JPH08213272A - Screening method of lamination ceramic capacitor - Google Patents
Screening method of lamination ceramic capacitorInfo
- Publication number
- JPH08213272A JPH08213272A JP7017963A JP1796395A JPH08213272A JP H08213272 A JPH08213272 A JP H08213272A JP 7017963 A JP7017963 A JP 7017963A JP 1796395 A JP1796395 A JP 1796395A JP H08213272 A JPH08213272 A JP H08213272A
- Authority
- JP
- Japan
- Prior art keywords
- ceramic capacitor
- voltage
- insulation resistance
- exceeding
- monolithic ceramic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は絶縁抵抗の信頼性を保証
するための積層セラミックコンデンサのスクリーニング
方法に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for screening a laminated ceramic capacitor for ensuring the reliability of insulation resistance.
【０００２】[0002]
【従来の技術】従来積層セラミックコンデンサの絶縁抵
抗の信頼性を保証するためのスクリーニング方法として
は、定格電圧を超える直流電圧を積層セラミックコンデ
ンサに印加し、誘電体の欠陥部分を破壊させ、絶縁抵抗
が劣化したものを取り除く耐圧試験法や、直流電圧を印
加したのち、一定時間後の絶縁抵抗を測定し基準値まで
達しないものを取り除く絶縁抵抗測定試験法などがあっ
た。このようなスクリーニング方法で、コンデンサの絶
縁抵抗の信頼性を保証していた。2. Description of the Related Art As a screening method for ensuring the reliability of the insulation resistance of a conventional monolithic ceramic capacitor, a DC voltage exceeding the rated voltage is applied to the monolithic ceramic capacitor to destroy the defective portion of the dielectric, and the insulation resistance There was a withstand voltage test method to remove the deteriorated product, and an insulation resistance measurement test method to remove the product that did not reach the reference value after measuring the insulation resistance after applying a DC voltage. With such a screening method, the reliability of the insulation resistance of the capacitor is guaranteed.
【０００３】[0003]
【発明が解決しようとする課題】しかしながら、電子部
品のよりいっそうの絶縁抵抗の信頼性向上が求められて
いる中、このような従来のスクリーニング方法で良品判
定した積層セラミックコンデンサに、高温多湿の環境下
で定格電圧を超える電圧を印加し、加速的信頼性試験を
行った場合、長時間経過後に絶縁抵抗が劣化するものが
発生するという問題点があった。本発明は上記従来の問
題点を解決するもので、絶縁抵抗が信頼性試験後も劣化
する事なく、長寿命で高信頼性をもつ積層セラミックコ
ンデンサを提供することを目的とするものである。However, in order to further improve the reliability of the insulation resistance of electronic parts, a multilayer ceramic capacitor judged as a non-defective product by such a conventional screening method is used in a high temperature and high humidity environment. When a voltage exceeding the rated voltage is applied below and an accelerated reliability test is performed, there is a problem that some insulation resistance deteriorates after a long time has passed. The present invention solves the above-mentioned conventional problems, and an object of the present invention is to provide a monolithic ceramic capacitor having a long life and high reliability without causing insulation resistance to deteriorate even after a reliability test.
【０００４】[0004]
【課題を解決するための手段】この目的を達成するため
に本発明は、積層セラミックコンデンサに定格電圧を超
える直流電圧を印加し、その時に流れる漏洩電流を連続
的にモニターし、その漏洩電流の瞬間ピークを検出し、
この瞬間ピークの値がある一定の値を超えたものを除去
するものである。In order to achieve this object, the present invention applies a DC voltage exceeding a rated voltage to a monolithic ceramic capacitor, continuously monitors the leakage current flowing at that time, and monitors the leakage current. Detect the instantaneous peak,
This instantaneous peak value is removed if it exceeds a certain value.
【０００５】[0005]
【作用】上記方法によると、積層セラミックコンデンサ
の対向する電極間の誘電体に欠陥部が存在する場合、直
流電圧を印加すると、その欠陥部に瞬間的に放電現象が
発生し、より多くの漏洩電流が流れ、それが瞬間ピーク
となって現れる。その瞬間ピークが現れたコンデンサを
信頼性試験すると絶縁抵抗が劣化する。According to the above method, when a defective portion exists in the dielectric between the electrodes facing each other of the monolithic ceramic capacitor, when a DC voltage is applied, a discharge phenomenon occurs instantaneously in the defective portion, and more leakage occurs. An electric current flows, which appears as an instantaneous peak. Insulation resistance deteriorates when a reliability test is performed on a capacitor in which an instantaneous peak appears.
【０００６】このようなことから、上記方法によると、
絶縁抵抗が劣化することなく、高寿命で高信頼性を有す
るコンデンサを提供することができる。From the above, according to the above method,
It is possible to provide a capacitor having long life and high reliability without deterioration of insulation resistance.
【０００７】[0007]
【実施例】以下、本発明の一実施例を図面を参照して詳
述する。図２は良品の積層セラミックコンデンサに、定
格電圧（５０Ｖ）を超える直流電圧（定格電圧の６倍）
を印加した時に流れる漏洩電流を、連続的にモニターし
た波形図で、図１はその波形に瞬間ピークが発生した時
の波形図である。図１の瞬間ピーク値を｜ΔＩ｜２１で
表し、｜ΔＩ｜２１の絶対値を（表１）に示すように区
分けする。DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described in detail below with reference to the drawings. Figure 2 shows a non-defective monolithic ceramic capacitor with a DC voltage exceeding the rated voltage (50V) (6 times the rated voltage).
FIG. 1 is a waveform diagram in which a leakage current flowing when a voltage is applied is continuously monitored, and FIG. 1 is a waveform diagram when an instantaneous peak occurs in the waveform. The instantaneous peak value in FIG. 1 is represented by | ΔI | 21, and the absolute value of | ΔI | 21 is classified as shown in (Table 1).
【０００８】[0008]
【表１】 [Table 1]
【０００９】各区分けに該当する積層セラミックコンデ
ンサを、各１００ヶずつ選別し、初期の絶縁抵抗を測定
した後、信頼性試験を１０００時間実施する。更に信頼
性試験後の絶縁抵抗を測定し、初期値と比較する。ここ
で、信頼性試験とは耐湿負荷試験のことで、８５℃、８
５Ｒｈ％で定格電圧の４倍の電圧を印加して行った。The multilayer ceramic capacitors corresponding to each classification are selected 100 each, and after measuring the initial insulation resistance, a reliability test is carried out for 1000 hours. Furthermore, the insulation resistance after the reliability test is measured and compared with the initial value. Here, the reliability test is a humidity resistance load test, which is performed at 85 ° C, 8
A voltage four times the rated voltage was applied at 5 Rh%.
【００１０】尚絶縁抵抗の良否判定は１０10Ωをもって
行い、１０10Ω以上を良品とし１０ 10Ω未満を不良品と
する。Incidentally, the quality of the insulation resistance is judged 10TenWith Ω
Done 10Ten10 or more is regarded as a good product TenLess than Ω is defective
I do.
【００１１】（表１）によると、区分けNo.１は初期値
で絶縁抵抗の劣化品が既に含まれている。更に信頼性試
験１０００時間後では全数が劣化していた。また区分け
No.２は、初期値の絶縁抵抗が全て良品であったが、信
頼性試験後は劣化するものがあった。しかし区分けNo.
３は、初期値と信頼性試験後の絶縁抵抗は、全て良品で
劣化品は無かった。According to (Table 1), the classification No. 1 is an initial value and already contains a product having deteriorated insulation resistance. Further, after 1000 hours of the reliability test, all of them were deteriorated. Also divide
In No. 2, all of the initial values of insulation resistance were good products, but some deteriorated after the reliability test. However, the classification No.
In No. 3, the initial value and the insulation resistance after the reliability test were all good and there were no deteriorated products.
【００１２】従って本実施例においては｜ΔＩ｜の範囲
を｜ΔＩ｜＜１０μＡで選別した場合、積層セラミック
コンデンサは信頼性試験１０００時間後でも劣化するこ
とはない。Therefore, in this embodiment, when the range of | ΔI | is selected with | ΔI | <10 μA, the laminated ceramic capacitor does not deteriorate even after 1000 hours of reliability test.
【００１３】即ち長寿命で、高信頼性の絶縁抵抗を保証
することが可能となる。また図４は積層セラミックコン
デンサに定格電圧５０を超える直流電圧（定格電圧×６
倍）を印加した時の電極間電圧を、連続的にモニターし
た波形図で、図３はその波形に瞬間ピークが発生した時
の波形図である。図３の瞬間ピーク値を｜ΔＶ｜４１で
表し、｜ΔＶ｜４１の絶対値を（表２）に示すように区
分けする。That is, it is possible to guarantee a highly reliable insulation resistance with a long life. In addition, Fig. 4 shows a DC voltage (rated voltage x 6
Voltage) is continuously monitored, and FIG. 3 is a waveform when an instantaneous peak occurs in the waveform. The instantaneous peak value in FIG. 3 is represented by | ΔV | 41, and the absolute value of | ΔV | 41 is classified as shown in (Table 2).
【００１４】[0014]
【表２】 [Table 2]
【００１５】各区分けに該当する積層セラミックコンデ
ンサを、各１００ヶずつ選別し、初期の絶縁抵抗を測定
した後、信頼性試験を１０００時間実施する。信頼性試
験は上記のとおり行う。更に信頼性試験後の絶縁抵抗を
測定し、初期値と比較する。100 monolithic ceramic capacitors corresponding to each category are selected, the initial insulation resistance is measured, and a reliability test is carried out for 1000 hours. The reliability test is performed as described above. Furthermore, the insulation resistance after the reliability test is measured and compared with the initial value.
【００１６】それによると、区分けNo.１は初期値で絶
縁抵抗の劣化品が既に含まれている。更に信頼性試験１
０００時間後では全てが劣化していた。また区分けNo.
２は、初期値の絶縁抵抗が全て良品であったが、信頼性
試験後は劣化するものがあった。しかし区分けNo.３
は、初期値と信頼性試験後の絶縁抵抗は、全て良品で劣
化品は無かった。According to this, the classification No. 1 is an initial value and already contains a product having deteriorated insulation resistance. Further reliability test 1
After 000 hours, everything had deteriorated. In addition, classification No.
In No. 2, the insulation resistance of the initial value was all good, but some deteriorated after the reliability test. However, classification No. 3
The initial values and the insulation resistance after the reliability test were all good and there was no deterioration.
【００１７】従って本実施例においては｜ΔＶ｜の範囲
を｜ΔＶ｜＜５Ｖで選別した場合、積層セラミックコン
デンサは信頼性試験１０００時間後でも劣化することは
ない。Therefore, in this embodiment, when the range of | ΔV | is selected with | ΔV | <5V, the laminated ceramic capacitor does not deteriorate even after 1000 hours of reliability test.
【００１８】即ち長寿命で、高信頼性の絶縁抵抗を保証
することが可能となる。なお、本発明は上記実施例に限
定されず、その要旨を変更しない範囲内で印加電圧と｜
ΔＩ｜と｜ΔＶ｜の値を変更実施可能である。That is, it is possible to guarantee a highly reliable insulation resistance with a long service life. It should be noted that the present invention is not limited to the above-mentioned embodiment, and the applied voltage and |
It is possible to change the values of ΔI | and | ΔV |.
【００１９】[0019]
【発明の効果】以上、本発明によれば、信頼性試験でも
絶縁抵抗が劣化せず、長寿命で高信頼性をもつコンデン
サを提供することができる。As described above, according to the present invention, it is possible to provide a capacitor having a long life and high reliability without deterioration of insulation resistance even in a reliability test.
【図１】積層セラミックコンデンサに定格電圧を超える
直流電流を印加した時に流れる漏洩電流の瞬間ピークの
発生した波形図FIG. 1 is a waveform diagram showing an instantaneous peak of leakage current flowing when a direct current exceeding a rated voltage is applied to a monolithic ceramic capacitor.
【図２】良品の積層セラミックコンデンサに、定格電圧
を超える直流電圧を印加した時に流れる漏洩電流の波形
図[Figure 2] Waveform diagram of leakage current that flows when a DC voltage exceeding the rated voltage is applied to a good quality monolithic ceramic capacitor
【図３】積層セラミックコンデンサに定格電圧を超える
直流電圧を印加した時に流れる電極間電圧の瞬間ピーク
の発生した波形図FIG. 3 is a waveform diagram showing an instantaneous peak of the inter-electrode voltage that flows when a DC voltage exceeding the rated voltage is applied to the multilayer ceramic capacitor.
【図４】良品の積層セラミックコンデンサに定格電圧を
超える直流電圧を印加した時に流れる電極間電圧の波形
図[Fig. 4] Waveform diagram of inter-electrode voltage that flows when a DC voltage exceeding the rated voltage is applied to a good quality monolithic ceramic capacitor
２１ ｜ΔＩ｜ ４１ ｜ΔＶ｜ 21 | ΔI | 41 | ΔV |
Claims (2)
を超える直流電圧を印加し、この時に流れる漏洩電流を
連続的にモニターし、この漏洩電流の瞬間ピークを検出
し、この瞬間ピークがある一定の値を超えたものを除去
する積層セラミックコンデンサのスクリーニング方法。1. A monolithic ceramic capacitor is applied with a DC voltage exceeding the rated voltage, the leakage current flowing at this time is continuously monitored, the instantaneous peak of this leakage current is detected, and this instantaneous peak has a constant value. A method for screening a monolithic ceramic capacitor that removes those exceeding the above.
を超える直流電圧を印加し、この時の前記積層セラミッ
クコンデンサの電極間電圧を連続的にモニターし、この
電極間電圧の瞬間ピークを検出し、この瞬間ピークがあ
る一定の値を超えたものを除去する積層セラミックコン
デンサのスクリーニング方法。2. A monolithic ceramic capacitor is applied with a DC voltage exceeding a rated voltage, the interelectrode voltage of the monolithic ceramic capacitor at this time is continuously monitored, and an instantaneous peak of the interelectrode voltage is detected. A screening method for a monolithic ceramic capacitor, which removes an instantaneous peak exceeding a certain value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7017963A JPH08213272A (en) | 1995-02-06 | 1995-02-06 | Screening method of lamination ceramic capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7017963A JPH08213272A (en) | 1995-02-06 | 1995-02-06 | Screening method of lamination ceramic capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH08213272A true JPH08213272A (en) | 1996-08-20 |
Family
ID=11958406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7017963A Pending JPH08213272A (en) | 1995-02-06 | 1995-02-06 | Screening method of lamination ceramic capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH08213272A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000046820A1 (en) * | 1999-02-04 | 2000-08-10 | Matsushita Electric Industrial Co., Ltd. | Method of screening laminated ceramic capacitor |
-
1995
- 1995-02-06 JP JP7017963A patent/JPH08213272A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000046820A1 (en) * | 1999-02-04 | 2000-08-10 | Matsushita Electric Industrial Co., Ltd. | Method of screening laminated ceramic capacitor |
| US6437579B1 (en) | 1999-02-04 | 2002-08-20 | Matsushita Electric Industrial Co., Ltd. | Screening method for a multi-layered ceramic capacitor |
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