measurement methods in a memory, a second step of comparing the measurement method data received together with the film thickness data from the probe with the measurement method data stored in the memory, A method of changing film thickness measurement conditions, comprising the step of switching the measurement method data stored in the memory when the measurement method data is different in the second step. 2. The method of changing the film thickness measurement condition according to claim 1, wherein the step of displaying the normally received received film thickness data, until a series of data received immediately after the displaying step is not normal. The method for changing film thickness measurement conditions, further comprising a step of waiting. 3. The method for changing the film thickness measurement condition according to claim 1, further comprising the step of displaying identification information stored in the main body for identifying the main body in response to power-on of the main body. The method for changing a film thickness measurement condition, comprising: