JPH079130Y2 - Stage device for sample in stereo microscope - Google Patents

Description

[Detailed Description of the Invention] [Industrial field of application] The present invention relates to a sample stage device in a stereoscopic microscope, and more specifically, to a metal sample mounted on a sample table for observation and inspection of the outer surface, The present invention relates to an improvement of a stage device that can be easily arranged directly below an objective lens and that can be adjusted to change its posture.

[Prior Art] Regarding wire rods and drawn iron wires produced through continuous casting equipment and rolling equipment, the state of scratches remaining on the surface and cross section of the wire rod is observed immediately after production or at the time of shipment. It is intended for quality control and is often viewed with a stereomicroscope and often photographed to leave it as inspection data. The sample inspection by the stereoscopic microscope is performed separately from the tissue inspection for observing the metallographic structure or the like at a high magnification, and is performed in order to easily and quickly grasp the flaw portion generated on the surface or the like.

That is, in the above-mentioned outer surface inspection and the like, after a wire rod or a piece of an iron wire which is a sample is placed on the sample table, the sample is fixed so as not to move. For example, clay molded by a press molding machine is placed on a sample table and is pressed into the clay so that a part of the sample does not move. When the sample is positioned directly below the objective lens and the center is adjusted, the fine adjustment screw is turned to move the sample placed on the sample table in the front-back and left-right directions by the stage. Then, when inclining the posture of the sample, the sample is manually moved little by little.

[Problems to be solved by the device]

By the way, in such an inspection, in order to fix the sample horizontally or vertically on the sample holder or to move the sample directly below the objective lens, the sample must be manually moved. Also, when tilting the posture of the sample as necessary, it is necessary to rotate the sample by hand, which requires time and effort to prepare for observation, which hinders the efficiency of inspection by a stereoscopic microscope. Further, when the sample is leveled and pushed into the clay on the sample stand and fixed, when the pushed portion is inspected, the adhered clay must be removed one by one, which hinders smooth inspection. Not only that, when inspecting wire rods and iron wires of various diameters, it is necessary to mold the fixing clay into a shape and size suitable for the size of the sample, which is a complicated clay molding process. There is also a drawback that it is difficult to inspect because it goes through.

The present invention has been made in view of the above-mentioned problems, and the purpose thereof is to position the sample directly below the objective lens of the stereomicroscope, so that the work of manually centering the sample table is extremely simple and quick. An object of the present invention is to provide a stage device for a sample in a stereoscopic microscope, which can be accurately performed and can inspect samples of different sizes over a desired surface or cross section without trouble.

[Means for Solving the Problems]

INDUSTRIAL APPLICABILITY The present invention is applied to a stereoscopic microscope in which a microscope main body including an objective lens, an eyepiece lens, a light projector, and the like is guided by a column body and moves up and down.

As shown in FIG. 1, the characteristics of sample 6 are as follows.
A swivel support cylinder 7A for locating the stage table 7 on which the stage is placed below the objective lens 3 is attached to the column body 5, and the upper surface 7a of the stage table 7 has a stage 8 whose position can be finely adjusted in the front-back and left-right directions. Is installed. The pedestal 9 is fixed to the upper surface 8a of the stage 8, while the partial spherical concave portion 10 is formed on the upper surface 9a of the receiving portion 9, and the hemispherical sample table 11 is tilted and rotated in the partial spherical concave portion 10. It is possible to be fitted.
The upper surface 11a of the hemispherical sample table 11 is engraved with a mounting groove 12 extending in the diametrical direction for mounting the sample 6, and a concave portion deeper than the bottom portion 12a of the mounting groove 12 is supported in the central portion of the upper surface 11a. Hole 1
3 is formed. In addition, the diameter that does not overlap the mounting groove 12
Sample fixing magnets 14 and 14 [see FIG. 2], which sandwich the recessed support hole 13, are embedded in the Y ₁ and Y ₂ [see FIG. 6] directions.

The concave support hole 13 may be filled with the amorphous adhesive 15 so that the posture of the sample 6 is maintained.

[Action]

When the outer surface of the wire rod rod section sample 6A (see FIG. 8) is observed, the sample 6A is placed in the mounting groove 12 formed on the upper surface 11a of the hemispherical sample base 11. The upper half of Sample 6A is the upper surface 11
exposed from a. The pedestal 9 provided with the stage stand 7 is swung below the objective lens 3, and the stage 8 is moved back and forth and left and right for fine adjustment while looking through the eyepiece 4 (see FIG. 3). Look for the flaw in Sample 6A and check its extent. If you need a photo, take a photo and leave it as inspection data. To observe the entire circumference of the sample 6A,
The sample 6A may be rotated while being placed in the mounting groove 12, or the hemispherical sample table 11 may be tilted along the partial spherical concave portion 10. When inspecting the sample 6A along the length direction, the sample 6A on the mounting groove 12 is moved to the right or left. Alternatively, the stage 8 is moved back and forth and left and right as necessary. in this way,
The observation location of the sample 6A can be adjusted to the field of view of the objective lens 3 simply by guiding the sample 6A while the sample 6A is placed in the mounting groove 12, which saves complicated time and shortens the time required for it. be able to. As a result, the external inspection can be speeded up and streamlined.

When the outer surface of the thin iron wire section sample 6C (see FIG. 6) is to be inspected, the sample 6C is attracted to the sample fixing magnets 14 and 14 at the positions sandwiching the concave supporting hole 13. Sample 6C is a magnetic force and is a hemispherical sample stand 1
It is fixed to the upper surface 11a of 1. The inspection can be performed in the same procedure as in the case of the wire rod sample 6A.

Further, when the cross-section inspection of the wire is performed, the sample 6B [see FIG. The sample 6B is in an upright posture, and it is possible to observe and photograph quickly and efficiently by the same operation as the external surface inspection. If the concave support hole 13 is filled with the amorphous adhesive 15, it becomes extremely easy to maintain the sample 6B in the upright posture by its adhesive force. In any case, when the sample needs to be tilted, the hemispherical sample base 11 can be easily tilted by shifting the hemispherical sample base 11 in the partially spherical concave portion 10 to change the observation target site.

[Effect of device]

According to the present invention, if the sample is placed on the central portion of the upper surface of the hemispherical sample table and swiveled around the supporting column, the sample is positioned almost directly below the objective lens. Fine adjustment to the front-rear action for centering the lens can be easily performed by displacing the stage. Also, when the sample is tilted, the hemispherical sample table may be fitted into the partially spherical concave portion and allowed to stand still, which is an extremely simple operation. As a result, centering of the sample is performed extremely efficiently, quickly and accurately as compared with the conventional case.

If the mounting groove is used, a thick wire rod can be stably placed, and its rotation is easy. The use of the recessed support hole in the center portion of the mounting groove allows the sample to have a desired upright posture during cross-section inspection of the sample. If the concave support hole is filled with an amorphous adhesive, it becomes extremely easy to maintain the upright posture. When the sample is attracted and fixed by the sample fixing magnet, the sample can be fixed to the hemispherical sample table even if the sample diameter is small, and the rotation thereof is easy. In this way, samples of various sizes and shapes can be easily fixed by using the mounting groove, the recessed support hole, and the sample fixing magnet, which can reduce the labor and time required, and eventually Acceleration and efficiency of external surface inspection and cross-sectional inspection can be achieved.

〔Example〕

Hereinafter, the present invention will be described with reference to the drawings of its embodiments.

The stereoscopic microscope 1 shown in FIG. 1 includes an objective lens 3 and a pair of eyepieces 4 which move up and down when the adjusting knob 3a is rotated.
A microscope body 1A accommodating [see FIG. 3] and a projector (not shown) and the like is supported by a column 5 so as to be able to move up and down.

The sample table 2 includes a horizontal stage table 7 on which a sample 6 is mounted, a swivel support cylinder 7A that is integrated with the flat stage table 7 and mounted on the support column 5, and an upper surface of the stage table 7.
The stage 8 is installed on 7a and can be finely adjusted in the front-rear direction and the left-right direction, the pedestal 9 fixed to the upper surface 8a of the stage 8 so that the central portion thereof is directly below the objective lens 3, and the pedestal 9 The semispherical sample base 11 is fitted in the partially spherical recess 10 so as to be rotatable and tiltable.

A swivel support cylinder 7A that allows the stage stand 7 to be swung while being held in a horizontal posture is attached to the support column 5 via a support member 16 that is attached to penetrate the end plate of the bent portion of the stage stand 7. It is installed. The support member 16 is received by a holding member 17 fixed to the support column 5 with a bolt or the like. Therefore, the stage table 7 can be horizontally rotated about the support column 5 via the swivel support cylinder 7A so as to be positioned below the objective lens 3 or separated from each other.

As shown in FIG. 4, a stage 8 composed of, for example, three layers is installed on the upper surface 7a of the stage table 7, and the lowermost part thereof is fixed to the upper surface 7a. By turning a knob 8b shown in FIG. 2, the intermediate portion is finely moved in the front-rear direction such that it approaches or separates from the column 5 through a front-rear moving screw (not shown). When the knob 8c is turned, the uppermost portion is slightly moved in the left-right direction with respect to the column 5 via a left-right moving screw (not shown). In this manner, the sample on which the stage 8 is placed on the hemispherical sample table 11 can be moved to directly below the objective lens 3.

A pedestal 9 is fixed to the upper surface 8a of the stage 8, and the pedestal 9 is made of plastic in order to reduce the weight. As shown in FIG. 5, the pedestal 9 is formed with a partial spherical concave portion 10 opening to the upper surface 9a.
A hemispherical sample base 11 made of steel is fitted on the base 10. Cradle 9
At two places around the upper part of the hemispherical sample table 11 projecting upward, the handles 18, 18 shown in FIG. 6 are formed.
When adjusting the posture of 1, grip the handle 18 with a fingertip and tilt the hemispherical sample base 11 in the directions of arrows L ₁ and L ₂ and further in the directions of arrows N ₁ and N ₂ shown in FIG. 7. be able to. In addition,
The spherical surface of the partially spherical concave portion 10 and the hemispherical sample base 11 is
The hemispherical sample stage 11 can be smoothly rotated and slid, while the hemispherical sample stage 11 is finished to have an appropriate roughness so that the hemispherical sample stage 11 will stop at that position if the operation is stopped. Incidentally, the pedestal 9 may also be made of steel or the like, and the point is that the pedestal 9 can be adjusted to a convenient posture and stopped.

On the upper surface 11a of the hemispherical sample table 11, as shown in FIG.
A mounting groove 12 extending in the diametrical direction is engraved for mounting the sample 6. In this example, the cross section of the mounting groove 12 is V as shown in FIG.
It is formed in a letter shape. For example, when a sample 6A having a diameter of 5.5 mm or more, which is a section of a thick wire rod, is placed in the placing groove 12,
The sample 6A abuts on both slopes and is placed on the hemispherical sample table 11,
The sample 6A holds the posture in which the upper half or more of the upper surface 11a is exposed. By rotating the sample 6A in the direction of arrow 19 as necessary, the entire circumference of the sample 6A can be observed while maintaining a stable posture.

Further, in the central portion of the upper surface 11a of the hemispherical sample table 11, a concave support hole 13 deeper than the bottom portion 12a of the mounting groove 12 (see FIG. 8) is formed.
Is formed. In the case of a sample having a diameter substantially equal to that of the recessed support hole 13, the sample can be inserted into the recessed support hole 13 to maintain the upright posture, and the end surface showing the cross section can be inspected. When inspecting the cross section of the sample 6B such as a thin iron wire [see FIG. 5], the concave support hole 13 is filled with an irregular adhesive 15, for example, a clay material, and its upright posture is easily maintained. It is designed so that you can keep it.

As shown in FIG. 6, the mounting groove 12 does not overlap the diameter direction,
For example, in the direction of the diameter Y ₁ or Y ₂ shown by the chain double-dashed line,
The sample fixing magnets 14 and 14 located with the 13 in between are embedded. The upper surface of the sample fixing magnet 14 is the upper surface 11 of the hemispherical sample table 11.
For example, an iron wire with a diameter of 3 mm or less, which has the same surface as a (see FIG. 5) and sinks when placed in the mounting groove 12,
It can be fixed on the hemispherical sample table 11. Since the fixation is due to the attraction force of the magnet, the sample 6C can be rotated in the direction of the arrow 20 to easily observe the entire circumference.

By using the sample holder 2 having such a configuration, the observation and inspection of the outer surface and the cross section of the wire rod or iron wire section sample 6 by the stereomicroscope 1 can be performed quickly and efficiently.

Of the wire rods and iron wires manufactured by continuous casting equipment and rolling equipment, for inspection of the outer surface of thick wire rods with a diameter of 5.5 mm or more, sample 6A in the state of being cut into small pieces
[See FIG. 8] is mounted on the mounting groove 12 formed in the upper surface 11a of the hemispherical sample table 11. The sample 6A is in contact with both slopes of the mounting groove 12, and the upper half or more of the sample 6A appears above the upper surface 11a. Then, the front, rear, left, and right are aligned by the stage 8, and the sample 6A is adjusted to 7.5
It is observed and inspected at a magnification of ~ 62. When observing the periphery of that portion, if the hemispherical sample base 11 is tilted using the handle 18 (see FIG. 7), continuous inspection can be performed.
If it is necessary to rotate the handle 18, the handle 18 may be slightly rotated in the directions of the arrows L ₁ and L ₂ (see FIG. 6). When observing the back side of the sample 6A or along the length direction, the sample 6A may be inverted 180 degrees while being placed in the mounting groove 12 or moved along the mounting groove 12. Alternatively, the stage 8 may be moved in the front, rear, left, and right directions. Each time, a photograph is taken as inspection data as needed.

When inspecting a thin iron wire for the outer surface, its section is Sample 6C.
[See FIG. 6] is placed on the upper surface 11a of the hemispherical sample table 11 so as to be along the diameter Y ₂ , for example. The sample 6B is attracted to the sample fixing magnets 14, 14 and fixed on the hemispherical sample table 11. Similar to the case of the outer surface inspection of the wire rod described above, the hemispherical sample stage 11 can be tilted or rotated to sequentially inspect desired points. It is possible to easily change the observation location by pushing and pulling the attracted wire rod in the axial direction.

When observing the cross section with the sample upright,
A short-cut wire rod or wire is inserted into the recessed support hole 13 at the center of the hemispherical sample table 11. If it is thin like a wire rod, the irregular shaped adhesive material is placed inside the concave support hole 13.
Fill with 15 [see FIG. 5]. Even if the cross section is inclined, if the hemispherical sample table 11 is tilted, the cross section can face the field of view through the objective lens 3 at a right angle. If different samples are erected one after another, each cross section can be inspected.

As shown in FIG. 9, if the stage stand 7 is provided at symmetrical positions different by 180 degrees with respect to the support column 5 as well, while one sample 6B ₁ is being inspected, another sample 6B ₁ is inspected. 6B ₂ can be put on, saving time for preparation.

As can be seen from the above description, the sample table of the present invention can easily fix various samples of different sizes to the hemispherical sample table according to their shapes and sizes by omitting the step of molding the clay material. On the other hand, the sample placed on the cradle can be
The position of the sample can be easily changed only by arranging it just below the objective lens and shifting the hemispherical sample table along the partial spherical concave portion. Therefore, unlike the conventional case, the troublesome work required to position the sample directly below the objective lens can be omitted, and the time required for fine adjustment can be significantly shortened, and external surface inspection and cross-section observation of the sample can be performed. , Simple,
It can be done quickly and efficiently.

[Brief description of drawings]

1 is a side view of the sample table of the present invention, and FIG. 2 is a side view of FIG.
II-II line arrow view, FIG. 3 is a perspective view of a stereomicroscope to which the sample stand of the present invention is applied, FIG. 4 is a perspective view of the sample stand, and FIG. 5 is a hemispherical shape fitted to the receiving stand. Side view of sample stand, No. 6
The figure is an arrow view of the portion corresponding to the line VI-VI in Fig. 5, Fig. 7 is a side view of the tilted hemispherical sample stage, and Fig. 8 is an enlarged view when the section of the wire rod is placed in the placing groove. FIG. 9 and FIG. 9 are side views of a sample holder having a stage holder at symmetrical positions. 1 ...... stereomicroscope, 1A ...... microscope body, 2 ...... Sample table, 3 ...... objective lens, 4 ...... eyepiece, 5 ...... strut, 6, 6A, 6B _1, 6B _2, 6C ...... sample , 7 ... Stage stand,
7A ... Swivel support cylinder, 7a ... Top surface, 8 ... Stage, 8a ...
… Top surface, 9 …… pedestal, 9a …… top surface, 10 …… partial spherical concave part, 11 …… hemispherical sample stand, 11a …… top surface, 12 …… mounting groove, 12a …… bottom part, 13 …… Recessed support hole, 14 …… Sample fixing magnet, 15 …… Unshaped adhesive material.

Claims (2)

[Scope of utility model registration request] 1. In a stereoscopic microscope in which a microscope main body equipped with an objective lens, an eyepiece lens, a light projector, etc. is elevated by being guided by a support body, a swivel support for positioning a stage table on which a sample is placed below the objective lens. A cylinder is attached to the pillar body, a stage whose position can be finely adjusted in the front-rear direction and the left-right direction is installed on the upper surface of the stage mounting table, and the receiving table is fixed to the upper surface of the stage while the receiving table of the receiving table is fixed. A partially spherical recess is formed on the upper surface, and a hemispherical sample base is tiltably and rotatably fitted in the partially spherical recess. An extending mounting groove is engraved, and a recessed support hole deeper than the bottom of the mounting groove is formed in the central portion of the upper surface, while the recessed support hole is located in the diametrical direction so as not to overlap the mounting groove. Do A sample stage device in a stereoscopic microscope, wherein a sample fixing magnet is embedded. 2. The stage device for a sample in a stereoscopic microscope according to claim 1, wherein the concave supporting hole is filled with an amorphous adhesive material for holding the posture of the sample.