JPH0789799A - Production of in-containing iii-v compound semiconductor crystal - Google Patents

Production of in-containing iii-v compound semiconductor crystal

Info

Publication number
JPH0789799A
JPH0789799A JP23439193A JP23439193A JPH0789799A JP H0789799 A JPH0789799 A JP H0789799A JP 23439193 A JP23439193 A JP 23439193A JP 23439193 A JP23439193 A JP 23439193A JP H0789799 A JPH0789799 A JP H0789799A
Authority
JP
Japan
Prior art keywords
compound semiconductor
growth
group
semiconductor crystal
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23439193A
Other languages
Japanese (ja)
Inventor
Hiroya Kimura
浩也 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP23439193A priority Critical patent/JPH0789799A/en
Publication of JPH0789799A publication Critical patent/JPH0789799A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To produce an In-contg. III-V compd. semiconductor crystal almost free from crystal defects by an organometallic vapor growth method at >=600 deg.C growth temp. CONSTITUTION:Starting material for In and starting material for a group V element are alternately fed and vapor growth is carried out within the growth temp. range of 600-800 deg.C.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、有機金属気相成長法を
用いるInAs,InP,InSb等のIn系III-V族
化合物半導体結晶の作製方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for producing an In-based III-V group compound semiconductor crystal such as InAs, InP, InSb, etc., using a metal organic chemical vapor deposition method.

【0002】[0002]

【従来の技術】InAs化合物半導体やIII 族元素がI
nであるIn系III-V族化合物半導体は、GaAsとは
異なった特徴を有しており、様々な光電子デバイスに数
多く利用されている。これらの化合物半導体結晶は有機
金属気相成長法で作製されていた。InAsを成長する
場合には、III 族原料としてTMI(トリメチルインジ
ウム)、TEI(トリエチルインジウム)等を、V族原
料としてはAsH3 (アルシン)やTBA(ターシャル
ブチルアルシン)等を用いて400℃以上600℃未満
の成長温度に加熱した基板上で原料を熱分解して成長を
行っていた。
2. Description of the Related Art InAs compound semiconductors and Group III elements are I
The In-based III-V group compound semiconductor, which is n, has a characteristic different from that of GaAs and is widely used in various optoelectronic devices. These compound semiconductor crystals were produced by the metal organic chemical vapor deposition method. When InAs is grown, TMI (trimethylindium), TEI (triethylindium) or the like is used as a group III raw material, and AsH 3 (arsine) or TBA (tertiary butylarsine) or the like is used as a group V raw material at 400 ° C. The raw material was thermally decomposed and grown on the substrate heated to a growth temperature of less than 600 ° C.

【0003】上記の成長温度の範囲で400℃を下回る
と原料の熱分解が完全に起こらず、結晶性が悪化する。
また、600℃以上の高温では、III 族原料(例えばT
MI)とV族原料(例えばAsH3 )の間の熱分解反応
が基板表面より前の気相中で発生して、やはり結晶性が
悪化してしまう。
When the temperature is lower than 400 ° C. in the above growth temperature range, the thermal decomposition of the raw material does not occur completely, and the crystallinity deteriorates.
Further, at a high temperature of 600 ° C. or higher, a group III raw material (for example, T
The thermal decomposition reaction between the MI) and the group V raw material (for example, AsH 3 ) occurs in the gas phase before the substrate surface, and the crystallinity also deteriorates.

【0004】[0004]

【発明が解決しようとする課題】一方、GaAs、Al
GaAs、GaP等の化合物半導体を有機金属気相成長
法で結晶欠陥の少ない良好な結晶を成長させるには60
0℃以上の成長温度が必要であることは知られていた
が、上記の理由でIn系III-V族化合物半導体結晶につ
いては600℃以上の成長温度で気相成長させることが
できなかった。そこで、本発明では、有機金属気相成長
法を用いて600℃以上の成長温度で結晶欠陥の少ない
In系III-V族化合物半導体結晶を作製する方法を提供
しようとするものである。
On the other hand, GaAs, Al
To grow a good crystal with few crystal defects in a compound semiconductor such as GaAs or GaP by the metal organic chemical vapor deposition method, 60
Although it has been known that a growth temperature of 0 ° C. or higher is required, the vapor growth of In-based III-V group compound semiconductor crystals could not be performed at a growth temperature of 600 ° C. or higher for the above reason. Therefore, the present invention is intended to provide a method for producing an In-based III-V group compound semiconductor crystal with few crystal defects at a growth temperature of 600 ° C. or higher by using the metal organic chemical vapor deposition method.

【0005】[0005]

【課題を解決するための手段】本発明は、有機金属気相
成長法を用いるInAs等のIn系III-V族化合物半導
体結晶の作製方法において、In原料とV族原料を交互
に供給し、成長温度を600〜800℃の範囲で気相成
長することを特徴とするIn系III-V族化合物半導体結
晶の作製方法である。
The present invention is a method for producing an In-based III-V group compound semiconductor crystal, such as InAs, which uses metalorganic vapor phase epitaxy, in which In raw materials and V raw materials are alternately supplied, A method for producing an In-based III-V group compound semiconductor crystal, characterized in that vapor phase growth is performed at a growth temperature in the range of 600 to 800 ° C.

【0006】[0006]

【作用】図2は従来の有機金属気相成長法でInAsを
成長するときの原料供給のシーケンスを示した図で、II
I 族原料(TMI,TEI等)とV族原料(AsH3
TBA等)を同時に基板上に流して気相成長する方法で
ある。この方法は、Ga系やAl系の有機金属とは異な
り、In系の原料では成長温度を600℃以上に上げる
と、基板より前に熱分解反応を起こすため、基板上に良
好な結晶を成長させることができなかった。
FIG. 2 is a diagram showing the sequence of the raw material supply when growing InAs by the conventional metalorganic vapor phase epitaxy. II
Group I raw materials (TMI, TEI, etc.) and Group V raw materials (AsH 3 ,
(TBA, etc.) is simultaneously flown onto the substrate for vapor phase growth. This method is different from Ga-based or Al-based organometallics, and in In-based raw materials, when the growth temperature is raised to 600 ° C. or higher, a thermal decomposition reaction occurs before the substrate, so that a good crystal is grown on the substrate. I couldn't do it.

【0007】図1は本発明の原料供給のシーケンスを示
した図で、III 族原料とV族を交互に流し、その間に水
素のみを流す時間を設けることにより、基板より上流に
おける原料の混合を防止することができ、600℃以上
という高温の成長温度の採用を可能にした。その結果、
GaAs等の結晶と同様に、結晶欠陥の少ない良好なI
nAs結晶を作製することができるようになった。な
お、成長温度が800℃を上回ると、成長したエピタキ
シャル層が分解・再蒸発を始めるため、上限の成長温度
を800℃にした。以上、InAs結晶の作製について
述べたが、その他のIn系III-V族化合物半導体結晶に
ついても同様にして結晶欠陥の少ない良好な結晶を得る
ことができるようになった。
FIG. 1 is a diagram showing a raw material supply sequence according to the present invention, in which a group III raw material and a group V raw material are alternately flowed, and a time during which only hydrogen is flown is provided to mix the raw materials upstream from the substrate. It was possible to prevent this, and it became possible to adopt a high growth temperature of 600 ° C. or higher. as a result,
Similar to GaAs and other crystals, good I with few crystal defects
It has become possible to produce nAs crystals. When the growth temperature exceeds 800 ° C, the grown epitaxial layer begins to decompose and re-evaporate, so the upper limit growth temperature was set to 800 ° C. Although the production of InAs crystals has been described above, it has become possible to obtain good crystals with few crystal defects in the same manner for other In-based III-V group compound semiconductor crystals.

【0008】[0008]

【実施例】【Example】

(実施例)有機金属気相成長法で図1の成長シーケンス
によりGaAs基板上にInAs結晶を成長させた。成
長温度は650℃に保持した。そして、TMIを収容し
たボトルの温度を20℃に保持して供給流量を100s
ccmとし、また、濃度10%のAsH3 の供給流量を
50sccmに調整し、図1のシーケンスにおいてTM
I及びAsH3 の供給時間をともに4秒とし、その間に
2秒だけ水素を流して成長圧力を10Torrに保持し
て気相成長を行った。得られたInAs結晶は、膜厚が
1.5μmで、77Kにおけるホール移動度を測定した
ところ、30000cm2 /Vsと結晶特性が極めて良
好であった。
(Example) An InAs crystal was grown on a GaAs substrate by the growth sequence of FIG. 1 by a metal organic chemical vapor deposition method. The growth temperature was maintained at 650 ° C. Then, the temperature of the bottle containing TMI is maintained at 20 ° C. and the supply flow rate is 100 s.
ccm, and the supply flow rate of AsH 3 with a concentration of 10% was adjusted to 50 sccm.
The supply time of I and AsH 3 was both set to 4 seconds, during which hydrogen was flowed for 2 seconds to maintain the growth pressure at 10 Torr for vapor phase growth. The obtained InAs crystal had a film thickness of 1.5 μm, and the hole mobility at 77K was measured. As a result, the crystal characteristic was 30,000 cm 2 / Vs, which was extremely good.

【0009】(比較例)有機金属気相成長法で図2の成
長シーケンスによりGaAs基板上にInAs結晶を成
長させた。成長温度は400℃に保持し、TMI及びA
sH3 の供給流量、成長圧力は実施例1と同様にして気
相成長を行った。得られたInAs結晶は、膜厚が1.
5μmで、77Kにおけるホール移動度を測定したとこ
ろ、15000cm2 /Vsであった。
(Comparative Example) An InAs crystal was grown on a GaAs substrate by the growth sequence of FIG. 2 by a metal organic chemical vapor deposition method. Growth temperature is kept at 400 ℃, TMI and A
The vapor phase growth was performed in the same manner as in Example 1 with the supply flow rate of sH 3 and the growth pressure. The obtained InAs crystal has a film thickness of 1.
When the hole mobility at 77 K was measured at 5 μm, it was 15000 cm 2 / Vs.

【0010】[0010]

【発明の効果】本発明は、上記の構成を採用することに
より、InAs等のIn系III-V族化合物半導体結晶に
ついて、有機金属気相成長法で結晶性の優れた結晶の成
長を可能にした。
EFFECTS OF THE INVENTION The present invention, by adopting the above-mentioned constitution, enables growth of In-based III-V group compound semiconductor crystals such as InAs having excellent crystallinity by metal organic chemical vapor deposition. did.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のInAs結晶の成長シーケンスを示し
た説明図である。
FIG. 1 is an explanatory diagram showing a growth sequence of an InAs crystal of the present invention.

【図2】従来のInAs結晶の成長シーケンスを示した
説明図である。
FIG. 2 is an explanatory diagram showing a growth sequence of a conventional InAs crystal.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 有機金属気相成長法を用いるIn系III-
V族化合物半導体結晶の作製方法において、In原料と
V族原料を交互に供給し、成長温度を600〜800℃
の範囲で気相成長することを特徴とするIn系III-V族
化合物半導体結晶の作製方法。
1. In-based III- using a metal organic chemical vapor deposition method
In the method for producing a Group V compound semiconductor crystal, In raw materials and Group V raw materials are alternately supplied, and the growth temperature is 600 to 800 ° C.
A method for producing an In-based III-V group compound semiconductor crystal, characterized in that vapor-phase growth is performed within the range.
【請求項2】 請求項1記載のIn系III-V族化合物半
導体結晶の作製方法において、V族元素がAsであるこ
とを特徴とするIn系III-V族化合物半導体結晶の作製
方法。
2. The method for producing an In-based III-V compound semiconductor crystal according to claim 1, wherein the V-group element is As.
JP23439193A 1993-09-21 1993-09-21 Production of in-containing iii-v compound semiconductor crystal Pending JPH0789799A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23439193A JPH0789799A (en) 1993-09-21 1993-09-21 Production of in-containing iii-v compound semiconductor crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23439193A JPH0789799A (en) 1993-09-21 1993-09-21 Production of in-containing iii-v compound semiconductor crystal

Publications (1)

Publication Number Publication Date
JPH0789799A true JPH0789799A (en) 1995-04-04

Family

ID=16970269

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23439193A Pending JPH0789799A (en) 1993-09-21 1993-09-21 Production of in-containing iii-v compound semiconductor crystal

Country Status (1)

Country Link
JP (1) JPH0789799A (en)

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