JPH08136578A - Mounting holder of contact probe - Google Patents

Abstract

PURPOSE: To obtain a mounting holder in which a plurality of, and various kinds of, contact probes can be arranged and mounted at an extremely small pitch as fas as possible, which can reduce, as far as possible, the creeping of a noise into signals to be transmitted to the respective contact probes mounted at the extremely small pitch in this manner and whose structure is comparatively simple. CONSTITUTION: A mounting plate 10, for contact probes 40, for which shield members 20, 20 composed of a conductive material are provided at least on both side faces in a nonattached state is composed of an insulating material. Mounting holes 11, for the contact probes 40, which are nearly parallel to side faces 10a to which the shield members 20 are attached are provided inside the plate thickness of the mounting plate 10.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a so-called contact probe mounting holder used for electrical inspection of electronic parts such as ICs and LSIs, and more specifically, a contact probe pin is attached to a lead portion of the electronic part. The present invention relates to a contact probe mounting holder having an insulating structure that prevents noise from entering a signal transmitted to each contact probe when the circuits are in contact with each other to electrically connect the circuits of the electronic component and perform an inspection. .

[0002]

2. Description of the Related Art In a so-called contact probe used for electrical inspection of electronic parts such as IC and LSI, in order to perform an accurate inspection between circuits of the electronic part, a specific lead portion in contact with a specific contact probe is used. There is a demand for shielding properties from signals other than the signals to be provided, for example, unnecessary signals due to electric current generated by electromagnetic waves or the like that are provided from peripheral devices other than the electronic components to be inspected.

Therefore, as shown in FIG. 6, the lead portion P
The inner cylinder 20 is provided with a socket 200 for accommodating the contact probe 100, which is composed of a pin 101 that is in contact with
1 and an outer cylinder 202, an insulating layer 300 made of an insulating material such as plastic is formed between both cylinders to shield the electric current generated by the electromagnetic wave or the like with the insulating layer 300, and the outer cylinder 202. There is disclosed a contact probe having a structure in which the electric potential of the outer cylinder 202 is prevented from increasing due to the electromagnetic waves or the like by grounding. (Actual development 63-
60966)

However, with the recent higher integration and miniaturization of electronic parts such as ICs and LSIs, the pitch between a plurality of lead parts P ... P provided in such electronic parts has been minimized. Therefore, in order to enable collection of signals from a plurality of lead parts P ... P of such electronic parts arranged at an extremely small pitch, this type of contact probe 10 is provided.
It has been strongly desired to arrange a plurality of 0s at a pitch corresponding to the minimum pitch of the plurality of lead parts P ... P arranged as described above.

[0005]

However, in the conventional contact probe, the shield property can be secured, but the pitch between the adjacent contact probes 100 is prevented from widening due to the demand for the minimum pitch. ,
It was difficult to form the insulating layer 300 made of an insulating material such as plastic between the cylinders 201 and 202.

Further, even if plastic or the like can be injected between the two cylinders 201 and 202, there are some cases in which the injected plastic does not properly cover the inner cylinder 201.
In this case, there is a disadvantage that the shield effect is lost.

Also, the insulating layer 3 is formed inside the outer cylinder 202.
00 is formed in advance, and then the inner cylinder 201 is attached to the outer cylinder 20.
When the socket 200 is formed by press-fitting into the inner cylinder 2, it is still difficult to uniformly form the insulating layer 300 on the inner surface of the outer cylinder 202. Or, it often caused a situation where it could not be press-fitted.

However, if the inner cylinder 201 is not provided, the contact probe 100 cannot be smoothly accommodated. Therefore, the inner cylinder 201 cannot be omitted to configure the socket 200.

Further, in order to prevent such inconvenience,
It is not impossible to construct the socket 200 with manufacturing labor and cost, but the socket 200 requires both the inner cylinder 201 and the outer cylinder 202 in terms of configuration.
Was difficult to meet the demand for the miniaturized pitch, which is expected to become stronger in the future.

Further, in the socket 200, there is a disadvantage that each socket 200 must be grounded so as not to raise the potential of the outer cylinder 202.

Therefore, according to the present invention, a plurality of and various kinds of contact probes can be arranged and mounted at a minimum pitch as much as possible, and noise to a signal transmitted to each contact probe thus mounted at a minimum pitch. It is an object of the present invention to provide a mounting holder with a relatively simple structure, which can reduce the intrusion of as much as possible.

[0012]

In order to solve the above-mentioned problems, according to the present invention, a mounting holder for a contact probe is provided with shield members 20, 20 made of a conductive material on at least both side surfaces thereof. The mounting plate 10 of the contact probe 40 is made of an insulating material, and the shield member 20 is attached to the thickness of the mounting plate 10. Side 1
The structure is such that a mounting hole 11 for the contact probe 40 that is substantially parallel to 0a is provided.

[0013]

In the mounting holder for the contact probe according to the present invention, the mounting plate 10 having the mounting hole 11 for the contact probe 40 within the wall thickness is made of an insulating material, and
Since the shield member 20 made of a conductive material is attached to at least both side surfaces 10a and 10a of the mounting plate 10, the contact probe 40 to be mounted can be insulated from a current generated by an electromagnetic wave from the outside.

Further, since it is not necessary for the contact probe 40 itself to have an insulating structure, the plurality of contact probes 40 ... 40 can be mounted with a very small pitch.

[0015]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A typical embodiment of a mounting holder for a contact probe according to the present invention will be described below with reference to FIGS.

FIG. 1 is a plan view of the mounting holder according to the embodiment so that the overall structure of the mounting holder can be easily understood. Further, FIG. 2 shows a part of the mounting holder in a cutaway view from the side.

Further, FIG. 3 shows a mounting hole 11 of the mounting plate 10 which constitutes the mounting holder according to the embodiment, and this mounting hole 11
The whole structure of the contact probe 40 accommodated in the inside is shown by breaking a part of the mounting holder.

FIG. 4 is an enlarged view of the mounting portion of the contact probe 40 of the mounting holder according to the embodiment, and FIG. 5 is a side view of the mounting holder.

As shown in FIGS. 1, 2 and 5, the mounting holder according to this embodiment has a substantially rectangular flat plate-shaped mounting plate 10 and both side surfaces 10 of the mounting plate 10.
a, a pair of shield members 20 attached to 10a
It is mainly composed of.

The mounting plate 10 is made of an insulating material such as a plastic material or a rubber material, and has a thick mounting hole 11 for the contact probe 40 which is substantially parallel to the side surface 10a of the shield member 20 on which it is mounted. Be prepared within.

On the other hand, in this embodiment, the shield member 20 is formed in a relatively thick plate shape having a side surface having substantially the same size and shape as the side surface 10a of the mounting plate 10.

In this embodiment, the mounting plate 10 and the pair of shield members 20, 20 attached to both side surfaces 10a, 10a of the mounting plate 10 are combined in this way. And a pair of shield members 20, 20, the bolt 30 is inserted into and tightened in a bolt insertion hole 31 that is provided in communication with the mounting holder in the width direction.

Further, as shown in FIG. 3, the contact probe 40 provided in the mounting hole 11 of the mounting plate 10 is housed in a cylindrical socket 41 inserted in the mounting hole 11. In addition, a sheath-shaped probe body 40a made of a conductive metal material and having an outer diameter approximately the same as the inner diameter of the socket 41, and a conductive metal material housed in the probe body 40a It is mainly configured with the configured pin 40b.

As shown in FIG. 3, a compression coil spring 40c is provided inside the probe main body 40a between the pin 40b and the pin 40b.
b is always urged in the direction of protruding from the inside of the probe main body 40a. Further, the intermediate portion of the pin 40b is formed to have a smaller diameter than both end portions thereof, and on the other hand, a protruding portion 40e directed inward is provided in a part of the probe main body 40a so as to contact the small diameter portion 40d. Because it is formed
The pin 40b biased as described above does not protrude beyond the position where the step 40f between the small diameter portion 40d and the lower end of the pin 40d contacts the protrusion 40e. In addition, the step 40g between the small diameter portion 40d and the tip 40b 'of the pin 40b is provided with the protrusion 40e.
It is configured so that it can be pushed to the position where it touches.

In this embodiment, the contact probe 40 housed in the socket 41 configured as described above.
The tip 40b 'of the pin 40b is attached to the mounting plate 1
No. 0 mounting hole 11 is housed in the mounting hole 11 so as to project outward from one opening.

Further, upper and lower two-stage insulating plates 61 and 62 made of an insulating material such as a plastic material are attached and attached to the lower surface of the mounting holder according to this embodiment by a bolt 50. The socket 41 accommodating 40 is configured such that the lower end side thereof is inserted into the holes 63 provided in the upper and lower insulating plates 61 and 62, and the lower end portion 41a thereof is projected outward. A conductive wire 70 is electrically connected to the lower end portion 41a of the socket 41, so that the signal transmitted from the lead portion P of the electric component is, as shown in FIG.
Conductive wire 7 through probe body 40a and socket 41
It will be sent to the proper measuring instrument via 0.

In this embodiment, a gap 64 is provided between the two insulating plates 61 and 62 to allow the adhesive to escape when the socket 41 is fixed to the insulating plate 61 with an adhesive.
Are formed.

Further, as shown in FIGS. 2 and 5,
The pair of shield members 20, 20 attached to both side surfaces 10a, 10a of the mounting plate 10 are electrically connected to the shield member 20 through holes properly provided in the two insulating plates 61, 62. By the conductive wire 71 connected to
It is configured to be grounded A.

As described above, in the mounting holder according to this embodiment, the contact probe 40 is housed in the mounting hole 11 provided in the mounting plate 10 made of an insulating material, and the mounting plate 10 is made of a conductive material. Since a pair of shield members 20 and 20 are used to sandwich the shield member, it is possible to prevent a situation in which a current other than a necessary signal flows through the contact probe 40 due to electromagnetic waves entering from other than the lead portion P of the electronic component. In addition, by making the shield member 20 ground A,
It is configured to prevent the potential of the shield member 20 from rising and further prevent the current other than the necessary signal from flowing to the contact probe 40.

In particular, in the mounting holder according to this embodiment, the impedance in the circuit including the contact probe 40 assembled in the mounting holder is determined by the mounting plate 10 having the mounting hole 11 of the contact probe 40. It can be easily adjusted by changing the material and thickness of.

That is, as shown in FIG. 4, by increasing the thickness of the mounting plate 11, it is possible to increase the distance S between the contact probe 40 and the shield member 20 which is grounded A. By reducing the thickness of the mounting plate 11, it is possible to reduce the distance S between the contact probe 40 and the shield member 20 which is grounded A, and thereby the contact probe 40.
By changing the electrostatic capacitance between the shield member 20 and the shield member 20, the impedance of the circuit including the contact probe 40 can be appropriately changed.

Further, by changing the material of the mounting plate 11 to an insulating material such as a plastic material or a rubber material having a proper relative dielectric constant, the contact probe 40 can be used without changing the thickness of the mounting plate 11. The capacitance between the shield member 20 and the shield member 20 is changed, and as a result, the contact probe 4
The impedance of the circuit including 0 can be changed appropriately.

The number and arrangement of the mounting holes 11 provided in the mounting plate 10 may be appropriately changed according to the number and arrangement of the contact probes 40 required.

Further, the shape, hole diameter, depth, etc. of the mounting hole 11 provided in the mounting plate 10 may be appropriately changed according to the type and shape of the contact probe to be mounted.

[0035]

In the mounting holder for the contact probe according to the present invention, the mounting hole 11 for the contact probe 40 is provided.
The mounting plate 10 having a wall thickness is made of an insulating material, and at least both side surfaces 10a, 10a of the mounting plate 10 are provided.
A shield member 20 made of a conductive material is attached to a, and the contact probe 40 is attached with a relatively simple structure from an electric current generated from an electromagnetic wave from the outside.
Can be insulated as much as possible.

Also, without providing the contact probe 40 itself with an insulating structure, the plurality of contact probes 40 ... 40 are attached to the plurality of mounting holes 11 ... 11 formed in the mounting plate 10 at a minimum pitch. Can be mounted at a very small pitch, so that ICs, LSIs, which have the above-mentioned insulating function, and whose lead portion P or terminals are miniaturized,
Features that can be applied to electrical inspection of electronic parts such as LCD panels

Further, by changing the thickness of the mounting plate 10 which can be easily modified in structure, the mounting hole 1
By changing the spacing S between the contact probe 40 and the shield member 20 housed in 0, or by appropriately changing the mounting plate 10 to the mounting plate 10 made of an insulating material having a different relative dielectric constant, or By appropriately changing both the spacing S and the type of the mounting plate 10, the capacitance between the contact probe 40 and the shield member 20 is changed, and the impedance of an electrical circuit including the contact probe 40 is changed. -Has the feature that dance can be easily adjusted.

Accordingly, in particular, the contact probe 40 mounted on the mounting holder with the required impedance is appropriately selected so that the performance and standards of various required measuring instruments electrically connected to the contact probe 40 are well matched. It has the advantage of being easy to hold.

[Brief description of drawings]

FIG. 1 is a plan view of a mounting holder.

FIG. 2 is a partially cutaway side view of a mounting holder.

FIG. 3 is a sectional view of a main part of a mounting holder.

FIG. 4 is an enlarged plan view of a main part of a mounting holder.

FIG. 5 is a side view of a mounting holder.

FIG. 6 is a cross-sectional view of a conventional contact probe.

[Explanation of symbols]

 10 mounting plate 10a side surface 11 mounting hole 20 shield member 40 contact probe

Claims (1)

[Claims] 1. A mounting plate for a contact probe, comprising a shield member made of a conductive material attached to at least both side surfaces thereof, the mounting plate being made of an insulating material. An attachment holder for a contact probe, the attachment hole for the contact probe being provided substantially parallel to the side surface on which the shield member is attached, within the thickness of the plate.