JPH08292231A - Ic test board apparatus - Google Patents

Abstract

PURPOSE: To provide an IC test board apparatus whereby a male connector disposed in a test board and a female connector disposed in a test board are correctly registered and, the test boards cannot be attached/detached while the female connector is in a closed state. CONSTITUTION: A positional relation of test boards 1 and 2 is ensured by guide holes 13a, 13b and guide pins 23a, 23b. While a contact element of a female connector 21 is in a closed state, tapered pins 24-27 are moved below a hole 23c of the test board 1, and blocks 14-17 of the test board 1 are obstructed by the tapered pins 24-27, whereby the test board 1 cannot be coupled with the test board 2.

Description

Detailed Description of the Invention

[0001]

FIELD OF THE INVENTION The present invention relates to an IC for testing an IC.
It is for a test board device. In particular, when testing a wide variety of ICs, prepare an upper test board with a specific type of IC socket for each type of product, and use only one lower test board to combine the upper test board and the lower test board. It relates to an IC test board device to be tested.

[0002]

2. Description of the Related Art In a conventional IC test board device, an upper test board and a lower test board are connected by a printed board connector. Since there are many arrays of connectors for connection,
A large driving force is required for insertion and removal. Further, since repeated repeated insertion and removal may damage the connector, the upper test board is divided into several blocks, and each block is detached from the lower test board.

From the above-mentioned background, in recent years, a connector having a small insertion / removal force has been developed. For example, if an LS10 connector (hereinafter referred to as a male connector) and an LS20 connector (hereinafter referred to as a female connector) manufactured by Japan Aviation Electronics Industry Co., Ltd. are used, the insertion / removal force can be reduced.

The above-mentioned female connector is provided with an opening / closing lever. By moving the opening / closing lever, the contactor of the female connector is opened / closed to make contact or non-contact with the contact of the male connector. If a male connector is attached to the upper test board, a female connector is attached to the lower test board, and a mechanism for collectively moving the opening / closing lever is adopted, the upper test board and the lower test board can be easily attached and detached.

[0005]

In the IC test board device using the above-mentioned connector, if the upper test board and the lower test board are not fitted properly, electrical connection failure may occur. Also, with the female connector closed,
Inserting the upper test board has the problem of damaging the contacts.

According to the present invention, the male connectors are arranged on the first test board, the female connectors are arranged on the second test board, the male connector and the female connector are accurately aligned, and the first test is performed. An object is to provide an IC test board device in which the first test board and the second test board cannot be attached / detached when the female connector is opened and the female connector is closed when the board and the second test board are attached / detached. And

[0007]

In order to achieve this object, the present invention is a substrate 1 in which a plurality of male connectors 11 are arranged vertically and horizontally on the same plane and which holds the male connectors 11 group.
2, the guide holes 13a and 13b are formed at a constant distance, and the blocks 14 and 15 of the set and the blocks 16 and 17 of the set are attached to the lower surface of the substrate 12, and the blocks 14 and 15 of the set are attached.
Coaxial guide holes 14a and 15a are formed in each of the groups, and coaxial guide holes 16a and 17a are formed in each of the blocks 16 and 17 of the set, and each of the male connectors 11 is formed above the male connector 11 group. Test board 1 having a plurality of IC sockets 18 electrically connected to it
And a plurality of female connectors 21 are arranged on the same plane as the male connectors 11 in the same arrangement. Each of the female connectors 21 has an opening / closing lever 21a. When the opening / closing lever 21a is moved, the contactor is opened / closed to open the male connector. Board 22 that holds the female connector 21 group by connecting or disconnecting to and from 11.
The first and the guide pins 23a and 23b guided by the guide holes 13a and 13b are projectingly provided on the board 22 to form holes 23c into and out of which the blocks 14 and 15 of the set and the blocks 16 and 17 of the set are inserted and removed. Tapered pin 2 fitted in each of the guide holes 14a and 15a and the guide holes 16a and 17a
4 and 25 and a movable board 28 to which the taper pins 26 and 27 are attached are movably held under the board 22 in parallel with the board 22, and a test board 2 having a clamp 29 for moving the movable frame 28 is provided. Is inserted into the test board 2 and the lever 29a of the clamp 29 is rotated by a first angle in the first rotation direction, the test board 1 and the test board 2 are brought into a coupled state, and the lever 29a of the clamp 29 is rotated.
Is rotated in the first rotation direction by a second angle larger than the first angle, the movable frame 28 moves the L-shaped plate 31 in the first direction, and the L-shaped plate 31 moves in the female connector 21. The open / close levers 21a are collectively moved to move the male connector 1
When the first group and the female connector 21 group are brought into the connected state and the lever 29a of the clamp 29 is returned by the first angle in the second rotation direction opposite to the first rotation direction, the L-shaped shape is connected to the movable frame 28. The plate 32 moves the L-shaped plate 31 in a second direction opposite to the first direction to move the male connector 11 group and the female connector 2 together.
When the first group is disconnected and the lever 29a of the clamp 29 is further rotated in the second rotation direction, the test board 1 and the test board 2 are disconnected.

[0008]

According to the above-described structure, the guide holes 13a and 13b of the test board 1 are provided when the clamp 29 is not rotated.
The guide pins 23a and 23b of the test board 2 are guided to, and the male connector 11 group and the female connector 21 group are correctly aligned.

When the clamp 29 is rotated in the first rotation direction by the first angle, the guide holes 14a.1 of the test board 1 are rotated.
The taper pins 24 and 25 and the taper pins 26 and 27 of the test board 2 are inserted in the 5a and the guide holes 16a and 17a, and the test board 1 and the test board 2 are connected.

When the clamp 29 is rotated by the second angle larger than the first angle in the first rotation direction, the movable frame 28 becomes L.
The L-shaped plate 31 is moved so that the L-shaped plate 31 is moved to the female connector 21.
The respective open / close levers 21a are collectively moved to bring the male connector 11 group and the female connector 21 group into the connected state.

The clamp 29 is moved to the second direction opposite to the first rotation direction.
When it is returned by the first angle in the rotation direction, the L-shaped plate 32 connected to the movable frame 28 moves the L-shaped plate 31 to the second direction opposite to the first direction.
The male connector 11 group and the female connector 21
Put the group in a disconnected state.

When the clamp 29 is further rotated in the second rotation direction to be in the initial state, the guide hole 14a of the test board 1
・ From the 15a and the guide holes 16a and 17a, the taper pins 24 and 25 and the taper pins 26 and 27 of the test board 2
Are separated from each other and the test board 1 and the test board 2 are separated.

In the state where the clamp 29 is rotated by the first angle in the first rotation direction, the hole 23c of the test board 2 is
Taper pins 24 and 25 and taper pins 26 and 27 below
Are moving, and block 14 of the set of test board 1
Blocks 16 and 17 in a pair with 15 are the tapered pins 24.
~ 27, and test board 1 to test board 2
Can not be combined with.

[0014]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the structure of an IC test board device according to the present invention will be described with reference to the embodiments of FIGS. Reference numeral 1 in FIG. 1 is a first test board which is an upper test board, and 2 is a second test board which is a lower test board. FIG. 1 shows a state in which the test board 1 and the test board 2 are connected.

FIG. 2 is a block diagram of the test board 1. 2, 11 is a male connector, 12 is a board, 13 is a guide, 1
4 to 17 are blocks, and 18 is an IC socket.

In FIG. 2, a frame 12a is erected on the substrate 12. A plurality of rectangular printed circuit boards 18a are attached to the upper surface of the frame 12a. A plurality of I's are formed on the upper surface of the printed circuit board 18a.
The C socket 18 is mounted. The support 18b is attached to the lower surface of the printed board 18a. The printed board 11a is attached to the end of the column 18b, and the male connector 11 is mounted on the printed board 11a. The male connector 11 and the IC socket 18 are electrically connected by the coaxial wire 18c.

In the embodiment shown in FIG. 2, eight printed circuit boards 18a are arranged, and each printed circuit board 18a has a printed circuit board 11a.
Attach a one to one. Two connectors 11 are mounted on each printed circuit board 11a. In FIG. 2, a plurality of male connectors 11 are vertically and horizontally arranged on the same plane, and the male connector 11 group is located on a window 12 b formed in the substrate 12.

Blocks 13 are attached to both ends of a substrate 12 holding a group of male connectors 11, and guide holes 13a and 13b are formed in the two blocks 13 at a constant distance. The blocks 14 and 15 of the set and the blocks 16 and 17 of the set are attached to the lower surface of the substrate 12,
The guide holes 14a and 15a which are coaxial with each other are formed, and the guide holes 16a and 17a which are coaxial with each of the blocks 16 and 17 of the set are formed.

FIG. 3 is a block diagram of the test board 2. In FIG. 3, 21 is a female connector, 22 is a board, 24-27 are tapered pins, 28 is a movable frame, 29 is a clamp, and 31 and 32.
Is an L-shaped plate.

In FIG. 3, a plurality of female connectors 21 are connected to the substrate 2
1b, and the plurality of substrates 21b are fixed to the upper surface of the substrate 22. The female connector group 21 of FIG. 3 is the male connector 1 of FIG.
Arrange them in the same plane as the first group. Female connector 2
The first group is connected to the printed circuit board 41 attached to the reinforcing frame 42 by the coaxial line 21e.

Each of the female connectors 21 has an opening / closing lever 2
When the opening / closing lever 21a having the position 1a is moved, the contactor is opened / closed to connect or disconnect with the contact of the male connector 11. The group of the opening / closing levers 21a is collectively moved by the L-shaped plate 31.

Guide pins 23a, which are guided by the guide holes 13a, 13b, in the substrate 22 holding the female connector 21 group.
23b is projected. Test board 1 on both sides of substrate 22
The four holes 23c for the blocks 14 to 17 to enter and exit are formed.

A movable frame 28 is arranged below the substrate 22 so as to surround the group of female connectors 21. Inside the movable frame 28, four blocks 21c are attached so as to project from the lower surface of the substrate 22. Bearings 21d are held in the respective blocks 21c in an opposite manner.

Slotted grooves for guiding the bearing 21d and moving the movable frame 28 in parallel with the substrate 22 are formed in both side frames 28a and 28b of the movable frame 28 facing the bearing 21d. Substrate 2
When the clamp 29 is attached to the end of 2 and the lever 29a of the clamp 29 is rotated, the movable frame 28 is moved.

The first set of taper pins 24 and 25 and the second set of taper pins 26 and 27 are attached to the outer sides of the both side frames 28a and 28b of the movable frame 28 so as to be opposite to each other. The taper pin 24 and the taper pin 25 of FIG. 3 are coaxial, and the taper pin 26 and the taper pin 27 are coaxial.

Guide holes 14a, 15a of the test board 1
Are fitted with the taper pins 24, 25, and the guide holes 16a, 17a of the test board 1 are fitted with the taper pins 26, 27.

Next, the operation of the present invention will be described with reference to the state change diagrams of FIGS. Figure 4 shows guide holes 13a and 13
The guide pins 23a and 23b are guided to b, the male connector 11 group and the female connector 21 group are aligned, and the test board 1 and the test board 2 are joined together.

As shown in the sectional view of FIG. 4A, the front frame 28c of the movable frame 28 is connected to the first end of the L-shaped plate 32. A second end of the L-shaped plate 32 opposite to the first end is bent upward. One end of the L-shaped plate 31 is bent downward, and one end of the L-shaped plate 31 is brought into contact with the second end of the L-shaped plate 32 in a drawn manner. In the state of FIG. 4A, the contacts of the female connector 21 group are in the open state.

FIG. 4A shows the blocks 14 to 14 of the test board 1.
17 shows the positional relationship between 17 and the taper pins 24 to 27 of the test board 2. In FIG. 4A, the taper pins 24 to 27 attached to the movable frame 28 are connected to the guide holes 14 a to 17.
Waiting to enter a.

From the state shown in FIG. 4, the lever 2 of the clamp 29 is
When 9a is rotated in the first rotation direction by the first angle, FIG.
It becomes the state of.

In FIG. 5A, the movable frame 28 is moved so that the inner side wall of the front frame 28c is in contact with the bending of the L-shaped plate 31. On the other hand, as shown in FIG.
.About.27 enter the guide holes 14a to 17a, the test board 1 is drawn to the test board 2, and the test board 1 and the test board 2 are brought into a coupled state.

From the state shown in FIG. 5, the lever 2 of the clamp 29 is
When 9a is rotated in the first rotation direction by the second angle larger than the first angle, the state shown in FIG. 6 is obtained.

In FIG. 6A, the front frame 28c moves the L-shaped plate 31 in the first direction. The L-shaped plate 31 is the female connector 2
The respective open / close levers 21a of No. 1 are collectively moved to bring the male connector 11 group and the female connector 21 group into the connected state.

In FIG. 6A, the taper pins 24 to 27 are shown in FIG.
Although it has moved further from the state of B, the connection state of the test board 1 and the test board 2 remains unchanged. In the state shown in FIG. 6, the IC can be tested.

From the state shown in FIG. 6, the lever 2 of the clamp 29 is
When 9a is returned by the first angle in the second rotation direction opposite to the first rotation direction, the state shown in FIG. 7 is obtained.

In FIG. 7A, the L-shaped plate 32 connected to the movable frame 28 moves the L-shaped plate 31 in the second direction opposite to the first direction. In FIG. 7A, the female connectors 21 are in the closed state, but when the L-shaped plate 31 is further moved, the L-shaped plate 31 is moved.
Opens the open / close levers 21a of the female connector group 21 together to bring the male connector group 11 and the female connector group 21 into a non-connected state.

In the state of FIG. 7A, the taper pins 24-2
7 is not completely separated from the guide holes 14a to 17a.
From the state of FIG. 7B, move the lever 29a of the clamp 29 to the second position.
4A, the open / close lever 21a is opened, the test board 1 and the test board 2 are uncoupled, and the test board 1 can be detached from the test board 2.

FIG. 8 is an external view of an IC test board device according to the present invention. As shown in FIG. 8, the IC test board device composed of the test board 1 and the test board 2 is fixed on the test station 3 and electrically connected thereto. The test station 3 is installed on the trolley 4, and although not shown in the figure, the cable 5
Is connected to the IC tester.

In the IC test board device according to the present invention, as connectors, connectors made by Japan Aviation Electronics Co., Ltd. are used for the male connector 11 and the female connector 21, and the clamp 29 is a push / pull clamp NO. FM150
It was used. However, the present invention is not limited to this embodiment. The present invention can be realized if the connector and the clamp have the same functions as those of the embodiment.

[0040]

According to the present invention, male connectors are arranged on the first test board, female connectors are arranged on the second test board, and the first test board and the second test board have guide holes and guide pins. The positional relationship can be confirmed with.

When the contact of the female connector is closed,
The taper pin is moved under the hole of the second test board, and the block of the first test board is blocked by the taper pin so that the first test board cannot be coupled to the second test board. Therefore, damage to the connector due to careless operation can be prevented.

[Brief description of drawings]

FIG. 1 is a configuration diagram of an embodiment of an IC test board device according to the present invention.

FIG. 2 is a configuration diagram of an embodiment of a first test board according to the present invention.

FIG. 3 is a configuration diagram of an embodiment of a second test board according to the present invention.

FIG. 4 is a state diagram in which the test board 1 and the test board 2 are aligned.

5 is a state change diagram of FIG. 4. FIG.

FIG. 6 is a state change diagram of FIG.

FIG. 7 is a state change diagram of FIG.

FIG. 8 is an external view of an IC test board device according to the present invention.

[Explanation of symbols]

 1 Test Board 2 Test Board 11 Male Connector 12 Board 13 Block 13a Guide Hole 13b Guide Hole 14 Block 14a Guide Hole 15 Block 15a Guide Hole 16 Block 16a Guide Hole 17 Block 17a Guide Hole 18 IC Socket 21 Female Connector 21a Open / Close Lever 22 Board 23a guide pin 23b guide pin 23c hole 24 taper pin 25 taper pin 26 taper pin 27 taper pin 28 movable frame 29 clamp 29a lever 31 L-shaped plate 32 L-shaped plate

Claims (1)

[Claims] 1. A plurality of male connectors (11) are arranged vertically and horizontally on the same plane, and a first guide hole (13a) is formed at a constant distance in a first board (12) holding the male connector (11) group. ) And the second guide hole (13b) are formed, and the first set of blocks (14) and (15) and the second set of blocks (16) and (17) are formed on the lower surface of the first substrate (12). )
, And form the third guide holes (14a) and (15a) that are coaxial with each of the blocks (14) and (15) of the first set,
Fourth guide holes (16a) and (17a) which are coaxial with each other are formed in the blocks (16) and (17) of the second set, and the male connector (11) is provided on the male connector (11) group. ) And a first test board (1) on which a plurality of IC sockets (18) electrically connected to each other are arranged, and a plurality of female connectors (21) in the same arrangement as the male connector (11) group and on the same plane. Each of the female connectors (21) has an opening / closing lever (21a), and when the opening / closing lever (21a) is moved, the contactor is opened and closed to connect or disconnect with the male connector (11). (21) Second substrate holding the group (2
In 2), the first and second guide pins (23a) and (23b) guided by the first guide hole (13a) and the second guide hole (13b) are projectingly provided, and the second substrate (22 ) Is formed with a hole (23c) through which the first set of blocks (14) and (15) and the second set of blocks (16) and (17) come in and out, and the third guide hole (14a) and ( Movable frame for attaching the first taper pin (24) / (25) and the second taper pin (26) / (27) which are fitted respectively in 15a) and the fourth guide hole (16a) / (17a) Second substrate (22) with (28) below second substrate (22)
And a second test board (2) having a clamp (29) that holds the movable frame (28) in parallel with the first test board (1) and the second test board (2). 2) and rotate the lever (29a) of the clamp (29) in the first rotation direction by the first angle, the first test board (1) and the second test board (2) are in the connected state. Then, when the lever (29a) of the clamp (29) is rotated in the first rotation direction by the second angle larger than the first angle, the movable frame (28) moves the first L-shaped plate (31). The first L-shaped plate (31) is moved in the first direction, and the opening / closing levers (21a) of the female connectors (21) are collectively moved to move the male connector (11) group and the female connector. (21) When the group is connected and the lever (29a) of the clamp (29) is returned by the first angle in the second rotation direction opposite to the first rotation direction, the first frame connected to the movable frame (28). The second L-shaped plate (32) is the first L-shaped plate (31) is moved in a second direction opposite the first direction with the male connector (11)
Group and the female connector (21) group are not connected, and the lever (29a) of the clamp (29) is further rotated in the second rotation direction, the first test board (1) and the second test board ( 2) An IC test board device characterized by being in a non-bonded state.