JPH0820735B2 - Photosensitive resin composition - Google Patents

Photosensitive resin composition

Info

Publication number
JPH0820735B2
JPH0820735B2 JP62211563A JP21156387A JPH0820735B2 JP H0820735 B2 JPH0820735 B2 JP H0820735B2 JP 62211563 A JP62211563 A JP 62211563A JP 21156387 A JP21156387 A JP 21156387A JP H0820735 B2 JPH0820735 B2 JP H0820735B2
Authority
JP
Japan
Prior art keywords
weight
parts
photosensitive resin
resin composition
compound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62211563A
Other languages
Japanese (ja)
Other versions
JPS6455551A (en
Inventor
庸司 田中
日出夫 中崎
寛己 古林
賢治 神尾
和隆 正岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko Materials Co Ltd
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP62211563A priority Critical patent/JPH0820735B2/en
Publication of JPS6455551A publication Critical patent/JPS6455551A/en
Publication of JPH0820735B2 publication Critical patent/JPH0820735B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/027Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
    • G03F7/028Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with photosensitivity-increasing substances, e.g. photoinitiators
    • G03F7/029Inorganic compounds; Onium compounds; Organic compounds having hetero atoms other than oxygen, nitrogen or sulfur
    • G03F7/0295Photolytic halogen compounds

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は感光性樹脂組成物,更に詳しくは印刷配線板
の製造,金属の精密加工等に用いられるエツチングレジ
スト又はめつきレジストとして,特に優れた密着性と作
業性又は高感度を有する感光性樹脂組成物に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention is particularly excellent as a photosensitive resin composition, more specifically, as an etching resist or a plating resist used in the production of printed wiring boards, precision processing of metals and the like. And a photosensitive resin composition having excellent adhesion and workability or high sensitivity.

(従来の技術) 印刷配線板の製造,金属の精密加工等の分野におい
て,エツチング,めつき等の基材の化学的,電気的手法
を用いる際にレジスト材料として感光性樹脂組成物及び
これを用いた感光性エレメントを使用することが知られ
ている。感光性エレメントとしては支持体上に感光性樹
脂組成物を積層したものが広く使用されている。
(Prior Art) In the fields of printed wiring board manufacturing, precision processing of metals, etc., a photosensitive resin composition and a photosensitive resin composition are used as a resist material when a chemical or electrical method of a substrate such as etching or plating is used. It is known to use the photosensitive elements used. As the photosensitive element, one in which a photosensitive resin composition is laminated on a support is widely used.

従来,印刷配線板の製造法には,テンテイング法とめ
つき法という二つの方法がある。テンテイング法は,チ
ツプ搭載のための銅スルーホールをレジストで保護し,
エツチング,レジストはくりを経て,電気回路形成を行
なうのに対し,めつき法は,電気めつきによつてスルー
ホールに銅を析出させ,半田めつきで保護し,レジスト
はくり,エツチングによつて電気回路の形成を行なう方
法である。
Conventionally, there are two methods of manufacturing a printed wiring board, a tenting method and a plating method. The tenting method protects the copper through holes for chip mounting with resist,
The electric circuit is formed through etching and resist peeling, whereas the plating method uses electrical plating to deposit copper in the through holes and protects it with soldering. This is a method of forming an electric circuit.

テンテイング法は,めつき法と比較すると脱脂,基板
洗浄,酸洗浄,活性化などの諸工程がなく,強酸性或い
は強塩基性の水溶液にレジストが直接接触しないため,
プリント基板の製造上,不必要なトラブルが避けられ,
かつ工程が単純になるので工業上,有用である。
Compared with the plating method, the tenting method does not have various steps such as degreasing, substrate cleaning, acid cleaning, and activation, and the resist does not come into direct contact with a strongly acidic or strongly basic aqueous solution.
Unnecessary troubles can be avoided in the manufacture of printed circuit boards,
In addition, the process is simple, which is industrially useful.

テンテイング法によつて電気回路の形成を行なう場
合,感光性樹脂組成物に要求される特性は,現像液や水
洗のスプレ圧に耐えうる充分な膜強度を有すること,エ
ツチングの際,所望ののライン幅を得るのに良好なレジ
ストの形状となること,はくりの際のはくり片が微細で
あること等である。
When an electric circuit is formed by a tenting method, the photosensitive resin composition is required to have a sufficient film strength to withstand the spray pressure of a developing solution or washing, and to have a desired film strength during etching. The resist shape is good for obtaining the line width, and the peeling pieces at the time of peeling are fine.

通常はくりは,自動はくり機にて行なわれるが,はく
り片が大きいと,はくり機のロールにはくり片が絡まり
著しく作業性を低下させるのみならず,はくり片が清浄
な基板上に再付着する可能性もあるため,はくり片は,
微細であることが望ましい。また,レジスト形状はレジ
ストと銅面との界面部分のレジスト壁に空洞がなくレジ
ストが垂直であることがライン精度の点から望ましい。
レジスト形状が台形であれば,解像度の点で高解像度化
に支障をきたし,逆台形であれば銅面との接触面積が相
対的に小さくなり,エツチング時のレジストの密着性を
低下させることになる。
Normally, the peeling is performed by an automatic peeling machine. However, if the peeling piece is large, the roll of the peeling machine will be entangled with the peeling piece and the workability will be significantly deteriorated. The peeling piece is
Fineness is desirable. In addition, it is desirable that the resist shape is vertical and there is no cavity in the resist wall at the interface between the resist and the copper surface, from the viewpoint of line accuracy.
If the resist shape is trapezoidal, it will be difficult to achieve high resolution in terms of resolution, and if it is an inverted trapezoidal shape, the contact area with the copper surface will be relatively small and the adhesion of the resist during etching will be reduced. Become.

特にアルカリ現像形感光性樹脂組成物の場合,はくり
片の大きさは感光性樹脂組成物に用いるフイルム性付与
ポリマの組成或いは分子量によつて決定される。即ち,
分子量が小さければ小さい程はくり片は小さくなり,組
成の親水性が高い程はくり片が小さくなる。
Particularly in the case of an alkali-developable photosensitive resin composition, the size of the peeling piece is determined by the composition or molecular weight of the film-imparting polymer used in the photosensitive resin composition. That is,
The smaller the molecular weight, the smaller the flakes, and the more hydrophilic the composition, the smaller the flakes.

一方,レジストの形状は,組成の親水性が高い程悪く
なり,親水性が高すぎる場合には,レジストのサイドウ
オールに空洞が見られるようになる。良好なレジスト形
状を持ち,はくり片が微細となる感光性樹脂物は,未だ
供給されておらず,良好なレジスト形状は有しているが
はくり片が大きいものが多く,はくり片がロールに絡み
ついた場合には1日に数度ロールから,はくり片を除去
しながら作業するのが現状である。
On the other hand, the shape of the resist becomes worse as the hydrophilicity of the composition becomes higher, and if the hydrophilicity is too high, cavities will be seen in the sidewalls of the resist. A photosensitive resin material having a good resist shape and a fine peeling piece has not been supplied yet, and although it has a good resist shape, there are many large peeling pieces. If the roll is entangled, it is the current practice to remove the strips from the roll several times a day.

(発明が解決しようとする問題点) 本発明者らは,上記の欠点を解消すべく研究を重ねた
結果,なされたもので,良好なレジストの形状を有し,
はくりの際にはくり片が微細となる感光性樹脂組成物を
提供するにある。
(Problems to be Solved by the Invention) As a result of repeated studies to solve the above-mentioned drawbacks, the present inventors have made a good resist shape,
Another object of the present invention is to provide a photosensitive resin composition in which the strips become fine during stripping.

(問題点を解決するための手段) 本発明は, (A)メタクリル酸20〜40重量%,スチレン5〜30重量
%及び一般式(I)で表わされる単量体30〜75重量%を
共重合成分として得られる重量平均分子量10,000〜50,0
00のアルカリ可溶なビニル系共重合化合物(a)とメタ
クリル酸20〜40重量%及び一般式(I)で表わされる単
量体60〜80重量%を共重合成分として得られる重量平均
分子量60,000〜150,000のアルカリ可溶なビニル系共重
合化合物(b)を含むフイルム性付与ポリマを40〜80重
量部 (R1は水素原子またはメチル基を意味し,R2は炭素数1
〜12のアルキル基を意味する) (B)エチレン性不飽和化合物を20〜60重量部(ただし
(A)と(B)の総和を100重量部とする) (C)有機ハロゲン化合物を(A)と(B)の総和100
重量部に対して0.2〜10重量部 (D)活性線により遊離ラジカルを生成しうる増感剤及
び/又は増感剤系を(A)と(B)の総和100重量部に
対して0.5〜10重量部含有してなる感光性樹脂組成物に
関する。
(Means for Solving Problems) The present invention provides (A) 20 to 40% by weight of methacrylic acid, 5 to 30% by weight of styrene, and 30 to 75% by weight of a monomer represented by the general formula (I). Weight average molecular weight obtained as a polymerization component 10,000 to 50,0
Alkali-soluble vinyl copolymer compound (a) of 00, 20 to 40% by weight of methacrylic acid and 60 to 80% by weight of the monomer represented by the general formula (I) as a copolymerization component are obtained. 40 to 80 parts by weight of a film-forming polymer containing 150,000 alkali-soluble vinyl copolymer compound (b) (R 1 means hydrogen atom or methyl group, R 2 has 1 carbon atom
(B) an ethylenically unsaturated compound in an amount of 20 to 60 parts by weight (however, the sum of (A) and (B) is 100 parts by weight) (C) an organic halogen compound (A). ) And (B) total 100
0.2 to 10 parts by weight with respect to parts by weight (D) A sensitizer and / or a sensitizer system capable of generating free radicals by actinic rays is 0.5 to 100 parts by weight with respect to 100 parts by weight of the total of (A) and (B). The present invention relates to a photosensitive resin composition containing 10 parts by weight.

本発明において,アルカリ可溶なビニル系共重合化合
物(a),(b)の重量平均分子量及びその共重合成分
の割合は,ポリマのガラス転移点,耐水性および組成物
の現像可能性の点から上記の範囲に制限される。アルカ
リ可溶なビニル系共重合化合物(a)とビニル系共重合
化合物(b)の重量比,(a)/(b)が10/90〜90/10
の範囲とすることが好ましい。
In the present invention, the weight average molecular weights of the alkali-soluble vinyl copolymer compounds (a) and (b) and the ratio of the copolymerization components are such that the glass transition point of the polymer, the water resistance and the developability of the composition. To the above range. The weight ratio of the alkali-soluble vinyl copolymer compound (a) and the vinyl copolymer compound (b), (a) / (b) is 10/90 to 90/10.
It is preferable to set it as the range.

感光性樹脂組成物のフイルム性付与ポリマを二成分系
にすることによつて単一成分では得られなかつた特性を
得ることができる。即ち,ビニル系共重合化合物(a)
のみを用いた場合には,はくり片は小さいものが得られ
るがレジスト形状が悪く,特に,銅面との界面に空洞が
発生する。またビニル系共重合化合物(b)のみを用い
た場合にはレジスト形状は良好なものが得られるが,は
くり片が大きくなる。ビニル系共重合化合物(a)とビ
ニル系共重合化合物(b)を組合せて用いることによ
り,はくり片も小さく,自動はくり機のロールにはくり
片が絡みつく現像もなくレジスト形状も空洞がなく垂直
なものを得ることができる。
By making the film-imparting polymer of the photosensitive resin composition into a two-component system, it is possible to obtain properties that cannot be obtained by a single component. That is, the vinyl copolymer compound (a)
When only one is used, a small peeling piece can be obtained, but the resist shape is poor, and in particular, a cavity is generated at the interface with the copper surface. When only the vinyl-based copolymer compound (b) is used, a good resist shape can be obtained, but the peeling pieces become large. By using the vinyl-based copolymer compound (a) and the vinyl-based copolymer compound (b) in combination, the peeling pieces are small, and the rolls of the automatic peeling machine are not entangled with the developing pieces, and there is no resist shape or void. You can get a vertical one without.

式(I)で表わされる単量体は,アクリル酸のエステ
ルまたはメタクリル酸のエステルであり,例えばアクリ
ル酸メチル,アクリル酸エチル,アクリル酸イソプロピ
ル,アクリル酸n−ブチル,アクリル酸イソブチル,ア
クリル酸−2−エチルヘキシル,アクリル酸β−ヒドロ
キシエチル,アクリル酸ラウリル,アクリル酸N,N′−
ジメチルアミノエチル,メタクリル酸メチル,メタクリ
ル酸エチル,メタクリル酸イソプロピル,メタクリル酸
n−ブチル,メタクリル酸イソブチル,メタクリル酸β
−ヒドロキシエチル,メタクリル酸2−エチルヘキシ
ル,メタクリル酸ラウリル等がある。
The monomer represented by the formula (I) is an ester of acrylic acid or an ester of methacrylic acid, for example, methyl acrylate, ethyl acrylate, isopropyl acrylate, n-butyl acrylate, isobutyl acrylate, acrylic acid- 2-ethylhexyl, β-hydroxyethyl acrylate, lauryl acrylate, N, N′-acrylic acid
Dimethylaminoethyl, methyl methacrylate, ethyl methacrylate, isopropyl methacrylate, n-butyl methacrylate, isobutyl methacrylate, β-methacrylate
-Hydroxyethyl, 2-ethylhexyl methacrylate, lauryl methacrylate and the like.

本発明に用いられるエチレン性不飽和化合物として
は,感度が高いという点から,アクリレート単量体又は
メタクリレート単量体の使用が好ましい。例えばポリエ
チレングリコールジアクリレート(エチレン基の数が2
〜14),ポリエチレングリコールジメタクリレート(エ
チレン基の数が2〜14),β−フエノキシエトキシエチ
ルアクリレート,トリメチロールプロパントリアクリレ
ート,ペンタエリスリトールトリアクリレート,1,6−ヘ
キサンジオールジアクリレート,2,2−ビス(4−メタク
リロキシエトキシフエニル)プロパン,2,2−ビス(4−
アクリロキシエトキシフエニル)プロパン,ジペンタエ
リスリトールペンタアクリレート,トリメチロールプロ
パントリメタクリレート等の多価アルコールのポリアク
リレート又はポリメタクリレート,トリメチルプロパン
トリグリシジルエーテルのアクリル酸又はメタクリル酸
との付加物,ビスフエノールAアルキレングリコール系
のアクリル酸又はメタクリル酸付加物等のアクリレー
ト,無水フタル酸−ネオペンチルグリコール−アクリル
酸の1:1:2の縮合物等の低分子不飽和ポリエステル,ジ
イソシアネート,ジアルコールおよびヒドロキシアクリ
レートの付加物等のウレタン系アクリレート,ジイソシ
アネート,ジアルコールおよびヒドロキシメタクリレー
トの付加物等のウレタン系メタクリレートなどが挙げら
れる。特にはくり片を細分化するには,3官能以上のアク
リレートまたはメタクリレート,例えばトリメチロール
プロパントリアクリレートが好ましい。
As the ethylenically unsaturated compound used in the present invention, it is preferable to use an acrylate monomer or a methacrylate monomer from the viewpoint of high sensitivity. For example, polyethylene glycol diacrylate (the number of ethylene groups is 2
~ 14), polyethylene glycol dimethacrylate (the number of ethylene groups is 2-14), β-phenoxyethoxyethyl acrylate, trimethylolpropane triacrylate, pentaerythritol triacrylate, 1,6-hexanediol diacrylate, 2, 2-bis (4-methacryloxyethoxyphenyl) propane, 2,2-bis (4-
Polyacrylates or polymethacrylates of polyhydric alcohols such as acryloxyethoxyphenyl) propane, dipentaerythritol pentaacrylate, trimethylolpropane trimethacrylate, adducts of trimethylpropane triglycidyl ether with acrylic acid or methacrylic acid, bisphenol A Alkylene glycol-based acrylates such as acrylic acid or methacrylic acid adducts, low molecular weight unsaturated polyesters such as phthalic anhydride-neopentyl glycol-acrylic acid 1: 1: 2 condensates, diisocyanates, dialcohols and hydroxy acrylates Examples thereof include urethane acrylates such as adducts, urethane isocyanates such as diisocyanates, dialcohols and adducts of hydroxymethacrylate. In particular, trifunctional or higher functional acrylates or methacrylates such as trimethylolpropane triacrylate are preferable for subdividing the strips.

フイルム性付与ポリマ(A)とエチレン性不飽和化合
物(B)とは上記の重量範囲内で,総和が100重量部と
なる量で用いられる。フイルム性付与ポリマ(A)とエ
チレン性不飽和化合物(B)とは,組成物のレジンフロ
ー性およびエツジフエージヨンの点から上記の重量範囲
で用いられる。
The film-forming polymer (A) and the ethylenically unsaturated compound (B) are used in the above-mentioned weight ranges in an amount of 100 parts by weight in total. The film-forming polymer (A) and the ethylenically unsaturated compound (B) are used in the above weight range from the viewpoint of the resin flow property of the composition and the edge age.

有機ハロゲン化合物としては,活性光により容易にハ
ロゲンラジカルを遊離するもの又は連鎖移動により容易
にハロゲンラジカルを遊離するものが好ましい。
The organic halogen compound is preferably one that easily releases a halogen radical by active light or one that easily releases a halogen radical by chain transfer.

有機ハロゲン化合物の例としては,四塩化炭素,クロ
ロホルム,ブロモホルム,1,1,1−トリクロロエタン,臭
化メチレン,ヨウ化メチレン,塩化メチレン,四臭化炭
素,ヨードホルム,1,1,2,2−テトラブロモエタン,ペン
タブロモエタン,トリブロモアセトフエノン,ビス−
(トリブロモメチル)スルホン,トリブロモメチルフエ
ニルスルホン,塩化ビニル,塩素化オレフイン等が挙げ
られる。炭素−ハロゲン結合強度の弱い脂肪族ハロゲン
化合物,特に同一炭素上に2個以上のハロゲン原子が結
合している化合物とりわけ有機ブロム化合物が好まし
い。トリブロモメチル基を有する有機ハロゲン化合物が
一層好ましい結果をあたえる。有機ハロゲン化合物は,
イメージング付与剤あるいはラジカルソースとなるため
上記の重量範囲で使用される。
Examples of organic halogen compounds are carbon tetrachloride, chloroform, bromoform, 1,1,1-trichloroethane, methylene bromide, methylene iodide, methylene chloride, carbon tetrabromide, iodoform, 1,1,2,2- Tetrabromoethane, pentabromoethane, tribromoacetophenone, bis-
(Tribromomethyl) sulfone, tribromomethylphenyl sulfone, vinyl chloride, chlorinated olefin, and the like. An aliphatic halogen compound having a weak carbon-halogen bond strength, particularly a compound in which two or more halogen atoms are bonded on the same carbon, particularly an organic bromine compound is preferable. An organohalogen compound having a tribromomethyl group gives more preferable results. The organic halogen compound is
It is used in the above weight range because it serves as an imaging agent or a radical source.

また,本発明における活性線により遊離ラジカルを生
成しうる増感剤及び増感剤系についても何ら制限はな
く,従来知られているものを用いることができる。例え
ば,ベンゾフエノン,4,4′−ジメチルアミノベンゾフエ
ノン,4,4′−ジエチルアミノベンゾフエノン,4,4′−ジ
クロルベンゾフエノン等のベンゾフエノン類,2−エチル
アントラキノン,t−ブチルアントラキノン等のアントラ
キノン類,2−クロロチオキサントン,ベンゾインエチル
エーテル,ベンゾインイソプロピルエーテル,ベンジ
ル,2,4,5−トリアリールイミダゾール二量体(ロフイン
二量体)などの1種又は2種以上が用いられる。
Further, there is no limitation on the sensitizer and the sensitizer system which can generate a free radical by the actinic ray in the present invention, and conventionally known ones can be used. For example, benzophenones such as benzophenone, 4,4′-dimethylaminobenzophenone, 4,4′-diethylaminobenzophenone, 4,4′-dichlorobenzophenone, 2-ethylanthraquinone, t-butylanthraquinone, etc. Of anthraquinone, 2-chlorothioxanthone, benzoin ethyl ether, benzoin isopropyl ether, benzyl, 2,4,5-triarylimidazole dimer (lophin dimer), or two or more thereof are used.

感光性樹脂組成物の感度の点から,フイルム性付与ポ
リマの100重量部に対して,活性線により遊離ラジカル
を生じうる増感剤及び/又は増感剤系は0.5〜10重量部
の範囲で用いられる。
From the viewpoint of the sensitivity of the photosensitive resin composition, the sensitizer and / or the sensitizer system capable of generating free radicals by actinic radiation are added in an amount of 0.5 to 10 parts by weight per 100 parts by weight of the film-forming polymer. Used.

これらの材料の混合順序,混合法等については特に制
限はない。
There are no particular restrictions on the mixing order or mixing method of these materials.

なお,本発明になる感光性樹脂組成物には,染料,可
塑剤,顔料,難燃剤,安定剤等を必要に応じて添加する
こともできる。又,密着性付与剤を使用することも可能
である。
In addition, a dye, a plasticizer, a pigment, a flame retardant, a stabilizer and the like can be added to the photosensitive resin composition of the present invention as required. It is also possible to use an adhesion promoter.

(発明の効果) 本発明によつて,良好なレジストの形状を有し,はく
りの際にはくり片が微細となる感光性樹脂組成物を得る
ことができる。
(Effects of the Invention) According to the present invention, it is possible to obtain a photosensitive resin composition which has a good resist shape and has fine pieces when peeled.

(実施例) 本発明の実施例を説明する。(Example) An example of the present invention will be described.

実施例1 以下の手順によりフイルム性付与ポリマを合成した。Example 1 A film-imparting polymer was synthesized by the following procedure.

1−a ビニル系共重合化合物(a)の製造 メチルセロソルブ/トルエンの重量で3/2の混合物
(以下,混合物Aとする)120g,メタクリル酸メチル29.
8g,スチレン20g,アクリル酸エチル31.8g,メタクリル酸4
gを500mlのフラスコに入れ85℃に加温する。85℃で30分
間保温後メタクリル酸メチル40g,スチレン10.4g,アクリ
ル酸エチル14g,メタクリル酸50g,アゾビスイソブチロニ
トリル3.4gを混合物A76gに溶解した溶液を4時間でフラ
スコ内に滴下,反応させる。ついで混合物A14gを加え2
時間保温後アゾビスイソブチロニトリル0.1gを混合物A2
0gに溶解した溶液を加え更に2時間保温する。ついでハ
イドロキノン0.02gを混合物A10gに溶かしたものを加え
冷却しビニル系共重合化合物(a)の溶液を得た。
1-a Production of vinyl copolymer compound (a) 120% of a mixture of methyl cellosolve / toluene at a weight ratio of 3/2 (hereinafter referred to as mixture A), methyl methacrylate 29.
8g, styrene 20g, ethyl acrylate 31.8g, methacrylic acid 4
Add g to a 500 ml flask and heat to 85 ° C. After incubating at 85 ℃ for 30 minutes, a solution prepared by dissolving 40 g of methyl methacrylate, 10.4 g of styrene, 14 g of ethyl acrylate, 50 g of methacrylic acid and 3.4 g of azobisisobutyronitrile in mixture A76 g was dropped into the flask for 4 hours and reacted. Let Then add 14g of mixture A 2
After keeping the temperature for a while, mix 0.1 g of azobisisobutyronitrile A2
Add a solution dissolved in 0 g and keep warm for 2 hours. Next, a solution of 0.02 g of hydroquinone in 10 g of mixture A was added and cooled to obtain a solution of vinyl copolymer compound (a).

1−b ビニル系共重合化合物(b)の製造 メチルセロソルブ/トルエンの重量で3/2の混合物97.
6g(以下,混合物Bとする)にメタクリル酸0.4g,メタ
クリル酸メチル2.6g,メタクリル酸n−ブチル0.3g,アク
リル酸2−エチルヘキシル3.1gを500mlのフラスコに入
れ,85℃に加温する。85℃で1時間保温後,メタクリル
酸22.3g,メタクリル酸メチル48.6g,アクリル酸2−エチ
ルヘキシル17.3g,メタクリル酸n−ブチル5.2g,アゾビ
スイソブチロニトリル0.17gを混合物B37.7gに溶解した
溶液を4時間でフラスコ内に滴下反応させる。その後メ
チルセロソルブを9.0g加え,2時間保温後,メタクリル酸
0.2g,アゾビスイソブチロニトリル0.21gを混合物B5.9g
に溶かした溶液を加え,更に5時間保温する。
1-b Production of vinyl copolymer compound (b) Mixture of methylcellosolve / toluene 3/2 by weight 97.
To 6 g (hereinafter referred to as the mixture B), 0.4 g of methacrylic acid, 2.6 g of methyl methacrylate, 0.3 g of n-butyl methacrylate and 3.1 g of 2-ethylhexyl acrylate were placed in a 500 ml flask and heated to 85 ° C. After incubating at 85 ℃ for 1 hour, 22.3g of methacrylic acid, 48.6g of methyl methacrylate, 17.3g of 2-ethylhexyl acrylate, 5.2g of n-butyl methacrylate, 0.17g of azobisisobutyronitrile were dissolved in 37.7g of mixture B. The resulting solution is dropped into the flask for 4 hours for reaction. Then add 9.0 g of methyl cellosolve, keep it warm for 2 hours, and then add methacrylic acid.
A mixture of 0.2 g and azobisisobutyronitrile 0.21 g B5.9 g
Add the solution dissolved in and keep it warm for another 5 hours.

ついでハイドロキノン0.02gをメチルセロソルブ1.4g
に溶かしたものを加え冷却しビニル系共重合化合物
(b)の溶液を得た。
Then 0.02 g of hydroquinone and 1.4 g of methyl cellosolve
A solution of the vinyl-based copolymer compound (b) was obtained by adding a solution of the above-mentioned solution and cooling.

得られたビニル系共重合化合物(a),(b)の組成
を表1に,特性を表2に示した。
The composition of the obtained vinyl copolymer compounds (a) and (b) is shown in Table 1, and the characteristics are shown in Table 2.

1−c 感光性樹脂組成物の組成表3に示す配合で以下
の感光性樹脂組成物を配合した(V−1,V−2は比較例
として示す)。
1-c Composition of photosensitive resin composition The following photosensitive resin compositions were compounded in the composition shown in Table 3 (V-1 and V-2 are shown as comparative examples).

1−d 感光性エレメントの製造及び試験片の作成V−
1〜V−5の感光性樹脂組成物溶液を,厚み23μmを有
するポリエチレンテレフタレートフイルム(東レ(株)
製 ルミラー )に乾燥後膜厚が50μmとなるように塗
工乾燥し,厚み35μmのポリエチレンフイルムで被覆し
て感光性エレメントを得た。得られた感光性エレメント
からポリエチレンフイルムを剥離しながら,その感光層
面を,スコツチブライト バフロール(住友スリーM
製)により研磨・乾燥し清浄にされた銅張積層板(100m
m×200mm)の銅面上に日立高温ラミネーターを用いて連
続的に積層して試験片を得た。積層条件を表4に示す。
1-d Manufacturing of photosensitive element and preparation of test piece V-
1 to V-5 photosensitive resin composition solution with a thickness of 23 μm
Polyethylene terephthalate film (Toray Industries, Inc.)
Made lumirror ) To a film thickness of 50 μm after drying.
Work-dried and covered with a polyethylene film with a thickness of 35 μm
To obtain a photosensitive element. Obtained photosensitive element
While peeling the polyethylene film from the photosensitive layer
The surface is Scott Bright Buffroll (Sumitomo Three M
Copper-clad laminate (100m)
(m × 200 mm) copper surface with Hitachi high temperature laminator
The test pieces were obtained by successively stacking. Table 4 shows the lamination conditions.

1−e 感光性エレメントの特性1−dで得られた各試
片につき,次に示す試験を行ない結果を表7に示した。
1-e Each test piece obtained in the characteristic 1-d of the photosensitive element was subjected to the following test, and the results are shown in Table 7.

(1)感度試験 21段ステツプタブレツトをそなえたネガを通し,超高
圧水銀灯により80mJ/cm2で1−dで得られた試験片を露
光した。30分放置後ポリエチレンテレフタレートフイル
ムをはくりし,30℃の1%炭酸ソーダ水溶液で現像し,
ステツプタブレツトの硬化段数を読みとつた。
(1) Sensitivity test A test piece obtained at 1-d was exposed at 80 mJ / cm 2 with an ultra-high pressure mercury lamp through a negative having a 21-step step plate. After leaving for 30 minutes, peel off the polyethylene terephthalate film, develop with 1% sodium carbonate aqueous solution at 30 ° C,
The number of curing steps of the step plate was read.

(2)はくり性 1−dで得られた試験片を,21段ステツプタブレツト
で8段になるように露光後,1%炭酸ソーダ水溶液によつ
て現像した。現像条件を表5に示す。
(2) Peeling property The test piece obtained in 1-d was exposed in a 21-step stepper plate so as to have 8 steps, and then developed with a 1% sodium carbonate aqueous solution. Table 5 shows the developing conditions.

その後,50℃の3%NaOH水溶液で,レジストをはくり
し,はくり片の大きさと,はくり終了時間(秒)を測定
した。はくり片の大きさの評価基準を表6に示す。
Then, the resist was peeled off with a 3% NaOH aqueous solution at 50 ° C., and the peeling piece size and the peeling end time (second) were measured. Table 6 shows the evaluation criteria for the size of the peeled pieces.

(3)レジスト形状 1−dで得られた試験片を21段ステツプタブレツトで
8段になるように露光する。その後1%炭酸ソーダ水溶
液によつて現像し,SEM(走査型電子顕微鏡)で,レジス
トの形状を観察し,レジストのサイドウオール空洞がな
い場合○,ある場合×とした。
(3) Resist shape The test piece obtained in 1-d is exposed in a 21-step stepper plate so as to have 8 steps. After that, it was developed with a 1% sodium carbonate aqueous solution and the shape of the resist was observed by SEM (scanning electron microscope).

表7に明らかなように上記の共重合化合物(a)と
(b)とを組合せた系は,他に比較してはくり片が小さ
い上に良好なレジスト形状を有する。
As is apparent from Table 7, the system in which the above-mentioned copolymerization compounds (a) and (b) are combined has smaller peeling pieces as compared with other systems and has a good resist shape.

フロントページの続き (72)発明者 神尾 賢治 茨城県日立市東町4丁目13番1号 日立化 成工業株式会社山崎工場内 (72)発明者 正岡 和隆 茨城県日立市東町4丁目13番1号 日立化 成工業株式会社山崎工場内 (56)参考文献 特開 昭62−75633(JP,A) 特開 昭61−134756(JP,A) 特開 昭62−59946(JP,A) 特開 昭60−225841(JP,A) 特公 昭54−25957(JP,B2)Front page continued (72) Kenji Kamio 4-13-1 Higashimachi, Hitachi City, Ibaraki Prefecture Hitachi Chemical Co., Ltd. Yamazaki Plant (72) Inventor Kazutaka Masaoka 4-13-1 Higashimachi, Hitachi City, Ibaraki Prefecture Hitachi Chemical Co., Ltd. Yamazaki Plant (56) Reference JP 62-75633 (JP, A) JP 61-134756 (JP, A) JP 62-59946 (JP, A) JP 60-225841 (JP, A) JP-B-54-25957 (JP, B2)

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】(A)メタクリル酸20〜40重量%,スチレ
ン5〜30重量%及び一般式(I)で表わされる単量体30
〜75重量%を共重合成分として得られる重量平均分子量
10,000〜50,000のアルカリ可溶なビニル系共重合化合物
(a)とメタクリル酸20〜40重量%及び一般式(I)で
表わされる単量体60〜80重量%を共重合成分として得ら
れる重量平均分子量60,000〜150,000のアルカリ可溶な
ビニル系共重合化合物(b)を含むフイルム性付与ポリ
マを40〜80重量部 (R1は,水素原子またはメチル基を意味し,R2は,炭素
数1〜12のアルキル基を意味する) (B)エチレン性不飽和化合物を20〜60重量部(ただし
(A)と(B)の総和を100重量部とする) (C)有機ハロゲン化合物を(A)と(B)の総和100
重量部に対して0.2〜10重量部 (D)活性線により遊離ラジカルを生成しうる増感剤及
び/又は増感剤系を(A)と(B)の総和100重量部に
対して0.5〜10重量部含有してなる感光性樹脂組成物。
1. A) 20 to 40% by weight of methacrylic acid, 5 to 30% by weight of styrene, and 30 of the monomer represented by the general formula (I).
Weight average molecular weight obtained as a copolymerization component of ~ 75% by weight
A weight average of 10,000 to 50,000 alkali-soluble vinyl copolymer compound (a), 20 to 40% by weight of methacrylic acid and 60 to 80% by weight of the monomer represented by the general formula (I) as a copolymerization component. 40 to 80 parts by weight of a film-forming polymer containing an alkali-soluble vinyl copolymer compound (b) having a molecular weight of 60,000 to 150,000 (R 1 means a hydrogen atom or a methyl group, R 2 means an alkyl group having 1 to 12 carbon atoms) (B) 20 to 60 parts by weight of an ethylenically unsaturated compound (provided that (A) (The total amount of (B) is 100 parts by weight) (C) The total amount of organic halogen compounds (A) and (B) is 100.
0.2 to 10 parts by weight with respect to parts by weight (D) A sensitizer and / or a sensitizer system capable of generating free radicals by actinic rays is 0.5 to 100 parts by weight with respect to 100 parts by weight of the total of (A) and (B). A photosensitive resin composition containing 10 parts by weight.
【請求項2】ビニル系共重合化合物(a)とビニル系共
重合化合物(b)の重量比(a)/(b)を10/90〜90/
10とした特許請求の範囲第1項記載の感光性樹脂組成
物。
2. The weight ratio (a) / (b) of the vinyl copolymer compound (a) and the vinyl copolymer compound (b) is 10/90 to 90 /.
The photosensitive resin composition according to claim 1, which is 10.
【請求項3】有機ハロゲン化合物がトリブロモメチル基
を有する有機ハロゲン化合物である特許請求の範囲第1
項又は第2項記載の感光性樹脂組成物。
3. The organic halogen compound is an organic halogen compound having a tribromomethyl group.
Item or the photosensitive resin composition according to Item 2.
JP62211563A 1987-08-26 1987-08-26 Photosensitive resin composition Expired - Lifetime JPH0820735B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62211563A JPH0820735B2 (en) 1987-08-26 1987-08-26 Photosensitive resin composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62211563A JPH0820735B2 (en) 1987-08-26 1987-08-26 Photosensitive resin composition

Publications (2)

Publication Number Publication Date
JPS6455551A JPS6455551A (en) 1989-03-02
JPH0820735B2 true JPH0820735B2 (en) 1996-03-04

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Country Link
JP (1) JPH0820735B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3805706A1 (en) * 1988-02-24 1989-09-07 Hoechst Ag RADIATION POLYMERIZABLE MIXTURE AND RECORDING MATERIAL MANUFACTURED THEREFROM
JPH03160058A (en) * 1989-11-17 1991-07-10 Mitsubishi Rayon Co Ltd Crosslinkage-curable resin composition
US5228498A (en) * 1990-05-31 1993-07-20 Kabushiki Kaisha Kobe Seiko Sho Continuous casting equipment and continuous casting method
EP0547944B1 (en) * 1991-12-11 1999-06-30 Sony Corporation Disk cartridge loading mechanism for use in disk recording and/or reproducing device
JP2756623B2 (en) * 1992-02-26 1998-05-25 富士写真フイルム株式会社 Photopolymerizable composition
JP2769589B2 (en) * 1992-06-03 1998-06-25 日本合成化学工業株式会社 Photosensitive resin composition

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ZA757984B (en) * 1974-10-04 1976-12-29 Dynachem Corp Polymers for aqueous processed photoresists
JPS60225841A (en) * 1984-04-25 1985-11-11 Hitachi Chem Co Ltd Photosensitive resin composition
JPS6259946A (en) * 1985-09-10 1987-03-16 Hitachi Chem Co Ltd Photosensitive resin composition
JPS6275633A (en) * 1985-09-30 1987-04-07 Hitachi Chem Co Ltd Photosensitive resin composition

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