JPH08165573A - Sputtering device and sputtering gas inlet pipe - Google Patents

Sputtering device and sputtering gas inlet pipe

Info

Publication number
JPH08165573A
JPH08165573A JP30751094A JP30751094A JPH08165573A JP H08165573 A JPH08165573 A JP H08165573A JP 30751094 A JP30751094 A JP 30751094A JP 30751094 A JP30751094 A JP 30751094A JP H08165573 A JPH08165573 A JP H08165573A
Authority
JP
Japan
Prior art keywords
sputtering
groove
treated workpiece
sputtering gas
sputtering apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP30751094A
Other languages
Japanese (ja)
Other versions
JP3646330B2 (en
Inventor
Atsuhiro Abe
淳博 阿部
Tomoyuki Sekino
智之 関野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP30751094A priority Critical patent/JP3646330B2/en
Publication of JPH08165573A publication Critical patent/JPH08165573A/en
Application granted granted Critical
Publication of JP3646330B2 publication Critical patent/JP3646330B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/14Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
    • H01F41/18Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering
    • H01F41/183Sputtering targets therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)
  • Thin Magnetic Films (AREA)

Abstract

PURPOSE: To obtain a sputtering device in which an abnormal discharge is reduced and dust is not generated, by which a magnetic recording medium, etc., free of a dropout and a sputtered film uniform in thickness and quality are obtained and capable of saving maintenance such as cleaning. CONSTITUTION: A target T set on a cathode 10 is sputtered to form a thin film on the surface of a polymer film Fa exposed to a film forming chamber 5 in this sputtering device 1A. A sputtering gas inlet pipe 20 is laid outside a deposition preventive mask 11 set around the cathode 10, and a sputtering gas is ejected into a gap between the film Fa and the mask 11 to form a thin film on the surface of the film Fa.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】この発明は、例えば、被表面処理
加工物である長尺の高分子フィルムの表面にスパッタリ
ングにより磁気記録薄膜及びその保護薄膜などの薄膜を
成膜して磁気記録媒体を製造する場合に用いることがで
きるスパッタ装置及びスパッタリングガス導入管の改良
に関するものである。なお、以下の説明では、前記磁気
記録媒体の製造を採り上げて説明するが、この発明はフ
ィルム状の被表面処理加工物に限定されるものではな
く、光ディスクなどの平板な被表面処理加工物にも適用
できることを付言しておく。
BACKGROUND OF THE INVENTION The present invention relates to a magnetic recording medium in which a thin film such as a magnetic recording thin film and its protective thin film is formed by sputtering on the surface of a long polymer film which is a surface treated product. The present invention relates to an improvement of a sputtering device and a sputtering gas introduction pipe that can be used in manufacturing. In the following description, the production of the magnetic recording medium will be described as an example, but the present invention is not limited to a film-shaped surface-treated workpiece, but a flat surface-treated workpiece such as an optical disk. It should be added that is also applicable.

【0002】[0002]

【従来の技術】先ず、図を用いて、従来技術のスパッタ
装置を説明する。図6は従来技術のスパッタ装置の概念
図である。この図6において、符号1は全体としてスパ
ッタ装置を指す。このスパッタ装置1は外筐2で囲まれ
た一つの部屋の内部を仕切板3A、3Bで仕切って、真
空槽4と成膜室5とが形成されている。仕切板3Aは外
筐2の天井から垂直に下がって部屋の中程まで仕切って
おり、この仕切板3Aとやや真空槽4寄りの水平位置の
前記外筐2の床から垂直に起立して部屋の中程まで仕切
っており、両者の自由端間で窓6を形成している。
2. Description of the Related Art First, a conventional sputtering apparatus will be described with reference to the drawings. FIG. 6 is a conceptual diagram of a conventional sputtering device. In FIG. 6, reference numeral 1 generally indicates a sputtering apparatus. In this sputtering apparatus 1, the inside of one chamber surrounded by an outer casing 2 is partitioned by partition plates 3A and 3B to form a vacuum chamber 4 and a film forming chamber 5. The partition plate 3A vertically descends from the ceiling of the outer casing 2 and partitions to the middle of the room. The partition plate 3A stands vertically from the floor of the outer casing 2 in a horizontal position slightly near the vacuum chamber 4 and the room. The window 6 is formed between the two free ends.

【0003】真空槽4の内部には、被表面処理加工物支
持装置である円筒状の一定速度で矢印Rの方向に回転す
る冷却キャン7がその一部の外周面を前記窓6から前記
成膜室5に露出した状態で支持されており、そしてこの
状態の冷却キャン7の約半周面にわたって、真空槽4の
左上方位置で支持されている供給ロール8の長尺の高分
子フィルムFaを巻き付け、そして後述するスパッタさ
れた高分子フィルムFbを、真空槽4の左下方位置で支
持されている巻取ロール9で巻き取るように構成されて
いる。
Inside the vacuum chamber 4, a cooling can 7 which is a support device for a surface-treated workpiece and which rotates in the direction of arrow R at a constant cylindrical speed forms a part of its outer peripheral surface from the window 6 through the window 6. The long polymer film Fa of the supply roll 8 which is supported in the state of being exposed in the film chamber 5 and which is supported at the upper left position of the vacuum chamber 4 over about half the circumferential surface of the cooling can 7 in this state. The polymer film Fb which has been wound and sputtered, which will be described later, is wound by a winding roll 9 supported at a lower left position of the vacuum chamber 4.

【0004】前記成膜室5には、前記窓6からこの成膜
室5に露出している冷却キャン7の一部外周面に向かっ
てカソード電極10が配設されており、そしてこれら両
者間でカソード電極10の周辺部を覆う防着マスク11
とこの防着マスク11のカソード電極10側で、その下
方周辺部から前記窓6付近にスパッタリングガスを供給
するスパッタリングガス導入管(以下、単に「ガス導入
管」と略記する)12とが配設されている。
A cathode electrode 10 is disposed in the film forming chamber 5 toward a part of the outer peripheral surface of the cooling can 7 exposed in the film forming chamber 5 from the window 6, and between the both. The deposition mask 11 that covers the periphery of the cathode electrode 10 with
On the cathode electrode 10 side of this deposition mask 11, a sputtering gas introduction pipe (hereinafter simply referred to as “gas introduction pipe”) 12 for supplying a sputtering gas from the lower peripheral portion to the vicinity of the window 6 is arranged. Has been done.

【0005】また、前記真空槽4の床及び前記成膜室5
の床にはそれぞれ開口13、14が開けられていて、そ
れぞれの開口13、14には排気装置15、16が接続
されている。
The floor of the vacuum chamber 4 and the film forming chamber 5
Openings 13 and 14 are opened on the floors of the above, and exhaust devices 15 and 16 are connected to the respective openings 13 and 14.

【0006】このような構成のスパッタ装置1を用い
て、高分子フィルムに既に成膜されている磁性層の表面
に保護膜を成膜する場合には、前記供給ロール8に磁性
層が成膜された高分子フィルムFaを装着し、この高分
子フィルムFaを前記冷却キャン7の約半周にわたって
巻き付け、そしてその端部を巻取ロール9で巻き取れる
ようにする。一方、前記カソード電極10にはターゲッ
トTとして保護膜材を装着する。このように準備した
後、前記各排気装置15、16を作動させて前記真空槽
4を、例えば、10パスカル程度に、そして成膜室5を
1パスカル程度に減圧し、カソード電極10に電圧を印
加し、これを加熱し、また、前記ガス導入管12から、
例えば、アルゴンガスを導入する。
When the protective film is formed on the surface of the magnetic layer already formed on the polymer film by using the sputtering apparatus 1 having such a structure, the magnetic layer is formed on the supply roll 8. The polymer film Fa thus formed is mounted, the polymer film Fa is wound around about half the circumference of the cooling can 7, and the end portion thereof can be wound by the winding roll 9. On the other hand, a protective film material is attached as a target T to the cathode electrode 10. After the preparation as described above, the exhaust devices 15 and 16 are operated to depressurize the vacuum chamber 4 to, for example, about 10 Pascal and the film forming chamber 5 to about 1 Pascal to apply a voltage to the cathode electrode 10. It is applied and heated, and from the gas introduction pipe 12,
For example, argon gas is introduced.

【0007】次に、前記窓6の近傍にプラズマPが発生
した状態で前記冷却キャン7などを矢印Rの方向に回転
駆動し始め、前記高分子フィルムFaを所定の速度で走
行させ、前記窓6の部分から成膜室5に露出している高
分子フィルムFaの前記磁性層の表面に保護膜材をスパ
ッタする。そうすると保護膜を前記磁性層の表面に成膜
することができる。
Next, when the plasma P is generated in the vicinity of the window 6, the cooling can 7 and the like are started to rotate in the direction of arrow R, the polymer film Fa is run at a predetermined speed, and the window A protective film material is sputtered on the surface of the magnetic layer of the polymer film Fa exposed in the film forming chamber 5 from the portion 6. Then, the protective film can be formed on the surface of the magnetic layer.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、前記の
ように、スパッタリングガスは前記防着マスク11のカ
ソード電極10側で、その下方周辺部に設けたガス導入
管12により導入されているため、このガス導入管12
にスパッタ膜が付着し、このスパッタ膜が絶縁膜である
場合には、この絶縁膜が帯電し、そのためアーキングが
発生したり、付着したスパッタ膜が剥離し、これがフレ
ークになってダストの一因になっており、磁気記録媒体
のドロップアウトの増加につながっていた。従って、ガ
ス導入管12を定期的にクリーニングする必要があっ
た。
However, as described above, since the sputtering gas is introduced on the cathode electrode 10 side of the deposition mask 11 by the gas introduction tube 12 provided in the lower peripheral portion thereof, this Gas introduction pipe 12
If the sputtered film adheres to the and the sputtered film is an insulating film, the insulating film is charged, so that arcing occurs or the adhered sputtered film is peeled off, which becomes flakes and causes dust. This has led to an increase in dropouts of magnetic recording media. Therefore, it was necessary to regularly clean the gas introduction pipe 12.

【0009】また、従来のガス導入管12は単に高分子
フィルムFaの走行方向に垂直に配設され、所定のピッ
チで複数の小孔を開けたパイプであったり、このような
パイプを二重管にしたパイプであるため、高分子フィル
ムFaの幅方向にスパッタリングガスの濃度分布に差が
生じ、膜質が均一なスパッタ膜ができなかった。
Further, the conventional gas introducing pipe 12 is simply a pipe which is arranged perpendicularly to the running direction of the polymer film Fa and has a plurality of small holes formed at a predetermined pitch, or such a pipe is doubled. Since the pipe was a pipe, a difference in the concentration distribution of the sputtering gas occurred in the width direction of the polymer film Fa, and a sputtered film having a uniform film quality could not be formed.

【0010】更にまた、前記ガス導入管12がスパッタ
リングガスをインターナルタイプのカソード電極10付
近で吹き出すため、カソード電極10の裏側やカソード
電極10の内部でも異常放電を起こしがちであった。従
って、本発明のスパッタ装置は、前記課題を解決し、異
常放電を減少させ、ダストの発生を防ぎ、ドロップアウ
トが生じない磁気記録媒体などが得られ、そして膜厚、
膜質が均一なスパッタ膜が得られ、また、クリーニング
などの保守の手間が省けるスパッタ装置を得ることを目
的とするものである。
Furthermore, since the gas introduction tube 12 blows out the sputtering gas in the vicinity of the internal type cathode electrode 10, an abnormal discharge tends to occur on the back side of the cathode electrode 10 and inside the cathode electrode 10. Therefore, the sputtering apparatus of the present invention solves the above-mentioned problems, reduces abnormal discharge, prevents the generation of dust, and obtains a magnetic recording medium in which dropout does not occur, and the film thickness,
It is an object of the present invention to provide a sputtering apparatus which can obtain a sputtered film having a uniform film quality and can save maintenance such as cleaning.

【0011】[0011]

【課題を解決するための手段】それ故、本発明のスパッ
タ装置は、カソード電極、このカソード電極に対向して
配設された被表面処理加工物支持装置、前記カソード電
極の周辺部に配設された防着マスク、ガス導入管を成膜
室内に配置してなるスパッタ装置において、前記ガス導
入管を前記防着マスク外側に配設し、スパッタリングガ
スを前記被表面処理加工物支持装置と前記防着マスクと
の間隙に噴出させて、前記被表面処理加工物の表面に薄
膜を成膜するように構成し、前記課題を解決した。
SUMMARY OF THE INVENTION Therefore, the sputtering apparatus of the present invention is provided with a cathode electrode, a surface-treated workpiece supporting device arranged facing the cathode electrode, and a peripheral portion of the cathode electrode. In the sputtering device in which the deposition mask and the gas introduction pipe are arranged in the film forming chamber, the gas introduction pipe is arranged outside the deposition mask, and the sputtering gas is supplied to the surface-treated workpiece supporting device and the sputtering device. The above problem was solved by being configured to jet a thin film on the surface of the surface-treated workpiece by being jetted into a gap with the deposition mask.

【0012】本発明のスパッタ装置の一実施例では、前
記ガス導入管を前記防着マスクの外方に配設した構成を
採って、スパッタリングガスを前記被表面処理加工物支
持装置と前記防着マスクとの間隙に噴出せている。更に
本発明のスパッタ装置の他の実施例では、前記ガス導入
管を前記防着マスクの内面に配設した構成を採って、ス
パッタリングガスを前記被表面処理加工物支持装置と前
記防着マスクとの間隙に噴出せている。更にまた本発明
のスパッタ装置の更に他の実施例では、窓が上下一対の
仕切板で形成され、かつ空間が仕切られた部屋の一方の
部屋の前記窓の近傍に被表面処理加工物支持装置を配設
し、前記被表面処理加工物支持装置に対向する位置で前
記他方の部屋の前記窓の近傍にカソード電極と、そのカ
ソード電極と前記被表面処理加工物支持装置との間の位
置に前記カソード電極の周辺部に配設された防着マスク
とガス導入管を配置してなるスパッタ装置において、前
記ガス導入管を前記上側の仕切板に配設した構成を採っ
て、スパッタリングガスを前記被表面処理加工物支持装
置と前記防着マスクとの間隙に噴出させている。
In one embodiment of the sputtering apparatus of the present invention, the gas introduction pipe is arranged outside the deposition mask, and the sputtering gas is applied to the surface-treated workpiece supporting device and the deposition target. It is squirting in the gap with the mask. Furthermore, in another embodiment of the sputtering apparatus of the present invention, a structure in which the gas introduction pipe is arranged on the inner surface of the deposition mask is used, and sputtering gas is supplied to the surface-treated workpiece supporting device and the deposition mask. It spurts into the gap. In still another embodiment of the sputtering apparatus of the present invention, the window is formed by a pair of upper and lower partition plates, and the surface-treated workpiece supporting device is provided in the vicinity of the window in one of the rooms where the space is partitioned. And a cathode electrode near the window of the other chamber at a position facing the surface-treated workpiece supporting device, and at a position between the cathode electrode and the surface-treated workpiece supporting device. In a sputtering device in which a deposition mask and a gas introduction pipe are arranged around the cathode electrode, the gas introduction pipe is arranged on the upper partition plate, and the sputtering gas is It is jetted into the gap between the surface-treated workpiece support device and the deposition mask.

【0013】また、前記ガス導入管をトーナメント状管
路で構成して、均一な膜質のスパッタ膜が得られるよう
にしている。そのトーナメント状管路で構成した一ガス
導入管としては、被表面処理加工物の幅とほぼ同等幅の
第1の一対の辺と第2の一対の辺とからなる四辺形の平
板な本体の一平面に、前記第1の一対の一辺の中央部か
ら始まり、前記第2の一対の両辺に向け、そのほぼ全幅
に広がって比較的浅くトーナメント状に分岐して彫られ
た第1の凹溝とこの第1のトーナメント状凹溝の全末端
に隣接し、全末端が導通するように、第1の凹溝より深
く彫られた一本の第2の凹溝とこの第2の凹溝の一側縁
の全長で導通し、前記第1の一対の一辺と反対側に在る
一側辺部に、そのほぼ全幅に広がった前記トーナメント
状の第1の凹溝の深さより遙に浅く彫られ第3の凹溝と
前記第1の凹溝の最先端に開けられた一本の貫通孔とが
形成されていて、該本体と同形状の平板な蓋体を合体、
固定して、前記第1の凹溝の部分でトーナメント状管路
を、前記第2の凹溝の部分でガス溜まりを、前記第3の
凹溝の部分で僅かな隙間が開いた吹き出しスリットを形
成し、該吹き出しスリット側の蓋体の表面の一側辺に沿
って前記トーナメント状管路の全幅を越える幅のフード
を固定し、そして前記貫通孔にガス供給管が接続された
構造で構成するとよい。
Further, the gas introducing pipe is constituted by a tournament-like conduit so that a sputtered film having a uniform film quality can be obtained. As one gas introduction pipe constituted by the tournament-like conduit, a quadrilateral flat body having a first pair of sides and a second pair of sides having a width substantially equal to the width of the surface-treated workpiece is used. A first concave groove carved on a plane from a central portion of one side of the first pair toward both sides of the second pair so as to spread over almost the entire width and branch relatively shallowly into a tournament shape. And adjacent to all the ends of this first tournament-shaped groove, and one second groove that is deeper than the first groove so that all the ends are conductive, and this second groove The one side edge is continuous with the entire length of one side edge opposite to the one side of the first pair, and is carved far shallower than the depth of the tournament-shaped first concave groove that is spread over almost the entire width. And a third recessed groove and a through hole formed at the tip of the first recessed groove, the same shape as the main body. Combining the flat lid of,
Fixing, a tournament-like conduit is provided at the first groove portion, a gas reservoir is provided at the second groove portion, and a blowing slit having a slight gap is formed at the third groove portion. And a hood having a width exceeding the entire width of the tournament-like conduit is fixed along one side of the surface of the lid on the side of the blowing slit, and a gas supply pipe is connected to the through hole. Good to do.

【0014】前記被表面処理加工物が長尺の高分子フィ
ルム状シートであれば、前記被表面処理加工物支持装置
を円筒状の冷却キャンで構成し、この冷却キャンの一部
周面で前記高分子フィルム状シートを順次支持、供給
し、この支持された高分子フィルム状シートと前記カソ
ード電極との間隙に前記ガス導入管からスパッタリング
ガスを供給する構成を採ればよい。
If the surface-treated workpiece is a long polymer film sheet, the surface-treated workpiece supporting device is constituted by a cylindrical cooling can, and a part of the peripheral surface of the cooling can is used as the above-mentioned. The polymer film sheet may be sequentially supported and supplied, and the sputtering gas may be supplied from the gas introduction tube into the gap between the supported polymer film sheet and the cathode electrode.

【0015】[0015]

【作用】従って、カソード電極付近にスパッタ膜が堆積
する要素が少なくなるのでアーキング回数が減り、また
ダストの発生が減少するので、ドロップアウトの少ない
スパッタ膜が得られる。また、幅方向に均一なガス濃度
を発生させることができるので、膜厚、膜質ともに均一
なスパッタ膜をうることができる。そしてガス導入管な
どにスパッタ膜が堆積したいため、これらをクリーニン
グするなどの保守の手間が省ける。
Therefore, the number of elements for depositing the sputtered film near the cathode electrode is reduced, the number of arcing is reduced, and the generation of dust is reduced, so that the sputtered film with less dropout can be obtained. Further, since a uniform gas concentration can be generated in the width direction, a sputtered film having a uniform film thickness and film quality can be obtained. Since it is desired to deposit the sputtered film on the gas introduction pipe or the like, maintenance work such as cleaning these can be omitted.

【0016】[0016]

【実施例】次に、図を用いて、本発明のスパッタ装置を
説明する。図1は本発明の第1の実施例であるスパッタ
装置の概念図であり、図2は本発明の第2の実施例であ
るスパッタ装置の一部概念図であり、図3は本発明の第
3の実施例であるスパッタ装置の一部概念図であり、図
4は本発明のスパッタ装置に用いることができる本発明
のガス導入管の上面図、そして図5は図4に示したガス
導入管を図1に示したスパッタ装置1Aに装着した状態
の一部を示していて、図4のガス導入管のA−A線上で
切断した断面図である。なお、以下の説明においては、
従来技術のスパッタ装置1の構成部分と同一の部分には
同一の符号を付して説明する。
EXAMPLES Next, the sputtering apparatus of the present invention will be described with reference to the drawings. 1 is a conceptual diagram of a sputtering apparatus that is a first embodiment of the present invention, FIG. 2 is a partial conceptual diagram of a sputtering apparatus that is a second embodiment of the present invention, and FIG. It is a partial conceptual diagram of the sputtering apparatus which is a 3rd Example, FIG. 4 is a top view of the gas introduction pipe of this invention which can be used for the sputtering apparatus of this invention, and FIG. 5 is the gas shown in FIG. FIG. 5 is a cross-sectional view taken along the line AA of the gas introduction pipe of FIG. 4, showing a part of a state in which the introduction pipe is attached to the sputtering apparatus 1A shown in FIG. 1. In the following explanation,
The same parts as those of the conventional sputtering device 1 are designated by the same reference numerals in the following description.

【0017】図1において、符号1Aは全体として本発
明の第1の実施例であるスパッタ装置1Aを指す。この
スパッタ装置1Aは、従来技術のスパッタ装置1と同様
に、外筐2で囲まれた一つの部屋の内部を仕切板3A、
3Bで仕切って、真空槽4と成膜室5とが形成されてい
る。仕切板3Aは外筐2の天井から垂直に下がって部屋
の中程まで仕切っており、この仕切板3Aとやや真空槽
4寄りの水平位置の前記外筐2の床から垂直に起立して
部屋の中程まで仕切っており、両者の自由端間で窓6を
形成している。
In FIG. 1, reference numeral 1A generally indicates a sputtering apparatus 1A according to the first embodiment of the present invention. This sputtering device 1A, like the sputtering device 1 of the prior art, divides the inside of one room surrounded by the outer casing 2 into a partition plate 3A,
A vacuum chamber 4 and a film forming chamber 5 are formed by partitioning with 3B. The partition plate 3A vertically descends from the ceiling of the outer casing 2 and partitions to the middle of the room. The partition plate 3A stands vertically from the floor of the outer casing 2 in a horizontal position slightly near the vacuum chamber 4 and the room. The window 6 is formed between the two free ends.

【0018】真空槽4の内部には、被表面処理加工物支
持装置である円筒状の冷却キャン7がその一部の外周面
を前記窓6から前記成膜室5に露出した状態で支持され
ており、そしてこの状態の冷却キャン7の約半周面にわ
たって、真空槽4の左上方位置で支持されている供給ロ
ール8の長尺の高分子フィルムFaを巻き付け、そして
後述するスパッタされた高分子フィルムFbを、真空槽
4の左下方位置で支持されている巻取ロール9で巻き取
るように構成されている。
Inside the vacuum chamber 4, a cylindrical cooling can 7, which is a device for supporting a surface-treated workpiece, is supported with a part of its outer peripheral surface exposed to the film forming chamber 5 through the window 6. In this state, the long polymer film Fa of the supply roll 8 supported at the upper left position of the vacuum chamber 4 is wound around the half circumference surface of the cooling can 7, and the sputtered polymer described later is used. The film Fb is configured to be wound by the winding roll 9 supported at the lower left position of the vacuum chamber 4.

【0019】前記成膜室5には、前記窓6からこの成膜
室5に露出している冷却キャン7の一部外周面に向かっ
てカソード電極10が配設されており、そしてまたこれ
ら両者間でカソード電極10の周辺部を覆う防着マスク
11が配設されている。そしてこのスパッタ装置1Aに
おいては、図4及び図5を用いて説明する、本発明のス
パッタ装置1Aに用いて好適な後記のガス導入管20を
前記防着マスク11の上部外方に配設し、スパッタリン
グガスを窓6に露出している冷却キャン7と防着マスク
11との間隙に噴出せるようにした。
In the film forming chamber 5, a cathode electrode 10 is arranged from the window 6 toward a part of the outer peripheral surface of the cooling can 7 exposed in the film forming chamber 5, and both of them. An adhesion-preventing mask 11 that covers the periphery of the cathode electrode 10 is provided between them. Further, in this sputtering apparatus 1A, a gas introduction tube 20 described later, which is suitable for the sputtering apparatus 1A of the present invention, which will be described with reference to FIGS. 4 and 5, is provided outside the upper part of the deposition mask 11. The sputtering gas was made to be able to be ejected into the gap between the cooling can 7 exposed to the window 6 and the deposition mask 11.

【0020】前記真空槽4の床及び前記成膜室5の床に
は、従来技術のスパッタ装置1と同様に、それぞれ開口
13、14が開けられていて、それぞれの開口13、1
4には排気装置15、16が接続されている。
Like the prior art sputtering apparatus 1, the floor of the vacuum chamber 4 and the floor of the film forming chamber 5 are provided with openings 13 and 14, respectively.
Exhaust devices 15 and 16 are connected to 4.

【0021】このような構成のスパッタ装置1Aを用い
て、高分子フィルムに既に成膜されている磁性層の表面
に保護膜を成膜する場合には、従来技術のスパッタ装置
1と同様に、前記供給ロール8に磁性層が成膜された高
分子フィルムFaを装着し、この高分子フィルムFaを
前記冷却キャン7の約半周にわたって巻き付け、そして
その端部を巻取ロール9で巻き取れるようにする。一
方、前記カソード電極10にはターゲットTとして保護
膜材料を装着する。このように準備した後、前記各排気
装置15、16を作動させて前記真空槽4を、例えば、
10パスカル程度に、そして成膜室5を1パスカル程度
に減圧し、カソード電極10に電圧を印加し、また、前
記ガス導入管20から、例えば、アルゴンガスを冷却キ
ャン7と防着マスク11との間隙に噴出させる。
When the protective film is formed on the surface of the magnetic layer already formed on the polymer film by using the sputtering apparatus 1A having such a structure, as in the conventional sputtering apparatus 1, A polymer film Fa on which a magnetic layer is formed is mounted on the supply roll 8, the polymer film Fa is wound around about half the circumference of the cooling can 7, and the end thereof can be wound by a winding roll 9. To do. On the other hand, a protective film material is mounted as a target T on the cathode electrode 10. After preparing in this manner, the exhaust devices 15 and 16 are operated to move the vacuum chamber 4 to, for example,
The film formation chamber 5 is depressurized to about 10 Pascal, the voltage is applied to the cathode electrode 10, and argon gas is supplied from the gas introduction pipe 20 to the cooling can 7 and the deposition mask 11. Squirt into the gap.

【0022】次に、前記窓6の近傍にプラズマPが発生
した状態で前記冷却キャン7などを矢印Rの方向に回転
駆動し始め、前記高分子フィルムFaを所定の速度で走
行させ、前記窓6の部分から成膜室5に露出している高
分子フィルムFaの前記磁性層の表面に保護膜材をスパ
ッタし、磁性層の表面に成膜する。
Next, with the plasma P generated in the vicinity of the window 6, the cooling can 7 and the like are started to rotate in the direction of the arrow R, and the polymer film Fa is run at a predetermined speed, and the window is opened. A protective film material is sputtered on the surface of the magnetic layer of the polymer film Fa exposed in the film forming chamber 5 from the portion 6 to form a film on the surface of the magnetic layer.

【0023】前記のように、本発明のスパッタ装置1A
では、前記ガス導入管20を防着マスク11の上部外方
に配設し、スパッタリングガスを冷却キャン7と防着マ
スク11との間隙に噴出させるようにしたので、スパッ
タ粒子がガス導入管20に全く付着しない。
As described above, the sputtering apparatus 1A of the present invention
Since the gas introducing pipe 20 is arranged outside the upper part of the deposition mask 11 so that the sputtering gas is ejected into the gap between the cooling can 7 and the deposition mask 11, the sputtered particles will be sputtered by the gas introduction pipe 20. Does not stick to

【0024】次に、図2を用いて、本発明の第2の実施
例であるスパッタ装置1Bを説明する。このスパッタ装
置1Bではガス導入管20を上方の仕切板3Aの成膜室
5側の下端部分に配設した構成が前記スパッタ装置1A
と異なるだけで、その他の構成はスパッタ装置1Aの構
成と同一である。
Next, referring to FIG. 2, a sputtering apparatus 1B which is a second embodiment of the present invention will be described. In the sputtering apparatus 1B, the gas introduction pipe 20 is arranged at the lower end portion of the upper partition plate 3A on the film forming chamber 5 side in the sputtering apparatus 1A.
The other configuration is the same as the configuration of the sputtering apparatus 1A except for the above.

【0025】従って、このスパッタ装置1Aも、ガス導
入管20からのスパッタリングガスを窓6部分に露出し
ている冷却キャン7と防着マスク11との間隙に噴出せ
ることができるので、スパッタ粒子がガス導入管20に
全く付着しない。
Therefore, in this sputtering apparatus 1A as well, the sputtering gas from the gas introduction tube 20 can be jetted into the gap between the cooling can 7 exposed at the window 6 and the deposition mask 11, so that sputtered particles are generated. It does not adhere to the gas introduction pipe 20 at all.

【0026】図3には、前記二実施例とは異なる本発明
の第3の実施例であるスパッタ装置1Cを示した。この
スパッタ装置1Cにおいては、ガス導入管20を上方の
防着マスク11の内面に配設し、スパッタリングガスを
前記窓6部分に露出している冷却キャンとその防着マス
ク11との間隙に噴出させるように構成した。従って、
このスパッタ装置1Cにおいても、スパッタ粒子がガス
導入管20に全く付着しない。
FIG. 3 shows a sputtering apparatus 1C which is a third embodiment of the present invention different from the above two embodiments. In this sputtering apparatus 1C, the gas introduction pipe 20 is arranged on the inner surface of the upper deposition mask 11, and the sputtering gas is ejected into the gap between the cooling can exposed in the window 6 and the deposition mask 11. Configured to let. Therefore,
Also in this sputtering apparatus 1C, sputtered particles do not adhere to the gas introduction pipe 20 at all.

【0027】次に、図4及び図5を用いて、前記の各ス
パッタ装置に用いて好適な本発明のガス導入管20の実
施例を説明する。この実施例のガス導入管20は高分子
フィルムFaの幅より広い幅がある長方形の平板な本体
21とこの本体21と同形状であるが薄い平板な蓋体2
6とが合わせられ、その蓋体26の表面の一側辺に沿っ
て固定された幅広のフード27とから構成されている。
Next, with reference to FIGS. 4 and 5, an embodiment of the gas introducing pipe 20 of the present invention, which is suitable for use in each of the above-mentioned sputtering apparatuses, will be described. The gas introducing pipe 20 of this embodiment has a rectangular flat plate main body 21 having a width wider than that of the polymer film Fa and a thin flat plate cover 2 having the same shape as the main body 21.
6 and a wide hood 27 fixed along one side of the surface of the lid 26.

【0028】前記本体21の一平面には、その一長辺の
中央部から始まり、両短辺に向けそのほぼ全幅に広がっ
て比較的浅くトーナメント状に分岐して彫られた第1の
凹溝とこの第1のトーナメント状凹溝の全末端に隣接
し、全末端が導通するように、第1の凹溝より深く彫ら
れた一本の直方体状の第2の凹溝とこの第2の凹溝の一
側縁の全長で導通し、前記一長辺と反対側に在る他の長
辺側の一側辺部に、そのほぼ全幅に広がった前記トーナ
メント状の第1の凹溝の深さより遙に浅く彫られ第3の
凹溝と前記第1の凹溝の最先端に開けられた一本の貫通
孔とが形成されている。
On one plane of the main body 21, there is formed a first concave groove that is carved from a central portion of one long side thereof, spreads over almost the entire width toward both short sides, and is branched relatively shallowly into a tournament shape. Adjacent to all the ends of the first tournament-shaped groove, and one second rectangular parallelepiped groove deeper than the first groove so that all the ends are electrically connected, and this second groove. The tournament-shaped first recessed groove which is conducted over the entire length of one side edge of the recessed groove and which is spread over almost the entire width of the one side edge portion on the other long side opposite to the one long side. A third groove and a single through hole formed at the tip of the first groove are formed so that the groove is much shallower than the depth.

【0029】このように加工された本体21の一平面に
前記蓋体26を合わせて固定すると、前記第1の凹溝の
部分ではトーナメント状管路22が、前記第2の凹溝の
部分ではガス溜まり23が、前記第3の凹溝の部分では
僅かな隙間が開いた吹き出しスリット24が形成され、
そして前記貫通孔はガス供給管受け25となる。そし
て、前記蓋体26の前記吹き出しスリット24側部分の
表面に形成された浅い段部には、前記吹き出しスリット
25から延長して、前記トーナメント状管路22の全幅
を越える幅のフード27が固定されている。
When the lid 26 is fitted and fixed to one flat surface of the main body 21 thus processed, the tournament-shaped conduit 22 is formed in the first concave groove portion, and the second concave groove portion is formed. In the gas reservoir 23, a blowing slit 24 having a slight gap is formed in the third groove portion,
The through hole serves as a gas supply pipe receiver 25. Then, a hood 27 extending from the blowing slit 25 and having a width exceeding the entire width of the tournament-shaped conduit 22 is fixed to a shallow step portion formed on the surface of the lid 26 on the blowing slit 24 side. Has been done.

【0030】図5には、このような構造のガス導入管2
0を図1に示した第1の実施例のスパッタ装置1Aに装
着したところを示した。ただし、スパッタ装置1Aはそ
の一部だけを示すに留めた。即ち、蓋体26側を上に、
本体21側を下にし、フード27の先端部を仕切板3A
に接近させた位置関係で前記防着マスク11の外側の表
面に固定し、前記ガス供給管受け25にガス供給管30
を接続した。
FIG. 5 shows the gas introduction pipe 2 having such a structure.
0 is attached to the sputtering apparatus 1A of the first embodiment shown in FIG. However, only a part of the sputtering apparatus 1A is shown. That is, with the lid 26 side up,
With the body 21 side down, the front end of the hood 27 is separated by the partition plate 3A.
Is fixed to the outer surface of the deposition-inhibitory mask 11 in a positional relationship of being close to
Connected.

【0031】従って、このような構造のガス導入管20
を用いて、そのガス供給管30から、例えば、アルゴン
ガスなどのスパッタリングガスを供給すると、そのスパ
ッタリングガスはトーナメント状管路22により等分圧
でガス溜まり24に供給され、そして吹き出しスリット
24から均一に吹き出され、更にフード27により前記
冷却キャン7と防着マスク11との間隙に導かれ、前記
窓6部分に露出している高分子フィルムFaの全幅にわ
たって均一に噴出させることができる。このため高分子
フィルムFaに堆積する薄膜は膜質、膜厚共に均一なも
のとなる。また、ガス導入管20は防着マスク11の外
側に位置しているのでスパッタ粒子により汚染されるこ
とがない。なお、スパッタリングが終了したスパッタリ
ングガスは排気装置15、16で前記真空槽4及び成膜
室5の外部に排気される。
Therefore, the gas introducing pipe 20 having such a structure.
When, for example, a sputtering gas such as argon gas is supplied from the gas supply pipe 30, the sputtering gas is supplied to the gas reservoir 24 at an equal partial pressure by the tournament-shaped conduit 22, and is uniformly discharged from the blowing slit 24. Further, the polymer film Fa can be blown out to the gap between the cooling can 7 and the deposition mask 11 by the hood 27, and can be jetted uniformly over the entire width of the polymer film Fa exposed at the window 6 portion. Therefore, the thin film deposited on the polymer film Fa has uniform film quality and film thickness. Further, since the gas introduction pipe 20 is located outside the deposition mask 11, it is not contaminated by sputtered particles. The sputtering gas after the sputtering is exhausted to the outside of the vacuum chamber 4 and the film forming chamber 5 by the exhaust devices 15 and 16.

【0032】スパッタリングガスとして反応性ガスを用
いると、反応性スパッタを行うことができる。例えば、
前記ガス供給管30から反応性ガスとして窒素ガスN2
を供給し、ターゲットTにシリコンSiを用いてスパッ
タを行うと、被表面処理加工物の表面に絶縁薄膜である
シリコンナイトライトを成膜することができる。
Reactive sputtering can be performed by using a reactive gas as the sputtering gas. For example,
Nitrogen gas N 2 as a reactive gas from the gas supply pipe 30
And the target T is sputtered using silicon Si, a silicon nitrite, which is an insulating thin film, can be formed on the surface of the surface-treated workpiece.

【0033】[0033]

【発明の効果】以上、説明したように、本発明のスパッ
タ装置及びスパッタリングガス導入管によれば、 1.カソード電極付近にスパッタ膜が堆積する要素が少
なくなるのでアーキング回数が減り、そのためダストの
発生が減少し、ドロップアウトの少ないスパッタ膜が得
られる 2.また、幅方向に均一なガス濃度を発生させることが
できるので、膜厚、膜質ともに均一なスパッタ膜を得る
ことができる 3.そしてカソード電極の内部や裏側に局所的にガス圧
が高い部分が無くなるため、異常放電が減少する 4.また、ガス導入管などにスパッタ膜が堆積したいた
め、これらをクリーニングするなどの保守の手間が省け
るなど、数々の優れた効果が得られる。
As described above, according to the sputtering apparatus and the sputtering gas introduction pipe of the present invention, 1. The number of arcing times is reduced because the number of elements that deposit the sputtered film near the cathode electrode is reduced, so that the generation of dust is reduced and a sputtered film with less dropout is obtained. Moreover, since a uniform gas concentration can be generated in the width direction, a sputtered film having a uniform film thickness and film quality can be obtained. Since there is no locally high gas pressure inside or on the back side of the cathode electrode, abnormal discharge is reduced. Further, since it is desired to deposit the sputtered film on the gas introduction pipe or the like, it is possible to obtain various excellent effects such as saving the labor of maintenance such as cleaning these.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の第1の実施例であるスパッタ装置の
概念図である。
FIG. 1 is a conceptual diagram of a sputtering apparatus that is a first embodiment of the present invention.

【図2】 本発明の第2の実施例であるスパッタ装置の
一部概念図である。
FIG. 2 is a partial conceptual diagram of a sputtering apparatus that is a second embodiment of the present invention.

【図3】 本発明の第3の実施例であるスパッタ装置の
一部概念図である。
FIG. 3 is a partial conceptual diagram of a sputtering apparatus that is a third embodiment of the present invention.

【図4】 本発明のスパッタ装置に用いることができる
本発明のスパッタリングガス導入管の上面図である。
FIG. 4 is a top view of a sputtering gas introduction tube of the present invention that can be used in the sputtering apparatus of the present invention.

【図5】 図4に示したスパッタリングガス導入管を図
1に示したスパッタ装置1Aに装着した状態の一部を示
していて、図4のスパッタリングガス導入管のA−A線
上で切断した断面図である。
5 shows a part of a state in which the sputtering gas introduction pipe shown in FIG. 4 is attached to the sputtering apparatus 1A shown in FIG. 1, and is a cross section taken along line AA of the sputtering gas introduction pipe in FIG. It is a figure.

【図6】 従来技術のスパッタ装置の概念図である。FIG. 6 is a conceptual diagram of a conventional sputtering device.

【符号の説明】[Explanation of symbols]

Fa 高分子フィルム T ターゲット P プラズマ 1A 本発明の第1の実施例であるスパッタ装置 1B 本発明の第2の実施例であるスパッタ装置 1C 本発明の第3の実施例であるスパッタ装置 2 外筐 3A 仕切板 3B 仕切板 4 真空槽 5 成膜室 6 窓 7 冷却キャン 8 供給ロール 9 巻取ロール 10 カソード電極 11 防着マスク 13 開口 14 開口 15 排気装置 16 排気装置 20 スパッタリングガス導入管(ガス導入管) 21 本体 22 トーナメント状管路 23 ガス溜まり 24 吹き出しスリット 25 ガス供給管受け 26 蓋体 27 フード 30 ガス供給管 Fa polymer film T target P plasma 1A Sputtering device which is the first embodiment of the present invention 1B Sputtering device which is the second embodiment of the present invention 1C Sputtering device which is the third embodiment of the present invention 2 Outer casing 3A Partition plate 3B Partition plate 4 Vacuum tank 5 Film forming chamber 6 Window 7 Cooling can 8 Supply roll 9 Winding roll 10 Cathode electrode 11 Deposition mask 13 Opening 14 Opening 15 Exhaust device 16 Exhaust device 20 Sputtering gas introducing pipe (gas introducing 21) Main body 22 Tournament-like conduit 23 Gas reservoir 24 Blow-off slit 25 Gas supply pipe receiver 26 Lid 27 Hood 30 Gas supply pipe

Claims (9)

【特許請求の範囲】[Claims] 【請求項1】 カソード電極、このカソード電極に対向
して配設された被表面処理加工物支持装置、前記カソー
ド電極の周辺部に配設された防着マスク、スパッタリン
グガス導入管を成膜室内に配置してなるスパッタ装置に
おいて、該スパッタリングガス導入管を前記防着マスク
側に配設し、スパッタリングガスを前記被表面処理加工
物支持装置と前記防着マスクとの間隙に噴出させて、前
記被表面処理加工物の表面に薄膜を成膜できるように構
成したことを特徴とするスパッタ装置。
1. A deposition chamber in which a cathode electrode, a surface-treated workpiece supporting device disposed facing the cathode electrode, a deposition mask disposed in the peripheral portion of the cathode electrode, and a sputtering gas introduction pipe are provided. In the sputtering apparatus arranged in the above, the sputtering gas introduction pipe is arranged on the side of the deposition mask, and the sputtering gas is ejected into the gap between the surface-treated workpiece supporting device and the deposition mask, A sputtering apparatus characterized in that a thin film can be formed on the surface of a surface-treated workpiece.
【請求項2】 前記スパッタリングガス導入管を前記防
着マスクの外方に配設し、スパッタリングガスを前記被
表面処理加工物支持装置と前記防着マスクとの間隙に噴
出させることを特徴とする請求項1に記載のスパッタ装
置。
2. The sputtering gas introduction pipe is arranged outside the deposition mask, and the sputtering gas is ejected into a gap between the surface-treated workpiece supporting device and the deposition mask. The sputtering apparatus according to claim 1.
【請求項3】 前記スパッタリングガス導入管を前記防
着マスクの内面に配設し、スパッタリングガスを前記被
表面処理加工物支持装置と前記防着マスクとの間隙に噴
出させることを特徴とする請求項1に記載のスパッタ装
置。
3. The sputtering gas introducing pipe is arranged on an inner surface of the deposition mask, and the sputtering gas is ejected into a gap between the surface-treated workpiece supporting device and the deposition mask. Item 1. The sputtering apparatus according to Item 1.
【請求項4】 窓が上下一対の仕切板で形成され、かつ
空間が仕切られた部屋の一方の部屋の前記窓の近傍に被
表面処理加工物支持装置を配設し、前記被表面処理加工
物支持装置に対向する位置で前記他方の部屋の前記窓の
近傍にカソード電極と、該カソード電極と前記被表面処
理加工物支持装置との間の位置に、前記カソード電極の
周辺部に配設された防着マスクとスパッタリングガス導
入管を配置してなるスパッタ装置において、前記スパッ
タリングガス導入管を前記上側の仕切板に配設し、スパ
ッタリングガスを前記被表面処理加工物支持装置と前記
防着マスクとの間隙に噴出させて、前記被表面処理加工
物の表面に薄膜を成膜できるように構成したことを特徴
とするスパッタ装置。
4. A surface-treated workpiece supporting device is disposed in the vicinity of the window in one of the rooms in which the window is formed by a pair of upper and lower partition plates and the space is partitioned, and the surface-treated workpiece is processed. A cathode electrode near the window of the other chamber at a position facing the object support device, and a position between the cathode electrode and the surface-treated workpiece support device, disposed in the peripheral portion of the cathode electrode. In the sputtering apparatus having the deposition mask and the sputtering gas introduction tube arranged as described above, the sputtering gas introduction tube is arranged on the upper partition plate, and the sputtering gas is attached to the surface-treated workpiece supporting device and the deposition target. A sputtering apparatus, characterized in that a thin film can be formed on the surface of the surface-treated workpiece by being ejected into a gap between the mask and the mask.
【請求項5】 前記スパッタリングガス導入管はトーナ
メント状管路で構成されていることを特徴とする請求項
1乃至4に記載のスパッタ装置。
5. The sputtering apparatus according to claim 1, wherein the sputtering gas introduction pipe is configured by a tournament-shaped pipe line.
【請求項6】 前記被表面処理加工物は長尺の高分子フ
ィルム状シートであり、前記被表面処理加工物支持装置
は円筒状の回転する冷却キャンで構成されていて、この
冷却キャンの一部周面で前記高分子フィルム状シートを
順次支持、供給し、この支持された高分子フィルム状シ
ートと前記防着マスクとの間隙に前記スパッタリングガ
ス導入管からスパッタリングガスを供給することを特徴
とする請求項1乃至5に記載のスパッタ装置。
6. The surface-treated workpiece is a long polymer film sheet, and the surface-treated workpiece supporting device is composed of a cylindrical rotating cooling can. One of the cooling cans is a cooling can. It is characterized in that the polymer film-like sheet is sequentially supported and supplied on the peripheral surface, and the sputtering gas is supplied from the sputtering gas introduction pipe into the gap between the supported polymer film-like sheet and the deposition mask. The sputtering apparatus according to any one of claims 1 to 5.
【請求項7】 前記トーナメント状管路からなるスパッ
タリングガス導入管が前記高分子フィルム状シートの全
幅にわたって延設されていることを特徴とする請求項6
に記載のスパッタ装置。
7. The sputtering gas introducing pipe formed of the tournament-shaped conduit extends over the entire width of the polymer film-like sheet.
2. The sputtering apparatus according to 1.
【請求項8】 前記被表面処理加工物に成膜される薄膜
は磁気記録薄膜及び又は保護薄膜であることを特徴とす
る請求項1乃至7に記載のスパッタ装置。
8. The sputtering apparatus according to claim 1, wherein the thin film formed on the surface-treated workpiece is a magnetic recording thin film and / or a protective thin film.
【請求項9】 第1の一対の辺と第2の一対の辺とから
なる四辺形の平板な本体の一平面に、前記第1の一対の
一辺の中央部から始まり、前記第2の一対の両辺に向
け、そのほぼ全幅に広がって比較的浅くトーナメント状
に分岐して彫られた第1の凹溝とこの第1のトーナメン
ト状凹溝の全末端に隣接し、全末端が導通するように、
第1の凹溝より深く彫られた一本の第2の凹溝とこの第
2の凹溝の一側縁の全長で導通し、前記第1の一対の一
辺と反対側に在る一側辺部に、そのほぼ全幅に広がった
前記トーナメント状の第1の凹溝の深さより遙に浅く彫
られ第3の凹溝と前記第1の凹溝の最先端に開けられた
一本の貫通孔とが形成されていて、該本体と同形状の平
板な蓋体を合体、固定して、前記第1の凹溝の部分でト
ーナメント状管路を、前記第2の凹溝の部分でガス溜ま
りを、前記第3の凹溝の部分で僅かな隙間が開いた吹き
出しスリットを形成し、該吹き出しスリット側の蓋体の
表面の一側辺に沿って前記トーナメント状管路の全幅を
越える幅のフードを固定し、そして前記貫通孔にガス供
給管を接続して構成されていることを特徴とするガス供
給管。
9. A flat plate main body of a quadrilateral comprising a first pair of sides and a second pair of sides, on one plane of the main pair, starting from the central portion of the first pair of sides, the second pair of sides. To the both sides of the first groove adjacent to all the ends of the first tournament groove and the first groove that is carved in a tournament shape that is relatively shallow and spreads over almost the entire width, so that all the terminals are conductive. To
One second groove that is deeper than the first groove and is continuous with the entire length of one side edge of the second groove and that is on the opposite side of the first pair of sides. A single penetrating hole formed on the edge of the third groove and the first groove, which is carved much shallower than the depth of the tournament-shaped first groove that spreads over almost the entire width of the side portion. A flat lid having the same shape as that of the main body is joined and fixed, and a tournament-shaped conduit is formed at the first concave groove portion, and a gas is formed at the second concave groove portion. A width that exceeds the entire width of the tournament-shaped conduit along one side of the surface of the lid body on the side of the blowing slit is formed by forming a blowing slit with a slight gap at the third groove. The gas supply pipe is configured by fixing the hood of, and connecting the gas supply pipe to the through hole.
JP30751094A 1994-12-12 1994-12-12 Sputtering equipment Expired - Fee Related JP3646330B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30751094A JP3646330B2 (en) 1994-12-12 1994-12-12 Sputtering equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30751094A JP3646330B2 (en) 1994-12-12 1994-12-12 Sputtering equipment

Publications (2)

Publication Number Publication Date
JPH08165573A true JPH08165573A (en) 1996-06-25
JP3646330B2 JP3646330B2 (en) 2005-05-11

Family

ID=17969949

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30751094A Expired - Fee Related JP3646330B2 (en) 1994-12-12 1994-12-12 Sputtering equipment

Country Status (1)

Country Link
JP (1) JP3646330B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001107231A (en) * 1999-10-01 2001-04-17 Toppan Printing Co Ltd Sputtering film deposition equiment, and fabrication of photomask blank using the same
JP2016008348A (en) * 2014-06-26 2016-01-18 住友金属鉱山株式会社 Gas emission unit, and film deposition apparatus comprising the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001107231A (en) * 1999-10-01 2001-04-17 Toppan Printing Co Ltd Sputtering film deposition equiment, and fabrication of photomask blank using the same
JP2016008348A (en) * 2014-06-26 2016-01-18 住友金属鉱山株式会社 Gas emission unit, and film deposition apparatus comprising the same

Also Published As

Publication number Publication date
JP3646330B2 (en) 2005-05-11

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