JPH08166340A - Apparatus for testing separation of wiring of substrate - Google Patents

Apparatus for testing separation of wiring of substrate

Info

Publication number
JPH08166340A
JPH08166340A JP33139494A JP33139494A JPH08166340A JP H08166340 A JPH08166340 A JP H08166340A JP 33139494 A JP33139494 A JP 33139494A JP 33139494 A JP33139494 A JP 33139494A JP H08166340 A JPH08166340 A JP H08166340A
Authority
JP
Japan
Prior art keywords
tape
substrate
board
adhesive tape
metal fitting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33139494A
Other languages
Japanese (ja)
Other versions
JP2646196B2 (en
Inventor
Hitoshi Saito
仁 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP33139494A priority Critical patent/JP2646196B2/en
Publication of JPH08166340A publication Critical patent/JPH08166340A/en
Application granted granted Critical
Publication of JP2646196B2 publication Critical patent/JP2646196B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE: To semiautomatically and speedily inspect by a simple tester without occupying space, by moving an adhesive tape supplied onto an IC substrate in a lateral direction while pressing the tape by means of a press roller, attaching the tape onto the substrate and then moving upward thereby to separate the tape. CONSTITUTION: An IC substrate is inserted from a lower part of a press plate 4 at an upper surface 3a of a main body of the tester. At a metal fitting 11 having a pressing means built therein and moved right and left by a guide rail 12 and a moving means 13, a press roller 21 is pressed by the pressing means, so that an adhesive tape 28 is bonded to the surface of the IC substrate. A tape-attaching metal fitting 9 is set to a substrate metal fitting 10 to be movable up and down. When the press roller 21 is finished to move, the metal fitting 9 is raised by the action of a limit switch and also the adhesive tape fixedly held by the press roller 21 and pressing means is moved upward eventually to be separated from the surface of the IC substrate. The adhesive tape 28 of a wound tape 15 wound around the metal fitting 9 is taken out via rollers 19, 20, 22, 23, 24 and rolled up around a tape wind reel 16.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、IC基板上に配線され
たプリント配線またはメッキ配線が良好であるか否かを
検査する基板配線剥離試験機に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a board wiring peeling tester for inspecting whether printed wiring or plated wiring provided on an IC substrate is good.

【0002】[0002]

【従来の技術】従来は人手によりIC基板配線上に接着
テ−プを張り、再度人手により張ったテ−プを剥し、I
C基板配線の剥離状況を肉眼により検査していた。この
ため、検査する人により強く接着テ−プを張る人または
弱く接着テ−プを張る人がおり個人差によるバラツキが
あるばかりでなく、検査能率も悪くその改善が望まれて
いた。
2. Description of the Related Art Conventionally, an adhesive tape is manually stretched on an IC substrate wiring, and the tape stretched manually is peeled again.
The peeling state of the C-substrate wiring was visually inspected. For this reason, some inspectors apply stronger adhesive tapes or weaker adhesive tapes, and there are variations due to individual differences, and the inspection efficiency is poor, and improvement thereof has been desired.

【0003】[0003]

【発明が解決しようとする課題】本発明は上記課題、即
ち個人差によるバラツキをなくし、常に一定圧力でIC
基板配線上にテ−プを張り、一定の力で接着テ−プを剥
離することができ、しかも検査能率を飛躍的に向上し検
査コストを低減するためには基板配線剥離試験機の自動
化が必要である。更に一台の試験機で種々の輪郭形状の
ものを容易に検査できるようにすることも必要である。
SUMMARY OF THE INVENTION The present invention eliminates the above-mentioned problem, that is, the variation due to individual differences, and keeps IC at a constant pressure.
A tape can be put on the board wiring and the adhesive tape can be peeled off with a certain force. In addition, in order to dramatically improve the inspection efficiency and reduce the inspection cost, it is necessary to automate the board wiring peeling tester. is necessary. Further, it is also necessary to be able to easily inspect various contour shapes with one testing machine.

【0004】本発明は、以上の事情に鑑みて発明された
ものであり、場所を取らずしかも簡単な試験機で半自動
的に、かつスピーディに検査することができ、個人差に
よるバラツキをなくし、検査コストの低減を図ることが
できる基板配線剥離試験機を提供することを目的とす
る。
The present invention has been invented in view of the above circumstances, and it is possible to perform a semi-automatic and speedy inspection with a simple tester that does not take up a lot of space, and eliminates variations due to individual differences. An object of the present invention is to provide a substrate wiring peeling tester capable of reducing inspection cost.

【0005】[0005]

【課題を解決するための手段】本発明は、以上の目的を
達成するために、次のような構成を有することを特徴と
する。すなわち、本発明のIC基板剥離試験機は、IC
基板の挿入位置を規制するIC基板当て板と、IC基板
を押える加圧板と、IC基板上に接着テ−プを供給し且
つ左右および上下に移動可能なテ−プ取付金具と、IC
基板上に供給された接着テ−プを押圧しながら横方向へ
移動することにより前記接着テ−プをIC基板上に張り
付け、且つ上下に移動することができる加圧ロ−ラ−
と、前記テ−プ取付金具が上方へ移動することによりI
C基板から剥離した接着テ−プを巻取ることができるテ
−プ巻取リ−ルとを備えていることを特徴とする。ま
た、本発明の第2は、IC基板当て板がハンドルにより
前後に移動可能であり、且つ加圧板がIC基板を押圧
後、IC基板当て板を後方へ移動する移動手段を備えて
いることを特徴とする。また、本発明の第3は、テ−プ
取付金具が、ガイドレ−ルおよび移動手段により左右に
移動可能な基盤金具に、上下方向ガイドレ−ルおよび移
動手段を介して上下方向移動可能に取付けられ、前記テ
−プ取付金具が上方へ移動する際にはテ−プ取付金具に
備えられた加圧手段により接着テ−プがロ−ラ−との間
に挟まれて固定されることにより、IC基板上に接着し
ている接着テ−プを剥離することを特徴とする。また、
本発明の第4は、加圧ロ−ラ−が、ガイドレ−ルおよび
移動手段により左右に移動可能な加圧手段内蔵金具に、
上下動可能に取付けられていることを特徴とする。更
に、本発明の第5は、テ−プ巻取リ−ルが一方向クラッ
チ付きであることを特徴とする。
SUMMARY OF THE INVENTION The present invention is characterized by having the following configuration in order to achieve the above object. That is, the IC substrate peeling tester of the present invention comprises an IC
An IC board backing plate for regulating the insertion position of the board, a pressing plate for pressing the IC board, a tape mounting bracket for supplying an adhesive tape on the IC board and capable of moving left and right and up and down;
A pressure roller capable of adhering the adhesive tape on the IC substrate and moving it up and down by moving the adhesive tape supplied on the substrate in the lateral direction while pressing the adhesive tape.
When the tape mounting bracket moves upward, I
And a tape winding reel capable of winding the adhesive tape separated from the C substrate. A second aspect of the present invention is that the IC board backing plate is movable back and forth by a handle, and that the pressing plate is provided with a moving means for moving the IC board backing plate backward after pressing the IC board. Features. A third aspect of the present invention is that a tape mounting bracket is mounted on a base bracket movable left and right by a guide rail and a moving means so as to be vertically movable through a vertical guide rail and a moving means. When the tape mounting bracket moves upward, the adhesive tape is sandwiched and fixed between the roller and the roller by the pressing means provided on the tape mounting bracket. It is characterized in that the adhesive tape adhered on the IC substrate is peeled off. Also,
A fourth aspect of the present invention is that a pressure roller has a metal fitting with built-in pressure means that can be moved left and right by a guide rail and a moving means.
It is characterized in that it is mounted so that it can move up and down. A fifth feature of the present invention is that the tape winding reel has a one-way clutch.

【0006】[0006]

【作用】本発明においては、検査員はIC基板を本発明
のIC基板配線剥離試験機の所定の位置に挿入した後
は、本発明のIC基板配線剥離試験機が自動的に作動
し、IC基板上にプリント配線またはメッキ配線された
配線上に接着テ−プを接着し剥離するので、検査員はそ
のIC基板を取出しIC基板配線の剥離状態を肉眼検査
するだけで良い。検査員がIC基板配線剥離試験機前面
の床上のペダルスイッチを足で踏むことにより運転が開
始される。運転が開始されると、先ず、(1) 基板当て板
が、移動手段により所定の位置まで前進する。そこで、
(2) 検査員がIC基板を、IC基板上に配線された面を
上にして本体上面上に載置し、IC基板当て板に当接す
るまで挿入する。(3) IC基板当て板下部には光センサ
−が設けられており、IC基板がIC基板当て板に当接
するのを確認すると、(4) 加圧板がフレ−ムの加圧手段
内蔵部の加圧手段により降下し、IC基板を押圧する。
押圧するとリミットスイッチ(図示せず)が作動し、
(5) IC基板当て板が移動手段により所定の位置まで後
退する。後退するとリミットスイッチ(図示せず)が作
動し、(6) 左端に移動して待機していたテ−プ取付金具
が右端まで移動し、接着テ−プをIC基板上面直上に施
設する。施設するとリミットスイッチ(図示せず)が作
動し、(7) 左端に移動して待機していた加圧手段内蔵金
具の加圧手段により加圧ロ−ラ−が所定圧力で接着テ−
プをIC基板上に押圧すると共に、加圧手段内蔵金具が
ガイドレ−ルおよび移動手段により右端まで移動するの
に伴い、加圧ロ−ラ−も接着テ−プ上を押圧しながら移
動して接着テ−プをIC基板面に接着する。加圧手段内
蔵金具が右端に到達すると、リミットスイッチ(図示せ
ず)が作動し、(8) 加圧手段内蔵金具を前記移動手段に
より今度は左端まで移動するのに伴い、加圧ロ−ラ−も
接着テ−プを再度押圧しながら移動する。加圧手段内蔵
金具が左端に到達すると、リミットスイッチ(図示せ
ず)が作動して加圧ロ−ラ−を上方へ移動させ当初の位
置に戻る。当初の位置に戻るとリミットスイッチ(図示
せず)が作動し、(9) テ−プ取付金具下端の加圧手段が
作動して、接着テ−プをロ−ラ−との間に挟み固定す
る。固定するとリミットスイッチ(図示せず)が作動
し、基盤金具に設けられた移動手段が作動しテ−プ取付
金具を上方へ引上げる。テ−プ取付金具が上方へ引上げ
られることにより、ロ−ラ−と前記加圧手段により挟み
固定された接着テ−プも上方へ引上げられIC基板面よ
り剥される。IC基板面より接着テ−プを剥離するため
には、前記移動手段単独でも良いが、接着テ−プの接着
力が可なり強いため図示の如くスプリングにより補助す
ると剥離時間を短縮することができる。テ−プ取付金具
が上端まで引上げられるとリミットスイッチ(図示せ
ず)が作動し、(10)テ−プ巻取リ−ルが剥された接着テ
−プの巻取りを開始すると同時に、テ−プ取付金具が左
端に移動を開始し、同時に基盤金具に設けられた前記移
動手段によりスプリングに抗して引下げられ、当初の位
置に戻る。当初の位置に戻るとリミットスイッチ(図示
せず)が作動し、テ−プ巻取リ−ルが停止し、テ−プ取
付金具下端の加圧手段が作動して、接着テ−プの挟込み
を解除する。この挟込み用加圧手段が元の位置に戻る
と、リミットスイッチ(図示せず)が作動し、(11)IC
基板を押圧していた加圧板が加圧手段により加圧手段内
蔵部端部に当接するまで引上げられる。引上げられると
リミットスイッチ(図示せず)が作動し、(12)IC基板
当て板が移動手段により所定の位置まで前方へ押出され
停止する。(13)検査員がIC基板を取出し、肉眼検査に
より良否を判定する。 上記の順序で1サイクルが完了し、次のIC基板を検査
するためには、再度ペダルスイッチを踏み、IC基板を
挿入するが、2回目以降はIC基板当て板が所定の位置
まで前方へ押出されて停止しているので上記工程の(2)
から開始され、基板配線剥離試験機が自動的に上記操作
を繰り返す。
In the present invention, after the inspector inserts the IC board into a predetermined position of the IC board wiring peeling tester of the present invention, the IC board wiring peeling tester of the present invention automatically operates, and Since the adhesive tape is adhered to the printed wiring or the plated wiring on the substrate and peeled off, the inspector need only take out the IC substrate and visually inspect the peeled state of the IC substrate wiring. The operation is started when the inspector steps on the pedal switch on the floor in front of the IC substrate wiring peel tester. When the operation is started, first, (1) the substrate abutment is advanced to a predetermined position by the moving means. Therefore,
(2) The inspector places the IC board on the upper surface of the main body with the surface wired on the IC board facing up, and inserts the IC board until it comes into contact with the IC board backing plate. (3) An optical sensor is provided below the IC board contact plate, and when it is confirmed that the IC board contacts the IC board contact plate, (4) the pressure plate is in the frame pressure means built-in part. The IC substrate is pressed down by the pressing means.
When pressed, the limit switch (not shown) operates,
(5) The IC substrate backing plate is retracted to a predetermined position by the moving means. When retracted, a limit switch (not shown) is activated, and (6) the tape mounting metal fitting that has moved to the left end and waited moves to the right end, and the adhesive tape is installed directly above the upper surface of the IC substrate. When the facility is installed, a limit switch (not shown) is operated, and (7) the pressure roller is moved to the left end by the pressure means of the metal means with built-in pressure means, which has been on standby, and the pressure roller is pressed at a predetermined pressure by the adhesive tape.
The pressing roller is pressed onto the IC substrate, and the pressure roller is also moved while pressing on the adhesive tape as the metal fitting for the pressing means is moved to the right end by the guide rail and the moving means. The adhesive tape is adhered to the IC substrate surface. When the metal fitting with built-in pressurizing means reaches the right end, a limit switch (not shown) is activated. (8) As the metal fitting with built-in pressurizing means is moved to the left end by the moving means, the pressurizing roller is moved. -Also moves while pressing the adhesive tape again. When the metal fitting with built-in pressurizing means reaches the left end, a limit switch (not shown) is operated to move the pressurizing roller upward and return to the initial position. When it returns to the initial position, the limit switch (not shown) operates, and (9) the pressing means at the lower end of the tape mounting bracket operates, sandwiching and fixing the adhesive tape with the roller. To do. When fixed, a limit switch (not shown) is actuated, a moving means provided on the base metal fitting is operated, and the tape mounting bracket is pulled upward. When the tape mounting bracket is pulled upward, the adhesive tape sandwiched and fixed by the roller and the pressing means is also pulled upward and peeled off the IC substrate surface. In order to peel the adhesive tape from the IC substrate surface, the above-mentioned moving means alone may be used. However, the adhesive force of the adhesive tape is quite strong, and the peeling time can be reduced by assisting with a spring as shown in the figure. . When the tape mounting bracket is pulled up to the upper end, a limit switch (not shown) is actuated, and (10) the tape winding reel is started to wind off the peeled adhesive tape, and at the same time, the tape is wound. -The mounting bracket starts to move to the left end, and at the same time is pulled down against the spring by the moving means provided on the base mounting, and returns to its original position. When it returns to the initial position, the limit switch (not shown) is activated, the tape winding reel is stopped, and the pressing means at the lower end of the tape mounting bracket is activated to clamp the adhesive tape. Remove the inclusion. When the sandwiching pressurizing means returns to the original position, the limit switch (not shown) is operated, and (11) IC
The pressing plate that has pressed the substrate is pulled up by the pressing unit until it comes into contact with the end of the built-in pressing unit. When pulled up, a limit switch (not shown) is actuated, and (12) the IC board backing plate is pushed forward to a predetermined position by the moving means and stopped. (13) The inspector takes out the IC substrate and judges the quality by visual inspection. One cycle is completed in the above order. To inspect the next IC board, depress the pedal switch again and insert the IC board, but after the second time the IC board backing plate is pushed forward to the predetermined position. (2) of the above process
And the above operation is automatically repeated by the substrate wiring peeling tester.

【0007】[0007]

【実施例】以下、本発明の一実施例を図面に基づき説明
する。図1は本実施例の全体概要構造を示す概略図、図
2は図1の実施例の内、加圧板、フレ−ム、フレ−ムを
支える支柱およびボルト又は蝶ねじを取除いた正面該略
図、図3は図2において、テ−プ取付金具が上方へ移動
し、それに伴い接着テ−プも上方へ持上げられる状態を
示す状態図、図4は煩雑を避けるため、スプリングを削
除した図1の一部切り欠き側面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic view showing an overall schematic structure of the present embodiment, and FIG. 2 is a front view of the embodiment of FIG. 1 from which a pressure plate, a frame, a column for supporting the frame and a bolt or a thumbscrew are removed. FIG. 3 is a state diagram showing a state in which the tape fitting is moved upward in FIG. 2 and the adhesive tape is lifted upward accordingly, and FIG. 4 is a diagram in which a spring is removed to avoid complication. It is a partially notched side view of FIG.

【0008】まず、本実施例の基板配線剥離試験機の概
要を図1乃至図4により説明する。当該試験機1は大別
して図示のように配置される本体3と、本体上面3aの
手前側に設けられた加圧板4と、この加圧板の下部から
挿入するIC基板31の挿入奥行きを規制するIC基板
当て板33(図4参照)と、本体上面の奥行きの略中央
部分に直立するパネル2と、このパネルに取付けられる
2本のガイドレ−ル12と、パネルに取付けられる加圧
手段内蔵金具の移動手段13と、このガイドレ−ルと移
動手段により左右に移動する加圧手段内蔵金具11と、
当該加圧手段内蔵金具内の加圧手段により接着テ−プ2
8をIC基板31に押圧する加圧ロ−ラ−21と、前記
ガイドレ−ル12と基盤金具移動手段14により左右に
移動する基盤金具10と、当該基盤金具に上下方向ガイ
ドレ−ル38と移動手段17を介して上下方向移動可能
に取付けられるテ−プ取付金具9と、当該テ−プ取付金
具の上先端に取付けられる接着テ−プを巻いた巻きテ−
プ15と、当該巻きテ−プより引出され、ロ−ラ−1
9、20及び固定ロ−ラ−22、23、24を介して引
出されたテ−プ28を巻取るテ−プ巻取リ−ル16と、
各種のスイッチ(図示せず)と各種のリミットスイッチ
(図示せず)および加圧板4の手前には安全のための防
護バ−(図示せず)等を備えている。
First, the outline of the substrate wiring peeling tester of this embodiment will be described with reference to FIGS. The testing machine 1 regulates the insertion depth of a main body 3 arranged roughly as shown in the drawing, a pressing plate 4 provided on the front side of the upper surface 3a of the main body, and an IC board 31 inserted from below the pressing plate. An IC board backing plate 33 (see FIG. 4), a panel 2 standing upright at a substantially central portion in the depth of the upper surface of the main body, two guide rails 12 attached to this panel, and a fitting with built-in pressurizing means attached to the panel. Moving means 13; a pressure means built-in metal fitting 11 which moves left and right by the guide rail and the moving means;
The adhesive tape 2 is formed by the pressing means in the metal fitting with built-in pressing means.
A pressure roller 21 for pressing the substrate 8 against the IC substrate 31, a base metal 10 which is moved left and right by the guide rail 12 and the base metal moving means 14, and a vertical guide rail 38 which is moved by the base metal. A tape mounting bracket 9 mounted to be vertically movable via means 17 and a wound tape wound with an adhesive tape mounted on the upper end of the tape mounting bracket.
Roll 15 and the roller 1
A tape winding reel 16 for winding a tape 28 drawn out through the fixing rollers 9, 22, and the fixing rollers 22, 23, 24;
Various switches (not shown), various limit switches (not shown), and a protection bar (not shown) for safety are provided in front of the pressure plate 4.

【0009】次に、本実施例の基板配線剥離試験機の操
作手順等を図1乃至図4により説明する。本試験機の動
力源の大部分はロッドレスエアシリンダ−または一般の
エアシリンダ−であり圧縮空気を必要とするが、コンプ
レッサ−まで内蔵させる必要はなく、外部よりホ−ス等
で本試験機に接続することにより本試験機を作動させる
ことができる。しかしながら、本発明はエアシリンダ−
に限定されることはなく、油圧シリンダ−または電動式
スクリュ−ロッド等、要は移動できるものであれば使用
することができる。また、図1に示すテ−プ巻取リ−ル
16は、図4に示す如くシャフト39、歯車37、36
を介してテ−プ巻取リ−ル用モ−タ−35により作動す
る。図1に示す如く、本体3は移動に便利なようにキャ
スタ−および固定用の足部を備えている。本試験機を所
定の位置に搬送固定後、まず、電源および圧縮空気源等
の動力源に接続する。その後、検査するIC基板配線の
位置に応じて、IC基板の挿入深度をハンドル25によ
り調節する。図4に示す如く、ハンドルを回すと歯車2
9、30を介してスクリュ−ロッド34が回り、このス
クリュ−ロッドに係合しているIC基板当て板33の移
動手段32を前後(図4においては左右)に移動させる
ことにより、IC基板当て板の挿入深度を調節すること
ができる。この場合、IC基板当て板は移動手段32が
最も押出した状態を基準にする。IC基板当て板は複数
の幅の狭い板がフォ−ク状に本体上面3aに開けられた
長孔を通して、長孔に対して摺動自在に本体上面より上
方へ突出しており、そのため、本体上面上に挿入された
IC基板を当接させることができる。センサ−40は、
移動手段32に固定用板等を介して固定されており、I
C基板当て板が移動手段32により最も押出された状態
の直下に設けられいる。このため、移動手段32がハン
ドル25により移動すると、センサ−40も移動する。
本実施例においては光センサ−を用いたが、光センサ−
に限定するものではなく、IC基板31が本体上面より
上方に突出しているIC基板当て板33の複数個に当接
した場合に電気信号を発信できるものであれば良い。
Next, the operation procedure and the like of the substrate wiring peeling tester of this embodiment will be described with reference to FIGS. Most of the power source of this tester is a rodless air cylinder or a general air cylinder and requires compressed air, but it is not necessary to incorporate it into the compressor. The tester can be operated by connecting to. However, the present invention is
The present invention is not limited to this, and a hydraulic cylinder or an electric screw rod or the like can be used as long as it can move. The tape winding reel 16 shown in FIG. 1 has a shaft 39, gears 37 and 36 as shown in FIG.
The motor is operated by the tape winding reel motor 35 through. As shown in FIG. 1, the main body 3 is provided with casters and fixing feet for convenience of movement. After transporting and fixing this tester to a predetermined position, first, it is connected to a power source and a power source such as a compressed air source. After that, the handle 25 adjusts the insertion depth of the IC board according to the position of the IC board wiring to be inspected. As shown in FIG. 4, when the handle is turned, the gear 2
The screw rod 34 is rotated via the components 9 and 30, and the moving means 32 of the IC board contact plate 33 engaged with the screw rod is moved back and forth (right and left in FIG. 4) to thereby contact the IC board. The insertion depth of the board can be adjusted. In this case, the IC board backing plate is based on the state in which the moving means 32 is pushed out most. The IC board backing plate is formed by a plurality of narrow plates fork-shaped through a long hole formed in the upper surface 3a of the main body and protrudes upward from the upper surface of the main body slidably with respect to the long hole. The IC substrate inserted above can be brought into contact. Sensor-40 is
It is fixed to the moving means 32 via a fixing plate or the like.
The C-substrate backing plate is provided immediately below the state where it is most pushed out by the moving means 32. Therefore, when the moving means 32 moves with the handle 25, the sensor 40 also moves.
Although the optical sensor is used in this embodiment, the optical sensor
The present invention is not limited to this, and any device may be used as long as it can transmit an electric signal when the IC substrate 31 comes into contact with a plurality of IC substrate contact plates 33 protruding above the upper surface of the main body.

【0010】まず、検査員が基板配線剥離試験機1前面
の床上のペダルスイッチ26を足で踏むと、(1) IC基
板当て板33が移動手段32により所定の位置まで前進
する。(2) この時点で検査員が検査しようとするIC基
板31を図4に示す如く、IC基板当て板33に当接す
るまで挿入する。この場合、IC基板を斜めに挿入する
と1か所のIC基板当て板に当接するだけなので、セン
サ−40は電気信号を発信せず次の工程に進むことがで
きない。(3) したがって、IC基板31を平行に挿入し
IC基板当て板の2か所以上に当接すると、(4) 加圧板
4がフレ−ム5より2か所下方へ突出している加圧手段
内蔵部6内の加圧手段により降下し、IC基板31を押
圧する。フレ−ム5は本体上面3aの前面に立設してい
る2本のボルトとナット8および蝶ねじ7により平行に
なるように固定される。加圧板4は2個の加圧手段によ
り降下するので、IC基板31を均等に所定の圧力で加
圧することができる。加圧板4がIC基板31を押圧す
ると、リミットスイッチ(図示せず)が作動し、(5) I
C基板当て板33が移動手段32により所定の位置まで
後退する。IC基板当て板33が後退することにより、
後の工程において加圧ロ−ラ−21が左右に移動する際
に加圧ロ−ラ−との接触を防止できる。後退するとリミ
ットスイッチ(図示せず)が作動し、(6) 左端に移動し
て待機していたテ−プ取付金具9を、上下方向ガイドレ
−ル38および移動手段17を介して上下方向に摺動自
在に取付けている基盤金具10が、2本のガイドレ−ル
12および基盤金具移動手段14により右端まで移動す
る。このことにより、テ−プ取付金具9の上端に取付け
られている巻きテ−プ15より引出された接着テ−プ2
8はロ−ラ−19、20を経由してIC基板31上に張
られる。なお、接着テ−プ28は更に伸びて固定ロ−ラ
−22、23、24を経由してテ−プ巻取リ−ル16に
到達しているが、テ−プ巻取リ−ル16は一方向クラッ
チ付きであるため逆回転することがなく、接着テ−プ2
8をIC基板上に張ることができる。基盤金具10に上
下方向摺動可能に取付けられているテ−プ取付金具9が
右端に到達するとリミットスイッチ(図示せず)が作動
し、(7) 左端に移動して待機していた加圧手段内蔵金具
11の加圧手段により加圧ロ−ラ−21が所定圧力で接
着テ−プ28をIC基板31上に押圧すると共に、加圧
手段内蔵金具11がガイドレ−ル12および加圧手段内
蔵金具の移動手段13により右端まで移動するのに伴
い、加圧ロ−ラ−21も接着テ−プ28上を押圧しなが
ら移動して接着テ−プをIC基板面に接着する。この場
合、テ−プ取付金具9を上下方向摺動可能に取付けてい
る基盤金具10も同じガイドレ−ルを移動するため、加
圧手段内蔵金具11が基盤金具10を追越すことはな
く、加圧手段内蔵金具11が既に右端に到達している基
盤金具10に当接するまで移動する。加圧手段内蔵金具
11が右端に到達すると、リミットスイッチ(図示せ
ず)が作動し、(8) 加圧手段内蔵金具11を前記加圧手
段内蔵金具の移動手段13により今度は左端まで移動す
るのに伴い、加圧ロ−ラ−21も接着テ−プ28を再度
押圧しながら移動する。加圧手段内蔵金具11が左端に
到達すると、リミットスイッチ(図示せず)が作動して
加圧ロ−ラ−21を上方へ移動させ当初の位置に戻る。
当初の位置に戻るとリミットスイッチ(図示せず)が作
動し、(9) テ−プ取付金具9下端の加圧手段18が作動
して、接着テ−プ28をロ−ラ−20との間に挟み固定
する。固定するとリミットスイッチ(図示せず)が作動
し、基盤金具10に設けられた移動手段17が作動しテ
−プ取付金具9を上方へ引上げる。テ−プ取付金具9が
上方へ引上げられることにより、ロ−ラ−20と加圧手
段18により挟み固定された接着テ−プ28も上方へ引
上げられIC基板31面より剥される。IC基板面より
接着テ−プ28を剥離するためには、移動手段17単独
でも良いが、接着テ−プ28の接着力が可なり強いため
図示の如くスプリング41により補助すると剥離時間を
短縮することができる。テ−プ取付金具9が上端まで引
上げられるとリミットスイッチ(図示せず)が作動し、
(10)テ−プ巻取リ−ル16が剥された接着テ−プ28の
巻取りを開始すると同時に、テ−プ取付金具9を取付け
た基盤金具10が左端に移動を開始し、同時に基盤金具
10に設けられた移動手段17によりスプリング41に
抗して下方へ引下げられ、当初の位置に戻る。この場合
においても、基盤金具10は同じガイドレ−ル12を利
用して左端に移動するため、基盤金具10が加圧手段内
蔵金具11を追越すことはなく、既に左端に移動して停
止している加圧手段内蔵金具11に当接して停止する。
当初の位置に戻るとリミットスイッチ(図示せず)が作
動し、テ−プ巻取リ−ル16が巻取を停止し、テ−プ取
付金具9下端の加圧手段18が作動して、接着テ−プ2
8の挟込みを解除する。この挟込み用加圧手段18が元
の位置に戻ると、リミットスイッチ(図示せず)が作動
し、(11)IC基板31を押圧していた加圧板4が加圧手
段により加圧手段内蔵部6の端部に当接するまで引上げ
られる。引上げられるとリミットスイッチ(図示せず)
が作動し、(12)IC基板当て板33が移動手段32によ
り所定の位置まで前方へ押出され停止する。(13)検査員
がIC基板31を取出し、肉眼検査により良否を判定す
る。上記の順序で1サイクルが完了し、次のIC基板を
検査するためには、再度ペダルスイッチを踏み、別のI
C基板31を挿入し、基板配線剥離試験機1が上記(2)
の工程から自動的に上記操作を繰り返す。 上記の如く作動する本発明の基板配線剥離試験機を用い
て検査した結果、従来検査員自身によりIC基板上に接
着テ−プを接着し、剥離し、剥離後肉眼検査により良否
を判定していたため、1枚のIC基板を検査するのに要
する時間が約1分程度必要としていたが、本発明の基板
配線剥離試験機を用いると1枚のIC基板を検査するの
に要する時間は約5秒程度であり、検査能率を大幅に向
上させることができた。更に従来は各検査員がIC基板
上に接着テ−プを接着するため、人により強く接着する
人、又は弱く接着する人により検査結果にバラツキが生
じていたが、本発明の基板配線剥離試験機を用いると、
常に一定圧力で接着テ−プを接着できるため安定した検
査結果を得ることができた。
First, when the inspector steps on the pedal switch 26 on the floor in front of the board wiring peeling tester 1, (1) the IC board backing plate 33 moves forward to a predetermined position by the moving means 32. (2) At this point, the inspector inserts the IC substrate 31 to be inspected into contact with the IC substrate contact plate 33 as shown in FIG. In this case, when the IC board is inserted obliquely, it only comes into contact with one IC board backing plate, so that the sensor 40 does not transmit an electric signal and cannot proceed to the next step. (3) Therefore, when the IC substrate 31 is inserted in parallel and abuts at two or more locations on the IC substrate contact plate, (4) the pressure means in which the pressure plate 4 projects downward from the frame 5 at two locations. The IC board 31 is pressed down by the pressurizing means in the built-in portion 6. The frame 5 is fixed to be parallel by two bolts, nuts 8 and thumb screws 7 erected on the front surface of the main body upper surface 3a. Since the pressing plate 4 is lowered by the two pressing means, the IC substrate 31 can be pressed uniformly at a predetermined pressure. When the pressure plate 4 presses the IC substrate 31, a limit switch (not shown) is operated, and (5) I
The C-substrate backing plate 33 is moved backward by the moving means 32 to a predetermined position. As the IC board backing plate 33 retreats,
In a later step, when the pressure roller 21 moves left and right, contact with the pressure roller 21 can be prevented. Upon retreating, a limit switch (not shown) is actuated, and (6) the tape mounting bracket 9 which has moved to the left end and waited is slid up and down via the up and down guide rail 38 and the moving means 17. The base metal fitting 10 movably mounted is moved to the right end by two guide rails 12 and base metal moving means 14. As a result, the adhesive tape 2 pulled out from the wound tape 15 mounted on the upper end of the tape mounting bracket 9.
8 is stretched on the IC substrate 31 via rollers 19 and 20. The adhesive tape 28 is further extended to reach the tape winding reel 16 via the fixed rollers 22, 23, 24. Has a one-way clutch so that it does not rotate in the reverse direction.
8 can be mounted on the IC substrate. When the tape mounting bracket 9 slidably mounted on the base bracket 10 reaches the right end, the limit switch (not shown) is actuated, and (7) the pressurization which has moved to the left end and is on standby. The pressure roller 21 presses the adhesive tape 28 onto the IC substrate 31 at a predetermined pressure by the pressurizing means of the means built-in metal fitting 11, and the fitting means built-in metal fitting 11 includes the guide rail 12 and the pressing means. As the built-in metal fitting moving means 13 moves to the right end, the pressure roller 21 also moves while pressing on the adhesive tape 28 to adhere the adhesive tape to the IC substrate surface. In this case, the base metal fitting 10 on which the tape mounting metal fitting 9 is slidable in the vertical direction also moves on the same guide rail. The pressure means built-in fitting 11 moves until it comes into contact with the base fitting 10 which has already reached the right end. When the metal fitting 11 with built-in pressurizing means reaches the right end, a limit switch (not shown) is operated, and (8) the metal fitting 11 with built-in pressurizing means is moved to the left end by the moving means 13 of the metal built-in pressurizing means. Accordingly, the pressure roller 21 also moves while pressing the adhesive tape 28 again. When the metal fitting 11 with built-in pressurizing means reaches the left end, a limit switch (not shown) is operated to move the pressurizing roller 21 upward to return to the initial position.
When returning to the initial position, the limit switch (not shown) is operated, and (9) the pressurizing means 18 at the lower end of the tape mounting bracket 9 is operated to move the adhesive tape 28 to the roller 20. Hold it between and fix it. When it is fixed, a limit switch (not shown) is operated, and a moving means 17 provided on the base metal fitting 10 is operated to pull up the tape mounting fitting 9 upward. When the tape mounting bracket 9 is pulled upward, the adhesive tape 28 sandwiched and fixed by the roller 20 and the pressing means 18 is also pulled upward and peeled off the IC substrate 31 surface. In order to peel the adhesive tape 28 from the IC substrate surface, the moving means 17 alone may be used. However, the adhesive force of the adhesive tape 28 is quite strong. be able to. When the tape mounting bracket 9 is pulled up to the upper end, a limit switch (not shown) operates,
(10) The tape winding reel 16 is peeled off, and at the same time the winding of the adhesive tape 28 is started, the base metal fitting 10 to which the tape mounting metal fitting 9 is attached starts to move to the left end. The moving means 17 provided on the base metal fitting 10 pulls it downwards against the spring 41, and returns to the initial position. Also in this case, since the base metal fitting 10 moves to the left end using the same guide rail 12, the base metal fitting 10 does not pass the metal fitting 11 with built-in pressing means, but has already moved to the left end and stopped. Then, it comes into contact with the metal fitting 11 with built-in pressurizing means and stops.
When it returns to the initial position, the limit switch (not shown) operates, the tape winding reel 16 stops winding, and the pressing means 18 at the lower end of the tape mounting bracket 9 operates, Adhesive tape 2
8 is released. When the sandwiching pressurizing means 18 returns to the original position, a limit switch (not shown) is operated, and (11) the pressurizing plate 4 which has pressed the IC board 31 is built in by the pressurizing means. It is pulled up until it touches the end of the part 6. Limit switch (not shown) when pulled up
(12) The IC substrate contact plate 33 is pushed forward to a predetermined position by the moving means 32 and stopped. (13) The inspector takes out the IC board 31 and judges the quality by a visual inspection. After one cycle is completed in the above order, in order to inspect the next IC board, the pedal switch is depressed again and another I
Insert the C board 31 and the board wiring peeling tester 1 performs the above (2).
The above operation is automatically repeated from the step. As a result of the inspection using the substrate wiring peeling tester of the present invention which operates as described above, the inspector himself adhered the adhesive tape on the IC substrate, peeled it off, and judged the quality by visual inspection after peeling. Therefore, the time required to inspect one IC board was about 1 minute, but the time required to inspect one IC board is about 5 minutes by using the substrate wiring peeling tester of the present invention. This is on the order of seconds, which has greatly improved the inspection efficiency. Further, conventionally, since each inspector adheres the adhesive tape on the IC substrate, the inspection result varies depending on the person who adheres strongly or the person who adheres weakly. With the machine,
Since the adhesive tape could always be adhered with a constant pressure, a stable inspection result could be obtained.

【0011】[0011]

【発明の効果】本発明によれば、次のような顕著な効果
を奏する。 1)個人差による検査結果のバラツキをなくし、常に安
定した検査結果を得ることが出来る。 2)検査能率を大幅に向上できる。 3)基板配線剥離試験機が小型で軽量なため、簡単に移
動できる。
According to the present invention, the following remarkable effects are obtained. 1) Variations in test results due to individual differences can be eliminated, and stable test results can always be obtained. 2) Inspection efficiency can be greatly improved. 3) Since the board wiring peeling tester is small and lightweight, it can be easily moved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の基板配線剥離試験機の全体概要構造を
示す正面概略図。
FIG. 1 is a schematic front view showing the overall schematic structure of a substrate wiring peel tester according to the present invention.

【図2】図1の基板配線剥離試験機の内、加圧板、フレ
−ム、フレ−ムを支える支柱およびボルト又は蝶ねじを
取除いた正面概略図。
FIG. 2 is a schematic front view of the substrate wiring peeling tester of FIG. 1 from which a pressure plate, a frame, a column supporting the frame, a bolt or a thumbscrew are removed.

【図3】図2において、テ−プ取付金具が上方へ移動
し、それに伴い接着テ−プも上方へ持上げられる状態を
示す状態図。
FIG. 3 is a state diagram showing a state in FIG. 2 in which a tape mounting bracket is moved upward, and an adhesive tape is also lifted upward accordingly.

【図4】煩雑を避けるため、スプリングを削除した図1
の一部切欠き側面図。
[Fig. 4] Fig. 1 with a spring removed to avoid complication.
FIG.

【符号の説明】[Explanation of symbols]

1 基板配線剥離試験機 2 パネル 3 本体 3a 本体上面 4 加圧板 5 フレ−ム 6 加圧手段内蔵部 7 蝶ねじ 8 ナット 9 テ−プ取付金具 10 基盤金具 11 加圧手段内蔵金具 12 ガイドレ−ル 13 加圧手段内蔵金具の移動手段 14 基盤金具移動手段 15 巻きテ−プ 16 テ−プ巻取リ−ル 17 移動手段 18 加圧手段 19 ロ−ラ− 20 ロ−ラ− 21 加圧ロ−ラ− 22 固定ロ−ラ− 23 固定ロ−ラ− 24 固定ロ−ラ− 25 ハンドル 26 ペダルスイッチ 27 コ−ド 28 接着テ−プ 29 歯車 30 歯車 31 IC基板 32 移動手段 33 IC基板当て板 34 スクリュ−ロッド 35 テ−プ巻取リ−ル用モ−タ− 36 歯車 37 歯車 38 上下方向ガイドレ−ル 39 シャフト 40 センサ− 41 スプリング DESCRIPTION OF SYMBOLS 1 Board wiring peeling tester 2 Panel 3 Main body 3a Main body upper surface 4 Pressing plate 5 Frame 6 Pressurizing means built-in part 7 Thumb screw 8 Nut 9 Tape mounting bracket 10 Base bracket 11 Pressing unit built-in bracket 12 Guide rail 13 Moving means of metal fitting with built-in pressurizing means 14 Base metal fitting moving means 15 Rolled tape 16 Tape take-up reel 17 Moving means 18 Pressurizing means 19 Roller 20 Roller 21 Pressurizing roll Reference numeral 22 Fixed roller 23 Fixed roller 24 Fixed roller 25 Handle 26 Pedal switch 27 Code 28 Adhesive tape 29 Gear 30 Gear 31 IC board 32 Moving means 33 IC board backing plate 34 Screw rod 35 Tape take-up reel motor 36 Gear 37 Gear 38 Vertical guide rail 39 Shaft 40 Sensor 41 Spring

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 IC基板の挿入位置を規制するIC基板
当て板と、IC基板を押える加圧板と、IC基板上に接
着テ−プを供給し且つ左右および上下に移動可能なテ−
プ取付金具と、IC基板上に供給された接着テ−プを押
圧しながら横方向へ移動することにより前記接着テ−プ
をIC基板上に張り付け、且つ上下に移動することがで
きる加圧ロ−ラ−と、前記テ−プ取付金具が上方へ移動
することによりIC基板から剥離した接着テ−プを巻取
ることができるテ−プ巻取リ−ルとを備えていることを
特徴とする基板配線剥離試験機。
1. An IC board backing plate that regulates an insertion position of an IC board, a pressure plate that presses an IC board, and a tape that supplies an adhesive tape on the IC board and that can be moved left and right and up and down.
The pressure tape which can be attached to the IC substrate and moved up and down by pressing the mounting tape and the adhesive tape supplied on the IC substrate in the horizontal direction while pressing the adhesive tape. And a tape winding reel capable of winding an adhesive tape peeled off from the IC substrate by moving the tape mounting bracket upward. Board wiring peel tester.
【請求項2】 IC基板当て板がハンドルにより前後に
移動可能であり、且つ加圧板がIC基板を押圧後、IC
基板当て板を後方へ移動する移動手段を備えていること
を特徴とする請求項1記載の基板配線剥離試験機。
2. The IC board backing plate can be moved back and forth by a handle, and the pressing plate presses the IC board.
2. The apparatus according to claim 1, further comprising a moving means for moving the substrate backing plate backward.
【請求項3】 テ−プ取付金具が、ガイドレ−ルおよび
移動手段により左右に移動可能な基盤金具に、上下方向
ガイドレ−ルおよび移動手段を介して上下方向移動可能
に取付けられ、前記テ−プ取付金具が上方へ移動する際
にはテ−プ取付金具に備えられた加圧手段により接着テ
−プがロ−ラ−との間に挟まれて固定されることによ
り、IC基板上に接着している接着テ−プを剥離するこ
とを特徴とする請求項2記載の基板配線剥離試験機。
3. A tape mounting bracket is mounted on a base bracket movable left and right by a guide rail and a moving means so as to be vertically movable through a vertical guide rail and a moving means. When the tape mounting bracket moves upward, the adhesive tape is sandwiched and fixed between the roller and the roller by the pressurizing means provided on the tape mounting bracket, so that the tape is mounted on the IC substrate. 3. The apparatus according to claim 2, wherein the adhesive tape is peeled off.
【請求項4】 加圧ロ−ラ−が、ガイドレ−ルおよび移
動手段により左右に移動可能な加圧手段内蔵金具に、上
下動可能に取付けられていることを特徴とする請求項3
記載の基板配線剥離試験機。
4. The pressurizing roller is vertically movably mounted on a pressurizing means built-in fitting which can be moved left and right by a guide rail and a moving means.
The board wiring peel tester according to the above.
【請求項5】 テ−プ巻取リ−ルが一方向クラッチ付き
であることを特徴とする請求項4記載の基板配線剥離試
験機。
5. The apparatus according to claim 4, wherein the tape winding reel has a one-way clutch.
JP33139494A 1994-12-12 1994-12-12 Substrate wiring peel tester Expired - Lifetime JP2646196B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33139494A JP2646196B2 (en) 1994-12-12 1994-12-12 Substrate wiring peel tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33139494A JP2646196B2 (en) 1994-12-12 1994-12-12 Substrate wiring peel tester

Publications (2)

Publication Number Publication Date
JPH08166340A true JPH08166340A (en) 1996-06-25
JP2646196B2 JP2646196B2 (en) 1997-08-25

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Family Applications (1)

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JP33139494A Expired - Lifetime JP2646196B2 (en) 1994-12-12 1994-12-12 Substrate wiring peel tester

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001075418A1 (en) * 2000-04-04 2001-10-11 Lintec Corporation Device and method for measuring adhesive strength
JP2007003250A (en) * 2005-06-22 2007-01-11 National Maritime Research Institute Dryness/wetness alternate tester

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001075418A1 (en) * 2000-04-04 2001-10-11 Lintec Corporation Device and method for measuring adhesive strength
US6584858B1 (en) 2000-04-04 2003-07-01 Lintec Corporation Device and method for measuring adhesive strength
KR100808853B1 (en) * 2000-04-04 2008-03-03 린텍 가부시키가이샤 Device and method for measuring adhesive strength
JP4580610B2 (en) * 2000-04-04 2010-11-17 リンテック株式会社 Adhesive force measuring device
JP2007003250A (en) * 2005-06-22 2007-01-11 National Maritime Research Institute Dryness/wetness alternate tester

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