JPH0814591B2 - Circuit element measuring device terminal connection state detection circuit - Google Patents
Circuit element measuring device terminal connection state detection circuitInfo
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- JPH0814591B2 JPH0814591B2 JP8266289A JP8266289A JPH0814591B2 JP H0814591 B2 JPH0814591 B2 JP H0814591B2 JP 8266289 A JP8266289 A JP 8266289A JP 8266289 A JP8266289 A JP 8266289A JP H0814591 B2 JPH0814591 B2 JP H0814591B2
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- measurement
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- switch
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Description
【発明の詳細な説明】 (a)発明の技術分野 この発明は、四端子構成の回路素子測定器において、
各測定端子と測定素子の電気的接触を確認し、かつ、測
定素子に接続される接続径路のインピーダンスが測定で
きるようにしたものである。Description: (a) Technical Field of the Invention The present invention relates to a circuit element measuring instrument having a four-terminal configuration,
The electrical contact between each measuring terminal and the measuring element is confirmed, and the impedance of the connection path connected to the measuring element can be measured.
(b)従来技術と問題点 次に、第4図を参照して、四端子構成の回路素子測定
器の構成を説明する。(B) Prior Art and Problems Next, with reference to FIG. 4, the configuration of a circuit element measuring instrument having a four-terminal configuration will be described.
第4図の1は測定用の信号源、2は電流制限用の抵
抗、8は電流/電圧変換器、9は電圧検出器、11〜14は
測定端子、20は測定素子、21〜24は接続端子である。In FIG. 4, 1 is a signal source for measurement, 2 is a resistor for limiting current, 8 is a current / voltage converter, 9 is a voltage detector, 11 to 14 are measuring terminals, 20 is a measuring element, and 21 to 24 are It is a connection terminal.
電流/電圧変換器8は、演算増幅器8A、基準抵抗8B、
差動増幅器8Cで構成され、電圧検出器9は差動増幅器で
構成されている。The current / voltage converter 8 includes an operational amplifier 8A, a reference resistor 8B,
It is composed of a differential amplifier 8C, and the voltage detector 9 is composed of a differential amplifier.
第4図では、測定素子20の端子20Aに測定端子11・12
を接続し、測定素子20の端子20Bに測定端子13・14を接
続し、信号源1の信号を測定端子11に供給し、測定素子
20に流れる信号電流を測定端子13・14に接続する電流/
電圧変換器8で検出するとともに、測定素子20の端子間
電圧を測定端子12・13に接続する電圧検出器9で検出す
る。In FIG. 4, measuring terminals 11 and 12 are connected to terminal 20A of measuring element 20.
, Connect the measuring terminals 13 and 14 to the terminal 20B of the measuring element 20, supply the signal of the signal source 1 to the measuring terminal 11,
Current that connects the signal current flowing in 20 to measuring terminals 13 and 14 /
The voltage is detected by the voltage converter 8 and the inter-terminal voltage of the measuring element 20 is detected by the voltage detector 9 connected to the measuring terminals 12 and 13.
測定端子11〜14と測定素子20の間の接続には、測定ジ
グなどを使用し、ケーブル等で接続する。A measurement jig or the like is used for the connection between the measurement terminals 11 to 14 and the measurement element 20, and the connection is made with a cable or the like.
第4図では、測定端子11〜14から測定素子20に対する
接続端子を21〜24とする。In FIG. 4, the connection terminals from the measurement terminals 11 to 14 to the measurement element 20 are 21 to 24.
正常に接続されている場合は、測定端子11と接続端子
21、測定端子12と接続端子22はそれぞれ同電位になり、
測定素子20の端子20Aに接続される。また、測定端子13
と接続端子23、測定端子14と接続端子24はそれぞれ同電
位になり、測定素子20の端子20Bに接続される。If the connection is correct, connect the measurement terminal 11 and the connection terminal.
21, measuring terminal 12 and connection terminal 22 have the same potential,
It is connected to the terminal 20A of the measuring element 20. In addition, the measuring terminal 13
The connection terminal 23, the measurement terminal 14, and the connection terminal 24 have the same potential, and are connected to the terminal 20B of the measurement element 20.
しかし、ケーブルの断線や、接触不良等で、接続端子
21〜24が確実に測定素子20に接続されない場合があり、
正しい測定ができないことがある。However, due to the disconnection of the cable or poor contact, the connection terminal
21 to 24 may not be securely connected to the measuring element 20,
Correct measurement may not be possible.
例えば、測定端子11と接続端子21の間だけが断線の場
合は、測定素子20には測定信号が供給されなくなり、測
定素子20の両端子間電圧は0Vとして検出され、測定素子
20に流れる信号電流は0Aとして検出され、インピーダン
ス不定として測定される。For example, when the disconnection is only between the measurement terminal 11 and the connection terminal 21, the measurement signal is not supplied to the measurement element 20, the voltage between both terminals of the measurement element 20 is detected as 0V, the measurement element
The signal current flowing through 20 is detected as 0A and is measured as the impedance is indefinite.
また、測定端子14と接続端子24の間だけが断線の場合
は、演算増幅器8Aの帰還径路が断となり、測定素子20の
端子20Bを仮想接地電位に保てなくなる。If only the measurement terminal 14 and the connection terminal 24 are broken, the feedback path of the operational amplifier 8A is broken, and the terminal 20B of the measurement element 20 cannot be maintained at the virtual ground potential.
この状態では、測定端子13の測定装置側の入力インピ
ーダンスがある値なので、微小電流が接続端子23から測
定端子13へ流れ、測定素子20の端子間電圧は、ある有限
の値を示し、測定端子14が開放状態なので、基準抵抗8B
には帰還電流が流れなくなり、信号電流は0Aとして検出
される。In this state, since the input impedance of the measuring device 13 on the measuring device side has a certain value, a minute current flows from the connecting terminal 23 to the measuring terminal 13, and the terminal voltage of the measuring element 20 shows a certain finite value. Since 14 is open, reference resistance 8B
The feedback current stops flowing through and the signal current is detected as 0A.
したがって、測定インピーダンスは、無限大となり正
しい測定値が得られないことになる。Therefore, the measured impedance becomes infinite and a correct measured value cannot be obtained.
さらに、測定端子12と接続端子22の間だけが断線の場
合は、測定端子12が開放状態となり、測定素子20の端子
間電圧は0Vとして検出され、測定素子20に流れる信号電
流は、ある有限の値として検出され、インピーダンスは
0Ωとして測定される。Furthermore, when only the measurement terminal 12 and the connection terminal 22 are disconnected, the measurement terminal 12 is in an open state, the inter-terminal voltage of the measurement element 20 is detected as 0 V, and the signal current flowing through the measurement element 20 is a finite value. The impedance is measured as 0Ω and the impedance is measured as 0Ω.
また、測定端子13と接続端子23の間だけが断線の場合
は、演算増幅器8Aの帰還径路が断になり、演算増幅器8A
が発生する信号で決まるある有限の信号電流が基準抵抗
8Bに流れ、測定端子12の電圧は、この信号電流で決定さ
れる値となる。If only the measurement terminal 13 and the connection terminal 23 are disconnected, the feedback path of the operational amplifier 8A is disconnected and the operational amplifier 8A
A finite signal current determined by the signal generated by the reference resistance
8B, the voltage of the measuring terminal 12 becomes a value determined by this signal current.
したがって、この場合には、測定インピーダンスはあ
る値が得られるが、測定素子20のインピーダンスとは一
致しない値になる。Therefore, in this case, the measured impedance has a certain value, but does not match the impedance of the measuring element 20.
これらは、それぞれ単独で発生する異常接続状態であ
るが、これらが組み合わさって発生する場合もある。These are abnormal connection states that occur independently of each other, but they may occur in combination.
(c)発明の目的 この発明は、測定素子20の端子20Aに接続される測定
端子11と接続端子21、測定端子12と接続端子22につい
て、測定端子11・12間に設けたスイッチを開放したとき
と短絡したときとで導通試験と接続径路のインピーダン
スを測定し、次に、測定素子20の端子20Bに接続される
測定端子13と接続端子23、接続端子24と測定端子14につ
いて、測定端子13・14間に設けたスイッチを開放したと
きと短絡したときとで導通試験と接続径路のインピーダ
ンスを測定し、導通試験の結果と、接続径路のインピー
ダンスの測定値から、正しく接続されていることを判断
する回路素子測定器の端子接続状態検出回路の提供を目
的とする。(C) Object of the Invention According to the present invention, for the measurement terminal 11 and the connection terminal 21, and the measurement terminal 12 and the connection terminal 22 connected to the terminal 20A of the measurement element 20, the switches provided between the measurement terminals 11 and 12 are opened. The continuity test and the impedance of the connection path are measured at time and when short-circuited, and then the measurement terminal 13 and the connection terminal 23, which are connected to the terminal 20B of the measurement element 20, the connection terminal 24 and the measurement terminal 14, the measurement terminal The continuity test and the impedance of the connection path are measured when the switch provided between 13 and 14 is opened and when the switch is short-circuited, and the connection is correct based on the continuity test result and the measured value of the impedance of the connection path. It is an object of the present invention to provide a terminal connection state detection circuit of a circuit element measuring device for determining whether or not.
(d)発明の実施例 次に、この発明による実施例の構成図を第1図に示
す。(D) Embodiment of the Invention Next, FIG. 1 shows a configuration diagram of an embodiment according to the present invention.
第1図の3〜7はスイッチであり、その他の部分は第
4図と同じである。Switches 3 to 7 in FIG. 1 are the same as those in FIG. 4 in other parts.
スイッチ3は、信号源1の出力に、抵抗2を通して接
続され、スイッチ3の端子3Aは測定端子11に接続され、
端子3Bは測定端子13に接続される。The switch 3 is connected to the output of the signal source 1 through the resistor 2, the terminal 3A of the switch 3 is connected to the measuring terminal 11,
The terminal 3B is connected to the measuring terminal 13.
スイッチ4は測定端子11・12の間に設けられており、
スイッチ5は測定端子13・14の間に設けられている。The switch 4 is provided between the measuring terminals 11 and 12,
The switch 5 is provided between the measuring terminals 13 and 14.
スイッチ6は、基準抵抗8Bの一端に接続される。そし
て、スイッチ6の端子6Aは端子14に接続され、端子6Bは
測定端子12に接続される。The switch 6 is connected to one end of the reference resistor 8B. The terminal 6A of the switch 6 is connected to the terminal 14, and the terminal 6B is connected to the measuring terminal 12.
スイッチ7は、演算増幅器8Aの入力端子に接続され
る。そして、スイッチ7の端子7Aは測定端子13に接続さ
れ、端子7Bは演算増幅器8Aの帰還回路を構成する基準抵
抗8Bの一端に接続される。The switch 7 is connected to the input terminal of the operational amplifier 8A. The terminal 7A of the switch 7 is connected to the measurement terminal 13, and the terminal 7B is connected to one end of the reference resistor 8B that constitutes the feedback circuit of the operational amplifier 8A.
なお、第1図のスイッチ3〜7の端子接続は、通常測
定の場合の状態を示す。The terminal connection of the switches 3 to 7 in FIG. 1 shows the state in the case of normal measurement.
次に、第2図を参照して、測定端子11・12の間の導通
試験をする場合を説明する。Next, with reference to FIG. 2, a case of conducting a continuity test between the measuring terminals 11 and 12 will be described.
スイッチ3〜7は、第2図に示す位置にする。 The switches 3 to 7 are set to the positions shown in FIG.
測定素子20の端子20Aで、接続端子21と接続端子22が
正しく接続されていれば、測定信号電流i1は、スイッチ
3の端子3Aから、測定端子11→接続端子21→接続端子22
→測定端子12→スイッチ6の端子6Bの径路で流れる。If the connection terminal 21 and the connection terminal 22 are correctly connected at the terminal 20A of the measuring element 20, the measurement signal current i 1 is from the terminal 3A of the switch 3 to the measurement terminal 11 → the connection terminal 21 → the connection terminal 22.
→ Measurement terminal 12 → Flows in the path of terminal 6B of switch 6.
演算増幅器8Aには、スイッチ7で基準抵抗8Bが演算増
幅器8Aの帰還抵抗として接続されており、スイッチ6の
端子6B、すなわち、測定端子12が仮想接地電位となり、
差動増幅器8Cの出力には、電圧Ei1が出る。この電圧Ei1
は、ケーブル等のインピーダンスと接続端子21・22の接
続インピーダンスの総和をZHとすれば、式(1)で表さ
れる。The reference resistor 8B is connected to the operational amplifier 8A as a feedback resistor of the operational amplifier 8A by the switch 7, and the terminal 6B of the switch 6, that is, the measurement terminal 12 becomes a virtual ground potential,
The voltage E i1 appears at the output of the differential amplifier 8C. This voltage E i1
, If the sum of connection impedance of the connection to the impedance of such a cable terminal 21 and 22 and Z H, the formula (1).
−Ei1={Rr/(Rs+ZH)}×Es ……(1) ここに、Rrは基準抵抗8Bの抵抗値、Rsは抵抗2の抵抗
値、Esは信号源1の電圧である。−E i1 = {Rr / (Rs + Z H )} × Es (1) where Rr is the resistance value of the reference resistor 8B, Rs is the resistance value of the resistor 2, and Es is the voltage of the signal source 1.
式(1)を展開し、ZHを求める式に書き直すと、式
(2)となる。When formula (1) is expanded and rewritten as a formula for obtaining Z H , formula (2) is obtained.
ZH=(ES/−Ei1)×Rr−Rs ……(2) 次に、スイッチ4を短絡する。 Z H = (E S / -E i1) × Rr-Rs ...... (2) Next, the short-circuiting switch 4.
このとき流れる信号電流i1sは、測定端子11→接続端
子21→接続端子22→測定端子12の接続径路に関係なく、
スイッチ4で測定端子11・12が短絡されるので、スイッ
チ3の端子3Aからスイッチ4を通り、スイッチ6の端子
6Bへ流れ、差動増幅器8Cの出力には、Ei1sの信号電圧が
検出される。このときのEi1sは、式(3)で表される。The signal current i 1s flowing at this time is irrespective of the connection path of the measurement terminal 11 → the connection terminal 21 → the connection terminal 22 → the measurement terminal 12,
Since the measuring terminals 11 and 12 are short-circuited by the switch 4, the terminal 3A of the switch 3 passes through the switch 4, and the terminal of the switch 6
The signal voltage of E i1s is detected at the output of the differential amplifier 8C. E i1s at this time is represented by Expression (3).
−Ei1s=(Rr/Rs)×Es ……(3) 式(3)を展開し、Rsを求める式に書き直すと、式
(4)になる。−E i1s = (Rr / Rs) × Es (3) Expanding equation (3) and rewriting it to obtain Rs yields equation (4).
Rs=(Es/−Ei1s)×Rr ……(4) 式(4)を式(2)に代入すると、式(5)となる。Rs = (Es / −E i1s ) × Rr (4) Substituting equation (4) into equation (2) yields equation (5).
ZH={(1/−Ei1)−(1/−Ei1s)} ×Es×Rr ……(5) 基準抵抗8Bと信号源1のEsが既知の値ならば、スイッ
チ4を開放としたときの検出電圧Ei1と、スイッチ4を
短絡としたときの検出電圧Ei1sの値から、ZHを容易に算
出することができる。Z H = {(1 / −E i1 ) − (1 / −E i1s )} × Es × Rr (5) If Es of the reference resistor 8B and the signal source 1 is a known value, switch 4 is opened. Z H can be easily calculated from the value of the detected voltage E i1 at that time and the value of the detected voltage E i1s when the switch 4 is short-circuited.
次に、第3図を参照して、測定端子13・14の間の導通
試験をする場合について説明する。Next, with reference to FIG. 3, a case of conducting a continuity test between the measuring terminals 13 and 14 will be described.
スイッチ3〜7は、第3図に示す位置にする。 The switches 3 to 7 are set to the positions shown in FIG.
測定素子20の端子20Bに、接続端子23と接続端子24が
正しく接続されているときは、電流i2は、スイッチ3の
端子3Bから測定端子13→接続端子23→接続端子24→測定
端子14→スイッチ6の端子6Aの接続径路で流れる。When the connection terminal 23 and the connection terminal 24 are correctly connected to the terminal 20B of the measuring element 20, the current i 2 is from the terminal 3B of the switch 3 to the measurement terminal 13 → the connection terminal 23 → the connection terminal 24 → the measurement terminal 14 → It flows through the connection path of terminal 6A of switch 6.
演算増幅器8Aには、スイッチ7で、基準抵抗8Bが演算
増幅器8Aの帰還抵抗として接続されており、スイッチ6
の端子6A、すなわち、接続端子14が仮想接地電位とな
り、基準抵抗8Bの端子電圧を検出するための差動増幅器
8Cの出力には、Ei2の信号電圧が出力される。この電圧E
i2は、測定ケーブル等のインピーダンスと、接続端子23
・24の接続インピーダンスの総和インピーダンスをZLと
すれば、式(6)で表される。A reference resistor 8B is connected to the operational amplifier 8A by a switch 7 as a feedback resistor of the operational amplifier 8A, and a switch 6 is provided.
6A, that is, the connection terminal 14 becomes a virtual ground potential, and a differential amplifier for detecting the terminal voltage of the reference resistor 8B.
The signal voltage of E i2 is output to the output of 8C. This voltage E
i2 is the impedance of the measurement cable and the connection terminal 23
・ If the total impedance of the 24 connection impedances is Z L , it is expressed by equation (6).
−Ei2={Rr/(Rs+ZL)}×Es ……(6) 式(6)を展開し、ZLを求める式に書き直すと、式
(7)になる。−E i2 = {Rr / (Rs + Z L )} × E s (6) Expanding equation (6) and rewriting it to obtain Z L yields equation (7).
ZL=(Es/−Ei2)×Rr−Rs ……(7) 次に、スイッチ5を短絡する。Z L = (Es / −E i2 ) × Rr−Rs (7) Next, the switch 5 is short-circuited.
このとき流れる信号電流i2Sは、測定端子13→接続端
子23→接続端子24→測定端子14の接続径路に関係なく、
スイッチ5で測定端子13・14が短絡されるので、スイッ
チ3の端子3Bからスイッチ5を通り、スイッチ6の端子
6Aの径路で流れ、差動増幅器8Cの出力には、Ei2sの信号
電圧が検出される。The signal current i 2S flowing at this time is irrespective of the connection path of the measurement terminal 13 → the connection terminal 23 → the connection terminal 24 → the measurement terminal 14,
Since the measuring terminals 13 and 14 are short-circuited by the switch 5, the terminal 3B of the switch 3 passes through the switch 5 and the terminal of the switch 6
The signal voltage of E i2s is detected at the output of the differential amplifier 8C by flowing in the path of 6A.
このときのEi2sは、式(8)で表される。E i2s at this time is represented by Expression (8).
−Ei2s=(Rr/Rs)×Es ……(8) 式(8)を展開し、Rsを求める式に書き直すと、式
(9)になる。-E i2s = (Rr / Rs) x Es (8) Expanding equation (8) and rewriting it to obtain Rs yields equation (9).
Rs=(ES/−Ei2s)×Rr ……(9) 式(9)を式(7)に代入すると式(10)になる。R s = (E S / −E i2s ) × R r (9) Substituting equation (9) into equation (7) yields equation (10).
ZL={(1/−Ei2)−(1/−Ei2s)} ×Es×Rr ……(10) 基準抵抗8Bと信号源1のEsが既知の値ならば、スイッ
チ5を開放したときの検出電圧Ei2と、スイッチ5を短
絡したときの検出電圧Ei2sの値からZLを容易に算出する
ことができる。Z L = {(1 / −E i2 ) − (1 / −E i2s )} × Es × Rr (10) If the reference resistance 8B and Es of the signal source 1 are known values, the switch 5 is opened. Z L can be easily calculated from the detected voltage E i2 at this time and the value of the detected voltage E i2s when the switch 5 is short-circuited.
もし、測定素子20との接続点で、ケーブルが断線した
り、接触抵抗が大きくなったりして接続径路インピーダ
ンスが高くなった場合は、検出されたEi1またはEi2の電
圧は、正常に接続されている場合より低い値になる。こ
れは、式(1)や式(6)からも容易に理解される。If the cable path breaks or the contact resistance increases and the connection path impedance increases at the connection point with the measuring element 20, the detected E i1 or E i2 voltage is connected normally. The value will be lower than the case. This is easily understood from the equations (1) and (6).
第2図と第3図の導通試験で測定されたZHとZLに対し
て、あらかじめ正しい接続時の判定基準値と比較するこ
とによって、正しく接続されているかどうかを判断する
ことができる。By comparing Z H and Z L measured in the continuity test of FIGS. 2 and 3 with a reference value for determination at the time of correct connection in advance, it is possible to determine whether or not they are correctly connected.
正しく接続されているときは、スイッチ3〜7を第1
図の位置にし、測定素子20の測定に移る。When properly connected, set switches 3 to 7 to the first
At the position shown in the figure, measurement of the measuring element 20 is started.
簡単な導通試験の手段としては、あらかじめ、電圧E
s、抵抗Rs、抵抗Rrが既知の値ならば、スイッチ4・5
を設けなくても導通試験をすることができる。As a simple continuity test method, voltage E
If s, resistance Rs, and resistance Rr are known values, switches 4 and 5
The continuity test can be performed without providing.
あらかじめ式(3)または式(8)によって、Eisを
計算しておき、第2図のとおり接続して測定したE
i1と、Eisを比較し、判定すればよい。また、第3図の
とおり接続して測定したEi2とEisを比較し判定すればよ
い。E is calculated in advance by equation (3) or equation (8), and E is measured by connecting as shown in FIG.
It may be determined by comparing i1 and E is . Further, it may be determined by comparing E i2 and E is measured by connecting as shown in FIG.
スイッチ3〜7を備えることによって、導通試験によ
り測定端子11・12の間、測定端子13・14の間の電圧を検
出し、流れる電流と端子間電圧から接続径路のインピー
ダンスを求め、正しく接続されていないと判断したとき
は、その装置に装備された表示器等で、接続異常を表示
させ、さらに、ZHとZLの接続径路のインピーダンスを測
定値を表示させることもできる。By providing the switches 3 to 7, the voltage between the measurement terminals 11 and 12 and between the measurement terminals 13 and 14 is detected by the continuity test, the impedance of the connection path is obtained from the flowing current and the voltage between the terminals, and the connection is correctly established. If it is determined that the connection is abnormal, a connection error can be displayed on the display unit or the like equipped in the device, and the impedance of the connection path between Z H and Z L can be displayed as a measured value.
(e)発明の効果 この発明によれば、スイッチの設定によって、各測定
端子と測定素子との接続状態を確認するための導通試験
をすることができるので、電気的接続を確認することが
でき、接続異常による測定ミスを防止することができ
る。(E) Effect of the Invention According to the present invention, since the continuity test for confirming the connection state between each measurement terminal and the measurement element can be performed by setting the switch, the electrical connection can be confirmed. It is possible to prevent a measurement error due to an abnormal connection.
また、測定端子と接続端子の間の接続径路インピーダ
ンスを測定することができるので、接続径路のインピー
ダンスを知らせることもできる。Further, since the connection path impedance between the measurement terminal and the connection terminal can be measured, the impedance of the connection path can be notified.
第1図はこの発明による実施例の構成図、第2図は測定
端子11・12の間の導通試験をする場合の接続図、第3図
は測定端子13・14の間の導通試験をする場合の接続図、
第4図は四端子構成の回路素子測定器の構成図である。 1……信号源、2……抵抗、3〜7……スイッチ、8…
…電流/電圧変換器、8A……演算増幅器、8B……基準抵
抗、8C……差動増幅器、9……電圧検出器、11〜14……
測定端子、20……測定素子、21〜24……接続端子。FIG. 1 is a configuration diagram of an embodiment according to the present invention, FIG. 2 is a connection diagram when conducting a continuity test between measuring terminals 11 and 12, and FIG. 3 is a conducting test between measuring terminals 13 and 14. Connection diagram,
FIG. 4 is a configuration diagram of a circuit element measuring instrument having a four-terminal configuration. 1 ... Signal source, 2 ... resistor, 3-7 ... switch, 8 ...
… Current / voltage converter, 8A …… operational amplifier, 8B …… reference resistance, 8C …… differential amplifier, 9 …… voltage detector, 11 to 14 ……
Measuring terminal, 20 …… Measuring element, 21-24 …… Connection terminal.
Claims (1)
1の測定端子(11)と第2の測定端子(12)を接続し、
測定素子(20)の第2の端子(20B)に第3の測定端子
(13)と第4の測定端子(14)を接続し、信号源(1)
の信号を第1の測定端子(11)に供給し、測定素子(2
0)に流れる信号電流を第3の測定端子(13)と第4の
測定端子(14)に接続する電流/電圧変換器(8)で検
出するとともに、測定素子(20)の端子間電圧を第2の
測定端子(12)と第3の測定端子(13)に接続する電圧
検出器(9)で検出する回路素子測定器において、 第1の測定端子(11)と第2の測定端子(12)の間を短
絡、開放する第1のスイッチ(4)と、 第3の測定端子(13)と第4の測定端子(14)の間を短
絡、開放する第2のスイッチ(5)とを備え、 第1の測定端子(11)と第2の測定端子(12)の間の導
通試験をするときは、信号源(1)の信号を第1の測定
端子(11)に接続し、第2の測定端子(12)を電流/電
圧変換器(8)に接続し、第1のスイッチ(4)を短
絡、開放し、 第3の測定端子(13)と第4の測定端子(14)の間の導
通試験をするときは、信号源(1)の信号を第3の測定
端子(13)に接続し、第4の測定端子(14)を電流/電
圧変換器(8)に接続し、第2のスイッチ(5)を短
絡、開放することを特徴とする回路素子測定器の端子状
態検出回路。1. A first measuring terminal (11) and a second measuring terminal (12) are connected to a first terminal (20A) of a measuring element (20),
Connect the third measuring terminal (13) and the fourth measuring terminal (14) to the second terminal (20B) of the measuring element (20) to obtain the signal source (1)
Signal to the first measuring terminal (11) and the measuring element (2
The signal current flowing in 0) is detected by the current / voltage converter (8) connected to the third measuring terminal (13) and the fourth measuring terminal (14), and the voltage between the terminals of the measuring element (20) is detected. In a circuit element measuring device for detecting with a voltage detector (9) connected to the second measuring terminal (12) and the third measuring terminal (13), a first measuring terminal (11) and a second measuring terminal ( A first switch (4) for short-circuiting and opening between 12) and a second switch (5) for short-circuiting and opening between the third measuring terminal (13) and the fourth measuring terminal (14) When conducting a continuity test between the first measurement terminal (11) and the second measurement terminal (12), connect the signal of the signal source (1) to the first measurement terminal (11), The second measuring terminal (12) is connected to the current / voltage converter (8), the first switch (4) is short-circuited and opened, and the third measuring terminal (13) and the fourth measuring terminal (14) When conducting a continuity test between the two, connect the signal from the signal source (1) to the third measuring terminal (13) and connect the fourth measuring terminal (14) to the current / voltage converter (8). , A terminal state detection circuit for a circuit element measuring device, characterized in that the second switch (5) is short-circuited and opened.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8266289A JPH0814591B2 (en) | 1989-03-31 | 1989-03-31 | Circuit element measuring device terminal connection state detection circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8266289A JPH0814591B2 (en) | 1989-03-31 | 1989-03-31 | Circuit element measuring device terminal connection state detection circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02259582A JPH02259582A (en) | 1990-10-22 |
JPH0814591B2 true JPH0814591B2 (en) | 1996-02-14 |
Family
ID=13780649
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8266289A Expired - Lifetime JPH0814591B2 (en) | 1989-03-31 | 1989-03-31 | Circuit element measuring device terminal connection state detection circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0814591B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4735250B2 (en) * | 2005-12-28 | 2011-07-27 | 横河電機株式会社 | Measuring device |
-
1989
- 1989-03-31 JP JP8266289A patent/JPH0814591B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH02259582A (en) | 1990-10-22 |
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