JPH08172136A - Mos inverter forming method - Google Patents

Mos inverter forming method

Info

Publication number
JPH08172136A
JPH08172136A JP7224611A JP22461195A JPH08172136A JP H08172136 A JPH08172136 A JP H08172136A JP 7224611 A JP7224611 A JP 7224611A JP 22461195 A JP22461195 A JP 22461195A JP H08172136 A JPH08172136 A JP H08172136A
Authority
JP
Japan
Prior art keywords
semiconductor layer
mos
mos inverters
inverters
inverter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7224611A
Other languages
Japanese (ja)
Other versions
JP3435417B2 (en
Inventor
Kokuriyou Kotobuki
国梁 寿
Kazunori Motohashi
本橋一則
Makoto Yamamoto
山本  誠
Sunao Takatori
直 高取
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yozan Inc
Sharp Corp
Original Assignee
Yozan Inc
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yozan Inc, Sharp Corp filed Critical Yozan Inc
Priority to JP22461195A priority Critical patent/JP3435417B2/en
Priority to EP95115447A priority patent/EP0709892B1/en
Priority to DE69525707T priority patent/DE69525707T2/en
Priority to EP00112801A priority patent/EP1045446A3/en
Publication of JPH08172136A publication Critical patent/JPH08172136A/en
Priority to US08/743,161 priority patent/US5811859A/en
Priority to US08/922,680 priority patent/US5917343A/en
Application granted granted Critical
Publication of JP3435417B2 publication Critical patent/JP3435417B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE: To minimize the delay in MOS inverters while securing a drive capacity by narrowing down a semiconductor layer between the MOS inverters in a region between the MOS inverters. CONSTITUTION: When providing a circuit where a plurality of stages of MOS inverters are connected in series within an LSI, semiconductor layers with the same polarity are commonly used for a plurality of MOS inverters to form the MOS inverters. In that case, the width of the semiconductor layers is narrowed down between the MOS inverters. For example, inverters I1 and I2 of an inverted amplifier INV consisting of three stages of MOS inverters I1-I3 are formed by common P-type semiconductor part PL1 and N-type semiconductor part NL1 and the L3 is formed by P-type semiconductor layer PL2 and N-type semiconductor layer NL2. Then, a narrow part S1 is provided at the semiconductor layer PL1 and a narrow part S3 is provided at the semiconductor layer NL1. Also, a narrow part S2 is provided at the semiconductor layer PL2 and a narrow part S4 is provided at the semiconductor layer NL2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はMOSインバータ形成方
法に係り、特に、複数段のMOSインバータを直列接続
した回路、例えば反転増幅器をLSI内に形成する際
の、MOSインバータ形成方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a MOS inverter, and more particularly to a method for forming a MOS inverter when a circuit in which a plurality of stages of MOS inverters are connected in series, for example, an inverting amplifier is formed in an LSI.

【0002】[0002]

【従来の技術】本発明の発明者等は特願平05−020
676号において、図2に示す乗算回路を提案してい
る。この乗算回路は、容量結合の重みによりアナログ入
力電圧に対してデジタル乗数を乗じたアナログ電圧を出
力し、この出力を2段階の反転増幅器INV1、INV
2あるいはINV3、INV2に入力し、その出力の安
定性と精度を確保している。これら反転増幅器は3段の
MOSインバータよりなり、その出力をフィードバック
キャパシタンスを介して入力に接続してなる。反転増幅
器は、MOSインバータのゲインを3重に掛けた大きな
オープンゲインにより出力の線形性と安定性を確保して
いる。
2. Description of the Related Art The inventors of the present invention have filed Japanese Patent Application No. 05-020.
No. 676 proposes the multiplication circuit shown in FIG. This multiplication circuit outputs an analog voltage obtained by multiplying the analog input voltage by a digital multiplier by the weight of capacitive coupling, and outputs this output as two-stage inverting amplifiers INV1 and INV.
2 or INV3, INV2 to ensure stability and accuracy of the output. These inverting amplifiers are composed of three-stage MOS inverters, the output of which is connected to the input via a feedback capacitance. The inverting amplifier secures the linearity and stability of the output by a large open gain obtained by multiplying the gain of the MOS inverter triple.

【0003】ここに反転増幅器のドライブ能力を高める
ためには充分な電流供給量が必要であるが、電流が大き
くなると一般に各トランジスタの寄生容量が増加し、回
路の遅延が大になるという問題があった。
Here, a sufficient amount of current supply is necessary to increase the drive capability of the inverting amplifier, but when the current becomes large, the parasitic capacitance of each transistor generally increases and the circuit delay becomes large. there were.

【0004】[0004]

【発明が解決しようとする課題】本発明はこのような従
来の問題点を解消すべく創案されたもので、ドライブ能
力を確保しつつMOSインバータの遅延を最小限に抑え
得るMOSインバータ形成方法を提供することを目的と
する。
SUMMARY OF THE INVENTION The present invention was devised to solve the above-mentioned conventional problems, and provides a method for forming a MOS inverter capable of minimizing the delay of the MOS inverter while ensuring the drive capability. The purpose is to provide.

【0005】[0005]

【課題を解決するための手段】本発明に係るMOSイン
バータ形成方法は、MOSインバータ間に渡る半導体層
をMOSインバータ間で絞るものである。
A method of forming a MOS inverter according to the present invention narrows a semiconductor layer extending between MOS inverters between MOS inverters.

【0006】[0006]

【作用】本発明によれば、MOSインバータ間の電流が
抑えられることによってトランジスタの寄生容量が減少
し、かつ最終段のMOSインバータの電流供給量を制限
しないので、ドライブ能力は保証される。
According to the present invention, since the current between the MOS inverters is suppressed, the parasitic capacitance of the transistor is reduced, and the current supply amount of the final stage MOS inverter is not limited, so that the drive capability is guaranteed.

【0007】[0007]

【実施例】次に本発明に係るMOSインバータ形成方法
の1実施例を図面に基づいて説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, one embodiment of a MOS inverter forming method according to the present invention will be described with reference to the drawings.

【0008】図1は、3段のMOSインバータI1、I
2、I3よりなる反転増幅器INVのLSIパターンを
示すものであり、インバータI1、I2は共通のP型半
導体部PL1、N型半導体部NL1を用いて形成され、
I3はP型半導体層PL2、N型半導体層NL2によっ
て形成されている。PL1、NL1にはコンタクト(半
導体層を貫通する金属部)C1、C2を介してドレイン
電圧Vdd、ソース電圧Vssが接続されている。一方
PL2、NL2はコンタクトC7、C8を介してドレイ
ン電圧Vdd、ソース電圧Vssが接続されている。
FIG. 1 shows a three-stage MOS inverter I1, I
2 shows an LSI pattern of an inverting amplifier INV composed of 2 and I3, wherein the inverters I1 and I2 are formed by using a common P-type semiconductor portion PL1 and N-type semiconductor portion NL1.
I3 is formed by the P-type semiconductor layer PL2 and the N-type semiconductor layer NL2. A drain voltage Vdd and a source voltage Vss are connected to PL1 and NL1 via contacts (metal portions penetrating the semiconductor layer) C1 and C2. On the other hand, PL2 and NL2 are connected to the drain voltage Vdd and the source voltage Vss via contacts C7 and C8.

【0009】半導体層PL1、NL1には第1段出力用
のコンタクトC3、C4、第2段出力用のコンタクトC
5、C6が設けられ、これらコンタクトに接続されたポ
リシリコン部PSを介して出力が後段に導かれている。
The semiconductor layers PL1 and NL1 have contacts C3 and C4 for the first-stage output and contacts C for the second-stage output.
5 and C6 are provided, and the output is led to the subsequent stage through the polysilicon portion PS connected to these contacts.

【0010】半導体層PL2、NL2には第3段出力用
のコンタクトC9、C10が設けられ、これらコンタク
トに接続されたポリシリコン部PSを介して出力が後段
に導かれている。
The semiconductor layers PL2, NL2 are provided with contacts C9, C10 for the third stage output, and the output is led to the latter stage through the polysilicon portion PS connected to these contacts.

【0011】半導体層PL1には、前記コンタクトC
1、C5の間の位置に狭窄部S1が設けられ、半導体層
NL1には、コンタクトC2、C6間の位置に狭窄部S
3が設けられている。また半導体層PL2には、コンタ
クトC7、C9間の位置に狭窄部S2が設けられ、半導
体層NL2には、コンタクトC8、C10間の位置に、
狭窄部S4が設けられている。
The contact C is formed on the semiconductor layer PL1.
The narrowed portion S1 is provided between the contacts C1 and C5, and the narrowed portion S1 is placed between the contacts C2 and C6 in the semiconductor layer NL1.
3 is provided. Further, the semiconductor layer PL2 is provided with a narrowed portion S2 at a position between the contacts C7 and C9, and the semiconductor layer NL2 is provided at a position between the contacts C8 and C10.
A narrowed portion S4 is provided.

【0012】これら狭窄部S1、S3はインバータI2
の出力電流を規制し、この電流減少によりI2を構成す
るトランジスタの寄生容量を減少している。インバータ
I2は寄生容量の減少により遅延が抑えられ、応答性が
高められる。ここに狭窄部の形成は一般に、狭チャンネ
ル効果による出力不安定や入力側寄生キャパシタンスの
増大を招くが2段目のインバータではこれらの悪影響が
少なくむしろ出力側寄生キャパシタンス減少による応答
性改良の効果が高い。一方狭窄部S2、S4は最終段の
インバータI3の出力電流を規制し、これによって節電
効果が得られる。ここに最終段インバータにおいても第
1段インバータと同様の悪影響が生じる可能性がある
が、節電効果、ドライブ能力のバランスを考慮して、狭
窄部の大きさ(絞りの度合)を決定すべきである。
These narrowed portions S1 and S3 are provided with an inverter I2
Output current is regulated, and this current reduction reduces the parasitic capacitance of the transistor forming I2. The delay of the inverter I2 is suppressed by the reduction of the parasitic capacitance, and the responsiveness is improved. The formation of the constricted portion generally causes the output instability and the increase of the parasitic capacitance on the input side due to the narrow channel effect. However, these adverse effects are less in the second stage inverter, and rather the effect of improving the responsiveness by reducing the parasitic capacitance on the output side is obtained. high. On the other hand, the narrowed portions S2 and S4 regulate the output current of the inverter I3 at the final stage, whereby a power saving effect is obtained. The final stage inverter may have the same adverse effect as the first stage inverter, but the size of the narrowed portion (the degree of the diaphragm) should be determined in consideration of the balance between the power saving effect and the drive capability. is there.

【0011】以上の実施例は3段インバータに関するも
のであったが、同一極性の半導体層を複数のMOSイン
バータに渡って共通に使用して複数段のMOSインバー
タを直列接続した回路をLSI内に設ける任意の構成に
適用し得る。
Although the above embodiments relate to a three-stage inverter, a circuit in which a plurality of stages of MOS inverters are connected in series is used in an LSI by commonly using semiconductor layers of the same polarity across a plurality of MOS inverters. It can be applied to any configuration provided.

【0012】[0012]

【発明の効果】前述のとおり、本発明に係るMOSイン
バータ形成方法は、MOSインバータ間に渡る半導体層
をMOSインバータ間で絞るので、MOSインバータ間
の電流が抑えられることによってトランジスタの寄生容
量が減少して応答性能が高められ、かつ最終段のMOS
インバータの電流供給量を制限しないので、ドライブ能
力は保証されるという優れた効果を有する。
As described above, in the method of forming a MOS inverter according to the present invention, since the semiconductor layer extending between the MOS inverters is narrowed between the MOS inverters, the current between the MOS inverters is suppressed and the parasitic capacitance of the transistor is reduced. Response performance is improved and the final stage MOS
Since the current supply amount of the inverter is not limited, it has an excellent effect that the drive capacity is guaranteed.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係るMOSインバータ形成方法の1実
施例を示す平面図である。
FIG. 1 is a plan view showing one embodiment of a method for forming a MOS inverter according to the present invention.

【図2】本発明を適用し得る回路例示す回路図である。FIG. 2 is a circuit diagram showing a circuit example to which the present invention can be applied.

【符号の説明】[Explanation of symbols]

INV...反転増幅器 I1、I2、I3...MOSインバータ PL...P層 NL...N層 C1、C2、C3、C4、C5、C6...コンタクト PS...ポリシリコン S1、S2、S3、S4...狭窄部 Vdd...ドレイン電圧 Vss...ソース電圧。 INV. . . Inverting amplifiers I1, I2, I3. . . MOS inverter PL. . . P layer NL. . . N layers C1, C2, C3, C4, C5, C6. . . Contact PS. . . Polysilicon S1, S2, S3, S4. . . Stenosis Vdd. . . Drain voltage Vss. . . Source voltage.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 山本 誠 東京都世田谷区北沢3−5−18 鷹山ビル 株式会社鷹山内 (72)発明者 高取 直 東京都世田谷区北沢3−5−18 鷹山ビル 株式会社鷹山内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Makoto Yamamoto 3-5-18 Kitazawa, Setagaya-ku, Tokyo Takayama Building Co., Ltd. (72) Inventor Nao Takatori 3-5-18 Kitazawa, Setagaya-ku, Tokyo Takayama Building Shares Company Takayamauchi

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 複数段のMOSインバータを直列接続
した回路をLSI内に設ける際に、同一極性の半導体層
を複数のMOSインバータに渡って共通に使用するMO
Sインバータ形成方法において、MOSインバータ間で
半導体層の幅を絞ることを特徴とするMOSインバータ
形成方法。
1. When a circuit in which a plurality of stages of MOS inverters are connected in series is provided in an LSI, a semiconductor layer having the same polarity is commonly used over a plurality of MOS inverters.
A method of forming an S inverter, wherein a width of a semiconductor layer is narrowed between MOS inverters.
【請求項2】 回路は、入出力をフィードバックキャ
パシタンスを介して接続した反転増幅器であることを特
徴とする請求項1記載のMOSインバータ形成方法。
2. The method for forming a MOS inverter according to claim 1, wherein the circuit is an inverting amplifier whose input and output are connected via a feedback capacitance.
JP22461195A 1994-09-30 1995-08-09 MOS inverter Expired - Fee Related JP3435417B2 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP22461195A JP3435417B2 (en) 1994-09-30 1995-08-09 MOS inverter
EP95115447A EP0709892B1 (en) 1994-09-30 1995-09-29 MOS inverter circuit
DE69525707T DE69525707T2 (en) 1994-09-30 1995-09-29 MOS inverter circuit
EP00112801A EP1045446A3 (en) 1994-09-30 1995-09-29 MOS invertor having a constricted channel width
US08/743,161 US5811859A (en) 1994-09-30 1996-11-04 MOS inverter forming method
US08/922,680 US5917343A (en) 1994-09-30 1997-09-03 MOS inverter circuit

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6-261633 1994-09-30
JP26163394 1994-09-30
JP22461195A JP3435417B2 (en) 1994-09-30 1995-08-09 MOS inverter

Publications (2)

Publication Number Publication Date
JPH08172136A true JPH08172136A (en) 1996-07-02
JP3435417B2 JP3435417B2 (en) 2003-08-11

Family

ID=26526151

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22461195A Expired - Fee Related JP3435417B2 (en) 1994-09-30 1995-08-09 MOS inverter

Country Status (1)

Country Link
JP (1) JP3435417B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010087884A1 (en) * 2009-01-27 2010-08-05 Synopsys, Inc. Boosting transistor performance with non-rectangular channels

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010087884A1 (en) * 2009-01-27 2010-08-05 Synopsys, Inc. Boosting transistor performance with non-rectangular channels
CN102365740A (en) * 2009-01-27 2012-02-29 新思科技有限公司 Boosting transistor performance with non-rectangular channels
US8701054B2 (en) 2009-01-27 2014-04-15 Synopsys, Inc. Boosting transistor performance with non-rectangular channels
US8869078B2 (en) 2009-01-27 2014-10-21 Synopsys, Inc. Boosting transistor performance with non-rectangular channels

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Publication number Publication date
JP3435417B2 (en) 2003-08-11

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