JPH078767U - Molten metal sampling probe - Google Patents

Abstract

(57) [Summary] [Purpose] To provide a metal sample collection probe that facilitates removal from the air carrier, enables multiple uses of the air carrier, and enables reliable chucking with an automatic polishing machine. . [Constitution] In a molten metal sampling probe having a sampling container incorporated inside a paper tube, a cooling chamber with a thickness of half-cracks in the upper chamber having a cylindrical side opening at the inlet and a runner inside. A sampling probe having a disc and a disk-shaped sampling chamber having a concave surface, wherein the thickness of the disk-shaped sample to be sampled increases from the bottom part to the approximately middle part in a taper shape in the diameter of the center part and the middle part. It is characterized in that it is provided with a sampling chamber having a diameter which is the same as that of the intermediate portion and which is straight from the middle portion to the upper portion.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a molten metal sampling probe used for component analysis of molten metal.

[0002]

[Prior art]

 In the metal refining process, it is necessary to appropriately collect molten metal data and control the operation of its components using analytical equipment. A metal sample collected using a molten metal sample collection probe is inserted into a paper or metal cylinder air carrier, and after air transfer to the analysis room, the analysis surface is polished to perform a fluorescent X-ray analysis or an emission spectroscopy analyzer. Will be analyzed promptly.

[0003]

[Problems to be solved by the device]

 When the air-delivered metal sample is taken out of the air carrier, a punch is used to punch out the sample from the upper part of the air carrier. The shape of the metal sample collected by the conventional molten metal sample collection probe is straight (a = b) or tapered (a <b) from the bottom analysis surface to the upper part. It is located higher than the sample shoulder B.

With the conventional shape of the metal sample, when the sample is put into the air carrier or when the sample is taken out by the punch, the edge part of the upper surface or the lower surface of the sample bites into the inner surface of the air carrier, so that the sample cannot be taken out. I couldn't do it, or I couldn't use the air carrier many times because the inner paper of the air carrier was broken.

Further, when the sample taken out from the air carrier is subjected to surface polishing by an automatic polishing machine for analysis, when the sampled molten metal is solidified in the conventional sample shape, the inflow port is projected and the sample upper part is The sample cannot be held stably with the automatic polishing machine that holds it on the shoulder of the sample because it remains in place. The present invention provides a metal sampling probe that can be easily taken out from an air carrier, can be used multiple times, and can be reliably chucked by an automatic polishing machine.

[0006]

[Means for Solving the Problems]

 The present invention solves the above-mentioned problems. (1) In a molten metal sampling probe in which a sampling container is incorporated inside a paper tube, a runner is formed inside an upper chamber opening on a cylindrical side surface at an inlet. It is a sample plow having a thick chill with longitudinal half-cracking and a concave disk-shaped sampling chamber, and the thickness of the disk-shaped sample to be sampled is from the bottom to the approximate middle part. It is characterized in that it is provided with a sampling chamber having a diameter that increases in a taper shape and that has a shape having the same diameter as the diameter of the intermediate portion and extending to the upper portion.

(2) It is characterized in that the sample inlet (A) of the disk-shaped sample collecting chamber is lower than the sample shoulder (B).

(3) The disk-shaped sampling chamber is characterized in that the bottom corner is a concave curved surface.

[0009]

[Action]

 The metal sample collected by the molten metal sampling probe of the present invention (Fig. 1) has a tapered shape (a <c) from the bottom analysis surface to the middle part, and from the middle part to the top with the same diameter. The sample shape is straight (c = b), the corners of the analysis surface are curved, and the sample shape is angled so that the thickness decreases from the outer circumference toward the inner side. Since it is located lower than the shoulder part B, there is no problem from sampling to air feeding, polishing, and analysis, and it is possible to perform automatic analysis quickly.

[0010]

【Example】

 An embodiment of the present invention will be described together with its operation with reference to the drawings. FIG. 2 shows a side sectional view of the molten metal sampling probe of the present invention. The entire molten metal sampling probe is surrounded by a paper tube, and a paper tube 2 having a larger diameter is attached to the tip of the paper tube 1 serving as a holder. A paper tube 5 containing a sandwiched sample collecting unit is attached, and a mouth 6 of the paper tube 2 is attached with a paper or metal announcer 7.

The sampling unit comprises a cylindrical metal, shell, or ceramic upper chamber 8 with an open side surface, a half-cooled cooling plate 9 in which a runner 9b is formed inside the metal, and a metal concave surface. The sample collecting container 10 is shaped like a circle.

The sampling space 10 b is composed of a chill 9 and a sampling container 10. With the sampling container 10, the corner of the sample bottom is curved, the diameter c of the sample bottom is larger than the diameter a of the sample bottom, and the diameter b of the sample top is c. . Further, the bottom shape of the chill 9 is straight from the outer circumference to about 2 / 3R (R: radius), and is tapered downward from 2 / 3R to the vicinity of the center. A constricted portion 9c is provided near the center of the bottom so as to have a smaller diameter than the runner 9b, and the constricted portion 9c is located below the straight portion. Since the metal collected by this breaks at the constricted portion 9c, the outer periphery of the straight becomes the uppermost surface of the sample.

When the molten metal sampling probe of the present invention is immersed in the molten metal, the Anabuta 7 is melted and the molten metal flows from the sprue part 6 through the upper chamber space 8b and the runner 9b into the sampling space 10b. Are collected. This metal sample is inserted into the air feeder, and is air-fed to the analysis chamber by the air feeding tube. FIG. 3 shows the state of the metal sample inserted inside the air carrier.

In the sampling chamber of the present invention, as shown in FIG. 3, the corner of the sample bottom (the upper surface of the metal sample 11 in FIG. 3) has a curved surface with a radius of curvature of 2 to 5 mm. There is no problem such as breaking the air carrier. If the radius of curvature is less than 2 mm, it is not effective against the breakage of the air carrier, and if it exceeds 5 mm, it becomes difficult to secure the analysis area of the metal sample.

Further, in the sample collecting chamber of the present invention, the sample inlet (A) is closer to the sample shoulder (B) than the sample inlet (B). It is configured to be 5 to 2 mm lower. As shown in FIG. 3, since the sample has the taper portion and the straight portion as described above with respect to the tapered air-conduit, the end portion of the sample upper surface (downward in FIG. 3) does not contact the air-conduit. Therefore, the same problem does not occur. A pneumatic punch sent to the analysis room punches the sample from the top with a punch, and after taking it out, the surface of the metal sample is polished by an automatic polishing device.

FIG. 4 shows a schematic view of the automatic polishing apparatus. The bottom surface of the sample, which is the analysis surface, is placed on the polishing belt 14 of the grinder 15 and the upper surface of the sample is pressed and polished by the chucking device 13. However, since the shape of the upper surface of the sample is flat, it is surely pressed by the chucking device 13. There is no analytical failure due to poor polishing. Also, there is no need to re-polish. The surface-polished metal sample is subjected to component analysis by a fluorescent X-ray analyzer and fed back to the refining process. In the above-mentioned embodiment, an example in which only a sampling unit is provided has been described, but it is naturally applicable to an apparatus for simultaneously performing temperature measurement and sampling of a type in which a side temperature unit using a thermocouple or the like is attached to the lower end of the paper tube 3. it can.

[0017]

[Effect of device]

 By using the metal sample of the probe for collecting molten metal of the present invention, the sample can be easily taken out from the air carrier, the sample cannot be taken out, and the inner paper of the air carrier is not broken. The child can be used many times. When the surface of the sample taken out from the air carrier is polished by an automatic polishing machine for analysis, a flat sample can be held on the shoulder of the sample, which can be used by the automatic polishing machine and contribute to automatic analysis. Became possible.

[Brief description of drawings]

FIG. 1 is a side view of a metal sample collected by a sampling probe of the present invention.

FIG. 2 is a side sectional view showing an embodiment of the present invention.

FIG. 3 is a state diagram of a metal sample in an air carrier according to the present invention.

FIG. 4 is a schematic view of an automatic polishing machine device.

FIG. 5 is a side view of a metal sample collected by a conventional sampling probe.

FIG. 6 is a side sectional view of a conventional sampling probe.

[Explanation of symbols]

 1-5 Paper tube 6 Gate 7 Anabuta 8 Upper chamber 8b Upper chamber 9 Cold metal 9b Runner 9c Constriction 10 Sampling chamber 10b Sampling space 11 Metal sample 12 Air carrier 13 Chucking device 14 Polishing belt 15 grinder

Continuation of front page (51) Int.Cl. ⁶ Identification number Reference number within the agency FI Technical display location G01N 1/28 (72) Inventor Hiroyoshi Matsuo 1 Nishinosu, Oita-shi, Oita New Nippon Steel Oita Co., Ltd. Ironworks (72) Creator Takeshi Yoshizawa 1-3-3-920 Nagata Minamidai, Minami-ku, Yokohama-shi, Kanagawa

Claims (3)

[Scope of utility model registration request] 1. A molten metal sampling probe in which a sampling container is incorporated inside a paper tube, wherein a wall thickness of a longitudinal half-crack in which an upper chamber opening at a cylindrical side surface at an inlet and a runner inside is formed. A cooling probe and a disk-shaped sampling chamber having a concave surface, wherein the thickness of the disk-shaped sample to be sampled increases from the bottom to the approximately middle part in a taper shape with a diameter of the central part and A molten metal sampling probe, comprising a sampling chamber having a diameter that is the same as the diameter of the intermediate portion and is straight from the middle portion to the upper portion. 2. The molten metal sampling probe according to claim 1, wherein the sample inlet (A) of the disk-shaped sampling chamber is lower than the sample shoulder (B). 3. The molten metal sampling probe according to claim 1, wherein the corner of the bottom of the disk-shaped sampling chamber is a concave curved surface.